CN213813682U - Conductive test fixture - Google Patents

Conductive test fixture Download PDF

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Publication number
CN213813682U
CN213813682U CN202022537773.7U CN202022537773U CN213813682U CN 213813682 U CN213813682 U CN 213813682U CN 202022537773 U CN202022537773 U CN 202022537773U CN 213813682 U CN213813682 U CN 213813682U
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China
Prior art keywords
test
die assembly
conductive
terminal
test fixture
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Active
Application number
CN202022537773.7U
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Chinese (zh)
Inventor
白志全
潘科廷
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Huizhou Desay Battery Co Ltd
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Huizhou Desay Battery Co Ltd
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Priority to CN202022537773.7U priority Critical patent/CN213813682U/en
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Abstract

The utility model relates to the technical field of electric conduction test, in particular to an electric conduction test fixture, which comprises an upper die assembly and a lower die assembly which are symmetrically arranged, wherein the upper die assembly is positioned at the upper end of the lower die assembly; the lower end of the upper die assembly is connected with a pressing test assembly; a test tray is arranged on the upper surface of the lower die assembly, an adapter plate is arranged on the test tray, and conductive adhesive is arranged on the adapter plate; the utility model discloses a set up the conducting resin, eliminate the hard contact between keysets and the protection shield, make the terminal of protection shield can not receive the damage, saved the operation of detaining the terminal and digging the terminal simultaneously, effectively shortened test cycle, improved efficiency of software testing.

Description

Conductive test fixture
Technical Field
The utility model relates to an electrically conductive test technical field especially relates to an electrically conductive test fixture.
Background
In the present trade, the test to the battery protection shield mainly tests through test fixture collocation keysets, and its test procedure includes, on putting into the test tray of test fixture with the battery protection shield earlier, withholds the battery protection shield with the terminal, fixes the back to the battery protection shield, puts into the test fixture with the test tray, starts the test, and the back that awaits measuring to finish needs manual digging the terminal, takes out the battery protection shield and puts into the plastic uptake dish.
In practical application, when the terminal of battery protection shield and keysets counterpoint inaccurately, can lose the public seat on female seat of keysets and the battery protection shield to when testing the battery protection shield at every turn, all need detain the terminal and scratch the terminal operation, not only increased operating procedure, reduced efficiency of software testing, also can cause the damage to the terminal simultaneously, increase cost of enterprises.
SUMMERY OF THE UTILITY MODEL
To the problem that damage protection shield terminal and efficiency of software testing that above-mentioned exists are low, the utility model provides a conductive test fixture through setting up conductive adhesive, eliminates the hard contact between keysets and the protection shield, makes the terminal of protection shield can not receive the damage, has saved the operation of detaining the terminal and digging the terminal simultaneously, has effectively shortened test cycle, improves efficiency of software testing.
In order to solve the technical problem, the utility model provides a concrete scheme as follows:
a conductive test fixture comprises an upper die assembly and a lower die assembly which are symmetrically arranged, wherein the upper die assembly is positioned at the upper end of the lower die assembly;
the lower end of the upper die assembly is connected with a pressing test assembly;
the upper surface of lower mould subassembly is provided with the test tray, be equipped with the keysets on the test tray, be equipped with the conducting resin on the keysets.
Optionally, the pressing test assembly comprises a test needle plate and a movable pressing block connected with the test needle plate;
the movable pressing block corresponds to the conductive adhesive, the conductive adhesive is used for being in contact with the terminal of the protection plate, the traditional hard contact mode is eliminated, the movable pressing block corresponds to the conductive adhesive, and when the movable pressing block presses downwards, the terminal of the protection plate is made to be in contact with the conductive adhesive, and the terminal of the protection plate is fixed.
Optionally, be equipped with the mounting groove on the test faller, be equipped with the elastic component in the mounting groove, the upper end of activity briquetting is located in the mounting groove and with the elastic component butt, when the terminal of protection shield and conducting resin are pushed down to activity briquetting, the elastic component can play certain cushioning effect to the overdraft of activity briquetting, avoids the production of hard contact.
Optionally, a positioning groove is formed in the test tray, the adapter plate is arranged in the positioning groove, and the positioning groove positions and installs the adapter plate, so that the alignment accuracy and the test accuracy are improved.
Optionally, the adapter plate is detachably connected with the positioning groove, so that the adapter plate can be conveniently detached and installed.
Optionally, a terminal fixing block is arranged on the adapter plate, and the conductive adhesive is arranged on the terminal fixing block, so that the alignment accuracy of the terminal of the protection plate and the conductive adhesive is further improved.
Optionally, the terminal fixing block and the adapter plate are detachably connected, so that the terminal fixing block can be conveniently detached and installed.
Optionally, the test tray is detachably connected with the lower die assembly, so that the test tray can be conveniently detached and assembled, an operator can be arranged to perform test operation, another operator is arranged to install the protection board to be tested, waiting time of the conductive test fixture is shortened, and service efficiency of the conductive test fixture is improved.
Compared with the prior art, the beneficial effects of the utility model reside in that: the utility model provides a pair of electrically conductive test fixture through setting up the conducting resin, eliminates the hard contact between keysets and the protection shield, makes the terminal of protection shield can not receive the damage, has saved the operation of detaining the terminal and digging the terminal simultaneously, has effectively shortened test cycle, improves efficiency of software testing.
Drawings
Fig. 1 is a schematic view of an overall structure of a conductive testing fixture provided in an embodiment of the present invention.
Wherein, 1 is an upper die component; 2 is a lower die component; 3 is a press-down test assembly; 31 is a test needle plate; 311 is a mounting groove; 32 is a movable pressing block; 33 is an elastic member; 4 is a test tray; 5 is a patch panel; 6 is conductive adhesive; 7 is a terminal fixing block; and 8 is a protection plate.
Detailed Description
In order to explain the technical solution of the present invention in detail, the following will combine the drawings of the embodiments of the present invention to perform clear and complete description on the technical solution of the embodiments of the present invention. It is to be understood that the embodiments described are only some of the embodiments of the present invention, and not all of them. All other embodiments, which can be obtained by a person skilled in the art without any inventive work based on the described embodiments of the present invention, belong to the protection scope of the present invention.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.
For example, the conductive test fixture comprises an upper die assembly and a lower die assembly which are symmetrically arranged, wherein the upper die assembly is positioned at the upper end of the lower die assembly; the lower end of the upper die assembly is connected with a pressing test assembly; the upper surface of lower module is provided with the test tray, is equipped with the keysets on the test tray, is equipped with the conducting resin on the keysets.
The electrically conductive test fixture that this embodiment provided eliminates the hard contact between keysets and the protection shield through setting up the conducting resin, makes the terminal of protection shield can not receive the damage, has saved the operation of detaining the terminal and digging the terminal simultaneously, has effectively shortened test cycle, improves efficiency of software testing.
As shown in figure 1, the conductive test fixture comprises an upper die assembly 1 and a lower die assembly 2 which are symmetrically installed, wherein the lower die assembly 2 is in a fixed installation state, the upper die assembly can move up and down under the driving of external force, the lower end of the upper die assembly is connected with a downward pressing test assembly 3, and the downward pressing test assembly moves up and down along with the upper die assembly. The protection board 8 to be tested is placed on the lower die assembly, then the lower pressing test assembly moves downwards along with the upper die assembly, and the protection board to be tested is pressed and tested. The upper surface of lower module is provided with test tray 4, the last keysets 5 that is provided with of test tray, be equipped with conducting resin 6 on the keysets, before the test, set up the keysets on test tray in advance, and set up conducting resin on the keysets and eliminate the hard contact between keysets and the protection shield, the terminal that makes the protection shield can not receive the damage, the operation of detaining the terminal and digging the terminal has been saved simultaneously, effectively shortened test cycle, the efficiency of software testing is improved.
In some embodiments, the hold-down test assembly 3 includes a test pin plate 31 and a movable press block 32 connected to the test pin plate; the activity briquetting corresponds with conductive adhesive, and conductive adhesive is used for the terminal contact with the protection shield, eliminates traditional hard contact mode, and the activity briquetting corresponds with conductive adhesive, and when the activity briquetting pushed down, the terminal and the conductive adhesive contact of promotion protection shield to fix the terminal of protection shield, be convenient for accomplish the test.
When the device is actually applied, the terminals of the protection plate are placed on the conductive adhesive, the downward pressing test assembly moves downwards along with the upper die assembly, when the movable pressing block presses downwards, the terminals of the protection plate are made to be in contact with the conductive adhesive, the test needle plate is in contact with other positions to be tested on the protection plate, and the conductive test of the protection plate is completed.
In some embodiments, the test needle plate 31 is provided with a mounting groove 311, the mounting groove is provided with an elastic member 33, the upper end of the movable pressing block is arranged in the mounting groove and abutted against the elastic member, and when the movable pressing block presses the terminal of the protection board and the conductive adhesive downwards, the elastic member can play a certain role in buffering the downward pressure of the movable pressing block, so as to avoid hard contact.
Be equipped with positioning groove on the test tray, the keysets is located in the positioning groove, and positioning groove fixes a position and installs the keysets, improves the accuracy of counterpointing and the precision of test. The adapter plate is detachably connected with the positioning groove, so that the adapter plate can be conveniently detached and installed, and can be connected in a threaded mode.
Be equipped with terminal fixed block 7 on the keysets 5, on the terminal fixed block was located to the conducting resin, further improved the terminal of protection shield and the counterpoint accuracy of conducting resin. For dismantling and being connected between terminal fixed block and the keysets, be convenient for dismantle and install the terminal fixed block, specifically can adopt the screw thread mode to connect.
The test tray is detachably connected with the lower die assembly, so that the test tray can be conveniently detached and assembled, an operator can be arranged to perform test operation, another operator is arranged to install the protection plate to be tested, the waiting time of the conductive test fixture is shortened, and the service efficiency of the conductive test fixture is improved.
The test tray can be provided with a plurality of test positions, an operator can be arranged to install the protection board to be tested, another operator is arranged to carry out operation test, after the test is finished, the test tray is taken down from the lower die assembly and is immediately replaced with the test tray provided with the protection board to be tested, the test is carried out, the waiting time of the conductive test fixture is shortened, and the test operation efficiency is improved.
It is understood that different embodiments among the components in the above embodiments can be combined and implemented, and the embodiments are only for illustrating the implementation of specific structures and are not limited to the implementation of the embodiments.
The embodiments of the present invention have been described in detail with reference to the drawings, but the present invention is not limited to the above embodiments, and various changes can be made without departing from the spirit of the present invention within the knowledge of those skilled in the art.

Claims (8)

1. The conductive test fixture is characterized by comprising an upper die assembly (1) and a lower die assembly (2) which are symmetrically arranged, wherein the upper die assembly (1) is positioned at the upper end of the lower die assembly (2);
the lower end of the upper die component (1) is connected with a press-down testing component (3);
the upper surface of lower module (2) is provided with test tray (4), be equipped with keysets (5) on test tray (4), be equipped with conducting resin (6) on keysets (5).
2. The conductive test fixture of claim 1, wherein the hold-down test assembly (3) comprises a test pin plate (31) and a movable press block (32) connected to the test pin plate (31);
the movable pressing block (32) corresponds to the conductive adhesive (6).
3. The conductive test fixture of claim 2, wherein the test needle plate (31) is provided with a mounting groove (311), an elastic member (33) is arranged in the mounting groove (311), and the upper end of the movable pressing block (32) is arranged in the mounting groove (311) and is abutted against the elastic member (33).
4. The conductive test fixture of claim 1, wherein the test tray (4) is provided with a positioning groove, and the adapter plate (5) is arranged in the positioning groove.
5. The conductive test fixture of claim 4, wherein the adapter plate (5) is detachably connected to the positioning recess.
6. The conductive test fixture of claim 1, wherein the adapter plate (5) is provided with a terminal fixing block (7), and the conductive adhesive (6) is provided on the terminal fixing block (7).
7. The conductive test fixture of claim 6, wherein the terminal fixing block (7) is detachably connected to the interposer (5).
8. The conductive test fixture of claim 1, wherein the test tray (4) is removably connected to the lower die assembly (2).
CN202022537773.7U 2020-11-05 2020-11-05 Conductive test fixture Active CN213813682U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202022537773.7U CN213813682U (en) 2020-11-05 2020-11-05 Conductive test fixture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202022537773.7U CN213813682U (en) 2020-11-05 2020-11-05 Conductive test fixture

Publications (1)

Publication Number Publication Date
CN213813682U true CN213813682U (en) 2021-07-27

Family

ID=76965285

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202022537773.7U Active CN213813682U (en) 2020-11-05 2020-11-05 Conductive test fixture

Country Status (1)

Country Link
CN (1) CN213813682U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116068380A (en) * 2023-03-01 2023-05-05 上海聚跃检测技术有限公司 Chip package testing method and device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116068380A (en) * 2023-03-01 2023-05-05 上海聚跃检测技术有限公司 Chip package testing method and device

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