CN213717215U - A Type-C data line and signal test system for signal switching device - Google Patents

A Type-C data line and signal test system for signal switching device Download PDF

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Publication number
CN213717215U
CN213717215U CN202023024187.9U CN202023024187U CN213717215U CN 213717215 U CN213717215 U CN 213717215U CN 202023024187 U CN202023024187 U CN 202023024187U CN 213717215 U CN213717215 U CN 213717215U
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type
plug
signal
signal pins
data line
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陈其涛
陈志列
刘志永
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Yanxiang Smart Iot Technology Co ltd
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Yanxiang Smart Iot Technology Co ltd
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Abstract

The utility model provides a Type-C data line and signal test system for signal switching device, this Type-C data line include first Type-C plug, second Type-C plug, data line body, and this body coupling of data line is in between first Type-C plug and the second Type-C plug. One Type-C plug in first Type-C plug and the second Type-C plug is used for being connected with the test host computer, and another Type-C plug is used for being connected with signal switching device. And no chip is arranged on the PCBA of the first Type-C plug and the PCBA of the second Type-C plug. Through all adopting no chip design on the PCBA at Type-C data line both ends Type-plug, make a new Type-C data line that is used for signal switching device to support the demand of positive and negative blind plugging. Compared with the prior art, the utility model has the advantages that the design of no chip is all adopted on the PCBA of Type-C data line both ends Type-plug, and the one end of Type-C data line is connected with signal switching device, and the other end is connected with the test host computer to support the demand of just reversing blind plug, save personnel operating time, improve work efficiency.

Description

A Type-C data line and signal test system for signal switching device
Technical Field
The utility model relates to a communication electronics technical field especially relates to a Type-C data line and signal test system for signal switching device.
Background
At present, a detection mode of signal switching is generally adopted for detecting the port function of industrial equipment before leaving a factory. Compared with a detection mode that the detection head is directly connected to the product port, the detection mode of signal transfer is greatly improved in detection efficiency. The signal switching is to provide signal through signal source, and transmit to signal switching module through data line, and then signal switching module switches signal and transmits to the tested end through data line, thus achieving the function of testing each port of the product. Nowadays, the ports of industrial products, consumer electronics and the like are increasingly using Type-C interfaces, such as wye electronic device ports, television display screen ports and the like. In the port function detection of such products, the common Type-C line cannot meet the application of the signal transfer detection mode.
A chip is arranged on a PCBA (Printed Circuit Board Assembly), which is short for Printed Circuit Board Assembly, at one end of a plug at two ends of an existing common Type-C wire, namely a PCB blank Board is subjected to SMT (surface mount technology) loading or the whole process of DIP (dual in-line package) loading, so that a finished Circuit Board is obtained, and the condition of positive and negative blind plugging can be met when the PCB blank Board is used independently. But use together when two ordinary Type-C lines and signal switching device cooperation, when inserting or inserting the normal transmission that is connected to signal switching device both ends backward respectively, the chip of two ordinary Type-C lines can influence the signal for can successfully transmit the probability of signal after inserting for it is half to insert for positive and negative, can't satisfy positive and negative blind, thereby the personnel operation that leads to is consuming time, reduces work efficiency.
SUMMERY OF THE UTILITY MODEL
The utility model provides a Type-C data line and signal test system for signal switching device for support positive and negative blind insertion's demand, save personnel operating time, improve work efficiency.
In a first aspect, the utility model provides a Type-C data line for signal switching device, this Type-C data line include first Type-C plug, second Type-C plug and data line body, and wherein, this data line body coupling is in between first Type-C plug and the second Type-C plug. One Type-C plug in first Type-C plug and the second Type-C plug is used for being connected with the test host computer, and another Type-C plug is used for being connected with signal switching device. And no chip is arranged on the PCBA of the first Type-C plug and the PCBA of the second Type-C plug.
In the scheme, the PCBA of the Type-plug at the two ends of the Type-C data line is designed without chips, and a new Type-C data line for the signal switching device is manufactured to support the requirements of positive and negative blind plugging. Among the ordinary Type-C line both ends Type-C plug among the prior art, have the chip on the PCBA of one end Type-C plug. The one end with signal switching device is connected with the test host through ordinary Type-C line, and when the other end was connected through ordinary Type-C line and surveyed terminal for when just inserting or inserting the both ends of being connected to signal switching device backward, the chip of two ordinary Type-C lines can influence the normal transmission of signal, makes the probability that can successfully transmit signal after inserting forward and backward for half, can't support forward and backward blind insertion. Compared with the prior art, the utility model has the advantages that the design of no chip is all adopted on the PCBA of Type-C data line both ends Type-C plug, and the one end of Type-C data line is connected with signal switching device, and the other end is connected with test host computer to support the demand of just turning over blind plug, save personnel operating time, improve work efficiency.
In a specific embodiment, a TX signal pin on the first Type-C plug is connected with an RX signal pin on the second Type-C plug, and the RX signal pin on the first Type-C plug is connected with a TX signal pin on the second Type-C plug. The test host sends a test signal to the signal switching device through the Type-C data line, and the signal switching device feeds back a data signal to the test host through the Type-C data line.
In a specific embodiment, the first Type-C plug has two sets of TX signal pins and RX signal pins symmetrically arranged thereon; each set of TX signal pins includes two TX signal pins, and each set of RX signal pins includes two RX signal pins. The second Type-C plug is provided with two groups of TX signal pins and RX signal pins which are symmetrically arranged; each set of TX signal pins includes two TX signal pins, and each set of RX signal pins includes two RX signal pins. Two sets of TX signal pins on the first Type-C plug are respectively connected with two sets of RX signal pins on the second Type-C plug. Two sets of RX signal pins on the first Type-C plug are connected with two sets of TX signal pins on the second Type-C plug respectively. So as to realize the cross connection of the TX signal pin and the RX signal pin on the first Type-C plug and the RX signal pin and the TX signal pin on the second Type-C plug.
In a specific embodiment, the two groups of TX signal pins on the first Type-C plug are TXP1/TXn1 signal pins A2/A3 and TXP2/TXn2 signal pins B2/B3; the two groups of RX signal pins on the first Type-C plug are RXP1/RXn1 signal pins B11/B10 and RXP2/RXn2 signal pins A11/A10 respectively. The two groups of TX signal pins on the second Type-C plug are TXP1/TXn1 signal pin A2/A3 and TXP2/TXn2 signal pin B2/B3 respectively; the two groups of RX signal pins on the second Type-C plug are RXP1/RXn1 signal pins B11/B10 and RXP2/RXn2 signal pins A11/A10 respectively. So that two sets of TX signal pins and RX signal pins disposed on each Type-C plug are symmetrically disposed.
In a specific embodiment, the TXP1/TXn1 signal pins A2/A3 on the first Type-C plug are respectively connected with the RXP1/RXn1 signal pins B11/B10 on the second Type-C plug; the TXP2/TXn2 signal pins B2/B3 on the first Type-C plug are correspondingly connected with the RXP2/RXn2 signal pins A11/A10 on the second Type-C plug respectively; the RXP1/RXn1 signal pins B11/B10 on the first Type-C plug are correspondingly connected with the TXP1/TXn1 signal pins A2/A3 on the second Type-C plug respectively; the RXP2/RXn2 signal pins A11/A10 on the first Type-C plug are correspondingly connected with the TXP2/TXn2 signal pins B2/B3 on the second Type-C plug respectively. So as to realize that two groups of TX signal pins and RX signal pins on the first Type-C plug and two groups of RX signal pins and TX signal pins on the second Type-C plug are respectively and correspondingly connected in a cross way.
In a specific embodiment, the SBU1/SBU2 signal pins A8/B8 on the first Type-C plug are respectively connected with the SBU2/SBU1 signal pins B8/A8 on the second Type-C plug; GND signal pins A1/B1/A12/B12 on the first Type-C plug are correspondingly connected with GND signal pins A1/B1/A12/B12 on the second Type-C plug respectively. The test host and the signal switching device transmit auxiliary signals and grounding signals through the Type-C data line.
In a specific embodiment, VBUS signal pins A4/B4/A9/B9 on the first Type-C plug are correspondingly connected with VBUS signal pins A4/B4/A9/B9 on the second Type-C plug respectively; the CC signal pin A5 on the first Type-C plug is connected with the CC signal pin A5 on the second Type-C plug. So as to realize the transmission of VBUS signals and connection confirmation signals between the test host and the signal switching device.
In one embodiment, the VCONN signal pin B5 on the first Type-C plug is connected to the VCONN signal pin B5 on the second Type-C plug; the D +/D-signal pins A6/A7 on the first Type-C plug are correspondingly connected with the D +/D-signal pins A6/A7 on the second Type-C plug respectively. So as to realize the transmission of VCONN signal and D +/D-signal between the test host and the signal switching device.
The second aspect, the utility model also provides a signal test system, this signal test system includes test host, signal switching device and above-mentioned arbitrary Type-C data line. The signal switching device comprises a first terminal and a second terminal, wherein the first terminal is used for being in communication connection with the test host, and the second terminal is used for being in communication connection with the tested terminal. One Type-C plug in first Type-C plug and the second Type-C plug is connected with the test host, and another Type-C plug is connected with signal switching device's first terminal. And a common Type-C wire is connected between the second terminal of the signal switching device and the terminal to be tested. Have the chip on the PCBA of the Type-C plug of this ordinary Type-C line one end, there is not the chip on the PCBA of the Type-C plug of the other end.
In the scheme, the PCBA of the Type-C plugs at the two ends of the Type-C data line is designed without chips, and a new Type-C data line for the signal switching device is manufactured to support the requirements of positive and negative blind plugging. Among the ordinary Type-C line both ends Type-C plug among the prior art, have the chip on the PCBA of one end Type-C plug. The one end with signal switching device is connected with the test host through ordinary Type-C line, and when the other end was connected through ordinary Type-C line and surveyed terminal for when just inserting or inserting the both ends of being connected to signal switching device backward, the chip of two ordinary Type-C lines can influence the normal transmission of signal, makes the probability that can successfully transmit signal after inserting forward and backward for half, can't support forward and backward blind insertion. Compared with the prior art, the utility model has the advantages that the design of no chip is all adopted on the PCBA of Type-C data line both ends Type-plug, and the one end of Type-C data line is connected with signal switching device, and the other end is connected with the test host computer to support the demand of just reversing blind plug, save personnel operating time, improve work efficiency.
In a specific embodiment, the first terminal is a male terminal and the second terminal is a female terminal.
Drawings
Fig. 1 is a schematic structural diagram of a signal testing system according to an embodiment of the present invention;
fig. 2 is the embodiment of the utility model provides a first Type-C plug and the connected schematic diagram of second Type-C plug pin.
Reference numerals:
10-Type-C data line 11-first Type-C plug 12-second Type-C plug
13-data line body 20-test host 30-signal switching device 31-first terminal
32-second terminal 40-tested terminal 50-common Type-C line
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
For the convenience of understanding the utility model provides a Type-C data line for signal switching device, first describe below the utility model provides an application scenario of Type-C data line, this Type-C data line is applied to in the signal test system for connect on the signal switching device. The Type-C data line will be described in detail with reference to the accompanying drawings.
Referring to fig. 1 and 2, an embodiment of the present invention provides a Type-C data line 10, which includes a first Type-C plug 11, a second Type-C plug 12, and a data line body 13, wherein the data line body 13 is connected between the first Type-C plug 11 and the second Type-C plug 12. When setting for first Type-C plug 11 and second Type-C plug 12, can all set up two Type-C plugs to public head, also can all set up to female head, of course, can also set up one Type-C plug in two Type-C plugs to public head, another sets up to female head. The data line body 13 connecting the two Type-C plugs can be a signal line which can be connected with various signals in the prior art, so that the two Type-C plugs are connected according to a specific line sequence mode. And no chip is arranged on the PCBA of the first Type-C plug 11 and the PCBA of the second Type-C plug 12. Through all adopting no chip design on the PCBA at Type-C data line 10 both ends Type-plug, make a new Type-C data line 10 that is used for signal switching device 30 to support the demand of positive and negative blind plugging.
Among the 50 both ends Type-C plugs of ordinary Type-C line among the prior art, have the chip on the PCBA of one end Type-C plug. When being connected with signal switching device 30's one end through ordinary Type-C line 50 and test host 20, the other end is connected with surveyed terminal 40 through ordinary Type-C line 50 for just inserting or when inserting the both ends of being connected to signal switching device 30 backward, the normal transmission of signal can be influenced to two ordinary Type-C line 50's chip, makes the probability that can successfully transmit the signal after inserting forward and backward half, can't support forward and backward blind insertion.
Compared with the prior art, the utility model has the advantages that the design of no chip is all adopted on the PCBA of Type-C data line 10 both ends Type-plug, and the one end of Type-C data line 10 is connected with signal switching device 30, and the other end is connected with test host 20 to support the demand of just turning over blind plug, save personnel operating time, improve work efficiency. Wherein the test host 20 is used to provide a signal source. In use, and with reference to FIG. 1, one of the first Type-C plug 11 and the second Type-C plug 12 of the Type-C data line 10 is adapted to connect with the test host 20, and the other Type-C plug is adapted to connect with the signal patch device 30. Specifically, the first Type-C plug 11 can be connected to the test host 20, the second Type-C plug 12 is connected to the signal adapter 30, and the specific connection mode can be a plug connection mode. Of course, since the Type-C data line 10 in the present application supports the requirement of forward and reverse blind plugging, the second Type-C plug 12 can also be connected to the test host 20, and the first Type-C plug 11 is connected to the signal adapter 30.
When the first Type-C plug 11 and the second Type-C plug 12 are specifically connected, referring to fig. 2, the TX signal pin on the first Type-C plug 11 may be connected to the RX signal pin on the second Type-C plug 12, and the RX signal pin on the first Type-C plug 11 may be connected to the TX signal pin on the second Type-C plug 12. So as to realize the cross connection of the TX/RX signal pins in the first Type-C plug 11 and the second Type-C plug 12, so as to realize that the test host 20 sends the test signal to the signal adapter 30 through the Type-C data line 10, and the signal adapter 30 feeds back the data signal to the test host 20 through the Type-C data line 10.
Specifically, when cross connection of TX/RX signal pins in two Type-C plugs is implemented, referring to fig. 2, two sets of TX signal pins and RX signal pins symmetrically arranged may be provided on the first Type-C plug 11. Each set of TX signal pins includes two TX signal pins, and each set of RX signal pins includes two RX signal pins. There are also two sets of TX and RX signal pins symmetrically disposed on the second Type-C plug 12. Each set of TX signal pins includes two TX signal pins, and each set of RX signal pins includes two RX signal pins. Two sets of TX signal pins on the first Type-C plug 11 are connected to two sets of RX signal pins on the second Type-C plug 12, respectively. Two sets of RX signal pins on the first Type-C plug 11 are connected to two sets of TX signal pins on the second Type-C plug 12, respectively. So as to realize the cross connection of the TX signal pin and the RX signal pin on the first Type-C plug 11 and the RX signal pin and the TX signal pin on the second Type-C plug 12.
Specifically, when the two sets of TX signal pins and RX signal pins are respectively and correspondingly connected, referring to fig. 2, the two sets of TX signal pins on the first Type-C plug 11 may be the TXp1/TXn1 signal pins a2/A3 and the TXp2/TXn2 signal pins B2/B3, respectively. The two sets of RX signal pins on the first Type-C plug 11 may be RXP1/RXn1 signal pins B11/B10, RXP2/RXn2 signal pins A11/A10, respectively. The two sets of TX signal pins on the second Type-C plug 12 may be the TXP1/TXn1 signal pins A2/A3, and the TXP2/TXn2 signal pins B2/B3, respectively. The two sets of RX signal pins on the second Type-C plug 12 may be RXP1/RXn1 signal pins B11/B10, RXP2/RXn2 signal pins A11/A10, respectively. So that two sets of TX signal pins and RX signal pins disposed on each Type-C plug are symmetrically disposed.
Specifically, when the two TX signal pins and the RX signal pins are interconnected, referring to fig. 2, the TXp1/TXn1 signal pins a2/A3 on the first Type-C plug 11 can be correspondingly connected to the RXp1/RXn1 signal pins B11/B10 on the second Type-C plug 12, respectively. The TXP2/TXn2 signal pins B2/B3 on the first Type-C plug 11 are correspondingly connected with the RXP2/RXn2 signal pins A11/A10 on the second Type-C plug 12, respectively. The RXP1/RXn1 signal pins B11/B10 on the first Type-C plug 11 are correspondingly connected with the TXP1/TXn1 signal pins A2/A3 on the second Type-C plug 12 respectively. The RXP2/RXn2 signal pins A11/A10 on the first Type-C plug 11 are correspondingly connected with the TXP2/TXn2 signal pins B2/B3 on the second Type-C plug 12 respectively. So as to realize that the two groups of TX signal pins and RX signal pins on the first Type-C plug 11 and the two groups of RX signal pins and TX signal pins on the second Type-C plug 12 are respectively and correspondingly cross-connected.
With continued reference to FIG. 2, the SBU1/SBU2 signal pins A8/B8 of the first Type-C plug 11 may be correspondingly connected to the SBU2/SBU1 signal pins B8/A8 of the second Type-C plug 12, respectively, so as to enable the test host 20 and the signal adapter 30 to transmit the auxiliary signal through the Type-C data line 10. The GND signal pins A1/B1/A12/B12 on the first Type-C plug 11 can be correspondingly connected with the GND signal pins A1/B1/A12/B12 on the second Type-C plug 12, so that the test host 20 and the signal adapter 30 can transmit the ground signal through the Type-C data line 10.
With continued reference to FIG. 2, the VBUS signal pins A4/B4/A9/B9 on the first Type-C plug 11 may also be connected to the VBUS signal pins A4/B4/A9/B9 on the second Type-C plug 12, respectively, to enable transmission of VBUS signals between the test host 20 and the signal relay device 30. Of course, the CC signal pin a5 on the first Type-C plug 11 can be connected to the CC signal pin a5 on the second Type-C plug 12 to transmit the connection confirmation signal between the test host 20 and the signal adapter 30.
As shown in FIG. 2, the VCONN signal pin B5 of the first Type-C plug 11 can be connected to the VCONN signal pin B5 of the second Type-C plug 12 to transmit the VCONN signal between the test host 20 and the signal adapter 30. Of course, the D +/D-signal pins A6/A7 of the first Type-C plug 11 can be correspondingly connected with the D +/D-signal pins A6/A7 of the second Type-C plug 12, respectively, so as to transmit the D +/D-signals between the test host 20 and the signal adapter 30.
Through all adopting no chip design on the PCBA at Type-C data line 10 both ends Type-C plug, make a new Type-C data line 10 that is used for signal switching device 30 to support the demand of positive and negative blind plugging. Among the 50 both ends Type-C plugs of ordinary Type-C data line among the prior art, have the chip on the PCBA of one end Type-C plug. When one end of the signal switching device 30 is connected with the test host 20 through the common Type-C line 50 and the other end is connected with the tested terminal 40 through the common Type-C line 50, when the signal switching device 30 is connected with the two ends through forward insertion or backward insertion, the special relation existing between the chips on the two common Type-C lines 50 enables the probability of successfully transmitting signals after forward and backward insertion to be half, and forward and backward blind insertion cannot be supported. Compared with the prior art, the utility model has the advantages that the design of no chip is all adopted on the PCBA of Type-C data line 10 both ends Type-plug, and the one end of Type-C data line 10 is connected with signal switching device 30, and the other end is connected with test host 20 to support the demand of just turning over blind plug, save personnel operating time, improve work efficiency.
In addition, the embodiment of the present invention further provides a signal testing system, referring to fig. 1, the signal testing system includes a testing host 20, a signal switching device 30, and any one of the above Type-C data lines 10. The test host 20 is configured to provide a test signal source to the test fixture. The signal transfer device 30 includes a first terminal 31 and a second terminal 32, wherein the first terminal 31 is used for communication connection with the test host 20, and the second terminal 32 is used for communication connection with the terminal under test 40. One Type-C plug of the first Type-C plug 11 and the second Type-C plug 12 is connected to the test host 20, and the other Type-C plug is connected to the first terminal 31 of the signal transfer device 30. A normal Type-C line 50 is connected between the second terminal 32 of the signal relay device 30 and the terminal under test 40. Have the chip on the PCBA of the Type-C plug of this 50 one ends of ordinary Type-C line, there is not the chip on the PCBA of the Type-C plug of the other end. Through all adopting no chip design on the PCBA at Type-C data line 10 both ends Type-C plug, make a new Type-C data line 10 that is used for signal switching device 30 to support the demand of positive and negative blind plugging.
Among the 50 both ends Type-C plugs of ordinary Type-C line among the prior art, have the chip on the PCBA of one end Type-C plug. When one end of the signal switching device 30 is connected with the test host 20 through the common Type-C line 50 and the other end is connected with the tested terminal 40 through the common Type-C line 50, when the signal switching device 30 is connected with the two ends through forward insertion or backward insertion, the special relation existing between the chips on the two common Type-C lines 50 enables the probability of successfully transmitting signals after forward and backward insertion to be half, and forward and backward blind insertion cannot be supported. Compared with the prior art, the utility model has the advantages that the design of no chip is all adopted on the PCBA of Type-C data line 10 both ends Type-plug, and the one end of Type-C data line 10 is connected with signal switching device 30, and the other end is connected with test host 20 to support the demand of just turning over blind plug, save personnel operating time, improve work efficiency.
When the first terminal 31 and the second terminal 32 in the signal transfer device 30 are specifically connected, the first terminal 31 and the second terminal 32 can be connected in a butt joint manner. When the test is not performed, the first terminal 31 and the Type-C data line 10 are placed at the host side under test, and the second terminal 32 and the normal Type-C line 50 are placed at the terminal 40 side under test. When a test is required, the test can be performed by butting the first terminal 31 and the second terminal 32 together.
When the types of the first terminals 31 and the second terminals 32 are specifically set, the first terminals 31 may be male terminals, and the second terminals 32 may be female terminals. Of course, the first terminal 31 may be a female terminal, and the second terminal 32 may be a male terminal.
The above description is only for the specific embodiments of the present invention, but the protection scope of the present invention is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present invention should be covered by the protection scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.

Claims (10)

1. A Type-C data line for a signal switching device, comprising:
a first Type-C plug;
a second Type-C plug;
the data line body is connected between the first Type-C plug and the second Type-C plug;
the PCBA of the first Type-C plug and the PCBA of the second Type-C plug are both provided with no chip; and one Type-C plug in first Type-C plug and the second Type-C plug is used for being connected with the test host, and another Type-C plug is used for being connected with signal switching device.
2. The Type-C data line of claim 1, wherein a TX signal pin on the first Type-C plug is connected with an RX signal pin on the second Type-C plug;
and an RX signal pin on the first Type-C plug is connected with a TX signal pin on the second Type-C plug.
3. The Type-C data line of claim 2, wherein the first Type-C plug has two symmetrically arranged sets of TX and RX signal pins; each group of TX signal pins comprises two TX signal pins, and each group of RX signal pins comprises two RX signal pins;
the second Type-C plug is provided with two groups of TX signal pins and RX signal pins which are symmetrically arranged; each group of TX signal pins comprises two TX signal pins, and each group of RX signal pins comprises two RX signal pins;
two groups of TX signal pins on the first Type-C plug are respectively connected with two groups of RX signal pins on the second Type-C plug;
two sets of RX signal pins on the first Type-C plug are respectively connected with two sets of TX signal pins on the second Type-C plug.
4. The Type-C data line of claim 3, wherein the two sets of TX signal pins on the first Type-C plug are TXP1/TXn1 signal pins A2/A3, TXP2/TXn2 signal pins B2/B3, respectively; two groups of RX signal pins on the first Type-C plug are RXP1/RXn1 signal pins B11/B10 and RXP2/RXn2 signal pins A11/A10 respectively;
the two groups of TX signal pins on the second Type-C plug are TXP1/TXn1 signal pins A2/A3 and TXP2/TXn2 signal pins B2/B3 respectively; the two groups of RX signal pins on the second Type-C plug are RXP1/RXn1 signal pins B11/B10 and RXP2/RXn2 signal pins A11/A10 respectively.
5. The Type-C data line of claim 4, wherein the TXP1/TXn1 signal pins A2/A3 on the first Type-C plug connect to corresponding RXP1/RXn1 signal pins B11/B10 on the second Type-C plug, respectively;
the TXP2/TXn2 signal pins B2/B3 on the first Type-C plug are correspondingly connected with the RXP2/RXn2 signal pins A11/A10 on the second Type-C plug respectively;
the RXP1/RXn1 signal pins B11/B10 on the first Type-C plug are correspondingly connected with TXP1/TXn1 signal pins A2/A3 on the second Type-C plug respectively;
the RXP2/RXn2 signal pins A11/A10 on the first Type-C plug are correspondingly connected with the TXP2/TXn2 signal pins B2/B3 on the second Type-C plug respectively.
6. The Type-C data line of claim 5, wherein SBU1/SBU2 signal pins A8/B8 on the first Type-C plug are connected to SBU2/SBU1 signal pins B8/A8, respectively, on the second Type-C plug;
GND signal pins A1/B1/A12/B12 on the first Type-C plug are correspondingly connected with GND signal pins A1/B1/A12/B12 on the second Type-C plug respectively.
7. The Type-C data line of claim 5, wherein the VBUS signal pins A4/B4/A9/B9 on the first Type-C plug are connected to correspond to the VBUS signal pins A4/B4/A9/B9 on the second Type-C plug, respectively;
and the CC signal pin A5 on the first Type-C plug is connected with the CC signal pin A5 on the second Type-C plug.
8. The Type-C data line of claim 5, wherein the VCONN signal pin B5 on the first Type-C plug is connected to the VCONN signal pin B5 on the second Type-C plug;
the D +/D-signal pins A6/A7 on the first Type-C plug are correspondingly connected with the D +/D-signal pins A6/A7 on the second Type-C plug respectively.
9. A signal testing system, comprising:
a test host;
the signal switching device comprises a first terminal and a second terminal, wherein the first terminal is used for being in communication connection with the test host, and the second terminal is used for being in communication connection with a terminal to be tested;
the Type-C data line of any one of claims 1 to 8, wherein one Type-C plug of the first Type-C plug and the second Type-C plug is connected to the test host, and the other Type-C plug is connected to the first terminal of the signal patch device;
a common Type-C wire connected between the second terminal of the signal switching device and the terminal to be tested; wherein, have the chip on the PCBA of the Type-C plug of ordinary Type-C line one end, do not have the chip on the PCBA of the Type-C plug of the other end.
10. The signal testing system of claim 9, wherein the first terminal is a male terminal and the second terminal is a female terminal.
CN202023024187.9U 2020-12-15 2020-12-15 A Type-C data line and signal test system for signal switching device Active CN213717215U (en)

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