CN213544638U - Novel probe - Google Patents
Novel probe Download PDFInfo
- Publication number
- CN213544638U CN213544638U CN202022589189.6U CN202022589189U CN213544638U CN 213544638 U CN213544638 U CN 213544638U CN 202022589189 U CN202022589189 U CN 202022589189U CN 213544638 U CN213544638 U CN 213544638U
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- plunger
- contact
- probe
- thickness
- novel probe
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Abstract
The utility model discloses a novel probe, including first plunger, second plunger and rotating spring, first plunger includes contact site, spacing portion and guide part, the second plunger is including contact plush copper, first flexure strip and second flexure strip. The utility model discloses a set the thickness of guide part to being less than the thickness of contact site, increased the toughness of probe, saved the material, be fit for some limit interval conductive pin interval more small electronic test simultaneously, through designing into the chevron with the contact plush copper, the bottom is used for joint coil spring, and the top is used for contacting the chip pin and tests, and the contact site is minimum, can not produce the short circuit.
Description
Technical Field
The utility model relates to a probe field specifically is a novel probe.
Background
The probe is a test needle for testing PCBA, the surface of the probe is plated with gold, and a high-performance spring with the average service life of 3-10 ten thousand is arranged in the probe.
The existing probe is mostly the same in thickness, not only wastes materials, but also is poor in toughness, cannot be suitable for being used at certain limit intervals, is large in contact part and is easy to generate short circuit.
SUMMERY OF THE UTILITY MODEL
The utility model discloses solve the technical problem that above-mentioned prior art exists, provide a novel probe.
In order to achieve the above object, the utility model provides a following technical scheme: the utility model provides a novel probe, includes first plunger, second plunger and rotating spring, first plunger includes contact site, spacing portion and guide part, the second plunger is including contact plush copper, first flexure strip and second flexure strip.
Preferably, one side of the contact part is provided with a contact end, and the surface of the guide part is provided with a guide groove.
Preferably, the limiting parts are symmetrically arranged on two sides of the first plunger.
Preferably, the thickness of the contact part is 1mm-3mm, and the thickness of the guide part is 0.1-0.5 mm.
Preferably, one end of the first elastic sheet is provided with a guide protrusion, and one end of the second elastic sheet is provided with a contact protrusion.
Preferably, the contact projection is provided in a chevron shape.
Compared with the prior art, the beneficial effects of the utility model are as follows:
the utility model discloses a set the thickness of guide part to being less than the thickness of contact site, increased the toughness of probe, saved the material, be fit for some limit interval conductive pin interval more small electronic test simultaneously, through designing into the chevron with the contact plush copper, the bottom is used for joint coil spring, and the top is used for contacting the chip pin and tests, and the contact site is minimum, can not produce the short circuit.
Drawings
Fig. 1 is a schematic structural view of the present invention;
fig. 2 is a schematic structural diagram of the first plunger of the present invention;
fig. 3 is a schematic structural view of the second plunger of the present invention;
fig. 4 is a schematic structural view of the rotary spring of the present invention;
fig. 5 is a schematic structural diagram of a side view section of the present invention;
fig. 6 is a schematic side view of the present invention;
FIG. 7 is an enlarged view of portion A of FIG. 6 according to the present invention;
fig. 8 is a schematic structural view of a front view section of the present invention;
FIG. 9 is an enlarged view of portion B of FIG. 8 according to the present invention;
fig. 10 is a schematic structural view of the upper side of the present invention.
In the figure: 1 a first plunger, 11 a contact part, 111 a contact end, 12 a limiting part, 13 a guide part, 131 a guide groove, 2 a second plunger, 21 a contact boss, 22 a first elastic sheet, 221 a guide projection, 23 a second elastic sheet, 231 a contact projection and 3 a rotating spring.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
Referring to fig. 1-10, a novel probe comprises a first plunger 1, a second plunger 2 and a rotating spring 3, wherein the rotating spring 3 is sleeved outside the second plunger 2, the second plunger 2 and the first plunger 1 are installed in a cross manner, the first plunger 1 comprises a contact part 11, a limiting part 12 and a guide part 13, one side of the contact part 11 is provided with a contact end 111, the limiting part 12 is symmetrically arranged at two sides of the first plunger 1, the limiting part 12 plays a role of limiting the rotating spring 3, the surface of the guide part 13 is provided with a guide groove 131, the guide groove 131 plays a role of limiting a guide protrusion 221, so that the guide protrusion 221 slides in the guide groove, the thickness of the contact part 11 is 1mm-3mm, the thickness of the guide part 13 is 0.1 mm-0.5 mm, and the thickness of the guide part 13 is set to be smaller than the thickness of the contact part 11, so as to increase the toughness of the probe, the material is saved, the electronic test that is fit for some limit interval (the conductive pin interval is more little) simultaneously, second plunger 2 is including contact plush copper 21, first flexure strip 22 and second flexure strip 23, contact plush copper 21 sets up the chevron shape, through designing contact plush copper 21 into the chevron shape, the bottom is used for joint coil spring 3, the top is used for contacting the chip pin and tests, the contact site is minimum, can not produce the short circuit, the one end of first flexure strip 22 is provided with direction arch 221, the one end of second flexure strip 23 is provided with contact arch 231.
The working principle is as follows: this novel probe, with the outside of rotating spring 3 cover first flexure strip 22 and second flexure strip 23 in second plunger 2, be the fork installation with second plunger 2 and first plunger 1 again, make the direction of the one end of first flexure strip 22 protruding 221 card go into in the guide way 131 in the guide part 13.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (6)
1. A novel probe comprises a first plunger (1), a second plunger (2) and a rotating spring (3), and is characterized in that: the first plunger (1) comprises a contact part (11), a limiting part (12) and a guide part (13), and the second plunger (2) comprises a contact raised head (21), a first elastic sheet (22) and a second elastic sheet (23).
2. The novel probe of claim 1, wherein: one side of the contact part (11) is provided with a contact end (111), and the surface of the guide part (13) is provided with a guide groove (131).
3. The novel probe of claim 1, wherein: the limiting parts (12) are symmetrically arranged on two sides of the first plunger (1).
4. The novel probe of claim 1, wherein: the thickness of the contact part (11) is 1mm-3mm, and the thickness of the guide part (13) is 0.1-0.5 mm.
5. The novel probe of claim 1, wherein: one end of the first elastic sheet (22) is provided with a guide protrusion (221), and one end of the second elastic sheet (23) is provided with a contact protrusion (231).
6. The novel probe of claim 1, wherein: the contact projection (21) is arranged in a chevron shape.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202022589189.6U CN213544638U (en) | 2020-11-10 | 2020-11-10 | Novel probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202022589189.6U CN213544638U (en) | 2020-11-10 | 2020-11-10 | Novel probe |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN213544638U true CN213544638U (en) | 2021-06-25 |
Family
ID=76481483
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202022589189.6U Active CN213544638U (en) | 2020-11-10 | 2020-11-10 | Novel probe |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN213544638U (en) |
-
2020
- 2020-11-10 CN CN202022589189.6U patent/CN213544638U/en active Active
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|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |