CN213544448U - Test system for low-temperature hemispherical emissivity of material - Google Patents
Test system for low-temperature hemispherical emissivity of material Download PDFInfo
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- CN213544448U CN213544448U CN202022386379.8U CN202022386379U CN213544448U CN 213544448 U CN213544448 U CN 213544448U CN 202022386379 U CN202022386379 U CN 202022386379U CN 213544448 U CN213544448 U CN 213544448U
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Abstract
The utility model relates to a technical field is measured to the material emissivity, especially relates to a test system of material low temperature hemisphere emissivity. The test system for the low-temperature hemispherical emissivity of the material comprises a test device, a vacuum pump, a refrigerating device and a temperature control device, wherein the vacuum pump and the refrigerating device are respectively connected with the test device, the test device comprises a vacuum cover, a shielding cover, a radiation screen cover and a sample table hung inside the radiation screen cover, the sample table comprises an electric heating sheet and two metal sheets respectively arranged on two sides of the electric heating sheet, one side of each metal sheet, which is back to the electric heating sheet, is respectively provided with a tested sample coating, each metal sheet is respectively provided with a thermometer, and the electric heating sheet and each thermometer are respectively connected with the temperature control device. The utility model provides a test system of material low temperature hemisphere emissivity can realize the continuous measurement of the average hemisphere emissivity of 10K to 300K material, and measurable quantity temperature range is bigger, and then has improved the measuring accuracy.
Description
Technical Field
The utility model relates to a technical field is measured to the material emissivity, especially relates to a test system of material low temperature hemisphere emissivity.
Background
Radiation heat transfer is the main heat transfer mode in a low-temperature environment, and the thermal emissivity is an important parameter for characterizing the thermal radiation characteristics of materials. Thermal emissivity at low temperatures is often required to calculate radiant energy and infrared background radiation. The radiation of a real object differs from that of a black body in that as long as the surface temperature of the object is above 0K, it emits radiant energy of different wavelengths in different directions in the hemispherical space above the surface and also absorbs radiant energy from all directions. The emissivity of a material is defined as the ratio of the total energy per unit time and unit area of an actual object emitted into the hemispherical space at all wavelengths to the total energy radiated by a black body at the same temperature. Since the radiation intensity of an actual object varies with wavelength and spatial direction, emissivity can be divided into spectral emissivity, directional emissivity and average hemispherical emissivity.
In the field of aerospace, thermal emissivity is a key parameter in measuring the thermal protection design of a radiation coating, and can greatly affect the working efficiency and the service life of a component. In the design of satellite detectors and large cryogenic systems, it is important to measure the thermal emissivity of metal and infrared coatings at low temperatures. However, accurate measurement of low temperature thermal emissivity of metals and coatings is a great challenge because thermal radiation wavelengths at low temperatures are mainly above 20 μm and background radiation introduces significant uncertainty.
At present, in the prior art, a measurable temperature region for emissivity is narrow, the measurement of average hemispherical emissivity of a sample with the temperature reduced to 10K cannot be realized, the temperature is reduced by liquid helium, liquid nitrogen and other cryogenic liquids during measurement, the waste of the cryogenic liquids is caused, and the test flow is complicated. In addition, the existing measuring device has fixed sample size and large area, and is not beneficial to the measurement of the average hemispherical emissivity of scarce and expensive sample materials.
SUMMERY OF THE UTILITY MODEL
The utility model discloses aim at solving one of the technical problem that exists among the prior art at least.
For this, the utility model provides a test system of material low temperature hemisphere emissivity can realize 10K to the continuous measurement of the average hemisphere emissivity of 300K material, and measurable quantity temperature range is bigger, and then has improved the measuring accuracy.
The system for testing the emissivity of the low-temperature hemisphere of the material comprises a testing device, a vacuum pump, a refrigerating device and a temperature control device, wherein the vacuum pump and the refrigerating device are respectively connected with the testing device; the testing device comprises a vacuum cover, a shielding cover arranged in the vacuum cover, a radiation screen arranged in the shielding cover and a sample stage arranged in the radiation screen in a hanging manner, wherein the sample stage comprises an electric heating sheet and two metal sheets arranged on two sides of the electric heating sheet respectively, the metal sheets face away from each other, a tested sample coating is arranged on one side of the electric heating sheet respectively, thermometers are arranged on the metal sheets respectively, and the electric heating sheet and the thermometers are connected with the temperature control device respectively.
According to an embodiment of the present invention, the refrigeration device includes a refrigerator and a compressor connected to the refrigerator; the bottom of the testing device is provided with a base support, the refrigerator is arranged on the base support, a primary cold head of the refrigerator penetrates through the vacuum cover to be connected with the bottom of the shielding cover, and a secondary cold head of the refrigerator penetrates through the shielding cover to be connected with the bottom of the radiation shielding cover.
According to an embodiment of the present invention, the radiation shield further comprises a mechanical thermal switch device, the mechanical thermal switch device comprises an adjusting rod, a fixed disk and a clamping mechanism, the fixed disk is fixedly installed above the outside of the vacuum shield, and the clamping mechanism is arranged inside the radiation shield;
the adjusting rod comprises an upper adjusting rod part, an adjusting disc and a lower adjusting rod part which are sequentially arranged from top to bottom, the adjusting disc is arranged inside the vacuum cover, the lower end of the upper adjusting rod part is fixedly connected with the adjusting disc, the upper end of the upper adjusting rod part penetrates through the vacuum cover to be in threaded connection with the fixed disc, the upper end of the lower adjusting rod part is rotatably connected with the adjusting disc, and the lower end of the lower adjusting rod part sequentially penetrates through the shielding cover and the radiation screen cover to be fixedly connected with the clamping mechanism; a limiting block is fixedly arranged at the position, corresponding to the top plate of the shielding case, of the lower part of the adjusting rod, and a limiting groove for limiting the limiting block to move up and down is formed in the top plate of the shielding case;
the clamping mechanism comprises two positioning plates, two first connecting plates, two second connecting plates, two clamping parts and a fixing part, the fixing part is fixedly connected with the lower ends of the lower parts of the adjusting rods, the fixing part is respectively and rotatably connected with the upper ends of the two first connecting plates through a first rotating shaft, the lower ends of the two first connecting plates are respectively and correspondingly and rotatably connected with the upper ends of the two second connecting plates through second rotating shafts, the two second connecting plates are mutually crossed and rotatably connected through a third rotating shaft, and the lower ends of the two second connecting plates are respectively and correspondingly and fixedly connected with the two clamping parts; the upper ends of the two positioning plates are respectively fixedly connected with the top plate of the radiation shield, and the lower ends of the two positioning plates are respectively and correspondingly fixedly connected with the two ends of the third rotating shaft.
According to the utility model discloses an embodiment still includes two metal braid over braid, two the upper end of metal braid over braid respectively with the roof of radiation shield cover is connected, two the lower extreme of metal braid over braid respectively with two the clamping part corresponds the connection.
According to an embodiment of the present invention, the sample stage is connected to the top plate of the radiation shield by a fiber line in a hanging manner; the radiation screen cover is characterized in that a compensation sheet is further arranged above the sample table, the fiber lines comprise a first fiber line and a second fiber line, two ends of the first fiber line are correspondingly connected with the sample table and the compensation sheet respectively, and two ends of the second fiber line are correspondingly connected with the compensation sheet and a top plate of the radiation screen cover respectively.
According to an embodiment of the utility model, the thermometer is including set up in the first thermometer on the sample coating of being surveyed, and encircle set up in the sample coating of being surveyed is all around second thermometer on the sheetmetal.
According to the utility model discloses an embodiment, the inside wall of radiation shield cover is equipped with super black coating.
According to the utility model discloses an embodiment still includes the vacuum gauge, the top of vacuum cover is equipped with detection mouth and extraction opening respectively, the vacuum gauge pass through the detection pipeline with it links to each other to detect the mouth, the vacuum pump pass through the extraction pipeline with the extraction opening links to each other.
According to an embodiment of the utility model, still include the computer, temperature regulating device with the computer links to each other.
The embodiment of the utility model provides an in above-mentioned one or more technical scheme, one of following technological effect has at least:
the test system of the material low temperature hemisphere emissivity of the embodiment of the utility model connects the vacuum pump and the refrigerating device with the test device respectively, the inside of the test device can be vacuumized by the vacuum pump, the inside of the test device can be cooled by the refrigerating device, wherein the test device comprises a vacuum cover, a shielding cover, a radiation shield cover and a sample stage hung in the radiation shield cover, the sample stage comprises an electric heating sheet and metal sheets arranged at two sides of the electric heating sheet, a tested sample coating is arranged on the metal sheets, a thermometer is arranged on the metal sheets, the tested sample coating is used as an emitting end, the radiation shield cover is used as an absorbing end, the heating temperature of the electric heating sheet can be controlled by a temperature control device in the test process, the emitting end is further heated by the electric heating sheet, heat flows from the emitting end to the absorbing end through radiation heat transfer, the absorption end receives the heat transmitted from the emission end, the heating power of the electric heating sheet and the measured temperature of the thermometer can be obtained through the temperature control device, and the emissivity of the measured sample can be obtained through calculation. Therefore, the utility model discloses the test system of material low temperature hemisphere emissivity, the heating temperature of control electric heating plate that can be convenient through temperature regulating device can realize 10K to the continuous measurement of the average hemisphere emissivity of 300K material, and measurable quantity temperature range is bigger, and then has improved the measuring accuracy.
Additional aspects and advantages of the invention will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention.
Drawings
Fig. 1 is a schematic structural diagram of a system for testing low-temperature hemispherical emissivity of a material according to an embodiment of the present invention;
FIG. 2 is a schematic structural diagram of a testing device according to an embodiment of the present invention;
fig. 3 is a schematic view of the internal structure of a radiation shield according to an embodiment of the present invention;
fig. 4 is a schematic structural diagram of a mechanical thermal switching device according to an embodiment of the present invention;
FIG. 5 is a schematic structural diagram of a sample stage according to an embodiment of the present invention;
fig. 6 is a schematic view of the arrangement of the thermometer on the metal sheet in the embodiment of the present invention.
Reference numerals:
1: a testing device; 11: a vacuum hood; 12: a shield case; 13: a radiation shield; 14: a sample stage; 141: an electrical heating sheet; 142: a metal sheet; 143: coating the tested sample; 144: a thermometer;
2: a vacuum pump; 3: a temperature control device;
4: a refrigerator; 41: a first-stage cold head; 42: a second-stage cold head;
5: a compressor; 6: a base support;
7: a mechanical thermal switching device; 71: fixing the disc; 72: a clamping mechanism; 721: positioning a plate; 722: a first connecting plate; 723: a second connecting plate; 724: a clamping portion; 725: a fixed part; 73: the upper part of the adjusting rod; 74: an adjusting disk; 75: the lower part of the adjusting rod; 76: a limiting block; 77: a metal braid;
8: a fiber thread; 9: a compensation plate; 10: a vacuum gauge; 20: and (4) a computer.
Detailed Description
The following describes embodiments of the present invention in further detail with reference to the accompanying drawings and examples. The following examples are intended to illustrate the invention, but are not intended to limit the scope of the invention.
In the description of the embodiments of the present invention, it should be noted that the terms "center", "longitudinal", "lateral", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of describing the embodiments of the present invention and simplifying the description, but do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as limiting the embodiments of the present invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
In the description of the embodiments of the present invention, it should be noted that, unless explicitly stated or limited otherwise, the terms "connected" and "connected" should be interpreted broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; may be directly connected or indirectly connected through an intermediate. The specific meaning of the above terms in the embodiments of the present invention can be understood in specific cases by those skilled in the art.
In embodiments of the invention, unless expressly stated or limited otherwise, the first feature may be directly on or directly under the second feature or indirectly via intermediate members. Also, a first feature "on," "over," and "above" a second feature may be directly or diagonally above the second feature, or may simply indicate that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature may be directly under or obliquely under the first feature, or may simply mean that the first feature is at a lesser elevation than the second feature.
In the description herein, references to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of an embodiment of the invention. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, various embodiments or examples and features of different embodiments or examples described in this specification can be combined and combined by one skilled in the art without contradiction.
As shown in fig. 1 to 6, the embodiment of the present invention provides a system for testing low-temperature hemispherical emissivity of a material, including a testing device 1, a vacuum pump 2, a refrigerating device and a temperature control device 3, wherein the vacuum pump 2 and the refrigerating device are respectively connected to the testing device 1. The inside of the testing device 1 can be evacuated by the vacuum pump 2, and the inside of the testing device 1 can be cooled by the refrigerating device.
Wherein, testing arrangement 1 includes vacuum cover 11, sets up at the inside shield 12 of vacuum cover 11, sets up at the inside radiation shield 13 of shield 12 and hangs the sample platform 14 of setting in radiation shield 13 inside, promptly, vacuum cover 11, shield 12 and radiation shield 13 set gradually from outer to inner, can provide the vacuum environment for test system through vacuum cover 11, can effectively reduce the inside radiant heat of testing arrangement 1 under the refrigeration effect of refrigerating plant through shield 12.
The sample stage 14 includes an electrical heating sheet 141 and two metal sheets 142 respectively adhered to two sides of the electrical heating sheet 141, and a coating 143 of the sample to be measured is respectively disposed on one side of each metal sheet 142 facing away from the electrical heating sheet 141, that is, each metal sheet 142 can be heated by the electrical heating sheet 141, so as to heat the sample to be measured. Each metal sheet 142 is provided with a thermometer 144, and the electric heating sheet 141 and each thermometer 144 are connected to the temperature control device 3 through a measurement lead, that is, the temperature of the metal sheet 142 can be measured by the thermometer 144, and the temperature of the sample to be measured is obtained. The temperature control device 3 can control the electric heating sheet 141 to be in a temperature range of 10K to 300K, and further can realize continuous measurement of the average hemispherical emissivity of the tested sample material in the temperature range of 10K to 300K.
The utility model discloses test system of material low temperature hemisphere emissivity, to be surveyed sample coating 143 as the transmitting terminal, regard radiation shield 13 as the absorption end, in the test process, control the temperature to electric heating plate 141 through temperature regulating device 3, and then heat the transmitting terminal through electric heating plate 141, the heat is passed through the radiation and is flowed to the absorption end from the transmitting terminal, the absorption end receives the heat from the transmitting terminal conveying, can obtain the heating power of electric heating plate 141 and the measurement temperature of each thermometer 144 through temperature regulating device 3, and then be convenient for calculate the emissivity of acquireing the surveyed sample.
From this, adopt the utility model discloses test system of material low temperature hemisphere emissivity, the heating temperature of control electric heating plate 141 that can be convenient through temperature regulating device 3 for the measurable quantity temperature range of being surveyed the sample material is wider, and then has improved the measuring accuracy.
And, adopt the utility model discloses the test system of material low temperature hemisphere emissivity owing to will be surveyed the sample setting and carry out the measurement on sample platform 14, consequently can realize the measurement of small-size surveyed the sample, and then can realize scarce, expensive sample material's average hemisphere emissivity measurement. Moreover, the area of the sample coating 143 can be changed by changing the size of the metal sheet 142, so that the measurement is more flexible and convenient.
Specifically, the vacuum cover 11 is formed by butt-jointing an upper section of the vacuum cover and a lower section of the vacuum cover, and the upper section of the vacuum cover and the lower section of the vacuum cover are connected through a flange, so that the structure assembly inside the vacuum cover 11 is facilitated. Wherein the vacuum cover 11 can be made of stainless steel, thereby ensuring the structural strength of the vacuum cover 11.
Specifically, the metal sheet 142 may be made of aluminum, which not only facilitates heat conduction from the electric heating sheet 141 to the sample coating 143 to be tested, but also facilitates spray setting of the sample coating 143 on the metal sheet 142.
Specifically, the temperature control device 3 may be a digital temperature controller.
In the utility model discloses a further embodiment, refrigerating plant includes refrigerator 4 and the compressor 5 of being connected with refrigerator 4, and the one-level cold head 41 of refrigerator 4 passes vacuum hood 11 and links to each other with the bottom of shield cover 12 to cool down shield cover 12 through the one-level cold head 41 of refrigerator 4. The secondary cold head 42 of the refrigerator 4 passes through the shield 12 and is connected with the bottom of the radiation shield 13, so that the radiation shield 13 is cooled by the secondary cold head 42 of the refrigerator 4. The refrigerator 4 is used as a cold source of the testing device 1, so that the use of low-temperature liquid for refrigeration is avoided, and the operation is simpler and safer.
The shielding cover 12 and the radiation shield cover 13 are both made of red copper, so that the effect of cold transfer of the shielding cover 12 and the radiation shield cover 13 is improved. In addition, a plurality of layers of heat insulating materials can be arranged on the outer side of the radiation shield 13, so that the heat radiation of the test chamber in the radiation shield 13 is further reduced.
Wherein, the bottom of the testing device 1 is provided with a base bracket 6, and the refrigerator 4 is arranged on the base bracket 6. Through setting up base support 6, not only can support testing arrangement 1, can also be used for installing refrigerator 4, be convenient for realize the assembly between refrigerator 4 and testing arrangement 1.
In some embodiments of the present invention, the testing system further comprises a mechanical thermal switch device 7, the mechanical thermal switch device 7 comprises an adjusting rod, a fixing disk 71 and a clamping mechanism 72, wherein the fixing disk 71 is fixedly installed above the outside of the vacuum housing 11, and the clamping mechanism 72 is disposed inside the radiation shield 13.
The adjusting rod comprises an adjusting rod upper portion 73, an adjusting disc 74 and an adjusting rod lower portion 75 which are sequentially arranged from top to bottom, the adjusting disc 74 is arranged inside the vacuum cover 11, the lower end of the adjusting rod upper portion 73 is fixedly connected with the adjusting disc 74, the upper end of the adjusting rod upper portion 73 penetrates through the vacuum cover 11 and is in threaded connection with the fixed disc 71, the upper end of the adjusting rod lower portion 75 is rotatably connected with the adjusting disc 74, and the lower end of the adjusting rod lower portion 75 sequentially penetrates through the shielding cover 12, the radiation screen cover 13 and the clamping mechanism 72 and is fixedly connected. A limiting block 76 is fixedly arranged on the lower part 75 of the adjusting rod at a position corresponding to the top plate of the shielding case 12, and a limiting groove for limiting the limiting block 76 to move up and down is arranged on the top plate of the shielding case 12. That is, the adjustment lever upper part 73 is rotated outside the vacuum housing 11, and the adjustment lever upper part 73 is screwed to the fixed disk 71, thereby moving up and down the adjustment lever upper part 73. When the adjustment lever upper part 73 is rotated, the adjustment disc 74 is driven to rotate synchronously. Due to the rotation matching mode between the adjusting disc 74 and the adjusting rod lower portion 75 and the limiting function between the limiting block 76 and the limiting groove of the shielding case 12, when the adjusting rod upper portion 73 rotates, the adjusting rod lower portion 75 cannot rotate but only can move up and down, and the clamping action of the clamping mechanism 72 is controlled by the up-and-down movement of the adjusting rod lower portion 75.
The clamping mechanism 72 includes two positioning plates 721, two first connecting plates 722, two second connecting plates 723, two clamping portions 724, and a fixing portion 725, the fixing portion 725 is fixedly connected to the lower end of the lower portion 75 of the adjusting rod, the fixing portion 725 is rotatably connected to the upper ends of the two first connecting plates 722 through a first rotating shaft, and the two clamping portions 724 are correspondingly disposed on two sides of the sample stage 14. The lower ends of the two first connecting plates 722 are respectively and correspondingly rotatably connected with the upper ends of the two second connecting plates 723 through second rotating shafts, the two second connecting plates 723 are mutually crossed and rotatably connected through third rotating shafts, and the lower ends of the two second connecting plates 723 are respectively and correspondingly and fixedly connected with the two clamping portions 724. The upper ends of the two positioning plates 721 are respectively and fixedly connected with the top plate of the radiation shield 13, and the lower ends of the two positioning plates 721 are respectively and correspondingly and fixedly connected with the two ends of the third rotating shaft. That is, the position of the third rotating shaft can be restricted from being fixed by the two positioning plates 721.
When the adjusting rod lower portion 75 moves upward, the fixing portion 725 can drive the included angle between the two first connecting plates 722 to decrease, so as to drive the lower end distance between the second connecting plates 723 to decrease, further drive the distance between the two clamping portions 724 to decrease, and further can clamp the sample platform 14 through the two clamping portions 724. Conversely, when the lower portion 75 of the adjustment lever moves downward, the two holding portions 724 are separated from the sample stage 14.
Because fixture 72 adopts heat conduction metal to make to fixture 72 is through two locating plates 721 and radiation shield 13 lug connection, consequently when refrigerating plant carries out the refrigeration cooling to radiation shield 13, carries out the centre gripping contact with sample platform 14 with two clamping parts 724, and then the cold volume of radiation shield 13 can be transmitted to sample platform 14 through fixture 72 rapidly, thereby carries out rapid cooling to the sample that is surveyed, and then can shorten test cycle.
Further, two metal braided straps 77 may be provided inside the radiation shield 13, the upper ends of the two metal braided straps 77 are connected to the top plate of the radiation shield 13, and the lower ends of the two metal braided straps 77 are correspondingly connected to the two holding portions 724, respectively. Through setting up metal braid 77, can make the cold volume of radiation shield cover 13 directly transmit to clamping part 724 through metal braid 77, the rethread clamping part 724 transmits to sample platform 14, further cold volume transfer rate. In order to ensure the cold energy transfer performance of the metal braid 77, the metal braid 77 may be made of copper.
In a further embodiment of the present invention, the sample stage 14 is suspended and connected to the top plate of the radiation shield 13 by the fiber thread 8, thereby minimizing the loss of heat. The fiber thread 8 may be a Kevlar fiber thread having a thermal conductivity of 0.048W/(m · K), or may be a fiber thread made of other material having a low thermal conductivity according to actual needs.
Specifically, the compensation sheet 9 is further arranged above the sample stage 14, the fiber line 8 comprises a first fiber line and a second fiber line, two ends of the first fiber line are correspondingly connected with the sample stage 14 and the compensation sheet 9, respectively, and two ends of the second fiber line are correspondingly connected with the compensation sheet 9 and a top plate of the radiation shield 13, respectively. By providing the compensation fins 9, heat conduction and heat leakage of the fiber wires 8 can be further reduced.
In one embodiment of the present invention, the thermometer 144 comprises at least one first thermometer disposed on the surface of the sample coating 143 to be measured, and a plurality of second thermometers disposed around the metal sheet 142 disposed around the sample coating 143 to be measured. Through the arrangement mode of first thermometer and second thermometer, can be more accurate, comprehensive acquire the temperature numerical value of transmitting terminal, and then improved the test accuracy.
The utility model discloses an in the embodiment, the inside wall spraying of radiation shield 13 has the super black coating that the absorption rate is high to better receipt is from the heat of transmitting terminal conveying, and then has improved the test accuracy.
The utility model discloses a further embodiment, this test system still includes vacuum gauge 10, and the top of vacuum cover 11 is equipped with detection mouth and extraction opening respectively, and vacuum gauge 10 links to each other with the detection mouth through detecting the pipeline, and vacuum pump 2 passes through the extraction pipeline and links to each other with the extraction opening. When the inside of the test apparatus 1 is evacuated by the vacuum pump 2, the vacuum degree inside the test apparatus 1 can be measured and obtained by the vacuum gauge 10.
In a further embodiment of the invention, the test system further comprises a computer 20, wherein the temperature control device 3 is connected to the computer 20. The temperature control device 3 can be controlled by the computer 20, and the heating temperature of the electric heating sheet 141 is controlled by the temperature control device 3. Meanwhile, the heating power of the electric heating plate 141 and the temperature measurement data of each thermometer 144 can be transmitted to the computer 20 through the temperature control device 3, so that the computer 20 processes the data, and finally the emissivity of the measured sample is obtained through calculation.
The test process of the test system is as follows:
a sample coating 143 to be measured is provided on the sample stage 14, a thermometer 144 is disposed on the sample stage 14, and then the sample stage 14 is mounted inside the radiation shield 13.
The vacuum pump 2 is turned on to evacuate the inside of the test apparatus 1.
And starting the refrigerating device to cool the inside of the testing device 1.
The mechanical thermal switch device 7 is operated to make the two clamping parts 724 respectively contact with the sample stage 14, so that the cold energy of the radiation shield 13 is quickly transferred to the sample stage 14.
After the temperature of the sample stage 14 is stabilized, the mechanical thermal switch device 7 is operated to separate the two clamping portions 724 from the sample stage 14 respectively.
The heating temperature of the electric heating sheet 141 is controlled by the temperature control device 3 to control the temperature of the sample coating 143 on the sample stage 14. The temperature of the electric heating sheet 141 can be set to 10K, 20K, 30K … … 300K by the temperature control device 3.
The heating power of the electric heating plate 141 and the measured temperature of each thermometer 144 are collected by the temperature control device 3, and then the emissivity of the sample to be measured is calculated and obtained by the computer 20.
The above embodiments are merely illustrative, and not restrictive, of the present invention. Although the present invention has been described in detail with reference to the embodiments, it should be understood by those skilled in the art that various combinations, modifications or equivalent substitutions may be made to the technical solution of the present invention without departing from the spirit and scope of the technical solution of the present invention, and all of the technical solutions should be covered by the scope of the claims of the present invention.
Claims (9)
1. The utility model provides a test system of material low temperature hemisphere emissivity which characterized in that: the device comprises a testing device, a vacuum pump, a refrigerating device and a temperature control device, wherein the vacuum pump and the refrigerating device are respectively connected with the testing device; the testing device comprises a vacuum cover, a shielding cover arranged in the vacuum cover, a radiation screen arranged in the shielding cover and a sample stage arranged in the radiation screen in a hanging manner, wherein the sample stage comprises an electric heating sheet and two metal sheets arranged on two sides of the electric heating sheet respectively, the metal sheets face away from each other, a tested sample coating is arranged on one side of the electric heating sheet respectively, thermometers are arranged on the metal sheets respectively, and the electric heating sheet and the thermometers are connected with the temperature control device respectively.
2. The system for testing the low-temperature hemispherical emissivity of a material according to claim 1, wherein: the refrigerating device comprises a refrigerator and a compressor connected with the refrigerator; the bottom of the testing device is provided with a base support, the refrigerator is arranged on the base support, a primary cold head of the refrigerator penetrates through the vacuum cover to be connected with the bottom of the shielding cover, and a secondary cold head of the refrigerator penetrates through the shielding cover to be connected with the bottom of the radiation shielding cover.
3. The system for testing the low-temperature hemispherical emissivity of a material according to claim 1, wherein: the radiation shield cover is characterized by further comprising a mechanical thermal switch device, wherein the mechanical thermal switch device comprises an adjusting rod, a fixed disc and a clamping mechanism, the fixed disc is fixedly arranged above the outer part of the vacuum cover, and the clamping mechanism is arranged in the radiation shield cover;
the adjusting rod comprises an upper adjusting rod part, an adjusting disc and a lower adjusting rod part which are sequentially arranged from top to bottom, the adjusting disc is arranged inside the vacuum cover, the lower end of the upper adjusting rod part is fixedly connected with the adjusting disc, the upper end of the upper adjusting rod part penetrates through the vacuum cover to be in threaded connection with the fixed disc, the upper end of the lower adjusting rod part is rotatably connected with the adjusting disc, and the lower end of the lower adjusting rod part sequentially penetrates through the shielding cover and the radiation screen cover to be fixedly connected with the clamping mechanism; a limiting block is fixedly arranged at the position, corresponding to the top plate of the shielding case, of the lower part of the adjusting rod, and a limiting groove for limiting the limiting block to move up and down is formed in the top plate of the shielding case;
the clamping mechanism comprises two positioning plates, two first connecting plates, two second connecting plates, two clamping parts and a fixing part, the fixing part is fixedly connected with the lower ends of the lower parts of the adjusting rods, the fixing part is respectively and rotatably connected with the upper ends of the two first connecting plates through a first rotating shaft, the lower ends of the two first connecting plates are respectively and correspondingly and rotatably connected with the upper ends of the two second connecting plates through second rotating shafts, the two second connecting plates are mutually crossed and rotatably connected through a third rotating shaft, and the lower ends of the two second connecting plates are respectively and correspondingly and fixedly connected with the two clamping parts; the upper ends of the two positioning plates are respectively fixedly connected with the top plate of the radiation shield, and the lower ends of the two positioning plates are respectively and correspondingly fixedly connected with the two ends of the third rotating shaft.
4. The system for testing the low-temperature hemispherical emissivity of a material according to claim 3, wherein: the radiation shield cover is characterized by further comprising two metal woven belts, the upper ends of the two metal woven belts are respectively connected with the top plate of the radiation shield cover, and the lower ends of the two metal woven belts are respectively correspondingly connected with the two clamping parts.
5. The system for testing the low-temperature hemispherical emissivity of a material according to claim 1, wherein: the sample stage is connected with a top plate of the radiation shield in a hanging manner through a fiber line; the radiation screen cover is characterized in that a compensation sheet is further arranged above the sample table, the fiber lines comprise a first fiber line and a second fiber line, two ends of the first fiber line are correspondingly connected with the sample table and the compensation sheet respectively, and two ends of the second fiber line are correspondingly connected with the compensation sheet and a top plate of the radiation screen cover respectively.
6. The system for testing the low-temperature hemispherical emissivity of a material according to any one of claims 1 to 5, wherein: the thermometer comprises a first thermometer arranged on the coating of the tested sample and a second thermometer arranged on the metal sheet around the coating of the tested sample.
7. The system for testing the low-temperature hemispherical emissivity of a material according to any one of claims 1 to 5, wherein: and the inner side wall of the radiation shield is provided with an ultra-black coating.
8. The system for testing the low-temperature hemispherical emissivity of a material according to any one of claims 1 to 5, wherein: the vacuum detection device is characterized by further comprising a vacuum gauge, wherein the top of the vacuum cover is respectively provided with a detection port and an extraction port, the vacuum gauge is connected with the detection port through a detection pipeline, and the vacuum pump is connected with the extraction port through an extraction pipeline.
9. The system for testing the low-temperature hemispherical emissivity of a material according to any one of claims 1 to 5, wherein: the temperature control device is connected with the computer.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202022386379.8U CN213544448U (en) | 2020-10-23 | 2020-10-23 | Test system for low-temperature hemispherical emissivity of material |
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| CN202022386379.8U CN213544448U (en) | 2020-10-23 | 2020-10-23 | Test system for low-temperature hemispherical emissivity of material |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114486981A (en) * | 2020-10-23 | 2022-05-13 | 中国科学院理化技术研究所 | System and method for testing low-temperature hemispherical emissivity of material |
| CN114486981B (en) * | 2020-10-23 | 2024-10-25 | 中国科学院理化技术研究所 | System and method for testing emissivity of material low-temperature hemisphere |
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2020
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114486981A (en) * | 2020-10-23 | 2022-05-13 | 中国科学院理化技术研究所 | System and method for testing low-temperature hemispherical emissivity of material |
| CN114486981B (en) * | 2020-10-23 | 2024-10-25 | 中国科学院理化技术研究所 | System and method for testing emissivity of material low-temperature hemisphere |
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