CN213517350U - Serial port testing device - Google Patents
Serial port testing device Download PDFInfo
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- CN213517350U CN213517350U CN202021793589.2U CN202021793589U CN213517350U CN 213517350 U CN213517350 U CN 213517350U CN 202021793589 U CN202021793589 U CN 202021793589U CN 213517350 U CN213517350 U CN 213517350U
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Abstract
The application provides a serial ports testing arrangement to set up RJ45 seat or arrange the needle and be used for the serial ports test in the equipment product, lead to the higher problem of product cost. The device includes: a housing; the test board is positioned in the shell; one end of the probe component is connected with the test board, and the other end of the probe component penetrates through the first end of the shell and extends out of the shell; and one end of the lead is connected with the test board, and the other end of the lead penetrates through the second end of the shell and extends out of the shell. Be provided with the casing, be connected through the one end with the probe part and the interior test panel of casing, the other end stretches out outside the casing, only needs to contact the other end of probe part and the reservation contact of the equipment that awaits measuring, reads serial port information, through lead wire output serial port information can, through the serial ports testing arrangement of this embodiment, only need set up the reservation contact in the equipment that awaits measuring, need not additionally to set up RJ45 seat and pin header, can realize the test of treating equipment of awaiting measuring, reduce the cost of the equipment that awaits measuring.
Description
Technical Field
The application relates to the technical field of equipment, in particular to a serial port testing device.
Background
In order to facilitate subsequent detection and maintenance of products, serial port interfaces are generally reserved for equipment products during shipment, and at present, an RJ45 seat is generally reserved on a PCB of the product, or a pin header is reserved on the PCB so as to be used as a debugging serial port.
In order to realize serial port test, an RJ45 seat or pin needs to be arranged on a product, and the serial port test of the product is realized through matching of a matched element with the RJ45 seat or pin, so that the cost of the product is high.
Disclosure of Invention
The embodiment of the application provides a serial ports testing arrangement to it is used for the serial ports test to solve to set up RJ45 seat or row needle in the product at present, leads to the higher problem of product cost.
In order to solve the technical problem, the present application is implemented as follows:
in a first aspect, an embodiment of the present application provides a serial port testing apparatus, including:
a housing;
the test board is positioned in the shell;
one end of the probe component is connected with the test board, and the other end of the probe component penetrates through the first end of the shell and extends out of the shell;
and one end of the lead is connected with the test board, and the other end of the lead penetrates through the second end of the shell and extends out of the shell.
Optionally, the clamping device further comprises at least one clamping part, and the clamping part is arranged on the outer side face of the shell.
Optionally, the at least one clamping part includes a first clamping part and a second clamping part, the first clamping part is disposed on a first outer side of the housing, the second clamping part is disposed on a second outer side of the housing, and the first outer side is opposite to the second outer side.
Optionally, the first retaining part includes a first retaining arm and a first protrusion disposed at one end of the first retaining arm, the other end of the first retaining arm is mounted on the first outer side surface, and the first protrusion faces away from the first outer side surface;
the second clamping part comprises a second clamping arm and a second protrusion arranged at one end of the second clamping arm, the other end of the second clamping arm is arranged on the second outer side face, and the second protrusion faces away from the second outer side face.
Optionally, the probe component includes probe, elastic component and sleeve, the elastic component all is located the casing with telling the sleeve, the elastic component with telescopic one end is connected, telescopic other end is installed in the casing, the one end of probe is passed through the elastic component and the sleeve is installed in the casing, the other end of probe passes the first end of casing stretches out outside the casing.
Optionally, a distance between one end of the first chucking arm and the first end of the housing is smaller than a distance between the other end of the probe and the first end of the housing, and a distance between one end of the second chucking arm and the first end of the housing is smaller than a distance between the other end of the probe and the first end of the housing.
Optionally, a distance between one end of the first retaining arm and the first end of the housing is the same as a distance between one end of the second retaining arm and the first end of the housing.
Optionally, the number of the probes is multiple, and the number of the probes, the number of the elastic members and the number of the sleeves are the same.
Optionally, the housing is made of PP or PC material.
In the serial ports testing arrangement of this application embodiment, be provided with the casing, be connected through the one end with the probe part and the interior test panel of casing, the other end stretches out outside the casing, only need to contact the other end of probe part and the reservation contact of the equipment that awaits measuring, read serial port information, through lead wire output serial port information can, through the serial ports testing arrangement of this embodiment, only need set up the reservation contact in the equipment that awaits measuring, need not additionally to set up RJ45 seat and pin header, can realize treating the test of equipment that awaits measuring, reduce the cost of the equipment that awaits measuring.
Drawings
Fig. 1 is one of structural diagrams of a serial port testing apparatus according to an embodiment of the present application;
fig. 2 is a second structural diagram of a serial port testing device according to an embodiment of the present application;
fig. 3 is a third structural diagram of a serial port testing device according to an embodiment of the present application;
fig. 4 is a fourth structural diagram of a serial port testing device according to an embodiment of the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some, but not all, embodiments of the present application. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
Referring to fig. 1-4, a serial port testing device 100 of an embodiment is provided, comprising:
a housing 101;
a test board 102 located within the housing 101;
a probe component 103, one end of the probe component 103 is connected with the test board 102, and the other end of the probe component 103 passes through the first end of the shell 101 and extends out of the shell 101;
and one end of the lead 104 is connected with the test board 103, and the other end of the lead 104 passes through the second end of the shell 101 and extends out of the shell 101.
The other end of the probe component 103 is used for contacting with a reserved contact 202 of a device to be tested, and can be used for contacting with the reserved contact 202 of the PCB201 of the device to be tested, namely, the reserved contact 202 is arranged in the device to be tested and is used for contacting with the probe component 103, serial port information of the device to be tested is transmitted to the probe component 103 through the contact 202, reading of the serial port information by the probe component 103 is achieved, it can be understood that the serial port information of the device to be tested is read by the probe component 103 through contact with the reserved contact 202, the serial port information is transmitted to the lead 104 through the test board 102, and the serial port information is output through the lead 104.
In serial ports testing arrangement 100 of this embodiment, be provided with casing 101, one end through with probe part 103 is connected with the interior test panel 102 of casing 101, the other end stretches out outside casing 101, only need to contact probe part 103's the other end and the reservation contact 202 of the equipment under test, read serial port information, through lead wire 104 output serial port information can, through serial ports testing arrangement 100 of this embodiment, only need set up reservation contact 202 in the equipment under test, need not additionally to set up RJ45 seat and pin header, can realize treating the test of equipment under test, reduce the cost of the equipment under test.
In one embodiment, the test board further comprises a first clamping part and a second clamping part, the shell is provided with a containing cavity, the test board is located in the containing cavity, the shell comprises an inner side face and an outer side face, the inner side face faces the containing cavity, the outer side face faces away from the containing cavity, the outer side face comprises a first outer side face and a second outer side face, the first clamping part is arranged on the first outer side face of the shell, and the second clamping part is arranged on the second outer side face of the shell.
That is, the first outer side and the second outer side of the casing 101 are respectively provided with a clamping component for clamping with the device to be tested, so that the serial port testing device 100 can be more stably fixed with the device to be tested. As an example, the first and second clamping members are symmetrical with respect to the housing 101, so that the serial port testing device 100 can be better clamped with the device under test.
As an example, the housing 203 of the device under test is provided with a card hole, the PCB board 201 of the device under test is provided with a reserved contact 202, and the card holding component can be engaged with the housing 203 through the card hole. The number of the clamping holes is the same as that of the clamping parts, the clamping holes are arranged at intervals, and the distance between the clamping holes on the shell 203 is matched with that between the clamping parts.
In one embodiment, as shown in FIG. 1, the first catch member includes a first catch arm 105 and a first protrusion 107 disposed at one end of the first catch arm 105, the other end of the first catch arm 105 is mounted on the first outer side, and the first protrusion 107 faces away from the first outer side. The second retaining member includes a second retaining arm 106 and a second protrusion 108 disposed at one end of the second retaining arm 106, the other end of the second retaining arm 106 is mounted on the second outer side, and the second protrusion 108 faces away from the second outer side.
The first latching member can be engaged with the device to be tested through the first latching arm 105 and the first protrusion 107, and the second latching member can be engaged with the device to be tested through the second latching arm 106 and the second protrusion 108, for example, as shown in fig. 3, the card hole in the housing 203 of the device to be tested includes a first sub-card hole 204 and a second sub-card hole 205, the first latching arm 105 is pressed towards the direction of the housing 101, one end of the first latching arm 105 passes through the first sub-card hole 204 and then loosens the first latching arm 105, a part of the first latching arm 105 is located in the first card hole, the first protrusion 107 abuts against the inner wall of the housing 203, so as to achieve the engagement of the first latching member with the housing 203, and the other end of the probe member 103 contacts with the reserved contact 202. Similarly, the second retaining arm 106 is pressed towards the housing 101, one end of the second retaining arm 106 passes through the second sub-retaining hole 205 and then releases the second retaining arm 106, a portion of the second retaining arm 106 is located in the second retaining hole, and the second protrusion 108 abuts against the inner wall of the housing 203, so that the second retaining member is engaged with the housing 203.
As an example, the portion of the probe assembly 103 extending outside of the housing 101, the portion of the first catch arm 105 opposite the housing 101, and the portion of the second catch arm 106 opposite the housing 101 are parallel, with the portion of the probe assembly 103 between the first and second catch arms 105, 106, it being understood that the first protrusion 107 faces away from the probe assembly 103 and the second protrusion 108 faces away from the probe assembly 103.
In one embodiment, in the extending direction of the probe part 103, the distance of one end of the first chucking arm 105 with respect to the first end of the housing 101 is smaller than the distance of the other end of the probe part 103 with respect to the first end of the housing 101, and the distance of one end of the second chucking arm 106 with respect to the first end of the housing 101 is smaller than the distance of the other end of the probe part 103 with respect to the first end of the housing 101.
That is, along the same direction (for example, the direction from the other end of the probe member 103 to the one end of the probe member 103, that is, along the extending direction of the probe member 103), the length of the one end of the first chucking arm 105 with respect to the first end of the housing 101 is shorter than the length of the other end of the probe 1031 with respect to the first end of the housing 101, and along the direction, the distance from the one end of the second chucking arm 106 with respect to the first end of the housing 101 is shorter than the distance from the other end of the probe member 103 with respect to the first end of the housing 101, so that the other end of the probe member 103 is better contacted with the reserved contact 202 after the first chucking arm 105 is engaged with the device under test housing 203.
As an example, a through hole 206 is further provided between the first sub card hole 204 and the second sub card hole 205 of the housing 203 of the device under test, the probe 1031 passes through the through hole 206, one end of the first chucking arm 105 passes through the first sub card hole 204, one end of the second chucking arm 106 passes through the second sub card hole 205, the probe part 103 is engaged with the housing 203, and a distance between the other end of the probe part 103 and the first surface (the surface facing the second end) of the first protrusion 107 of the first chucking arm 105 along a direction from the other end of the probe part 103 to one end of the probe part 103 is greater than or equal to a distance between the housing 203 and the PCB board 201 provided with the reserved contact 202, so that the probe 1031 can be ensured to be in contact with the reserved contact 202.
In one embodiment, the end of the first catch arm 105 is the same distance from the first end of the housing 101 as the end of the second catch arm 106 is from the first end of the housing 101. Therefore, the clamping effect of the first clamping part and the second clamping part with other equipment can be improved. As an example, in the same direction, for example, the extending direction of the probe part 103, the distance of one end of the first chucking arm 105 with respect to the first end of the housing 101 is the same as the distance of one end of the second chucking arm 106 with respect to the first end of the housing 101.
In one embodiment, the extending direction of the probe member 103, the extending direction of the first retaining wall 105 and the extending direction of the second retaining wall 106 are the same, for example, all directions are from the second end to the first end of the casing 101, so that the serial port testing apparatus can be clamped with the device under test through the first retaining wall 105 and the second retaining wall 106, and the probe member 103 can be contacted with a reserved electric shock in the device under test.
In one embodiment, the probe component 103 includes a probe 1031, an elastic member 1032 and a sleeve 1033, the elastic member 1032 and the sleeve 1033 are both located in the housing 101, one end of the elastic member 1032 is connected to one end of the sleeve 1033, the other end of the sleeve 1033 is installed in the housing 101, one end of the probe 1031 is connected to the other end of the elastic member 1032, that is, one end of the probe 1031 is installed in the housing 101 through the elastic member 1032 and the sleeve 1033, and the other end of the probe 1031 passes through the first end of the housing 101 and protrudes out of the housing 101.
That is, one end of the probe 1031 is connected to one end of the cartridge 1033 through the elastic member 1032, and the other end of the cartridge 1033 is mounted in the housing 101, thereby achieving that one end of the probe 1031 is mounted in the housing 101 through the elastic member 1032 and the cartridge 1033. The other end of probe 1031 is used for contacting with reserved contact 202 of the equipment to be tested, can be used for contacting with preset contact 202 of PCB board 201 of the equipment to be tested, namely, reserved contact 202 is arranged in the equipment to be tested, and is used for contacting with the other end of probe 1031, and the serial port information of the equipment to be tested is transmitted to the other end of probe 1031 through contact 202, so that the reading of the serial port information by probe 1031 is realized, and it can be understood that the serial port information of the equipment to be tested is read by one end of probe 1031 through the contact with reserved contact 202, and is output through lead 104, thereby realizing the serial port test. In this embodiment, the probe 1031 is connected to the sleeve 1033 by the elastic member 1032, so that the probe 1031 can be engaged with the housing 203 through the engaging hole more flexibly. As one example, the elastic member 1032 may be a spring.
In one embodiment, the number of the probe members 103 is plural, and the plural probe members 103 are arranged at intervals. Each probe component 103 comprises a plurality of probe members 1031, resilient members 1032 and sleeves 1033, and the number of probe members 103 is understood to be plural, and the number of probe members 1031, the number of resilient members 1032 and the number of sleeves 1033 are the same, and are respectively the same as the number of probe members 103. That is, the probes 1031, the elastic members 1032 and the sleeves 1033 correspond one to one, and thus, the probes 1031 can be more reliably mounted to the housing 101.
In one embodiment, the other ends of the plurality of probe members 103 are spaced apart from the first end of the housing 101 at the same distance, so that the plurality of probe members 103 can be brought into better contact with the reserved contacts. As an example, the probes 1031 in the plurality of probe components 103 are arranged at intervals and in parallel, and the other ends of the plurality of probe components 103 are at the same distance from the first end of the housing 101, and it can be understood that the other ends of the plurality of probe components 103 are at the same distance from the first end of the housing 101 and the other ends of the probes 1031 in the plurality of probe components 103 are at the same distance from the first end of the housing 101 along the extending direction of the probe components.
In one embodiment, the casing 101 is made of PP material or PC material, so that the service life of the casing 101 can be prolonged, thereby prolonging the service life of the serial port testing device 100.
The structure and principle of the serial port testing device 100 are described below with an embodiment.
As shown in fig. 1-2, the serial port testing device 100 of the present embodiment includes an elastic probe member 103, a testing board 102 (testing PCB), a lead 104, and a plastic housing 101 with a clamping member. The probe member 103 of this embodiment is different from the ordinary fixed-length probe 1031 in that the probe member 103 of this embodiment is composed of three parts, i.e., the probe 1031, the elastic member 1032, and the sleeve 1033. As shown in fig. 3, after the probe 1031 of the serial port testing apparatus 100 of the present embodiment is inserted into the through hole 206 on the housing 203 of the device under test, it contacts with the reserved test contact 202 (reserved contact 202) on the PCB board 201 in the device under test. The first holding arm 105 passes through the first sub-card hole 204 of the housing 203, the second holding arm 106 passes through the second sub-card hole 205 of the housing 203, the first protrusion 107 is held with the inner wall of the housing 203, the second protrusion 108 is held with the inner wall of the housing 203, the elastic probe component 103 can always ensure the contact between the probe 1031 and the reserved contact 202, and the equipment between the serial port testing device 100 and the device to be tested is completed. The overall assembly structure is schematically shown in fig. 4. When the use is completed, the first holding arm 105 and the second holding arm 106 are lightly pressed by fingers and penetrate through the holding holes to release, and the elastic force of the probe 1031 can automatically pop out of the device.
By using the serial port testing device 100 of the embodiment, the Printed Circuit Board (PCB) 201 of the device to be tested does not need to be provided with the RJ45 socket or the pin header for serial port debugging, so that the cost of the device to be tested is saved. And only a plurality of test contacts 202 are reserved on the PCB201 of the equipment to be tested, and serial port information cannot be read through the contacts 202 during the test by matching with the RJ45 socket or the pin header in the prior art, so that the information safety risk is avoided.
The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
While the present embodiments have been described with reference to the accompanying drawings, it is to be understood that the invention is not limited to the precise embodiments described above, which are meant to be illustrative and not restrictive, and that various changes may be made therein by those skilled in the art without departing from the spirit and scope of the invention as defined by the appended claims.
Claims (10)
1. A serial port testing device is characterized by comprising:
a housing;
the test board is positioned in the shell;
one end of the probe component is connected with the test board, and the other end of the probe component penetrates through the first end of the shell and extends out of the shell;
and one end of the lead is connected with the test board, and the other end of the lead penetrates through the second end of the shell and extends out of the shell.
2. The device of claim 1, further comprising a first retaining member and a second retaining member, wherein the housing has a receiving cavity, wherein the test plate is positioned in the receiving cavity, wherein the housing comprises an inner side facing the receiving cavity and an outer side facing away from the receiving cavity, wherein the outer side comprises a first outer side and a second outer side opposite to each other, wherein the first retaining member is disposed on the first outer side of the housing, and wherein the second retaining member is disposed on the second outer side of the housing.
3. The apparatus of claim 2, wherein the first catch member includes a first catch arm and a first projection disposed at one end of the first catch arm, the other end of the first catch arm being mounted on the first outer side, the first projection facing away from the first outer side;
the second clamping part comprises a second clamping arm and a second protrusion arranged at one end of the second clamping arm, the other end of the second clamping arm is arranged on the second outer side face, and the second protrusion faces away from the second outer side face.
4. The apparatus of claim 3, wherein the first retaining arm has one end that is less distant from the first end of the housing than the other end of the probe component, and the second retaining arm has one end that is less distant from the first end of the housing than the other end of the probe component.
5. The apparatus of claim 4, wherein an end of the first catch arm is spaced the same distance from the first end of the housing as an end of the second catch arm.
6. The apparatus according to claim 3, wherein the extending direction of the probe member, the extending direction of the first retaining wall, and the extending direction of the second retaining wall are the same.
7. The device of claim 1, wherein the probe component comprises a probe, an elastic member and a sleeve, the elastic member and the sleeve are both located in a housing, one end of the elastic member is connected with one end of the sleeve, the other end of the sleeve is installed in the housing, one end of the probe is connected with the other end of the elastic member, and the other end of the probe passes through the first end of the housing and extends out of the housing.
8. The apparatus of claim 7, wherein the number of the probe members is plural, and the plural probe members are arranged at intervals.
9. The apparatus of claim 8, wherein the other ends of the plurality of probe members are the same distance from the first end of the housing.
10. The device of claim 1, wherein the housing is made of PP or PC material.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021793589.2U CN213517350U (en) | 2020-08-25 | 2020-08-25 | Serial port testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021793589.2U CN213517350U (en) | 2020-08-25 | 2020-08-25 | Serial port testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN213517350U true CN213517350U (en) | 2021-06-22 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202021793589.2U Active CN213517350U (en) | 2020-08-25 | 2020-08-25 | Serial port testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN213517350U (en) |
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2020
- 2020-08-25 CN CN202021793589.2U patent/CN213517350U/en active Active
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