CN213456633U

CN213456633U - Portable photometer for wafer detection

Info

Publication number: CN213456633U
Application number: CN202022567604.8U
Authority: CN
Inventors: 孙健; 陈晓达
Original assignee: Hebei Yincheng Photoelectric Technology Co ltd
Current assignee: Hebei Yincheng Photoelectric Technology Co ltd
Priority date: 2020-11-09
Filing date: 2020-11-09
Publication date: 2021-06-15
Anticipated expiration: 2030-11-09

Abstract

The utility model discloses a wafer detects uses portable photometer, including the photometer body, photometer body upper end right side front portion is fixed and is provided with control adjust knob and warm and humid acidimeter, photometer body upper end right side rear portion is fixed and is provided with picture and text display screen and control panel, photometer body left side inside is fixed and is provided with the sample detection room, the fixed sample frame that is provided with in sample detection room inside, the box is placed to the inside fixed movable wafer that is provided with of sample frame, the fixed two light beam high performance holographic gratings that are provided with in sample frame bottom, sample detection room rear end is rotated through the rotating pin and is connected with the sample lid. The utility model discloses a wafer detects uses portable photometer, this photometer simple structure, it is convenient to wash, and is cleaner thoroughly, long service life, effectual, the testing result is more accurate, and the display result is more clear, and the convenience is handled and is analyzed each item data, and it is very convenient to use, is worth promoting.

Description

Portable photometer for wafer detection

Technical Field

The utility model relates to an instrument technical field for the wafer detection especially relates to a wafer detects uses portable photometer.

Background

Along with the rapid development of quartz crystal trade, the product type also more and more tends to the miniaturization, quality testing to quartz wafer is in the manual work and directly observes with the naked eye or observes with the magnifying glass at present, owing to there is the subjective factor, everyone's inspection standard can be different, and along with the miniaturization of product, the artifical naked eye observation degree of difficulty is more and more big, consequently, artifical measuring can not satisfy the requirement of market and technology processing, so the present more uses the photometer to carry out the detection of miniaturized wafer, the standard that uses the photometer to detect is unanimous, and the result that detects is also more accurate, however, photometer commonly used uses comparatively inconveniently, the support of placing of wafer is fixed and can not be taken out inside the sample detection room during the detection, lead to wasing inconvenient, can't carry out comprehensive washing, it is very inconvenient to.

SUMMERY OF THE UTILITY MODEL

The utility model aims at solving the defects existing in the prior art and providing a portable photometer for wafer detection.

In order to achieve the above purpose, the utility model adopts the following technical scheme: a portable photometer for detecting a wafer comprises a photometer body, wherein a control adjusting knob and a hygrothermograph are fixedly arranged at the front part of the right side of the upper end of the photometer body, the rear part of the right side of the upper end of the photometer body is fixedly provided with an image-text display screen and a control panel, the inner part of the left side of the photometer body is fixedly provided with a sample detection chamber, a sample rack is fixedly arranged in the sample detection chamber, a movable wafer placing box is fixedly arranged in the sample rack, the bottom of the sample frame is fixedly provided with a double-beam high-performance holographic grating, the rear end of the sample detection chamber is rotationally connected with a sample cover through a rotating pin, the photometer body rear end lower left corner is fixed and is provided with a USB interface and a power source interface, the fixed import silicon photodiode that is provided with in sample detection room bottom, sample detection room both sides wall all is fixed and is provided with a plurality of import long-life tungsten lamps.

As a further description of the above technical solution:

the photometer body lower extreme four corners department all fixedly connected with adjustable landing leg, four adjustable landing leg lower extreme all fixedly is provided with anti-skidding callus on the sole.

As a further description of the above technical solution:

and a switch button is fixedly arranged at the upper end of the control panel.

As a further description of the above technical solution:

and a cover plate control button is fixedly arranged on the lower part of the front end surface of the sample detection chamber.

As a further description of the above technical solution:

the middle part of the front side of the upper end face of the sample detection chamber is fixedly provided with a lock catch, the middle part of the front side inside the sample cover is fixedly provided with a lock head, and the lock head and the lock catch are fixedly buckled and connected.

As a further description of the above technical solution:

the photometer body rear wall upper left corner is fixedly provided with an alarm, and the input end of the alarm is electrically connected with the output end of the hygrothermograph.

As a further description of the above technical solution:

and a plurality of heat dissipation holes are fixedly formed in the rear end of the sample detection chamber.

As a further description of the above technical solution:

and an ultraviolet germicidal lamp is fixedly arranged inside the sample cover.

The utility model discloses following beneficial effect has:

the utility model provides a pair of wafer detects uses portable photometer carries out the protection of sample detection room inner structure through the sample lid that sets up the switching of conveniently controlling, sets up the movable wafer that can take out and places the box, conveniently takes out and cleans, and clear cleaner thoroughly to the upper cover is equipped with sterilamp, can disinfect to inside, keeps the clean degree of sample detection room inner portion, prevents to cause the influence to the testing process.

The utility model provides a pair of wafer detects uses portable photometer, conveniently adjust the luminosity of testing process through control adjustment button, the humiture of photometer surrounding environment can be detected well to the warm and humid acidimeter, if exceed suitable humiture, then can send out the police dispatch newspaper through the alarm, it is not conform to the condition of placing to staff warning environment humiture, make the staff in time handle, this photometer can control through USB interface connection computer, the convenience is handled and the analysis each item data, it is very convenient to use.

The utility model provides a pair of wafer detects uses portable photometer, the light source adopts the imported long-life tungsten lamp, and life is longer, and the effect is better, and the detector uses imported silicon photodiode, and the testing result is more accurate, and optical system uses the holographic grating of two light beams high performance, and the display result is more clear reliable, is worth promoting.

Drawings

Fig. 1 is a schematic view of a main structure of a portable photometer for wafer detection according to the present invention;

fig. 2 is a top view of a sample detection chamber of a portable photometer for wafer detection according to the present invention;

fig. 3 is a rear view of a portable photometer for wafer inspection according to the present invention;

fig. 4 is a schematic diagram of the internal structure of a portable photometer for wafer inspection according to the present invention.

Illustration of the drawings:

1. a photometric instrument body; 2. controlling an adjusting knob; 3. a hygrothermograph; 4. a picture and text display screen; 5. a control panel; 6. a switch button; 7. a sample detection chamber; 8. a cover plate control button; 9. a sample holder; 10. a movable wafer placing box; 11. a dual-beam high performance holographic grating; 12. a sample cover; 13. a lock head; 14. an ultraviolet germicidal lamp; 15. a rotation pin; 16. locking; 17. an alarm; 18. a USB interface; 19. a power interface; 20. heat dissipation holes; 21. an adjustable leg; 22. anti-skid foot pads; 23. an inlet silicon photodiode; 24. import long-life tungsten lamp.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplification of description, but do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention; the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance, and furthermore, unless otherwise explicitly stated or limited, the terms "mounted," "connected," and "connected" are to be construed broadly and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.

Referring to fig. 1-4, the present invention provides an embodiment: the utility model provides a wafer detects uses portable photometer, including photometer body 1, photometer body 1 upper end right side front portion is fixed and is provided with control adjust knob 2 and warm and humid acidimeter 3, photometer body 1 upper end right side rear portion is fixed and is provided with picture and text display screen 4 and control panel 5, photometer body 1 left side inside fixed sample detection room 7 that is provided with, the inside fixed sample frame 9 that is provided with of sample detection room 7, the inside fixed movable wafer that is provided with of sample frame 9 places box 10, the fixed two light beam high performance holographic gratings 11 that are provided with in sample frame 9 bottom, sample detection room 7 rear end is rotated through rotating pin 15 and is connected with sample lid 12, photometer body 1 rear end lower left corner is fixed and is provided with USB interface 18 and power source 19, the fixed import silicon photodiode 23 that is provided with in sample detection room 7 bottom, the both sides wall of sample detection room 7 all is fixed and.

Equal adjustable landing leg 21 of equal fixedly connected with in photometer body 1 lower extreme four corners department, four adjustable landing leg 21 lower extremes are all fixed anti-skidding callus on the sole 22 that is provided with, control panel 5 upper end is fixed and is provided with shift knob 6, the fixed apron control button 8 that is provided with in 7 preceding terminal surface lower parts of sample detection room, the fixed hasp 16 that is provided with in 7 upper end front side middle parts of sample detection room, the fixed tapered end 13 that is provided with in inside front side middle part of sample lid 12, fixed lock is connected between tapered end 13 and hasp 16, the fixed siren 17 that is provided with in 1 rear wall upper left corner of photometer body, the input of siren 17 and the output electric connection of warm and humid acidimeter 3, a plurality of louvres 20 have been fixed to be seted up in 7.

The working principle is as follows: when the portable photometer for wafer detection is used, the photometer body 1 is connected with a power supply through a power interface 19, then the portable photometer is started through a switch button 6 on a control panel 5, then a sample cover 12 is opened through a cover plate control button 8, a movable wafer placing box 10 in a sample frame 9 is taken out, a sample wafer to be detected is placed in the movable wafer placing box 10, then the movable wafer placing box 10 is placed in the sample frame 9, then the sample cover 12 is covered, an imported long-life tungsten lamp 24 is opened through the control panel 5 to provide a light source, the detection is carried out through an imported silicon photodiode 23, the detection result is displayed through an image-text display screen 4, heat dissipation holes 20 can be used for heat dissipation of the photometer body 1, a control adjusting knob 2 can be used for adjusting the photometer body 1, and a hygrothermograph 3 can be used for detecting the temperature and humidity of the surrounding environment of the photomet, if exceed suitable humiture, then can send out the police dispatch newspaper through siren 17, to staff's warning environment humiture be not conform to the condition of placing, make the staff in time handle, this photometer can also be controlled through USB interface 18 connection computer, conveniently handle and the analysis each item data, it is very convenient to use, when needs wash photometer body 1, place the box 10 with the activity wafer and take out from sample frame 9 is inside, then place box 10 to the activity wafer and carry out thorough clearance, the inside sterilamp 14 that is equipped with of sample lid 12, can disinfect to inside, keep the inside clean degree of sample detection room 7, prevent to cause the influence to testing process, high convenience is used.

Finally, it should be noted that: although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that modifications and variations can be made in the embodiments or in part of the technical features of the embodiments without departing from the spirit and the scope of the invention.

Claims

1. A portable photometer for wafer detection, comprising a photometer body (1), characterized in that: the photometer body (1) upper end right side front portion is fixedly provided with a control adjusting knob (2) and a temperature and humidity meter (3), the photometer body (1) upper end right side rear portion is fixedly provided with a picture and text display screen (4) and a control panel (5), the photometer body (1) left side inner portion is fixedly provided with a sample detection chamber (7), the sample detection chamber (7) inner portion is fixedly provided with a sample frame (9), the sample frame (9) inner portion is fixedly provided with a movable wafer placing box (10), the sample frame (9) bottom portion is fixedly provided with a double-beam high-performance holographic grating (11), the sample detection chamber (7) rear end is rotatably connected with a sample cover (12) through a rotating pin (15), the photometer body (1) rear end left lower corner is fixedly provided with a USB interface (18) and a power supply interface (19), the sample detection chamber (7) bottom portion is fixedly provided with an inlet silicon photodiode (23), and a plurality of inlet long-life tungsten lamps (24) are fixedly arranged on two side walls of the sample detection chamber (7).

2. The portable photometer for wafer inspection as recited in claim 1, wherein: the photometer is characterized in that adjustable supporting legs (21) are fixedly connected to four corners of the lower end of the photometer body (1), and anti-skidding foot pads (22) are fixedly arranged at the lower ends of the four adjustable supporting legs (21).

3. The portable photometer for wafer inspection as recited in claim 1, wherein: and a switch button (6) is fixedly arranged at the upper end of the control panel (5).

4. The portable photometer for wafer inspection as recited in claim 1, wherein: and a cover plate control button (8) is fixedly arranged on the lower part of the front end surface of the sample detection chamber (7).

5. The portable photometer for wafer inspection as recited in claim 1, wherein: the sample detection chamber (7) upper end front side middle part is fixed and is provided with hasp (16), sample lid (12) inside front side middle part is fixed and is provided with tapered end (13), fixed lock connection between tapered end (13) and hasp (16).

6. The portable photometer for wafer inspection as recited in claim 1, wherein: the photometer body (1) is characterized in that an alarm (17) is fixedly arranged at the upper left corner of the rear wall of the photometer body, and the input end of the alarm (17) is electrically connected with the output end of the hygrothermograph (3).

7. The portable photometer for wafer inspection as recited in claim 1, wherein: and a plurality of heat dissipation holes (20) are fixedly formed in the rear end of the sample detection chamber (7).

8. The portable photometer for wafer inspection as recited in claim 1, wherein: an ultraviolet germicidal lamp (14) is fixedly arranged inside the sample cover (12).