CN213364962U

CN213364962U - IC chip testing device with pressing tool

Info

Publication number: CN213364962U
Application number: CN202022114091.5U
Authority: CN
Inventors: 邢小亮
Original assignee: Wuxi Shibaide Microelectronics Co ltd
Current assignee: Chengdu Lingke Microelectronics Co ltd
Priority date: 2020-09-24
Filing date: 2020-09-24
Publication date: 2021-06-04
Anticipated expiration: 2030-09-24

Abstract

The utility model relates to the technical field of IC chips, and discloses an IC chip testing device with a pressing tool, which comprises an action box, wherein a motor is fixedly arranged in the inner cavity of the action box, a screw rod is fixedly connected with the transmission end of the motor, supporting plates are fixedly arranged on the front side and the rear side of the top end of the action box, a workbench is fixedly arranged on the top end of the supporting plates, connecting plates are fixedly connected on the front side and the rear side of the bottom end of the workbench, and action clamping plates are movably connected on the left side and the right side of the visual sides of the two groups of connecting plates through action rods, and the lifting is automatic, so that the IC chip can be collected conveniently after the detection is finished by the worker.

Description

IC chip testing device with pressing tool

Technical Field

The utility model belongs to the technical field of the IC chip, specifically be an IC chip testing arrangement with tamp.

Background

Because defects are more or less caused in the manufacturing process or the using process of the IC chip and the material itself, the IC chip testing becomes one of the indispensable processes in the integrated circuit manufacturing to detect the unsatisfactory defective products caused by physical defects in the manufacturing process.

However, in the IC chip testing apparatus of the prior art, the replacement operation of placing the chip to be tested into the chip slot of the worktable for fixing or taking the chip out of the chip slot is very troublesome in the using process, and the chip to be tested is easily damaged in the operating process, which seriously affects the working speed and working efficiency of the worker.

SUMMERY OF THE UTILITY MODEL

To the above situation, for overcoming prior art's defect, the utility model provides a IC chip testing arrangement with tamp, the effectual IC chip testing arrangement who solves prior art is at the use, and the chip inslot that will await measuring the test chip and put into the workstation is fixed or the change operation of taking out from the chip inslot is very troublesome to damage the test chip that awaits measuring in operation process very easily, seriously influence staff's operating speed and work efficiency's problem.

In order to achieve the above object, the utility model provides a following technical scheme: an IC chip testing device with a pressing tool comprises an action box, wherein a motor is fixedly arranged in an inner cavity of the action box, a screw rod is fixedly connected with a transmission end of the motor, supporting plates are fixedly arranged on the front side and the rear side of the top end of the action box, a workbench is fixedly arranged on the top end of the supporting plates, connecting plates are fixedly connected on the front side and the rear side of the bottom end of the workbench, action clamping plates are movably connected on the left side and the right side of the visual sides of the two groups of connecting plates through action rods, the upper end of the screw rod penetrates through the top wall of the action box and is connected with a screw plate in a threaded manner, an action column is fixedly connected with the front end of the screw plate, an action through hole is formed in the lower part of the action clamping plate and penetrates through the action through hole, action clamping plates are fixedly connected on the top parts of the visual sides of the, and a chip testing device is fixedly arranged at the bottom end of the fixing plate.

Preferably, the inside of workstation is seted up flutedly, the inside spring that is provided with of recess, the bottom of spring is connected with the workstation, the top fixedly connected with roof of spring.

Preferably, the visual side of the action box and the workbench is fixedly connected with a guide rod, and the guide rod penetrates through the body of the screw plate.

Preferably, the lateral wall of effect splint is provided with the fixed block, the bottom fixedly connected with protection block of fixed block, the material of protection block is rubber.

Preferably, the top end of the screw rod is fixedly connected with a limiting block.

Preferably, the front end of the action column is fixedly connected with a limiting plate.

Compared with the prior art, the beneficial effects of the utility model are that:

1. the top plate, the connecting plate, the screw plate, the action column, the action clamping plate, the fixing block and the motor are arranged to be matched with the screw rod, so that the IC chip can be fixed to the top end of the workbench, the use is convenient, and the working efficiency is improved;

2. the device is matched with the top plate and the like through the spring, and can automatically lift after the IC chip is detected, so that the IC chip can be conveniently collected by a worker after the detection is finished;

3. through setting up the guide arm, prevent that the spiral shell board not only self from producing the rotation phenomenon under the drive of screw rod, avoid damaging the effect splint.

Drawings

The accompanying drawings are included to provide a further understanding of the invention, and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention, and together with the description serve to explain the invention and not to limit the invention.

In the drawings:

FIG. 1 is a schematic structural view of the present invention;

FIG. 2 is a schematic view of the structure of the action splint of the present invention;

fig. 3 is a left side view of the present invention.

In the figure: 100. an action box; 110. a motor; 120. a screw; 121. a guide bar; 130. a support plate; 140. A work table; 141. a spring; 142. a top plate; 150. a connecting plate; 160. a screw plate; 161. an action column; 170. acting on the splint; 171. a fixed block; 172. a protection block; 180. a support pillar; 190. a fixing plate; 200. A chip testing device.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments; based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

In the first embodiment, as shown in fig. 1, 2 and 3, the utility model comprises an action box 100, a motor 110 is fixedly installed in the inner cavity of the action box 100, a screw 120 is fixedly connected to the transmission end of the motor 110, support plates 130 are fixedly installed on the front and rear sides of the top end of the action box 100, a workbench 140 is fixedly installed on the top end of the support plate 130, connecting plates 150 are fixedly connected to the front and rear sides of the bottom end of the workbench 140, action clamping plates 170 are movably connected to the left and right sides of the viewing side of the two groups of connecting plates 150 through action rods, a screw 160 is screwed on the upper end of the screw 120 through the top wall of the action box 100, an action column 161 is fixedly connected to the front end of the screw 160, an action through hole is opened on the lower part of the action clamping plate 170, the action column 161 penetrates through the action through hole, the action clamping plates 170 are fixedly connected to the top of, the top end of the supporting column 180 is fixedly provided with a fixing plate 190, and the bottom end of the fixing plate 190 is fixedly provided with a chip testing device 200.

In the second embodiment, on the basis of the first embodiment, as shown in fig. 2, a groove is formed in the workbench 140, a spring 141 is arranged in the groove, the bottom of the spring 141 is connected with the workbench 140, and a top plate 142 is fixedly connected to the top of the spring 141.

Through setting up spring 141 and roof 142 with IC-card jack-up after IC-card detection finishes, the staff of being convenient for takes.

In the third embodiment, on the basis of the first embodiment, as shown in fig. 2, a guide rod 121 is fixedly connected to the viewing side of the action box 100 and the workbench 140, and the guide rod 121 penetrates through the body of the screw plate 160.

Through setting up guide arm 121, prevent that spiral shell 160 not only self from producing the rotation phenomenon under the drive of screw rod 120, avoid damaging effect splint 170.

In the fourth embodiment, based on the first embodiment, as shown in fig. 1, a fixing block 171 is disposed on an outer side wall of the action splint 170, a protecting block 172 is fixedly connected to a bottom end of the fixing block 171, and the protecting block 172 is made of rubber.

By providing the protection block 172, the IC chip is prevented from being damaged by the action clamp plate 170 and the fixing block 171.

In the fifth embodiment, on the basis of the first embodiment, as shown in fig. 2, a limit block is fixedly connected to the top end of the screw rod 120.

The screw plate 160 is prevented from being separated from the screw rod 120 under the driving of the screw rod 120 by arranging the limiting block, and the device is prevented from being damaged.

Sixth, in addition to the first embodiment, as shown in fig. 3, a limiting plate is fixedly connected to the front end of the action column 161.

By providing a limit plate, the action splint 170 is prevented from disengaging from the action post 161 during use, resulting in damage to the device.

The working principle is as follows: when the novel scheme is implemented, an IC chip is placed on the top of a workbench 140 and a top plate 142 and is pressed downwards, a motor 110 is started, a screw rod 120 is driven to rotate by the motor 110, a screw plate 160 is driven to move up and down by the screw rod 120, the top of an action column 161 is driven to move up and down by the screw plate 160, the bottoms of two groups of action clamping plates 170 are driven to move in opposite directions by the downward movement of the two groups of action columns 161, meanwhile, under the limit of an action rod, two groups of fixed blocks 171 move towards the direction of the workbench 140, the IC chip placed on the upper part of the workbench 140 is fixed by the movement of the fixed blocks 171 and a protection block 172 towards the workbench 140, the workbench 140 is released, a chip testing device 200 is started to detect the IC chip, the bottoms of the two groups of action clamping plates 170 are driven to move in opposite directions by the upward movement of the two groups of action columns 161, and simultaneously, under the, by the movement of the two sets of fixed blocks 171 in a direction away from the table 140, the IC chip is lifted up by the top plate 142 under the elastic force of the springs 141.

It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims

1. An IC chip testing device with a presser is characterized in that: comprises an action box (100), a motor (110) is fixedly arranged in an inner cavity of the action box (100), a screw (120) is fixedly connected to a transmission end of the motor (110), supporting plates (130) are fixedly arranged on the front side and the rear side of the top end of the action box (100), a workbench (140) is fixedly arranged on the top end of the supporting plates (130), connecting plates (150) are fixedly connected to the front side and the rear side of the bottom end of the workbench (140), action clamping plates (170) are movably connected to the left side and the right side of the visual side of the two groups of connecting plates (150) through action rods, the upper end of the screw (120) penetrates through the top wall of the action box (100) and is screwed with a screw plate (160), an action column (161) is fixedly connected to the front end of the screw plate (160), an action through hole is formed in the lower part of the action clamping plate (170), the action through hole is formed in the action column (161), and action clamping plates, the right side fixed mounting on effect case (100) top has support column (180), the top fixed mounting of support column (180) has fixed plate (190), the bottom fixed mounting of fixed plate (190) has chip testing arrangement (200).

2. The IC chip test apparatus with a hold-down as set forth in claim 1, wherein: the novel workbench is characterized in that a groove is formed in the workbench (140), a spring (141) is arranged in the groove, the bottom of the spring (141) is connected with the workbench (140), and the top of the spring (141) is fixedly connected with a top plate (142).

3. The IC chip test apparatus with a hold-down as set forth in claim 1, wherein: the visual side of the action box (100) and the workbench (140) is fixedly connected with a guide rod (121), and the guide rod (121) penetrates through the body of the screw plate (160).

4. The IC chip test apparatus with a hold-down as set forth in claim 1, wherein: the lateral wall of effect splint (170) is provided with fixed block (171), the bottom fixedly connected with protection piece (172) of fixed block (171), the material of protection piece (172) is rubber.

5. The IC chip test apparatus with a hold-down as set forth in claim 1, wherein: the top end of the screw rod (120) is fixedly connected with a limiting block.

6. The IC chip test apparatus with a hold-down as set forth in claim 1, wherein: the front end of the action column (161) is fixedly connected with a limiting plate.