CN213337927U - Portable high-power microwave switch in-situ inspection tester - Google Patents
Portable high-power microwave switch in-situ inspection tester Download PDFInfo
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- CN213337927U CN213337927U CN202022410901.1U CN202022410901U CN213337927U CN 213337927 U CN213337927 U CN 213337927U CN 202022410901 U CN202022410901 U CN 202022410901U CN 213337927 U CN213337927 U CN 213337927U
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Abstract
The utility model belongs to the technical field of microwave switch detects, concretely relates to portable high-power microwave switch normal position detector, include the signal acquisition circuit who is used for reading the closure state signal of every switch that is connected with high-power microwave switch, the switch drive circuit who is used for controlling the closure and the disconnection of high-power microwave switch and be used for providing the power management circuit of power consumption demand, signal acquisition circuit, switch drive circuit and power management circuit be connected with ARM embedded system simultaneously, ARM embedded system pass through network interface connection result processing software customer end, connect simultaneously and show interface circuit and announce the display to the result; the power management circuit is connected with an external power supply through a charger to perform power transmission. By driving the high-power microwave switch, the inspection tester can automatically and quickly judge the working state of the switch in situ by 1 person, and report and analyze the test result, thereby greatly improving the task guarantee efficiency.
Description
Technical Field
The utility model belongs to the technical field of the microwave switch detects, concretely relates to portable high-power microwave switch normal position detector.
Background
Electronic warfare equipment generally covers wide frequency range and large airspace, and in order to realize high-power and broadband electronic interference, a space multi-beam power synthesis technology is mostly adopted, and a plurality of transmitters are respectively arranged in a frequency range covered by the electronic warfare equipment, so that each transmitter is matched with a plurality of high-power microwave switches, and taking a certain type of task system as an example, the number of the high-power microwave switches is as high as 60. In order to detect the performance of the microwave switch, the task system display and control device and the transmitter need to be powered on simultaneously, 3-4 people are matched simultaneously, the task system software controls the microwave switch array to work, whether the switch is closed or disconnected is judged in a manual monitoring mode, the detection mode consumes the service life of a traveling wave tube of a core device of the transmitter on one hand, and on the other hand, the result is unreliable, the detection efficiency is low, and the requirement of troops on combat training tasks is difficult to meet. Therefore, a portable in-situ inspection tester is urgently needed to be developed, 1 person can finish performance detection and record results, and the guarantee efficiency of a task system is improved.
In the guarantee of the existing task system, the performance inspection of a high-power microwave switch needs to be matched by a plurality of persons, the display and control console and the transmitter of the carrier are powered on simultaneously, the working state of the switch is monitored in a manual mode, the result is unreliable, the efficiency is low, the service life of a traveling wave tube can be shortened simultaneously, and the requirement for quick and accurate guarantee cannot be met. At present, equipment for switch in-situ inspection does not exist, so the field is vacant, and the portable in-situ inspection instrument has great significance.
Disclosure of Invention
An object of the utility model is to provide a portable high-power microwave switch normal position detector to the problem that exists among the prior art, this detector is through driving high-power microwave switch, does not need the carrier to show accuse platform and transmitter and adds the electric condition under simultaneously, and 1 person can be in the automatic quick decision switch operating condition of normal position to report the analysis with the test result, greatly improved task guarantee efficiency.
The technical scheme of the invention is as follows:
a portable high-power microwave switch in-situ inspection instrument comprises a signal acquisition circuit, a switch driving circuit and a power management circuit, wherein the signal acquisition circuit is connected with a high-power microwave switch and used for reading a closed state signal of each switch, the switch driving circuit is used for controlling the closing and the opening of the high-power microwave switch, the power management circuit is used for providing power consumption requirements, the signal acquisition circuit, the switch driving circuit and the power management circuit are simultaneously connected with an ARM embedded system, the ARM embedded system is connected with a result processing software client through a network interface, and is simultaneously connected with a display interface circuit to publish and display a result; the power management circuit is connected with an external power supply through a charger to perform power transmission.
Specifically, the ARM embedded system adopts a samsung s5PV210 chip.
Specifically, the display interface circuit comprises a four-wire resistive touch screen interface and a group-creation seven-inch true color LCD.
Specifically, the power management circuit comprises a voltage boosting circuit and a voltage reducing circuit, the power supply modes of the external power supply comprise AC220V and DC28V, and the inside of the in-situ inspection instrument is powered by a lithium battery.
Specifically, the boost circuit adopts an XL6009-ADJ adjustable boost chip.
Specifically, the voltage reduction circuit adopts XL1509-5V and XL1509-3.3V voltage reduction chips.
Specifically, the switch driving circuit comprises at least one path of relay driving circuit and a relay connected with the relay driving circuit.
Specifically, the signal acquisition circuit comprises a switch state reading circuit connected with the high-power microwave switch and an AD conversion circuit for monitoring the battery voltage and control voltage power signals in real time.
Specifically, the ARM embedded system further comprises a control circuit, and the control circuit adopts a C8051F020 singlechip.
The high-power microwave switch mainly refers to SP2T and SP3T switches, the control signal is direct current 28V, and for the SP2T microwave switch, a control line is provided, if the control line is grounded, the channel 1 and the common end of the microwave switch are closed, and if the control line is connected with DC28V, the channel 2 and the common end are closed; similarly, the microwave switch SP3T has two control lines, and the same control method is also adopted. Each microwave switch is provided with a corresponding state monitoring signal output port besides the control signal input port and the input/output port of the microwave signal, and the current state of the microwave switch can be judged by reading the state monitoring signal.
From the above analysis it can be seen that: each switch in the SP2T and SP3T switch array has corresponding control and monitoring signals in certain states, and if the control and reading back of the signals can be carried out, the current working state of the microwave switch can be known, so that whether the microwave switch can be normally closed or opened can be judged. Therefore, the tester utilizes the monitoring interface to test the SP2T and SP3T switch arrays, selects the switch arrays with different wave bands by developing a control circuit, and utilizes software to give out and record detection results, thereby achieving the purpose of rapid detection and positioning.
The invention has the beneficial effects that: the embedded system selected by the detector takes a Samsung S5PV210 chip as a processing control core, and the operation dominant frequency can reach 1 GHz. A professional stable CPU kernel power supply chip and a reset chip are adopted to ensure the stability of the system during operation; the seven-layer board design of the gold immersion process is adopted, and the wires are distributed in a professional and equal length mode, so that the signal integrity of the key signal wires is guaranteed. The embedded system has the advantages of small volume, low power consumption, high operation speed, short interrupt response time, real-time multitask support and the like.
The utility model discloses a show interface circuit and include 4 line resistance touch-sensitive screen interfaces and crowd and create 7 cun true color LCD, this LCD is resistance-type touch-sensitive screen, and screen resolution can reach 800X 480, and display area is big, and the color reduction degree is higher. Because the display interface of the shelf product on the market generally adopts the flat wire design and has poor reliability, the external interface of the LCD display screen is customized, and the IDC40 line pressing interface with high reliability is adopted, so that the reliability is good.
The utility model discloses the outside power supply mode of inspection tester has AC220V and DC28V, inside adopts the large capacity lithium cell to supply power, its power management circuit includes boost circuit and step-down circuit, wherein boost circuit adopts XL6009-ADJ adjustable boost chip, its input voltage scope can reach 4 ~ 40V, through adjusting external resistance, can make output voltage fix to DC28V, both can satisfy the requirement of stepping up of lithium cell, also can directly adopt outside DC28V to supply power, need not design alone power supply switching circuit again. The embedded system and the signal acquisition circuit adopt a separated power supply mode, so the voltage reduction circuit selects voltage reduction chips XL1509-5V and XL1509-3.3V respectively for the embedded system and the signal acquisition, the input voltage range can reach 5-40V, the conversion efficiency reaches 95%, the requirements of wide input voltage range and high conversion efficiency are met, and the voltage reduction circuit is relatively stable.
The utility model discloses inspection appearance switch drive circuit is used for controlling the closure and the disconnection of high-power microwave switch, because its operating voltage is DC28V, the electric current can reach 400mA the most, consequently must fully consider the requirement that satisfies high-power load when drive circuit designs, the invention adopts the two-way relay of ohm dragon to carry out the switch-over, and its is small, and the electric current can reach 2A under the condition of DC30V, can satisfy the requirement that high-power microwave switch-over completely, is the two-way switch-over simultaneously, is used for control all the way, can detect all the way in addition.
The utility model discloses the signal acquisition circuit primary function of inspection tester is used for reading the closed state signal of every switch, and signal acquisition circuit is in order to carry out real time monitoring to power signals such as battery voltage, control voltage simultaneously, guarantees equipment under test safety, and consequently signal acquisition circuit still designs has AD converting circuit for transform voltage signal.
Drawings
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a schematic diagram of a boost circuit;
FIG. 3 is a schematic diagram of the voltage step-down circuit;
FIG. 4 is a schematic diagram of the switch driving circuit;
FIG. 5 is a schematic diagram of a switch state reading circuit;
FIG. 6 is a schematic diagram of the AD converter circuit;
FIG. 7 is a schematic diagram of the control circuit;
FIG. 8 is a block diagram of the software architecture of the inspection scope testing system.
Detailed Description
The technical solution of the present invention will be described in detail below with reference to the accompanying drawings and specific embodiments.
Example 1
As shown in fig. 1, the schematic structural diagram of the portable high-power microwave switch in-situ inspection instrument provided in this embodiment is a schematic structural diagram of the portable high-power microwave switch in-situ inspection instrument, which includes a signal acquisition circuit connected to a high-power microwave switch for reading a closed state signal of each switch, a switch driving circuit for controlling the closing and opening of the high-power microwave switch, and a power management circuit for providing power consumption requirements, where the signal acquisition circuit, the switch driving circuit, and the power management circuit are simultaneously connected to an ARM embedded system, the ARM embedded system is connected to a result processing software client through a network interface, and is connected to a display interface circuit for displaying a result; the power management circuit is connected with an external power supply through a charger to perform power transmission.
The core of the embedded system is an embedded microprocessor. The embedded system selected by the portable in-situ inspection instrument uses a Samsung S5PV210 chip as a processing control core, and the operation dominant frequency can reach 1 GHz. A professional stable CPU kernel power supply chip and a reset chip are adopted to ensure the stability of the system during operation; the seven-layer board design of the gold immersion process is adopted, and the wires are distributed in a professional and equal length mode, so that the signal integrity of the key signal wires is guaranteed. The embedded system has the advantages of small volume, low power consumption, high operation speed, short interrupt response time, real-time multitask support and the like.
The display interface circuit in the embodiment comprises a four-wire resistive touch screen interface and a group seven-inch true color LCD, wherein the LCD is a resistive touch screen, the screen resolution can reach 800 multiplied by 480, the display area is large, and the color reduction degree is high. Because the display interface of the shelf product on the market generally adopts the flat wire design and has poor reliability, the external interface of the LCD display screen is customized, and the IDC40 line pressing interface with high reliability is adopted, so that the reliability is good.
Example 2
The power management circuit in the embodiment comprises a boost circuit and a buck circuit, according to index requirements, the power supply mode of the external power supply comprises AC220V and DC28V, a lithium battery is adopted for power supply inside the in-situ inspection tester, and the power consumption requirements of the inspection tester comprise DC28V required by a high-power microwave switch, DC5V required by an ARM embedded system, DC12V required by a switch driving circuit and DC3.3V required by a signal acquisition circuit, so that the power supply mode is diversified, the span of an output voltage range is large, and the requirement that the continuous working time is not less than 4 hours is met.
In terms of battery selection, if a nickel-metal hydride battery is adopted, the advantages are that the voltage can be directly DC28V, the capacity is large, but the defects are obvious, and the volume cannot meet the requirements. In order to meet the requirement of miniaturization of equipment, a lithium battery with the largest unit volume capacity is the best scheme, and the lithium battery on the market at present can be DC12V or DC24V, can not be directly used and needs secondary conversion of voltage.
Because the continuous working time is required to be not less than 4 hours, the static current is 200mA and the peak current is 400mA when each high-power microwave switch is switched by analyzing the power consumption, and the power consumption is not more than 50W when the microwave switch is continuously operated for 4 hours; the maximum power consumption current of the ARM embedded system (including a liquid crystal display screen) is not more than 2000mA, and the power consumption is not more than 50W after continuous working for 4 hours; the maximum power consumption of the driving circuit board and the signal acquisition board in 4 hours is not more than 50W, so the capacity of the selected lithium battery is not less than 150W.
In consideration of the above supply and discharge requirements, the tester adopts a lithium battery with the capacity of 20Ah of DC12V and adopts a large-current protection plate, and the discharge current can reach more than 5A, so that the tester can meet the requirements on power consumption and discharge current. And the convenience of dismantlement can be fully considered when the battery case is designed.
Boost circuit design
Due to the adoption of the lithium battery of the DC12V, in order to meet the voltage requirement of a high-power microwave switch test, a boost circuit of the DC12V to the DC28V needs to be designed, the requirements of wide input voltage range, high conversion efficiency and large driving current are met during the design of the boost circuit, through comparison and selection, the boost circuit adopts an XL6009-ADJ adjustable boost chip, the input voltage range of the boost circuit can reach 4-40V, the output voltage can be fixed to the DC28V by adjusting an external resistor, the boost requirement of the lithium battery can be met, the external DC28V can be directly adopted for power supply, a power supply switching circuit does not need to be separately designed, and the schematic diagram of the principle and structure of the boost circuit is shown in figure 2.
Step-down circuit design
The design of the voltage reduction circuit mainly meets the power supply requirements of an ARM embedded system and a signal acquisition circuit board, and simultaneously considers that DC28V is directly adopted for power supply, so that the requirements of wide input voltage range and high conversion efficiency are also met during voltage reduction chip selection, and the stability of a power supply system is considered, the embedded system and the signal acquisition board adopt a separated power supply mode, voltage reduction chips XL1509-5V and XL1509-3.3V are respectively selected, the input voltage range can reach 5-40V, the conversion efficiency reaches 95%, and the circuit principle is shown in figure 3.
Example 3
The difference of the embodiment lies in a switch driving circuit, the switch driving circuit is used for controlling the on and off of the high-power microwave switch, the maximum current can reach 400mA due to the working voltage of the switch driving circuit is DC28V, so the requirement of high-power load must be fully considered when the driving circuit is designed, and the modes of manual switch switching, automatic photoelectric coupler switching, relay switching and the like can be adopted according to the development scheme. If a manual switch switching mode is adopted, the inspection tester has larger volume, long testing time and low efficiency because the requirements of 8 paths of SP3T and 4 paths of SP2T microwave switch switching are met; if the mode that adopts photoelectric coupler to switch can effectual reduction equipment volume and reduce the consumption, nevertheless because photoelectric coupler's reliability when high temperature is difficult to guarantee, through trial and error, selection, adopt ohm dragon's double-circuit relay to switch over, its is small, and the electric current can reach 2A under the condition of DC30V, can satisfy the requirement that high-power microwave switch switches completely, is double-circuit to switch over simultaneously, is used for controlling all the way, can detect all the way in addition. The whole switch driving circuit consists of 16 relays and a relay driving circuit, and the circuit principle is shown in fig. 4.
Example 4
The difference in this embodiment is that the signal acquisition circuit is different, and the signal acquisition circuit includes a switching state reading circuit connected to the high-power microwave switch, and an AD conversion circuit for monitoring the battery voltage and the control voltage power supply signal in real time.
Switch state reading circuit
The switch state reading circuit needs to read 24 paths of state signals, the 24 paths of state signals can be set to be TTL levels, only one path of state signal needs to be read in each test, the 24 paths of state signals can share one path of digital I/O (input/output) to be tested, only a corresponding state signal switching circuit needs to be designed, the state signal current is considered to be small, the TTL levels are adopted, a plurality of paths of analog switches are adopted to control, and the circuit principle is shown in figure 5.
The signal acquisition circuit is mainly used for reading the closed state signal of each switch, and is designed according to the test requirements of 1 group of SP3T high-power microwave switches, and 24 paths of signals need to be detected. Meanwhile, the signal acquisition circuit is used for monitoring power signals such as battery voltage and control voltage in real time to ensure the safety of the tested equipment, and the signal acquisition circuit is also provided with an AD conversion circuit for converting the voltage signals.
The AD conversion circuit is mainly used for monitoring the voltage of the lithium battery and the driving voltage of the high-power microwave switch, and if the voltage of the lithium battery is less than 10V, the undervoltage indicator lamp can be lightened. When the high-power microwave switch is tested, the DC28V is detected before the switch is closed, the closing control signal is allowed to be output only within a standard range, the output voltage of the relay is required to be detected after the closing signal is output, and then the state loop of the high-power microwave switch is read only when the two voltages are within the standard range, so that the high-power microwave switch can be ensured not to be accidentally burnt, and meanwhile, the reliability of the test result can be confirmed. The principle of the AD conversion circuit is shown in fig. 6.
Example 5
The difference in this embodiment lies in the ARM embedded system, which further includes a control circuit, the control circuit employs a C8051F020 single chip microcomputer, the main control of the control circuit is to control the operating states of the switch driving circuit and the signal acquisition circuit, read the test result, and then report the test result through a communication interface, in order to ensure the reliability of the operation, the single chip microcomputer employed by the control circuit is designed with a reset circuit, a watchdog is employed to monitor the software, and ensure the reliable operation of the system, the schematic structure diagram is shown in fig. 7, which includes a control input interface, an analog quantity test interface, and a communication interface and is simultaneously connected with the C8051F020 single chip microcomputer, the reset function is a starting signal given by the "control input interface", that is, when the reset is controlled by the outside, and the software logic is also burned in the C8051F020 single chip microcomputer.
The software test is performed on the inspection instrument of the embodiment, and the application software of the inspection instrument is developed and completed by adopting a Windows CE6.0 operating system, and comprises an application program and a related driver program which are attached to an operating system environment. The driver includes a display driver, a communication interface driver and the like, and is a bridge between system software and hardware. The application program is a final executor of the functions of the whole system, and utilizes a modularized design idea, and mainly comprises test setting, function testing, auxiliary testing, result management, system setting and the like, wherein the software structure is shown in fig. 8, the test setting comprises the recording of airplane numbers, switch selection and the like, the function testing comprises SP3T switch array detection and SP2T switch array detection, the auxiliary testing comprises the positioning testing and the auxiliary standing-wave ratio testing of switches, the result management comprises result viewing and result transmission, and the system setting comprises the setting of state setting and calibration standards and the like.
The specific test procedure is as follows:
s1, equipment preparation: 1 set of high-power microwave switch inspection tester, SP2T system and SP3T system;
s2, setting a test item;
s3, performing system self-check, namely performing self-check test on system equipment through a female clerk monitoring and self-check unit of the C8051F020 singlechip, wherein the test result is normally performed in the next step;
s4, functional test: the method comprises the following steps of performing SP2T system function test, SP2T system auxiliary performance test, SP3T system function test, SP3T system auxiliary performance test, positioning test and auxiliary standing-wave ratio test;
s5, managing results, wherein the test items in the step S4 are processed for three times, the results are normal, the results are checked through a display device, and the results are transmitted through a communication unit;
and S6, setting the system, setting the test state of each item, and performing calibration setting.
Finally, it should be noted that the above examples are only used to illustrate the technical solutions of the present invention and not to limit the same; although the present invention has been described in detail with reference to preferred embodiments, those skilled in the art will understand that: modifications to the specific embodiments of the invention or equivalent substitutions for parts of the technical features may be made; without departing from the spirit of the present invention, it is intended to cover all aspects of the invention as defined by the appended claims.
Claims (9)
1. A portable high-power microwave switch in-situ inspection instrument is characterized by comprising a signal acquisition circuit, a switch driving circuit and a power management circuit, wherein the signal acquisition circuit is connected with a high-power microwave switch and used for reading a closed state signal of each switch, the switch driving circuit is used for controlling the closing and the opening of the high-power microwave switch, the power management circuit is used for providing power consumption requirements, the signal acquisition circuit, the switch driving circuit and the power management circuit are simultaneously connected with an ARM embedded system, the ARM embedded system is connected with a result processing software client through a network interface, and is simultaneously connected with a display interface circuit to publish and display results; the power management circuit is connected with an external power supply through a charger to perform power transmission.
2. The portable high-power microwave switch in-situ inspection tester as claimed in claim 1, wherein the ARM embedded system employs a samsung s5PV210 chip.
3. The portable high-power microwave switch in-situ inspection tester as claimed in claim 1, wherein the display interface circuit includes a four-wire resistive touch screen interface and a group seven inch true color LCD.
4. The portable high-power microwave switch in-situ inspection instrument according to claim 1, wherein the power management circuit comprises a voltage boosting circuit and a voltage reducing circuit, the external power supply has AC220V and DC28V, and the in-situ inspection instrument is internally powered by a lithium battery.
5. The portable high-power microwave switch in-situ inspection tester as claimed in claim 4, wherein the boost circuit employs an XL6009-ADJ adjustable boost chip.
6. The portable high-power microwave switch in-situ inspection instrument according to claim 4, characterized in that the voltage reduction circuit adopts XL1509-5V and XL1509-3.3V voltage reduction chips.
7. The portable high-power microwave switch in-situ inspection tester as claimed in claim 1, wherein the switch driving circuit comprises at least one relay driving circuit and a relay connected thereto.
8. The portable high-power microwave switch in-situ inspection tester as claimed in claim 1, wherein the signal acquisition circuit comprises a switch state reading circuit connected with the high-power microwave switch, and an AD conversion circuit for monitoring the battery voltage and the control voltage power supply signal in real time.
9. The portable high-power microwave switch in-situ inspection tester as claimed in claim 1, wherein the ARM embedded system further comprises a control circuit, and the control circuit adopts a C8051F020 single chip microcomputer.
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| CN202022410901.1U CN213337927U (en) | 2020-10-27 | 2020-10-27 | Portable high-power microwave switch in-situ inspection tester |
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| CN202022410901.1U CN213337927U (en) | 2020-10-27 | 2020-10-27 | Portable high-power microwave switch in-situ inspection tester |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117434439A (en) * | 2023-12-20 | 2024-01-23 | 天津航空机电有限公司 | Circuit and method for collecting state of large-scale device with auxiliary contact |
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2020
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117434439A (en) * | 2023-12-20 | 2024-01-23 | 天津航空机电有限公司 | Circuit and method for collecting state of large-scale device with auxiliary contact |
| CN117434439B (en) * | 2023-12-20 | 2024-04-09 | 天津航空机电有限公司 | Circuit and method for collecting state of large-scale device with auxiliary contact |
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