CN213244008U - Self-adaptive device for protecting strong light attack and calibration parameters of single photon detector - Google Patents
Self-adaptive device for protecting strong light attack and calibration parameters of single photon detector Download PDFInfo
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- CN213244008U CN213244008U CN202022693758.1U CN202022693758U CN213244008U CN 213244008 U CN213244008 U CN 213244008U CN 202022693758 U CN202022693758 U CN 202022693758U CN 213244008 U CN213244008 U CN 213244008U
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Abstract
The scheme provides a self-adaptive device for protecting strong light attack and calibration parameters of a single photon detector. The controller and the APD high-voltage generator are both connected with the voltage controller, and a level signal receiving end of the APD high-voltage generator is connected with the comparator. Two input ends of the comparator are respectively connected with the reference voltage control unit and the sampling voltage acquisition assembly. The current detection device is connected with the APD high-voltage generator, the APD load circuit and the sampling voltage acquisition assembly, and the other end of the sampling voltage acquisition assembly is grounded or connected with the control feedback end of the controller. The controller is connected with the optical generator and then sequentially connected with the attenuation controller and the APD load circuit. The advantages are that: the effective judgment on the strong light attack is realized through a comparison mode, a mode of calculating an APD (avalanche photo diode) bias current value is not adopted, a feedback link is additionally arranged to realize the self-adaptive adjustment of the reference voltage according to the distance change of an optical fiber link, the effective detection on the strong light attack is kept, and the problem that a key signal is stolen due to the fact that detection is missed is avoided.
Description
Technical Field
The utility model relates to a quantum communication field especially relates to a protection single photon detector highlight attacks and calibration parameter's self-adaptation device.
Background
With the continuous progress of quantum key communication, attack schemes are more and more, and the eyes of attackers do not focus on splitting or copying photon signals any more, but try to attack and control single-photon detectors carrying information directly. The attack scheme is that a single photon detector is sent with strong light to cause the single photon detector to be blinded: adding a strong direct current optical signal into a quantum communication channel to attack the single photon detector, so that the single photon detector cannot work in an avalanche state → cannot respond to the single photon signal → the output of the single photon detector circuit is controlled by a strong light pulse signal superposed on the direct current strong light signal. The detector blind attack is based on the difference between a Geiger working mode and a linear working mode of a single-photon detector, and the blind detector controls the basis vector selection of a receiving end.
If the attack is successful, the attacker can completely control the output of the single-photon detector. The attacker can then act as a sender to randomly "send data" to the receiver. The sender and the receiver can not find out the received data which is abnormal, and handshake and base pairing operations are carried out through the classical channel as well, so that an attacker can obtain almost all quantum key signals only by stealing the communication data of the classical channel.
The existing main detection method for the blind attack of the detector is to detect the strong light blind attack by constructing a measuring device irrelevant scheme, but the scheme needs two-photon interference, and the problem of low key rate generation rate of a protocol exists.
In another existing mode, a PIN photodiode is used to convert a strong light narrow pulse signal sent by an attacker into a narrow pulse current, a narrow pulse voltage is output, and a control chip judges whether the single photon detector is attacked by strong light or not according to a voltage value. However, the conventional PIN tube detection method has low sensitivity, poor linearity and poor accuracy, and cannot accurately measure the bias current value of an APD (Avalanche photodiode). In the prior art, the measurement accuracy is improved by additionally arranging a current detection circuit, but an APD (avalanche photo diode) bias current value is calculated according to a bias current fitting curve obtained by a current sensor, the judgment process is slow in the technical scheme of further judging whether the single-photon detector is attacked by strong light, and the problem that the dependence on the performance of the sensor on the bias current fitting curve is large exists in the scheme.
Therefore, how to provide a circuit device for detecting and protecting strong light attack of a single photon detector, which is simple, rapid and accurate in detection, becomes an urgent problem to be solved.
SUMMERY OF THE UTILITY MODEL
The utility model provides a protection single photon detector highlight attacks and calibration parameter's self-adaptation device for solve among the prior art attack the problem that the detection relies on greatly to the sensor performance to the highlight, further solve among the prior art problem that single photon detector received the unable timely protection single photon detector of highlight attack, still solved when the optical fiber link distance changes, the highlight attack detection scheme that prior art provided does not have the distance change of self-adaptation optical fiber link, and can't carry out the problem that the highlight attack detected.
In order to achieve the above object, the utility model provides a protection single photon detector highlight attacks and calibration parameter's self-adaptation device, it includes: the device comprises a controller, a voltage controller, an APD high-voltage generator, a current detection device, a comparator, an APD load circuit, a reference voltage control unit, a sampling voltage acquisition assembly, an optical generator and an attenuation controller, wherein a first control end of the controller is connected with a control signal receiving end of the voltage controller. The voltage input end of the APD high-voltage generator is connected with the voltage output end of the voltage controller, and the level signal receiving end of the APD high-voltage generator is connected with the output end of the comparator. The input end IN + of the comparator is connected with the reference voltage output end of the reference voltage control unit, and the input end IN-of the comparator and the sampling voltage acquisition assembly are connected with a circuit node A. The drive end of the current detection device is connected with the output end of the APD high-voltage generator, the first output end of the current detection device is connected with the drive end of the APD load circuit, and the second output end of the current detection device is connected with the sampling voltage acquisition assembly through the circuit node A. One end of the voltage acquisition assembly is connected with the circuit node A, and the other end of the voltage acquisition assembly is grounded or connected with the control feedback end of the controller. The light source control end of the controller is connected with the light generator, and the light generator is connected with the APD load circuit after being communicated with the attenuation controller.
Preferably, the voltage sampling module is connected to the circuit node a at one end and grounded at the other end, and includes a single sampling resistor, the sampling resistor is connected to the circuit node a at one end and grounded at the other end.
Preferably, as the above technical solution, one end of the sampling voltage collecting component is connected to the circuit node a, and the other end is grounded, including that the sampling voltage collecting component is composed of a sampling resistor and an ADC analog-to-digital conversion circuit, one end of the sampling resistor and a receiving end of the ADC analog-to-digital conversion circuit are both connected to the circuit node a, the other end of the sampling resistor is grounded, and the other end of the ADC analog-to-digital conversion circuit is connected to a third control end of the controller.
Preferably, the reference voltage control unit is a chip or is composed of a fixed resistor.
Preferably, as a preferred option of the above technical solution, the reference voltage control unit is composed of at least two fixed resistors, one end of each of the two fixed resistors is connected to the circuit node B and then communicated with the input terminal IN +, and the other end of each of the two fixed resistors is grounded.
Preferably, when the reference voltage control unit is a chip, the second control terminal of the controller is connected to the control signal receiving terminal of the reference voltage control unit.
Preferably, as a preferred feature of the above technical solution, the enable terminal of the APD high voltage generator is connected to the enable output terminal of the controller,
preferably, the APD load circuit is composed of an APD load, a capacitor and a resistor, the APD load, the capacitor and the resistor are connected in parallel, one parallel end is connected to the output end of the current detection device, and the other parallel end is grounded.
Preferably, in the above technical solution, light emitted by the light generator is attenuated by the attenuation controller and then input to the APD load circuit, and the voltage acquisition component continuously receives a sampling voltage output by the APD load circuit after receiving the attenuation light and feeds the sampling voltage back to the storage unit of the controller.
The utility model provides a protection single photon detector highlight attacks and mark parameter's self-adaptation device. The first control end of the controller is connected with the control signal receiving end of the voltage controller. The voltage input end of the APD high-voltage generator is connected with the voltage controller, and the level signal receiving end of the APD high-voltage generator is connected with the output end of the comparator. The input end IN + of the comparator is connected with the reference voltage control unit, and the input end IN-of the comparator and the sampling voltage acquisition assembly are connected with a circuit node A. The drive end of the current detection device is connected with the APD high-voltage generator, the first output end of the current detection device is connected with the APD load circuit, and the second output end of the current detection device is connected with the sampling voltage acquisition assembly through a circuit node A. One end of the voltage acquisition assembly is connected with the circuit node A, and the other end of the voltage acquisition assembly is grounded or connected with the control feedback end of the controller. The controller is connected to the optical generator and then to the attenuation controller and the APD load circuit.
The utility model has the advantages that, it is quick through the mode of comparison, simple and convenient realization is to the effective judgement that the highlight is attacked, does not adopt the mode that calculates APD partial flow value according to sensor data to judge whether receive the highlight attack, has shortened the response time of system to the highlight attack.
The feedback link is additionally arranged, the feedback link can feed back sampling voltage change to the control unit according to the distance change of the optical fiber link, and the controller adaptively adjusts the reference voltage according to the sampling voltage change, so that the problem that a key signal is stolen due to detection leakage is solved by effectively detecting strong light attack.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, a brief description will be given below of the drawings required to be used in the description of the embodiments or the prior art, and it is obvious that the drawings in the following description are some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is a circuit structure diagram of an adaptive apparatus for protecting single photon detector from strong light attack and calibrating parameters according to an embodiment of the present invention.
Fig. 1a is a circuit structure diagram of the adaptive apparatus for protecting strong light attack and calibration parameters of a single photon detector shown in fig. 1 without a light generator and an attenuation controller.
Fig. 2 is a circuit structure diagram of the adaptive apparatus for protecting the hard light attack and calibration parameters of the single photon detector provided by the embodiment of the present invention.
Fig. 3 is a circuit structure diagram of the adaptive apparatus for protecting the hard light attack and calibration parameters of the single photon detector provided in the third embodiment of the present invention.
Fig. 3a is a circuit structure diagram of the adaptive apparatus for protecting the single photon detector from strong light attack and calibration parameters shown in fig. 3 without the light generator and the attenuation controller.
Fig. 4 is a flow chart of the protection single photon detector highlight attack and calibration parameter adaptive device provided by the technical scheme of the utility model in the specific application.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the drawings in the embodiments of the present invention are combined below to clearly and completely describe the technical solutions in the embodiments of the present invention, and obviously, the described embodiments are some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.
Fig. 1-3a are schematic diagrams of circuit structures provided by an embodiment of the present invention, as shown in fig. 1 and fig. 3, the present embodiment provides, including: the device comprises a controller 1, a reference voltage control unit 2, a comparator 3, an APD load circuit 4, a current detection device 5, a voltage controller 6, an APD high-voltage generator 7, a sampling voltage acquisition component 8, an optical generator 9 and an attenuation controller 10.
The first control end of the controller 1 and the control signal receiving end of the voltage controller are connected with the voltage input end of the APD high-voltage generator 7 and the voltage output end of the voltage controller 6, and the level signal receiving end of the APD high-voltage generator 7 is connected with the output end of the comparator 3. The enable terminal of the APD high voltage generator 7 is connected to the enable output terminal of the controller 1. The light source control end of the controller 1 is connected with the light generator 9, and the light generator 9 is connected with the APD load circuit 4 after being communicated with the attenuation controller 10.
The input end IN + of the comparator 3 is connected with the reference voltage output end of the reference voltage control unit 2, and the input end IN-of the comparator 3 and the sampling voltage acquisition component 8 are connected to a circuit node A.
The driving end of the current detection device 5 is connected with the output end of the APD high-voltage generator 7, the first output end of the current detection device 5 is connected with the driving end of the APD load circuit 4, and the second output end is connected with the sampling voltage acquisition component 8 through a circuit node A.
One end of the voltage acquisition component 8 is connected with the circuit node A, and the other end is grounded or connected with the control feedback end of the controller 1. Specifically, as shown in fig. 1, when the voltage sampling component 8 is a single sampling resistor R1, one end of the sampling resistor is connected to the circuit node a, and the other end is grounded.
Light emitted by the light generator 9 is attenuated by the attenuation controller 10 and then input to the APD load circuit 4, and the voltage acquisition component 8 continuously receives sampling voltage output by the APD load circuit 4 after receiving the attenuation and feeds the sampling voltage back to the storage unit of the controller 1. In practical application, the controller 1 controls the light generator 9 to emit light source, the light source is attenuated after passing through the attenuation controller 10, the attenuated light source is input to the APD load circuit 4 to operate, during this period, the sampling voltage collecting assembly 8 collects sampling voltage values corresponding to light sources with various attenuation degrees uninterruptedly, and sends the sampling voltage values to the storage unit of the controller 1, so as to further obtain reference voltage values corresponding to different light sources, so as to adjust the reference voltage in a self-adaptive manner in the circuit structures shown in fig. 1, 1a, 3 and 3 a.
Further, the APD load circuit 4 is composed of an APD load, a capacitor C and a resistor R2, the APD load, the capacitor C and the resistor R2 are connected in parallel, a parallel end of the APD load, the capacitor C and the resistor R2 is connected with an output end of the current detection device, and the other parallel end is grounded.
Specifically, as shown in fig. 3 and fig. 3a, when the sampling voltage collecting module 8 is composed of a sampling resistor R1 and an ADC analog-to-digital conversion circuit 81, one end of the sampling resistor R1 and the receiving end of the ADC analog-to-digital conversion circuit 81 are both connected to the circuit node a, the other end of the sampling resistor R1 is grounded, and the other end of the ADC analog-to-digital conversion circuit 81 is connected to the third control end of the controller.
The reference voltage control unit 2 is composed of a chip or a plurality of resistors, and specifically, as shown in fig. 1 and 3, when the reference voltage control unit 2 is a chip, the second control terminal of the controller 1 is connected to the control signal receiving terminal of the reference voltage control unit 2.
For another example, the circuit diagrams shown in fig. 1a and 3a are based on the circuit diagrams shown in fig. 1 and 3. In fig. 1 a: the controller 1 sends a control signal B to the reference voltage control unit 2 to adjust the current reference voltage Vref, where the control signal B includes the reference voltage Vref matched with the sampling voltage Vc and retrieved from the memory unit in the controller 1.
In fig. 3 a: the controller 1 sends a control signal B to the reference voltage control unit 2 to adjust the current reference voltage Vref, where the control signal B includes a reference voltage Vref matched with the sample voltage Vc and retrieved from a storage unit in the controller 1.
As shown in fig. 2, includes: the device comprises a controller 1, a reference voltage control unit 2, a comparator 3, an APD load circuit 4, a current detection device 5, a voltage controller 6, an APD high-voltage generator 7 and a sampling voltage acquisition assembly 8, wherein when the reference voltage control unit 2 consists of at least two fixed resistors R3 and R4, one ends of R3 and R4 are connected to a circuit node B and then communicated with an input end IN + of the comparator, the other ends of R3 and R4 are grounded, an output end of the comparator 3 is also connected with a signal receiving end of the controller 1 and used for receiving a strong light attack warning signal, and the rest structures (except the light generator 9 and the attenuation controller 10) are the same as the circuit structures shown IN FIG. 1 and are not repeated herein.
Further, it is right to combine specific use scene now the utility model discloses technical scheme carries out the detailed description:
the technical solution of the present invention is now described in detail with reference to specific embodiments, and the specific sampling component is illustrated by taking a resistor as an example, but may be other electronic components capable of recovering the purpose of sampling voltage.
As shown in fig. 1 and fig. 1a, fig. 1 and fig. 1a are circuit structure diagrams of a single photon detector strong light attack detection and protection circuit provided by an embodiment of the present invention, wherein the sampling voltage collecting component 8 is a sampling resistor R1.
Furthermore, in the technical scheme of the utility model; the voltage controller 6 may be a DAC chip.
Now, the circuit device provided by the present invention will be described in detail, and the circuit structure shown in fig. 1 and fig. 1a will be described first: the sampling voltage acquisition component 8 is a sampling resistor R1.
In the initial state: the controller 1 sends a control signal a to the voltage controller 6, causing the voltage control unit to output a voltage V-IN to the APD high voltage generator 7. The controller 1 sends a control signal B to the reference voltage control unit 2, and the reference voltage control unit 2 sets the value of the reference voltage Vref according to the control signal B and loads it to the IN + port of the comparator 3. The controller 1 outputs an OFF signal (OFF signal) to the APD high-voltage generator 7, the APD load circuit 4 is not operated, the sampling voltage Vc across the resistor R1 is 0V, Vref > Vc, and the output terminal of the comparator 3 outputs an APC-CTL signal at a high level to the APD, thereby turning on the APD high-voltage generator 7 (to be operated). For the circuit diagram shown in fig. 1, the controller 1 controls the light generator 9 to emit light source, the light source is attenuated after passing through the attenuation controller 10, the attenuated light source is input to the APD load circuit 4 to operate, during this period, the sampling resistor R1 collects the sampling voltage values corresponding to the light sources with different attenuation degrees uninterruptedly, and sends the sampling voltage values to the storage unit of the controller 1 through the comparator 3 to obtain the corresponding relation between different light sources and the sampling voltage, and the adjustment is realized through the control signal B when the reference voltage Vref needs to be adjusted. For the circuit diagram shown in fig. 1a, the corresponding relationship between each attenuation degree light source and the sampling voltage Vc is pre-stored in the memory unit of the controller 1, and is realized by the control signal B when the reference voltage Vref needs to be adjusted.
And (3) starting to work: after controller 1 sends the ON signal to APD high voltage generator 7 to enable and APD high voltage generator 7 receives V-IN, APD high voltage generator 7 outputs high voltage signal HV-OUT. After receiving the HV-OUT, the current detection device 5 outputs two paths of consistent voltage signals, referring to fig. 1 and fig. 1a, one path of the two paths of voltage signals is used to provide a high voltage signal to the APD load circuit 4 to enable the APD load circuit to operate normally, and the other path recovers the sampling voltage Vc through the sampling component R1 and sends the sampling voltage Vc to the other input end IN-of the comparator 3.
When the single photon detector (APD load circuit 4) normally works: the comparator 3 compares the sampling voltage Vc with the reference voltage Vref, and when Vref > Vc, the comparator 3 outputs an APD-CTL signal of high level to the APD high voltage generator 7.
In detail, in normal operation, Vc < Vref, I1 flowing through the APD load circuit 4 is small, and I2 flowing through the sampling component R1 is also small, where I2= β I1 and Vc = I2 × R1. Wherein β is a fixed parameter (any decimal) of 0 to 1, preferably β = 0.1.
When the APD of the single photon detector is attacked by strong light: i1 rises rapidly, I2 rises rapidly in synchronization with the above formula, and Vc = I2 × R1> Vref at this time. At the moment, the comparator 3 outputs the low-level APD-CTL to the APD high-voltage generator 7, the APD high-voltage generator 7 is closed, and HV-OUT is 0V, so that the HV-APD loaded on the APD load circuit 4 disappears, the APD of the single-photon detector is immediately turned off, and the protection of the APD of the single-photon detector is realized. Meanwhile, the comparator 3 can also output strong light alarm information to the controller 1 for detecting strong light attack in the single photon detector. Wherein the turn-off response time is less than 100 picoseconds (ps). When I1 produces a slight fluctuation, the comparator 3 also sends a strong light attack warning to the controller 1, at which time the controller 1 judges that it is not under strong light attack, and sends a control signal B to the reference voltage control unit to adjust the current reference voltage Vref.
The circuit diagram shown in fig. 2 will now be explained: fig. 2 replaces the reference voltage control unit 6 in fig. 1 with pre-configured resistors R3, R4 for the purpose of inputting a pre-configured reference voltage Vref to the comparator 3. Compared with the first embodiment, the scheme provided by the embodiment simplifies the circuit design, and reduces the cost. When the controller 1 is attacked by strong light, the comparator 3 outputs a low level signal to turn off the APD high voltage generator 7, and sends a strong light attack warning signal to the APD high voltage generator.
The circuit diagram shown in fig. 3 and 3a will now be described, specifically: in this figure, the voltage acquisition component 8 is a feedback link: the ADC analog-to-digital conversion circuit 81 is composed of a resistor R1.
In the initial state: the controller 1 sends a control signal a to the voltage control unit, causing the voltage control unit to output a voltage V-IN to the APD high voltage generator 7. The controller 1 sends a control signal B to the reference voltage control unit 2, and the reference voltage control unit 2 sets the value of the initial reference voltage Vref1 according to the control signal B and loads it to the IN + port of the comparator 3. Initially, the Vref1 voltage is set to a maximum value to ensure that the APD-CTL signal received by APD high voltage generator 7 is valid at all times. The controller 3 outputs an OFF signal (OFF signal) to the APD high-voltage generator 7, the APD load circuit 4 is not operated, the sampling voltage Vc across the resistor R1 is 0V, Vref > Vc, and the output terminal of the comparator 3 outputs an APC-CTL signal at a high level to the APD high-voltage generator 7, thereby turning on the APD high-voltage generator 7 (to be operated). For the circuit diagram shown in fig. 3, the controller 1 controls the light generator 9 to emit light source, the light source is attenuated after passing through the attenuation controller 10, the attenuated light source is input to the APD load circuit 4 to operate, during this period, the sampling resistor R1 collects the sampling voltage values corresponding to the light sources with different attenuation degrees uninterruptedly, and sends the sampling voltage values to the storage unit of the controller 1 through the ADC analog-to-digital conversion circuit 81 to obtain the corresponding relationship between different light sources and sampling voltages for subsequent calling, and the reference voltage Vref is adjusted by the control signal B. For the circuit diagram shown in fig. 3a, the controller 1 sends a control signal B to the reference voltage control unit to adjust the reference voltage Vref according to the information contained in the control signal C collected and fed back in real time by the real-time sampling resistor R1 and the ADC analog-to-digital conversion circuit 81.
And (3) starting to work: after controller 1 sends the ON signal to APD high voltage generator 7 to enable and APD high voltage generator 7 receives V-IN, APD high voltage generator 7 outputs high voltage signal HV-OUT. After receiving the HV-OUT, the current detection device 5 outputs two paths of consistent voltage signals, referring to fig. 3, one path of the two paths of voltage signals is used for providing a high voltage signal to the APD load circuit 4 to enable the APD load circuit to work normally, and the other path recovers the sampling voltage Vc through the sampling component R1 and sends the sampling voltage Vc to the other input end IN-of the comparator.
When the single photon detector normally works: the comparator compares the sampling voltage Vc with the reference voltage Vref, when Vref > Vc, the comparator outputs a high-level APD-CTL signal to the APD high-voltage generator 7. The controller 1 reads the current sample voltage Vc1 in R1 according to the control signal C sent by the ADC analog-to-digital conversion circuit 81. In detail, Vc1 is a voltage value of the single photon detector that normally works in the actual system operation, and its value is related to the actual fiber link distance, and the longer the link, the smaller Vc 1.
Further, when the optical fiber device is redeployed and the distance of the optical fiber link changes, the prior art can only match the reference voltage and the sampling voltage again in a continuous test mode, the time consumption is long in the process, the matching is easy to be inaccurate, and the following modes are provided in the application:
when the link distance becomes longer: the controller 1 sends a control signal B for setting Vref2 in accordance with the received control signal C. The control signal B instructs the reference voltage control unit 2 to adjust Vref1 to a voltage of Verf2, Vref2 is applied to the input terminal IN + of the comparator 3, Vref2= Vc1+ a0mV, and a0 is a negative number.
Thereby solving the following problems: the difference value between the initial reference voltage and the sampling voltage is gradually increased due to the fact that the optical fiber link is shortened and lengthened, and the single photon detector is attacked by strong light in the deployment process and cannot detect the strong light (the reference voltage is larger than the attack light is larger than the sampling voltage). The strong light attack detection is realized according to the distance self-adaption of the optical fiber link of the single-photon detector in practical application.
When the fiber link distance becomes short: during this deployment, the ADC analog-to-digital conversion circuit 81 continuously receives the current sampling voltage, and the controller 1 sends a control signal B for setting Vref3 according to the received control signal C. The control signal B instructs the reference voltage control unit 2 to adjust Vref1 to a voltage of Verf3, and Vref3 is applied to the input terminal IN + of the comparator 3, where Vref3= Vc1+ a0mV and a0 is a positive number.
Further, after the optical fiber equipment is deployed, the single photon detector works normally, Vref > Vc, I1 flowing through an APD load circuit is small, and I2 flowing through a sampling assembly R1 is also small, wherein I2= beta I1, and Vc = I2 multiplied by R1. Wherein beta is a fixed parameter of 0-1, and preferably beta = 0.1.
When the single photon detector is attacked by strong light: i1 rises rapidly, I2 rises rapidly in synchronization with the above formula, and Vc = I2 × R1> Vref at this time. At this time, the comparator 3 outputs an APD-CTL signal with a low level to the APD high-voltage generator 7, the APD high-voltage generator 7 is turned off, and the HV-OUT output is 0V, so that the HV-APD loaded on the APD load circuit 4 disappears, the APD of the single-photon detector is turned off, and the protection of the APD of the single-photon detector is realized. Meanwhile, the comparator 3 can also output strong light warning information to the controller 1, and the controller 1 records strong light attack according to the warning information to realize strong light attack detection in the single photon detector.
When the circuits shown in fig. 1 and 3 are attacked by strong light, the reference voltage control unit 2 can also adjust the reference voltage according to the corresponding relationship between the sampling voltage value stored in the storage unit of the controller 1 and the light source.
The circuit device shown in fig. 3 realizes optimization of the strong light attack detection circuit, and not only adopts the ADC analog-to-digital conversion circuit to directly sample the voltage in the R1 sampling component, but also reads the sampling value of the ADC analog-to-digital conversion module through the control signal C, thereby realizing the purpose of adjusting the reference voltage value through adaptive optical fiber link change, and also realizing the purpose of detecting and protecting the strong light attack of the single photon detector.
Specifically, a flow chart is used to describe the situation that the APD is attacked by strong light in the circuits shown in fig. 1 to 3a, as shown in fig. 4:
And 102, setting a reference voltage value.
In step 103, the comparator outputs the APC-CTL signal of high level.
Specifically, for the circuits IN fig. 1, 1a, 3 and 3a, the reference voltage control unit 2 sets the reference voltage value according to the control signal B and loads it to the IN + port of the comparator 3, while the APD load circuit 4 is not operating, and the comparator 3 outputs the APC-CTL signal at a high level. For the circuit of fig. 2, the IN + port of the comparator 3 receives a preconfigured reference voltage, the APD load circuit 4 is not operating, and thus the comparator 3 outputs an APC-CTL signal at a high level.
And step 104, the APD high-voltage generator is in a standby working state.
At this time, the enable terminal of the APD high voltage generator 7 receives the OFF signal (OFF) transmitted by the controller 1.
And 106, outputting a high-voltage signal by the APD high-voltage generator.
And step 107, outputting a high-voltage signal for the APD load circuit to work and a high-voltage signal for recovering the sampling voltage by the current detection device.
And step 108, recovering the sampling voltage by the sampling resistor R1 and sending the sampling voltage to the comparator.
Step 110, the APD load circuit continues to operate.
And step 111, turning off the APD high-voltage generator, and stopping the APD load circuit.
Meanwhile, the comparator 3 outputs strong light warning information to the controller 1 for detecting strong light attack in the single photon detector.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; such modifications and substitutions do not depart from the spirit and scope of the present invention.
Claims (9)
1. An adaptive device for protecting strong light attack and calibrating parameters of a single photon detector is characterized by comprising: a controller, a voltage controller, an APD high voltage generator, a current detection device, a comparator, an APD load circuit, a reference voltage control unit, a sampling voltage acquisition component, an optical generator and an attenuation controller,
the first control end of the controller is connected with the control signal receiving end of the voltage controller;
the voltage input end of the APD high-voltage generator is connected with the voltage output end of the voltage controller, and the level signal receiving end of the APD high-voltage generator is connected with the output end of the comparator;
the input end IN + of the comparator is connected with the reference voltage output end of the reference voltage control unit, and the input end IN-of the comparator and the sampling voltage acquisition assembly are connected to a circuit node A;
the drive end of the current detection device is connected with the output end of the APD high-voltage generator, the first output end of the current detection device is connected with the drive end of the APD load circuit, and the second output end of the current detection device is connected with the sampling voltage acquisition component through the circuit node A;
one end of the sampling voltage acquisition assembly is connected with the circuit node A, and the other end of the sampling voltage acquisition assembly is grounded or connected with a control feedback end of the controller;
and the light source control end of the controller is connected with the light generator, and the light generator is connected with the APD load circuit after being communicated with the attenuation controller.
2. The apparatus for protecting strong light attack and calibrating parameters of single photon detectors of claim 1 wherein said sampling voltage collecting module is connected to said circuit node A at one end and to ground at the other end, comprising,
the sampling voltage acquisition assembly is an independent sampling resistor, one end of the sampling resistor is connected with the circuit node A, and the other end of the sampling resistor is grounded.
3. The apparatus for protecting strong light attack and calibrating parameters of single photon detectors of claim 1 wherein said sampling voltage collecting module is connected to said circuit node A at one end and to ground at the other end, comprising,
the sampling voltage acquisition assembly comprises a sampling resistor and an ADC analog-to-digital conversion circuit, one end of the sampling resistor and the receiving end of the ADC analog-to-digital conversion circuit are connected to a circuit node A, the other end of the sampling resistor is grounded, and the other end of the ADC analog-to-digital conversion circuit is connected with the third control end of the controller.
4. The apparatus of claim 1 for protecting single photon detector from strong light attack and calibrating parameters, wherein said reference voltage control unit is a chip or is composed of fixed resistors.
5. The apparatus according to claim 4 for protecting single photon detector from strong light attack and calibrating parameters, wherein said reference voltage control unit comprises at least two fixed resistors, one end of each of said two fixed resistors is connected to node B of the circuit and then connected to said input IN +, and the other end of each of said two fixed resistors is grounded.
6. The adaptive device for protecting strong light attack and calibration parameters of single photon detectors according to claim 4, wherein when said reference voltage control unit is a chip, the second control terminal of said controller is connected to the control signal receiving terminal of said reference voltage control unit.
7. The adaptive apparatus for protecting strong light attack and calibration parameters of single photon detectors according to claim 1, wherein the enable terminal of said APD high voltage generator is connected to the enable output terminal of said controller.
8. The adaptive device for protecting strong light attack and calibration parameters of single photon detectors according to claim 1, wherein said APD load circuit is composed of an APD load, a capacitor and a resistor, said APD load, said capacitor and said resistor are connected in parallel, one parallel end is connected to the output end of said current detection device, and the other parallel end is grounded.
9. The adaptive device for protecting strong light attack and calibration parameters of single photon detectors according to claim 1, wherein the light generated by said light generator is attenuated by said attenuation controller and then input to said APD load circuit, and said voltage acquisition module continuously receives the sampling voltage output by said APD load circuit after receiving the attenuated light and feeds the sampling voltage back to the storage unit of said controller.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN114580003A (en) * | 2022-04-28 | 2022-06-03 | 北京密码云芯科技有限公司 | Data protection device aiming at energy attack and use method |
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| CN114580003A (en) * | 2022-04-28 | 2022-06-03 | 北京密码云芯科技有限公司 | Data protection device aiming at energy attack and use method |
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