CN213212141U - Chip testing platform - Google Patents
Chip testing platform Download PDFInfo
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- CN213212141U CN213212141U CN202022187364.9U CN202022187364U CN213212141U CN 213212141 U CN213212141 U CN 213212141U CN 202022187364 U CN202022187364 U CN 202022187364U CN 213212141 U CN213212141 U CN 213212141U
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Abstract
The embodiment of the utility model provides a chip test platform, include: an adjustment mechanism, the adjustment mechanism comprising: the direction adjusting sliding table is installed on the rotating motor; the testing mechanism is arranged on the rotating motor, and the other testing mechanism is arranged on the direction adjusting sliding table; and the two refrigerating mechanisms are respectively arranged on the two testing mechanisms. The embodiment of the utility model provides a chip test platform adjusts the slip table through setting up the direction, when having overcome artifical installation chip test platform, has positional deviation's problem between two accredited testing organization, has realized the accurate fine setting to accredited testing organization, can adjust two accredited testing organization to a circumference through manual fine setting effectively, when guaranteeing the accuracy of chip test, also provides reference for chip test platform dismantles the back and installs once more.
Description
Technical Field
The utility model relates to a chip test technical field especially relates to a chip test platform.
Background
The technology of the current chip test platform is mature, but the chip test time is too long, so that the productivity can not be met completely, and the industry starts to look at a test platform for carrying out material transportation at the same time in double stations. Although the double-station simultaneous material conveying can improve the testing efficiency, the rotary platform is adopted between the double stations to adjust the positions of the chips, theoretically, the two chips can reach the point to be tested at each time, and in actual work, as the machining precision and the assembling precision cannot meet the theoretical requirements, or debugging is laborious, randomness is high, and the requirements of installation and debugging of the existing production line cannot be met.
SUMMERY OF THE UTILITY MODEL
The embodiment of the utility model provides a chip test platform for the rotatory back position in duplex position of solving among the prior art chip test platform can not the coincidence defect.
The embodiment of the utility model provides a chip test platform, include: an adjustment mechanism, the adjustment mechanism comprising: the direction adjusting sliding table is installed on the rotating motor; the testing mechanism is arranged on the rotating motor, and the other testing mechanism is arranged on the direction adjusting sliding table; and the two refrigerating mechanisms are respectively arranged on the two testing mechanisms.
According to the utility model discloses a chip test platform, accredited testing organization includes first supporting seat and second supporting seat, first supporting seat is installed on the rotating motor, the second supporting seat is installed on the slip table is adjusted to the direction.
According to the utility model discloses a chip test platform, the length of first supporting seat is greater than the length of second supporting seat.
According to the utility model discloses a chip test platform, every refrigerating mechanism includes respectively: the water-cooling copper blocks are respectively arranged on the first supporting seat and the second supporting seat; the refrigeration piece is installed on the water-cooling copper block.
According to the utility model discloses a chip test platform, every the side of water-cooling copper billet is formed with inlet channel and outlet channel, just inlet channel with outlet channel intercommunication.
According to the utility model discloses a chip test platform, every refrigerating mechanism still includes: the water inlet end is connected with the water inlet channel of the water-cooled copper block; and the water outlet end is connected with the water outlet channel of the water-cooling copper block.
According to the utility model discloses a chip test platform, every accredited testing organization still includes: the cooling plate comprises a refrigeration piece, a gold-plated copper block, a boss and a test chip, wherein the gold-plated copper block is arranged on the refrigeration piece, and the boss is formed on the upper surface of the gold-plated copper block and is constructed into the test boss for placing the test chip.
According to the utility model discloses a chip test platform, every accredited testing organization still includes: the pen-shaped air cylinder is arranged on the gold-plated copper block; the guide rail is arranged on the gold-plated copper block and is opposite to the pen-shaped cylinder; and the clip is arranged on the guide rail and is connected with the pen-shaped air cylinder.
According to the utility model discloses a chip test platform, every refrigerating mechanism still includes: a thermistor mounted on the gold-plated copper block; and the thermistor pressing block is arranged on the thermistor so as to fix the thermistor and the gold-plated copper block.
According to the utility model discloses a chip test platform, every refrigerating mechanism still includes the controller, the controller respectively with thermistor with the refrigeration piece electricity is connected.
The embodiment of the utility model provides a chip test platform adjusts the slip table through setting up the direction, when having overcome artifical installation chip test platform, has positional deviation's problem between two accredited testing organization, has realized the accurate fine setting to accredited testing organization, can adjust two accredited testing organization to a circumference through manual fine setting effectively, when guaranteeing the accuracy of chip test, also provides reference for chip test platform dismantles the back and installs once more.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art are briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
FIG. 1 is a schematic diagram of a prior art chip test platform;
fig. 2 is a schematic structural diagram of a chip testing platform provided in an embodiment of the present invention;
fig. 3 is a partially enlarged view of fig. 2.
Reference numerals:
1: a first clip; 2: a second clip; 3: gold-plated copper blocks; 4: a clamping jaw cylinder; 5: a rotary motor; 6: a connecting plate; 7: water-cooling the copper block; 8: a chip; 9: a thermistor; 10: a refrigeration plate; 11: testing the boss; 12: a thermistor pressing block; 13: a water inlet end; 14: a water outlet end; 15: a direction adjustment sliding table; 16: a first support base; 17: a second support seat; 18: a clip; 19: a pen-shaped cylinder.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
The chip testing platform according to the embodiment of the present invention is described below with reference to fig. 1 to 3.
Fig. 1 is a schematic structural diagram of a chip testing platform in the prior art. As shown in fig. 1, the conventional chip testing platform is a double-station testing platform, and the two testing platforms have the same structure and are mainly used for testing COS chips.
The existing chip test platform mainly has the following defects:
1. the installation space of the clamping jaw cylinder 4 is too small, and the first clamp 1 and the second clamp 2 connected with the clamping jaw cylinder 4 are difficult to lock by an inner hexagonal wrench;
2. when the first clamp 1 and the second clamp 2 are locked at one end of the clamping jaw cylinder 4, the force arm is too large, so that large moment is generated, and the clamping jaw cylinder 4 is easy to clamp when being opened and closed;
3. the gold-plated copper block 3 is locked on the connecting plate 6 and is not easy to be disassembled and assembled, and the relative position of the gold-plated copper block 3 is easy to change due to the fact that one end of the locking screw is tilted to the other end;
4. the double-station test platform is mounted on the rotary motor 5, such as a platform a and a platform B. In the actual use process, after the chip on the platform A is tested, the platform B must be rotated to the position of the platform A, and then the chip on the platform B can be tested, so that the accuracy of the test result is ensured. This requires turning the rotary motor 5 to interchange the positions of the platform a and the platform B. When the rotation motor 5 rotates 180 degrees each time, theoretically, the two test platforms should exchange positions, the platform a should be at the position of the platform B after rotation, and the platform B should be at the position of the platform a. However, in actual work, due to the influence of the processing precision and the installation precision of the equipment, there is a deviation between the installation positions of the platform a and the platform B, the platform a and the platform B are not on the same circumference, and after the rotating motor 5 rotates 180 °, the platform a and the platform B cannot be exchanged in position, and the platform B cannot accurately reach the position of the platform a.
Synthesize above problem, as shown in fig. 2, the embodiment of the utility model provides a chip test platform specifically includes: two relatively arranged testing mechanisms, adjusting mechanisms and refrigerating mechanisms. The adjustment mechanism includes: the sliding table 15 is adjusted to swivel motor 5 and direction, and the direction is adjusted the sliding table 15 and is installed on swivel motor 5, and two accredited testing organization are installed respectively on swivel motor 5 and direction adjust the sliding table 15. In the actual use process, after the chip on the first testing mechanism is tested, the rotating motor 5 is rotated to rotate the rotating motor 5 by 180 degrees, and the positions of the first testing mechanism and the second testing mechanism are exchanged. As mentioned before, because of the influence of equipment machining precision and installation accuracy, the initial position of first accredited testing organization can't be arrived accurately to the second accredited testing organization, and at this moment, manual regulation direction regulation slip table 15 makes the second accredited testing organization move on the horizontal plane, specifically is the removal all around to make the accurate initial position that arrives the first accredited testing organization of second accredited testing organization, and then guarantees that the chip on the second accredited testing organization arrives the position of testing, with the accuracy of guaranteeing the chip test. Further, in an embodiment of the present invention, the precision of the direction adjusting sliding table 15 can reach 0.01mm, and the adjustment is very precise, convenient and does not occupy space. After the adjustment is finished, the position of the second testing mechanism can be recorded, the assembly position can be found for the next installation and disassembly, and reference can be provided for mass production of the chip testing platform.
In the chip testing process, after the chip is electrified, a large amount of heat can be generated instantly when the chip is electrified, and inaccurate data testing can be caused if the heat dissipation is not timely performed. The utility model discloses an in the embodiment, refrigerating mechanism installs on accredited testing organization to dispel the heat to accredited testing organization. Specifically, the refrigerating mechanism may be a cooling device such as a cooling fin or a fan.
The embodiment of the utility model provides a chip test platform adjusts the slip table through setting up the direction, when having overcome artifical installation chip test platform, has positional deviation's problem between two accredited testing organization, has realized the accurate fine setting to accredited testing organization, can adjust two accredited testing organization to a circumference through manual fine setting effectively, when guaranteeing the accuracy of chip test, also provides reference for chip test platform dismantles the back and installs once more.
As shown in fig. 2, in an embodiment of the present invention, the testing mechanism includes a first supporting seat 16 and a second supporting seat 17. Particularly, first supporting seat 16 is installed on rotary motor 5, and second supporting seat 17 is installed on direction adjustment slip table 15, and for guaranteeing that two accredited testing organization's height is the same, the length of second supporting seat 17 is less than the length of first supporting seat 16 to when guaranteeing that second accredited testing organization rotates to the position of first accredited testing organization, the chip of placing on it and the chip of placing on the first accredited testing organization's height position are identical completely.
As shown in fig. 2 and 3, further, in an embodiment of the present invention, each testing mechanism further includes: the test device comprises a clamp 18, a gold-plated copper block 3, a pen-shaped air cylinder 19, a guide rail 6 and a test boss 11. Specifically, the first supporting seat 16 and the second supporting seat 17 are both provided with a water-cooling copper block 7, the water-cooling copper block 7 is provided with a refrigerating sheet 10, the refrigerating sheet 10 is provided with a gold-plated copper block 3, a boss is formed on the upper surface of the gold-plated copper block 3 and located in front of the upper surface of the gold-plated copper block 3, and the boss is constructed into a testing boss 11 for placing a tested chip 8.
The pen-shaped cylinder 19 is arranged at the rear part of the upper surface of the gold-plated copper block 3, the guide rail 6 is also arranged on the gold-plated copper block 3 and is opposite to the pen-shaped cylinder 19, and the clamp 18 is arranged on the guide rail and is connected with the pen-shaped cylinder 19. The gripper 18 is movable along the guide rail 6 by a pen cylinder 19 to grip the chip 8 on the test stage 11.
Further, in an embodiment of the present invention, the clip 18 includes two oppositely disposed clamping pieces, the two clamping pieces are respectively connected to the pen-shaped cylinder 19, and the two clamping pieces can be opened and closed under the driving of the pen-shaped cylinder 19 to fasten and loosen the chip 8.
The embodiment of the utility model provides a chip test platform, through being connected stroke of form cylinder and two clamping pieces, its centre gripping is more smooth and easy with loosening the chip, has solved the problem that pine clamp core piece easily blocks among the prior art.
As shown in fig. 2 and 3, in an embodiment of the present invention, each of the refrigeration mechanisms includes: the water-cooling copper block 7, the refrigeration piece 10, the water inlet end 13 and the water outlet end 14. Specifically, the water-cooled copper blocks 7 are respectively installed on the first supporting seat 16 and the second supporting seat 17, and the refrigerating sheet 10 is installed on the water-cooled copper blocks 7. And a water inlet channel and a water outlet channel are formed on the side surface of the water-cooling copper block 7 and are communicated. The water inlet end 13 is connected with the water inlet channel, and the water outlet end 14 is connected with the water outlet channel.
In practical use, after placing chip 8 on test boss 11, push down through the probe, press in the left and right sides of chip 8, clip 18 opens under the drive of pen-shaped cylinder 19, and the current source gives chip 8 circular telegram, and the circular telegram can produce a large amount of heats in the twinkling of an eye, if the heat dissipation in time will lead to chip 8 parameter testing inaccurate. The upper surface of the refrigeration piece 10 absorbs heat, and the heat is transferred to the lower surface of the refrigeration piece 10, that is, the temperature of the upper surface of the refrigeration piece 10 is lower than that of the lower surface, and the heat of the lower surface is conducted to the water-cooling copper block 7. Cold water flows in from the water inlet end 13 of the water-cooled copper block 7 and is used for absorbing heat of the water-cooled copper block 7, and flows out from the water outlet end 14, so that the heat on the water-cooled copper block 7 is taken away, and the heat generated by the testing mechanism is dissipated in time.
Further, in an embodiment of the present invention, the external dimensions of the refrigeration plate 10 are: 40 mmx40mmx3.2mm.
As shown in fig. 2 and 3, in an embodiment of the present invention, the refrigeration mechanism further includes: a thermistor 9, a thermistor compact 12 and a controller. Specifically, the thermistor 9 is mounted on the gold-plated copper block 3, and the thermistor compact 12 is disposed on the thermistor 9 so that the thermistor 9 and the gold-plated copper block 3 are in sufficient contact. In practical use, a temperature, for example, 20 ℃, may be set on the controller, and when the temperature of the upper surface of the refrigeration sheet 10 is higher than 20 ℃, the thermistor 9 transmits the sensed temperature data to the controller, and the controller cools the refrigeration sheet 10 to make the temperature of the upper surface thereof reach a set value of 20 ℃. When the temperature of the upper surface of the refrigerating sheet 10 is lower than 20 ℃, the thermistor 9 transmits the sensed temperature data to the controller, and the controller heats the refrigerating sheet 10 to enable the temperature of the upper surface of the refrigerating sheet to reach a set value of 20 ℃.
Further, in an embodiment of the present invention, the thermistor 9 may be a temperature sensor.
The embodiment of the utility model provides a chip test platform through setting up refrigeration piece and water-cooling copper billet, utilizes the hydrologic cycle to dispel the heat to accredited testing organization, has solved the integrated more heat dissipation module of chip test platform among the prior art, and the problem that heat dissipation module easily damaged in the debugging process, the embodiment of the utility model provides a refrigeration mechanism simple structure, easily installation.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not depart from the spirit and scope of the present invention in its corresponding aspects.
Claims (10)
1. A chip test platform, comprising:
an adjustment mechanism, the adjustment mechanism comprising: the direction adjusting sliding table is installed on the rotating motor;
the testing mechanism is arranged on the rotating motor, and the other testing mechanism is arranged on the direction adjusting sliding table;
and the two refrigerating mechanisms are respectively arranged on the two testing mechanisms.
2. The chip testing platform of claim 1, wherein the testing mechanism comprises a first supporting seat and a second supporting seat, the first supporting seat is mounted on the rotating motor, and the second supporting seat is mounted on the direction adjusting sliding table.
3. The chip testing platform of claim 2, wherein the length of the first supporting seat is greater than the length of the second supporting seat.
4. The chip test platform according to claim 2, wherein each of the cooling mechanisms comprises:
the water-cooling copper blocks are respectively arranged on the first supporting seat and the second supporting seat;
the refrigeration piece is installed on the water-cooling copper block.
5. The chip testing platform of claim 4, wherein a water inlet channel and a water outlet channel are formed on a side surface of each water-cooled copper block, and the water inlet channel is communicated with the water outlet channel.
6. The chip test platform of claim 5, wherein each of the cooling mechanisms further comprises:
the water inlet end is connected with the water inlet channel of the water-cooled copper block;
and the water outlet end is connected with the water outlet channel of the water-cooling copper block.
7. The chip test platform according to claim 4, wherein each of the test mechanisms further comprises: the cooling plate comprises a refrigeration piece, a gold-plated copper block, a boss and a test chip, wherein the gold-plated copper block is arranged on the refrigeration piece, and the boss is formed on the upper surface of the gold-plated copper block and is constructed into the test boss for placing the test chip.
8. The chip test platform according to claim 7, wherein each of the test mechanisms further comprises:
the pen-shaped air cylinder is arranged on the gold-plated copper block;
the guide rail is arranged on the gold-plated copper block and is opposite to the pen-shaped cylinder;
and the clip is arranged on the guide rail and is connected with the pen-shaped air cylinder.
9. The chip test platform according to claim 7, wherein each of said cooling mechanisms further comprises:
a thermistor mounted on the gold-plated copper block;
and the thermistor pressing block is arranged on the thermistor so as to fix the thermistor and the gold-plated copper block.
10. The chip test platform according to claim 9, wherein each of the cooling mechanisms further comprises a controller electrically connected to the thermistor and the cooling plate, respectively.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202022187364.9U CN213212141U (en) | 2020-09-29 | 2020-09-29 | Chip testing platform |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202022187364.9U CN213212141U (en) | 2020-09-29 | 2020-09-29 | Chip testing platform |
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| Publication Number | Publication Date |
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| CN213212141U true CN213212141U (en) | 2021-05-14 |
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| CN202022187364.9U Active CN213212141U (en) | 2020-09-29 | 2020-09-29 | Chip testing platform |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115980555A (en) * | 2023-03-20 | 2023-04-18 | 无锡祺芯半导体科技有限公司 | Intelligent chip packaging test equipment |
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2020
- 2020-09-29 CN CN202022187364.9U patent/CN213212141U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115980555A (en) * | 2023-03-20 | 2023-04-18 | 无锡祺芯半导体科技有限公司 | Intelligent chip packaging test equipment |
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