CN213091810U - Integrated circuit tester based on non-contact PCB board - Google Patents

Integrated circuit tester based on non-contact PCB board Download PDF

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Publication number
CN213091810U
CN213091810U CN202021546596.2U CN202021546596U CN213091810U CN 213091810 U CN213091810 U CN 213091810U CN 202021546596 U CN202021546596 U CN 202021546596U CN 213091810 U CN213091810 U CN 213091810U
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China
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fixedly connected
control box
integrated circuit
pcb board
circuit tester
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CN202021546596.2U
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Chinese (zh)
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高帆
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Suzhou Chuangxin Information Technology Co ltd
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Suzhou Chuangxin Information Technology Co ltd
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Abstract

The utility model discloses an integrated circuit tester based on non-contact PCB board, including detecting frame, bottom plate and control box, equal fixedly connected with support column all around on bottom plate top, and the top fixedly connected with of support column detects the frame, the central position department fixedly connected with on bottom plate top runs through the elevation structure who detects the frame, and elevation structure's top fixed connection and backup pad, detect the equal fixedly connected with support in top of frame both sides, and the inboard top fixedly connected with mounting panel of support, the central position department fixedly connected with control box of mounting panel bottom, and the front of control box is provided with control panel, the equal activity of lower extreme of control box both sides articulates there is the articulated slab, and the equal fixedly connected with mounting structure in both ends of control box bottom, the card is equipped with the test probe between the mounting structure. The utility model discloses a fan work produces wind-force, absorbs dust or heat through the shunt tubes to the influence of dust and high heat has been avoided.

Description

Integrated circuit tester based on non-contact PCB board
Technical Field
The utility model relates to a circuit board test technical field specifically is an integrated circuit tester based on non-contact PCB board.
Background
When the PCB design is completed and then the PCB enters a mass production stage, each PCB needs to be tested to ensure that the quality of each produced circuit board is reliable, so that an integrated circuit tester of the PCB needs to be used, but the existing integrated circuit tester of the PCB still has a plurality of problems or defects:
first, the conventional integrated circuit tester for PCB cannot test PCBs of different specifications, generally can only detect a circuit board of one specification, and has low adaptability.
Second, the integrated circuit tester of traditional PCB board is not convenient for dismantle the change to test probe, when test probe need maintain or change, the process of dismantling is very hard.
Third, the integrated circuit tester of the conventional PCB lacks heat dissipation and dust removal, and particularly in the process of mass detection, the tester generates a large amount of heat, and the PCB is easily stained with dust.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide an integrated circuit tester based on non-contact PCB board to the PCB board test that can not be to different specifications size that proposes in solving above-mentioned background art, be not convenient for dismantle change and lack the problem of heat dissipation and dust removal to test probe.
In order to achieve the above object, the utility model provides a following technical scheme: an integrated circuit tester based on a non-contact PCB comprises a detection frame, a bottom plate and a control box, wherein support columns are fixedly connected to the periphery of the top end of the bottom plate, the top end of each support column is fixedly connected with the detection frame, a lifting structure penetrating through the detection frame is fixedly connected to the central position of the top end of the bottom plate, the top end of the lifting structure is fixedly connected with a support plate, a sliding groove is formed in the middle position of the top end of the support plate, sliding plates matched with the sliding grooves are sleeved at two ends of the inner part of the sliding groove, a rubber seat is fixedly connected to the top end of each sliding plate, supports are fixedly connected to the top ends of two sides of the detection frame, a mounting plate is fixedly connected to the top end of the inner side of each support, the control box is fixedly connected to the central position of the bottom end of the mounting plate, and the both ends of control box bottom are equal fixedly connected with mounting structure, the card is equipped with test probe between the mounting structure.
Preferably, the slide has all been seted up to the intermediate position department of the inside both sides of detection frame, and the inside of slide through with slide assorted slider and backup pad fixed connection.
Preferably, universal wheels are installed around the bottom end of the bottom plate, and braking structures are arranged inside the universal wheels.
Preferably, ejector pin, sleeve pipe, bolt and spacing groove have set gradually in elevation structure's inside, sleeve pipe fixed connection is in the central position department on bottom plate top, and sheathed tube inside cover is equipped with the ejector pin, the upper end of sleeve pipe one side is run through there is the bolt, and the ejector pin lateral wall of bolt one side corresponds and has evenly seted up the spacing groove.
Preferably, mounting structure's inside has set gradually kelly, spring, baffle and erection column, erection column fixed connection is at the both ends of control box bottom, and the lower extreme in the erection column outside all runs through there is the kelly, the one end fixedly connected with baffle of kelly outer wall, and fixedly connected with spring between baffle and the erection column, the draw-in groove has been seted up in the correspondence of the test probe both sides of kelly one side.
Preferably, the equal fixedly connected with bellows in both ends of mounting panel bottom, and the inside one side fixedly connected with fan of keeping away from the control box of bellows, the inside fixedly connected with filter screen of bellows of fan one side, and the bellows bottom of filter screen one side runs through there is the dust fall pipe, one side fixedly connected with dust collection box that the bellows bottom is close to the dust fall pipe, and the bottom of dust fall pipe runs through the dust collection box top, the intermediate position department that bellows is close to control box one side runs through there is the shunt tubes.
Compared with the prior art, the beneficial effects of the utility model are that: the integrated circuit tester of the PCB has reasonable structure and the following advantages;
(1) by arranging the bolt, the limiting groove, the supporting plate, the ejector rod and the sleeve, when the supporting plate is at a proper height, the bolt is screwed down and clamped into the limiting groove, the ejector rod is fixed, the rubber seat is pulled to slide in the sliding groove through the sliding plate, and the rubber seat is moved to a proper detection position, so that a PCB can be placed at the top end of the rubber seat conveniently, and meanwhile, the PCB testing device can adapt to PCB testing of different specifications;
(2) through the arrangement of the hinged plate, the clamping rod, the baffle, the spring, the clamping rod, the clamping groove and the detection probe, the clamping rod is pulled outwards to drive the baffle to extrude the spring to be elastically deformed and shortened by stirring the hinged plate to be in an inclined state, so that the clamping rod is driven to be separated from the inside of the clamping groove, the detection probe is convenient to disassemble, and the complex process of disassembling the detection probe is greatly reduced;
(3) through being provided with fan, shunt tubes, filter screen, dust fall pipe and dust collection box, produce wind-force through fan work, absorb dust or heat through the shunt tubes, the dust falls the pipe through the filtration rear portion of filter screen and falls to the dust collection box inside and collect to dust and thermal influence has been avoided.
Drawings
Fig. 1 is a schematic front view of a cross-sectional structure of the present invention;
fig. 2 is a schematic diagram of the right-side view structure of the present invention;
FIG. 3 is a schematic view of an enlarged front view section of the lifting structure of the present invention;
fig. 4 is an enlarged schematic view of the front view section of the mounting structure of the present invention.
In the figure: 1. a support; 2. detecting a frame; 3. a slider; 4. a slideway; 5. a support pillar; 6. a base plate; 7. a lifting structure; 701. a top rod; 702. a sleeve; 703. a bolt; 704. a limiting groove; 8. a universal wheel; 9. a support plate; 10. a slide plate; 11. a chute; 12. a rubber seat; 13. a dust collection box; 14. a dust falling pipe; 15. a shunt tube; 16. detecting a probe; 17. a mounting structure; 1701. a clamping rod; 1702. a spring; 1703. a baffle plate; 1704. mounting a column; 18. a control panel; 19. a control box; 20. mounting a plate; 21. a hinge plate; 22. an air box; 23. a filter screen; 24. a fan; 25. a clamping groove.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
Referring to fig. 1-4, the present invention provides an embodiment: an integrated circuit tester based on a non-contact PCB comprises a detection frame 2, a bottom plate 6 and a control box 19, wherein universal wheels 8 are mounted on the periphery of the bottom end of the bottom plate 6, and a braking structure is arranged inside each universal wheel 8;
specifically, as shown in fig. 1 and 2, the tester is moved to a proper position through the universal wheel 8, and the universal wheel 8 is locked through a braking structure inside the universal wheel 8, so that the tester is prevented from sliding;
the periphery of the top end of the bottom plate 6 is fixedly connected with support columns 5, the top ends of the support columns 5 are fixedly connected with a detection frame 2, a lifting structure 7 penetrating through the detection frame 2 is fixedly connected to the center of the top end of the bottom plate 6, and the top end of the lifting structure 7 is fixedly connected with a support plate 9;
a top rod 701, a sleeve 702, a bolt 703 and a limit groove 704 are sequentially arranged in the lifting structure 7, the sleeve 702 is fixedly connected to the central position of the top end of the bottom plate 6, the top rod 701 is sleeved in the sleeve 702, the bolt 703 penetrates through the upper end of one side of the sleeve 702, and the limit groove 704 is correspondingly and uniformly formed in the side wall of the top rod 701 on one side of the bolt 703;
specifically, as shown in fig. 1 and 3, the bolt 703 is loosened so that the bolt 703 is disengaged from the inside of the limiting groove 704, the support plate 9 is pulled up and down, and the ejector rod 701 is driven to slide inside the sleeve 702, and when the support plate 9 is at a proper height, the bolt 703 is tightened and clamped into the inside of the limiting groove 704, so that the height of the ejector rod 701 is adjusted;
the middle positions of two sides inside the detection frame 2 are both provided with a slide way 4, and the inside of the slide way 4 is fixedly connected with a support plate 9 through a slide block 3 matched with the slide way 4;
specifically, as shown in fig. 1, the sliding block 3 slides in the slide way 4, so that the support plate 9 can be maintained to move stably;
a sliding groove 11 is formed in the middle of the top end of the supporting plate 9, sliding plates 10 matched with the sliding groove 11 are sleeved at two ends of the interior of the sliding groove 11, a rubber seat 12 is fixedly connected to the top ends of the sliding plates 10, supports 1 are fixedly connected to the top ends of two sides of the detection frame 2, a mounting plate 20 is fixedly connected to the top end of the inner side of each support 1, a control box 19 is fixedly connected to the center of the bottom end of the mounting plate 20, a control panel 18 is arranged on the front side of the control box 19, hinged plates 21 are movably hinged to the lower ends of two sides of the control box 19, mounting structures 17 are fixedly connected to two ends of the bottom end of the control box 19;
a clamping rod 1701, a spring 1702, a baffle 1703 and an installation column 1704 are sequentially arranged in the installation structure 17, the installation column 1704 is fixedly connected to two ends of the bottom end of the control box 19, the clamping rod 1701 penetrates through the lower end of the outer side of the installation column 1704, the baffle 1703 is fixedly connected to one end of the outer wall of the clamping rod 1701, the spring 1702 is fixedly connected between the baffle 1703 and the installation column 1704, and clamping grooves 25 are correspondingly formed in two sides of the detection probe 16 on one side of the clamping rod 1701;
specifically, as shown in fig. 1 and 4, the blocking rod 1701 is pulled outwards to drive the baffle 1703 to extrude the spring 1702 to be elastically deformed and shortened, so that the blocking rod 1701 is driven to be separated from the inside of the clamping groove 25, and the detection probe 16 is convenient to detach;
both ends of the bottom end of the mounting plate 20 are fixedly connected with an air box 22, one side of the interior of the air box 22, which is far away from the control box 19, is fixedly connected with a fan 24, a filter screen 23 is fixedly connected with the interior of the air box 22 at one side of the fan 24, a dust falling pipe 14 penetrates through the bottom end of the air box 22 at one side of the filter screen 23, a dust collecting box 13 is fixedly connected at one side of the bottom end of the air box 22, which is close to the dust falling pipe 14, the bottom end of the dust falling pipe 14 penetrates through the top end of the dust collecting box 13, and a shunt pipe;
specifically, as shown in fig. 1, the fan 24 operates to generate wind force to absorb dust or heat through the shunt tube 15, and the dust falls into the dust collection box 13 through the dust falling tube 14 after being filtered by the filter screen 23, so as to be collected, thereby avoiding the influence of the dust and heat;
the single chip microcomputer in the control panel 18 is electrically connected with the detection probe 16 and the fan 24 through wires.
The working principle is as follows: the tester is moved to a proper position through the universal wheel 8, the universal wheel 8 is locked through a braking structure in the universal wheel 8, the tester is prevented from sliding, and an external power supply is switched on;
loosening the bolt 703 to separate the bolt 703 from the inside of the limit groove 704, pulling the support plate 9 up and down, and sliding in the slide way 4 through the slide block 3 to maintain the stable motion of the support plate 9, so as to drive the ejector rod 701 to slide in the sleeve 702, when the support plate 9 is at a proper height, tightening the bolt 703 to be clamped in the limit groove 704 to fix the ejector rod 701, pulling the rubber seat 12 to slide in the slide groove 11 through the slide plate 10, so as to move the rubber seat 12 to a proper detection position, thereby facilitating the placement of the PCB on the top end of the rubber seat 12;
when the detection probe 16 needs to be detached and replaced, the hinge plate 21 is shifted to be in an inclined state, the clamping rod 1701 is pulled outwards to drive the baffle 1703 to extrude the spring 1702 to be elastically deformed and shortened, so that the clamping rod 1701 is driven to be separated from the inside of the clamping groove 25, and the detection probe 16 is convenient to detach;
in the test process, the fan 24 is started to work through the control panel 18, the generated wind power absorbs dust or heat through the shunt pipe 15, and the dust falls into the dust collection box 13 through the dust falling pipe 14 after being filtered by the filter screen 23 and is collected, so that the influence of the dust and the heat is avoided.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims (6)

1. The utility model provides an integrated circuit tester based on non-contact PCB board, includes detection frame (2), bottom plate (6) and control box (19), its characterized in that: the detection device is characterized in that support columns (5) are fixedly connected to the periphery of the top end of the bottom plate (6), a detection frame (2) is fixedly connected to the top end of each support column (5), a lifting structure (7) penetrating through the detection frame (2) is fixedly connected to the central position of the top end of the bottom plate (6), a support plate (9) is fixedly connected to the top end of each lifting structure (7), a sliding groove (11) is formed in the middle position of the top end of the support plate (9), sliding plates (10) matched with the sliding grooves (11) are sleeved at two ends of the inner portion of each sliding groove (11), a rubber seat (12) is fixedly connected to the top ends of the sliding plates (10), supports (1) are fixedly connected to the top ends of two sides of the detection frame (2), mounting plates (20) are fixedly connected to the top ends of the inner sides of the supports (1), and the front of control box (19) is provided with control panel (18), the lower extreme of control box (19) both sides all activity hinge joint has articulated slab (21), and the equal fixedly connected with mounting structure (17) in both ends of control box (19) bottom, the card is equipped with test probe (16) between mounting structure (17).
2. The integrated circuit tester based on the non-contact PCB board of claim 1, wherein: slide (4) have all been seted up to the intermediate position department of the inside both sides of detection frame (2), and the inside of slide (4) through with slide (4) assorted slider (3) and backup pad (9) fixed connection.
3. The integrated circuit tester based on the non-contact PCB board of claim 1, wherein: all install universal wheel (8) around bottom plate (6) bottom, and the inside of universal wheel (8) is provided with braking structure.
4. The integrated circuit tester based on the non-contact PCB board of claim 1, wherein: the inside of elevation structure (7) has set gradually ejector pin (701), sleeve pipe (702), bolt (703) and spacing groove (704), sleeve pipe (702) fixed connection is in the central point department on bottom plate (6) top, and the inside cover of sleeve pipe (702) is equipped with ejector pin (701), the upper end of sleeve pipe (702) one side is run through there is bolt (703), and ejector pin (701) lateral wall correspondence of bolt (703) one side has evenly seted up spacing groove (704).
5. The integrated circuit tester based on the non-contact PCB board of claim 1, wherein: the inside of mounting structure (17) has set gradually kelly (1701), spring (1702), baffle (1703) and erection column (1704), erection column (1704) fixed connection is at the both ends of control box (19) bottom, and the lower extreme in the erection column (1704) outside all runs through kelly (1701), one end fixedly connected with baffle (1703) of kelly (1701) outer wall, and fixedly connected with spring (1702) between baffle (1703) and erection column (1704), draw-in groove (25) have been seted up in correspondence in the inspection probe (16) both sides of kelly (1701) one side.
6. The integrated circuit tester based on the non-contact PCB board of claim 1, wherein: the equal fixedly connected with bellows (22) in both ends of mounting panel (20) bottom, and bellows (22) inside one side fixedly connected with fan (24) of keeping away from control box (19), bellows (22) inside fixedly connected with filter screen (23) of fan (24) one side, and bellows (22) bottom of filter screen (23) one side run through and have the dust pipe (14) that falls, one side fixedly connected with dust collection box (13) that bellows (22) bottom is close to the dust pipe (14) that falls, and the bottom of dust pipe (14) that falls runs through dust collection box (13) top, intermediate position department that bellows (22) are close to control box (19) one side runs through has shunt tubes (15).
CN202021546596.2U 2020-07-30 2020-07-30 Integrated circuit tester based on non-contact PCB board Active CN213091810U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202021546596.2U CN213091810U (en) 2020-07-30 2020-07-30 Integrated circuit tester based on non-contact PCB board

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Application Number Priority Date Filing Date Title
CN202021546596.2U CN213091810U (en) 2020-07-30 2020-07-30 Integrated circuit tester based on non-contact PCB board

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CN213091810U true CN213091810U (en) 2021-04-30

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113359011A (en) * 2021-06-10 2021-09-07 深圳市华测半导体设备有限公司 Analog integrated circuit test machine with self-detection function

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113359011A (en) * 2021-06-10 2021-09-07 深圳市华测半导体设备有限公司 Analog integrated circuit test machine with self-detection function

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