CN213090970U

CN213090970U - Test positioning tool and IR LED testing device

Info

Publication number: CN213090970U
Application number: CN202021992663.3U
Authority: CN
Inventors: 赵龙华; 谭树海; 刘铁伟; 徐博
Original assignee: Goertek Techology Co Ltd
Current assignee: Goertek Techology Co Ltd
Priority date: 2020-09-11
Filing date: 2020-09-11
Publication date: 2021-04-30
Anticipated expiration: 2030-09-11

Abstract

The utility model discloses a test positioning tool and an IR LED testing device, wherein the test positioning tool comprises an upper test substrate and a lower test substrate; go up test substrate and test substrate one end down and articulate, the other end passes through buckle structure block and connects, is equipped with the location structure that is used for carrying out the location to FPC on the face of test substrate towards the lower test substrate, goes up test substrate or/and is provided with the light trap that corresponds with IR LED position down on the test substrate. The IR LED testing device comprises a rack, wherein a testing probe and a testing positioning tool positioned below the testing probe are arranged on the rack; and a shading ring is arranged around the receiving window of the test probe. The utility model discloses utilize test positioning frock to fix a position FPC; after the positioning, the testing probe can be used for testing the plurality of IR LEDs on the FPC one by one; the test effect of the radiation illumination of the IR LED is ensured, the production beat is improved, and the test period is shortened.

Description

Test positioning tool and IR LED testing device

Technical Field

The utility model belongs to the technical field of product test, especially, relate to a test positioning frock and IR LED testing arrangement.

Background

Various eyeball/face tracking technologies are added to the existing intelligent head-mounted devices such as VR/AR, namely, a large number of IR LEDs (infrared light emitting diodes) are introduced for illumination, and the radiation illumination of the IR LEDs is generally required to be tested in order to ensure the safety of use. However, currently, for testing the IR LEDs, only a single IR LED test scheme is available, and in this case, only the on/off or relative brightness of the IR LEDs can be tested; and the IR LED under the FPC state is tested without a mature test scheme at present.

In view of this, how to design a test positioning tool and an IR LED testing device suitable for testing the IR LED radiation illuminance in the FPC state is a technical problem that needs to be solved by those skilled in the art.

SUMMERY OF THE UTILITY MODEL

Aiming at overcoming the defects existing in the prior art, the utility model provides a first technical problem to be solved, which is to provide a test positioning tool, and during the test, the IR LED to be tested on the FPC and the FPC can be accurately positioned; to ensure the testing effect of the IR LED radiation illumination.

As same technical conception, the utility model provides a second technical problem be, provide an IR LED testing arrangement.

The utility model provides a technical scheme that above-mentioned first technical problem adopted is: a test positioning tool is used for an IR LED test device, wherein IR LEDs are arranged on the front side or/and the back side of an FPC; the test positioning tool comprises an upper test substrate and a lower test substrate; go up the test substrate with test substrate one end is articulated down, and the other end passes through buckle structure block connection, test substrate orientation down be equipped with on the face of going up the test substrate be used for right FPC carries out the location structure of fixing a position, go up the test substrate or/and be provided with on the test substrate down with the light trap that the IR LED position corresponds.

Further, the buckle structure comprises a hinge seat, a first clamping piece and a second clamping piece, wherein the first clamping piece and the second clamping piece are hinged to the hinge seat;

the hinge base is arranged on the upper test substrate, and the second clamping piece is arranged on the lower test substrate; or, the hinged seat is arranged on the lower test substrate, and the second clamping piece is arranged on the upper test substrate.

Furthermore, an elastic piece is arranged between the hinge seat and the first clamping piece; in the clamping state, the resetting force of the elastic piece enables the clamping part of the first clamping piece to have the tendency of moving towards the direction of the second clamping piece.

Furthermore, a guide positioning column is arranged on the lower test substrate, and a guide positioning hole matched with the guide positioning column is arranged on the upper test substrate; or, a guide positioning column is arranged on the upper test substrate, and a guide positioning hole matched with the guide positioning column is arranged on the lower test substrate.

Furthermore, the upper test substrate is hinged with the lower test substrate through a self-resetting damping hinge structure.

Further, the self-resetting damping hinge structure comprises a hinge lug, a pivot arranged on the hinge lug, a pivoting piece pivoted with the pivot and a torsion spring sleeved on the pivot; one end of the torsion spring is connected with the pivoting piece through a torsion arm;

the hinge lug is formed on the lower test base plate, and the pivot piece is fixed with the upper test base plate; or, the hinge lug is formed on the upper test base plate, and the pivot piece is fixed with the lower test base plate.

The utility model provides a technical scheme that above-mentioned second technical problem adopted is: an IR LED testing device is used for testing the radiation illumination of an IR LED on an FPC; the test probe is arranged on the rack, and the test positioning tool is arranged on the rack; the test positioning tool is arranged on the rack below the test probe; and a shading ring is arranged around the receiving window of the test probe.

Further, the radius of a receiving window of the test probe is R0, the radius of the light hole is R1, the height of the light emitting surface of the IR LED is D2, the angle of view of the IR LED is FOV, the height of the shading ring is H, the distance from the light emitting surface of the IR LED to the receiving window is D, and the thickness of the upper test substrate is D1_MAX(ii) a Wherein:

(D1_MAX-D2+H)＜d。

further, the rack comprises a bottom plate and a vertical plate arranged on the bottom plate; the testing and positioning tool is rotatably installed on the bracket, and the bracket is provided with a driving mechanism for driving the testing and positioning tool to overturn; the vertical plate is provided with a vertical movement mechanism, and the test probe is arranged at a power output part of the vertical movement mechanism.

Further, a sliding rail parallel to the longitudinal movement mechanism is arranged on the bottom plate, a sliding block is arranged on the sliding rail in a sliding mode, and the transverse movement mechanism is fixedly connected with the sliding block.

Due to the adoption of the technical scheme, the beneficial effects are as follows:

the utility model provides a test positioning tool, which comprises an upper test substrate and a lower test substrate; go up test substrate and test substrate one end down and articulate, the other end passes through buckle structure block and connects, is equipped with the location structure that is used for carrying out the location to FPC on the face of test substrate towards the lower test substrate, goes up test substrate or/and is provided with the light trap that corresponds with IR LED position down on the test substrate. The IR LED testing device comprises a rack, a testing probe arranged on the rack and the testing positioning tool; the test positioning tool is arranged on the rack below the test probe.

Before testing, accurately positioning the FPC and the plurality of IR LEDs to be tested on the FPC by using a testing and positioning tool; after the positioning is carried out for one time, the plurality of IR LEDs on the FPC can be tested one by utilizing a test probe with a receiving window and a shading ring; the test effect of the radiation illumination of the IR LED is ensured, the production beat is improved, and the test period is shortened.

Drawings

FIG. 1 is a schematic structural view of the test positioning tool of the present invention;

FIG. 2 is an exploded view of the open position of FIG. 1;

FIG. 3 is a schematic structural view of the self-resetting damped hinge structure of FIG. 2;

FIG. 4 is an open state view of the snap structure of FIG. 1;

FIG. 5 is a schematic structural diagram of the IR LED testing device of the present invention;

FIG. 6 is a schematic diagram of the design of the test positioning tool and the test probe of the present invention;

FIG. 7 is a schematic diagram of the IR LED of FIG. 6;

in the figure: 1-test positioning tool, 11-upper test substrate, 111-guide positioning hole, 12-lower test substrate, 121-guide positioning column, 13-buckle structure, 131-hinge seat, 132-first fastener, 133-second fastener, 134-spring, 135-hinge shaft, 14-positioning structure, 15-light hole, 16-self-reset damping hinge structure, 161-hinge lug, 162-pivot shaft, 163-torsion spring, 164-pivot part, 2-frame, 21-bottom plate, 22-vertical plate, 23-longitudinal motion mechanism, 24-transverse motion mechanism, 25-bracket, 26-driving mechanism, 27-vertical motion mechanism, 28-slide rail, 29-slide block, 3-test probe, 31-receiving window, 32-shading ring.

Detailed Description

In order to make the objects, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the described embodiments of the present invention are for simplicity of description only and are not to be construed as limiting the present invention.

The first embodiment is as follows:

as shown collectively in fig. 1 to 4, the present embodiment discloses a test positioning tool 1 for an IR LED testing device, wherein IR LEDs can be disposed on the front side or/and the back side of an FPC as required. The test positioning tool 1 comprises an upper test substrate 11 and a lower test substrate 12; go up test substrate 11 and test substrate 12 one end down and articulate, the other end passes through buckle structure 13 block connection, is equipped with the location structure 14 that is used for fixing a position FPC on the face of test substrate 12 on test substrate 11 orientation down, is provided with the light trap 15 that corresponds with the IR LED position on last test substrate 11 or/and the test substrate 12 down. Opening the buckle structure 13 to open the upper test substrate 11 and the lower test substrate 12 at a certain angle, placing the FPC with the IR LED on the lower test substrate 12, and clamping the buckle structure 13 to realize positioning and pressing of the FPC; the light of the IR LED can shine through the light-transmitting hole 15.

The FPC in this embodiment is provided with a plurality of IR LEDs only on the front surface, and therefore the light-transmitting holes 15 are opened only on the upper test substrate 11.

The fastening structure 13 includes a hinge base 131, a first engaging member 132 and a second engaging member 133 hinged to the hinge base 131, wherein the first engaging member 132 can be separated from or engaged with the second engaging member 133. The hinge seat 131 is disposed on the upper test substrate 11, and the second engaging member 133 is disposed on the lower test substrate 12; alternatively, the hinge base 131 is disposed on the lower test substrate 12, and the second engaging member 133 is disposed on the upper test substrate 11. In this embodiment, the first engaging member 131 includes a body, a hook-shaped engaging portion is disposed on the top of the body, the hinge seat 131 is disposed at the opening of the lower test substrate 12, a hinge shaft 135 is disposed on the hinge seat 131, and a hinge portion hinged to the hinge shaft 135 is disposed on the inner side surface of the body of the first engaging member 131; the upper surface of the upper test substrate 11 is provided with a recessed portion, the recessed portion is provided with an avoidance opening, and the second engaging member 133 is arranged on the recessed portion and has a plate-shaped structure; the hook-shaped engaging portion is engaged with (pressed against) the second engaging member 133 having a plate-shaped structure to achieve engagement, or the hook-shaped engaging portion is disengaged from the second engaging member 133 having a plate-shaped structure to achieve separation; the lower plate surface of the upper test substrate 11 is provided with an avoiding groove matched with the hinge seat 131. An elastic member (preferably, a spring 134) is arranged between the hinge seat 131 and the inner side surface of the first engaging member 131; in the engaged state, the return force of the spring 134 causes the engaging portion of the first engaging member 132 to have a tendency to move toward the second engaging member 133.

In order to ensure the smoothness and accuracy of the FPC bonding when the upper test substrate 11 moves downward toward the lower test substrate 12, the lower test substrate 12 is provided with a guiding positioning post 121, and the upper test substrate 11 is provided with a guiding positioning hole 111 matched with the guiding positioning post 121. Alternatively, the guide positioning posts 121 are disposed on the upper test substrate 11, and the guide positioning holes 111 adapted to the guide positioning posts 121 are disposed on the lower test substrate 12.

In this embodiment, the upper test substrate 11 and the lower test substrate 12 are hinged by a self-resetting damping hinge structure 16. The self-resetting damping hinge structure 16 includes a hinge lug 161, a pivot 162 disposed on the hinge lug 161, a pivot member 164 pivotally connected to the pivot 162, and a torsion spring 162 sleeved on the pivot 162; one end of the torsion spring 162 is connected to a pivot member 164, and the pivot member 164 is provided with a through hole for the torsion arm to pass through. The hinge lug 161 is formed on the lower test substrate 12, the pivot member 164 is fixed to the upper test substrate 11, and the other end of the torsion spring 162 is connected to the pivot shaft 162 or the lower test substrate 12. Alternatively, the hinge lug 161 is formed on the upper test substrate 11, and the pivot member 164 is fixed to the lower test substrate 12; the other end of the torsion spring 162 is connected to the pivot 162 or the upper test substrate 11.

In this embodiment, the positioning structure 14 on the lower test substrate 12 includes a plurality of positioning protrusions, and the upper test substrate 11 may be provided with profiling grooves matching with the positioning protrusions; or the locating structure 14 is a contoured groove.

Example two:

as shown in fig. 5 to 7, the present embodiment discloses an IR LED testing apparatus for testing the illuminance of IR LED radiation on the FPC; the test positioning device specifically comprises a rack 2, a test probe 3 arranged on the rack 2 and a test positioning tool 1 disclosed in the first embodiment; the test positioning tool 1 is arranged on the machine frame 2 below the test probe 3, and a shading ring 32 is arranged around a receiving window 31 of the test probe 3.

The frame 2 comprises a bottom plate 21 and a vertical plate 22 arranged on the bottom plate 21; the bottom plate 21 is provided with a longitudinal movement 23 (preferably a linear module), the power output part of the longitudinal movement mechanism 23 is provided with a transverse movement mechanism 24 (preferably a linear module), and the transverse movement mechanism 24 is provided with a bracket 25. The support 25 comprises a mounting plate and two vertical plates arranged on the mounting plate at intervals, rotating shafts are arranged on two opposite sides of an upper test substrate 11 in the test positioning tool 1, bearings which are in rotating fit with the rotating shafts are arranged on the vertical plates, a driving mechanism 26 (preferably a swing cylinder which can be turned for 180 degrees and is suitable for the condition that IR LEDs are arranged on the front and back surfaces of an FPC (flexible printed circuit) and light holes are formed in the upper test substrate and the lower test substrate) for driving the test positioning tool 1 to turn is arranged on one vertical plate of the support 25, and a power output shaft of the driving mechanism 26 is fixedly connected with one rotating shaft; a vertical motion mechanism 27 (preferably a lifting electric cylinder) is installed on the vertical plate 22, and the test probe 3 is installed on a power output part of the vertical motion mechanism 27.

To further ensure the stability and reliability of the longitudinal movement of the lateral movement mechanism 24; the bottom plate 21 is provided with a slide rail 28 parallel to the longitudinal movement mechanism 23, the slide rail 28 is provided with a slide block 29 in a sliding way, and the transverse movement mechanism 24 is fixedly connected with the slide block 29.

To further ensure the effectiveness of the test, various design parameters are optimized. The radius 31 of the receiving window of the test probe 3 is R0, the radius of the light hole 15 is R1, the height of the light emitting surface of the IR LED (namely the vertical distance from the light emitting surface to the FPC mounting surface) is D2, the field angle of the IR LED is FOV, the height of the shading ring 32 is H, the distance from the light emitting surface of the IR LED to the receiving window 31 is D, and the thickness of the upper test substrate 11 is D1 MAX; wherein:

(D1_MAX-D2+H)＜d。

the method for testing by using the IR LED testing device comprises the following steps:

1. opening the buckle structure 13 to open the upper test substrate 11 and the lower test substrate 12 at a certain angle, placing the FPC provided with the IR LED on the lower test substrate 12, and buckling the upper test substrate 11 and the lower test substrate 12; the clamping structure 13 is clamped, and positioning and pressing of the FPC are realized by utilizing the upper test substrate and the lower test substrate; the light of the IR LED thereon can be illuminated through the corresponding light transmitting hole 15.

2. And controlling the longitudinal movement mechanism 23, the transverse movement mechanism 24 and the vertical movement mechanism 27 to perform corresponding actions, and ensuring that the test probe 3 is positioned above the IR LED and the bottom of the shading ring 32 is close to the upper test substrate 11.

3. The test was started and the radiance w/m of the IR LED was measured²Light intensity lx, wavelength nm, etc.

4. And (5) repeating the step (2), and moving the test probe (3) to the position above another IR LED for testing.

5. And (5) after the test is finished, taking down the FPC.

In conclusion, before testing, the FPC and the plurality of IR LEDs to be tested on the FPC are accurately positioned by using the testing and positioning tool 1; after the positioning is carried out for one time, the testing probe 3 can be utilized to test the plurality of IR LEDs on the FPC one by one; the testing effect of the radiation illumination of the IR LED is ensured, and meanwhile, the production beat can be improved and the testing period can be shortened due to the reduction of the positioning times; the testing device is particularly suitable for testing the radiation illuminance of the IR LED under the FPC state.

The above description is only exemplary of the present invention and should not be taken as limiting the scope of the present invention, as any modifications, equivalents, improvements and the like made within the spirit and principles of the present invention are intended to be included within the scope of the present invention.

Claims

1. A test positioning tool is used for an IR LED test device, wherein IR LEDs are arranged on the front side or/and the back side of an FPC; the test positioning tool is characterized by comprising an upper test substrate and a lower test substrate; go up the test substrate with test substrate one end is articulated down, and the other end passes through buckle structure block connection, test substrate orientation down be equipped with on the face of going up the test substrate be used for right FPC carries out the location structure of fixing a position, go up the test substrate or/and be provided with on the test substrate down with the light trap that the IR LED position corresponds.

2. The test positioning tool according to claim 1, wherein the fastener structure comprises a hinge base, a first engaging member and a second engaging member hinged to the hinge base, and the first engaging member and the second engaging member can be separated from or engaged with each other;

3. The test positioning tool of claim 2, wherein an elastic member is arranged between the hinge seat and the first clamping member; in the clamping state, the resetting force of the elastic piece enables the clamping part of the first clamping piece to have the tendency of moving towards the direction of the second clamping piece.

4. The test positioning tool according to claim 1, wherein a guide positioning column is arranged on the lower test substrate, and a guide positioning hole matched with the guide positioning column is arranged on the upper test substrate; or, a guide positioning column is arranged on the upper test substrate, and a guide positioning hole matched with the guide positioning column is arranged on the lower test substrate.

5. The test positioning tool of claim 1, wherein the upper test base plate is hinged to the lower test base plate by a self-resetting damped hinge structure.

6. The test positioning tool of claim 5, wherein the self-resetting damping hinge structure comprises a hinge lug, a pivot arranged on the hinge lug, a pivot piece pivoted with the pivot and a torsion spring sleeved on the pivot; one end of the torsion spring is connected with the pivoting piece through a torsion arm;

7. An IR LED testing device is used for testing the radiation illumination of an IR LED on an FPC; the test positioning tool is characterized by comprising a rack, a test probe arranged on the rack and the test positioning tool according to any one of claims 1 to 6; the test positioning tool is arranged on the rack below the test probe, and a shading ring is arranged around a receiving window of the test probe.

8. The IR LED testing device of claim 7, wherein the radius of the receiving window of the testing probe is R0, the radius of the light hole is R1, the height of the light emitting surface of the IR LED is D2, the angle of view of the IR LED is FOV, the height of the shading ring is H, the distance from the light emitting surface of the IR LED to the receiving window is D, and the thickness of the upper testing substrate is D1_MAX(ii) a Wherein:

(D1_MAX-D2+H)＜d。

9. the IR LED testing device of claim 7, wherein the chassis comprises a base plate and a riser disposed on the base plate; the testing and positioning tool is rotatably installed on the bracket, and the bracket is provided with a driving mechanism for driving the testing and positioning tool to overturn; the vertical plate is provided with a vertical movement mechanism, and the test probe is arranged at a power output part of the vertical movement mechanism.

10. An IR LED testing device according to claim 9, characterized in that the bottom plate is provided with a slide rail parallel to the longitudinal movement mechanism, a slide block is slidably mounted on the slide rail, and the transverse movement mechanism is fixedly connected with the slide block.