CN213021512U - Electronic high-precision film material thickness instrument - Google Patents

Electronic high-precision film material thickness instrument Download PDF

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Publication number
CN213021512U
CN213021512U CN202022528539.8U CN202022528539U CN213021512U CN 213021512 U CN213021512 U CN 213021512U CN 202022528539 U CN202022528539 U CN 202022528539U CN 213021512 U CN213021512 U CN 213021512U
Authority
CN
China
Prior art keywords
thickness
film material
material thickness
bearing platform
detection device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN202022528539.8U
Other languages
Chinese (zh)
Inventor
邓翱
王疆
仵建国
候艳松
林孝挺
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anhui Expressway Engineering Test And Research Center LLC
Wenzhou Jigao Testing Instrument Co Ltd
Original Assignee
Anhui Expressway Engineering Test And Research Center LLC
Wenzhou Jigao Testing Instrument Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anhui Expressway Engineering Test And Research Center LLC, Wenzhou Jigao Testing Instrument Co Ltd filed Critical Anhui Expressway Engineering Test And Research Center LLC
Priority to CN202022528539.8U priority Critical patent/CN213021512U/en
Application granted granted Critical
Publication of CN213021512U publication Critical patent/CN213021512U/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)

Abstract

The utility model belongs to the field of film materials, in particular to an electronic high-precision film material thickness instrument, which comprises a thickness instrument, wherein an operation table is arranged on the thickness instrument, and a digital display screen for displaying detection values is arranged on the operation table; a raised upright post is fixed at the top of the thickness gauge, a bearing platform is fixed at the top of the upright post, a vertical rod is installed at the top of the bearing platform, and a cross frame is fixed at the top of the vertical rod; a lower detection device is arranged on the bearing platform and comprises an air cylinder arranged on the thickness gauge, the output end of the air cylinder is connected with a piston rod, and the other end of the piston rod is provided with a supporting plate clamped in the middle of the bearing platform; the thickness gauge detection mode is various, can go on detection device and detect membrane material thickness alone and go up two kinds of detections of detection device bi-polar cooperation detection membrane material thickness under the detection device cooperation, can promote membrane material thickness and detect the precision, and convenience of customers carries out the record of membrane material thickness data.

Description

Electronic high-precision film material thickness instrument
Technical Field
The utility model relates to a membrane material field, concretely relates to electronic type high accuracy membrane material thickness appearance.
Background
The film thickness gauge is also called as a thickness gauge, a film thickness detector, a film thickness gauge and the like, and is specially suitable for the accurate measurement of the thickness of various materials such as plastic films, sheets, diaphragms, paper, foils, silicon wafers and the like within a measuring range.
The prior art has the following problems:
when the existing film material thickness meter is used for detecting the thickness of a film material, the film material can only be extruded by a measuring probe to detect the thickness of the film, the measurement result is single, the thickness precision of the detected film material is low, and the subsequent analysis of the film material thickness data is influenced.
In order to solve the problems, the application provides an electronic high-precision film material thickness meter.
SUMMERY OF THE UTILITY MODEL
Objects of the invention
For solving the technical problem who exists among the background art, the utility model provides an electronic type high accuracy membrane material thickness appearance has the bi-polar cooperation and detects the characteristics that promote membrane material thickness and detect the precision.
(II) technical scheme
In order to solve the technical problem, the utility model provides an electronic high-precision film material thickness instrument, which comprises a thickness instrument, wherein an operation table is arranged on the thickness instrument, and a digital display screen for displaying a detection numerical value is arranged on the operation table;
a raised upright post is fixed at the top of the thickness gauge, a bearing platform is fixed at the top of the upright post, a vertical rod is installed at the top of the bearing platform, and a cross frame is fixed at the top of the vertical rod;
the bearing platform is provided with a lower detection device, the lower detection device comprises an air cylinder arranged on the thickness gauge, the output end of the air cylinder is connected with a piston rod, the other end of the piston rod is provided with a supporting plate clamped in the middle of the bearing platform, and the upper surface of the supporting plate is attached with a pressure-sensitive sensing plate;
the detection device is arranged on the cross frame and comprises a lifting platform arranged on the cross frame, a lifting rod is arranged on the lifting platform, and a raised measuring probe is fixed at the bottom of the lifting rod.
Preferably, the measuring probe is connected with the lifting platform in a lifting mode through the lifting rod.
Preferably, the pressure-sensitive induction plate arranged on the top of the supporting plate and the bearing platform are positioned on the same plane, and the specification of the supporting plate is matched with that of the through groove formed in the bearing platform.
Preferably, the pressure-sensitive sensing plate and the measuring probe are in the same axis, and a film material to be detected is clamped between the pressure-sensitive sensing plate and the measuring probe.
Preferably, a printer is installed on the thickness gauge, and a paper groove is formed in the front surface of the printer.
Preferably, a foot seat is installed at the bottom corner of the thickness gauge.
The above technical scheme of the utility model has following profitable technological effect: the thickness gauge detection mode is various, can go on detection device and detect membrane material thickness alone and go up two kinds of detections of detection device bi-polar cooperation detection membrane material thickness under the detection device cooperation, can promote membrane material thickness and detect the precision, and convenience of customers carries out the record of membrane material thickness data.
Drawings
Fig. 1 is a schematic front view of the present invention;
FIG. 2 is a schematic structural view of the lower detecting device of the present invention;
FIG. 3 is a schematic view of the upper detecting device of the present invention;
fig. 4 is the working structure diagram of the upper detection device of the present invention.
Reference numerals:
1. a thickness gauge; 11. an operation table; 12. a digital display screen; 13. a printer; 14. a foot seat; 2. a column; 3. a bearing platform; 4. a vertical rod; 5. a cross frame; 6. a lower detection device; 61. a cylinder; 62. a piston rod; 63. a support plate; 64. a pressure sensitive sensing plate; 7. an upper detection device; 71. a lifting platform; 72. a lifting rod; 73. and (4) measuring the probe.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention will be described in detail with reference to the accompanying drawings. It should be understood that the description is intended to be illustrative only and is not intended to limit the scope of the present invention. Moreover, in the following description, descriptions of well-known structures and techniques are omitted so as to not unnecessarily obscure the concepts of the present invention.
As shown in fig. 1-4, the electronic high-precision film material thickness gauge provided by the present invention comprises a thickness gauge 1, wherein an operation table 11 is arranged on the thickness gauge 1, and a digital display screen 12 for displaying a detection value is installed on the operation table 11;
a raised upright post 2 is fixed at the top of the thickness gauge 1, a bearing platform 3 is fixed at the top of the upright post 2, a vertical rod 4 is installed at the top of the bearing platform 3, and a cross frame 5 is fixed at the top of the vertical rod 4;
the bearing platform 3 is provided with a lower detection device 6, the lower detection device 6 comprises an air cylinder 61 arranged on the thickness instrument 1, the output end of the air cylinder 61 is connected with a piston rod 62, the other end of the piston rod 62 is provided with a supporting plate 63 clamped in the middle of the bearing platform 3, and the upper surface of the supporting plate 63 is provided with a pressure-sensitive induction plate 64 in an attaching manner;
the transverse frame 5 is provided with an upper detection device 7, the upper detection device 7 comprises a lifting table 71 arranged on the transverse frame 5, a lifting rod 72 is arranged on the lifting table 71, and a raised measuring probe 73 is fixed at the bottom of the lifting rod 72.
It should be noted that:
1. the measuring probe 73 is connected with the lifting platform 71 in a lifting way through a lifting rod 72; the lift lever 72 moves up and down on the lift table 71, and drives the measurement probe 73 to rise or press down.
2. The pressure-sensitive induction plate 64 arranged at the top of the supporting plate 63 and the bearing platform 3 are positioned on the same plane, and the specification of the supporting plate 63 is matched with that of the through groove formed in the bearing platform 3; a pressure-sensitive sensing plate 64 is mounted on the top of the supporting plate 63 for detecting the pressure applied to the film material, and the supporting plate 63 can protrude out of the supporting plate 63 through the top of the piston rod 62 at the output end of the air cylinder 61.
In this embodiment, the pressure-sensitive sensing plate 64 and the measuring probe 73 are located at the same axis, a film material to be detected is clamped between the pressure-sensitive sensing plate 64 and the measuring probe 73, and when the film material thickness is detected, two detection modes, namely, the upper detection device 7 is used for detecting the film material thickness independently, and the upper detection device 7 is matched with the lower detection device 6 to detect the film material thickness in a double-end cooperation manner;
as a working example of the upper detection device 7 alone detecting: the cut film material is placed on the supporting plate 63, the lifting rod 72 on the lifting platform 71 descends to drive the measuring probe 73 to extrude the film material, the extrusion data is fed back to the thickness gauge 1 through the measuring probe 73 to be decoded, and the processed data is displayed on the digital display screen 12 of the thickness gauge 1;
as a working example of double-end cooperative detection of the upper detection device 7 and the lower detection device 6: the cut film material is placed on a supporting plate 63, a lifting rod 72 on a lifting platform 71 descends to drive a measuring probe 73 to press downwards, a piston rod 62 at the output end of an air cylinder 61 stretches to drive the supporting plate 63 to lift, the film material is clamped between a pressure-sensitive sensing plate 64 and the measuring probe 73 to detect the thickness, the pressure-sensitive sensing plate 64 on the supporting plate 63 receives pressure feedback, the data measured by extruding the film material by matching with the measuring probe 73 is subjected to double-end acquisition, the acquired data is transmitted to a thickness meter 1 to be subjected to data decoding, and the processed data is displayed on a digital display screen 12 of the thickness meter 1;
the thickness meter 1 has various detection modes, can improve the film material thickness detection precision, and is convenient for a user to record film material thickness data.
In an alternative embodiment, the thickness gauge 1 is provided with a printer 13, and a paper slot is formed in the front surface of the printer 13.
The printer 13 is used to print the film material thickness data after detection and analysis, and the printed paper is taken out through the paper slot to assist recording of the film material thickness data.
In an alternative embodiment, the bottom corners of the thickness gauge 1 are fitted with foot mounts 14.
The foot rest 14 is used to support the thickness gauge 1.
It is to be understood that the above-described embodiments of the present invention are merely illustrative of or explaining the principles of the invention and are not to be construed as limiting the invention. Therefore, any modification, equivalent replacement, improvement and the like made without departing from the spirit and scope of the present invention should be included in the protection scope of the present invention. Further, it is intended that the appended claims cover all such variations and modifications as fall within the scope and boundaries of the appended claims or the equivalents of such scope and boundaries.

Claims (6)

1. An electronic high-precision film material thickness instrument is characterized by comprising a thickness instrument (1), wherein an operation table (11) is arranged on the thickness instrument (1), and a digital display screen (12) for displaying detection values is arranged on the operation table (11);
the thickness gauge comprises a thickness gauge (1), wherein a raised upright post (2) is fixed at the top of the thickness gauge (1), a bearing platform (3) is fixed at the top of the upright post (2), a vertical rod (4) is installed at the top of the bearing platform (3), and a cross frame (5) is fixed at the top of the vertical rod (4);
a lower detection device (6) is arranged on the bearing platform (3), the lower detection device (6) comprises an air cylinder (61) arranged on the thickness gauge (1), the output end of the air cylinder (61) is connected with a piston rod (62), the other end of the piston rod (62) is provided with a supporting plate (63) clamped in the middle of the bearing platform (3), and the upper surface of the supporting plate (63) is provided with a pressure-sensitive induction plate (64) in an attaching manner;
be provided with detection device (7) on crossbearer (5), go up detection device (7) including installing elevating platform (71) on crossbearer (5), install lifter (72) on elevating platform (71), the bottom of lifter (72) is fixed with bellied measuring probe (73).
2. A high-precision electronic film material thickness gauge according to claim 1, wherein the measuring probe (73) is connected with the lifting platform (71) in a lifting manner through the lifting rod (72).
3. The electronic high-precision film material thickness instrument according to claim 1, wherein the pressure-sensitive sensing plate (64) mounted on the top of the supporting plate (63) and the bearing platform (3) are in the same plane, and the specification of the supporting plate (63) is matched with that of a through groove formed in the bearing platform (3).
4. The electronic high-precision film material thickness meter as claimed in claim 1, wherein the pressure-sensitive sensing plate (64) and the measuring probe (73) are coaxially arranged, and the film material to be detected is clamped between the pressure-sensitive sensing plate (64) and the measuring probe (73).
5. The electronic high-precision film material thickness instrument according to claim 1, wherein a printer (13) is mounted on the thickness instrument (1), and a paper groove is formed in the front surface of the printer (13).
6. The electronic high-precision film material thickness gauge according to claim 1, wherein a foot seat (14) is installed at the bottom corner of the thickness gauge (1).
CN202022528539.8U 2020-11-04 2020-11-04 Electronic high-precision film material thickness instrument Expired - Fee Related CN213021512U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202022528539.8U CN213021512U (en) 2020-11-04 2020-11-04 Electronic high-precision film material thickness instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202022528539.8U CN213021512U (en) 2020-11-04 2020-11-04 Electronic high-precision film material thickness instrument

Publications (1)

Publication Number Publication Date
CN213021512U true CN213021512U (en) 2021-04-20

Family

ID=75482136

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202022528539.8U Expired - Fee Related CN213021512U (en) 2020-11-04 2020-11-04 Electronic high-precision film material thickness instrument

Country Status (1)

Country Link
CN (1) CN213021512U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113251976A (en) * 2021-06-30 2021-08-13 苏师大半导体材料与设备研究院(邳州)有限公司 Silicon wafer overall dimension detection tool and detection method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113251976A (en) * 2021-06-30 2021-08-13 苏师大半导体材料与设备研究院(邳州)有限公司 Silicon wafer overall dimension detection tool and detection method
CN113251976B (en) * 2021-06-30 2021-09-24 苏师大半导体材料与设备研究院(邳州)有限公司 Silicon wafer overall dimension detection tool and detection method

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CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20210420

Termination date: 20211104

CF01 Termination of patent right due to non-payment of annual fee