CN212932855U - A forward voltage drop test circuit for schottky diode - Google Patents
A forward voltage drop test circuit for schottky diode Download PDFInfo
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- CN212932855U CN212932855U CN202021746922.4U CN202021746922U CN212932855U CN 212932855 U CN212932855 U CN 212932855U CN 202021746922 U CN202021746922 U CN 202021746922U CN 212932855 U CN212932855 U CN 212932855U
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Abstract
The utility model belongs to the technical field of the diode test, especially, relate to a forward voltage drop test circuit for schottky diode. The device comprises a power supply, a constant current source module, a sampling processing circuit and a display circuit, wherein the two ends of the power supply are connected with a pipe to be tested, the constant current source module is connected between the power supply and the pipe to be tested in series and used for providing specified current for the pipe to be tested, the sampling processing circuit is connected with the two ends of the pipe to be tested and used for collecting and processing the voltage value of the pipe to be tested under the specified current value, and the display circuit is connected with the sampling processing circuit and used for displaying signals processed by the sampling processing. The utility model is used for solve the inconvenient problem of forward pressure drop parameter test. The constant current source module provides appointed current for the pipe to be tested, and the voltage of the pipe to be tested is collected through the sampling processing circuit and is processed through data under the appointed current, and then the specific numerical value is displayed through the display circuit, so that the integral structure is simple, the convenience and the easy implementation are realized, the size is small, and the carrying is convenient.
Description
Technical Field
The utility model belongs to the technical field of the diode test, especially, relate to a forward voltage drop test circuit for schottky diode.
Background
The Schottky diode is a low-power-consumption and high-speed semiconductor device, and has the characteristics of small forward voltage drop, short recovery time and high switching frequency, wherein the forward voltage drop is one of important parameters of the Schottky diode.
In actual use, the selection is usually performed according to a nominal forward voltage drop parameter, however, in production, the problem of poor consistency of forward voltage drops may be caused due to the influence of packaging technology, and the actual forward voltage drop value of the diode itself may cause a certain influence in selection and adaptation, so that in actual use, the value is usually required to be tested, and the conventional test instrument is usually large in size and inconvenient to carry.
SUMMERY OF THE UTILITY MODEL
The technical problem that this application embodiment will solve lies in overcoming prior art not enough, provides a forward voltage drop test circuit for schottky diode for solve the inconvenient problem of forward voltage drop parameter test.
The technical scheme for solving the technical problems in the embodiment of the application is as follows: a forward voltage drop test circuit for a Schottky diode comprises a power supply, wherein two ends of the power supply are connected with a tube to be tested;
the constant current source module is connected between the power supply and the pipe to be tested in series and used for providing specified current for the pipe to be tested;
the sampling processing circuit is connected to the two ends of the pipe to be detected and used for collecting and processing the voltage value of the pipe to be detected under the specified current value, and the sampling processing circuit is also connected with the constant current source module and used for controlling the on-off of the constant current source;
and the display circuit is connected with the sampling processing circuit and is used for displaying the signals processed by the sampling processing circuit.
Compared with the prior art, the technical scheme has the following beneficial effects:
the constant current source module provides appointed current for the pipe to be tested, and the voltage of the pipe to be tested is collected through the sampling processing circuit and is processed through data under the appointed current, and then the specific numerical value is displayed through the display circuit, so that the integral structure is simple, the convenience and the easy implementation are realized, the size is small, and the carrying is convenient.
Further, the constant current source module comprises a current gear setting circuit, and the current gear setting circuit is connected with the pipe to be tested and is used for providing a specified current value for the pipe to be tested.
The beneficial effect of this step is: the current gear setting circuit connected with the to-be-tested tube realizes current input of different gears of the to-be-tested tube, and is convenient to test.
Further, the sampling processing circuit comprises a voltage sampling circuit and a processing circuit which are connected with each other;
the voltage sampling circuit is connected to two ends of the pipe to be tested and used for collecting the voltage value of the pipe to be tested and then transmitting the voltage value to the processing circuit;
the processing circuit is used for processing the signal transmitted by the voltage sampling circuit under a specified current value.
The beneficial effect of this step is: the voltage sampling circuit connected to the two ends of the tube to be tested collects the voltage values at the two ends of the tube to be tested loaded with the specified current and transmits the voltage values to the processing circuit, and then the forward voltage drop value of the tube to be tested under the specified current can be obtained through processing.
Furthermore, the sampling processing circuit further comprises a current sampling circuit, wherein the current sampling circuit is connected to two ends of the current gear setting circuit in parallel, is connected with the processing circuit and is used for detecting and displaying a current value provided by the current gear setting circuit.
The beneficial effect of this step is: the current sampling circuits connected in parallel at the two ends of the current gear setting circuit can read and display the magnitude of the current value provided by the current gear setting circuit in real time, and the accuracy of the test parameters is ensured.
Furthermore, the processing circuit comprises a singlechip and an A/D conversion module;
the A/D conversion module is connected with the voltage sampling circuit and the current sampling circuit and is used for converting signals transmitted by the voltage sampling circuit and the current sampling circuit;
the single chip microcomputer is connected with the A/D conversion module and used for processing signals converted by the A/D conversion module, and the single chip microcomputer is also connected with the constant current source module and used for controlling the on-off of the constant current source module.
The beneficial effect of this step is: the A/D conversion module is connected between the single chip microcomputer and the current sampling circuit and between the single chip microcomputer and the voltage sampling circuit, collected analog signals can be converted into digital signals, the digital signals are transmitted to the single chip microcomputer to be processed and operated, the constant current source module is connected through the single chip microcomputer, the opening and closing of the constant current source are controlled, the constant current source module is started when testing is needed, and the constant current source module is closed when not needed.
Further, the sampling processing circuit further comprises a test switch, and the test switch is connected with the processing circuit.
The beneficial effect of this step is: and the processing circuit is connected with a test switch, the test switch is switched on during testing, the whole circuit is ensured to be effective, the testing is carried out, and the test switch is switched off when the testing is not carried out.
Further, the display circuit comprises a voltage display module and a current display module.
And the current gear switch is linked with the current gear setting circuit and is connected with the singlechip to input gear signals of the current gear setting circuit in a linkage manner.
The beneficial effect of this step is: the current gear switch linked with the current gear setting circuit is connected with the single chip microcomputer, when the specified current is regulated and input by the current gear setting circuit, the single chip microcomputer is linked to close a pin of an input signal of the corresponding specified current value, a gear signal is provided for the single chip microcomputer, and subsequent processing and display are facilitated.
One or more technical solutions provided in the embodiments of the present application have at least the following technical effects or advantages:
1. the constant current source module provides appointed current for the pipe to be tested, and the voltage of the pipe to be tested is collected through the sampling processing circuit and is processed through data under the appointed current, and then the specific numerical value is displayed through the display circuit, so that the integral structure is simple, the convenience and the easy implementation are realized, the size is small, and the carrying is convenient.
2. The current sampling circuits connected in parallel at the two ends of the current gear setting circuit can read and display the current value provided by the current gear setting circuit in real time, and the accuracy of the test parameters is ensured.
3. And the processing circuit is connected with a test switch, the test switch is switched on during testing, the whole circuit is ensured to be effective, the testing is carried out, and the test switch is switched off when the testing is not carried out.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the embodiments or the technical solutions in the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is a block diagram of an overall circuit structure according to an embodiment of the present invention.
Fig. 2 is a block diagram of the processing circuit of fig. 1.
Fig. 3 is a block diagram of the current level setting circuit and the current sampling circuit in fig. 1.
Fig. 4 is a block diagram of the voltage sampling current structure in fig. 1.
Fig. 5 is a block diagram of the whole connection between the constant current source module and the current level setting circuit, and the current sampling circuit and the voltage sampling circuit in this embodiment.
Fig. 6 is an enlarged schematic view of B in fig. 5.
Fig. 7 is an enlarged schematic view of a portion a in fig. 5.
Detailed Description
Embodiments of the present invention will be described in detail below with reference to the accompanying drawings. The following examples are only for illustrating the technical solutions of the present invention more clearly, and therefore are only examples, and the protection scope of the present invention is not limited thereby.
It is to be noted that unless otherwise specified, technical or scientific terms used herein shall have the ordinary meaning as understood by those skilled in the art to which the present invention belongs.
In the description of the present application, it is to be understood that the terms "upper", "lower", "front", "rear", "left", "right", "inner", "outer", and the like, indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, are only for convenience of description and simplicity of description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be construed as limiting the present invention.
Furthermore, the terms "first", "second", etc. are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. In the description of the present invention, "a plurality" means two or more unless specifically limited otherwise.
In this application, unless expressly stated or limited otherwise, the terms "mounted," "connected," "secured," and the like are to be construed broadly and can include, for example, fixed connections, removable connections, or integral parts; can be mechanically or electrically connected; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meaning of the above terms in the present invention can be understood according to specific situations by those skilled in the art.
In this application, unless expressly stated or limited otherwise, the first feature "on" or "under" the second feature may be directly contacting the first and second features or indirectly contacting the first and second features through intervening media. Also, a first feature "on," "over," and "above" a second feature may be directly or diagonally above the second feature, or may simply indicate that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature may be directly under or obliquely under the first feature, or may simply mean that the first feature is at a lesser elevation than the second feature.
Examples
As shown in FIG. 1, the embodiment of the present invention provides a forward voltage drop test circuit for Schottky diode, which comprises a power supply, a constant current source module, a sampling processing circuit and a display circuit, wherein the power supply is connected with a tube to be tested at two ends, the constant current source module is connected in series between the power supply and the tube to be tested for providing a specified current for the tube to be tested, the sampling processing circuit is connected with two ends of the tube to be tested for collecting and processing the voltage value of the tube to be tested at a specified current value, the sampling processing circuit is further connected with the constant current source module for controlling the on/off of the constant current source, i.e. controlling the constant current source module to provide the specified current for the tube to be tested during the test, the display circuit is connected with the sampling processing circuit for displaying the signal processed by the sampling processing circuit, the specified current is provided for the tube to be tested by the constant current, and then the specific numerical value is displayed through the display circuit, the whole structure is simple, the operation is convenient and easy, the volume is small, and the carrying is convenient.
The constant current source module comprises a current gear setting circuit, the current gear setting circuit is connected with a to-be-tested tube and used for providing a specified current value for the to-be-tested tube, specifically, the circuit of the current gear setting circuit is shown in fig. 3, resistors are connected in series through a selection switch to form A, B, C, D four gears, each gear provides currents of four gears of 1A, 2A, 2.5A and 3A respectively, the selection switch corresponding to the gear can be closed according to actual needs to provide the specified current for the to-be-tested tube, and through the current gear setting circuit connected with the to-be-tested tube, current input of different gears of the to-be-tested tube is achieved, and testing is facilitated.
In this embodiment, the sampling processing circuit includes a voltage sampling circuit and a processing circuit that are connected to each other, specifically, the circuit of the voltage sampling circuit is as shown in fig. 4, the voltage sampling circuit is connected to both ends of the tube to be measured, and is used for collecting the voltage value of the tube to be measured and then transmitting the voltage value to the processing circuit, the processing circuit is used for processing the signal transmitted from the voltage sampling circuit at a specified current value, the voltage sampling circuit connected to both ends of the tube to be measured collects the voltage values at both ends of the tube to be measured loaded with specified current and transmits the voltage values to the processing circuit, and the forward voltage drop value of the tube to be measured at the specified current can be processed;
in this embodiment, the sampling processing circuit further includes a current sampling circuit, and specifically, the constant current source module, the current level setting circuit, the current sampling circuit, and the voltage sampling circuit are connected in series as shown in fig. 5, where the current sampling circuit is connected in parallel as shown in fig. 3, and the current sampling circuit is connected in parallel at both ends of the current level setting circuit and connected with the processing circuit, and is configured to detect and display a current value provided by the current level setting circuit, and the current sampling circuit connected in parallel at both ends of the current level setting circuit can read and display the current value provided by the current level setting circuit in real time, so as to ensure accuracy of the test parameters.
The specific circuit of the processing circuit is shown in fig. 2, wherein the processing circuit includes a single chip microcomputer and an a/D conversion module, specifically, the a/D conversion module of this embodiment may adopt a conversion module of ADS1286PA, or a similar conversion module, the single chip microcomputer may adopt a single chip microcomputer of AT89C2051, the a/D conversion modules are connected to a voltage sampling circuit and a current sampling circuit, and are used for converting signals transmitted from the voltage sampling circuit and the current sampling circuit, the single chip microcomputer is connected to the a/D conversion module, and is used for processing signals converted by the a/D conversion module, the single chip microcomputer is further connected to a constant current source module, and is used for controlling on and off of the constant current source module, the a/D conversion module connected between the single chip microcomputer and the current sampling circuit and the voltage sampling circuit, and is capable of converting acquired analog signals into digital signals and transmitting the digital signals to the, the single chip microcomputer is connected with the constant current source module to control the on-off of the constant current source, the constant current source module is started when testing is needed, and the constant current source module is closed when not needed.
In addition, in this embodiment, the current level switch is further included and is linked with the current level setting circuit, the current level switch is connected with the single chip microcomputer, and is linked to input the level signal of the current level setting circuit, specifically, the current level switch is also a fourth level switch, and is connected with pins No. 15, 16, 17, and 18 of the single chip microcomputer respectively.
The current gear switch linked with the current gear setting circuit is connected with the single chip microcomputer, when the specified current is regulated and input by the current gear setting circuit, the single chip microcomputer is linked to close a pin of an input signal of the corresponding specified current value, a gear signal is provided for the single chip microcomputer, and subsequent processing and display are facilitated.
The single chip microcomputer judges the magnitude of the current value provided by the current gear setting circuit corresponding to the closing by reading the closing condition of the current gear switch, specifically, as shown in fig. 1, 2 and 3, a selection switch A, B, C, D in the current gear setting circuit and the current gear switch are realized by a three-blade four-gear switch, and when the four-gear adjustment is realized by mutual linkage between three blades, the specified current is provided for the tube to be measured, and a gear signal of the specified current value is provided for the single chip microcomputer.
In this embodiment, as shown in fig. 2, the sampling processing circuit further includes a testing switch, the testing switch is connected to the processing circuit, specifically, the testing switch adopts a foot switch, and is connected to the single chip microcomputer 14, the testing switch is connected to the processing circuit, the testing switch is turned on during testing, the whole circuit is ensured to be effective, the testing is performed, the testing switch is turned off during non-testing, and the foot switch is convenient to operate.
In this embodiment, the display circuit includes a voltage display module and a current display module, and specifically, the current display module and the voltage display module are both implemented by connecting a digital tube to a single chip microcomputer, the current display module displays a specified current value, and the voltage display module displays a forward voltage drop value of the tube to be measured corresponding to the specified current value.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; such modifications and substitutions do not depart from the spirit and scope of the present invention.
Claims (7)
1. A forward voltage drop test circuit for a Schottky diode, characterized in that: the device comprises a power supply, wherein two ends of the power supply are connected with a tube to be tested;
the constant current source module is connected between the power supply and the pipe to be tested in series and used for providing specified current for the pipe to be tested;
the sampling processing circuit is connected to the two ends of the pipe to be detected and used for collecting and processing the voltage value of the pipe to be detected under the specified current value, and the sampling processing circuit is also connected with the constant current source module and used for controlling the on-off of the constant current source;
and the display circuit is connected with the sampling processing circuit and is used for displaying the signals processed by the sampling processing circuit.
2. The forward voltage drop test circuit for the schottky diode of claim 1, wherein: the constant current source module comprises a current gear setting circuit, and the current gear setting circuit is connected with the pipe to be tested and used for providing a specified current value for the pipe to be tested.
3. The forward voltage drop test circuit for the schottky diode of claim 2, wherein: the sampling processing circuit comprises a voltage sampling circuit and a processing circuit which are connected with each other;
the voltage sampling circuit is connected to two ends of the pipe to be tested and used for collecting the voltage value of the pipe to be tested and then transmitting the voltage value to the processing circuit;
the processing circuit is used for processing the signal transmitted by the voltage sampling circuit under a specified current value.
4. The forward voltage drop test circuit for the schottky diode of claim 3, wherein: the sampling processing circuit further comprises a current sampling circuit, wherein the current sampling circuit is connected with two ends of the current gear setting circuit in parallel, is connected with the processing circuit and is used for detecting and displaying a current value provided by the current gear setting circuit.
5. The forward voltage drop test circuit for the schottky diode of claim 4, wherein: the processing circuit comprises a singlechip and an A/D conversion module;
the A/D conversion module is connected with the voltage sampling circuit and the current sampling circuit and is used for converting signals transmitted by the voltage sampling circuit and the current sampling circuit;
the single chip microcomputer is connected with the A/D conversion module and used for processing signals converted by the A/D conversion module, and the single chip microcomputer is also connected with the constant current source module and used for controlling the on-off of the constant current source module.
6. The forward voltage drop test circuit for the schottky diode of claim 3, wherein: the sampling processing circuit further comprises a test switch, and the test switch is connected with the processing circuit.
7. The forward voltage drop test circuit for the schottky diode of claim 1, wherein: the display circuit comprises a voltage display module and a current display module.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021746922.4U CN212932855U (en) | 2020-08-19 | 2020-08-19 | A forward voltage drop test circuit for schottky diode |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021746922.4U CN212932855U (en) | 2020-08-19 | 2020-08-19 | A forward voltage drop test circuit for schottky diode |
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| CN212932855U true CN212932855U (en) | 2021-04-09 |
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| CN202021746922.4U Active CN212932855U (en) | 2020-08-19 | 2020-08-19 | A forward voltage drop test circuit for schottky diode |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114184928A (en) * | 2021-11-24 | 2022-03-15 | 深圳同兴达科技股份有限公司 | Performance detection system and detection method for Schottky diode in display module |
| CN114184928B (en) * | 2021-11-24 | 2024-05-28 | 深圳同兴达科技股份有限公司 | Performance detection system and detection method for Schottky diode in display module |
-
2020
- 2020-08-19 CN CN202021746922.4U patent/CN212932855U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114184928A (en) * | 2021-11-24 | 2022-03-15 | 深圳同兴达科技股份有限公司 | Performance detection system and detection method for Schottky diode in display module |
| CN114184928B (en) * | 2021-11-24 | 2024-05-28 | 深圳同兴达科技股份有限公司 | Performance detection system and detection method for Schottky diode in display module |
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