CN212808084U - Measuring tool for inspecting surface wave defects of stamping parts - Google Patents
Measuring tool for inspecting surface wave defects of stamping parts Download PDFInfo
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- CN212808084U CN212808084U CN202021428480.9U CN202021428480U CN212808084U CN 212808084 U CN212808084 U CN 212808084U CN 202021428480 U CN202021428480 U CN 202021428480U CN 212808084 U CN212808084 U CN 212808084U
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Abstract
The utility model relates to the technical field of surface defect measurement, in particular to a measuring tool for detecting surface wave defects of stamping parts, which comprises a dial indicator, a base and a bracket, wherein the base is provided with a through hole; the dial indicator is arranged above the base, a measuring head of the dial indicator can extend out of the bottom surface of the base through the through hole, the measuring head is of a telescopic structure, and the measuring head is perpendicular to the bottom surface of the base; the body of the dial indicator is connected with the base through the bracket. Compared with the prior art, the beneficial effects of the utility model reside in that: the utility model provides a stamping workpiece surface wave defect inspection measuring tool, it detects the precision height, and the structure is exquisite, the part is compatible good, low cost easily uses widely.
Description
Technical Field
The utility model relates to a surface defect measures technical field, concretely relates to stamping workpiece surface wave defect inspection measuring tool.
Background
In the field of automobile manufacturing, in particular in stamping workshops of industrial automobile stamping die manufacturing enterprises and host factories, the surface quality of automobile panels must be checked. The production standard requires that the surface of the automobile covering part is smooth and has no defects of wave, dark pits and the like. Thus, the whole vehicle looks more beautiful after paint spraying.
The general surface quality method in the prior art is as follows: and (3) polishing the surface of the stamping part along a specific direction by using an oilstone, wherein if the surface has defects such as waves, dark pits and the like, polishing marks have breakpoints and discontinuity. However, this method still has the following defects: although the defect area can be determined by this method, the depth of the defect cannot be determined. Under the existing conditions, the depth judgment can only be subjectively sensed by touching parts by a holding person, and the judgment mode is not objective and is easy to deviate.
In fact, the defect depth is decisive for judging the defect grade of the covering part, and the stamping part with the deep defect must be repaired or even scrapped.
In addition, the surface quality can be performed by means of optical scanning in the prior art. But the optical scanning equipment has huge investment and is difficult to bear by small and medium-sized enterprises. Meanwhile, the installation of the optical scanning equipment has certain requirements on the stamping line and a factory building, the original production line needs to be modified, and due to the high cost, the method for carrying out surface quality by using the optical scanning equipment is not widely applied.
Therefore, it is urgently needed to design a stamping part surface wave defect inspection measuring tool which can quantify the depth of a dark pit, is convenient to use and is low in cost.
In view of the above-mentioned drawbacks, the authors of the present invention have finally obtained the present invention through long-term research and practice.
SUMMERY OF THE UTILITY MODEL
In order to solve the technical defects, the utility model adopts the technical scheme that the utility model provides a measuring tool for detecting the surface wave defects of stamping parts, which comprises a dial indicator, a base and a bracket, wherein the base is provided with a through hole; the dial indicator is arranged above the base, a measuring head of the dial indicator can extend out of the bottom surface of the base through the through hole, the measuring head is of a telescopic structure, and the measuring head is perpendicular to the bottom surface of the base; the body of the dial indicator is connected with the base through the bracket.
Preferably, the support is the notch cuttype support, the support includes first connecting portion and second connecting portion, first connecting portion with the second connecting portion pass through the stand and connect, first connecting portion are higher than the second connecting portion, the lower part of first connecting portion is equipped with and is used for holding the space of amesdial's body.
Preferably, the first connecting portion is provided with a clamping portion, and a clamping rod on the dial indicator is connected with the clamping portion.
Preferably, the clamping portion is provided with a groove for accommodating a clamping rod on the dial indicator, and the clamping portion is further provided with two clamping arms with adjustable intervals.
Preferably, the outer surface of the clamping bar and/or the inner surface of the groove in the bracket is a knurled surface.
Preferably, the two clamping arms are connected through a first screw, and the first screw is used for adjusting the clamping force of the clamping part.
Preferably, the second connecting part is connected with the base through a second screw, a first pin and a second pin; the first pin and the second pin are respectively positioned on two sides of the second screw; two ends of the first pin are in interference fit with a corresponding pin hole in the base and a corresponding pin hole in the second connecting part respectively; and two ends of the second pin are in interference fit with the corresponding pin holes in the base and the corresponding pin holes in the second connecting part respectively.
Preferably, the dial indicator is a pointer type dial indicator or an electronic dial indicator or a dial indicator with a recording function.
Preferably, the precision of the dial indicator is 0.001 mm.
Preferably, the bottom surface of the base is rectangular, and the rectangle is a rectangle with a length of 200 mm and a width of 20 mm, or the rectangle is a rectangle with a length of 100 mm and a width of 10 mm.
Compared with the prior art, the beneficial effects of the utility model reside in that:
the utility model provides a stamping workpiece surface wave defect inspection measuring tool, it detects the precision height, and the part is compatible good, low cost easily uses widely.
Drawings
Fig. 1 is an assembly view of a measuring tool for inspecting surface waviness defects of a stamping part according to embodiment 1 of the present invention;
fig. 2 is an exploded view of a measuring tool for inspecting surface waviness defects of a stamping part according to embodiment 1 of the present invention;
fig. 3 is a top view of a measuring tool for inspecting surface waviness defects of a stamping part according to embodiment 1 of the present invention;
fig. 4 is a front view of a measuring tool for inspecting surface waviness defects of a stamping part according to embodiment 1 of the present invention;
FIG. 5 is a diagram showing the status of the inspection gauge for wavy defects on the surface of a stamping part when the planar part is free from defects;
FIG. 6 is a diagram showing the status of the inspection gauge for wavy defects on the surface of a stamping part when the curved surface part is free of defects;
FIG. 7 is a diagram showing the operation of the inspection gauge for wavy defects on the surface of a stamping part during the inspection of a defective part.
Reference numerals:
the measuring tool comprises a first screw 1, a second screw 2, a bracket 3, a first pin 4, a second pin 5, a base 6, a dial indicator 7, a first connecting part 31, a second connecting part 32, a clamping arm 33, a through hole 60, a measuring head 70 and a clamping rod 71.
Detailed Description
The above and further features and advantages of the present invention will be described in more detail below with reference to the accompanying drawings.
In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", and the like, indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for convenience of describing the present invention, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, should not be construed as limiting the present invention.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present invention, "a plurality" means at least two unless specifically limited otherwise.
In the present invention, unless otherwise expressly stated or limited, the terms "mounted," "connected," and "fixed" are to be construed broadly and may, for example, be fixedly connected, detachably connected, or integrally formed; may be mechanically coupled, may be electrically coupled or may be in communication with each other; they may be directly connected or indirectly connected through intervening media, or they may be connected internally or in any other suitable relationship, unless expressly stated otherwise. The specific meaning of the above terms in the present invention can be understood according to specific situations by those skilled in the art.
In the present application, unless expressly stated or limited otherwise, the first feature may be directly on or directly under the second feature or indirectly via intermediate members. Also, a first feature "on," "over," and "above" a second feature may be directly or diagonally above the second feature, or may simply indicate that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature may be directly under or obliquely under the first feature, or may simply mean that the first feature is at a lesser elevation than the second feature.
In the description herein, references to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, various embodiments or examples and features of different embodiments or examples described in this specification can be combined and combined by one skilled in the art without contradiction.
Example 1
Fig. 1 is an assembly view of a measuring tool for inspecting surface waviness defects of a stamping part according to embodiment 1 of the present invention; fig. 2 is an exploded view of a measuring tool for inspecting surface waviness defects of a stamping part according to embodiment 1 of the present invention. As shown in fig. 1 and fig. 2, embodiment 1 of the present invention provides a measuring tool for inspecting surface waviness of a stamping part, which includes a dial indicator 7, a base 6 and a bracket 3.
The bottom surface of the base 6 is a plane, the bottom surface of the base 6 is a contact surface contacted with a part, a through hole 60 is arranged on the base 6, and the through hole 60 is used for accommodating a measuring head 70 of the dial indicator 7.
The dial gauge 7 is disposed above the base 6, and the probe 70 of the dial gauge 7 can protrude from the bottom surface of the base 6 through the through hole 60. The probe 70 has a telescopic structure. The gauge head 70 of the dial gauge 7 is disposed perpendicular to the bottom surface of the base 6.
The body of the dial indicator 7 is connected with the base 6 through the bracket 3. The dial indicator 7 is clamped and fixed by the through hole 60 on the base 6 and the bracket 3.
Fig. 3 is a top view of a measuring tool for inspecting surface waviness defects of a stamping part according to embodiment 1 of the present invention; fig. 4 is a front view of a measuring tool for inspecting surface waviness of a stamping part according to embodiment 1 of the present invention. As shown in fig. 3 and 4, the bracket 3 includes a first connecting portion 31 and a second connecting portion 32.
The first connecting portion 31 is provided with a clamping portion, and the clamping portion is provided with a groove capable of accommodating and clamping the clamping rod 71 on the dial indicator 7. The two clamping arms 33 of the clamping part are connected by a first screw 1. The distance between the two clamping arms 33 can be adjusted through the first screw 1, so that the purpose of clamping or loosening the clamping rod 71 of the dial indicator 7 is achieved.
The second connecting portion 32 is connected to the base 6 by the second screw 2, the first pin 4 and the second pin 5. The first pin 4 and the second pin 5 are located on either side of the second screw 2. Two ends of the first pin 4 are respectively in interference fit with a corresponding pin hole on the base 6 and a corresponding pin hole on the second connecting part 32. Two ends of the second pin 5 are respectively in interference fit with a corresponding pin hole on the base 6 and a corresponding pin hole on the second connecting part 32.
Preferably, the first connecting portion 31 and the second connecting portion 32 are connected by a pillar. The bracket 3 is a stepped bracket, and the first connecting portion 31 is higher than the second connecting portion 32. The first connecting portion 31 is used for connecting the dial indicator 7, and the lower portion of the first connecting portion 31 is used for accommodating the dial indicator 7. The second connecting portion 32 is used for connecting the base 6.
Preferably, the base 6 is a rectangular parallelepiped.
Preferably, the dial indicator 7 is a pointer dial indicator, an electronic dial indicator, or a dial indicator with a recording function. Further preferably, a dial gauge 7 with an accuracy of 0.001mm is used as the measuring tool. Accurate measurement can be realized by using a dial indicator with the precision of 0.001mm as a measuring tool and using a contact mode.
FIG. 5 is a diagram showing the status of the inspection gauge for wavy defects on the surface of a stamping part when the planar part is free from defects; FIG. 6 is a diagram showing the status of the inspection gauge for wavy defects on the surface of a stamping part when the curved surface part is free of defects; FIG. 7 is a diagram showing the operation of the inspection gauge for wavy defects on the surface of a stamping part during the inspection of a defective part. As shown in fig. 5, fig. 6 and fig. 7, the utility model provides a stamping workpiece surface wave defect inspection measuring tool, its theory of operation is:
in the inspection gauge, the gauge head 70 of the dial gauge 7 can be extended out of the bottom surface of the base 6 in a natural state. When the surface defect detection is executed, the detection measuring tool is used for measuring the surface of a part, if the surface of the part is free of defects, the measuring head 70 of the dial indicator 7 is compressed, the bottom end of the measuring head 70 is flush with the bottom surface of the base 6, and the reading of the dial indicator 7 is 0; if there is a defect on the surface of the part, the probe 70 of the dial gauge 7 is extended, and the depth of the defect can be displayed on the dial gauge 7 body.
The utility model provides a pair of stamping workpiece surface wave defect inspection measuring tool, its beneficial effect lies in: the detection precision is high, the structure is exquisite, the part compatibility is good, the cost is low, and the popularization and the use are easy.
Example 2
The present embodiment is different from embodiment 1 in that:
the outer surface of the clamping rod 71 of the dial indicator 7 and/or the inner surface of the groove on the bracket 3 are/is a knurled surface, and the beneficial effects are that: the use of a knurled surface can increase friction.
Example 3
The present embodiment is different from embodiment 1 in that: the bottom surface of the base 6 is preferably rectangular with a length of 200 mm and a width of 20 mm. The beneficial effects are that: the detection precision is high, the applicable parts are various, and the compatibility is good.
Example 4
The present embodiment is different from embodiment 1 in that: the bottom surface of the base 6 is preferably rectangular with a length of 100 mm and a width of 10 mm. The beneficial effects are that: the detection precision is high, the applicable parts are various, and the compatibility is good.
The foregoing is merely a preferred embodiment of the invention, which is intended to be illustrative, not limiting. The utility model discloses in all can change to some extent structure and connected mode etc. of each part all be in the utility model discloses equal transform and the improvement of going on technical scheme's the basis all should not get rid of the utility model discloses an outside the protection scope.
Claims (10)
1. A measuring tool for inspecting the surface wave defects of a stamping part is characterized by comprising a dial indicator, a base and a bracket, wherein the base is provided with a through hole; the dial indicator is arranged above the base, a measuring head of the dial indicator can extend out of the bottom surface of the base through the through hole, the measuring head is of a telescopic structure, and the measuring head is perpendicular to the bottom surface of the base; the body of the dial indicator is connected with the base through the bracket.
2. The gauge for inspecting wavy defects on the surface of a stamping part according to claim 1, wherein the bracket is a stepped bracket, the bracket comprises a first connecting part and a second connecting part, the first connecting part and the second connecting part are connected through an upright post, the first connecting part is higher than the second connecting part, and a space for accommodating the body of the dial indicator is arranged at the lower part of the first connecting part.
3. The inspection gauge for the surface waviness defects of the stamped part according to claim 2, wherein a clamping portion is provided on the first connecting portion, and a clamping rod on the dial indicator is connected with the clamping portion.
4. The inspection gauge for the surface waviness defects of the stamped part according to claim 3, wherein the clamping portion is provided with a groove for accommodating a clamping rod on the dial indicator, and the clamping portion is further provided with two clamping arms with adjustable intervals.
5. The apparatus according to claim 4, wherein the outer surface of the clamping bar and/or the inner surface of the groove on the bracket is a knurled surface.
6. The inspection gauge for the surface waviness defects of the stamping part as claimed in claim 4, wherein the two clamping arms are connected through a first screw, and the first screw is used for adjusting the clamping force of the clamping portion.
7. The apparatus according to claim 2, wherein the second connecting portion is connected to the base through a second screw, a first pin and a second pin; the first pin and the second pin are respectively positioned on two sides of the second screw; two ends of the first pin are in interference fit with a corresponding pin hole in the base and a corresponding pin hole in the second connecting part respectively; and two ends of the second pin are in interference fit with the corresponding pin holes in the base and the corresponding pin holes in the second connecting part respectively.
8. The inspection gauge for the surface wave defects of the stamping part as claimed in claim 1, wherein the dial indicator is an indicator dial indicator, an electronic dial indicator or a dial indicator with a recording function.
9. The inspection gauge for the surface waviness defects of a stamping part as claimed in claim 1, wherein the accuracy of the dial indicator is 0.001 mm.
10. A stamping surface waviness defect inspection gauge according to any one of claims 1 to 9, wherein the base bottom surface is rectangular, the rectangle is a rectangle having a length of 200 mm and a width of 20 mm, or the rectangle is a rectangle having a length of 100 mm and a width of 10 mm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021428480.9U CN212808084U (en) | 2020-07-20 | 2020-07-20 | Measuring tool for inspecting surface wave defects of stamping parts |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021428480.9U CN212808084U (en) | 2020-07-20 | 2020-07-20 | Measuring tool for inspecting surface wave defects of stamping parts |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN212808084U true CN212808084U (en) | 2021-03-26 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202021428480.9U Active CN212808084U (en) | 2020-07-20 | 2020-07-20 | Measuring tool for inspecting surface wave defects of stamping parts |
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| Country | Link |
|---|---|
| CN (1) | CN212808084U (en) |
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2020
- 2020-07-20 CN CN202021428480.9U patent/CN212808084U/en active Active
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