CN212758649U - High-low temperature test box - Google Patents
High-low temperature test box Download PDFInfo
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- CN212758649U CN212758649U CN202020898202.3U CN202020898202U CN212758649U CN 212758649 U CN212758649 U CN 212758649U CN 202020898202 U CN202020898202 U CN 202020898202U CN 212758649 U CN212758649 U CN 212758649U
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- connecting rod
- low temperature
- strip
- box
- temperature test
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Abstract
The utility model discloses a high low temperature test box relates to the technical field that the electronic product detected. The technical key points are as follows: the improved refrigerator is characterized by comprising a box body, wherein a heat insulation plate is fixedly mounted in the box body, a heating device and a refrigerating device are respectively arranged on the upper side and the lower side of the heat insulation plate, a through hole is formed in the heat insulation plate, the box body is double-layer in structure and comprises an inner layer and an outer layer, a connecting rod is inserted into one side of the box body and penetrates through the box body, the connecting rod is arranged in the box body, one end of the box body is connected with a clamping assembly, and the inner layer and the outer layer are vertically. The chip is conveniently clamped through the connecting rod and the clamping assembly, the position of the connecting rod can be conveniently adjusted through the strip-shaped hole, and then the connecting rod is rotated to turn over the chip, so that the chip can be subjected to double-sided testing under the condition of inconvenient space, the energy consumption is reduced, and the chip detection precision is improved.
Description
Technical Field
The utility model relates to a technical field that the electronic product detected, more specifically says, it relates to a high low temperature test chamber.
Background
The high-low temperature test device can perform high-temperature, low-temperature or high-low temperature gradual change experiments on electricians, electronic products, components, parts and materials thereof through rapid temperature rise and fall, and can perform stress screening tests on the electronic components and the products. However, the cold air and hot air generated by the existing test device can not be in good contact with the tested product, so that the quality of the test is reduced.
The Chinese utility model patent with the publication number of CN208512586U discloses a high and low temperature test box, which comprises a box body, a semiconductor heating sheet, a semiconductor refrigerating sheet and two air blowers, wherein a heat insulating plate (the heat insulating plate can be made of high temperature resistant rubber material) is fixedly arranged in the box body, an opening is arranged at the center of the heat insulating plate, a template is arranged in the opening, a cavity is arranged in the middle of the template, two fixing plates are fixedly arranged on the surface of the template, the two fixing plates are arranged in a left-right mode, the fixing plates are both fixed on the heat insulating plate through bolts, a sliding chute is transversely arranged at both sides of the opening of the heat insulating plate, a sliding block is uniformly and slidably arranged in the sliding chute, a pressing block is fixedly arranged at the upper end of the sliding block, a first screw hole is arranged in the middle of the sliding block, a fixing bolt is uniformly and threadedly connected in the first screw hole, a plurality of second screw holes are arranged on the bottom surface of the sliding chute, one end of the fixing bolt extends into the corresponding, and are all in threaded connection with the second screw holes. Open the apron through the handle earlier, because first intake pipe is made for metal material, thereby the first intake pipe and the first cover body can be taken over out in opening of apron, because the template passes through the bolt fastening on the thermal-insulated board, thereby this template can be changed, can change the template according to the difference of product, make the die cavity in the template the same with the shape of product, change the completion back, insert the product on the die cavity, can effectively plug up the die cavity through the product, and two sliders of inside removal, the removal of slider has driven the compact heap, can effectually carry the product through two compact heaps of inside removal, the dropping has been avoided, after pressing from both sides tight product, it is fixed with the slider through fixing bolt.
The above prior art solution has the following drawbacks: although the device can simultaneously carry out high-temperature or low-temperature treatment on the two surfaces of the chip, the two surfaces of the chip are simultaneously treated by filling cold air or hot air in the first cover body and the second cover body, so that the loss of energy is large.
SUMMERY OF THE UTILITY MODEL
Not enough to prior art exists, the utility model aims to provide a high low temperature test box conveniently carries out the centre gripping to the chip through connecting rod and the centre gripping subassembly that sets up, and the bar hole that sets up can conveniently adjust the position of connecting rod, and then rotates the connecting rod and realize the turn-over to the chip to can carry out two-sided test to the chip under the inconvenient condition in space, reduce the consumption of the energy, improve the precision that the chip detected simultaneously.
The above object of the present invention can be achieved by the following technical solutions:
the utility model provides a high low temperature test box, includes the box, fixed mounting has the thermal-insulated board in the box, the upper and lower both sides of thermal-insulated board are equipped with heating device and refrigerating plant respectively, the through-hole has been seted up on the thermal-insulated board, the double-deck setting of box just includes inlayer and skin, box one side is inserted and is equipped with the connecting rod just the connecting rod runs through the box, the connecting rod is arranged in one end is connected with the centre gripping subassembly in the box, the inlayer with the outer equal vertical bar hole of having seted up.
Through adopting above-mentioned technical scheme, conveniently carry out the centre gripping to the chip through connecting rod and the centre gripping subassembly that sets up, and the bar hole that sets up can conveniently adjust the position of connecting rod, and then rotates the connecting rod and realize the turn-over to the chip to can carry out two-sided test to the chip under the inconvenient condition in space, reduce the consumption of the energy, improve the precision that the chip detected simultaneously.
The utility model discloses further set up to: the cover is equipped with the baffler on the connecting rod, the baffler with the inlayer is kept away from the terminal surface laminating setting of centre gripping subassembly one end, the connecting rod removes the top in bar hole is with during the bottom, the baffler all can seal the bar hole.
Through adopting above-mentioned technical scheme, the bar hole on the inlayer can be sealed at the in-process of normal work to the baffler that sets up, has reduced high temperature or low temperature and has escaped from the bar hole in the course of the work, has reduced the consumption of the energy.
The utility model discloses further set up to: the centre gripping subassembly includes U type piece, U type piece keep away from its opening one end with the connection can be dismantled to the connecting rod, be connected with stud between the both ends of U type piece, stud's both ends tip all is not equipped with the screw thread, just stud's both ends with U type spare rotates to be connected, threaded connection has two grip blocks on the stud.
Through adopting above-mentioned technical scheme, the mode of setting up of centre gripping subassembly can go to carry out the centre gripping to the chip of different thickness, has improved the application scope of centre gripping subassembly, and utilizes stud can conveniently adjust the interval between the grip block.
The utility model discloses further set up to: the clamping blocks are located on two sides of the stud bolt, a fixing rod is additionally arranged, the axis of the fixing rod is parallel to the axis of the stud bolt, the fixing rod penetrates through the two clamping blocks, and the two ends of the fixing rod are rotatably connected with the U-shaped blocks.
Through adopting above-mentioned technical scheme, the dead lever that sets up can reduce the rotation of grip block at the in-process that uses, lets the grip block be in the state and the direction of preparing the centre gripping all the time.
The utility model discloses further set up to: and sealing gaskets are arranged on the end surfaces of the two clamping blocks, which are close to each other.
Through adopting above-mentioned technical scheme, the sealed pad that sets up can increase frictional force at the in-process of centre gripping, can reduce the damage of centre gripping process to the chip simultaneously.
The utility model discloses further set up to: a plurality of through holes are formed in the heat insulation plate, a plurality of rubber plugs are additionally arranged, and the rubber plugs can be embedded in the through holes.
Through adopting above-mentioned technical scheme, the rubber buffer and the through hole that set up can conveniently circulate upside and downside air, can detect cold and hot simultaneously in the testing process.
The utility model discloses further set up to: one end of the rubber plug is provided with a pulling ring which is fixedly connected with the rubber plug
Through adopting above-mentioned technical scheme, the rubber buffer can conveniently be pulled out to the pulling ring that sets up, has reduced the operation degree of difficulty.
The utility model discloses further set up to: the outer perpendicular to of following the bar groove has been seted up to the axis direction in bar hole, the bar groove with the crisscross setting in bar hole, fixedly connected with bar plate on the connecting rod, but the bar plate joint in the bar inslot.
Through adopting above-mentioned technical scheme, the bar groove that sets up can carry out the joint through the bar shaped plate in the use, has improved the stability of connecting rod.
To sum up, the utility model discloses a beneficial technological effect does:
(1) by adopting the technical scheme, the chip is conveniently clamped through the arranged connecting rod and the clamping assembly, the position of the connecting rod can be conveniently adjusted through the arranged strip-shaped hole, and the connecting rod is further rotated to turn over the chip, so that the chip can be subjected to double-sided testing under the condition of inconvenient space, the energy consumption is reduced, and the chip detection precision is improved;
(2) through adopting above-mentioned technical scheme, the bar hole on the inlayer can be sealed at the in-process of normal work to the baffler that sets up, has reduced high temperature or low temperature and has escaped from the bar hole in the course of the work, has reduced the consumption of the energy.
Drawings
Fig. 1 is a schematic view of the overall structure of the present invention;
FIG. 2 is a cross-sectional view taken along A-A in FIG. 1
Fig. 3 is a partially enlarged schematic view of a portion B in fig. 2.
Reference numerals: 1. a box body; 101. an inner layer; 102. an outer layer; 2. a cover plate; 3. a thermal insulation plate; 4. a heating device; 5. a refrigeration device; 6. a through hole; 7. a connecting rod; 8. a clamping assembly; 81. a U-shaped block; 82. a stud bolt; 83. a clamping block; 84. fixing the rod; 85. a gasket; 9. a strip-shaped groove; 10. a strip plate; 11. a barrier plate; 12. a through hole; 13. a rubber plug; 14. pulling the ring; 15. and (4) strip-shaped holes.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings.
As shown in fig. 1 and 2, for the utility model discloses a high low temperature test box, including box 1, box 1 is provided with apron 2, fixed mounting has insulation board 3 in the box 1, insulation board 3's upper and lower both sides are equipped with heating device 4 and refrigerating plant 5 respectively, heating device 4 is the simplified diagram with refrigerating plant 5, through-hole 6 has been seted up on insulation board 3, 1 double-deck setting of box just includes inlayer 101 and skin 102, box 1 one side is inserted and is equipped with connecting rod 7 and connecting rod 7 runs through box 1, connecting rod 7 is arranged in box 1 one end and is connected with centre gripping subassembly 8, inlayer 101 and the equal vertical bar hole 15 of having seted up of skin 102. Through connecting rod 7 and the centre gripping subassembly 8 that sets up conveniently carry out the centre gripping to the chip, and the bar hole 15 that sets up can conveniently adjust the position of connecting rod 7, and then rotate connecting rod 7 and realize the turn-over to the chip to can carry out two-sided test to the chip under the inconvenient condition in space, reduce the consumption of the energy, improve the precision that the chip detected simultaneously. Outer 102 has seted up bar groove 9 along the axis direction of perpendicular to bar hole 15, and bar groove 9 sets up with the crisscross setting in bar hole 15, fixedly connected with bar board 10 on the connecting rod 7, but bar board 10 joint is in bar groove 9. The strip groove 9 that sets up can carry out the joint through strip shaped plate 10 in the use, has improved connecting rod 7's stability.
As shown in fig. 2, the connecting rod 7 is sleeved with a blocking plate 11, the blocking plate 11 and the inner layer 101 are far away from the end face of one end of the clamping assembly 8, and when the connecting rod 7 moves to the uppermost end and the lowermost end of the strip-shaped hole 15, the blocking plate 11 can seal the strip-shaped hole 15. The strip-shaped holes 15 in the inner layer 101 can be sealed by the arranged barrier plates 11 in the normal working process, so that the high temperature or low temperature escaping from the strip-shaped holes 15 in the working process is reduced, and the energy consumption is reduced.
As shown in fig. 2 and 3, the clamping assembly 8 includes a U-shaped block 81, one end of the U-shaped block 81, which is far away from the opening thereof, is detachably connected to the connecting rod 7, and the U-shaped block 81 is connected to the connecting rod 7 in a sleeved manner. Stud 82 is connected between the both ends of U type piece 81, and stud 82's both ends tip does not all be equipped with the screw thread, and stud 82's both ends and U type piece 81 rotate to be connected, and threaded connection has two grip blocks 83 on the stud 82. The mode of setting up of centre gripping subassembly 8 can go to carry out the centre gripping to the chip of different thickness, has improved centre gripping subassembly 8's application scope, and utilizes stud 82 can conveniently adjust the interval between the grip block 83. The clamping blocks 83 are located on two sides of the stud 82, fixing rods 84 are additionally arranged, the axis of each fixing rod 84 is parallel to the axis of the stud 82, the fixing rods 84 penetrate through the two clamping blocks 83, and two ends of each fixing rod 84 are rotatably connected to the U-shaped blocks 81. The fixing rod 84 can reduce the rotation of the clamping block 83 in the using process, so that the clamping block 83 is always in a state and direction ready for clamping. The end faces of the two clamping blocks 83 which are close to each other are provided with sealing gaskets 85. The sealing gasket 85 can increase friction force in the clamping process, and meanwhile damage to the chip in the clamping process can be reduced.
As shown in fig. 2, the heat insulating plate 3 is provided with a plurality of through holes 12, and a plurality of rubber stoppers 13, wherein the rubber stoppers 13 can be embedded in the through holes 12. The rubber buffer 13 and the through hole 12 that set up can conveniently circulate upside and downside air, can detect cold and hot simultaneously at the testing process. One end of the rubber plug 13 is provided with a pulling ring 14, the pulling ring 14 fixedly connected with the rubber plug 13 can conveniently pull out the rubber plug 13, and the operation difficulty is reduced.
The embodiment of this specific implementation mode is the preferred embodiment of the present invention, not limit according to this the utility model discloses a protection scope, so: all equivalent changes made according to the structure, shape and principle of the utility model are covered within the protection scope of the utility model.
Claims (8)
1. The utility model provides a high low temperature test box, includes box (1), box (1) internal fixed mounting has insulation board (3), the upper and lower both sides of insulation board (3) are equipped with heating device (4) and refrigerating plant (5) respectively, through-hole (6) have been seted up on insulation board (3), its characterized in that, box (1) double-deck setting just includes inlayer (101) and skin (102), box (1) one side is inserted and is equipped with connecting rod (7) just connecting rod (7) run through box (1), connecting rod (7) are arranged in one end is connected with centre gripping subassembly (8) in box (1), inlayer (101) with bar hole (15) have all vertically been seted up in skin (102).
2. The high-low temperature test chamber according to claim 1, wherein a blocking plate (11) is sleeved on the connecting rod (7), the blocking plate (11) is attached to the end face of the inner layer (101) far away from one end of the clamping assembly (8), and when the connecting rod (7) moves to the uppermost end and the lowermost end of the strip-shaped hole (15), the blocking plate (11) can seal the strip-shaped hole (15).
3. The high-low temperature test chamber as claimed in claim 1, wherein the clamping assembly (8) comprises a U-shaped block (81), one end of the U-shaped block (81), which is far away from the opening, is detachably connected with the connecting rod (7), a stud bolt (82) is connected between two ends of the U-shaped block (81), no thread is arranged at the end parts of two ends of the stud bolt (82), two ends of the stud bolt (82) are rotatably connected with the U-shaped block (81), and two clamping blocks (83) are connected with the stud bolt (82) in a threaded manner.
4. A high-low temperature test chamber as claimed in claim 3, wherein the clamping blocks (83) are located at two sides of the stud bolt (82), a fixing rod (84) is further provided, the axis of the fixing rod (84) is parallel to the axis of the stud bolt (82), the fixing rod (84) penetrates through the two clamping blocks (83), and both ends of the fixing rod (84) are rotatably connected to the U-shaped block (81).
5. A high-low temperature test chamber as claimed in claim 3, wherein the end faces of the two clamping blocks (83) close to each other are provided with sealing gaskets (85).
6. The high and low temperature test chamber as claimed in claim 1, wherein the heat insulation plate (3) is provided with a plurality of through holes (12) and a plurality of rubber plugs (13), and the rubber plugs (13) can be embedded in the through holes (12).
7. A high and low temperature test chamber as claimed in claim 6, wherein one end of the rubber stopper (13) is provided with a pulling ring (14), and the pulling ring (14) is fixedly connected with the rubber stopper (13).
8. The high-low temperature test chamber according to claim 1, wherein the outer layer (102) is provided with a strip-shaped groove (9) along an axial direction perpendicular to the strip-shaped hole (15), the strip-shaped groove (9) and the strip-shaped hole (15) are arranged in a staggered manner, a strip-shaped plate (10) is fixedly connected to the connecting rod (7), and the strip-shaped plate (10) can be clamped in the strip-shaped groove (9).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020898202.3U CN212758649U (en) | 2020-05-25 | 2020-05-25 | High-low temperature test box |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020898202.3U CN212758649U (en) | 2020-05-25 | 2020-05-25 | High-low temperature test box |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN212758649U true CN212758649U (en) | 2021-03-23 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202020898202.3U Active CN212758649U (en) | 2020-05-25 | 2020-05-25 | High-low temperature test box |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116558803A (en) * | 2023-05-12 | 2023-08-08 | 江苏宝强钢结构有限公司 | Device capable of automatically detecting horizontal stress of steel structural member |
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2020
- 2020-05-25 CN CN202020898202.3U patent/CN212758649U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116558803A (en) * | 2023-05-12 | 2023-08-08 | 江苏宝强钢结构有限公司 | Device capable of automatically detecting horizontal stress of steel structural member |
| CN116558803B (en) * | 2023-05-12 | 2023-11-21 | 江苏宝强钢结构有限公司 | Device capable of automatically detecting horizontal stress of steel structural member |
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