CN212748921U - Fabric shrinkage analyzer - Google Patents
Fabric shrinkage analyzer Download PDFInfo
- Publication number
- CN212748921U CN212748921U CN202021583279.8U CN202021583279U CN212748921U CN 212748921 U CN212748921 U CN 212748921U CN 202021583279 U CN202021583279 U CN 202021583279U CN 212748921 U CN212748921 U CN 212748921U
- Authority
- CN
- China
- Prior art keywords
- signal
- sample
- fabric
- fabric shrinkage
- workbench
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Landscapes
- Treatment Of Fiber Materials (AREA)
Abstract
The utility model provides a pair of surface fabric shrinkage analysis appearance, including workstation, mark device, light emitting device, signal acquisition device and signal processing device. Compared with the prior art, the fabric shrinkage analyzer provided by the utility model can complete the whole process of fabric shrinkage detection by a single machine, including automatic marking, accurate identification and measurement, thereby greatly improving the manpower consumption of the test; the fabric shrinkage analyzer is designed by applying a positioning principle in a visible light indoor positioning technology, and is more accurate and direct in marking compared with a method adopting invisible ink or pigment; the optical signal is converted into an electric signal through the signal acquisition device, the signal processing device calculates the measured shrinkage through the electric signal to obtain the shrinkage structure with high precision and high speed; compared with manual measurement, the analysis precision and speed are greatly improved, the error rate is effectively reduced, the operation is simple and convenient, test data of multiple groups of samples can be quickly checked after the analysis is completed, and the user experience is improved.
Description
Technical Field
The utility model relates to a surface fabric detection area, concretely relates to surface fabric shrinkage analysis appearance.
Background
A wide variety of fabrics are affluent with ever changing markets, each with its unique characteristics. The analysis of the fabric comprises a plurality of important indexes, and the analysis data can accelerate the understanding of the characteristics and the microstructure of the fabric on the performance of the fabric. And the sample design is carried out according to the obtained data, so that market first opportunity is occupied, and the product competitiveness is improved.
In the quality detection of fabrics and clothes, the shrinkage is an important parameter, and the unqualified shrinkage can directly cause the unstable sizes, the unstable shapes and the unqualified quality of the fabrics and the clothes. In the production and processing of the fabric and the clothes, the fabric and the clothes can be in a tensioned state under certain stretching action in the transverse and longitudinal directions and have certain internal stress. When the fabric and the clothes are stimulated by external factors such as water, damp heat and the like, the fibers are converted from a temporary equilibrium state to a stable equilibrium state, the fibers stretch and contract in the process, the internal stress among the fibers disappears, the fibers stretch and contract transversely and longitudinally, and the stretching degree is the shrinkage rate. The shrinkage includes water shrinkage and ironing shrinkage, wherein the ironing shrinkage is divided into dry ironing shrinkage and wet ironing shrinkage.
The shrinkage of the fabric under different conditions is different in the testing method. When the existing fabric and clothes are used for washing and testing the shrinkage rate of dry and wet ironing, workers need to manually pick points and measure the same sample for multiple times, large errors can occur due to the difference of the testers during measurement, the accuracy of a detection result is seriously affected, the result of subsequent evaluation can generate serious errors, and the labor and time are wasted, so that the test efficiency is influenced.
The fabric shrinkage analysis is the early basic work of fabric design, and the accuracy and the high efficiency of data analysis directly influence whether the subsequent work can be smoothly carried out and the satisfaction degree of customers. The currently used analysis method is time-consuming and complex, low in analysis efficiency and low in accuracy, and influences user experience.
The visible light indoor positioning technology is an indoor positioning technology based on a visible light communication technology, has high positioning precision, generally comprises an LED point light source and a photoelectric detection device, generally realizes the positioning of the light source or the photoelectric detection device in the modes of Received Signal Strength (RSS), arrival Time (TOA) or time difference of arrival (TDOA) and the like in the positioning distance detection, and has good application prospect.
Disclosure of Invention
In order to solve above-mentioned fabrics and need detect washing, scald before the use and contract the shrinkage, need beat a series of manual works and click, the shrinkage analytical method who uses at present consumes time many and complicated, and the analysis efficiency is low, and the accuracy is lower, influences technical problem such as user experience, the utility model provides a surface fabric shrinkage analysis appearance.
The utility model provides a fabric shrinkage analyzer, which comprises a workbench, a marking device, a light emitting device, a signal acquisition device and a signal processing device;
the signal acquisition device is in signal connection with the signal processing device;
the workbench is made of transparent materials and used for placing a sample;
the marking device is positioned above the workbench and used for marking at least two test points on the sample to be tested placed on the workbench;
the light emitting device is positioned below the workbench and used for emitting light signals upwards;
the signal acquisition device is positioned above the workbench and used for detecting a light source and converting an optical signal into an electric signal;
and the signal processing device is used for calculating the sample shrinkage rate according to the electric signal of the signal acquisition device.
Further, still include connecting rod and slide rail, the connecting rod sets up on the workstation perpendicularly, and the slide rail sets up in the connecting rod top, signal acquisition device passes through slide rail and connecting rod sliding connection.
Further, the signal acquisition device comprises a light intensity sensor and/or a photosensitive sensor.
Further, the signal processing device comprises a second microcontroller and an MCU control system, wherein the second microcontroller is used for receiving the electric signal and generating position information according to the electric signal; and the MCU control system is used for processing the position information and calculating to obtain the reduction rate.
Further, the light emitting device comprises a first microcontroller and a light emitting element, wherein the first microcontroller is in signal connection with the light emitting element, the first microcontroller is used for controlling the frequency and/or the color of the light signal, and the light emitting element is used for emitting the light source according to the signal of the first microcontroller.
Furthermore, the marking device comprises a punching dotting device, and round hole-shaped test points with consistent shapes are formed on the sample to be tested through the punching dotting device.
And the fabric pretreatment module is used for carrying out one or more of humidifying, washing and drying on the sample to be tested.
Further, the fabric pretreatment module comprises a washing device and a steam ironing device, wherein the washing device is used for washing a sample to be tested; the steam ironing device is used for performing steam ironing treatment on the sample to be tested.
Furthermore, the device also comprises a sample fixer arranged on the workbench and used for fixing the sample to be tested.
And the scanning device is in signal connection with the signal processing device and is used for scanning one or more of the identification mark, the code, the model and the goods number on the sample to be detected.
According to the technical scheme, the beneficial effects of the utility model reside in that:
1. the utility model provides a surface fabric shrinkage ratio analysis appearance is designed to the location principle among the indoor location technique of application visible light, and the light signal of test point department has apparent difference with other positions, through receiving light signal strong and weak (RSS), arrival Time (TOA) or arrival Time Difference (TDOA) etc. mode realization test point's location, compares and adopts stealthy ink or pigment to mark more accurately, directly; the optical signal is converted into an electric signal through the signal acquisition device, the signal processing device calculates the measured shrinkage through the electric signal to obtain the shrinkage structure with high precision and high speed; compared with manual measurement, the precision and speed of analysis by the fabric shrinkage analyzer provided by the utility model are greatly improved, and the error rate is effectively reduced;
2. compared with the prior art, the utility model provides a surface fabric shrinkage analysis appearance, single machine can accomplish the detection overall process of surface fabric shrinkage, including automatic marking, accurate discernment and measurement, carry out test pretreatment such as washing or ironing, very big improvement test consumes the manpower;
3. the utility model provides a pair of surface fabric shrinkage ratio analysis appearance test analysis is fast, efficient, has effectively reduced the artifical error rate of typing, and easy and simple to handle, and the error is little, the degree of accuracy is high, a lot of measuring deviation is little, can look over the test data of multiunit sample fast after the analysis is accomplished, promotes user experience.
4. The utility model provides a pair of surface fabric shrinkage analysis appearance further still can include preceding processing module, can carry out one or more pretreatment in humidifying, washing, the drying to the sample that awaits measuring, and the process of whole surface fabric shrinkage analysis can be accomplished to a machine, and the tester need not make a round trip the operation between a plurality of test instruments, has saved whole analysis test time, improves work efficiency.
Drawings
Fig. 1 is a schematic view of a fabric shrinkage analyzer according to a first embodiment of the present invention;
fig. 2 is a schematic diagram of signal transmission of a fabric shrinkage analyzer according to a first embodiment of the present invention;
fig. 3 is a schematic view of a sample analysis of a fabric shrinkage analyzer according to a first embodiment of the present invention;
fig. 4 is a schematic view of a sample analysis of a fabric shrinkage analyzer according to a first embodiment of the present invention;
fig. 5 is a schematic view of a sample analysis of a fabric shrinkage analyzer according to a first embodiment of the present invention;
fig. 6 is a schematic view of a fabric shrinkage analyzer according to a second embodiment of the present invention;
fig. 7 is a schematic view of a fabric shrinkage analyzer in the third embodiment of the present invention.
Detailed Description
The principles and features of the present invention will be described with reference to the accompanying fig. 1-7, wherein the examples are provided for illustration purposes only and are not intended to limit the scope of the invention; the invention is described in more detail in the following paragraphs by way of example with reference to the accompanying drawings. The advantages and features of the present invention will become more fully apparent from the following description and appended claims. It should be noted that the drawings are in simplified form and are not to precise scale, and are provided for convenience and clarity in order to facilitate the description of the embodiments of the present invention.
Detailed description of the preferred embodiment
A fabric shrinkage analyzer is shown in figure 1 and comprises a workbench 1, a marking device 2, a light emitting device, a signal acquisition device 4, a signal processing device 5, a connecting rod 6, a slide rail 7 and a scanning device 8;
the workbench 1 is made of transparent materials and is used for flatly laying a sample to be tested;
the marking device 2 is positioned above the workbench 1 and used for marking at least two test points on a sample to be tested placed on the workbench 1; the marking device 2 comprises a punching dotting device, round hole-shaped test points with the same shape are formed on a sample to be tested through the punching dotting device, light emitted by the light emitting device can directly penetrate through the round hole-shaped test points, the signal collecting device 4 collects light signals, and the light signals at the test points are obviously different from other positions; when the marking device 2 is a punching and dotting device, the positioning can be carried out by utilizing a visible light positioning method, the positioning precision is high, the positioning of the test point is realized by receiving the light signal intensity (RSS), the arrival Time (TOA) or the time difference of arrival (TDOA) and the like, and the marking is more accurate and direct compared with the marking by adopting invisible ink or pigment;
the light emitting device is positioned below the workbench 1 and used for emitting light signals upwards; the light emitting device comprises a first microcontroller and a light emitting element 31, wherein the first microcontroller is in signal connection with the light emitting element 31, the first microcontroller is used for controlling the frequency and/or the color of a light signal, and the light emitting element 31 is used for emitting a light source according to the signal of the first microcontroller; the first microcontroller is an MSP430 single chip microcomputer, and the light-emitting element 31 is an LED lamp;
the signal acquisition device 4 is in signal connection with the signal processing device 5;
the signal acquisition device 4 is positioned above the workbench 1, the connecting rod 6 is vertically arranged on the workbench 1, the sliding rail 7 is arranged above the connecting rod 6, and the signal acquisition device 4 is in sliding connection with the connecting rod 6 through the sliding rail 7;
the signal acquisition device 4 comprises an illuminance sensor and/or a photosensitive sensor and is used for detecting a light source and converting an optical signal into an electric signal; the illuminance sensor can be a sensor with the model number of P0188 or an HA2003 illuminance sensor; the photosensitive sensor comprises one or more of a photoelectric tube, a photomultiplier, a photoresistor, a phototriode, a solar cell, an infrared sensor, an ultraviolet sensor, an optical fiber type photoelectric sensor, a color sensor, a CCD (charge coupled device) and a CMOS (complementary metal oxide semiconductor) image sensor; as shown in fig. 2, the photosensitive sensor can detect the light source and convert the light signal into an electrical signal, and the communication protocol I2C is used to implement the optical communication between the signal acquisition device 4 and the first microcontroller, and transmit the electrical signal to the signal processing device 5;
the signal processing device 5 is used for calculating the sample shrinkage rate according to the electric signal of the signal acquisition device 4, and comprises a second microcontroller and an MCU control system, wherein the second microcontroller is used for receiving the electric signal and generating position information according to the electric signal; the MCU control system is used for processing the position information and calculating to obtain the shrinkage; the second microcontroller may be an STM32 single chip microcomputer; the second microcontroller receives the electrical signal of the signal acquisition device 4, and calculates the distance between the illuminance sensor and/or the photosensitive sensor and each test point according to the electrical signal to obtain the location of each test point. The value of the electrical signal depends on the distance between the illuminance sensor and/or the photosensitive sensor and the test point transmitting the light with the corresponding frequency and/or color, as shown in fig. 3-5, the vertical distance (Aa = a') between the illuminance sensor and/or the photosensitive sensor and the workbench is fixed, the electrical signal value of the test point B, C, D, E is related to the distances AB, AC, AD, AE, so that the distance between the test points can be calculated according to the electrical signal values, the sample before washing (as shown in fig. 3) and the sample after washing (as shown in fig. 4) are respectively tested, and the MCU control system calculates the shrinkage rate according to the difference of the distances between the test points of the sample before washing and the sample after washing; meanwhile, as shown in fig. 5, the signal acquisition device 4 can slide to different positions on the slide rail 7 to measure multiple groups of data, so that the test accuracy is improved.
The scanning device 8 is used for scanning one or more of identification marks, codes, models and goods numbers on the sample to be detected; after scanning the identification mark, the code, the model or the goods number on the sample to be detected, the scanning device 8 sends a signal to the signal processing device 5, and the signal processing device 5 matches the identification mark, the code, the model or the goods number with the reduction rate calculation result; a display can be further included to display the calculation result and information of the signal processing device 5; after the scanning device 8 scans the identification mark, the code, the model or the goods number on the sample to be detected, the display can display the identification mark, the code, the model, the goods number corresponding to the sample to be detected and the shrinkage rate information corresponding to the sample to be detected.
Detailed description of the invention
A fabric shrinkage analyzer is disclosed, as shown in fig. 6, and further comprises a sample holder 9 arranged on a workbench on the basis of the first embodiment; the sample fixer 9 is used for fixing the sample to be tested, and prevents the sample from moving in the test process to cause test errors.
Detailed description of the preferred embodiment
As shown in fig. 7, the fabric shrinkage analyzer further includes a fabric pretreatment module 10 on the basis of the second embodiment, for performing one or more pretreatments including humidity conditioning, washing and drying on a sample to be tested; specifically, the fabric pretreatment module comprises a washing device and a steam ironing device; the washing device is used for washing the sample to be detected; the steam ironing device is used for performing steam ironing treatment on the sample to be tested.
It should be noted that the above embodiments are only preferred solutions for clearly explaining the present invention, and the modifications and additions which are not inventive and made by those skilled in the art on the basis of the present invention should fall within the protection scope of the present invention.
Claims (10)
1. A fabric shrinkage analyzer is characterized in that: comprises a workbench, a marking device, a light emitting device, a signal acquisition device and a signal processing device;
the signal acquisition device is in signal connection with the signal processing device;
the workbench is made of transparent materials and used for placing a sample;
the marking device is positioned above the workbench and used for marking at least two test points on the sample to be tested placed on the workbench;
the light emitting device is positioned below the workbench and used for emitting light signals upwards;
the signal acquisition device is positioned above the workbench and used for detecting a light source and converting an optical signal into an electric signal;
and the signal processing device is used for calculating the sample shrinkage rate according to the electric signal of the signal acquisition device.
2. A fabric shrinkage analyzer according to claim 1, wherein: still include connecting rod and slide rail, the connecting rod sets up perpendicularly on the workstation, and the slide rail sets up in the connecting rod top, signal acquisition device passes through slide rail and connecting rod sliding connection.
3. A fabric shrinkage analyzer according to claim 1, wherein: the signal acquisition device comprises a light intensity sensor and/or a photosensitive sensor.
4. A fabric shrinkage analyzer according to claim 1, wherein: the signal processing device comprises a second microcontroller and an MCU control system, wherein the second microcontroller is used for receiving the electric signal and generating position information according to the electric signal; and the MCU control system is used for processing the position information and calculating to obtain the reduction rate.
5. A fabric shrinkage analyzer according to claim 1, wherein: the light emitting device comprises a first microcontroller and a light emitting element, wherein the first microcontroller is in signal connection with the light emitting element, the first microcontroller is used for controlling the frequency and/or the color of a light signal, and the light emitting element is used for emitting a light source according to the signal of the first microcontroller.
6. A fabric shrinkage analyzer according to claim 1, wherein: the marking device comprises a punching dotting device, and round hole-shaped test points with the same shape are formed on the sample to be tested through the punching dotting device.
7. A fabric shrinkage analyzer according to any one of claims 1 to 6, wherein: the device also comprises a fabric pretreatment module which is used for carrying out one or more of the pretreatment of humidifying, washing and drying on the sample to be tested.
8. A fabric shrinkage analyzer according to claim 1, wherein: the fabric pretreatment module comprises a washing device and a steam ironing device, wherein the washing device is used for washing a sample to be tested; the steam ironing device is used for performing steam ironing treatment on the sample to be tested.
9. A fabric shrinkage analyzer according to any one of claims 1 to 6, wherein: the test sample fixing device is arranged on the workbench and used for fixing the test sample to be tested.
10. A fabric shrinkage analyzer according to any one of claims 1 to 6, wherein: the device comprises a scanning device, wherein the scanning device is in signal connection with the signal processing device and is used for scanning one or more of identification marks, codes, models and goods numbers on a sample to be detected.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021583279.8U CN212748921U (en) | 2020-08-03 | 2020-08-03 | Fabric shrinkage analyzer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021583279.8U CN212748921U (en) | 2020-08-03 | 2020-08-03 | Fabric shrinkage analyzer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN212748921U true CN212748921U (en) | 2021-03-19 |
Family
ID=74986236
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202021583279.8U Active CN212748921U (en) | 2020-08-03 | 2020-08-03 | Fabric shrinkage analyzer |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN212748921U (en) |
-
2020
- 2020-08-03 CN CN202021583279.8U patent/CN212748921U/en active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN102243069B (en) | Method and device for determining leaf area index | |
| CN106979948B (en) | Handheld portable fabric density detection system | |
| CN104931454A (en) | Method for rapidly determining Lycra fiber content of textiles using near infrared spectroscopic analysis | |
| CN105606424A (en) | Standard sample for grading color fastness to perspiration of cotton cloth and preparation method thereof | |
| CN110672019A (en) | Full-automatic MSA measuring tool for laser online thickness gauge and detection method thereof | |
| CN212748921U (en) | Fabric shrinkage analyzer | |
| CN108344859B (en) | Online detection method for circulating friction fabric surface hairiness | |
| CN106226314B (en) | Yarn evenness measurement method based on yarn cross section perimeter | |
| CN110231328A (en) | A kind of Raman spectrum quantitative analysis tech based on half peak height Furthest Neighbor | |
| CN203011847U (en) | Micropore rapidly-detecting device based on luminous flux | |
| CN114371372A (en) | Method and device for evaluating aging state of silicone rubber composite insulator | |
| CN101929843A (en) | Device and method for automatically measuring spike length of rice | |
| CN108508012A (en) | A kind of textile visual style measuring device and method | |
| CN202033293U (en) | Chloramphenicol concentration quantitative detection device based on test strip | |
| CN103776528A (en) | Wireless transmission system used for synchronous measurement of illuminance of fishing gathering lamp | |
| CN110274851A (en) | A kind of textile material anisotropy characterizing method and measuring device | |
| CN212845040U (en) | Multi-wavelength colorimetric module with light convergence function | |
| CN208505573U (en) | A kind of LED magnitude tracing light parameter and standard aging monitoring device | |
| CN109444150A (en) | Contactless crackle measurement method and its device | |
| CN208314857U (en) | Artificial intelligence pattern recognition device towards the online position detection of photovoltaic cell | |
| CN210375198U (en) | Soil environment detector | |
| CN209570661U (en) | A kind of PN junction device impurity concentration/concentration gradient automatic measurement system | |
| CN203981586U (en) | A kind of bifurcation fiber device for fluoroscopic examination | |
| CN113869112A (en) | Instrument automatic reading method and device based on machine vision | |
| CN86205111U (en) | Fabric surface deformeter |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |