CN212681740U - Semiconductor test sorting machine blocking mechanism - Google Patents

Semiconductor test sorting machine blocking mechanism Download PDF

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Publication number
CN212681740U
CN212681740U CN202021230145.8U CN202021230145U CN212681740U CN 212681740 U CN212681740 U CN 212681740U CN 202021230145 U CN202021230145 U CN 202021230145U CN 212681740 U CN212681740 U CN 212681740U
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China
Prior art keywords
fixed
organism
delivery track
semiconductor test
type delivery
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CN202021230145.8U
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Chinese (zh)
Inventor
候士保
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Wuxi Ming Xiang Electronics Co ltd
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Wuxi Ming Xiang Electronics Co ltd
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Priority to CN202021230145.8U priority Critical patent/CN212681740U/en
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Abstract

The utility model belongs to the technical field of semiconductor test sorting facilities, especially, be a semiconductor test sorter barrier mechanism, select separately the organism including vibration dish material loading organism, U type delivery track and test, U type delivery track's both ends are connected with the discharge gate of vibration dish material loading organism and the feed inlet of test sorting organism respectively, U type delivery track is provided with the backup pad near the one end below of test sorting organism, the top symmetry of backup pad is fixed with four spliced poles, the top of spliced pole all with U type delivery track's bottom fixed connection, the top symmetry of backup pad is fixed with the mounting panel. The utility model discloses a cooperation of mounting panel, bull stick, driven gear, disc, motor, driving gear, chain, connecting rod, slide bar and diaphragm, when the motor rotates, can control baffle up-and-down motion to can realize releasing semiconductor components and parts in proper order, and the structure is comparatively simple, and manufacturing cost is lower.

Description

Semiconductor test sorting machine blocking mechanism
Technical Field
The utility model relates to a semiconductor test sorting facilities technical field specifically is a semiconductor test sorter barrier mechanism.
Background
The semiconductor refers to a material with electric conductivity between a conductor and an insulator at normal temperature, and is applied to the fields of integrated circuits, consumer electronics, communication systems, photovoltaic power generation, illumination, high-power conversion and the like.
After the semiconductor components and parts processing production is accomplished, need test it, whether it is qualified to the inspection, generally all carry semiconductor components and parts to the test sorting machine through vibration dish material loading machine and delivery track, test and select separately to semiconductor components and parts in order to realize in proper order, can set up blocking mechanism in the delivery track usually, set up a baffle that can reciprocate promptly, come this to control semiconductor components and parts and enter into in proper order the test sorting machine in, present blocking mechanism structure is comparatively complicated, manufacturing cost is higher, therefore we have proposed a semiconductor test sorting machine blocking mechanism and have solved above-mentioned problem.
SUMMERY OF THE UTILITY MODEL
Technical problem to be solved
Not enough to prior art, the utility model provides a semiconductor test sorter barrier mechanism has solved the problem that proposes in the above-mentioned background art.
(II) technical scheme
In order to achieve the above object, the utility model provides a following technical scheme: a semiconductor test separator blocking mechanism comprises a vibrating disk feeding machine body, a U-shaped conveying track and a test separator body, wherein two ends of the U-shaped conveying track are respectively connected with a discharge port of the vibrating disk feeding machine body and a feed port of the test separator body, a supporting plate is arranged below one end, close to the test separator body, of the U-shaped conveying track, four connecting columns are symmetrically fixed at the top of the supporting plate, the tops of the connecting columns are fixedly connected with the bottom of the U-shaped conveying track, a supporting plate is symmetrically fixed at the top of the supporting plate, a rotating rod is rotatably connected to one side wall of the supporting plate through a bearing, a driven gear is fixed at one end of the rotating rod, a disk is fixed at the other end of the rotating rod, a motor is fixed at the top of the supporting plate, a driving gear is fixed at an output shaft of the motor, a chain is arranged above the supporting plate, the driving gear is in transmission connection with the two driven gears through a chain, one side wall of the disc is connected with a connecting rod through a pin shaft in a rotating mode, a baffle is arranged inside the U-shaped conveying track, a top plate is fixed to the top of the baffle, sliding rods are symmetrically fixed to the bottom of the top plate, transverse plates are fixed to two side walls of the U-shaped conveying track, the bottom ends of the sliding rods respectively penetrate through the bottoms of the corresponding transverse plates in a sliding mode, and the top end of the connecting rod is connected with the bottoms of the corresponding sliding rods through the pin shaft in a rotating mode.
As an optimal technical scheme of the utility model, the slide opening has all been seted up at the top of diaphragm, the slide bar runs through the slide opening.
As an optimized technical scheme of the utility model, the bottom of baffle is fixed with the rubber pad.
As an optimized technical scheme of the utility model, U type delivery track's material is the stainless steel.
(III) advantageous effects
Compared with the prior art, the utility model provides a semiconductor test sorter barrier mechanism possesses following beneficial effect:
this semiconductor test sorter barrier mechanism, through the cooperation of mounting panel, bull stick, driven gear, disc, motor, driving gear, chain, connecting rod, slide bar and diaphragm, when the motor rotates, can control the baffle up-and-down motion to can realize releasing semiconductor components and parts in proper order, and the structure is comparatively simple, and manufacturing cost is lower.
Drawings
FIG. 1 is a schematic view of the overall structure of the present invention;
FIG. 2 is a schematic view of a three-dimensional structure of a U-shaped conveying rail of the present invention near a testing and sorting machine body;
FIG. 3 is a schematic view of the front structure of the U-shaped conveying rail of the present invention near one end of the testing and sorting machine body;
fig. 4 is the schematic view of the structure of one end side of the U-shaped conveying track near the testing separator body.
In the figure: 1. vibrating a tray feeding machine body; 2. a U-shaped conveying track; 3. testing the sorting machine body; 4. a support plate; 5. connecting columns; 6. a mounting plate; 7. a rotating rod; 8. a driven gear; 9. a disc; 10. a motor; 11. a driving gear; 12. a chain; 13. a connecting rod; 14. a baffle plate; 15. a top plate; 16. a slide bar; 17. a transverse plate; 18. a slide hole; 19. and (7) a rubber pad.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
Examples
Referring to fig. 1-4, the present invention provides the following technical solutions: a semiconductor test separator blocking mechanism comprises a vibrating disk feeding machine body 1, a U-shaped conveying rail 2 and a test separator body 3, wherein two ends of the U-shaped conveying rail 2 are respectively connected with a discharge hole of the vibrating disk feeding machine body 1 and a feed hole of the test separator body 3, a support plate 4 is arranged below one end, close to the test separator body 3, of the U-shaped conveying rail 2, four connecting columns 5 are symmetrically fixed to the top of the support plate 4, the tops of the connecting columns 5 are fixedly connected with the bottom of the U-shaped conveying rail 2, a support plate 6 is symmetrically fixed to the top of the support plate 4, a rotating rod 7 is rotatably connected to one side wall of the support plate 6 through a bearing, a driven gear 8 is fixed to one end of the rotating rod 7, a disc 9 is fixed to the other end of the rotating rod 7, a motor 10 is fixed to the top of the support plate 4, a driving gear 11 is fixed to an output shaft of the motor 10, the driving gear 11 is in transmission connection with the two driven gears 8 through a chain 12, one side wall of the disc 9 is rotatably connected with a connecting rod 13 through a pin shaft, a baffle 14 is arranged inside the U-shaped conveying track 2, a top plate 15 is fixed at the top of the baffle 14, slide rods 16 are symmetrically fixed at the bottom of the top plate 15, transverse plates 17 are fixed on two side walls of the U-shaped conveying track 2, the bottom ends of the slide rods 16 respectively slide through the bottoms of the corresponding transverse plates 17, and the top ends of the connecting rods 13 are respectively rotatably connected with the bottoms of the corresponding slide rods 16 through pin shafts.
In this embodiment, through the cooperation of mounting panel 6, bull stick 7, driven gear 8, disc 9, motor 10, driving gear 11, chain 12, connecting rod 13, slide bar 16 and diaphragm 17, when motor 10 rotated, can control baffle 14 up-and-down motion to can realize releasing semiconductor components and parts in proper order, and the structure is comparatively simple, and manufacturing cost is lower.
Specifically, the top of the transverse plate 17 is provided with a slide hole 18, and the slide rod 16 penetrates through the slide hole 18.
In this embodiment, the top of the horizontal plate 17 is provided with a slide hole 18 so that the slide rod 16 can smoothly pass through the horizontal plate 17.
Specifically, a rubber pad 19 is fixed to the bottom of the baffle plate 14.
In this embodiment, by fixing the rubber pad 19 to the bottom of the baffle plate 14, the U-shaped conveying rail 2 can be prevented from being damaged when the baffle plate 14 moves downward.
Specifically, the U-shaped conveying rail 2 is made of stainless steel.
In this embodiment, the U-shaped conveying rail 2 is made of stainless steel, which has high structural strength and is not easy to rust, so that it is durable.
The utility model discloses a theory of operation and use flow: the motor 10 rotates to drive the driving gear 11 to rotate, the driving gear 11 can drive the two driven gears 8 to rotate through the chain 12, the driven gears 8 can drive the corresponding rotating rods 7 to rotate, so that the two disks 9 can be driven to rotate, the disks 9 can drive the corresponding connecting rods 13 to move, the connecting rods 13 can drive the corresponding sliding rods 16 to move up and down, the two sliding rods 16 can drive the top plate 15 to move up and down, so that the baffle 14 can be controlled to move up and down, and the semiconductor component can be sequentially released.
Finally, it should be noted that: although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that modifications may be made to the embodiments described in the foregoing embodiments, or equivalents may be substituted for elements thereof. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims (4)

1. The utility model provides a semiconductor test sorter barrier mechanism, includes vibration dish material loading organism (1), U type delivery track (2) and test sorter organism (3), its characterized in that: the two ends of the U-shaped conveying track (2) are respectively connected with a discharge port of the vibrating disc feeding machine body (1) and a feed inlet of the testing and sorting machine body (3), a supporting plate (4) is arranged below one end, close to the testing and sorting machine body (3), of the U-shaped conveying track (2), four connecting columns (5) are symmetrically fixed to the top of the supporting plate (4), the tops of the connecting columns (5) are fixedly connected with the bottom of the U-shaped conveying track (2), support plates (6) are symmetrically fixed to the top of the supporting plate (4), one side wall of each support plate (6) is rotatably connected with a rotating rod (7) through a bearing, one end of each rotating rod (7) is fixedly provided with a driven gear (8), the other end of each rotating rod (7) is fixedly provided with a disc (9), the top of the supporting plate (4) is fixedly provided with a motor (10), and an output shaft of the motor (10) is fixedly provided with a driving, the top of backup pad (4) is provided with chain (12), driving gear (11) are connected with two driven gear (8) transmissions through chain (12), a lateral wall of disc (9) all is connected with connecting rod (13) through the round pin axle rotation, the inside of U type delivery track (2) is provided with baffle (14), the top of baffle (14) is fixed with roof (15), the bottom symmetry of roof (15) is fixed with slide bar (16), the both sides wall of U type delivery track (2) all is fixed with diaphragm (17), the bottom of slide bar (16) slides respectively and passes the bottom of corresponding diaphragm (17), the top of connecting rod (13) all rotates with the bottom of corresponding slide bar (16) respectively through the round pin axle and is connected.
2. The semiconductor test handler of claim 1, wherein: slide holes (18) are formed in the tops of the transverse plates (17), and the slide rods (16) penetrate through the slide holes (18).
3. The semiconductor test handler of claim 1, wherein: and a rubber pad (19) is fixed at the bottom of the baffle plate (14).
4. The semiconductor test handler of claim 1, wherein: the U-shaped conveying track (2) is made of stainless steel.
CN202021230145.8U 2020-06-29 2020-06-29 Semiconductor test sorting machine blocking mechanism Active CN212681740U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202021230145.8U CN212681740U (en) 2020-06-29 2020-06-29 Semiconductor test sorting machine blocking mechanism

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202021230145.8U CN212681740U (en) 2020-06-29 2020-06-29 Semiconductor test sorting machine blocking mechanism

Publications (1)

Publication Number Publication Date
CN212681740U true CN212681740U (en) 2021-03-12

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113909130A (en) * 2021-10-09 2022-01-11 怀化海红盛电子科技有限公司 Electronic component production is with detection device that dispatches from factory

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113909130A (en) * 2021-10-09 2022-01-11 怀化海红盛电子科技有限公司 Electronic component production is with detection device that dispatches from factory
CN113909130B (en) * 2021-10-09 2024-03-08 怀化海红盛电子科技有限公司 Factory detection device for electronic component production

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