CN212572522U - Signal source and test system - Google Patents
Signal source and test system Download PDFInfo
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- CN212572522U CN212572522U CN202021152518.4U CN202021152518U CN212572522U CN 212572522 U CN212572522 U CN 212572522U CN 202021152518 U CN202021152518 U CN 202021152518U CN 212572522 U CN212572522 U CN 212572522U
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Abstract
The embodiment of the application describes a signal source and a test system, and the signal source comprises: the control signal receiving device, the signal transmitting chip and the transmission device are arranged on the printed circuit board and are sequentially connected; the control signal receiving device is used for receiving an external control signal, the signal transmitting chip is used for selecting at least part of transmitting channels to output millimeter wave signals of a first preset frequency band according to the control signal, and the transmission device is used for outputting the millimeter wave signals. The signal source provided by the embodiment of the application has the advantages of low cost, small size, easiness in repeated use and portability.
Description
Technical Field
The embodiment of the application relates to the technical field of electronic measuring instruments, in particular to a signal source and a testing system.
Background
The signal source can be used for providing signals of corresponding frequency bands and waveforms to a tested circuit or device, and comprises a low-frequency signal source, a radio-frequency signal source, a video signal source, a microwave signal source, a millimeter wave signal source and the like. In order to meet the requirements of different scenes, a conventional signal source generally needs to provide signals with various waveforms, and the bandwidth is large (such as the bandwidth of dozens of G or even hundreds of G), so that the number of components constituting the signal source is large, and the requirements on the components are high, thereby not only causing the signal source to have a large size and a high price, but also causing a large implementation difficulty.
However, in practical applications, users generally only use a specific waveform or waveforms and signals within a very small frequency range (for example, bandwidth is several G, and several hundreds or tens of megabytes are set), and further, compared with the actual requirements of users, the conventional signal source not only has inconvenience in operation due to large size, but also has high cost, which causes high test cost for users, and also causes waste of many resources.
SUMMERY OF THE UTILITY MODEL
The embodiment of the application provides a signal source and a test system, which have the advantages of low cost, small size, easiness in repeated use and portability.
An embodiment of the present application provides a signal source, which may include:
a printed circuit board, and
the control signal receiving device, the signal transmitting chip and the transmission device are arranged on the printed circuit board and are sequentially connected;
the control signal receiving device can be used for receiving an external control signal, the signal transmitting chip can be used for selecting at least part of transmitting channels according to the control signal to output millimeter wave signals of a first preset frequency band, and the transmission device is used for outputting the millimeter wave signals.
The signal source in this application embodiment, owing to utilize the signal transmission chip to provide the millimeter wave signal of predetermineeing the frequency channel, not only the design degree of difficulty is low, and the size of device is little, easily operation, compares in traditional several hundred thousand's signal source simultaneously, and the signal source in this application embodiment only needs about the thousand yuan, and the price advantage is obvious.
Meanwhile, because the waveform and bandwidth of the signal provided by the signal transmitting chip are smaller than those of a conventional signal source, for example, a conventional millimeter wave signal source can provide signals such as triangular waves, square waves and frequency modulated continuous waves of 30GHz-300GHz, while the millimeter signal transmitting chip can provide only signals in the frequency bands of 60GHz-64GHz or 76GHz-81GHz, and the waveform of the provided signal is only an FMCW wave or a triangular wave. In practical production applications, products of general enterprises (especially small and medium-sized enterprises) only need to test signals with specific frequency bands and waveforms, such as millimeter wave radar chips, and when the products generally need to test FMCW waves with 77GHz frequency bands, compared with the traditional millimeter wave signal source, the signal source in the embodiment of the present application is selected with strong pertinence, and waste of product functions and frequency resources is not caused. Similarly, the signal source in the embodiment of the present application may also be applied to a test scenario for a communication or sensor chip such as a millimeter wave communication chip (e.g., 5G communication).
In addition, in this application embodiment, through the external control signal that control signal receiving arrangement received, select the suitable transmission channel of signal transmission chip to and the millimeter wave signal of corresponding frequency channel, the frequency channel of transmission channel and signal all is adjustable promptly, thereby makes same signal transmission chip can provide corresponding signal to different application scenarios, and then effectively promotes the scope and the flexibility that the signal source was suitable for.
Optionally, the transmission device may include:
the waveguide structure is connected with the signal transmitting chip and is detachably arranged on the printed circuit board; and
the waveguide connecting seat is arranged on the printed circuit board so as to adapt to different application scenes or test devices by replacing the waveguide structure when different signal transmitting chips share the same waveguide connecting seat;
the waveguide structure outputs the millimeter wave signal of the first preset frequency band to an external device through the waveguide connecting seat.
Optionally, the signal source may further include:
the storage device is arranged on one side of the printed circuit board, which is far away from the signal transmitting chip;
the storage device is connected with the signal transmitting chip and can be used for storing firmware data (such as firmware) of the signal transmitting chip, and the firmware data can be used for regulating and controlling functions, working states and the like which can be realized by the signal transmitting chip.
Optionally, the signal source may further include:
and the shielding cover is covered on the signal transmitting chip and used for shielding the leakage signal of the signal transmitting chip so as to prevent the leakage signal from forming an interference signal in a test environment and further improve the test accuracy. Meanwhile, the shielding case can shield the interference of the antenna feeder line, the interference of the outside to the signal transmitting chip and the like.
Optionally, the signal source may further include:
and the power supply device is connected with the signal transmitting chip and is used for providing working electric energy for the signal transmitting chip. The power supply device can be various types of power supplies, and in an optional embodiment, the power supply device can be a USB power supply device, namely, the signal transmitting chip can be powered by using a USB interface on a computer, so that the convenience of controlling a signal source in the embodiment of the application to test by using the computer by an operator is improved.
In another optional embodiment, the power supply device further includes an electric energy conversion unit, which is configured to convert the received external power into a plurality of branches with different electrical parameters, so as to provide corresponding electric energy to each electric energy input interface of the signal transmitting chip. For example, the power conversion unit may convert a 5V electrical signal received through the USB into 3.3V, 1.8V, and/or 1.5V branches.
Optionally, the signal source may further include:
a housing having an accommodating chamber;
wherein the printed circuit board is placed in the accommodating cavity. The shell has certain functions of heat dissipation and signal shielding while accommodating and protecting the printed circuit board and devices arranged on the printed circuit board, so that the working stability of a signal source is improved, and a high-quality test environment is provided.
Optionally, the bandwidth of the first preset frequency band is less than or equal to 5G. For example, 5G, 2G, 500M, 200M, 100M, or 50M, etc.
Optionally, the first preset frequency band may be a high frequency signal frequency band such as 24GHz, 60GHz, or 70 GHz. For example, the first predetermined frequency band may be in a range of [60GHz,64GHz ] or [76GHz,81GHz ].
In a second aspect, an embodiment of the present application further provides a signal source, which can be applied to perform a performance test on a device to be tested, where the signal source includes:
the signal transmitting chip is used for providing a test signal of a preset frequency band; and
and the waveguide device is used for outputting the test signal so as to test the performance of the device to be tested.
The embodiment of the application can effectively reduce the size of the signal source by providing the chip-level signal source, is convenient to operate and carry, and simultaneously, because the price of the signal transmitting chip is economic, the price of the signal source can be greatly reduced, the popularization and the application are convenient, and the cost of device testing is reduced.
Optionally, the bandwidth of the preset frequency band is less than or equal to 10G. For example, 10G, 8G, 4G, 1G, 800M, 400M, 800M, or 40M, etc.
Optionally, the device to be tested is a signal transceiver, and the frequency band of the test signal is matched with the frequency band of the signal that can be received by the signal transceiver.
Optionally, the device to be tested and the signal transmitting chip are the same chip, the same type of chip or chips capable of realizing the same function;
the signal transmitting chip is a chip which is tested and verified, and the device to be tested is a chip which is not tested and verified. The new signal source is formed by using the chips after test verification, so that various performances and scenes of subsequent chips to be tested and verified are tested, and compared with the traditional signal source, the testing method can save the process of debugging the signal source, greatly reduce the testing cost and effectively improve the testing efficiency and precision. For example, a conventional signal source or other signal sources formed on the basis of a chip may be leased for test verification, and then a new signal source is constructed by using the chip that passes the test verification, and the subsequent chip to be tested is tested by using the new signal source.
Optionally, the signal source may further include:
the signal transmitting chip and the waveguide device are arranged on the bearing plate; and
and the shielding cover is covered on the signal transmitting chip and fixed on the bearing plate and used for shielding signals leaked by the signal transmitting chip and shielding the interference of an antenna feeder line, the interference of the outside to the signal transmitting chip and the like so as to improve the quality of a testing environment.
In a third aspect, an embodiment of the present application further provides a test system, where the test system may include:
a sensor device to be tested; and
the signal source for testing provides a test signal for testing the sensor device to be tested;
the signal source for each test is the signal source in any one of the embodiments of the present application.
Due to the adoption of the chip-level signal source, when the test system provided by the embodiment of the application is utilized to test scenes and functions of signal emission, signal reception and/or signal processing and the like of the sensor device to be tested (such as a sensor chip, a communication chip/device and the like), the test cost can be effectively reduced, and the flexibility of test operation, the precision of a test result and the like can be improved.
Optionally, the at least one signal source for testing includes a first signal source, and the testing system further includes:
the first analog signal sampler is connected with the intermediate frequency signal output end of the to-be-detected sensing device;
and the signal receiving end of the sensor device to be tested is connected with the first signal source and can be used for receiving the test signal. The first signal source generates a test signal, the sensor device to be tested directly receives the test signal through a medium such as a waveguide and the like, the test signal is processed to output an intermediate frequency signal, the intermediate frequency signal is sampled by the first analog signal sampler, and then the intermediate frequency signal is analyzed and processed according to the sampled signal, so that the functional tests of signal receiving, signal processing and the like of the sensor device to be tested are realized.
Optionally, the test system may further include:
the first signal source is connected to a signal receiving end of the sensor device to be detected through the first attenuator;
the first attenuator can be used for adjusting the power of the test signal to be matched with the signal receiving parameter of the sensor device to be tested, so that the power of the test signal output by the first signal source is prevented from being larger than the rated signal receiving power of the sensor device to be tested.
Optionally, the at least one signal source for testing includes a second signal source, and the testing system may further include:
a mixer having two signal inputs and a signal output; and
the second analog signal sampler is connected with the signal output end of the mixer and is used for sampling the mixed signal output by the mixer;
the radio frequency signal output end of the to-be-tested sensing device and the signal output end of the second signal source are respectively connected with one signal input end of the frequency mixer, the radio frequency signal output by the to-be-tested sensing device is subjected to frequency reduction processing by using a signal generated by the second signal source as a reference signal, the frequency-reduced signal is sampled by using a second analog signal sampler subsequently, and the signal is analyzed and processed according to the sampled signal, so that the signal transmitted by the to-be-tested sensing device is tested.
Optionally, the test system may further include:
a second attenuator, a signal output terminal of the second signal source being connected to a signal input terminal of the mixer through the second attenuator;
the signal output end of the mixer is connected with the second analog signal sampler through the amplifier; and
a low noise amplifier and a third attenuator;
and the radio frequency signal output end of the to-be-detected sensing device is connected to the other signal input end of the frequency mixer through the low-noise amplifier and the third attenuator in sequence.
Optionally, the at least one signal source for testing includes a third signal source, and the testing system further includes:
the first connecting port, the connecting cable, the second connecting port and the fourth attenuator are connected in sequence;
the signal receiving end of the sensor device to be tested is connected with the first connection port, and the third signal source is connected with the fourth attenuator. This scenario can be used to simulate the performance of the receive channel to receive the echo signal.
Optionally, each signal source of the at least one signal source for testing is the same sensor chip with adjustable output signal.
Optionally, the test system may further include:
the power detector is provided with a signal input end and a signal output end, and the signal input end of the power detector is connected with the signal output end of the to-be-detected sensing device; and
and the measuring unit (such as an ATE (automatic test equipment) detection device and the like) is connected with the signal output end of the power detector and is used for measuring the voltage signal and the current signal output by the power detector so as to obtain parameters (such as power and the like) of the output signal of the sensor device to be measured.
Optionally, among the signal sources mentioned in the present application, and/or between a signal source and a sensor device to be tested, the signal sources may be chips of the same type, chips of the same model, or chips capable of implementing the same function, and based on a signal source constituted by chips of the same model, parameters such as frequency (within a preset frequency band), power, and waveform of a transmission signal may be adjusted by using a control signal to adapt to different test scenarios, and different test scenarios may also be implemented based on the same signal source.
According to the signal source and the test system provided by the embodiment of the application, the signal transmitting chip can transmit the millimeter wave signal of the characteristic frequency band based on the control signal, so that the actual requirements of users are met, the waste of resources is avoided, and meanwhile, the requirements of different scenes are not taken into consideration, so that the size of the signal source is reduced; in addition, the signal source provided by the embodiment can also rapidly realize the replacement of the signal transmitting chip according to the requirements, thereby adapting to the requirements of signal sources in different frequency band ranges.
Drawings
Fig. 1 is a schematic structural diagram of a signal source according to an embodiment of the present application;
fig. 2 is a schematic structural diagram of another signal source provided in an embodiment of the present application;
fig. 3 is a schematic structural diagram of another signal source provided in an embodiment of the present application;
fig. 4 is a schematic structural diagram of another signal source provided in an embodiment of the present application;
FIG. 5 is a schematic structural diagram of a test system according to an embodiment of the present disclosure;
fig. 6 is a schematic structural diagram of another test system provided in the embodiment of the present application.
Detailed Description
The present application will be described in further detail with reference to the following drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the application and are not limiting of the application. It should be further noted that, for the convenience of description, only some of the structures related to the present application are shown in the drawings, not all of the structures.
Fig. 1 is a schematic structural diagram of a signal source provided in an embodiment of the present application, and as shown in fig. 1, a signal source 100 provided in an embodiment of the present application may include: the device comprises a printed circuit board 10, and a control signal receiving device 20, a signal transmitting chip 30, a transmission device 40 and other devices which are arranged on the printed circuit board 10 and are connected in sequence; the control signal receiving device 20 may be configured to receive an external control signal, the signal transmitting chip 30 may be configured to select at least a portion of the transmitting channels according to the control signal to output a millimeter wave signal in a first preset frequency band (for example, a signal in a 24GHz frequency band, a signal in a 60GHz frequency band, or a signal in a 77GHz frequency band), and the transmitting device 40 may be configured to output the millimeter wave signal.
In an alternative embodiment, as shown in fig. 1, the control signal receiving device 20 may be, for example, a Serial Peripheral Interface (SPI). The external control device, for example, a computer or other device capable of implementing control, controls the signal transmitting chip 30 to select at least a portion of the transmitting channels through the SPI interface to output the millimeter wave signals in the first preset frequency band. The signal transmitting chip 30 may transmit a millimeter wave signal in a second preset frequency band, where the first preset frequency band is within the second preset frequency band; the first predetermined frequency band may be, for example, 74 to 74.6GHz, 79.2 to 79.4GHz or 83.6 to 84 GHz.
Illustratively, the first predetermined frequency bands emitted by the signal emitting chips 30 of different series are different, for example, the signal emitting chip 30 includes an ALPS series chip or a Rhine series chip, and if the signal emitting chip 30 is an ALPS chip, it is a 77G source, and if the signal emitting chip 30 is a Rhine chip, it is a 60G source, and those skilled in the art can understand that the signal emitting chip 30 is not limited to an ALPS chip or a Rhine chip, and may also use other frequency chips as the emitting, that is, different signal emitting chips 30 may be used to generate different emitting sources.
Alternatively, as shown in fig. 1, the signal transmitting chip 30 is integrated on the printed circuit board 10, and accordingly, other structures electrically connected to the signal transmitting chip 30, for example, the transmission device 40, can be adaptively adjusted according to the requirements and requirements. In different application scenarios, signals of corresponding frequencies can be provided by integrating different signal transmitting chips 30.
Optionally, as shown in fig. 1, the external control device controls the signal transmitting chip 30 to generate the millimeter wave signal of the first preset frequency band, which may specifically be implemented by debugging an internal register of the signal transmitting chip 30 to generate the millimeter wave signal of the first preset frequency band.
It should be noted that the size of the printed circuit board 10 is not specifically limited in this embodiment, as long as the control signal receiving device 20, the signal transmitting chip 30 and the transmitting device 40 can be disposed on the printed circuit board 10, and can achieve their corresponding functions; the position of the control signal receiving device 20, the signal transmitting chip 30 and the transmitting device 40 on the printed circuit board 10 is not specifically limited in this embodiment, alternatively, referring to fig. 1, the signal transmitting chip 30 is located at the middle position of the printed circuit board 10, the control signal receiving device 20 is disposed at the receiving end of the signal transmitting chip 30, and the transmitting device 40 is disposed at the transmitting end of the signal transmitting chip 30.
According to the signal source provided by the embodiment of the application, the signal transmitting chip can transmit the millimeter wave signal of the characteristic frequency band based on the control signal, so that the actual requirements of users are met, the waste of resources is avoided, and meanwhile, the requirements of different scenes are not taken into consideration, so that the size of the signal source is reduced, namely, the signal source provided by the embodiment is reasonable in structure, small in size, low in cost and convenient to carry, and the problems of large size, inconvenience in operation and high price of the signal source in the prior art are solved; in addition, the signal source provided by the embodiment can also rapidly realize the replacement of the signal transmitting chip according to the requirements, thereby adapting to the requirements of signal sources in different frequency band ranges.
In an alternative embodiment, the bandwidth of the first predetermined frequency band may be less than or equal to 5G, and the range of the first predetermined frequency band may be [60GHz,64GHz ] or [76GHz,81GHz ].
It is to be understood that the wideband of the first preset frequency band is not limited thereto; and the range of the first preset frequency band is not limited thereto.
Optionally, with continued reference to fig. 1, the transmission device 40 includes: a waveguide structure 41 detachably disposed on the printed circuit board 10 and connected to the signal transmitting chip 30; and a waveguide connection seat 42 provided on the printed circuit board 10; the waveguide structure 41 outputs the millimeter wave signal of the first preset frequency band to an external device through the waveguide connecting seat 42.
When the frequency bands of the millimeter wave signals transmitted by the signal transmitting chip 30 are different, the waveguide structure 41 is also different, that is, the waveguide structure 41 corresponds to the millimeter wave signals of the specific frequency band transmitted by the signal transmitting chip 30, so that the millimeter wave signals of the first preset frequency band are output to an external device through the waveguide connecting seat 42.
It should be noted that the waveguide structure 41 may have a variety, and the waveguide structure 41 is not specifically limited in this embodiment.
Optionally, with continued reference to fig. 1, the signal source 100 may further include: a storage device 50 disposed on a side of the printed circuit board 10 facing away from the signal emitting chip 30; the storage device 50 is connected to the signal transmitting chip 30 and can be used for storing firmware data of the signal transmitting chip 30.
The storage device 50 may be a device having a storage function, such as a flash.
Optionally, with continued reference to fig. 1, the signal source 100 further comprises: and a shielding case 60 disposed over the signal transmitting chip 30 for shielding the leakage signal of the signal transmitting chip 30, wherein the shielding case 60 may also shield interference of the antenna feeder, interference of the signal transmitting chip 30 from the outside, and the like.
Considering that the leakage signal of the signal transmitting chip 30 may cause interference to the millimeter wave signal of the first preset frequency band output by the signal transmitting chip 30, the present embodiment covers the shielding cover 60 above the signal transmitting chip 30 for shielding the leakage signal of the signal transmitting chip 30, so that the performance of the output millimeter wave signal of the first preset frequency band is better. The shield case 60 may be a metal plate made of a specific material such as aluminum or copper.
Optionally, with continued reference to fig. 1, the signal source 100 may further include: and the power supply device 70 is connected with the signal transmitting chip 30 and is used for supplying working electric energy to the signal transmitting chip 30.
Specifically, the power supply device 70 supplies operating power to the signal transmitting chip 30, so that the signal transmitting chip 30 can operate normally when being started.
Optionally, the power supply device 70 may include, for example, a USB power supply and a power conversion module, where the USB power supply generally has a power supply voltage of 5V, and outputs a multi-path power supply branch signal (such as 3.3V, 1.8V, 1.5V, and the like) to the signal transmitting chip 30 through each power conversion module, so that the signal transmitting chip 30 can start to operate normally.
Alternatively, the power supply device 70 may include, for example, a power socket, a direct plug-in power socket, and a device connected to a power source for providing operating power to the power supply device 70.
Optionally, fig. 2 is a schematic structural diagram of another signal source provided in an embodiment of the present application, and as shown in fig. 2, the signal source 100 further includes: a housing 80 having a receiving cavity; wherein the printed circuit board 10 is placed in the receiving cavity.
The housing 80 has a certain heat dissipation function while accommodating and protecting the printed circuit board 10.
Alternatively, when the power supply device 70 is a USB power supply, the USB power supply is disposed near the printed circuit board 10, and the corresponding position of the housing 80 needs to be hollowed out (e.g. the area AA in fig. 2) to expose the USB interface.
Optionally, fig. 3 is a schematic structural diagram of another signal source provided in the embodiment of the present application, and as shown in fig. 3, a fixing hole 90 is provided on the printed circuit board 10; the vertical projection of the fixing hole 90 on the plane of the printed circuit board 10 does not overlap with the vertical projection of the control signal receiving device 20, the signal transmitting chip 30 and the transmission device 40 on the plane of the printed circuit board 10.
The fixing holes 90 are provided to facilitate fixing and mounting the signal source 100, and to dissipate heat of the signal source 100 by using a heat-conducting bolt structure, for example, and to connect the housing 80 to the printed circuit board 10 through the fixing holes 90.
Optionally, the fixing holes 90 are uniformly distributed around the printed circuit board 10, and the size of the fixing holes 90 is not limited in this embodiment, and only the devices on the printed circuit board 10 need to be avoided.
On the basis of the above scheme, optionally, with reference to fig. 3, heat dissipation structures 91 are disposed around the fixing holes 90.
The heat dissipation structure 91 can be subjected to windowing treatment along the upper layer and the lower layer of the fixing hole 90 circles to expose a surface base material, and meanwhile, the exposed surface base material can also be connected with the shell 80, so that the contact area with the shell 80 is enlarged, and heat dissipation can be better realized; the heat dissipation structure 91 may also be a hollow structure penetrating the front and back sides of the printed circuit board 10.
Based on the same inventive concept, an embodiment of the present application further provides a signal source, which is applied to perform a performance test on a device to be tested, fig. 4 is a schematic structural diagram of another signal source provided in the embodiment of the present application, and as shown in fig. 4, the signal source 100 includes: the signal transmitting chip 30' is used for providing a test signal of a preset frequency band; and a waveguide device 40' for outputting the test signal to perform a performance test on the device under test.
The signal source provided by the embodiment of the application can be used as a standard signal source to perform performance test on a device to be tested, and the signal transmitting chip can provide a test signal of a preset frequency band, so that the actual requirements of users are met, the waste of resources is avoided, and meanwhile, the requirements of different scenes are not taken into consideration, so that the size of the signal source is reduced; in addition, the signal source provided by the embodiment can also rapidly realize the replacement of the signal transmitting chip according to the requirements, thereby adapting to the requirements of signal sources in different frequency band ranges.
Optionally, the bandwidth of the preset frequency band may be less than 10G.
Optionally, the device to be tested is a signal transceiver, and the frequency band of the test signal is matched with the frequency band of the signal that can be received by the signal transceiver.
Optionally, the device to be tested and the signal transmitting chip 30' are the same chip; the signal emitting chip 30' is a chip which is tested and verified, and the device to be tested is a chip which is not tested and verified.
Optionally, with continued reference to fig. 4, the method further includes: the carrier plate 10 ', the signal emitting chip 30' and the waveguide device 40 'are disposed on the carrier plate 10'; and a shield case 60 ' covering the signal emitting chip 30 ' and fixed on the carrier plate 10 '. By housing the shield can 60 ' over the signal transmitting chip 30 ', the leakage signal of the signal transmitting chip 30 ' is shielded.
Based on the same inventive concept, an embodiment of the present application further provides a test system, fig. 5 is a schematic structural diagram of the test system provided in the embodiment of the present application, and as shown in fig. 5, the test system 300 includes: a sensor device to be tested 200; and at least one test signal source providing a test signal for testing the sensor device 200 to be tested; each signal source for testing is the signal source 100 in any of the above embodiments.
For example, the sensor device 200 to be detected may be a millimeter wave radar related device, and specifically, a millimeter wave signal source is generally purchased in a detection process of the millimeter wave radar related device; however, the conventional millimeter wave signal source can generally provide signals with frequencies ranging from 30GHz to 300GHz, and in practical application, only the millimeter wave signal source needs to provide FMCW wave signals with frequencies ranging from 60GHz to 64GHz and from 76GHz to 81GHz, so that nearly 97% of the frequency bands of the signals provided by the millimeter wave signal source are wasted. Therefore, the signal source 100 provided by the above embodiment can transmit the millimeter wave signal in the characteristic frequency band, so as to meet the actual requirements of the user, thereby not only avoiding the waste of resources, but also meeting the requirements of different scenes, thereby maintaining the flexibility of the test system 300.
The signal source 100 provided in the present application will be further described with reference to specific application scenarios, but is not limited to the present application.
Optionally, fig. 6 is a schematic structural diagram of another test system provided in the embodiment of the present application, referring to block 1 in fig. 6, where at least one of the signal sources for test includes a first signal source 101, and the test system 300 further includes: the first analog signal sampler 110 is connected with the intermediate frequency signal output end of the sensor device to be detected 200; the signal receiving end of the sensor device 200 to be tested is connected to the first signal source 101, and is configured to receive the test signal.
Specifically, the first signal source 101 generates a test signal with a certain frequency and power to the sensor device 200 to be tested, and the intermediate frequency signal generated by the sensor device 200 to be tested based on the test signal is collected by the first analog signal sampler 110, that is, the first analog signal sampler 110 receives the performance test of the intermediate frequency signal.
Optionally, with continued reference to block 1 in fig. 6, the test system 300 further includes: the first signal source 101 is connected to a signal receiving end of the sensor device 200 to be measured through the first attenuator 120; the first attenuator 120 can be used to adjust the power of the test signal to match the signal receiving parameters of the sensor device under test.
Specifically, the test signal output by the first signal source 101 is transmitted to the first attenuator 120, and the first attenuator 120 generates an appropriate attenuation coefficient to adjust the power of the test signal, so as to ensure that the power is always appropriate when the test signal is transmitted to the signal receiving end of the sensor device 200 to be tested. By the series connection of the first signal source 101 and the first attenuator 120, the test signal power is very adjustable, and by using test signals of different bands, the test signal can provide frequencies of multiple bands.
Optionally, referring to block 2 in fig. 6, the at least one signal source for testing includes the second signal source 102, and the testing system 300 further includes: a mixer 130 having two signal inputs and one signal output; and a second analog signal sampler 111 connected to a signal output terminal of the mixer 130, for sampling the mixed signal output by the mixer 130; the rf signal output end of the sensing device 200 to be tested and the signal output end of the second signal source 102 are respectively connected to a signal input end of the mixer 130.
Optionally, referring to block 2 in fig. 6, the test system 300 further includes: a second attenuator 121, a signal output terminal of the second signal source 102 being connected to one signal input terminal of the mixer 130 through the second attenuator 121; the signal output end of the mixer 130 is connected with the second analog signal sampler 111 through the amplifier 140; and a Low Noise Amplifier (LNA)141 and a third attenuator 122; the rf signal output end of the sensing device 200 to be tested is connected to the other signal input end of the mixer 130 through a Low Noise Amplifier (LNA)141 and a third attenuator 122 in sequence.
Specifically, the power of the signal emitted by the second signal source 102 is adjusted to an appropriate value by the second attenuator 121, that is, by the adjustment, the difference between the frequency of the output signal of the second signal source 102 and the frequency of the output signal of the sensor device 200 to be tested, that is, the frequency of the analog signal output by the mixer 130, will be a frequency value that can be accurately tested by the second analog signal sampler 111.
Specifically, when the mixer 130 outputs an analog signal with a small bias, the amplifier 140 amplifies the analog signal appropriately to ensure that the power of the analog signal can be accurately measured by the second analog signal sampler 111.
Specifically, the signal emitted from the second signal source 102 is transmitted to a Low Noise Amplifier (LNA)141, where the lower power signal is appropriately amplified, and then transmitted to the third attenuator 122, where the higher power signal is appropriately attenuated.
The embodiment can determine the corresponding relationship between the output power of the sensor device 200 to be tested and the output power of the analog signal output by the mixer 130 by using a precise calibration method.
Optionally, referring to block 4 in fig. 6, the at least one signal source for testing includes the third signal source 103, and the test system 300 further includes: a first connection port 150, a connection cable 160, a second connection port 151, and a fourth attenuator 123 connected in this order; the signal receiving end of the sensor device 200 to be measured is connected to the first connection port 150, and the third signal source 103 is connected to the fourth attenuator 123.
Specifically, in order to calibrate the signal emitted from the third signal source 103, the first connection port 150, the connection cable 160, and the second connection port 151 are added to the above structure. The calibration compensation parameters of the whole block 4 are confirmed by the calibration equipment measuring the output frequency and power of the test signal of the second connection port 151 and the frequency and loss parameters of the connection cable 160, so that the block 4 can output a signal with precise frequency and power.
Optionally, each signal source 100 in the at least one signal source for testing is the same sensor chip with adjustable output signal.
Optionally, referring to block 3 in fig. 6, the test system 300 further includes: a power detector 170 having a signal input and a signal output; the signal input end of the power detector 170 is connected with the signal output end of the sensor device 200 to be detected; and a measuring unit 180 connected to the signal output end of the power detector 170, for measuring the voltage signal and the current signal output by the power detector 170, so as to obtain parameters (such as power, etc.) of the output signal of the sensor device 200 to be measured.
Specifically, a radio frequency signal emitted by the sensing device 200 to be measured is input to the power detector 170, the output characteristics (voltage, current intensity, etc.) of the power detector 170 vary with the power of the input radio frequency signal, and the output of the power detector 170 is measured by the measuring unit 180. And establishing a corresponding relation between the output characteristic of the power detector 170 and the input power of the radio frequency signal thereof, and calculating the power of the radio frequency signal output by measuring the output of the power detector 170.
It should be noted that the frequency and power of the test signal emitted by the signal source 100 are adjustable. The above 4 blocks may be performed separately or simultaneously, and this embodiment is not particularly limited. The signal emitting chips in the signal source 100 and the sensor device 200 under test may use the same chip if performed simultaneously, but the frequencies of the test signals of different blocks are different.
It is to be noted that the foregoing is only illustrative of the preferred embodiments of the present application and the technical principles employed. It will be understood by those skilled in the art that the present application is not limited to the particular embodiments described herein, but is capable of various obvious changes, rearrangements and substitutions as will now become apparent to those skilled in the art without departing from the scope of the application. Therefore, although the present application has been described in more detail with reference to the above embodiments, the present application is not limited to the above embodiments, and may include other equivalent embodiments without departing from the spirit of the present application, and the scope of the present application is determined by the scope of the appended claims.
Claims (21)
1. A signal source, comprising:
a printed circuit board, and
the control signal receiving device, the signal transmitting chip and the transmission device are arranged on the printed circuit board and are sequentially connected;
the control signal receiving device is used for receiving an external control signal, the signal transmitting chip is used for selecting at least part of transmitting channels to output millimeter wave signals of a first preset frequency band according to the control signal, and the transmission device is used for outputting the millimeter wave signals.
2. The signal source of claim 1, wherein the transmission means comprises:
the waveguide structure is connected with the signal transmitting chip; and
the waveguide connecting seat is arranged on the printed circuit board;
the waveguide structure is detachably arranged on the printed circuit board, and the waveguide structure outputs the millimeter wave signal of the first preset frequency band to an external device through the waveguide connecting seat.
3. The signal source of claim 1, further comprising:
the storage device is arranged on one side of the printed circuit board, which is far away from the signal transmitting chip;
the storage device is connected with the signal transmitting chip and can be used for storing firmware data of the signal transmitting chip.
4. The signal source of claim 1, further comprising:
and the shielding cover is covered on the signal transmitting chip and used for shielding the leakage signal of the signal transmitting chip.
5. The signal source of claim 1, further comprising:
and the power supply device is connected with the signal transmitting chip and is used for providing working electric energy for the signal transmitting chip.
6. The signal source of claim 1, further comprising:
a housing having an accommodating chamber;
wherein the printed circuit board is placed in the accommodating cavity.
7. The signal source according to any of claims 1-6, wherein the bandwidth of the first predetermined frequency band is less than or equal to 5G.
8. The signal source of claim 7, wherein the first predetermined frequency band is in a range of [60GHz,64GHz ] or [76GHz,81GHz ].
9. A signal source for performing performance testing on a device under test, the signal source comprising:
the signal transmitting chip is used for providing a test signal of a preset frequency band; and
and the waveguide device is used for outputting the test signal so as to test the performance of the device to be tested.
10. The signal source of claim 9, wherein the bandwidth of the predetermined frequency band is less than 10G.
11. The signal source of claim 10, wherein the device under test is a signal transceiver device, and a frequency band of the test signal matches a frequency band of a signal receivable by the signal transceiver device.
12. The signal source of claim 11, wherein the dut and the signal emitting chip are the same chip;
the signal transmitting chip is a chip which is tested and verified, and the device to be tested is a chip which is not tested and verified.
13. The signal source of any of claims 9-12, further comprising:
the signal transmitting chip and the waveguide device are arranged on the bearing plate; and
and the shielding cover covers the signal transmitting chip and is fixed on the bearing plate.
14. A test system, comprising:
a sensor device to be tested; and
the signal source for testing provides a test signal for testing the sensor device to be tested;
wherein each of the test signal sources is a signal source according to any one of claims 1 to 13.
15. The test system of claim 14, wherein the at least one test signal source comprises a first signal source, the test system further comprising:
the first analog signal sampler is connected with the intermediate frequency signal output end of the to-be-detected sensing device;
and the signal receiving end of the sensor device to be tested is connected with the first signal source and is used for receiving the test signal.
16. The test system of claim 15, further comprising:
the first signal source is connected to a signal receiving end of the sensor device to be detected through the first attenuator;
the first attenuator can be used for adjusting the power of the test signal so as to be matched with the signal receiving parameter of the sensor device to be tested.
17. The test system of claim 14, wherein the at least one test signal source comprises a second signal source, the test system further comprising:
a mixer having two signal inputs and a signal output; and
the second analog signal sampler is connected with the signal output end of the mixer and is used for sampling the mixed signal output by the mixer;
the radio frequency signal output end of the to-be-detected sensing device and the signal output end of the second signal source are respectively connected with one signal input end of the frequency mixer.
18. The test system of claim 17, further comprising:
a second attenuator, a signal output terminal of the second signal source being connected to a signal input terminal of the mixer through the second attenuator;
the signal output end of the mixer is connected with the second analog signal sampler through the amplifier; and
a low noise amplifier and a third attenuator;
and the radio frequency signal output end of the to-be-detected sensing device is connected to the other signal input end of the frequency mixer through the low-noise amplifier and the third attenuator in sequence.
19. The test system of claim 14, wherein the at least one test signal source comprises a third signal source, the test system further comprising:
the first connecting port, the connecting cable, the second connecting port and the fourth attenuator are connected in sequence;
the signal receiving end of the sensor device to be tested is connected with the first connection port, and the third signal source is connected with the fourth attenuator.
20. The test system according to any one of claims 14 to 19, wherein each of the at least one test signal source is a same sensor chip with adjustable output signal.
21. The test system of any one of claims 14-19, further comprising:
a power detector; and
and the measuring unit is connected to the signal output end of the sensor device to be measured through the power detector and is used for measuring the parameters of the signal output by the sensor device to be measured.
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| CN202021152518.4U CN212572522U (en) | 2020-06-19 | 2020-06-19 | Signal source and test system |
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| CN202021152518.4U CN212572522U (en) | 2020-06-19 | 2020-06-19 | Signal source and test system |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113824454A (en) * | 2020-06-19 | 2021-12-21 | 加特兰微电子科技(上海)有限公司 | Signal source and test system |
| CN113890644A (en) * | 2021-11-10 | 2022-01-04 | 广东明创软件科技有限公司 | Radio frequency test method, device, storage medium and electronic equipment |
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2020
- 2020-06-19 CN CN202021152518.4U patent/CN212572522U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113824454A (en) * | 2020-06-19 | 2021-12-21 | 加特兰微电子科技(上海)有限公司 | Signal source and test system |
| CN113890644A (en) * | 2021-11-10 | 2022-01-04 | 广东明创软件科技有限公司 | Radio frequency test method, device, storage medium and electronic equipment |
| CN113890644B (en) * | 2021-11-10 | 2024-03-19 | 广东明创软件科技有限公司 | Radio frequency test method and device, storage medium and electronic equipment |
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