CN212567323U

CN212567323U - Probe clamp for three-dimensional measuring instrument

Info

Publication number: CN212567323U
Application number: CN202021244080.2U
Authority: CN
Inventors: 李建; 徐林
Original assignee: Kunshan Baiyichuan Electronics Co ltd
Current assignee: Kunshan Baiyichuan Electronics Co ltd
Priority date: 2020-06-29
Filing date: 2020-06-29
Publication date: 2021-02-19
Anticipated expiration: 2030-06-29

Abstract

The utility model provides a probe clamp for a three-dimensional measuring instrument, which belongs to the field of probe clamps of three-dimensional measuring instruments, and comprises a mounting mechanism, an extruding mechanism and a clamping mechanism, wherein a bearing is fixedly arranged on the mounting seat, a rotary sleeve is rotatably arranged on the mounting seat through the bearing, an extruding block is fixedly connected with the inner wall of the rotary sleeve, an inclined part is arranged on the side surface of the vertical part, a clamping rod is slidably arranged in a first mounting hole, a first spring is sleeved on the clamping rod, a supporting plate is fixedly connected with the clamping rod, the supporting plate is arranged outside the mounting seat, a first ball is rotatably arranged at one end of the clamping rod, which is far away from the mounting groove, the clamp can disassemble and mount a probe only by rotating the rotary sleeve, and the operation is simple and convenient, the replacement time of the probe is reduced, and the working efficiency is improved.

Description

Probe clamp for three-dimensional measuring instrument

Technical Field

The utility model relates to a cubic unit measuring apparatu probe anchor clamps field particularly, relates to a cubic unit measuring apparatu is with probe anchor clamps.

Background

The three-dimensional measuring instrument is mainly an instrument for measuring by taking points in three dimensions, a measured object is placed in a three-dimensional measuring space, the coordinate position of each measuring point on the measured object can be obtained, and the geometric dimension, the shape and the position of the measured object are calculated according to the space coordinate values of the points. When the three-dimensional measuring instrument measures different measuring targets, a corresponding probe is required to be used. The probe clamp of the existing three-dimensional measuring instrument is troublesome when the probe is replaced, so that the probe is inconvenient to replace, the replacement time of the probe is prolonged, and the working efficiency is reduced.

SUMMERY OF THE UTILITY MODEL

In order to compensate above not enough, the utility model provides a cubic unit is probe anchor clamps for measuring apparatu aims at improving that the probe anchor clamps of current cubic unit measuring apparatu are comparatively troublesome when changing the probe for the inconvenient with trading of probe has increased the change time of probe, has reduced work efficiency's problem.

The utility model discloses a realize like this: a probe clamp for a three-dimensional measuring instrument is used for clamping and fixing a probe and is characterized by comprising an installation mechanism, an extrusion mechanism and a clamping mechanism.

The installation mechanism comprises an installation seat, wherein the installation seat is provided with an installation groove, and the installation seat is provided with a first installation hole.

The extrusion mechanism comprises a rotary sleeve, a bearing and an extrusion block, the bearing is fixedly installed on the installation seat, the rotary sleeve is installed on the installation seat in a rotating mode through the bearing, the extrusion block is fixedly connected to the inner wall of the rotary sleeve, the extrusion block comprises a vertical portion and an inclined portion, the inclined portion is arranged on the side face of the vertical portion, and a limiting groove is formed in the vertical portion.

The clamping mechanism comprises a clamping rod, a first spring, a supporting plate and a first ball, the clamping rod is slidably mounted in the first mounting hole, the first spring is sleeved on the clamping rod, the supporting plate is fixedly connected to the clamping rod, the supporting plate is arranged outside the mounting seat, the first spring is arranged between the supporting plate and the mounting seat, and the first ball is rotatably mounted at one end, far away from the mounting groove, of the clamping rod.

The utility model discloses an in one embodiment, the second mounting hole has been seted up to the mount pad, the second mounting hole sets up to the blind hole, second mounting hole inner wall fixedly connected with second spring, the second mounting hole is close to the one end of mounting groove is provided with the second ball, the second mounting hole is close to the one end fixed mounting of mounting groove has the baffle, the three fifths of second ball partly run through in the baffle, be provided with the ring channel on the shell of probe.

In an embodiment of the present invention, the side wall of the annular groove is set to be arc-shaped, and the annular groove is in spacing fit with the second ball.

In an embodiment of the present invention, the second mounting hole is in the mounting seat annular array is provided with at least four, and the number of the second spring and the second ball corresponds to the number of the second mounting hole.

In an embodiment of the present invention, both sides of the vertical portion are provided with the inclined portion.

The utility model discloses an in one embodiment, anti-skidding line has been seted up to the rotating sleeve outer wall, anti-skidding line is in the last ring array setting of rotating sleeve.

In an embodiment of the present invention, the limiting groove is set to be spherical, and the limiting groove is in clearance fit with the first ball.

The utility model discloses an in one embodiment, the first magnet of mount pad bottom fixedly connected with, fixed mounting has the second magnet on the probe, first magnet with the mutual actuation of second magnet.

In an embodiment of the present invention, the clamping rod is close to the one end fixedly connected with rubber pad of the mounting groove.

In an embodiment of the present invention, the clamping mechanism is arranged on the mounting seat in at least two groups.

The utility model has the advantages that: the utility model discloses a three dimension measurement appearance that obtains through above-mentioned design is with probe anchor clamps, when using, put the probe into the mounting groove, rotate the rotating sleeve, make the rake extrude first ball, and then make clamping rod approach to the mounting groove inside, and then extrude fixed clamp to the probe, when the spacing groove moves to first ball position, first ball gets into the spacing groove, first ball and spacing groove carry out spacing, probe centre gripping is accomplished, the first spring is compressed at this moment, when needing to dismantle the probe, reset the rotating sleeve and rotate, first ball leaves spacing groove and extrusion piece, clamping rod resets under the effect of first spring, clamping rod no longer extrudes the probe at this moment, the probe can be dismantled, this anchor clamps only need rotate the rotating sleeve to dismantle the probe and install, easy operation is convenient, the replacement time of the probe is reduced, and the working efficiency is improved.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are required to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention, and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.

Fig. 1 is a schematic structural view of a probe clamp for mounting a probe on a three-dimensional measuring instrument according to an embodiment of the present invention;

FIG. 2 is a schematic view of an internal structure of a mounting mechanism according to an embodiment of the present invention;

fig. 3 is a schematic structural diagram of a probe according to an embodiment of the present invention;

fig. 4 is a schematic structural diagram of an extrusion mechanism according to an embodiment of the present invention;

fig. 5 is a schematic structural diagram of an extrusion block provided in an embodiment of the present invention;

fig. 6 is a schematic structural diagram of a clamping mechanism according to an embodiment of the present invention;

FIG. 7 is a schematic view of another internal structure of a mounting mechanism according to an embodiment of the present invention;

fig. 8 is a schematic structural diagram of a probe clamp for a three-dimensional measuring instrument according to an embodiment of the present invention.

In the figure: 10-a probe; 100-a mounting mechanism; 110-a mount; 111-mounting grooves; 112-a first mounting hole; 113-a second mounting hole; 114-a baffle; 120-a first magnet; 121-a second magnet; 130-a second spring; 140-a second ball; 150-an annular groove; 200-an extrusion mechanism; 210-rotating the sleeve; 211-non-skid lines; 220-a bearing; 230-an extrusion block; 231-a vertical portion; 232-an inclined portion; 233-a limit groove; 300-a clamping mechanism; 310-a clamping bar; 311-rubber pad; 320-a first spring; 330-a holding plate; 340-first ball.

Detailed Description

To make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the drawings of the embodiments of the present invention are combined to clearly and completely describe the technical solutions of the embodiments of the present invention, and obviously, the described embodiments are some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Thus, the following detailed description of the embodiments of the present invention, presented in the accompanying drawings, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures.

In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and to simplify the description, but do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore should not be construed as limiting the present invention.

Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless specifically limited otherwise.

In the present invention, unless otherwise expressly stated or limited, the terms "mounted," "connected," and "fixed" are to be construed broadly and may, for example, be fixedly connected, detachably connected, or integrally formed; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meaning of the above terms in the present invention can be understood according to specific situations by those skilled in the art.

In the present disclosure, unless expressly stated or limited otherwise, the first feature "on" or "under" the second feature may comprise direct contact between the first and second features, or may comprise contact between the first and second features not directly. Also, the first feature being "on," "above" and "over" the second feature includes the first feature being directly on and obliquely above the second feature, or merely indicating that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature includes the first feature being directly under and obliquely below the second feature, or simply meaning that the first feature is at a lesser elevation than the second feature.

Examples

Referring to fig. 1, the present invention provides a technical solution: a probe clamp for a three-dimensional measuring instrument is used for clamping and fixing a probe 10 and comprises an installation mechanism 100, an extrusion mechanism 200 and a clamping mechanism 300.

Referring to FIG. 2, the mounting mechanism 100 includes a mounting base 110, the mounting base 110 has a mounting groove 111, and the mounting base 110 has a first mounting hole 112.

Referring to fig. 3, in some specific embodiments, a first magnet 120 is fixedly bonded to the bottom of the mounting base 110, a second magnet 121 is fixedly mounted on the probe 10, the first magnet 120 and the second magnet 121 attract each other, and when the probe 10 is mounted, the first magnet 120 and the second magnet 121 attract each other to primarily fix the probe 10 inside the mounting base 110.

Referring to fig. 4 and 5, the extrusion mechanism 200 includes a rotating sleeve 210, a bearing 220 and an extrusion block 230, the bearing 220 is fixedly sleeved on the mounting base 110 in an interference manner, the rotating sleeve 210 is rotatably mounted on the mounting base 110 through the bearing 220, the extrusion block 230 is fixedly connected to the inner wall of the rotating sleeve 210, the extrusion block 230 includes a vertical portion 231 and an inclined portion 232, the inclined portion 232 is disposed on the side surface of the vertical portion 231, both sides of the vertical portion 231 are provided with inclined portions 232, the vertical portion 231 is provided with a limiting groove 233, the limiting groove 233 is spherical, and the limiting groove 233 is in clearance fit with the first ball 340.

In some specific embodiments, the outer wall of the rotating sleeve 210 is provided with anti-slip patterns 211, the anti-slip patterns 211 are arranged on the rotating sleeve 210 in an annular array, and the arrangement of the anti-slip patterns 211 increases the friction force between the rotating sleeve 210 and the hand, so as to facilitate the rotation of the rotating sleeve 210.

Referring to fig. 6, the clamping mechanism 300 is disposed at least two groups on the mounting seat 110 in an annular array to increase the clamping effect on the probe 10, the clamping mechanism 300 includes a clamping rod 310, a first spring 320, a holding plate 330 and a first ball 340, the clamping rod 310 is slidably mounted in the first mounting hole 112, the first spring 320 is sleeved on the clamping rod 310, the holding plate 330 is fixedly welded to the clamping rod 310, the holding plate 330 is disposed outside the mounting seat 110, the first spring 320 is disposed between the holding plate 330 and the mounting seat 110, and the first ball 340 is rotatably mounted at one end of the clamping rod 310 away from the mounting groove 111.

Referring to fig. 7, in some specific embodiments, the mounting base 110 is provided with a second mounting hole 113, the second mounting hole 113 is a blind hole, a second spring 130 is fixedly connected to an inner wall of the second mounting hole 113, a second ball 140 is disposed at one end of the second mounting hole 113 close to the mounting groove 111, a baffle 114 is fixedly mounted at one end of the second mounting hole 113 close to the mounting groove 111, three fifths of the second ball 140 penetrate through the baffle 114, an annular groove 150 is disposed on a housing of the probe 10, a side wall of the annular groove 150 is arc-shaped, the annular groove 150 is in limit fit with the second ball 140, when the probe 10 is mounted, the second ball 140 is extruded by the second spring 130, so that the second ball 140 is in limit fit with the annular groove 150, and the probe 10 is further primarily fixed.

Referring to fig. 8, in some specific embodiments, the second mounting holes 113 are at least four in the annular array of the mounting seat 110, the number of the second springs 130 and the second balls 140 is corresponding to the number of the second mounting holes 113, and the plurality of second springs 130 and the second balls 140 are used for fixing the probe 10, so as to increase the fixing effect on the probe 10.

In some specific embodiments, a rubber pad 311 is fixedly connected to an end of the clamping rod 310 close to the mounting groove 111, and the rubber pad 311 is disposed to protect the probe 10 and prevent the clamping rod 310 from damaging the probe 10.

The working principle is as follows: during the use, put into mounting groove 111 with probe 10 inside, rotate swivel sleeve 210, make the rake 232 extrude first ball 340, and then make clamping rod 310 close to mounting groove 111 inside, and then extrude fixed clamp to probe 10, when spacing groove 233 removed to first ball 340 position, first ball 340 gets into spacing groove 233, first ball 340 carries on spacingly with spacing groove 233, the centre gripping of probe 10 is accomplished, first spring 320 is compressed this moment, when needing to dismantle probe 10, reset swivel sleeve 210 and rotate, first ball 340 leaves spacing groove 233 and extrusion piece 230, clamping rod 310 resets under the effect of first spring 320, clamping rod 310 no longer extrudes probe 10 this moment, probe 10 can dismantle.

The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A probe clamp for a three-dimensional measuring instrument is used for clamping and fixing a probe (10), and is characterized by comprising

The mounting mechanism comprises a mounting mechanism body (100), wherein the mounting mechanism body (100) comprises a mounting seat (110), the mounting seat (110) is provided with a mounting groove (111), and the mounting seat (110) is provided with a first mounting hole (112);

the extrusion mechanism (200) comprises a rotating sleeve (210), a bearing (220) and an extrusion block (230), the bearing (220) is fixedly mounted on the mounting base (110), the rotating sleeve (210) is rotatably mounted on the mounting base (110) through the bearing (220), the extrusion block (230) is fixedly connected to the inner wall of the rotating sleeve (210), the extrusion block (230) comprises a vertical part (231) and an inclined part (232), the inclined part (232) is arranged on the side surface of the vertical part (231), and the vertical part (231) is provided with a limit groove (233);

the clamping mechanism (300) comprises a clamping rod (310), a first spring (320), a supporting plate (330) and first balls (340), the clamping rod (310) is slidably mounted in the first mounting hole (112), the first spring (320) is sleeved on the clamping rod (310), the supporting plate (330) is fixedly connected to the clamping rod (310), the supporting plate (330) is arranged outside the mounting seat (110), the first spring (320) is arranged between the supporting plate (330) and the mounting seat (110), and the first balls (340) are rotatably mounted at one end, far away from the mounting groove (111), of the clamping rod (310).

2. The probe clamp for the three-dimensional measuring instrument as claimed in claim 1, wherein a second mounting hole (113) is formed in the mounting seat (110), the second mounting hole (113) is a blind hole, a second spring (130) is fixedly connected to the inner wall of the second mounting hole (113), a second ball (140) is arranged at one end, close to the mounting groove (111), of the second mounting hole (113), a baffle (114) is fixedly mounted at one end, close to the mounting groove (111), of the second mounting hole (113), three fifths of the second ball (140) penetrate through the baffle (114), and an annular groove (150) is formed in a shell of the probe (10).

3. The probe clamp for the three-dimensional measuring instrument as recited in claim 2, wherein the side wall of the annular groove (150) is configured to be circular arc, and the annular groove (150) is in limit fit with the second ball (140).

4. The probe holder for a three-dimensional measuring instrument as claimed in claim 2, wherein the second mounting holes (113) are provided in an annular array of the mounting base (110) at least four, and the number of the second springs (130) and the number of the second balls (140) are provided corresponding to the number of the second mounting holes (113).

5. The probe holder for a cubic meter as recited in claim 1, wherein both sides of the perpendicular portion (231) are provided with the inclined portions (232).

6. The probe clamp for the three-dimensional measuring instrument is characterized in that anti-slip patterns (211) are formed on the outer wall of the rotating sleeve (210), and the anti-slip patterns (211) are arranged on the rotating sleeve (210) in an annular array.

7. The probe holder for a three-dimensional measuring instrument according to claim 1, wherein the limiting groove (233) is provided in a spherical shape, and the limiting groove (233) is in clearance fit with the first ball (340).

8. The probe clamp for the three-dimensional measuring instrument as claimed in claim 1, wherein a first magnet (120) is fixedly connected to the bottom of the mounting seat (110), a second magnet (121) is fixedly mounted on the probe (10), and the first magnet (120) and the second magnet (121) attract each other.

9. The probe clamp for the three-dimensional measuring instrument as claimed in claim 1, wherein a rubber gasket (311) is fixedly connected to one end of the clamping rod (310) close to the mounting groove (111).

10. The probe holder for a three-dimensional measuring instrument according to claim 1, wherein the holding mechanisms (300) are arranged in at least two groups in an annular array on the mount (110).