CN212483632U

CN212483632U - Testing device for integrated circuit

Info

Publication number: CN212483632U
Application number: CN202020691323.0U
Authority: CN
Inventors: 严传滨
Original assignee: Shenzhen Konasan Electronic Co ltd
Current assignee: Shenzhen Konasan Electronic Co ltd
Priority date: 2020-04-29
Filing date: 2020-04-29
Publication date: 2021-02-05
Anticipated expiration: 2030-04-29

Abstract

The utility model discloses a testing arrangement for integrated circuit, including device body, panel, wire, the surface of panel is equipped with the fixed plate, the fixed plate includes horizontal portion down, vertical portion on, the inside of vertical portion on the fixed plate is equipped with the slip square, the surface of vertical portion on the fixed plate is equipped with the head rod, the tip that the fixed plate was kept away from to the head rod is equipped with stop gear, stop gear includes fixed block, second connecting rod, sliding block, the surface of fixed block is equipped with three wrapping posts, the inside of sliding block tip is equipped with the spring, the top of vertical portion on the fixed plate is equipped with stabilizing mean, stabilizing mean includes swing arm, slider, lower bottom block, last dog; the part of wire overlength encircles in the wrapping post outside on the circuit board tester, and the wire is spacing fixed between fixed block, sliding block, avoids the wire overlength to be torn, leads to the wire to tear from the circuit board tester and influence the condition of testing process and takes place.

Description

Testing device for integrated circuit

Technical Field

The utility model belongs to the technical field of integrated circuit test equipment, concretely relates to testing arrangement for integrated circuit.

Background

The circuit board tester is a type of integrated circuit test equipment which can automatically complete excitation, measurement, data processing, display or output test results under the control of a computer, and the circuit board test system has the characteristics of high speed, high precision, multiple functions, multiple parameters, wide measurement range and the like;

in the process of testing an integrated circuit by using an existing circuit board tester, the problem that the conducting wire is too long and is easy to tear off from the circuit board tester to influence the testing process condition exists, and therefore a testing device for the integrated circuit is provided.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a testing arrangement for integrated circuit to solve the in-process of the circuit board tester test integrated circuit that provides in the above-mentioned background art, there is the wire overlength easy by pulling, leads to the wire to tear from the circuit board tester and influences the problem of the test procedure condition.

In order to achieve the above object, the utility model provides a following technical scheme: the utility model provides a testing arrangement for integrated circuit, includes device body, panel, wire, the surface of panel is equipped with the fixed plate, the fixed plate includes horizontal portion down, goes up vertical portion, the inside of vertical portion is equipped with the slip square on the fixed plate, the surface of vertical portion is equipped with the head rod on the fixed plate, the tip that the fixed plate was kept away from to the head rod is equipped with stop gear, stop gear includes fixed block, second connecting rod, sliding block, the surface of fixed block is equipped with three wrapping post, the inside of sliding block tip is equipped with the spring, the top of vertical portion is equipped with stabilizing mean on the fixed plate, stabilizing mean includes swing arm, slider, bottom plate, last dog down.

Preferably, a sliding cavity is formed in the lower vertical portion of the fixing plate, the sliding square block is located in the sliding cavity, one end of the first connecting rod penetrates through the surface of the fixing plate and is connected with the sliding square block, the other end of the first connecting rod is connected with the fixing block, the bottom end of the rotating rod penetrates through the top of the fixing plate and is connected with the sliding square block, and the first connecting rod and the rotating rod are both connected with the fixing plate in a sliding mode.

Preferably, the movable cavity has been seted up to the inside of sliding block tip, the spring is located the movable cavity, the tip that the second connecting rod is located the movable cavity is "T" type structure, spring one end is connected with the sliding block and the other end is connected with the second connecting rod, the tip that the sliding block was kept away from to the second connecting rod is connected with the fixed block, sliding block, second connecting rod sliding connection.

Preferably, three circular grooves are formed in the opposite surfaces of the sliding block and the fixed block, and the winding posts are matched with the circular grooves.

Preferably, the top of swing arm is "T" type structure, the swing arm runs through the slider, the outside of swing arm is equipped with the screw thread, the swing arm closes with the slider through the screw thread soon and is connected, the tip and the slider side of bottom block are connected down, the tip that the slider was kept away from to last dog is connected with the rotation of bottom block down, four half slots have been seted up on the surface of bottom block down.

Preferably, the surface of the device body is provided with a shielding mechanism, the shielding mechanism comprises two stabilizing blocks, a shielding plate and two rotating rods, the two stabilizing blocks are distributed at the side positions of two sides of the surface of the device body, and the shielding plate is located between the two stabilizing blocks.

Preferably, the fixing block is internally connected with a moving block in a sliding and clamping manner, the moving block is of a T-shaped structure, the end part of the moving block is embedded into the side surface of the edge of the shielding plate, the rotating rod is rotatably connected with the top of the fixing block, a semicircular clamping groove is formed in the surface of the shielding plate, and the rotating rod is matched with the clamping groove.

Compared with the prior art, the beneficial effects of the utility model are that:

1. through the fixed block, second connecting rod, the sliding block of design, the part of wire overlength encircles in the wrapping post outside on the circuit board tester, and the wire is spacing fixed between fixed block, sliding block, avoids the wire overlength to be torn, leads to the wire to tear from the circuit board tester and influences the condition of testing process and takes place.

2. Through the swing arm, the slider, the bottom block down, go up the dog of design, the part that the wire is connected with the circuit board tester is located down between bottom block, the last dog by spacing fixed, makes the stability that the wire is connected with the circuit board tester, makes the circuit board test process comparatively stable.

3. Through the shielding mechanism of design, the shielding plate covers the panel surface data socket and shields, and dust impurities are prevented from accumulating in the data socket, so that the condition of reducing the sensitivity of connection between the circuit board tester and the lead wire occurs.

Drawings

Fig. 1 is a schematic structural view of the present invention;

fig. 2 is a schematic top view of the fixing plate of the present invention;

fig. 3 is a schematic sectional view of the fixing plate of the present invention;

FIG. 4 is a schematic sectional view of the stabilizing block of the present invention;

in the figure: 1. a device body; 2. a panel; 3. a fixing plate; 4. a limiting mechanism; 5. rotating the rod; 6. a slider; 7. a lower bottom block; 8. an upper stop block; 9. a shielding mechanism; 10. a stabilizing block; 11. a shielding plate; 12. a rotating rod; 13. a first connecting rod; 14. a fixed block; 15. a second connecting rod; 16. a slider; 17. a winding post; 18. a spring; 19. sliding the square block; 20. moving the mass.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Example 1

Referring to fig. 1 to 3, the present invention provides a technical solution: a testing device for integrated circuits comprises a device body 1, a panel 2 and a wire, wherein a fixing plate 3 is arranged on the surface of the panel 2, the fixing plate 3 comprises a lower horizontal part and an upper vertical part, a sliding block 19 is arranged inside the upper vertical part of the fixing plate 3, a first connecting rod 13 is arranged on the surface of the upper vertical part of the fixing plate 3, one end of the first connecting rod 13 penetrates through the surface of the fixing plate 3 and is connected with the sliding block 19, a limiting mechanism 4 is arranged at the end part, far away from the fixing plate 3, of the first connecting rod 13, the limiting mechanism 4 comprises a fixing block 14, a second connecting rod 15 and a sliding block 16, three winding posts 17 are arranged on the surface of the fixing block 14, a spring 18 is arranged inside the end part of the sliding block 16, a stabilizing mechanism is arranged at the top of the upper vertical part of the fixing plate 3, the stabilizing mechanism comprises a rotary rod 5, a sliding block, the first connecting rod 13 and the rotating rod 5 are both connected with the fixed plate 3 in a sliding way.

In this embodiment, the movable chamber has been seted up to the inside of sliding block 16 tip, spring 18 is located the movable chamber, the tip that second connecting rod 15 is located the movable chamber is "T" type structure, spring 18 one end is connected with sliding block 16 and the other end is connected with second connecting rod 15, second connecting rod 15 keeps away from sliding block 16's tip and fixed block 14 and is connected, sliding block 16, second connecting rod 15 sliding connection, sliding block 16 has seted up three circular slot with 14 opposite on the surface of fixed block, wrapping post 17 matches with the circular slot, the part of wire overlength encircles in wrapping post 17, the wire is in fixed block 14, by spacing fixed between sliding block 16, avoid the wire overlength to be torn, the condition that leads to the wire to tear off from the circuit board tester takes place.

In this embodiment, the top of swing arm 5 is "T" type structure, swing arm 5 runs through slider 6, the outside of swing arm 5 is equipped with the screw thread, swing arm 5 closes with slider 6 through the screw thread soon and is connected, the tip and the slider 6 side of lower bottom block 7 are connected, go up the tip that slider 6 was kept away from to dog 8 and be connected with lower bottom block 7 rotation, four half slots have been seted up on the surface of lower bottom block 7, the part that the wire is connected with the circuit board tester is located the half slot, and the wire is in lower bottom block 7, it is spacing fixed to go up between the dog 8, the stability that makes the wire be connected with the circuit board tester, make the circuit board test process comparatively stable.

Example 2

Referring to fig. 1 to 4, the present invention provides a technical solution: a testing device for integrated circuits comprises a device body 1, a panel 2 and a wire, wherein a fixing plate 3 is arranged on the surface of the panel 2, the fixing plate 3 comprises a lower horizontal part and an upper vertical part, a sliding block 19 is arranged inside the upper vertical part of the fixing plate 3, a first connecting rod 13 is arranged on the surface of the upper vertical part of the fixing plate 3, one end of the first connecting rod 13 penetrates through the surface of the fixing plate 3 and is connected with the sliding block 19, a limiting mechanism 4 is arranged at the end part, far away from the fixing plate 3, of the first connecting rod 13, the limiting mechanism 4 comprises a fixing block 14, a second connecting rod 15 and a sliding block 16, three winding posts 17 are arranged on the surface of the fixing block 14, a spring 18 is arranged inside the end part of the sliding block 16, a stabilizing mechanism is arranged at the top of the upper vertical part of the fixing plate 3, the stabilizing mechanism comprises a rotary rod 5, a sliding block, first connecting rod 13, swing arm 5 all with fixed plate 3 sliding connection, the wire is in fixed block 14, the sliding block 16 between by spacing fixed, avoid the wire overlength to be torn, the condition that leads to the wire to tear off from the circuit board tester takes place, the surface of device body 1 is equipped with shelters from mechanism 9, shelter from mechanism 9 and include two steady pieces 10, shielding plate 11, two bull stick 12, two steady pieces 10 distribute in the both sides avris position on device body 1 surface, shielding plate 11 is located between two steady pieces 10, shielding plate 11 covers 2 surperficial data sockets of panel and shelters from, avoid dust impurity to gather in the data socket, thereby take place to reduce the condition of the sensitivity of being connected between circuit board tester and the wire.

In this embodiment, the movable chamber has been seted up to the inside of sliding block 16 tip, spring 18 is located the movable chamber, the tip that second connecting rod 15 is located the movable chamber is "T" type structure, spring 18 one end is connected with sliding block 16 and the other end is connected with second connecting rod 15, second connecting rod 15 keeps away from sliding block 16's tip and fixed block 14 and is connected, sliding block 16, second connecting rod 15 sliding connection, sliding block 16 has seted up three circular slot with 14 opposite on the surface of fixed block, wrapping post 17 matches with the circular slot, the part of wire overlength encircles in the wrapping post 17 outside, the wire is in fixed block 14, by spacing fixed between sliding block 16, avoid the wire overlength to be pulled, the condition that leads to the wire to tear off from the circuit board tester takes place.

In this embodiment, sliding block is connected with movable block 20 in the piece that stabilizes 10, movable block 20 is "T" type structure, the tip embedding shielding plate 11 avris surface of movable block 20 is inside, bull stick 12 rotates with the top of the piece that stabilizes 10 to be connected, the draw-in groove of semicircle form is seted up on the surface of shielding plate 11, bull stick 12 matches with the draw-in groove, shielding plate 11 covers 2 surperficial data sockets of panel and shelters from, avoid dust impurity to gather in the data socket, thereby the condition of the sensitivity of being connected between emergence reduction circuit board tester and the wire.

The utility model discloses a theory of operation and use flow:

when a circuit board tester is used for testing a circuit board, the fixed block 14 is pinched and slides to a proper position along the length direction of the fixed plate 3, the first connecting rod 13 drives the sliding block 19 to move, the rotary rod 5 moves along the same direction of the sliding block 19, the sliding block 16 is pinched and pulled outwards, the spring 18 is in a contraction state, the overlong part of the wire is surrounded outside the winding post 17, the sliding block 16 is loosened, the spring 18 is stretched from the contraction state, the wire is limited and fixed between the fixed block 14 and the sliding block 16, and the phenomenon that the wire is overlong and pulled to cause the wire to be torn off from the circuit board tester is avoided;

in addition, the rotary rod 5 is pinched and rotates clockwise from left to right, the sliding block 6 and the lower bottom block 7 move up to proper positions, the part of the lead connected with the circuit board tester is positioned in the upper semicircular groove of the lower bottom block 7, the upper stop block 8 rotates and is attached to the lower bottom block 7, and the lead is limited and fixed between the lower bottom block 7 and the upper stop block 8, so that the lead is stably connected with the circuit board tester, and the circuit board testing process is stable;

the rotating rod 12 and the rotating rod 12 are rotated to leave the baffle plate 11, the baffle plate 11 moves downwards, the moving block 20 is connected with the stabilizing block 10 in a sliding clamping mode, the baffle plate 11 covers and shields the surface data socket of the panel 2, dust and impurities are prevented from accumulating in the data socket, and therefore the situation that the sensitivity of connection between the circuit board tester and a lead is reduced is achieved.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims.

Claims

1. A testing device for integrated circuits comprises a device body (1), a panel (2) and a lead, and is characterized in that: the surface of panel (2) is equipped with fixed plate (3), fixed plate (3) are including lower horizontal portion, vertical portion of going up, the inside of vertical portion is equipped with slip square (19) on fixed plate (3), the surface of vertical portion is equipped with head rod (13) on fixed plate (3), the tip that fixed plate (3) were kept away from in head rod (13) is equipped with stop gear (4), stop gear (4) are including fixed block (14), second connecting rod (15), sliding block (16), the surface of fixed block (14) is equipped with three wrapping post (17), the inside of sliding block (16) tip is equipped with spring (18), the top of vertical portion is equipped with stabilizing mean on fixed plate (3), stabilizing mean includes swing arm (5), slider (6), bottom block (7) down, goes up dog (8).

2. A test apparatus for an integrated circuit as defined in claim 1, wherein: smooth chamber has been seted up to vertical portion's inside under fixed plate (3), slip square (19) are located smooth intracavity, fixed plate (3) surface is passed and the other end is connected with fixed block (14) with slip square (19) to head rod (13) one end, fixed plate (3) top is passed and the fixed block (19) is connected to swing arm (5) bottom, head rod (13), swing arm (5) all with fixed plate (3) sliding connection.

3. A test apparatus for an integrated circuit as defined in claim 1, wherein: the movable cavity has been seted up to the inside of sliding block (16) tip, spring (18) are located the activity intracavity, the tip that second connecting rod (15) are located the activity intracavity is "T" type structure, spring (18) one end is connected and the other end is connected with second connecting rod (15) with sliding block (16), the tip that sliding block (16) were kept away from in second connecting rod (15) is connected with fixed block (14), sliding block (16), second connecting rod (15) sliding connection.

4. A test apparatus for an integrated circuit as defined in claim 1, wherein: three circular grooves are formed in the opposite surfaces of the sliding block (16) and the fixed block (14), and the winding posts (17) are matched with the circular grooves.

5. A test apparatus for an integrated circuit as defined in claim 1, wherein: the top of swing arm (5) is "T" type structure, swing arm (5) run through slider (6), the outside of swing arm (5) is equipped with the screw thread, swing arm (5) close with slider (6) soon through the screw thread and are connected, the tip and the slider (6) side of bottom block (7) are connected down, go up the tip that slider (6) were kept away from in dog (8) and rotate with bottom block (7) down and be connected, four semicircular grooves have been seted up on the surface of bottom block (7) down.

6. A test apparatus for an integrated circuit as defined in claim 1, wherein: the surface of device body (1) is equipped with shelters from mechanism (9), shelter from mechanism (9) and include two stabilizing block (10), shielding plate (11), two bull stick (12), two stabilizing block (10) distribute in the both sides avris position on device body (1) surface, shielding plate (11) are located between two stabilizing block (10).

7. The test apparatus of claim 6, wherein: the fixing device is characterized in that a moving block (20) is connected to the fixing block (10) in a sliding clamping mode, the moving block (20) is of a T-shaped structure, the end portion of the moving block (20) is embedded into the side surface of the shielding plate (11), the rotating rod (12) is rotatably connected with the top of the fixing block (10), a semicircular clamping groove is formed in the surface of the shielding plate (11), and the rotating rod (12) is matched with the clamping groove.