CN212462211U - Automatic plug-pull test structure of memory card - Google Patents
Automatic plug-pull test structure of memory card Download PDFInfo
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- CN212462211U CN212462211U CN202021314352.1U CN202021314352U CN212462211U CN 212462211 U CN212462211 U CN 212462211U CN 202021314352 U CN202021314352 U CN 202021314352U CN 212462211 U CN212462211 U CN 212462211U
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Abstract
The utility model discloses an automatic plug test structure of RAM card, including unable adjustment base, guide tracked slider, slider-crank transmission, the fixed RAM card block device of elasticity, card reading device, elasticity fine motion buffer and plug test drive arrangement, unable adjustment base is the setting of L shaped plate form. The utility model belongs to the technical field of the RAM card detection device, specifically, automatic plug test structure of RAM card, adopt slider-crank and the mode that the elasticity fine setting transmission combined together, realized the technological effect to the automatic plug of RAM card, guide tracked block removes, realized the technological effect to the accurate location plug of RAM card, the setting of the fixed RAM card block device of elasticity, can carry out embedded block and elasticity chucking to the RAM card, it is poor effectively to have solved the automatic plug test structure effect of RAM card on the existing market, and self structure is complicated, maintain comparatively inconvenient problem.
Description
Technical Field
The utility model belongs to the technical field of the RAM card detection device, specifically indicate the automatic plug test structure of RAM card.
Background
In the prior art, a memory card test generally adopts a manual mode to plug and unplug a memory card, which is inconvenient to operate, low in efficiency, labor-consuming, and prone to have some adverse consequences due to human factors, for example, an operator does not plug the memory card in place, which results in a poor test result, or the operator uses too much force to plug and unplug the memory card, which results in damage to the memory card or the slot, and the like. In order to overcome the defects, the utility model provides an automatic plug test structure of RAM card, the utility model discloses an automatic plug test structure of RAM card has realized the automatic plug of RAM card when the test of RAM card, has liberated the manpower, has also avoided the bad consequence because of human factor leads to, and is efficient moreover, the utility model discloses structural design is simple reasonable, easy to carry out.
SUMMERY OF THE UTILITY MODEL
To the above situation, for overcoming prior art's defect, the utility model provides an automatic plug test structure of RAM card adopts slider-crank and the mode that the elasticity fine setting transmission combined together, realized the technological effect to the automatic plug of RAM card, guide tracked block removes, realized the technological effect to the accurate location plug of RAM card, the setting of the fixed RAM card block device of elasticity, can carry out embedded block and elasticity chucking to the RAM card, it is poor effectively to have solved the automatic plug test structure effect of RAM card on the existing market, and self structure is complicated, maintain comparatively inconvenient problem.
The utility model adopts the following technical scheme: the utility model relates to an automatic plug-in test structure of a memory card, which comprises a fixed base, a guide rail type sliding device, a crank block transmission device, an elastic fixed memory card clamping device, a card reading device, an elastic micro-motion buffer device and a plug-in test driving device, the fixed base is arranged in an L-shaped plate shape, the guide rail type sliding device is arranged on the upper wall of the fixed base, the plug-in test driving device is arranged on the upper wall of the fixed base, the crank block transmission device is respectively connected with the elastic micro-motion buffer device and the plug-in test driving device, the elastic fixed memory card clamping device is arranged on the upper wall of the guide rail type sliding device, the card reading device is arranged on the upper wall of the fixed base, the card reading device and the elastic fixed memory card clamping device are correspondingly arranged, and the elastic micro-motion buffer device is arranged on the guide rail type sliding device and is connected with the crank sliding block transmission device.
Further, the guide rail type sliding device comprises a sliding guide rail, a clamping sliding piece and a sliding bearing plate, the sliding guide rail is arranged on the upper wall of the fixed base, the clamping sliding piece is clamped and slidably arranged on the sliding guide rail, and the sliding bearing plate is arranged on the upper wall of the clamping sliding piece.
Furthermore, the elastic micro-motion buffer device comprises a micro-motion sliding piece, a fixing plate, a micro-motion spring and a clamping sliding block, wherein the micro-motion sliding piece is arranged on the upper wall of the sliding bearing plate, the clamping sliding block is arranged in the micro-motion sliding piece in a clamping and sliding manner, the fixing plate is arranged on the upper wall of the sliding bearing plate and is respectively arranged on two sides of the micro-motion sliding piece, and the micro-motion spring is arranged between the fixing plate and the clamping sliding block.
Further, slider-crank transmission includes axis of rotation, crank connecting rod and drive carousel, the axis of rotation rotates and locates on the block sliding block, the one end of crank connecting rod links to each other with the axis of rotation, the drive carousel links to each other with plug test drive arrangement, be equipped with waist type regulation hole on the drive carousel, the other end and the waist type of crank connecting rod are adjusted the hole block and are slided and link to each other.
Further, elasticity fixed memory card block device is including fixed block board, the spacing block groove of memory card, rotation pressure strip, block mouth and elasticity fastener, fixed block board is located on the slip loading board upper wall, the even interval arrangement in the spacing block groove of memory card is located on fixed block board upper wall, it locates on the fixed block board upper wall to rotate the pressure strip, the block mouth is located in fixed block board, elasticity fastener is located on the rotation pressure strip diapire, elasticity fastener elasticity block is located in the block mouth to fix compressing tightly the memory card.
Furthermore, the card reading device is provided with memory card reading slots, and the number of the memory card reading slots is equal to the number of the memory card limiting clamping slots.
Furthermore, a limit column is arranged on one side wall of the fixed base close to the card reading device, and the limit column can effectively prevent the memory card from being inserted too deeply to influence the test result.
Further, plug test drive arrangement includes fixed hoop, driving motor, planetary reducer, output shaft, shaft coupling, bearing support and square shaft, fixed hoop is located on the unable adjustment base upper wall, driving motor locates on the unable adjustment base upper wall and locates in the fixed hoop, planetary reducer links to each other with driving motor, the output shaft links to each other with planetary reducer, the shaft coupling links to each other with the output shaft, bearing support cup joints on locating the output shaft, the square shaft links to each other with the output of output shaft, the drive carousel links to each other with the square shaft.
Adopt above-mentioned structure the utility model discloses the beneficial effect who gains as follows: this scheme automatic plug test structure of RAM card adopts slider-crank and the mode that elasticity fine setting transmission combined together, has realized the technological effect to the automatic plug of memory card, and guide tracked block removes, has realized the technological effect to the accurate location plug of memory card, and the setting of the fixed RAM card clamping device of elasticity can carry out embedded block and elasticity chucking to the memory card, and it is poor effectively to have solved the automatic plug test structure effect of memory card in the existing market, and self structure is complicated, maintains comparatively inconvenient problem.
Drawings
Fig. 1 is a schematic diagram of an overall structure of the automatic memory card plugging and unplugging test structure of the present invention;
fig. 2 is a top view of the memory card automatic plugging test structure of the present invention;
fig. 3 is a right side view of the memory card automatic plugging and unplugging test structure of the present invention;
fig. 4 is a rear view of the memory card automatic plugging/unplugging test structure of the present invention;
fig. 5 is a left side view of the memory card automatic plugging/unplugging test structure of the present invention;
fig. 6 is a schematic structural view of the elastic fixed memory card engaging device of the memory card automatic plug-in and pull-out test structure of the present invention;
fig. 7 is a cross-sectional view of the automatic plug test structure of the memory card of the present invention.
Wherein, 1, a fixed base, 2, a guide rail type sliding device, 3, a crank sliding block transmission device, 4, an elastic fixed memory card clamping device, 5, a card reading device, 6, an elastic micro-motion buffer device, 7, a plug test driving device, 8, a sliding guide rail, 9, a clamping sliding piece, 10, a sliding bearing plate, 11, a micro-motion sliding piece, 12, a fixed plate, 13, a micro-motion spring, 14, a clamping sliding block, 15, a rotating shaft, 16, a crank connecting rod, 17, the device comprises a driving turntable, 18, a waist-shaped adjusting hole, 19, a fixing clamping plate, 20, a memory card limiting clamping groove, 21, a rotating pressing plate, 22, a clamping opening, 23, an elastic clamping piece, 24, a memory card reading groove, 25, a limiting column, 26, a fixing hoop, 27, a driving motor, 28, a planetary reducer, 29, an output shaft, 30, a coupling, 31, a bearing support, 32 and a square shaft.
The accompanying drawings are included to provide a further understanding of the invention, and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention, and together with the description serve to explain the invention and not to limit the invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments; based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
As shown in fig. 1-7, the memory card automatic plugging and unplugging test structure of the present invention comprises a fixed base 1, a guide rail type sliding device 2, a slider-crank transmission device 3, an elastic fixed type memory card clamping device 4, a card reading device 5, an elastic inching buffer device 6 and a plugging and unplugging test driving device 7, wherein the fixed base 1 is arranged in an L-shaped plate shape, the guide rail type sliding device 2 is arranged on the upper wall of the fixed base 1, the plugging and unplugging test driving device 7 is arranged on the upper wall of the fixed base 1, the slider-crank transmission device 3 is respectively connected with the elastic inching buffer device 6 and the plugging and unplugging test driving device 7, the elastic fixed type memory card clamping device 4 is arranged on the upper wall of the guide rail type sliding device 2, the card reading device 5 is arranged on the upper wall of the fixed base 1, the card reading device 5 is arranged corresponding to the, the elastic micro-motion buffer device 6 is arranged on the guide rail type sliding device 2 and is connected with the crank block transmission device 3.
The guide rail type sliding device 2 comprises a sliding guide rail 8, a clamping sliding part 9 and a sliding bearing plate 10, wherein the sliding guide rail 8 is arranged on the upper wall of the fixed base 1, the clamping sliding part 9 is arranged on the sliding guide rail 8 in a clamping sliding mode, and the sliding bearing plate 10 is arranged on the upper wall of the clamping sliding part 9.
The elastic micro-motion buffer device 6 comprises a micro-motion slider 11, a fixing plate 12, a micro-motion spring 13 and a clamping sliding block 14, wherein the micro-motion slider 11 is arranged on the upper wall of the sliding bearing plate 10, the clamping sliding block 14 is arranged in the micro-motion slider 11 in a clamping and sliding manner, the fixing plate 12 is arranged on the upper wall of the sliding bearing plate 10 and is respectively arranged at two sides of the micro-motion slider 11, and the micro-motion spring 13 is arranged between the fixing plate 12 and the clamping sliding block 14.
Elastic fixed memory card clamping device 4 includes fixed block board 19, the spacing block groove 20 of memory card, rotates closing plate 21, block mouth 22 and elasticity fastener 23, fixed block board 19 is located on the 10 upper walls of slip loading board, the even interval arrangement in the spacing block groove 20 of memory card is located on fixed block board 19 upper walls, rotate closing plate 21 and rotate and locate on fixed block board 19 upper walls, block mouth 22 is located in fixed block board 19, elasticity fastener 23 is located on rotating closing plate 21 diapire, elasticity fastener 23 elasticity fastener is located in block mouth 22 to fix compressing tightly the memory card.
The card reading device 5 is provided with memory card reading slots 24, and the number of the memory card reading slots 24 is equal to the number of the memory card limiting clamping slots 20.
A limit column 25 is arranged on one side wall of the fixed base 1 close to the card reading device 5, and the limit column 25 can effectively prevent the memory card from being inserted too deeply to influence the test result.
Plug test drive arrangement 7 includes fixed hoop 26, driving motor 27, planetary reducer 28, output shaft 29, shaft coupling 30, bearing support 31 and square shaft 32, fixed hoop 26 is located on unable adjustment base 1 upper wall, driving motor 27 is located on unable adjustment base 1 upper wall and is located in fixed hoop 26, planetary reducer 28 links to each other with driving motor 27, output shaft 29 links to each other with planetary reducer 28, shaft coupling 30 links to each other with output shaft 29, bearing support 31 cup joints and locates on output shaft 29, square shaft 32 links to each other with output shaft 29's output, drive carousel 17 links to each other with square shaft 32.
When the memory card reading device is used, a user places a memory card to be inserted into the memory card limiting clamping groove 20, rotates and rotates the pressing plate 21, aligns the elastic clamping piece 23 with the clamping opening 22 and clamps the memory card in the clamping opening 22 to press and fix the memory card, starts the driving motor 27, rotates and drives the square shaft 32 to rotate, rotates and drives the driving turntable 17 to rotate, rotates and drives the crank connecting rod 16 to rotate, rotates and drives the rotating shaft 15 to rotate, rotates and drives the clamping sliding block 14 to reciprocate along the micro sliding piece 11 to drive the sliding bearing plate 10 to reciprocate, moves and drives the clamping sliding piece 9 to reciprocate along the sliding guide rail 8 to drive the elastic fixed memory card clamping device 4 to reciprocate, so as to clamp the memory card into the memory card reading groove 24 and read by the card reading device 5, spacing post 25 is spacing to the depth of insertion of memory card simultaneously, it is above that the utility model discloses holistic work flow, repeat this step when using next time can.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
The present invention and the embodiments thereof have been described above, but the description is not limited thereto, and the embodiment shown in the drawings is only one of the embodiments of the present invention, and the actual structure is not limited thereto. In summary, those skilled in the art should understand that they should not be limited to the embodiments described above, and that they can design the similar structure and embodiments without departing from the spirit of the invention.
Claims (8)
1. Automatic plug test structure of memory card, its characterized in that: including unable adjustment base, guide rail type slider, slider-crank transmission, the fixed memory card block device of elasticity, card reading device, elasticity fine motion buffer and plug test drive arrangement, unable adjustment base is the setting of L shape plate form, guide rail type slider locates on the unable adjustment base upper wall, plug test drive arrangement locates on the unable adjustment base upper wall, slider-crank transmission links to each other with elasticity fine motion buffer and plug test drive arrangement respectively, the fixed memory card block device of elasticity locates on the guide rail type slider upper wall, card reading device locates on the unable adjustment base upper wall, card reading device corresponds the setting with the fixed memory card block device of elasticity, elasticity fine motion buffer locates on the guide rail type slider and links to each other with slider-crank transmission.
2. The automatic plug-in test structure for memory cards according to claim 1, characterized in that: the guide rail type sliding device comprises a sliding guide rail, a clamping sliding piece and a sliding bearing plate, wherein the sliding guide rail is arranged on the upper wall of the fixed base, the clamping sliding piece is clamped and slidably arranged on the sliding guide rail, and the sliding bearing plate is arranged on the upper wall of the clamping sliding piece.
3. The automatic plug-in test structure for memory cards according to claim 2, characterized in that: the elastic micro-motion buffer device comprises a micro-motion sliding piece, a fixing plate, a micro-motion spring and a clamping sliding block, wherein the micro-motion sliding piece is arranged on the upper wall of the sliding bearing plate, the clamping sliding block is arranged in the micro-motion sliding piece in a clamping and sliding mode, the fixing plate is arranged on the upper wall of the sliding bearing plate and is respectively arranged on two sides of the micro-motion sliding piece, and the micro-motion spring is arranged between the fixing plate and the clamping.
4. The automatic plug-in test structure for memory cards according to claim 3, characterized in that: crank block transmission includes axis of rotation, crank connecting rod and drive carousel, the axis of rotation rotates and locates on the block sliding block, the one end of crank connecting rod links to each other with the axis of rotation, the drive carousel links to each other with plug test drive arrangement, be equipped with waist type regulation hole on the drive carousel, the other end and the waist type of crank connecting rod are adjusted the hole block and are slided and link to each other.
5. The automatic plug-in test structure for memory cards according to claim 4, characterized in that: elastic fixation type memory card clamping device comprises a fixed clamping plate, a memory card limiting clamping groove, a rotating pressing plate, a clamping opening and an elastic clamping piece, wherein the fixed clamping plate is arranged on the upper wall of the sliding bearing plate, the memory card limiting clamping groove is uniformly arranged on the upper wall of the fixed clamping plate at intervals, the rotating pressing plate is arranged on the upper wall of the fixed clamping plate in a rotating mode, the clamping opening is arranged in the fixed clamping plate, the elastic clamping piece is arranged on the bottom wall of the rotating pressing plate, and the elastic clamping piece is elastically clamped in the clamping opening.
6. The automatic plug-in test structure for memory cards according to claim 5, characterized in that: the card reading device is provided with memory card reading slots, and the number of the memory card reading slots is equal to the number of the memory card limiting clamping slots.
7. The automatic plug-in test structure for memory cards according to claim 6, characterized in that: and a limiting column is arranged on one side wall of the fixed base close to the card reading device.
8. The automatic plug-in test structure for memory cards according to claim 7, characterized in that: plug test drive arrangement includes fixed hoop, driving motor, planetary reducer, output shaft, shaft coupling, bearing support and square shaft, fixed hoop is located on the unable adjustment base upper wall, driving motor locates on the unable adjustment base upper wall and locates in the fixed hoop, planetary reducer links to each other with driving motor, the output shaft links to each other with planetary reducer, the shaft coupling links to each other with the output shaft, bearing support cup joints on locating the output shaft, the square shaft links to each other with the output of output shaft, the drive carousel links to each other with the square shaft.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021314352.1U CN212462211U (en) | 2020-07-07 | 2020-07-07 | Automatic plug-pull test structure of memory card |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021314352.1U CN212462211U (en) | 2020-07-07 | 2020-07-07 | Automatic plug-pull test structure of memory card |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN212462211U true CN212462211U (en) | 2021-02-02 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202021314352.1U Active CN212462211U (en) | 2020-07-07 | 2020-07-07 | Automatic plug-pull test structure of memory card |
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| Country | Link |
|---|---|
| CN (1) | CN212462211U (en) |
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2020
- 2020-07-07 CN CN202021314352.1U patent/CN212462211U/en active Active
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Address after: 518000 1st floor, 105-16 huanguan South Road, Dahe community, Guanlan street, Longhua New District, Shenzhen City, Guangdong Province Patentee after: Shenzhen Shili Semiconductor Technology Co.,Ltd. Address before: 518000 1st floor, 105-16 huanguan South Road, Dahe community, Guanlan street, Longhua New District, Shenzhen City, Guangdong Province Patentee before: Shenzhen Shili coastal Technology Co.,Ltd. |
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| TR01 | Transfer of patent right |
Effective date of registration: 20220415 Address after: 518000 workshop 501-601, No. 1, Qixin science and Technology Park, No. 18, Jinxiu Middle Road, Laokeng community, Longtian street, Pingshan District, Shenzhen City, Guangdong Province Patentee after: Shenzhen quantian Technology Co.,Ltd. Address before: 518000 1st floor, 105-16 huanguan South Road, Dahe community, Guanlan street, Longhua New District, Shenzhen City, Guangdong Province Patentee before: Shenzhen Shili Semiconductor Technology Co.,Ltd. |