CN212418018U - Electronic information engineering is test bench for specialty - Google Patents

Electronic information engineering is test bench for specialty Download PDF

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Publication number
CN212418018U
CN212418018U CN202021072905.7U CN202021072905U CN212418018U CN 212418018 U CN212418018 U CN 212418018U CN 202021072905 U CN202021072905 U CN 202021072905U CN 212418018 U CN212418018 U CN 212418018U
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CN
China
Prior art keywords
test bench
main part
electronic information
sliding
bench main
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Expired - Fee Related
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CN202021072905.7U
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Chinese (zh)
Inventor
常凯凯
常婷婷
王开禄
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Individual
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Individual
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Priority to CN202021072905.7U priority Critical patent/CN212418018U/en
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Abstract

The utility model discloses a test bench for electronic information engineering specialty relates to test bench technical field, including the test bench main part, the internally mounted of test bench main part has a horizontal partition, and the inside of test bench main part is provided with placement machine and constructs, and the installation stage body is installed at the top of test bench main part, goes up the inside sliding display mechanism that is provided with of installation stage body, and the PLC test board is installed at test bench main part top, and the top of test bench main part and the internally mounted who is located the installation stage body have the rack, and one side that test bench main part top is close to the rack installs mouse pad, the beneficial effects of the utility model are that: this electronic information engineering is test bench for specialty through the use have PLC test panel and slide display mechanism and the test bench of rack, can be better carry out special study to PLC, the learning efficiency of enhancement PLC that can be better, it is more convenient to compare in the electronic information engineering specialty test bench of using at present.

Description

Electronic information engineering is test bench for specialty
Technical Field
The utility model relates to a test bench technical field specifically is a test bench is used to electronic information engineering specialty.
Background
Electronic information engineering is a subject of electronic information control and information processing by applying modern technologies such as computers, and mainly researches acquisition and processing of information, design, development, application and integration of electronic equipment and information systems, and the electronic information engineering already covers many aspects of society. The electronic information engineering specialty is a specialty integrating modern electronic technology, information technology and communication technology, and the PLC, as an extremely important classification in the electronic information engineering, is widely applied to various fields in daily life, and a special test bed is needed to be used for testing when the PLC is learned, but at present, no test bed specially used for learning the PLC is available, so that the learning efficiency of the PLC is low, and the PLC is inconvenient to use.
SUMMERY OF THE UTILITY MODEL
Not enough to prior art, the utility model provides an electronic information engineering is test bench for specialty has solved the problem of proposing in the above-mentioned background art.
In order to achieve the above purpose, the utility model discloses a following technical scheme realizes: the utility model provides a test bench is used to electronic information engineering specialty, includes the test bench main part, the internally mounted of test bench main part has transverse partition, the inside of test bench main part is provided with the placement mechanism, the installation stage body is installed at the top of test bench main part, it is provided with the sliding display mechanism to go up the inside of installation stage body, the PLC test panel is installed at test bench main part top, the top of test bench main part and the internally mounted who is located the installation stage body have the rack, one side that test bench main part top is close to the rack is installed mouse pad, the light is installed at the top of going up installation stage body inner wall, the bottom supporting shoe is installed to the bottom of test bench main part.
Preferably, the placing mechanism comprises a vertical partition plate and a drawer, the vertical partition plate is installed inside the test bed main body and located above the transverse partition plate, connecting sliding grooves are formed in one side of the vertical partition plate and two sides corresponding to the test bed main body, connecting sliding blocks are installed on two sides corresponding to the drawer, the drawer is in sliding connection with the connecting sliding grooves through the connecting sliding blocks, and a bottom placing cabinet is arranged inside the test bed main body and below the transverse partition plate.
Preferably, the sliding display mechanism comprises a first sliding groove, a second sliding groove and an integrated hanging computer, the first sliding groove is formed in one side of the inside of the upper mounting table body, the second sliding groove is formed in the inside of the upper mounting table body and is positioned below the first sliding groove, a plurality of fixing holes are formed in the top and the bottom of the second sliding groove in the inside of the upper mounting table body, a first sliding block and a second sliding block are mounted on one side of the integrated hanging computer, the integrated hanging computer is respectively connected with the first sliding groove and the second sliding groove in a sliding mode through the first sliding block and the second sliding block, fixing columns are respectively connected with the top and the bottom of the inner wall of the second sliding block in a sliding mode, the two fixing columns respectively penetrate through the top and the bottom of the second sliding block, an inclined connecting block is mounted on one side, which the two fixing columns are close to each other, and a first spring is movably sleeved on the outer sides of the two, the second spring is installed to one side of second slider inner wall, trapezoidal connecting block is installed through one side of second spring to the second slider, the one side that the second spring was kept away from to trapezoidal connecting block is installed and is pressed the post.
Preferably, handles are mounted on one side of the drawer and one side of the bottom cabinet.
Preferably, a plurality of placing partition plates are installed inside the placing frame.
Preferably, the elastic force generated by the second spring is greater than the sum of the elastic forces generated by the two first springs.
The utility model provides an electronic information engineering test bench for specialty possesses following beneficial effect:
this electronic information engineering is test bench for specialty through the use have PLC test panel (6) and slide display mechanism and rack's test bench, can be better carry out special study to PLC, the study efficiency of reinforcing PLC that can be better, it is more convenient to compare in the electronic information engineering specialty test bench of using at present.
Drawings
FIG. 1 is a schematic structural view of the present invention;
fig. 2 is a cross-sectional view of the present invention;
fig. 3 is a schematic structural view of the sliding display mechanism of the present invention;
fig. 4 is a schematic structural view of a second slide block of the present invention;
fig. 5 is an enlarged view of a portion a in fig. 2 according to the present invention.
In the figure: 1. a test bed main body; 2. a transverse partition; 3. a placement mechanism; 31. a vertical partition plate; 32. connecting the sliding chute; 33. a drawer; 34. connecting the sliding block; 35. a handle; 36. a bottom placement cabinet; 4. an upper mounting table body; 5. a slide display mechanism; 51. a first chute; 52. a second chute; 53. a fixing hole; 54. an integrated hanging computer; 55. a first slider; 56. a second slider; 57. fixing a column; 58. an oblique connecting block; 59. a first spring; 510. a second spring; 511. a trapezoidal connecting block; 512. pressing the column; 6. a PLC test board; 7. placing a rack; 8. a mouse pad; 9. an illuminating lamp; 10. a bottom support block.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments.
Referring to fig. 1 to 5, the present invention provides a technical solution: a professional test bed for electronic information engineering comprises a test bed main body 1, a transverse partition plate 2 is installed inside the test bed main body 1, a placing mechanism 3 is arranged inside the test bed main body 1, the placing mechanism 3 comprises a vertical partition plate 31 and a drawer 33, the vertical partition plate 31 is installed inside the test bed main body 1 and is located above the transverse partition plate 2, connecting sliding grooves 32 are formed in one side of the vertical partition plate 31 and two corresponding sides of the test bed main body 1, connecting sliding blocks 34 are installed on two corresponding sides of the drawer 33, the drawer 33 is in sliding connection with the connecting sliding grooves 32 through the connecting sliding blocks 34, a bottom placing cabinet 36 is arranged inside the test bed main body 1 and below the transverse partition plate 2, handles 35 are installed on one side of the drawer 33 and one side of the bottom placing cabinet 36, the drawer 33 and the handles 35 can be conveniently pulled, sundries and test supplies can be conveniently placed, an upper mounting table body 4 is installed on the top of the test bed main, the upper mounting table body 4 is internally provided with a sliding display mechanism 5, the sliding display mechanism 5 comprises a first sliding groove 51, a second sliding groove 52 and an integrated hanging computer 54, the first sliding groove 51 is arranged at one side inside the upper mounting table body 4, the second sliding groove 52 is arranged inside the upper mounting table body 4 and is positioned below the first sliding groove 51, the upper mounting table body 4 is internally provided with a plurality of fixing holes 53 at the top and the bottom of the second sliding groove 52, one side of the integrated hanging computer 54 is provided with a first sliding block 55 and a second sliding block 56, the integrated hanging computer 54 is respectively connected with the first sliding groove 51 and the second sliding groove 52 in a sliding way through the first sliding block 55 and the second sliding block 56, the top and the bottom of the inner wall of the second sliding block 56 are respectively connected with fixing columns 57 in a sliding way, the two fixing columns 57 respectively penetrate through the top and the bottom of the second sliding block 56, one sides of the two fixing columns 57 close to each, the outer sides of the two fixed columns 57 and the inner side of the second sliding block 56 are movably sleeved with first springs 59, one side of the inner wall of the second sliding block 56 is provided with a second spring 510, the elastic force generated by the second spring 510 is larger than the sum of the elastic forces generated by the two first springs 59, the inclined connecting block 58 can be pushed out by utilizing a trapezoidal connecting block 511, the trapezoidal connecting block 511 is arranged on one side of the second sliding block 56 passing through the second spring 510, a pressing column 512 is arranged on one side of the trapezoidal connecting block 511 far away from the second spring 510 to facilitate moving and fixing the position of the integrated hanging computer 54, the top of the test bed main body 1 is provided with a PLC test board 6, the top of the test bed main body 1 and the inner side of the upper mounting table body 4 are provided with a placing frame 7, the placing frame 7 is internally provided with a plurality of placing partition plates for placing more test elements and facilitating taking the elements, one side of the top of the test bed main body, the top of the inner wall of the upper mounting table body 4 is provided with an illuminating lamp 9, and the bottom of the test bed main body 1 is provided with a bottom supporting block 10.
In conclusion, when the test stand for electronic information engineering major is used, components and circuits required in learning can be placed on the placing frame 7, a PLC test can be performed through the PLC test board 6, when a program is input and programmed by using the integrated hanging type computer 54, the pressing column 512 can be pressed inwards, so that the inclined connecting block 58 can move inwards under the action of the elastic force of the first spring 59, the fixing column 57 is separated from the inside of the fixing hole 53, the position of the integrated hanging type computer 54 is moved, when the test stand is moved to a proper position, the pressing column 512 can be released, the trapezoidal connecting block 511 is ejected outwards under the action of the elastic force of the second spring 510, the fixing column 57 is continuously inserted into the inside of the fixing hole 53 and fixes the position of the integrated hanging type computer 54, and the movement of the position of the integrated hanging type computer 54 is more flexible, the use is more convenient.
The above, only be the concrete implementation of the preferred embodiment of the present invention, but the protection scope of the present invention is not limited thereto, and any person skilled in the art is in the technical scope of the present invention, according to the technical solution of the present invention and the utility model, the concept of which is equivalent to replace or change, should be covered within the protection scope of the present invention.

Claims (6)

1. The utility model provides a test bench is used to electronic information engineering specialty, includes test bench main part (1), its characterized in that: the utility model discloses a test bench, including test bench main part (1), the internally mounted of test bench main part (1) has transverse partition board (2), the inside of test bench main part (1) is provided with placement mechanism (3), install mounting table body (4) at the top of test bench main part (1), it has slide display mechanism (5) to go up inside mounting table body (4), PLC test board (6) are installed at test bench main part (1) top, the top of test bench main part (1) and the internally mounted who is located mounting table body (4) have rack (7), mouse pad (8) are installed to one side that test bench main part (1) top is close to rack (7), light (9) are installed at the top of going up mounting table body (4) inner wall, bottom supporting shoe (10) are installed to the bottom of test bench main part (1).
2. The professional test bench of electronic information engineering of claim 1, characterized in that: placing mechanism (3) include vertical baffle (31) and drawer (33), vertical baffle (31) are installed in test bench main part (1) inside and are located the top of horizontal baffle (2), connection spout (32) have all been seted up to one side of vertical baffle (31) and the corresponding both sides of test bench main part (1), link block (34) are all installed to the corresponding both sides of drawer (33), drawer (33) are through link block (34) and link spout (32) sliding connection, the inside of test bench main part (1) and the below that is located horizontal baffle (2) are provided with end and place cabinet (36).
3. The professional test bench of electronic information engineering of claim 1, characterized in that: the sliding display mechanism (5) comprises a first sliding groove (51), a second sliding groove (52) and an integrated hanging computer (54), the first sliding groove (51) is formed in one side inside the upper mounting table body (4), the second sliding groove (52) is formed in the upper mounting table body (4) and is located below the first sliding groove (51), a plurality of fixing holes (53) are formed in the top and the bottom of the second sliding groove (52) inside the upper mounting table body (4), a first sliding block (55) and a second sliding block (56) are installed on one side of the integrated hanging computer (54), the integrated hanging computer (54) is respectively in sliding connection with the first sliding groove (51) and the second sliding groove (52) through the first sliding block (55) and the second sliding block (56), and fixing columns (57) are respectively in sliding connection with the top and the bottom of the inner wall of the second sliding block (56), two fixed column (57) run through the top and the bottom of second slider (56) respectively, two slant connecting block (58) are all installed to one side that fixed column (57) are close to each other, two the outside of fixed column (57) and the inside activity that is located second slider (56) have cup jointed first spring (59), second spring (510) are installed to one side of second slider (56) inner wall, trapezoidal connecting block (511) is installed through one side of second spring (510) in second slider (56), one side that second spring (510) were kept away from in trapezoidal connecting block (511) is installed and is pressed post (512).
4. The test bed for electronic information engineering speciality of claim 2, wherein: handles (35) are arranged on one side of the drawer (33) and one side of the bottom placing cabinet (36).
5. The professional test bench of electronic information engineering of claim 1, characterized in that: a plurality of placing partition plates are arranged in the placing rack (7).
6. The professional test bench of electronic information engineering of claim 3, characterized in that: the elastic force generated by the second spring (510) is larger than the sum of the elastic forces generated by the two first springs (59).
CN202021072905.7U 2020-06-11 2020-06-11 Electronic information engineering is test bench for specialty Expired - Fee Related CN212418018U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202021072905.7U CN212418018U (en) 2020-06-11 2020-06-11 Electronic information engineering is test bench for specialty

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202021072905.7U CN212418018U (en) 2020-06-11 2020-06-11 Electronic information engineering is test bench for specialty

Publications (1)

Publication Number Publication Date
CN212418018U true CN212418018U (en) 2021-01-29

Family

ID=74272802

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202021072905.7U Expired - Fee Related CN212418018U (en) 2020-06-11 2020-06-11 Electronic information engineering is test bench for specialty

Country Status (1)

Country Link
CN (1) CN212418018U (en)

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CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20210129

CF01 Termination of patent right due to non-payment of annual fee