CN212410014U - Test fixture - Google Patents
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- CN212410014U CN212410014U CN202020485355.5U CN202020485355U CN212410014U CN 212410014 U CN212410014 U CN 212410014U CN 202020485355 U CN202020485355 U CN 202020485355U CN 212410014 U CN212410014 U CN 212410014U
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Abstract
A test fixture is used for carrying out a slight drop test on a battery and comprises a base, a cover plate and a fixing jig, wherein the base is provided with a groove; the cover plate is covered on the base, and the cover plate is detachably connected with the base; the fixing jig is located in the groove and connected with the base, the fixing jig is provided with a containing groove, and the containing groove is used for containing a battery so as to carry out slight drop test on the battery. Because the test fixture comprises the base, the cover plate and the fixed fixture parts, the mode that the traditional test fixture adopts a mobile phone real machine to carry out slight drop test is changed, the cost of the slight drop test is greatly reduced, and the problem of higher test cost of the slight drop test is solved. Because the base can be dismantled with the apron and be connected, fixed tool is located the recess of base and is connected with the base, and the battery that awaits measuring can be arranged in the holding tank of fixed tool in to drop the test a little to the battery, to the battery of different models, can change different fixed tools can, improved the convenience and the suitability that test fixture carries out the drop test a little.
Description
Technical Field
The utility model relates to a battery manufacturing field especially relates to a test fixture.
Background
The micro-drop test of the lithium ion battery is used as an important test item for detecting whether the battery performance is qualified in the battery production process. In the traditional aspect of slight drop test of the battery, the whole mobile phone containing the battery is placed into a slight drop tester for testing.
However, the frequency of the slight drop test is high, and a mobile phone with a matched model is used for each slight drop test. The slight drop test is a destructive test, and the mobile phone is scrapped and cannot be used after the test is finished, so that the problem of high test cost of the slight drop test is caused.
SUMMERY OF THE UTILITY MODEL
The utility model aims at overcoming the weak point among the prior art, provide a test fixture that test cost is lower.
The purpose of the utility model is realized through the following technical scheme:
a test fixture for performing a micro-drop test on a battery, the test fixture comprising:
the base is provided with a groove;
the cover plate is covered on the base and is detachably connected with the base;
the fixing jig is located in the groove and connected with the base, a containing groove is formed in the fixing jig and used for containing the battery, and therefore the battery is subjected to slight drop test.
In one embodiment, the fixing jig is adhered to the base.
In one embodiment, the test fixture further comprises a locking member, the cover plate defines a first connecting hole, the base defines a second connecting hole, and the locking member is respectively inserted into the first connecting hole and the second connecting hole.
In one embodiment, the number of the locking members is multiple; the number of the first connecting holes and the number of the second connecting holes are multiple, the first connecting holes correspond to the second connecting holes one to one, and each locking piece penetrates through the corresponding first connecting holes and the corresponding second connecting holes respectively.
In one embodiment, a plurality of the locking members are spaced apart.
In one embodiment, the first connection hole and the second connection hole are both screw holes.
In one embodiment, an annular flange is formed at the periphery of the base, the cover plate is located in the area surrounded by the annular flange, and the cover plate is abutted to the annular flange.
In one embodiment, a gap exists between the fixing jig and the inner side wall of the groove.
In one embodiment, the receiving groove communicates with the recess.
In one embodiment, the fixing jig is a silicon plate.
Compared with the prior art, the utility model discloses at least, following advantage has:
1. because the test fixture comprises the base, the cover plate and the fixed fixture parts, the traditional test fixture is changed from a mode of carrying out slight drop test by adopting a mobile phone real machine, the cost of the slight drop test is greatly reduced, and the problem of higher test cost of the slight drop test is solved;
2. because the base can be dismantled with the apron and be connected, fixed tool is located the recess of base and is connected with the base, and the battery that awaits measuring can be arranged in the holding tank of fixed tool in to drop the test a little to the battery, to the battery of different models, can change different fixed tools can, improved the convenience and the suitability that test fixture carries out the drop test a little.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are required to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention, and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.
FIG. 1 is a schematic view of a test fixture according to an embodiment;
FIG. 2 is an exploded view of the test fixture of FIG. 1;
FIG. 3 is another exploded view of the test fixture of FIG. 2;
fig. 4 is an enlarged schematic view of the test fixture shown in fig. 2 at a.
Detailed Description
In order to facilitate understanding of the present invention, the present invention will be described more fully hereinafter with reference to the accompanying drawings. The preferred embodiments of the present invention are shown in the drawings. The invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
It will be understood that when an element is referred to as being "secured to" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. The terms "vertical," "horizontal," "left," "right," and the like as used herein are for illustrative purposes only and do not represent the only embodiments.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used herein in the description of the invention is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.
As shown in fig. 1 and 2, the test fixture 10 of one embodiment is used for performing a slight drop test on the battery 20. The test fixture 10 includes a base 100, a cover 200, and a fixing jig 300. The base 100 is formed with a recess 110. The cover plate 200 covers the base 100, and the cover plate 200 is detachably connected to the base 100, so that the cover plate 200 can be detached, the fixing jig 300 and the battery 20 to be tested can be replaced, and the convenience of the test fixture 10 can be improved.
Referring also to fig. 3, in one embodiment, the fixing jig 300 is located in the groove 110 and connected to the base 100. The fixing fixture 300 has a receiving groove 310. The receiving groove 310 is used for receiving the battery 20 to perform a slight drop test on the battery 20. In the present embodiment, the accommodating groove 310 is adapted to the battery 20. It can be understood that, for different types of batteries 20, different types of fixing jigs 300 can be adopted, so that the batteries 20 can be positioned in the base 100 through the fixing jigs 300 to perform a slight drop test on the batteries 20.
According to the test fixture 10, as the test fixture 10 comprises the base 100, the cover plate 200 and the fixing jig 300, the traditional mode that the test fixture 10 adopts a mobile phone real machine to carry out slight falling test is changed, the cost of the slight falling test is greatly reduced, and the problem of high test cost of the slight falling test is solved. Because the base 100 is detachably connected with the cover plate 200, the fixing jig 300 is located in the groove 110 of the base 100 and connected with the base 100, the battery 20 to be tested can be placed in the accommodating groove 310 of the fixing jig 300 to perform a slight drop test on the battery 20, and for batteries 20 of different models, different fixing jigs 300 can be replaced, so that the convenience and the applicability of the slight drop test performed by the testing fixture 10 are improved.
In one embodiment, the base 100 is provided with a first contact pad and the fixture 300 is provided with a second contact pad. The second contact piece abuts against the first contact piece when the fixing jig 300 is located in the groove 110, so that the first contact piece and the second contact piece are electrically connected. A tab contact block is arranged in the holding groove 310 of the fixing jig 300, and is used for being electrically connected with a tab contact of the battery 20, and the tab contact block is electrically connected with a second contact piece. In this embodiment, the base 100 is provided with an emulation circuit identical to the circuit of the mobile phone handset, and the emulation circuit is electrically connected to the first contact piece, so that when the first contact piece contacts with the second contact piece and the tab contact block contacts with the tab of the battery 20, the test fixture 10 can perform a slight drop test on the battery 20.
In order to improve the reliability of the micro-drop test, in one embodiment, the fixing jig 300 is adhered to the base 100, so that the fixing jig 300 and the base 100 are reliably positioned and connected, thereby avoiding the problem of test failure caused by the movement of the fixing jig 300 relative to the base 100 during the micro-drop test process, and improving the reliability of the micro-drop test.
As shown in fig. 1 to 3, in one embodiment, the test fixture 10 includes a base 100, a cover 200, and a fixing jig 300. The base 100 is formed with a recess 110. The cover plate 200 covers the base 100, and the cover plate 200 is detachably connected to the base 100, so that the cover plate 200 can be detached, the fixing jig 300 and the battery 20 to be tested can be replaced, and the convenience of the test fixture 10 can be improved. The fixing jig 300 is located in the groove 110 and is bonded and fixed with the base 100, so that the fixing jig 300 is firmly connected with the base 100, the problem of test failure caused by movement of the fixing jig 300 relative to the base 100 in the micro-drop test process is avoided, and the reliability of the micro-drop test is improved. The fixing fixture 300 has a receiving groove 310. The receiving groove 310 is used for receiving the battery 20 to perform a slight drop test on the battery 20. For batteries 20 of different models, different fixing jigs 300 can be replaced, so that the convenience and the applicability of the test fixture 10 for slight drop test are improved.
As shown in FIG. 3, in order to allow the cover 200 to be removably coupled to the base 100 and to allow the cover 200 to be more securely coupled to the base 100, in one embodiment, the test fixture 10 further includes a retaining member (not shown). The cover 200 has a first connecting hole 220, and the base 100 has a second connecting hole 120. The locking members are respectively inserted into the first connecting holes 220 and the second connecting holes 120, so that the cover plate 200 is detachably connected with the base 100, and the cover plate 200 is more reliably connected with the base 100.
As shown in fig. 1 to 3, in one embodiment, the test fixture 10 includes a base 100, a cover 200, and a fixing jig 300. The base 100 is formed with a recess 110. The cover plate 200 covers the base 100, and the cover plate 200 is detachably connected to the base 100, so that the cover plate 200 can be detached, the fixing jig 300 and the battery 20 to be tested can be replaced, and the convenience of the test fixture 10 can be improved. The fixing jig 300 is located in the groove 110 and is bonded and fixed with the base 100, so that the fixing jig 300 is firmly connected with the base 100, the problem of test failure caused by movement of the fixing jig 300 relative to the base 100 in the micro-drop test process is avoided, and the reliability of the micro-drop test is improved. The fixing fixture 300 has a receiving groove 310. The receiving groove 310 is used for receiving the battery 20 to perform a slight drop test on the battery 20. For batteries 20 of different models, different fixing jigs 300 can be replaced, so that the convenience and the applicability of the test fixture 10 for slight drop test are improved. The test fixture 10 also includes a retaining member. The cover 200 has a first connecting hole 220, and the base 100 has a second connecting hole 120. The locking members are respectively inserted into the first connecting holes 220 and the second connecting holes 120, so that the cover plate 200 is detachably connected with the base 100, and the cover plate 200 is more reliably connected with the base 100. Before the slight drop test, the battery 20 is placed in the accommodating groove 310 of the test fixture, the test fixture is adhered and fixed in the groove 110 of the base 100, the cover plate 200 is covered on the base 100, and finally the locking member is respectively penetrated and arranged in the first connecting hole 220 and the second connecting hole 120, so that the cover plate 200 is detachably connected with the base 100, and meanwhile, the connection between the cover plate 200 and the base 100 is more reliable.
As shown in FIG. 3, in one embodiment, the number of retaining members is plural. The number of the first connection holes 220 and the second connection holes 120 is plural, and the plural first connection holes 220 correspond to the plural second connection holes 120 one to one. Each locking member is respectively inserted into the corresponding first connecting hole 220 and the second connecting hole 120, so that the base 100 and the cover 200 are more firmly connected.
In order to make the base 100 and the cover 200 more firmly connected, in one embodiment, a plurality of locking members are spaced apart to make the base 100 and the cover 200 more firmly connected. In this embodiment, a plurality of locking members are spaced along the circumference of the base 100, so that the base 100 and the cover 200 are more firmly connected.
As shown in fig. 3, in one embodiment, the first connecting holes 220 and the second connecting holes 120 are screw holes, so that the locking members are respectively screwed with the first connecting holes 220 and the second connecting holes 120, thereby making the connection between the base 100 and the cover plate 200 more reliable. In this embodiment, the locking member is a screw. In other embodiments, the retaining member may also be a bolt.
As shown in fig. 1 to 3, in one embodiment, the test fixture 10 includes a base 100, a cover 200, and a fixing jig 300. The base 100 is formed with a recess 110. The cover plate 200 covers the base 100, and the cover plate 200 is detachably connected to the base 100, so that the cover plate 200 can be detached, the fixing jig 300 and the battery 20 to be tested can be replaced, and the convenience of the test fixture 10 can be improved. The fixing jig 300 is located in the groove 110 and is bonded and fixed with the base 100, so that the fixing jig 300 is firmly connected with the base 100, the problem of test failure caused by movement of the fixing jig 300 relative to the base 100 in the micro-drop test process is avoided, and the reliability of the micro-drop test is improved. The fixing fixture 300 has a receiving groove 310. The receiving groove 310 is used for receiving the battery 20 to perform a slight drop test on the battery 20. For batteries 20 of different models, different fixing jigs 300 can be replaced, so that the convenience and the applicability of the test fixture 10 for slight drop test are improved. The test fixture 10 also includes a retaining member. The cover 200 has a first connecting hole 220, and the base 100 has a second connecting hole 120. The locking members are respectively inserted into the first connecting holes 220 and the second connecting holes 120, so that the cover plate 200 is detachably connected with the base 100, and the cover plate 200 is more reliably connected with the base 100. The first coupling hole 220 and the second coupling hole 120 are both screw holes, so that the locking member is screw-coupled with the first coupling hole 220 and the second coupling hole 120, respectively. Before carrying out the slight drop test, place battery 20 in test fixture's holding tank 310 earlier, then in being fixed in the recess 110 of base 100 with the test fixture bonding, then locate base 100 with the apron 200 lid, wear to locate first connecting hole 220 and second connecting hole 120 respectively with the retaining member at last, and the retaining member cooperates with first connecting hole 220 and second connecting hole 120 spiro union respectively, makes apron 200 and base 100 can dismantle and be connected, makes the connection of apron 200 and base 100 more reliable simultaneously.
As shown in fig. 3, in one embodiment, an annular flange 130 is formed at the periphery of the base 100, the cover plate 200 is located in the region surrounded by the annular flange 130, and the cover plate 200 abuts against the annular flange 130, so that the cover plate 200 is quickly positioned and connected with the base 100, the assembly efficiency of the test fixture 10 is improved, and the efficiency of the micro-drop test of the battery 20 is further improved.
As shown in fig. 1 to 3, in one embodiment, the test fixture 10 includes a base 100, a cover 200, and a fixing jig 300. The base 100 is formed with a recess 110. An annular flange 130 is formed at the periphery of the base 100, the cover plate 200 is positioned in the region surrounded by the annular flange 130, and the cover plate 200 is brought into contact with the annular flange 130, so that the cover plate 200 is reliably placed on the base 100. The fixing jig 300 is located in the groove 110 and is bonded and fixed with the base 100, so that the fixing jig 300 is firmly connected with the base 100, the problem of test failure caused by movement of the fixing jig 300 relative to the base 100 in the micro-drop test process is avoided, and the reliability of the micro-drop test is improved. The fixing fixture 300 has a receiving groove 310. The receiving groove 310 is used for receiving the battery 20 to perform a slight drop test on the battery 20. For batteries 20 of different models, different fixing jigs 300 can be replaced, so that the convenience and the applicability of the test fixture 10 for slight drop test are improved. The test fixture 10 also includes a retaining member. The cover 200 has a first connecting hole 220, and the base 100 has a second connecting hole 120. The locking members are respectively inserted into the first connecting holes 220 and the second connecting holes 120, so that the cover plate 200 is detachably connected with the base 100, and the cover plate 200 is more reliably connected with the base 100. The first coupling hole 220 and the second coupling hole 120 are both screw holes, so that the locking member is screw-coupled with the first coupling hole 220 and the second coupling hole 120, respectively. Before carrying out the slight drop test, place battery 20 in test fixture's holding tank 310 earlier, then in being fixed in the recess 110 of base 100 with the test fixture bonding, then locate base 100 with the apron 200 lid, wear to locate first connecting hole 220 and second connecting hole 120 respectively with the retaining member at last, and the retaining member cooperates with first connecting hole 220 and second connecting hole 120 spiro union respectively, makes apron 200 and base 100 can dismantle and be connected, makes the connection of apron 200 and base 100 more reliable simultaneously.
As shown in fig. 2 and 4, in order to improve the convenience of use and the testing efficiency of the testing fixture 10, in one embodiment, a gap 302 exists between the fixing jig 300 and the inner sidewall of the groove 110, so that the fixing jig 300 can be taken out quickly, thereby improving the convenience of use and the testing efficiency of the testing fixture 10.
As shown in fig. 2 and 4, in order to make the processing difficulty of the accommodating groove 310 low and facilitate quick removal of the battery 20, in one embodiment, the accommodating groove 310 is communicated with the groove 110, so that the processing difficulty of the accommodating groove 310 is low and the battery 20 is convenient to take out quickly. In addition, the accommodating groove 310 is communicated with the groove 110, which is beneficial to the existence of a certain deformation accommodating space for the battery 20 in the test process, reduces the damage of the base 100 in the test process, and prolongs the service life of the test fixture 10.
As shown in fig. 1 to 3, in one embodiment, the test fixture 10 includes a base 100, a cover 200, and a fixing jig 300. The base 100 is formed with a recess 110. An annular flange 130 is formed at the periphery of the base 100, the cover plate 200 is positioned in the region surrounded by the annular flange 130, and the cover plate 200 is brought into contact with the annular flange 130, so that the cover plate 200 is reliably placed on the base 100. The fixing jig 300 is located in the groove 110 and is bonded and fixed with the base 100, so that the fixing jig 300 is firmly connected with the base 100, the problem of test failure caused by movement of the fixing jig 300 relative to the base 100 in the micro-drop test process is avoided, and the reliability of the micro-drop test is improved. The fixing fixture 300 is formed with a receiving groove 310 communicating with the groove 110. The receiving groove 310 is used for receiving the battery 20 to perform a slight drop test on the battery 20. For batteries 20 of different models, different fixing jigs 300 can be replaced, so that the convenience and the applicability of the test fixture 10 for slight drop test are improved. The test fixture 10 also includes a retaining member. The cover 200 has a first connecting hole 220, and the base 100 has a second connecting hole 120. The locking members are respectively inserted into the first connecting holes 220 and the second connecting holes 120, so that the cover plate 200 is detachably connected with the base 100, and the cover plate 200 is more reliably connected with the base 100. The first coupling hole 220 and the second coupling hole 120 are both screw holes, so that the locking member is screw-coupled with the first coupling hole 220 and the second coupling hole 120, respectively. Before carrying out the slight drop test, place battery 20 in test fixture's holding tank 310 earlier, then in being fixed in the recess 110 of base 100 with the test fixture bonding, then locate base 100 with the apron 200 lid, wear to locate first connecting hole 220 and second connecting hole 120 respectively with the retaining member at last, and the retaining member cooperates with first connecting hole 220 and second connecting hole 120 spiro union respectively, makes apron 200 and base 100 can dismantle and be connected, makes the connection of apron 200 and base 100 more reliable simultaneously. Because the accommodating groove 310 is communicated with the groove 110, a certain deformation accommodating space exists in the test process of the battery 20, the damage of the base 100 in the test process is reduced, and the service life of the test fixture 10 is prolonged.
In one embodiment, the fixing jig 300 is a silicon plate, so that the fixing jig 300 has certain elasticity and buffering property, so that the fixing jig 300 is reliably adhered to the base 100, and the battery 20 has a certain expansion space during the micro-drop test, thereby preventing the fixing jig 300 from being easily damaged.
In one embodiment, the fixing jig 300 is a silicon plate, and the fixing jig 300 is located in the groove 110 and is adhered and fixed to the base 100, so that the fixing jig 300 is firmly connected to the base 100, thereby avoiding the problem of test failure caused by movement of the fixing jig 300 relative to the base 100 during the micro-drop test, and improving the reliability of the micro-drop test. Since the fixing jig 300 is a silicon plate, the fixing jig 300 has certain elasticity and buffering property, so that the fixing jig 300 is reliably adhered to the base 100, and the battery 20 has a certain expansion space during the micro-drop test, thereby preventing the fixing jig 300 from being easily damaged.
Compared with the prior art, the utility model discloses at least, following advantage has:
1. because the test fixture 10 comprises the base 100, the cover plate 200 and the fixed fixture 300, the traditional mode that the test fixture 10 adopts a mobile phone real machine to carry out slight drop test is changed, the cost of the slight drop test is greatly reduced, and the problem of higher test cost of the slight drop test is solved;
2. because the base 100 is detachably connected with the cover plate 200, the fixing jig 300 is located in the groove 110 of the base 100 and connected with the base 100, the battery 20 to be tested can be placed in the accommodating groove 310 of the fixing jig 300 to perform a slight drop test on the battery 20, and for batteries 20 of different models, different fixing jigs 300 can be replaced, so that the convenience and the applicability of the slight drop test performed by the testing fixture 10 are improved.
In one embodiment, the cover plate 200 is a rectangular plate, and the four corners of the cover plate 200 are formed with the first connection holes 220. The base 100 is formed with a recess 110, and four corners of the base 100 are formed with second connection holes 120. The first connection hole 220 and the second connection hole 120 are both screw holes. The retaining members are screws, the number of the retaining members is four, and each retaining member is respectively inserted into the corresponding first connecting hole 220 and the corresponding second connecting hole 120. For batteries 20 with different specifications and sizes, the matched fixing jig 300 is adopted, and the fixing jig 300 is fixed in the groove 110 structure. The fixing jig 300 is a square plate made of silica gel. The receiving groove 310 of the fixing jig 300 may be processed to have different sizes according to the specification of the battery 20. The slight drop test of the battery 20 can be performed by placing and bonding the fixing jig 300 matched with the battery 20 in the groove 110 of the substrate, and then placing the battery 20 in the accommodating groove 310 of the fixing jig 300.
The above-mentioned embodiments only represent some embodiments of the present invention, and the description thereof is specific and detailed, but not to be construed as limiting the scope of the present invention. It should be noted that, for those skilled in the art, without departing from the spirit of the present invention, several variations and modifications can be made, which are within the scope of the present invention. Therefore, the protection scope of the present invention should be subject to the appended claims.
Claims (10)
1. A test fixture for performing a micro-drop test on a battery, the test fixture comprising:
the base is provided with a groove;
the cover plate is covered on the base and is detachably connected with the base;
the fixing jig is located in the groove and connected with the base, a containing groove is formed in the fixing jig and used for containing the battery, and therefore the battery is subjected to slight drop test.
2. The test fixture of claim 1, wherein the fixture is adhered to the base.
3. The test fixture of claim 2, further comprising a locking member, wherein the cover defines a first connecting hole, the base defines a second connecting hole, and the locking member is disposed through the first connecting hole and the second connecting hole, respectively.
4. The test fixture of claim 3, wherein the number of retaining members is plural; the number of the first connecting holes and the number of the second connecting holes are multiple, the first connecting holes correspond to the second connecting holes one to one, and each locking piece penetrates through the corresponding first connecting holes and the corresponding second connecting holes respectively.
5. The test fixture of claim 3, wherein a plurality of the retaining members are spaced apart.
6. The test fixture of claim 3, wherein the first connection hole and the second connection hole are both screw holes.
7. The test fixture of any one of claims 1 to 6, wherein an annular flange is formed at a periphery of the base, the cover plate is located within an area surrounded by the annular flange, and the cover plate abuts the annular flange.
8. The test fixture of any one of claims 1 to 6, wherein a gap exists between the fixture and an inner sidewall of the groove.
9. The test fixture of claim 8, wherein the receiving groove is in communication with the recess.
10. The test fixture of any one of claims 1 to 6, wherein the fixture is a silicone plate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020485355.5U CN212410014U (en) | 2020-04-03 | 2020-04-03 | Test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020485355.5U CN212410014U (en) | 2020-04-03 | 2020-04-03 | Test fixture |
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| CN212410014U true CN212410014U (en) | 2021-01-26 |
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| CN202020485355.5U Active CN212410014U (en) | 2020-04-03 | 2020-04-03 | Test fixture |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113419087A (en) * | 2021-06-21 | 2021-09-21 | 紫光展讯通信(惠州)有限公司 | Radio frequency test fixture |
-
2020
- 2020-04-03 CN CN202020485355.5U patent/CN212410014U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113419087A (en) * | 2021-06-21 | 2021-09-21 | 紫光展讯通信(惠州)有限公司 | Radio frequency test fixture |
| CN113419087B (en) * | 2021-06-21 | 2023-06-02 | 紫光展讯通信(惠州)有限公司 | Radio frequency test fixture |
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Effective date of registration: 20230919 Address after: No.38, Huifeng 7th Road, Zhongkai high tech Zone, Huizhou City, Guangdong Province Patentee after: EVE ENERGY Co.,Ltd. Address before: 516006 63 District, Hui Tai Industrial Park, Zhongkai hi tech Zone, Huizhou, Guangdong Patentee before: Huizhou Yiwei Energy Battery Co.,Ltd. |