CN212254612U

CN212254612U - High low temperature aging device of batch

Info

Publication number: CN212254612U
Application number: CN202020808218.0U
Authority: CN
Inventors: 王印芳
Original assignee: Tianjin Deke Auto Parts Co Ltd
Current assignee: Tianjin Deke Intelligent Control Co.,Ltd.
Priority date: 2020-05-15
Filing date: 2020-05-15
Publication date: 2020-12-29
Anticipated expiration: 2030-05-15

Abstract

The utility model relates to a high low temperature aging device of batch, its basic component mainly includes sensor socket, ageing oven, power module, the host computer of different grade type. The aging box comprises 3 types of sensor sockets, an aging cabinet, a sensor signal acquisition system, a groove baffle plate and wheels. The sensor signal acquisition system comprises a plurality of signal acquisition circuit boards, and each signal acquisition circuit board comprises a signal acquisition circuit, a code setting circuit and a communication circuit. The utility model discloses can be compatible the sensor plug of different grade type, do not need the patch cord, improved the reliability of transmission; 640 sensors can be inserted simultaneously to the ageing oven, can be in batches and standardized ageing, have improved production efficiency. The detected sensor information is transmitted to a display interface of the upper computer through CAN communication for real-time monitoring, when the abnormality of the sensor is detected, the display interface displays red at the corresponding address information, and the power supply voltage of the sensor is disconnected, so that the fault position is conveniently searched.

Description

High low temperature aging device of batch

Technical Field

The utility model relates to a novel high low temperature is ageing in batches device, especially can be applied to the sensor of car electric power steering system and age.

Background

The automobile electric power steering industry develops rapidly, and the sensor technology is relatively mature. However, systematic research on failure mechanisms of sensors is still lacking, so that the reliability problem of sensors in the design, manufacture, application and other links is always a difficult problem in the industry. The requirements of the automobile electric power steering system on the reliability and the service life of the sensor are very high. The reliability and consistency of the sensor will change over time after long periods of operation. At the initial stage of the sensor use, the sensor which normally works breaks down after working for a period of time, so that serious damage is brought to products, and meanwhile, the products with problems cannot be found and recorded in time. The existing aging equipment is characterized by small batch, single socket variety and low efficiency when large batch aging is needed. When the sensors of different plugs are aged, a patch cord is needed, and the reliability of transmission is reduced.

Disclosure of Invention

The invention aims to: the high-temperature and low-temperature aging device with the sensor plug compatible, large-batch and movable is realized. The method is used for solving the problems of incompatibility of the sensor sockets, small batch, slow searching of abnormal sensors and the like.

In order to realize the functions, a batch high-low temperature aging device is developed, and the batch high-low temperature aging device comprises a programmable constant-temperature constant-humidity laboratory, an aging box, a power supply module and an upper computer. The aging box is internally provided with a sensor signal acquisition circuit board, a sensor socket and a baffle. The aging box and the upper computer realize the transmission and monitoring of sensor data through CAN data stream; the sensor signal acquisition circuit board and the sensor socket are arranged in the same baffle plate, so that connecting wire harnesses are reduced, and reliability is improved. As a practical novel improvement, the ageing oven of ageing device can compatible 3 types of plug's sensor.

As the utility model discloses the improvement, every sensor signal acquisition circuit board has 4 MCU, and 5 sensors's signal is gathered to every MCU, and 8 dial switch set up the sensor address. Each MCU on the sensor signal acquisition circuit board is provided with a group of dial switches, 1 address is occupied, and the MCU divides the address into five according to pins occupied by acquiring 5 sensor signals, so that each sensor has a corresponding unique address. The upper computer identifies the address information of the sensor from the data transmitted from the sensor signal acquisition circuit board, collects the online aging data of the sensor, monitors the real-time dynamic state of the online aging sensor at the monitoring window, and derives the high-temperature aging data of the sensor at the query window to draw an analog signal change curve.

As the utility model discloses improve, this equipment collects sensor signal acquisition circuit board, sensor socket in the ageing oven, and sensor socket distributes and improves the effective utilization area in both sides around the ageing oven. 640 sensor sockets of each type can be aged in a large batch, and the production efficiency is improved.

As the utility model discloses improve, the ageing oven of this equipment has carried out the partition with the cabinet door according to sensor signal acquisition circuit board distribution, and the equipment, wiring, control, the maintenance of ageing oven can all realize the subregion operation, and the requirement of convenient operation can be satisfied again to the power saving of saving time. The aging box cabinet door is milled out of a sensor socket for oppositely inserting a product to be aged, a sensor signal acquisition circuit board can be fixed on the inner side, and the cabinet door is opened for installing and maintaining the circuit board.

Drawings

FIG. 1 is a block diagram of a batch high and low temperature burn-in apparatus.

In the drawings: 1 is a power supply module; 2 is an aging box; 3 is an upper computer; 4 is a sensor socket; 5 is a groove baffle; 6 is a baffle plate; 7 is a sensor signal acquisition circuit board; 8 is a wheel; and 9, a programmable constant temperature and humidity laboratory.

Detailed Description

In the drawings: power module (1) is connected with power wire for ageing oven (2), and sensor signal acquisition circuit board (7) are fixed in baffle (6) inboard, and sensor socket (4) mill out in baffle (6) outside, insert the sensor that needs ageing on sensor socket (4), and the sensor pencil is put in recess baffle (5), and the CAN communication line on sensor signal acquisition circuit board (7) is connected with host computer (3). The power module (1) of the batch high-low temperature aging device supplies an input power line to 32 sensor signal acquisition circuit boards (7) in the aging box (2) along the wiring on two sides of the box body respectively, and connector pins in the sensor socket (4) are connected with signal acquisition ends of corresponding addresses in the circuit boards according to sensor distribution on the circuit boards. The collected data are transmitted out by the CAN chip in a data flow mode after being processed, the transmission path is the hard wire connection between the sensor signal collecting circuit board (7) and the upper computer (3), and the CANH and CANL two wires adopt a twisted pair mode to reduce interference. Inside circuit arrangement of ageing oven (2) is accomplished back locking cabinet door and is inserted the connector with the sensor from bottom to top according to the socket type from the box below, and rectangle recess baffle (5) of box below are used for holding sensor body and pencil thereof, avoid colliding with of sensor and ground and pulling of box removal process. And after the connection of the wiring is finished, the aging box (2) is moved to a programmable constant temperature and humidity laboratory (9), the temperature and the time of the constant temperature laboratory are set, and the aging is started. The power supply voltage of the sensor signal acquisition circuit board is 12V, and the sensor signal acquisition circuit board (7) is supplied with power in a centralized power supply mode by adjusting the output voltage of the power supply module (1). After the sensor signal acquisition circuit board (7) is powered on, the upper computer (3) sets CAN communication parameters to establish connection with the aging box, and the sensor signal acquisition circuit board (7) and the MCU thereof are controlled in a unified manner to acquire and process data of the sensor. The processed data information and the address information controlled by the dial switch CAN be fed back to the upper computer (3) by the MCU through the CAN chip, and the upper computer (3) collects the acquired data according to the address information of the sensor.

The upper computer (3) consists of three interfaces, namely a test window, a monitoring window and an inquiry window, and the three interfaces can be switched at will. The test window is the center for controlling the operation of the aging box, and the window is used for setting the test time, the test intensity and the target address of the aging box. After the setting is finished, the upper computer (3) addresses the sensor controlled by the corresponding dial switch through the target address, controls the sensor signal acquisition circuit board to turn on the relay to supply power to the sensor, and controls the sensor to carry out testing according to the set parameters. The monitoring window is used for uniformly displaying and monitoring the high-low temperature aging states of all the sensors in the window by the upper computer (3) according to the sensor addresses distributed by the dial switches. The sensor displays green on a normal state interface; the sensor displays red on the abnormal state interface, and sends an instruction to the MCU to disconnect the power supply of the sensor. The query window can search the historical information received by the upper computer (3) and draw a time-voltage curve, and the high-temperature aging result is visually displayed on the interface of the upper computer (3) through the sensor data and the time-voltage curve.

Claims

1. The utility model provides a high low temperature aging device in batches which characterized in that: the high-low temperature aging device mainly comprises a programmable constant-temperature constant-humidity laboratory, an aging box, a power supply module and an upper computer; the aging box consists of a sensor socket, an aging cabinet, a groove baffle plate and wheels; the aging cabinet consists of a sensor signal acquisition circuit board and a baffle plate, the power supply module is connected with the aging box through a power supply lead, and the aging box is supplied with power in a centralized power supply mode; the sensor socket in the aging box is milled out of the box body and fixed on the aging cabinet, a sensor to be aged is inserted into the sensor socket, the sensor body and a wire harness of the sensor body are placed in the groove baffle, and the wheels are positioned below the aging cabinet to facilitate the aging box to be moved to a programmable constant temperature and humidity laboratory; the sensor signal acquisition circuit board is fixed on the inner side of the baffle, and transmits high-temperature and low-temperature aged data of the sensor to an upper computer integrated with the power module in the same cabinet through a wire.

2. The batch high and low temperature aging apparatus according to claim 1, wherein: the device is compatible with three types of sensor sockets, and each type of sensor socket is 640 in total, so that the device can be aged in a large batch.

3. The batch high and low temperature aging apparatus according to claim 1, wherein: the device monitors the process of the high-temperature and low-temperature aging sensor in real time on line, and displays and stores the address and the state of the corresponding sensor on an upper computer.

4. The batch high and low temperature aging apparatus according to claim 1, wherein: the device has rectangle recess baffle in the both sides design of ageing oven below for place sensor body and pencil thereof, protect the sensor.

5. The batch high and low temperature aging apparatus according to claim 1, wherein: the sensor signal acquisition circuit board is fixed on the baffle of the aging cabinet, and is arranged in a partitioning and partitioning mode, so that the circuit board is convenient to maintain.