CN211827459U - Capacitive coupling detection anti-dismantling device and POS machine - Google Patents

Capacitive coupling detection anti-dismantling device and POS machine Download PDF

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CN211827459U
CN211827459U CN202020403952.9U CN202020403952U CN211827459U CN 211827459 U CN211827459 U CN 211827459U CN 202020403952 U CN202020403952 U CN 202020403952U CN 211827459 U CN211827459 U CN 211827459U
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tamper
signal
detection
coupling
signal contact
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汤瑞智
苏小燕
黄茂涵
吴贤生
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PAX Computer Technology Shenzhen Co Ltd
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Abstract

本申请的电容耦合式检测防拆装置和POS机,在传统防拆结构的基础上增加耦合电容式防拆结构,耦合电容没有直接使用Tamper信号,使得耦合电容耦合到Tamper信号而得到的检测电信号不会直接暴露在防拆开关处,提升检测电信号防检测的安全性和被攻击的难度。通过检测电路检测耦合电容的容值电压以输出检测电信号,提高了检测的准确度,实现方法及电路简单可靠,同时检测电路的后级还可以继续扩展其它控制电路。

Figure 202020403952

The capacitive coupling detection and tamper-proof device and POS machine of the present application add a coupling capacitive tamper-proof structure on the basis of the traditional tamper-proof structure, and the coupling capacitor does not directly use the Tamper signal, so that the detection voltage obtained by coupling the coupling capacitor to the Tamper signal is obtained. The signal will not be directly exposed to the tamper switch, which improves the security of detecting electrical signals and the difficulty of being attacked. The detection circuit detects the capacitance voltage of the coupling capacitor to output the detection electrical signal, which improves the detection accuracy, the realization method and the circuit are simple and reliable, and the latter stage of the detection circuit can continue to expand other control circuits.

Figure 202020403952

Description

电容耦合式检测防拆装置及POS机Capacitive coupling detection anti-dismantling device and POS machine

技术领域technical field

本申请属于电子电路领域,尤其涉及一种电容耦合式检测防拆装置及POS 机。The application belongs to the field of electronic circuits, and in particular relates to a capacitive coupling detection and anti-disassembly device and a POS machine.

背景技术Background technique

Tamper信号线:一种可被检测电路检测其电平变化的信号线,当检测电路检测到该信号线上的电平与设定电平值不一致时,检测电路将触发安全机制,擦除密钥及其他敏感信息。防拆开关:一种带有Tamper信号的防拆除机制,一旦防拆开关分离,检测电路将触发安全机制,擦除密钥及其他敏感信息;Tamper signal line: a signal line whose level changes can be detected by the detection circuit. When the detection circuit detects that the level on the signal line is inconsistent with the set level value, the detection circuit will trigger the security mechanism to erase the password. keys and other sensitive information. Tamper switch: An tamper-proof mechanism with a Tamper signal, once the tamper switch is disengaged, the detection circuit will trigger the security mechanism, erasing the key and other sensitive information;

目前,已知的防拆开关都是通过碳粒或锅仔片的压合来控制Tamper信号的通断,从而实现防拆开关的功能,而由于tamper信号直接在开关上,因此容易被探测到而破解失效,且只有两个有效触点,也容易被攻击失效,可见,防拆开关的防攻击能力较弱。At present, the known tamper switch controls the on-off of the tamper signal through the pressing of carbon particles or dome pieces, so as to realize the function of the tamper switch. Since the tamper signal is directly on the switch, it is easy to be detected. The cracking fails, and there are only two valid contacts, and it is also easy to be attacked and failed. It can be seen that the anti-attack ability of the tamper switch is weak.

实用新型内容Utility model content

本申请的目的在于提供一种电容耦合式检测防拆装置及POS机,旨在解决传统的防拆开关防拆开关两个有效触点,防攻击能力较弱的问题。The purpose of the present application is to provide a capacitively coupled detection anti-disassembly device and a POS machine, which aims to solve the problem that the traditional anti-disassembly switch has two effective contacts, and the anti-attack capability is weak.

本申请实施例的第一方面提了一种电容耦合式检测防拆装置,设于电路基板上,包括:A first aspect of the embodiments of the present application proposes a capacitively coupled detection and tamper-proof device, which is arranged on a circuit substrate and includes:

至少一个防拆结构,所述防拆结构包括设于所述电路基板的第一导电层用于接入Tamper信号的第一信号触点以及导电连接片,所述导电连接片将所述第一信号触点覆盖并将其焊接或直接压合;At least one anti-dismantling structure, the anti-dismantling structure includes a first signal contact and a conductive connection piece provided on the first conductive layer of the circuit substrate for accessing the Tamper signal, and the conductive connection piece connects the first Signal contacts are covered and welded or directly pressed;

至少一个耦合导电片,所述耦合导电片设于所述电路基板的第二导电层上,每个所述耦合导电片与一个所述防拆结构相对设置以构成耦合电容;以及at least one coupling conductive sheet, the coupling conductive sheet is arranged on the second conductive layer of the circuit substrate, each of the coupling conductive sheets is arranged opposite to one of the anti-removal structures to form a coupling capacitor; and

检测电路,所述检测电路与所述耦合导电片连接,所述检测电路用于所述耦合电容的电容量变化输出检测电信号。A detection circuit, the detection circuit is connected to the coupling conductive sheet, and the detection circuit is used for outputting a detection electrical signal for the capacitance change of the coupling capacitor.

在其中一个实施例中,每个所述防拆结构还包括至少一个第二信号触点,所述第二信号触点在所述第一导电层上与所述第一信号触点电气隔离,所述导电连接片将所述第一信号触点、所述第二信号触点覆盖并将其焊接或直接压合。In one of the embodiments, each of the tamper-resistant structures further includes at least one second signal contact, the second signal contact being electrically isolated from the first signal contact on the first conductive layer, The conductive connection piece covers the first signal contact and the second signal contact and solders or directly presses them.

在其中一个实施例中,所述检测电路包括:In one of the embodiments, the detection circuit includes:

接入电路,所述接入电路的输入端与所述耦合导电片连接,基于所述耦合电容的电压输出驱动电压;an access circuit, the input end of the access circuit is connected to the coupling conductive sheet, and a driving voltage is output based on the voltage of the coupling capacitor;

开关管,所述开关管的控制端与所述接入电路的输出端连接,所述开关管在所述驱动电压的驱动下通断,以在其第一导通端或第二导通端输出所述检测电信号。a switch tube, the control end of the switch tube is connected to the output end of the access circuit, and the switch tube is turned on and off under the driving of the driving voltage, so as to connect to the first conduction end or the second conduction end of the switch tube The detection electrical signal is output.

在其中一个实施例中,所述接入电路包括二极管和电容,所述二极管的阳极作为所述接入电路的输入端,所述二极管的阴极与所述电容的一端连接,且作为所述接入电路的输出端,所述电容的另一端接地。In one embodiment, the access circuit includes a diode and a capacitor, the anode of the diode is used as the input terminal of the access circuit, and the cathode of the diode is connected to one end of the capacitor and serves as the connection terminal. into the output end of the circuit, and the other end of the capacitor is grounded.

在其中一个实施例中,所述接入电路还包括一上拉电阻或一下拉电阻,所述上拉电阻或所述下拉电阻连接在所述二极管的阴极。In one embodiment, the access circuit further includes a pull-up resistor or a pull-down resistor, and the pull-up resistor or the pull-down resistor is connected to the cathode of the diode.

在其中一个实施例中,所述开关管为NPN三极管或NMOS管。In one embodiment, the switch transistor is an NPN transistor or an NMOS transistor.

在其中一个实施例中,所述防拆结构还包括设于第一导电层上的保护信号环,所述保护信号环电气隔离地围设于所述第一信号触点和所述第二信号触点的外侧,且所述保护信号环与所述导电连接片电气隔离。In one embodiment, the tamper-proof structure further includes a protection signal ring provided on the first conductive layer, and the protection signal ring is electrically isolated around the first signal contact and the second signal the outer side of the contact, and the protection signal ring is electrically isolated from the conductive connection piece.

在其中一个实施例中,所述保护信号环、第一信号触点及第二信号触点为设在第一导电层上的金手指或露铜层。In one embodiment, the protection signal ring, the first signal contact and the second signal contact are gold fingers or exposed copper layers disposed on the first conductive layer.

在其中一个实施例中,所述第一导电层为所述电路基板的表层,所述第二导电层为所述电路基板的中间层。In one embodiment, the first conductive layer is a surface layer of the circuit substrate, and the second conductive layer is a middle layer of the circuit substrate.

本申请实施例的第二方面提了一种POS机,包括如上所述的电容耦合式检测防拆装置。A second aspect of the embodiments of the present application provides a POS machine, which includes the capacitively-coupled detection and tamper-proof device as described above.

上述的电容耦合式检测防拆装置,在传统防拆结构的基础上增加耦合电容式防拆结构,耦合电容没有直接使用Tamper信号,使得耦合电容耦合到Tamper 信号而得到的检测电信号不会直接暴露在防拆开关处,提升检测电信号防检测的安全性和被攻击的难度。本申请通过检测电路检测耦合电容的容值电压以输出检测电信号,提高了检测的准确度,实现方法及电路简单可靠,同时检测电路的后级还可以继续扩展其它控制电路。The above-mentioned capacitive coupling detection tamper-proof device adds a coupling capacitive tamper-proof structure on the basis of the traditional tamper-proof structure, and the coupling capacitor does not directly use the Tamper signal, so that the detection electrical signal obtained by coupling the coupling capacitor to the Tamper signal will not be directly. Exposure to the tamper switch improves the security of electrical signal detection and the difficulty of being attacked. In the present application, the detection circuit detects the capacitance voltage of the coupling capacitor to output the detection electrical signal, which improves the detection accuracy, the implementation method and circuit are simple and reliable, and the latter stage of the detection circuit can continue to expand other control circuits.

附图说明Description of drawings

图1为本申请实施例提供的电容耦合式检测防拆装置的电路基板结构示意图;FIG. 1 is a schematic structural diagram of a circuit substrate of a capacitively coupled detection and anti-disassembly device provided by an embodiment of the present application;

图2为本申请第一实施例提供的电容耦合式检测防拆装置结构示意图;FIG. 2 is a schematic structural diagram of the capacitive coupling detection and anti-disassembly device provided by the first embodiment of the present application;

图3为本申请第二实施例提供的电容耦合式检测防拆装置结构示意图;3 is a schematic structural diagram of a capacitively coupled detection and anti-disassembly device provided by the second embodiment of the present application;

图4为本申请第三实施例提供的电容耦合式检测防拆装置结构示意图。FIG. 4 is a schematic structural diagram of a capacitively coupled detection and tamper-proof device according to a third embodiment of the present application.

具体实施方式Detailed ways

为了使本申请所要解决的技术问题、技术方案及有益效果更加清楚明白,以下结合附图及实施例,对本申请进行进一步详细说明。应当理解,此处所描述的具体实施例仅仅用以解释本申请,并不用于限定本申请。In order to make the technical problems, technical solutions and beneficial effects to be solved by the present application clearer, the present application will be described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application, but not to limit the present application.

需要说明的是,当元件被称为“固定于”或“设置于”另一个元件,它可以直接在另一个元件上或者间接在该另一个元件上。当一个元件被称为是“连接于”另一个元件,它可以是直接连接到另一个元件或间接连接至该另一个元件上。It should be noted that when an element is referred to as being "fixed to" or "disposed on" another element, it can be directly on the other element or indirectly on the other element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or indirectly connected to the other element.

需要理解的是,术语“长度”、“宽度”、“上”、“下”、“前”、“后”、“左”、“右”、“竖直”、“水平”、“顶”、“底”“内”、“外”等指示的方位或位置关系为基于附图所示的方位或位置关系,仅是为了便于描述本申请和简化描述,而不是指示或暗示所指的装置或元件必须具有特定的方位、以特定的方位构造和操作,因此不能理解为对本申请的限制。It is to be understood that the terms "length", "width", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top" , "bottom", "inside", "outside", etc. indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, which are only for the convenience of describing the application and simplifying the description, rather than indicating or implying the indicated device. Or elements must have a particular orientation, be constructed and operate in a particular orientation, and therefore should not be construed as a limitation of the present application.

此外,术语“第一”、“第二”仅用于描述目的,而不能理解为指示或暗示相对重要性或者隐含指明所指示的技术特征的数量。由此,限定有“第一”、“第二”的特征可以明示或者隐含地包括一个或者更多个该特征。在本申请的描述中,“多个”的含义是两个或两个以上,除非另有明确具体的限定。In addition, the terms "first" and "second" are only used for descriptive purposes, and should not be construed as indicating or implying relative importance or implying the number of indicated technical features. Thus, a feature defined as "first" or "second" may expressly or implicitly include one or more of that feature. In the description of the present application, "plurality" means two or more, unless otherwise expressly and specifically defined.

请参阅图1,本申请实施例提供的可应用于POS(Point of Sales,销售点情报管理系统)机的电容耦合式检测防拆装置,设于电路基板上,本实施例的电路基板为多层板,具有位于表层的第一导电层L1和位于中间层的第二导电层 L2,位于中间层的电信号是不容易被检测到的,故可以提升防拆装置的安全性;在其他实施例中,电路基板为多块单层板,第一导电层L1、第二导电层L2分别位于不同单层板上。Please refer to FIG. 1 . The capacitive coupling detection and anti-disassembly device provided by an embodiment of the present application, which can be applied to a POS (Point of Sales, point of sale information management system) machine, is disposed on a circuit substrate. The circuit substrate in this embodiment is multi- The laminate has a first conductive layer L1 on the surface layer and a second conductive layer L2 on the middle layer. The electrical signal on the middle layer is not easy to be detected, so it can improve the security of the tamper-proof device; in other implementations In an example, the circuit substrate is a plurality of single-layer boards, and the first conductive layer L1 and the second conductive layer L2 are respectively located on different single-layer boards.

请参阅图1至图3,电容耦合式检测防拆装置包括至少一个防拆结构100、至少一个耦合导电片及至少一个检测电路,防拆结构100包括设于电路基板的第一导电层L1用于接入Tamper信号的第一信号触点P1以及导电连接片(未图示),导电连接片将第一信号触点P1覆盖并将其焊接或直接压合,该防拆结构100为传统的防拆结构100,第一信号触点P1为一个或在第一导电层L1上电气隔离的两个以上。导电连接片为锅仔片、炭粒、露铜FPC或铜箔等导电材料。Please refer to FIG. 1 to FIG. 3 , the capacitively-coupled detection and tamper-proof device includes at least one tamper-proof structure 100 , at least one coupling conductive sheet and at least one detection circuit. The tamper-proof structure 100 includes the first conductive layer L1 disposed on the circuit substrate for For connecting the first signal contact P1 and the conductive connecting piece (not shown) of the Tamper signal, the conductive connecting piece covers the first signal contact P1 and welds or directly presses it. The anti-dismantling structure 100 is a traditional In the tamper-resistant structure 100, the first signal contact P1 is one or two or more electrically isolated on the first conductive layer L1. The conductive connecting piece is a conductive material such as dome, carbon particles, exposed copper FPC or copper foil.

耦合导电片200设于电路基板的第二导电层L2上,每个耦合导电片200 与一个防拆结构100相对设置以构成耦合电容C0;可以理解的是,防拆结构 100和耦合导电片200的数量应该相当,防拆结构100的第一信号触点P1以及导电连接片构成耦合电容C0的一个极板,耦合导电片200构成耦合电容C0的另一个极板。耦合导电片200第二导电层L2开设的露铜,或焊接在第二导电层L2上的导电金属片。The coupling conductive sheets 200 are disposed on the second conductive layer L2 of the circuit substrate, and each coupling conductive sheet 200 is disposed opposite to a tamper-proof structure 100 to form a coupling capacitor C0; it can be understood that the tamper-proof structure 100 and the coupling conductive sheet 200 The number should be equal, the first signal contact P1 of the anti-dismantling structure 100 and the conductive connecting piece constitute one pole plate of the coupling capacitor C0, and the coupling conductive plate 200 constitutes the other pole plate of the coupling capacitor C0. The exposed copper opened on the second conductive layer L2 of the coupling conductive sheet 200, or the conductive metal sheet welded on the second conductive layer L2.

检测电路300与耦合导电片200连接,检测电路300用于耦合电容C0的电容量变化输出检测电信号,可以理解的是,检测电路300可以是一个,同时检测多个耦合电容C0的电压,或者是与耦合电容C0数量相当,分别与每个耦合电容C0连接以检测其电压。检测电路300对耦合电容C0检测过程中,正常状态下输出一个默认电平信号表示防拆装置正常,当耦合电容C0的电压产生改变被检测电路300检测到,以改变输出电平状态时,则表示防拆装置被攻击或拆除。The detection circuit 300 is connected to the coupling conductive sheet 200, and the detection circuit 300 is used for the capacitance change of the coupling capacitor C0 to output a detection electrical signal. It can be understood that the detection circuit 300 can be one, and simultaneously detects the voltage of multiple coupling capacitors C0, or It is equivalent to the number of coupling capacitors C0, and is connected to each coupling capacitor C0 to detect its voltage. During the detection process of the coupling capacitor C0 by the detection circuit 300, a default level signal is output in a normal state to indicate that the tamper-proof device is normal. When the change in the voltage of the coupling capacitor C0 is detected by the detection circuit 300 to change the output level state, then Indicates that a tamper has been attacked or removed.

由此可见,电容耦合式检测防拆装置在原来防拆结构100的不同导电层新增一个耦合导电片200以构成耦合电容C0,通过检测此耦合导电片200上的电压变化来确认Tamper信号的状态来达到防拆保护的目的,由于耦合导电片200 在电路基板的内层,没有直接暴露在电路基板的外面,有利于提升Tamper信号本身的安全性。通过本方案不仅能防拆耦合电容C0变化检测机制,又保证 Tamper信号远离了防拆点,提升了Tamper信号本身防探测的安全性。It can be seen that the capacitively coupled detection anti-tamper device adds a coupling conductive sheet 200 to the different conductive layers of the original anti-tamper structure 100 to form a coupling capacitor C0, and confirms the Tamper signal by detecting the voltage change on the coupling conductive sheet 200. state to achieve the purpose of tamper-proof protection, because the coupling conductive sheet 200 is on the inner layer of the circuit substrate and is not directly exposed outside the circuit substrate, which is beneficial to improve the security of the Tamper signal itself. This solution can not only prevent the detection mechanism of the change of the coupling capacitor C0, but also ensure that the Tamper signal is far away from the tamper point, which improves the security of the Tamper signal itself against detection.

请参阅图4,在其中一个实施例中,每个防拆结构100还包括至少一个第二信号触点N1,第二信号触点N1在第一导电层L1上与第一信号触点P1电气隔离,导电连接片将第一信号触点P1、第二信号触点N1覆盖并将其焊接或直接压合。如此防拆结构100中的第一信号触点P1、第二信号触点N1及导电连接片构成传统的防拆开关,对本电容耦合式检测防拆装置而言,具有两层导电层Tamper信号的防拆检测机制,提高了安全性。相对图4实施例而言,图2 和图3实施例中,把防拆结构100的第二信号触点N1去掉(或设置在其他位置),从而脱离了原来传统的防拆结构,可以在一个Tamper信号的基础上扩展很多的防拆开关,参考图3。Referring to FIG. 4, in one embodiment, each tamper-proof structure 100 further includes at least one second signal contact N1, and the second signal contact N1 is electrically connected to the first signal contact P1 on the first conductive layer L1 For isolation, the first signal contact P1 and the second signal contact N1 are covered by the conductive connecting piece and welded or directly pressed together. The first signal contact P1, the second signal contact N1 and the conductive connecting piece in the tamper-proof structure 100 constitute a traditional tamper-proof switch. For the capacitive coupling detection tamper-proof device, there are two conductive layers of Tamper signal. Anti-tamper detection mechanism improves safety. Compared with the embodiment of FIG. 4 , in the embodiments of FIGS. 2 and 3 , the second signal contact N1 of the tamper-proof structure 100 is removed (or arranged at other positions), thereby breaking away from the original traditional tamper-proof structure, and can be used in Many tamper switches are extended on the basis of a Tamper signal, refer to Figure 3.

请参阅图2至图4,在其中一个实施例中,检测电路300包括:接入电路 302和开关管Q1。接入电路302的输入端与耦合导电片200连接,基于耦合电容C0的电压输出驱动电压V1;开关管Q1的控制端与接入电路302的输出端连接,开关管Q1在驱动电压V1的驱动下通断,以在其第一导通端或第二导通端输出检测电信号。Referring to FIG. 2 to FIG. 4, in one embodiment, the detection circuit 300 includes: an access circuit 302 and a switch Q1. The input terminal of the access circuit 302 is connected to the coupling conductive sheet 200, and the driving voltage V1 is output based on the voltage of the coupling capacitor C0; the control terminal of the switch Q1 is connected to the output terminal of the access circuit 302, and the switch Q1 is driven by the driving voltage V1 It is turned on and off, so as to output a detection electrical signal at its first conducting end or second conducting end.

在其中一个实施例中,接入电路302包括二极管D1和电容C1,二极管 D1的阳极作为接入电路302的输入端,阴极与电容C1的一端连接,且作为接入电路302的输出端,电容C1的另一端接地。接入电路302还包括一上拉电阻或一下拉电阻,上拉电阻或下拉电阻连接在二极管D1的阴极。开关管Q1为 NPN三极管或NMOS管。本实施例中,NPN三极管的集电极或NMOS管的漏极作为检测电路300的输出端P0。In one embodiment, the access circuit 302 includes a diode D1 and a capacitor C1, the anode of the diode D1 is used as the input end of the access circuit 302, the cathode is connected to one end of the capacitor C1, and is used as the output end of the access circuit 302, the capacitor The other end of C1 is grounded. The access circuit 302 further includes a pull-up resistor or a pull-down resistor, and the pull-up resistor or the pull-down resistor is connected to the cathode of the diode D1. The switch Q1 is an NPN transistor or an NMOS transistor. In this embodiment, the collector of the NPN transistor or the drain of the NMOS transistor is used as the output terminal P0 of the detection circuit 300 .

待检测信号(Tamper信号)从第一信号触点P1(或其它有用信号)通过耦合电容C0输出驱动电压V1给检测电路300,当导电连接片按压好的时候,耦合电容C0值较大,此时耦合出来的驱动电压V1的值大于开关管Q1的导通开启电压时,开关管Q1会导通,会把检测电路300输出端P0的检测电信号拉低,保持在未触发状态,一旦防拆结构100的导电连接片松开,导致耦合电容 C0变小,此时驱动电压V1也随之变小达不到开关管Q1的导通电压,开关管 Q1截止,导致检测电路300输出端P0的检测电信号变高,而导致触发,从而判断防拆开关是否被拆开。The signal to be detected (Tamper signal) outputs the driving voltage V1 to the detection circuit 300 from the first signal contact P1 (or other useful signals) through the coupling capacitor C0. When the conductive connecting piece is pressed well, the value of the coupling capacitor C0 is relatively large. When the value of the coupled drive voltage V1 is greater than the turn-on voltage of the switch tube Q1, the switch tube Q1 will be turned on, which will pull down the detection electrical signal at the output terminal P0 of the detection circuit 300, and keep it in a non-triggered state. The conductive connecting piece of the dismantling structure 100 is loosened, resulting in a decrease in the coupling capacitor C0. At this time, the driving voltage V1 also decreases and cannot reach the turn-on voltage of the switch tube Q1, and the switch tube Q1 is turned off, resulting in the output end P0 of the detection circuit 300. The detection electrical signal becomes high, which leads to triggering, thereby judging whether the tamper switch has been disassembled.

其中,上述电容C1值的改变可以调节电压驱动电压V1的大小,二极管 D1起到正向导通,反向截止的作用,同时驱动电压V1处可以增加上拉电阻或下拉电阻来改变驱动电压V1的初值,输出检测电路300输出端P0后端可以继续扩展其它控制电路,导电连接片正常压合状态开关管Q1导通,输出的检测电信号为低电平,导电连接片松开状态开关管Q1截止,输出检测电信号为高电平。Among them, the change of the value of the capacitor C1 can adjust the size of the voltage driving voltage V1, the diode D1 plays the role of forward conduction and reverse cutoff, and at the same time, a pull-up resistor or pull-down resistor can be added to the driving voltage V1 to change the driving voltage V1. The initial value, the rear end of the output terminal P0 of the output detection circuit 300 can continue to expand other control circuits, the conductive connection piece is normally pressed and the switch tube Q1 is turned on, the output detection electrical signal is low level, and the conductive connection piece is released. The state switch tube Q1 is turned off, and the output detection electrical signal is a high level.

在其中一个实施例中,防拆结构100还包括设于第一导电层L1上的保护信号环105,保护信号环105电气隔离地围设于第一信号触点P1和第二信号触点N1的外侧,且保护信号环105与导电连接片的电气隔离。保护信号环105 能够给防拆结构100提供在最外侧的防拆保护,当保护信号环105与导电连接片电连接时使得加载在保护信号环105的电参数改变而导致触发。In one embodiment, the tamper-proof structure 100 further includes a protection signal ring 105 disposed on the first conductive layer L1 , and the protection signal ring 105 is electrically isolated around the first signal contact P1 and the second signal contact N1 and protect the electrical isolation of the signal ring 105 from the conductive connection piece. The protection signal ring 105 can provide the tamper-resistant structure 100 with tamper-proof protection at the outermost side. When the protection signal ring 105 is electrically connected with the conductive connecting piece, the electrical parameters loaded on the protection signal ring 105 are changed to cause triggering.

在其中一个实施例中,保护信号环105、第一信号触点P1及第二信号触点 N1为设在第一导电层L1上的金手指或露铜层。In one embodiment, the protection signal ring 105, the first signal contact P1 and the second signal contact N1 are gold fingers or exposed copper layers disposed on the first conductive layer L1.

本申请的电容耦合式检测防拆装置,是的在原来传统防拆结构上新增了一个不能被直接探测的PCB板内部检测信号,从而大大增强了防拆开关的安全性和被攻击的难度。耦合电容通过耦合Tamper信号,而不是直接接入,使得耦合电容检测部分的Tamper信号没有直接暴露在防拆装置处,提升Tamper信号本身的安全性。检测电路300通过二极管D1的整流特性以及电容C1或上下拉电阻来控制驱动电压V1的大小来控制开关管Q1的导通状态,实现了检测的准确度,同时实现方法及电路简单可靠,另外,检测电路的后级还可以继续扩展其它控制电路。The capacitive coupling detection and tamper-proof device of the present application adds an internal detection signal of the PCB board that cannot be directly detected to the original traditional tamper-proof structure, thereby greatly enhancing the security of the tamper-proof switch and the difficulty of being attacked . The coupling capacitor couples the Tamper signal instead of directly connecting it, so that the Tamper signal of the coupling capacitor detection part is not directly exposed to the tamper-proof device, which improves the security of the Tamper signal itself. The detection circuit 300 uses the rectification characteristics of the diode D1 and the capacitor C1 or the pull-up and pull-down resistors to control the size of the driving voltage V1 to control the conduction state of the switch tube Q1, so as to achieve the detection accuracy, and at the same time, the implementation method and circuit are simple and reliable. In addition, The latter stage of the detection circuit can also continue to expand other control circuits.

以上所述实施例仅用以说明本申请的技术方案,而非对其限制;尽管参照前述实施例对本申请进行了详细的说明,本领域的普通技术人员应当理解:其依然可以对前述各实施例所记载的技术方案进行修改,或者对其中部分技术特征进行等同替换;而这些修改或者替换,并不使相应技术方案的本质脱离本申请各实施例技术方案的精神和范围,均应包含在本申请的保护范围之内。The above-mentioned embodiments are only used to illustrate the technical solutions of the present application, but not to limit them; although the present application has been described in detail with reference to the above-mentioned embodiments, those of ordinary skill in the art should understand that: it can still be used for the above-mentioned implementations. The technical solutions described in the examples are modified, or some technical features thereof are equivalently replaced; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions in the embodiments of the application, and should be included in the within the scope of protection of this application.

Claims (10)

1. The utility model provides a capacitive coupling formula detects anti-disassembly device, locates on the circuit substrate, its characterized in that includes:
the anti-disassembly structure comprises a first conductive layer arranged on the circuit substrate, a first signal contact for accessing a Tamper signal and a conductive connecting sheet, and the conductive connecting sheet covers the first signal contact and welds or directly presses the first signal contact;
the coupling conducting strips are arranged on the second conducting layer of the circuit substrate, and each coupling conducting strip is arranged opposite to one anti-dismounting structure to form a coupling capacitor; and
and the detection circuit is connected with the coupling conducting strip and is used for outputting a detection electric signal according to the capacitance change of the coupling capacitor.
2. The capacitively coupled sensing tamper-evident device of claim 1, wherein each of the tamper-evident structures further comprises at least one second signal contact electrically isolated from the first signal contact on the first conductive layer, and the conductive connecting pad overlays and either welds or directly presses the first signal contact and the second signal contact.
3. The capacitively-coupled detection tamper apparatus of claim 1, wherein the detection circuit comprises:
the input end of the access circuit is connected with the coupling conducting strip, and the drive voltage is output based on the voltage of the coupling capacitor;
and the control end of the switch tube is connected with the output end of the access circuit, and the switch tube is switched on and off under the driving of the driving voltage so as to output the detection electric signal at the first conduction end or the second conduction end of the switch tube.
4. The capacitively coupled test tamper evident device of claim 3, wherein the access circuit includes a diode and a capacitor, an anode of the diode being an input of the access circuit, a cathode of the diode being connected to one end of the capacitor and being an output of the access circuit, and another end of the capacitor being connected to ground.
5. The capacitively coupled detection tamper resistant device of claim 4, wherein the access circuit further comprises a pull-up resistor or a pull-down resistor, the pull-up resistor or the pull-down resistor connected to the cathode of the diode.
6. The capacitively coupled tamper-evident device of claim 3, wherein the switch tube is an NPN transistor or an NMOS tube.
7. The capacitively-coupled sensing tamper-evident device of claim 2, wherein the tamper-evident structure further comprises a guard signal ring disposed on the first conductive layer, the guard signal ring being electrically isolated around the outside of the first signal contact and the second signal contact, and the guard signal ring being electrically isolated from the conductive connecting pad.
8. The capacitively-coupled test tamper of claim 7, wherein the guard signal ring, the first signal contact and the second signal contact are gold fingers or copper exposed layers disposed on the first conductive layer.
9. The capacitively-coupled test tamper of any of claims 1 to 6, wherein the first conductive layer is a surface layer of the circuit substrate and the second conductive layer is an intermediate layer of the circuit substrate.
10. A POS machine comprising a capacitively coupled detection tamper evident device of any one of claims 1 to 9.
CN202020403952.9U 2020-03-25 2020-03-25 Capacitive coupling detection anti-dismantling device and POS machine Active CN211827459U (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114322727A (en) * 2021-12-21 2022-04-12 深圳市恒辉达电子有限公司 Equipment anti-disassembly detection device and detection method
WO2023215087A1 (en) * 2022-05-05 2023-11-09 Applied Materials, Inc. Rf measurement from a transmission line sensor

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114322727A (en) * 2021-12-21 2022-04-12 深圳市恒辉达电子有限公司 Equipment anti-disassembly detection device and detection method
CN114322727B (en) * 2021-12-21 2024-04-02 深圳市恒辉达电子有限公司 Equipment anti-disassembly detection device and detection method
WO2023215087A1 (en) * 2022-05-05 2023-11-09 Applied Materials, Inc. Rf measurement from a transmission line sensor
US12061215B2 (en) 2022-05-05 2024-08-13 Applied Materials, Inc. RF measurement from a transmission line sensor

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