CN211718378U - Non-contact voltage detection test circuit for test pencil - Google Patents
Non-contact voltage detection test circuit for test pencil Download PDFInfo
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- CN211718378U CN211718378U CN201921444046.7U CN201921444046U CN211718378U CN 211718378 U CN211718378 U CN 211718378U CN 201921444046 U CN201921444046 U CN 201921444046U CN 211718378 U CN211718378 U CN 211718378U
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Abstract
The utility model discloses a non-contact voltage detection test circuit for a test pencil, relating to the technical field of detection circuits; the device comprises a power supply circuit, a signal acquisition circuit, an MCU chip, a digital display circuit and a test state LED warning reminding circuit; the MCU chip is integrated with a signal integrated circuit, a detection circuit, an amplifying circuit, an AD data analyzing circuit, a preset data circuit, a software correcting circuit, a logic comparison circuit and a functional driving circuit; the digital display circuit and the test state LED warning and reminding circuit are connected to an output port of the function driving circuit; the power supply circuit is electrically connected to the amplifying circuit and the AD data analyzing circuit; the utility model has the advantages that: the circuit can be detected simply to confirm whether the circuit is charged or not.
Description
[ technical field ] A method for producing a semiconductor device
The utility model relates to a test circuit technical field, more specifically the utility model relates to a non-contact voltage detection test circuit.
[ background of the invention ]
The existing measurement mode for alternating voltage mostly adopts contact type measurement, along with the increasing use rate of electronic appliances in home users, the probability of faults of a home power supply line system is continuously increased, the home power supply line system has fatal high voltage under unknown conditions, the contact type measurement test pencil is more exposed due to conductive parts, and the danger of mistaken touch can often appear in practical application of users.
[ Utility model ] content
An object of the utility model is to overcome effectively not enough of above-mentioned technique, provide a non-contact voltage surveys electrography test circuit, can realize easy operation's detecting the circuit to confirm whether electrified.
The technical scheme of the utility model is realized like this: the improvement of a non-contact voltage detection test circuit of a test pencil is that: the device comprises a power supply circuit, a signal acquisition circuit, an MCU chip, a digital display circuit and a test state LED warning reminding circuit;
the MCU chip is integrated with a signal integrated circuit, a detection circuit, an amplification circuit, an AD data analysis circuit, a preset data circuit, a software correction circuit, a logic comparison circuit and a functional drive circuit; the digital display circuit and the test state LED warning reminding circuit are electrically connected to an output port of the function driving circuit;
the power supply circuit is electrically connected to the amplifying circuit and the AD data analyzing circuit.
In the structure, a clock circuit and a reference circuit are further integrated on the MCU chip, the clock circuit is electrically connected with a power supply circuit, and the amplifying circuit is electrically connected to the clock circuit;
one end of the reference circuit is electrically connected with the clock circuit, and the other end of the reference circuit is electrically connected with the AD data analysis circuit.
In the above structure, the MCU chip further integrates a PWM circuit electrically connected to the functional driving circuit.
In the above structure, the non-contact voltage detecting test circuit further includes a sound reminding circuit electrically connected to the function driving circuit.
In the above structure, the non-contact voltage detecting test circuit further includes an illumination circuit electrically connected to the function driving circuit.
In the above structure, the signal acquisition circuit includes an NVC sensor.
In the structure, the MCU chip is a 12-bit AD single chip microcomputer, and the model number of the MCU chip is SC77P 33.
The beneficial effects of the utility model reside in that: the user can accurately judge whether the detected part of the circuit is provided with the dangerous power supply, and the circuit can be detected simply to confirm whether the circuit is electrified.
[ description of the drawings ]
Fig. 1 is a circuit block diagram of the non-contact voltage detecting test circuit of the present invention.
Fig. 2 is the utility model relates to a non-contact voltage detection test circuit's supply circuit schematic diagram.
Fig. 3 is the utility model relates to a non-contact voltage surveys test circuit's signal integrated circuit, MCU chip, lighting circuit, sound warning circuit's circuit schematic diagram.
Fig. 4 is a schematic diagram of a digital display circuit of the non-contact voltage detection test circuit of the present invention.
Fig. 5 is the utility model relates to a test status LED warning of non-contact voltage detection test circuit reminds the schematic diagram of circuit.
[ detailed description ] embodiments
The invention is further described with reference to the following figures and examples.
Referring to fig. 1 to 5, the utility model discloses a non-contact voltage detection test circuit for test pencil, it is specific, this circuit includes power supply circuit 10, signal acquisition circuit 20, MCU chip 30, digital display circuit 40 and test status LED warning circuit 50, wherein, as shown in fig. 2, power supply circuit 10 is direct current 1.5V battery, in this embodiment, as shown in combination with fig. 1, MCU chip 30 on integrate signal integrated circuit, detection circuit, amplifier circuit, AD data analysis circuit, preset data circuit, software correction circuit, logic comparison circuit and function drive circuit; the signal acquisition circuit 20, the detection circuit, the amplification circuit, the AD data analysis circuit, the software correction circuit, the logic comparison circuit and the function driving circuit are electrically connected in sequence, the preset data circuit is electrically connected with the software correction circuit, and the digital display circuit 40 and the test state LED warning and reminding circuit 50 are both electrically connected to an output port of the function driving circuit; the power supply circuit 10 is electrically connected to the amplifying circuit and the AD data analyzing circuit.
As shown in fig. 1, a clock circuit and a reference circuit are further integrated on the MCU chip 30, the clock circuit is electrically connected to the power supply circuit 10, and the amplifying circuit is electrically connected to the clock circuit; one end of the reference circuit is electrically connected with the clock circuit, and the other end of the reference circuit is electrically connected with the AD data analysis circuit; furthermore, a PWM circuit is integrated on the MCU chip 30, and the PWM circuit is electrically connected to the functional driving circuit. As shown in fig. 3, the non-contact voltage detecting test circuit further includes an audio alert circuit 60 and an illumination circuit 70, both of which are electrically connected to the functional driving circuit.
Referring to fig. 2, in this embodiment, the MCU chip is a 12-bit AD single chip microcomputer, which is of a type SC77P33 and has a plurality of pins, the signal acquisition circuit 20 includes an NVC inductive sensor, the NVC inductive sensor is connected to an AIO pin of the MCU chip, a resistor R2 is disposed between the NVC inductive sensor and an AL1 pin of the MCU chip, and the AL1 pin of the MCU chip is connected to an ACM pin. Further, we describe the peripheral circuit of the MCU chip in detail, wherein the RST/VPP pin and VDD pin of the MCU chip are both connected to the power supply circuit 10, a resistor R1 is disposed between the RST/VPP pin of the MCU chip and the power supply circuit 10, a capacitor C1 is disposed between the RST/VPP pin of the MCU chip and the ground, a key switch SW1 is disposed between the PT1.0 pin of the MCU chip and the ground, a key switch SW2 is disposed between the PT1.1 pin of the MCU chip and the ground, the PT1.2 pin, the PT1.3 pin, the PT1.4 pin, and the PT1.5 pin of the MCU chip are all connected to the digital display port LED1, and the PT12.0 pin and the PT12.3 pin of the MCU chip are also connected to the digital display port LED 1.
The PT1.6 pin of MCU chip is connected to lighting circuit to realize the control to lighting circuit, in this embodiment, lighting circuit include triode Q2, light LED3, resistance R6 and resistance R7, resistance R6 and light LED3 establish ties between mains operated circuit 10 and triode Q2's collecting electrode, resistance R7 sets up between the PT1.6 pin of triode Q2 and MCU chip, the projecting pole of triode Q2 ground connection. The PT1.7 pin of MCU chip is connected to on the sound warning circuit, in order to realize the control to the sound warning circuit, in this embodiment, the sound warning circuit includes triode Q1, resistance R4, loudspeaker BZ and resistance R3, between resistance R3 and the collector electrode of loudspeaker BZ series connection power supply circuit 10 and triode Q1, resistance R4 sets up between the base of triode Q1 and the PT1.7 pin of MCU chip, triode Q1's emitter ground. In addition, an SEG4 pin, an SEG3 pin, an SEG2 pin, a COM2 pin, a COM1 pin and a COM0 pin of the MCU chip are connected to a port LCD1 for digital display.
Referring to fig. 5, a pin PT2.1 and a pin PT2.2 of the MCU chip are connected to a test state LED warning circuit, which includes a transistor Q3, a transistor Q4, a red diode LEDRGA, a green diode LEDRGB, and a plurality of resistors; the red diode LEDRGA and the resistor R8 are arranged between the power supply circuit 10 and the collector of the triode Q3, a resistor R8 is arranged between the common end of the red diode LEDRGA and the resistor R8 and the PT2.1 pin, a resistor R9 is arranged between the PT2.1 pin and the base of the triode Q3, a resistor R9 is connected between the collector and the emitter of the triode Q3, and the emitter of the triode Q3 is grounded. The green diode LEDRGB and the resistor R10 are arranged between the power supply circuit 10 and the collector of the triode Q4, a resistor R10 is arranged between the common end of the green diode LEDRGB and the resistor R10 and the PT2.2 pin, a resistor R11 is arranged between the PT2.2 pin and the base of the triode Q3, a resistor R11 is connected between the collector and the emitter of the triode Q3, and the emitter of the triode Q4 is grounded.
With the above circuit structure, we explain the working process of the non-contact voltage detecting test circuit of the present invention in detail, the signal collected by the NCV sensing device of the signal collecting circuit is filtered by the detection circuit, after queuing up the interference and noise signals, it is sent to the amplifying circuit to be amplified, the internal amplifier amplifies the weak signal by 100 times to obtain a stable and continuous analog signal, then the analog signal is sent to the AD data analyzing circuit to be data processed and converted by the internal switch of the MCU, after analysis, a relatively effective digital signal is obtained, and after merging with the data list preset by the preset data circuit, it is provided to the post-stage logic comparing circuit, when the measured data conforms to the preset comparison data, the logic comparing result is true value, the result is sent to the function driving circuit, and outputting a visualized result.
When the device is used, the lowest digit displays a green mark, which indicates that the microprocessing control circuit of the device starts working, the device scans the range of about 2-10cm near the induction device successively at the speed of less than 1/10 seconds/times, if alternating magnetic field current is generated, the digital display part of the non-contact voltage detection electroprobe device can automatically give out corresponding 3-time judgment reminding warning including digital display, light colors (green, yellow and red) and buzzing alarm alarms at different speeds according to the amplitude value of the signal detected by the induction device after multiple times of multiple data analysis, so that a user can accurately judge whether the detected part of the circuit is provided with a dangerous power supply, and the circuit can be detected simply to confirm whether the circuit is electrified or not.
In the embodiment, the digital display circuit and various switches are combined to form a control display panel, the control display panel is provided with a power switch display identifier, a sensitivity control switch, a flashlight function switch, a battery low-voltage reminding identifier, a low-voltage detection display identifier, a relatively high-voltage display identifier, a dangerous voltage identifier and a high-voltage danger warning identifier, when the power switch display identifier is pressed down, the control display panel is started, when the power switch display identifier is pressed down again, the control display panel is turned off, at the moment, the LED and the like are all displayed once, and the buzzer gives an alarm; the sensitivity control switch is turned on when pressed down, the corresponding S symbol is lightened, the buzzer function prompts a sound, and the sensitivity control switch is turned off when pressed down again. When voltage detection is carried out, if the voltage is less than 36V, the low-voltage detection display mark slowly flashes, and the buzzer gives an alarm; if the voltage is greater than 36V and less than 110V, the display mark with relatively high voltage is flashed at a medium speed, and the buzzer and the dangerous voltage mark alarm at the same time; if the voltage is larger than 220V, the measuring indicator lamp is in a quick flash state, and the buzzer and the dangerous voltage mark alarm at the same time.
The above description is only for the preferred embodiment of the present invention, and the above specific embodiments are not intended to limit the present invention. Within the scope of the technical idea of the present invention, various modifications and alterations can be made, and any person skilled in the art can make modifications, amendments or equivalent replacements according to the above description, all belonging to the protection scope of the present invention.
Claims (7)
1. The utility model provides a non-contact voltage detection test circuit of electrography which characterized in that: the device comprises a power supply circuit, a signal acquisition circuit, an MCU chip, a digital display circuit and a test state LED warning reminding circuit;
the MCU chip is integrated with a signal integrated circuit, a detection circuit, an amplification circuit, an AD data analysis circuit, a preset data circuit, a software correction circuit, a logic comparison circuit and a functional drive circuit; the digital display circuit and the test state LED warning reminding circuit are electrically connected to an output port of the function driving circuit;
the power supply circuit is electrically connected to the amplifying circuit and the AD data analyzing circuit.
2. The non-contact voltage detecting test circuit of claim 1, wherein: the MCU chip is also integrated with a clock circuit and a reference circuit, the clock circuit is electrically connected with the power supply circuit, and the amplifying circuit is electrically connected with the clock circuit;
one end of the reference circuit is electrically connected with the clock circuit, and the other end of the reference circuit is electrically connected with the AD data analysis circuit.
3. A non-contact voltage detecting stylus test circuit according to claim 1 or 2, wherein: and the MCU chip is also integrated with a PWM circuit, and the PWM circuit is electrically connected to the functional driving circuit.
4. The non-contact voltage detecting test circuit of claim 1, wherein: the non-contact voltage detection test circuit further comprises a sound reminding circuit, and the sound reminding circuit is electrically connected to the function driving circuit.
5. The non-contact voltage detecting test circuit of claim 1, wherein: the non-contact voltage detection test circuit further comprises an illumination circuit, and the illumination circuit is electrically connected to the function driving circuit.
6. The non-contact voltage detecting test circuit of claim 1, wherein: the signal acquisition circuit comprises an NVC induction sensor.
7. The non-contact voltage detecting test circuit of claim 1, wherein: the MCU chip is a 12-bit AD single chip microcomputer, and the model number of the MCU chip is SC77P 33.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921444046.7U CN211718378U (en) | 2019-09-02 | 2019-09-02 | Non-contact voltage detection test circuit for test pencil |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921444046.7U CN211718378U (en) | 2019-09-02 | 2019-09-02 | Non-contact voltage detection test circuit for test pencil |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN211718378U true CN211718378U (en) | 2020-10-20 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201921444046.7U Active CN211718378U (en) | 2019-09-02 | 2019-09-02 | Non-contact voltage detection test circuit for test pencil |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN211718378U (en) |
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2019
- 2019-09-02 CN CN201921444046.7U patent/CN211718378U/en active Active
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Address after: Area A, 4th Floor, Building D3, No. 78 Jiangbei Road, Xiekeng, Qingxi Town, Dongguan City, Guangdong Province Patentee after: Guangdong Huayi Intelligent Equipment Co.,Ltd. Country or region after: China Address before: 523660 Area A, 4th Floor, Building D3, No. 78 Jiangbei Road, Xiekeng, Qingxi Town, Dongguan City, Guangdong Province Patentee before: Dongguan Huayi Intelligent Equipment Co.,Ltd. Country or region before: China |