CN211698178U - Resolution testing device - Google Patents

Abstract

The utility model relates to a resolution testing arrangement. The device comprises a device to be tested, a test pattern and a reflector, wherein the reflector is arranged on one side of a connecting line between the device to be tested and the test pattern at a set angle, and the set angle enables the device to be tested to obtain the complete test pattern through the reflector.

Description

Resolution testing device

Technical Field

The utility model relates to a resolution test technical field, more specifically relates to a resolution testing arrangement.

Background

When performing resolution test on some devices, such as TOF modules, a device to be tested is usually placed at a position just opposite to a test pattern, the test pattern is obtained by using the device to be tested, and the obtained test pattern is analyzed to obtain the resolution of the device.

The existing method can only test the resolution of the devices one by one, and has low test speed and high time cost.

Therefore, a new technical solution for resolution test is needed.

SUMMERY OF THE UTILITY MODEL

An object of the embodiment of the utility model is to provide a resolution testing arrangement.

According to the utility model discloses an aspect provides a resolution testing arrangement, including device under test, test pattern and speculum, the speculum with set angle set up in the device under test with one side of line between the test pattern, set angle makes the device under test can pass through the speculum acquires completely the test pattern.

Optionally, the device under test and the reflectors are multiple, and each device under test obtains the test pattern through a corresponding reflector.

Optionally, the plurality of mirrors are evenly distributed around a line between the device under test and the test pattern.

Optionally, the device further comprises a light source board capable of emitting light, and the test pattern is arranged on the surface of the light source board.

Optionally, the device under test is located opposite to the test pattern.

Optionally, a distance between the device under test and the test pattern is less than 1 meter.

Optionally, the mirror is a planar mirror.

Optionally, the device under test is a TOF module device.

The device testing device in the embodiment increases the number of devices which can be tested simultaneously on the basis of the existing testing mode, and is beneficial to improving the testing efficiency.

Other features of the present invention and advantages thereof will become apparent from the following detailed description of exemplary embodiments of the invention, which proceeds with reference to the accompanying drawings.

Drawings

The accompanying drawings, which are incorporated in and constitute a part of the specification, illustrate embodiments of the invention and together with the description, serve to explain the principles of the invention.

Fig. 1 is a schematic diagram of a resolution testing apparatus according to an embodiment of the present invention.

Fig. 2 is a schematic diagram of another resolution testing apparatus according to an embodiment of the present invention.

Fig. 3 is a schematic diagram of a test pattern provided by an embodiment of the present invention.

Detailed Description

Various exemplary embodiments of the present invention will now be described in detail with reference to the accompanying drawings. It should be noted that: unless specifically stated otherwise, the relative arrangement of the components and steps, the numerical expressions, and numerical values set forth in these embodiments do not limit the scope of the present invention.

The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the invention, its application, or uses.

Techniques and equipment known to those of ordinary skill in the relevant art may not be discussed in detail, but are intended to be part of the specification where appropriate.

In all examples shown and discussed herein, any particular value should be construed as merely illustrative, and not limiting. Thus, other examples of the exemplary embodiments may have different values.

It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, further discussion thereof is not required in subsequent figures.

Fig. 1 shows a schematic diagram of a resolution testing apparatus provided by the present invention.

As shown in fig. 1, the resolution test apparatus includes a device under test 32, a test pattern 2, and a mirror 4. The mirror 4 is disposed at a set angle on one side of a connection line between the device under test 32 and the test pattern 2, the set angle enabling the complete test pattern to be acquired through the mirror 4.

The resolution test apparatus further includes a light source board 1 that can emit light. The test pattern 2 is disposed on the surface of the light source board 1. Specifically, the test pattern 2 is disposed in a pasted manner on the lower surface of the light source board 1. Therefore, the brightness requirement of the resolution test can be met.

The line between the device under test 32 and the test pattern 2 is, for example, a line between the center of the device under test 32 and the center of the test pattern 2.

The set angle is, for example, an angle between a normal line of the mirror surface of the mirror and a line connecting the device under test 32 and the test pattern 2. The set angle is, for example, 45 °.

Under the condition that the positions of the test pattern 2, the reflector 4 and the device to be tested 32 are fixed, the reflector angle enabling the device to be tested 32 to obtain a complete test pattern through the reflector 4 can be found by rotating the reflector 4 and the device to be tested 32, and the angle is the set angle.

The light path in the above-mentioned testing device is shown by the dotted line in fig. 1, and the light starts from a certain point in the test pattern 2, reaches the reflector 4, and reaches the receiving portion of the dut 32 after being reflected.

The test apparatus further includes a device under test 31. The testing mode of the device under test 31 is the conventional mode, that is, the device under test 31 is disposed right under the test pattern 2 and directly receives the light from the test pattern 2, and the path of the light is shown by the dotted line between the test pattern 2 and the device under test 31 in fig. 1.

When performing the resolution test, the device under test 32 may be used to obtain a complete test pattern reflected by the reflector 4, and the test pattern obtained by the device under test 32 is analyzed, so as to obtain the resolution of the device under test 32. The analysis process is to obtain the brightness values of 5 positions on the surface of the test pattern as shown in fig. 3, for example, and compare the brightness values with the standard values to obtain the resolution.

The device testing device in the embodiment increases the number of devices which can be tested simultaneously on the basis of the existing testing mode, and is beneficial to improving the testing efficiency.

The device under test 32 is located at a position facing the test pattern 2, i.e., the center of the device under test 32 faces the test pattern 2.

Preferably, the distance between the device under test 32 and the test pattern 2 is less than 1 meter. Thus, the test requirements can be met.

A mirror is an optical element that works using the law of reflection. The reflecting mirror can be divided into a plane reflecting mirror, a spherical reflecting mirror and an aspheric reflecting mirror according to the shapes. The mirror in this embodiment may be selected to be a flat mirror.

In this embodiment, the device to be tested is, for example, a TOF (Time of flight) module device. TOF is an abbreviation of Time of Flight (TOF) technology, i.e. a sensor emits modulated near-infrared light, which is reflected after encountering an object, and the sensor converts the distance of the photographed scene by calculating the Time difference or phase difference between light emission and reflection to generate depth information.

Fig. 2 shows a schematic diagram of another resolution testing apparatus provided by the present invention.

As shown in fig. 2, the resolution test apparatus includes a plurality of devices under test 32, a plurality of reflection mirrors 4, a test pattern 2, and a light source board 1. And each device to be tested acquires a test pattern through a corresponding reflector.

Specifically, the test device comprises 3 devices to be tested and 3 reflectors, and the devices to be tested 3a, 3b and 3c correspond to the reflectors 4a, 4b and 4c in sequence. The reflecting mirror 4a is disposed at a set angle on the side of the line between the device under test 3a and the test pattern 2. Similarly, the reflecting mirror 4b is provided at a set angle on the side of the line between the device under test 3b and the test pattern 2, and the reflecting mirror 4c is provided at a set angle on the side of the line between the device under test 3c and the test pattern 2.

The number of the reflectors can be reasonably set according to the test requirements and the production conditions.

The device testing device in the embodiment can simultaneously perform resolution testing on a plurality of devices to be tested, and greatly improves the testing efficiency.

Preferably, the plurality of mirrors are evenly distributed around a line between the device under test and the test pattern.

Although some specific embodiments of the present invention have been described in detail by way of illustration, it should be understood by those skilled in the art that the above illustration is only for purposes of illustration and is not intended to limit the scope of the invention. It will be appreciated by those skilled in the art that modifications may be made to the above embodiments without departing from the scope and spirit of the invention. The scope of the invention is defined by the appended claims.

Claims (8)

1. The resolution testing device is characterized by comprising a device to be tested, a testing pattern and a reflecting mirror, wherein the reflecting mirror is arranged on one side of a connecting line between the device to be tested and the testing pattern at a set angle, and the set angle enables the device to be tested to obtain a complete testing pattern through the reflecting mirror.

2. The apparatus of claim 1, wherein the device under test and the mirror are plural, and each of the device under test obtains the test pattern through a corresponding one of the mirrors.

3. The apparatus of claim 2, wherein the plurality of mirrors are evenly distributed around a line between the device under test and the test pattern.

4. The device of claim 1, further comprising a light source board that can emit light, the test pattern being disposed on a surface of the light source board.

5. The apparatus of claim 1, wherein the device under test is located directly opposite the test pattern.

6. The apparatus of claim 1, wherein a distance between the device under test and the test pattern is less than 1 meter.

7. The apparatus of claim 1, wherein the mirror is a planar mirror.

8. The apparatus of any of claims 1-7, wherein the device under test is a TOF module device.

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