CN211669246U - Novel test jig of circuit board test fixture - Google Patents
Novel test jig of circuit board test fixture Download PDFInfo
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- CN211669246U CN211669246U CN202020129546.8U CN202020129546U CN211669246U CN 211669246 U CN211669246 U CN 211669246U CN 202020129546 U CN202020129546 U CN 202020129546U CN 211669246 U CN211669246 U CN 211669246U
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Abstract
The utility model discloses a novel test jig of circuit board test fixture, including the frame seat, the front side of frame seat is opened and is equipped with first chamber and the second chamber that holds, the top both sides of frame seat all have the backup pad through welded fastening, are equipped with the transmission chamber between the top of two backup pads, the below in transmission chamber is provided with the holding down plate, the bottom of holding down plate is provided with the probe card, the bottom of probe card is equipped with elastic probe, the below of probe card is equipped with test base, test base's bottom equidistant buffer gear that is equipped with, buffer gear comprises pole, support outer tube and buffer spring in the support. The utility model discloses an impact force that produces when buffer gear can cushion the elastic probe and contact with the circuit board has protected elastic probe and circuit board, can make circuit board and elastic probe effectively contact through buffer gear simultaneously, has improved the effect of test.
Description
Technical Field
The utility model relates to a circuit board test field, concretely relates to novel test jig of circuit board test fixture.
Background
The test jig is an auxiliary device for carrying out the circular telegram to the circuit board and detects, it has obtained extensive use in test equipment's field, when the test jig used, the staff at first placed the circuit board on the workstation, carry out spacing fixed to the circuit board through the bolt, the multiunit test probe is connected with the electricity between external controlling means and the display device, manual pressing plate downwards, the clamp plate drives the probe card downstream, and through the circular telegram test of carrying out of multiunit test probe to the circuit board, the information that the multiunit test probe detected shows through external display device.
At present, when a probe is used for testing, the distance between the probe and a circuit board cannot be effectively ensured, and the conditions of probe breakage and circuit board breakage are possible.
Therefore, it is necessary to provide a novel test jig for a circuit board testing tool to solve the above problems.
SUMMERY OF THE UTILITY MODEL
The utility model aims at providing a novel test jig of circuit board test fixture, through rotating the bull stick, it rotates to drive the lead screw, the lead screw rotates and makes the lower pressure plate move the probe card and move down, it drives the probe card downstream to compare traditional with the hand according to the pressing plate downwards, the speed that the control probe card that the bull stick can be better moved down, adjust the height of probe card, the elastic probe who avoids the probe card bottom leads to elastic probe rupture or circuit board damage with circuit board contact pressure is too big in the twinkling of an eye, the bottom of test base is equipped with buffer gear, the impact force that produces when can cushion elastic probe and circuit board contact through buffer gear, elastic probe and circuit board have been protected, can make circuit board and elastic probe effectively contact through buffer gear simultaneously, the effect of testing has been improved, with the above-mentioned weak point in the solution technique.
In order to achieve the above object, the present invention provides the following technical solutions: a test jig of a novel circuit board test tool comprises a jig base, wherein a first accommodating cavity and a second accommodating cavity are formed in the front side of the jig base, a circuit board placing frame to be tested is placed in the first accommodating cavity in a sliding mode, the second accommodating cavity is located on the right side of the first accommodating cavity, a tested circuit board placing frame is placed in the second accommodating cavity in a sliding mode, supporting plates are fixedly welded on the two sides of the top of the jig base, a transmission cavity is formed between the tops of the two supporting plates, a lower pressing plate is arranged below the transmission cavity, a probe plate is arranged at the bottom of the lower pressing plate, a plurality of elastic probes are arranged at the bottom of the probe plate, nuts are nested on the left side and the right side of the lower pressing plate, the nuts penetrate through the upper side and the lower side of the lower pressing plate, the nuts are fixedly connected with the lower pressing plate, and lead screws are nested in the nuts, the lower end of the screw rod is movably connected with the top surface of the frame seat through a bearing, the upper end of the screw rod extends into the transmission cavity through the bearing and is connected with a first gear, the first gear and the screw rod are fixed through welding, the transmission cavity is internally nested with a rotating rod, one end of the rotating rod is movably connected with the inner wall of the transmission cavity through the bearing, the other end of the rotating rod extends out of the transmission cavity through the bearing and is connected with a handle, the rod body surface of the rotating rod in the transmission cavity is sleeved with a second gear, the second gear and the rotating rod are fixed through welding, a test base is arranged below the probe card and is positioned between the two screw rods, a mounting groove is formed in the middle part of the upper side of the test base, buffer mechanisms are arranged at equal intervals at the bottom of the test base and consist of a support inner rod, a support outer tube and a buffer spring, the lower end of the inner support rod is nested in the outer support tube, the inner support rod is in sliding connection with the outer support tube, and the buffer spring is sleeved on the outer sides of the inner support rod and the outer support tube.
Preferably, the screw rod is rotatably connected with the nut through threads.
Preferably, the number of the second gears and the number of the first gears are two, the two second gears and the two first gears are both conical gears, the second gears are respectively positioned above the two first gears, and the second gears are meshed with the first gears.
Preferably, bolt mounting holes are formed in four corners of the mounting groove.
Preferably, the bottom end of the support inner rod is fixed with a limiting block, the diameter of the limiting block is larger than the diameter of a port of the support outer tube, the limiting block and the support outer tube are connected in a sliding mode, the upper end of the support inner rod is fixedly connected with the bottom of the test base, and the bottom of the support outer tube is fixedly connected with the top of the frame seat.
Preferably, the handle is fixedly connected with the rotating rod through welding, and the surface of the handle is sleeved with the anti-slip sleeve.
Preferably, a first sliding groove is formed in the inner wall of the bottom of the first accommodating cavity, a first pulley is fixed to the bottom of the circuit board placing frame to be tested through a bolt, the first pulley is nested in the first sliding groove, and the first pulley and the first sliding groove are connected in a sliding mode.
Preferably, a second sliding groove is formed in the inner wall of the bottom of the second containing cavity, a second pulley is fixed to the bottom of the measured circuit board placing frame through a bolt, the second pulley is nested in the second sliding groove, and the second pulley is connected with the second sliding groove in a sliding mode.
In the technical scheme, the utility model provides a technological effect and advantage:
1. the rotating rod is rotated to drive the lead screw to rotate, the lead screw rotates to enable the pressing plate to drive the probe board to move downwards, compared with the traditional method that the probe board is driven to move downwards by pressing the board downwards by hands, the rotating rod can be rotated to better control the speed of the downward movement of the probe board, the height of the probe board is adjusted, the elastic probe is prevented from being broken or damaged due to the fact that the elastic probe is excessively high in pressure at the moment that the elastic probe at the bottom of the probe board is contacted with the circuit board, the bottom of the test base is provided with the buffer mechanism, impact force generated when the elastic probe is contacted with the circuit board can be buffered through the buffer mechanism, the elastic probe and the circuit board are protected, meanwhile, the circuit board can;
2. the cavity is held through being equipped with first holding the chamber and the second, and the first intracavity that holds is slided and is placed the circuit board rack that awaits measuring, and the second holds the intracavity and slides and has placed the circuit board rack that has measured, and the circuit board that awaits measuring is placed at the circuit board rack that awaits measuring, and the circuit board rack that has surveyed is placed at the circuit board that has measured, makes things convenient for the staff to take and place the circuit board in the testing process, has improved the efficiency of test.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments described in the present invention, and other drawings can be obtained by those skilled in the art according to these drawings.
Fig. 1 is a schematic view of the overall structure of the present invention;
fig. 2 is a cross-sectional view of the present invention;
fig. 3 is a top view of the testing base of the present invention;
FIG. 4 is an enlarged view of the point A of FIG. 2 according to the present invention;
FIG. 5 is an enlarged view of the point B of FIG. 2 according to the present invention;
fig. 6 is a sectional view of the buffer mechanism of the present invention.
Description of reference numerals:
the test device comprises a base 1, a first accommodating cavity 2, a second accommodating cavity 3, a circuit board accommodating rack 4 to be tested, a measured circuit board accommodating rack 5, a supporting plate 6, a transmission cavity 7, a lower pressing plate 8, a probe plate 9, an elastic probe 10, a screw nut 11, a lead screw 12, a first gear 13, a rotating rod 14, a handle 15, a second gear 16, a test base 17, a mounting groove 18, a buffer mechanism 19, a support inner rod 20, a support outer tube 21, a buffer spring 22, a bolt mounting hole 23, a first sliding groove 24, a first pulley 25, a second sliding groove 26 and a second pulley 27.
Detailed Description
In order to make the technical solution of the present invention better understood by those skilled in the art, the present invention will be further described in detail with reference to the accompanying drawings.
The utility model provides a test jig of a novel circuit board test tool shown in figures 1-6, which comprises a frame base 1, wherein a first accommodating cavity 2 and a second accommodating cavity 3 are arranged at the front side of the frame base 1, a circuit board placing frame 4 to be tested is placed in the first accommodating cavity 2 in a sliding manner, the second accommodating cavity 3 is positioned at the right side of the first accommodating cavity 2, a tested circuit board placing frame 5 is placed in the second accommodating cavity 3 in a sliding manner, supporting plates 6 are fixed at both sides of the top of the frame base 1 through welding, a transmission cavity 7 is arranged between the tops of the two supporting plates 6, a lower pressing plate 8 is arranged below the transmission cavity 7, a probe plate 9 is arranged at the bottom of the lower pressing plate 8, elastic probes 10 are arranged at the bottom of the probe plate 9, the number of the elastic probes 10 is multiple, and screw nuts 11 are nested at both sides of the lower pressing plate 8, the screw 11 penetrates through the upper side and the lower side of the lower pressing plate 8, the screw 11 is fixedly connected with the lower pressing plate 8, a lead screw 12 is nested in the screw 11, the lower end of the lead screw 12 is movably connected with the top surface of the frame base 1 through a bearing, the upper end of the lead screw 12 extends into the transmission cavity 7 through the bearing and is connected with a first gear 13, the first gear 13 is fixed with the lead screw 12 through welding, a rotating rod 14 is nested in the transmission cavity 7, one end of the rotating rod 14 is movably connected with the inner wall of the transmission cavity 7 through the bearing, the other end of the rotating rod 14 extends out of the transmission cavity 7 through the bearing and is connected with a handle 15, a second gear 16 is sleeved on the rod body surface of the rotating rod 14 in the transmission cavity 7, the second gear 16 is fixed with the rotating rod 14 through welding, a test base 17 is arranged below the probe plate 9, and the test base 17 is arranged between the two lead screws 12, the middle of the upper side of the test base 17 is provided with a mounting groove 18, the bottom of the test base 17 is provided with buffer mechanisms 19 at equal intervals, each buffer mechanism 19 consists of an inner support rod 20, an outer support tube 21 and a buffer spring 22, the lower end of the inner support rod 20 is nested in the outer support tube 21, the inner support rod 20 and the outer support tube 21 are in sliding connection, and the buffer springs 22 are sleeved on the outer sides of the inner support rod 20 and the outer support tube 21;
further, in the above technical solution, the lead screw 12 is rotatably connected with the nut 11 through a thread, so that the lead screw 12 rotates to move the nut 11 on the lead screw 12, and the lower pressing plate 8 drives the probe board 9 to move;
further, in the above technical solution, two second gears 16 and two first gears 13 are provided, the two second gears 16 and the two first gears 13 are both bevel gears, the second gears 16 are respectively located above the two first gears 13, the second gears 16 are connected with the first gears 13 through meshing, so that the rotation of the rotating rod 14 drives the second gears 16 to rotate, and the second gears 16 rotate and drive the screw rods 12 to rotate through the first gears 13;
further, in the above technical solution, four corners of the mounting groove 18 are all provided with bolt mounting holes 23, the circuit board is placed in the mounting groove 18, and the circuit board is fixed by large-head bolts;
further, in the above technical solution, a limiting block is fixed at the bottom end of the inner support rod 20, the diameter of the limiting block is larger than the diameter of the port of the outer support tube 21, the limiting block and the outer support tube 21 are connected in a sliding manner, the upper end of the inner support rod 20 is fixedly connected with the bottom of the test base 17, and the bottom of the outer support tube 21 is fixedly connected with the top of the frame base 1, so that the mounting stability of the test base 17 is improved;
further, in the above technical scheme, the handle 15 and the rotating rod 14 are fixedly connected by welding, and an anti-slip sleeve is sleeved on the surface of the handle 15, so that the phenomenon of slipping of hands due to sweating is avoided;
the implementation mode is specifically as follows: the probe board 9 is connected with external detection equipment, a circuit board to be detected is placed in a mounting groove 18 on a test base 17, four corners of the circuit board to be detected are fixed by bolts penetrating through large-head bolt mounting holes 23, a handle 15 is rotated, an anti-slip sleeve is sleeved on the surface of the handle 15 to prevent the phenomenon of slipping caused by hand sweating, the handle 15 drives a rotating rod 14 to rotate, the rotating rod 14 rotates to drive a second gear 16 to rotate, the second gear 16 rotates to drive a screw rod 12 to rotate through a first gear 13, the screw rod 12 rotates to enable a screw nut 11 to move on the screw rod 12, so that a lower pressing plate 8 drives the probe board 9 to move downwards, the probe board 9 moves downwards to drive an elastic probe 10 to be in contact with a test point on the circuit board, compared with the traditional method that the probe board 9 is driven to move downwards by pressing the probe board downwards by hands, the rotating rod 14 can better control the speed of the downward movement of the probe board 9, the probe breakage or the circuit board damage caused by the contact instant overlarge pressure of the probe 10 at the bottom of the probe board 9 and the circuit board is avoided, the elastic probe 10 is contacted with the circuit board to extrude the circuit board, the circuit board pushes the test base 17 under stress, the test base 17 extrudes the buffer mechanism 19 under stress, the buffer spring 22 on the buffer mechanism 19 is contracted under stress, thereby effectively buffering the pressure born by the circuit board, reducing the pressure between the elastic probe 10 and the circuit board, preventing the surface of the circuit board from being damaged and the probe from being broken, protecting the elastic probe 10 and the circuit board, meanwhile, the circuit board is effectively contacted with the elastic probe 10 through the elasticity of the buffer spring 22, the test effect is improved, the embodiment specifically solves the problems that when a probe is used for testing in the prior art, the distance between the probe and a circuit board cannot be effectively ensured, and the conditions of probe breakage and circuit board damage are possibly caused.
Further, in the above technical scheme, a first sliding groove 24 is formed in the inner wall of the bottom of the first accommodating cavity 2, a first pulley 25 is fixed to the bottom of the to-be-tested circuit board placing frame 4 through a bolt, the first pulley 25 is nested in the first sliding groove 24, and the first pulley 25 and the first sliding groove 24 are in sliding connection, so that the to-be-tested circuit board placing frame 4 can be placed in the first accommodating cavity 2 conveniently, and meanwhile, the to-be-tested circuit board placing frame 4 can be taken out of the first accommodating cavity 2 conveniently;
further, in the above technical scheme, a second sliding groove 26 is formed in the inner wall of the bottom of the second accommodating cavity 3, a second pulley 27 is fixed to the bottom of the measured circuit board placing frame 5 through a bolt, the second pulley 27 is nested in the second sliding groove 26, and the second pulley 27 and the second sliding groove 26 are in sliding connection, so that the measured circuit board placing frame 5 can be placed in the second accommodating cavity 3 conveniently, and meanwhile, the measured circuit board placing frame 5 can be taken out of the second accommodating cavity 3 conveniently;
the implementation mode is specifically as follows: a circuit board placing frame 4 to be tested is placed in the first accommodating cavity 2, the circuit board placing frame 4 to be tested is connected with the first accommodating cavity 2 in a sliding manner, the circuit board placing frame 4 to be tested is conveniently placed in the first accommodating cavity 2, meanwhile, the circuit board placing frame 4 to be tested is convenient to take out from the first containing cavity 2, the measured circuit board placing frame 5 is placed in the second containing cavity 3, the measured circuit board placing frame 5 is connected with the second containing cavity 3 in a sliding way, the measured circuit board placing frame 5 is convenient to place in the second containing cavity 3, meanwhile, the tested circuit board placing frame 5 is convenient to take out from the second accommodating cavity 3, the circuit board to be tested is placed on the circuit board placing frame 4 to be tested, and the tested circuit board is placed on the tested circuit board placing frame 5, so that the circuit board is convenient to take and place by workers in the testing process, the testing efficiency is improved, this embodiment has specifically solved the inconvenient problem of getting of circuit board in the test procedure that exists among the prior art.
This practical theory of operation:
referring to the attached drawings 1-6 of the specification, a probe board 9 is connected with external detection equipment, a circuit board to be detected is placed in a mounting groove 18 on a test base 17, four corners of the circuit board to be detected are fixed by bolts penetrating through large-head bolt mounting holes 23, a handle 15 is rotated, the handle 15 drives a rotating rod 14 to rotate, the rotating rod 14 rotates to drive a second gear 16 to rotate, the second gear 16 rotates to drive a screw rod 12 to rotate through a first gear 13, the screw rod 12 rotates to enable a screw nut 11 to move on the screw rod 12, so that a lower pressing plate 8 drives the probe board 9 to move downwards, the probe board 9 moves downwards to drive an elastic probe 10 to contact with a test point on the circuit board, the elastic probe 10 contacts with the circuit board to extrude the circuit board, the circuit board pushes the test base 17 under stress, the test base 17 extrudes a buffer mechanism 19 under stress, and a buffer spring 22 on the buffer, buffering the pressure on the circuit board;
referring to the attached figures 1-6 of the specification, a circuit board placing frame 4 to be tested is placed in the first containing cavity 2, a circuit board placing frame 5 to be tested is placed in the second containing cavity 3, the circuit board to be tested is placed in the circuit board placing frame 4 to be tested, and the circuit board to be tested is placed in the circuit board placing frame 5 to facilitate a worker to take and place the circuit board in the testing process.
While certain exemplary embodiments of the present invention have been described above by way of illustration only, it will be apparent to those of ordinary skill in the art that the described embodiments may be modified in various different ways without departing from the spirit and scope of the present invention. Accordingly, the drawings and description are illustrative in nature and should not be construed as limiting the scope of the invention.
Claims (8)
1. The utility model provides a novel test jig of circuit board test fixture, includes frame foundation (1), its characterized in that: a first accommodating cavity (2) and a second accommodating cavity (3) are formed in the front side of the frame base (1), a circuit board placing frame (4) to be tested is placed in the first accommodating cavity (2) in a sliding mode, the second accommodating cavity (3) is located on the right side of the first accommodating cavity (2), a tested circuit board placing frame (5) is placed in the second accommodating cavity (3) in a sliding mode, supporting plates (6) are fixed to two sides of the top of the frame base (1) through welding, a transmission cavity (7) is arranged between the tops of the two supporting plates (6), a lower pressing plate (8) is arranged below the transmission cavity (7), a probe plate (9) is arranged at the bottom of the lower pressing plate (8), elastic probes (10) are arranged at the bottom of the probe plate (9), a plurality of the elastic probes (10) are arranged, and nuts (11) are nested on the left side and the right side of the lower pressing plate (8), the screw (11) penetrates through the upper side and the lower side of the lower pressing plate (8), the screw (11) is fixedly connected with the lower pressing plate (8), a screw rod (12) is nested in the screw (11), the lower end of the screw rod (12) is movably connected with the top surface of the frame base (1) through a bearing, the upper end of the screw rod (12) stretches into the transmission cavity (7) through the bearing, a first gear (13) is connected with the inner part of the transmission cavity (7), the first gear (13) is fixedly welded with the screw rod (12), a rotating rod (14) is nested in the transmission cavity (7), one end of the rotating rod (14) is movably connected with the inner wall of the transmission cavity (7) through the bearing, the other end of the rotating rod (14) stretches out of the transmission cavity (7) through the bearing, a handle (15) is connected with the outer part of the rotating rod (14), a second gear (16) is sleeved on the rod body surface of the rotating rod (14) in the transmission cavity (7, welded fastening between second gear (16) and bull stick (14), the below of probe card (9) is equipped with test base (17), test base (17) are located between two lead screws (12), mounting groove (18) have been seted up at the upside middle part of test base (17), the bottom of test base (17) is equidistant to be equipped with buffer gear (19), buffer gear (19) comprise pole (20), support outer tube (21) and buffer spring (22) in supporting, the lower extreme nestification of pole (20) is in supporting outer tube (21) in supporting, set up to sliding connection between pole (20) in supporting and the support outer tube (21), buffer spring (22) cup joint the outside of pole (20) in supporting and supporting outer tube (21).
2. The test jig of claim 1, characterized in that: the screw rod (12) is in rotary connection with the screw nut (11) through threads.
3. The test jig of claim 1, characterized in that: the number of the second gears (16) and the number of the first gears (13) are two, the two second gears (16) and the two first gears (13) are all set to be conical gears, the second gears (16) are respectively located above the two first gears (13), and the second gears (16) are connected with the first gears (13) in a meshed mode.
4. The test jig of claim 1, characterized in that: and bolt mounting holes (23) are formed in four corners of the mounting groove (18).
5. The test jig of claim 1, characterized in that: the bottom mounting of pole (20) has the stopper in the support, the diameter of stopper is greater than the port diameter of supporting outer tube (21), set up to sliding connection between stopper and the support outer tube (21), the bottom fixed connection of the upper end of pole (20) and test base (17) in the support, the top fixed connection of the bottom of support outer tube (21) and frame seat (1).
6. The test jig of claim 1, characterized in that: the handle (15) is fixedly connected with the rotating rod (14) through welding, and the surface of the handle (15) is sleeved with the anti-skidding sleeve.
7. The test jig of claim 1, characterized in that: first spout (24) have been seted up to the bottom inner wall of first chamber (2) that holds, the bottom of awaiting measuring circuit board rack (4) is fixed with first pulley (25) through the bolt, first pulley (25) nestification is in first spout (24), set up to sliding connection between first pulley (25) and first spout (24).
8. The test jig of claim 1, characterized in that: the inner wall of the bottom of the second containing cavity (3) is provided with a second sliding groove (26), the bottom of the measured circuit board placing frame (5) is fixed with a second pulley (27) through a bolt, the second pulley (27) is nested in the second sliding groove (26), and the second pulley (27) is connected with the second sliding groove (26) in a sliding mode.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020129546.8U CN211669246U (en) | 2020-01-20 | 2020-01-20 | Novel test jig of circuit board test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020129546.8U CN211669246U (en) | 2020-01-20 | 2020-01-20 | Novel test jig of circuit board test fixture |
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| CN211669246U true CN211669246U (en) | 2020-10-13 |
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| CN202020129546.8U Active CN211669246U (en) | 2020-01-20 | 2020-01-20 | Novel test jig of circuit board test fixture |
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Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112782566A (en) * | 2021-02-01 | 2021-05-11 | 南京元博皓创科技有限公司 | Ad hoc network circuit board test tool and use method thereof |
| CN112834902A (en) * | 2020-12-31 | 2021-05-25 | 浙江水利水电学院 | Circuit board test fixture |
| CN113960451A (en) * | 2021-10-28 | 2022-01-21 | 广州辰创科技发展有限公司 | Universal structure for testing circuit board function |
| CN114034578A (en) * | 2021-11-11 | 2022-02-11 | 詹清 | Special circuit board bending resistance test machine |
| CN115343596A (en) * | 2022-07-29 | 2022-11-15 | 宜兴兴森快捷电子有限公司 | PCBA board function test system |
| CN116754929A (en) * | 2023-08-17 | 2023-09-15 | 深圳市凌科凯特电子有限公司 | Voltage test jig for vehicle PCB |
| CN114034578B (en) * | 2021-11-11 | 2024-05-24 | 广东君治电子有限公司 | Special circuit board bending resistance testing machine |
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2020
- 2020-01-20 CN CN202020129546.8U patent/CN211669246U/en active Active
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112834902A (en) * | 2020-12-31 | 2021-05-25 | 浙江水利水电学院 | Circuit board test fixture |
| CN112782566A (en) * | 2021-02-01 | 2021-05-11 | 南京元博皓创科技有限公司 | Ad hoc network circuit board test tool and use method thereof |
| CN113960451A (en) * | 2021-10-28 | 2022-01-21 | 广州辰创科技发展有限公司 | Universal structure for testing circuit board function |
| CN113960451B (en) * | 2021-10-28 | 2024-01-16 | 广州辰创科技发展有限公司 | Universal architecture for testing circuit board functions |
| CN114034578A (en) * | 2021-11-11 | 2022-02-11 | 詹清 | Special circuit board bending resistance test machine |
| CN114034578B (en) * | 2021-11-11 | 2024-05-24 | 广东君治电子有限公司 | Special circuit board bending resistance testing machine |
| CN115343596A (en) * | 2022-07-29 | 2022-11-15 | 宜兴兴森快捷电子有限公司 | PCBA board function test system |
| CN116754929A (en) * | 2023-08-17 | 2023-09-15 | 深圳市凌科凯特电子有限公司 | Voltage test jig for vehicle PCB |
| CN116754929B (en) * | 2023-08-17 | 2023-10-13 | 深圳市凌科凯特电子有限公司 | Voltage test jig for vehicle PCB |
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