CN211652508U - Infrared spectrum appearance sample frame - Google Patents

Infrared spectrum appearance sample frame Download PDF

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Publication number
CN211652508U
CN211652508U CN202020413249.6U CN202020413249U CN211652508U CN 211652508 U CN211652508 U CN 211652508U CN 202020413249 U CN202020413249 U CN 202020413249U CN 211652508 U CN211652508 U CN 211652508U
Authority
CN
China
Prior art keywords
socket
sample chamber
inserting plate
base
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN202020413249.6U
Other languages
Chinese (zh)
Inventor
谭微
廖红梅
易慧
吴文启
李奋
谢晓雁
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Lushan College of Guangxi University of Science and Technology
Original Assignee
Lushan College of Guangxi University of Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lushan College of Guangxi University of Science and Technology filed Critical Lushan College of Guangxi University of Science and Technology
Priority to CN202020413249.6U priority Critical patent/CN211652508U/en
Application granted granted Critical
Publication of CN211652508U publication Critical patent/CN211652508U/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Abstract

A sample holder for an infrared spectrometer comprises a plugboard, a socket and a base. And after being assembled into the plug board, the wafer template is inserted into the infrared detection light path from the outside of the top cover of the sample chamber through the socket, and the spectrum measurement is carried out after the positioning point on the base is positioned. The utility model has the advantages that: the opening of the sample chamber communicated with the outside is small, 3 samples can be measured by opening the socket door once when the sample chamber is used, so that the disturbance of harmful gases such as water vapor, carbon dioxide and the like to the environment in the sample chamber can be reduced, the samples are convenient to put in and take out, and the detection working efficiency can be improved.

Description

Infrared spectrum appearance sample frame
Technical Field
The utility model relates to an infrared spectrum appearance sample frame belongs to laboratory instrument subassembly.
Background
When the infrared spectrometer measures a solid sample by a fluoroscopy method, the door of the sample chamber is opened usually once every time one sample is measured. Frequent opening of the door, water vapor, carbon dioxide and other gases enter the sample chamber in a turbulent state, the concentration of the gases is large and small, adverse effects can be caused to infrared spectrum measurement, and particularly, in the experimental class of students in schools, the number of personnel in the laboratory is large, and the effects are particularly obvious.
Disclosure of Invention
The utility model discloses can overcome above-mentioned existing problem, provide a simple structure, the reliable operation's infrared spectrometer sample frame.
The technical solution of the utility model is as follows.
1. Inserting plates: for receiving a wafer template. The inserting plate is provided with a wafer template inlet and a wafer template groove, and the wafer template is put into the wafer template groove from the wafer template inlet and pushed into the wafer template groove. 3 wafer templates can be placed in the wafer template grooves, and the inserting plate is provided with 3 positioning grooves corresponding to the positions of the wafer templates.
2. Inserting a socket: and cutting an opening which can be just inserted into the socket screw from the top cover of the sample chamber, sleeving a rubber gasket on the socket screw after the socket screw is inserted from the top cover, and finally screwing and fixing the socket screw by using a socket fixing nut. And sequentially placing the rubber square ring and the plastic square ring at the inlet end of the upper plug board pipeline, and fixing by using screws. The inner side length of the rubber square ring is 0.5mm less than the corresponding side length of the inserting plate, so that the gap between the inserting plate and the inner wall of the upper inserting plate pipeline is blocked when the inserting plate is inserted. And a socket door is arranged at the inlet of the pipeline of the upper inserting plate and is in a normally closed state when an instrument is in standby.
3. Socket: and the sample chamber is fixed on the bottom plate of the sample chamber by screws. The inlet of the pipeline of the lower plug board is made into a bell mouth shape so as to correct the deviation of the direction which can happen when the plug board is inserted downwards. And the middle section of the lower inserting plate pipeline is provided with a reed for positioning the inserting plate, and the reed is fixed by a screw.
4. When in use, the wafer template carrying the sample is arranged in the inserting plate; opening the socket door, and inserting the plugboard from the socket; after the positioning groove of the plug board moves to the positioning point of the reed on the base, the positioning point blocks the positioning groove on the plug board, and at the moment, infrared spectrum measurement can be carried out on the sample on the wafer template corresponding to the positioning point.
5. The size of the upper inserting plate pipeline and the lower inserting plate pipeline can be just inserted into the inserting plate and can flexibly move in the inserting plate. The socket and the base are separated from each other, and the sample chamber top cover can be lifted and opened together with the socket, so that the operations of cleaning, maintaining and the like in the sample chamber are facilitated.
6. Except as specifically noted, the components are made of plastic or metal; all parts are black.
The utility model discloses the same with prior art is: the sample holder is used for placing the wafer template.
The utility model discloses the difference with prior art is: the sample frame comprises picture peg, socket and base, and the opening of sample room and external intercommunication is little, opens 3 samples of 3 sockets door survey during the use, so can reduce the disturbance of harmful gas to the internal environment of sample room, and can make things convenient for the operation that the sample put into, taken out, improves and detects work efficiency.
Drawings
Fig. 1 is a schematic view of the connection relationship between the components of the present invention.
Fig. 2 is a sectional view of section a-a in fig. 1.
Fig. 3 is a schematic view of the connection relationship between the components of the socket of the present invention.
Fig. 4 is a schematic structural diagram of the socket of the present invention, wherein fig. 4a is a front view of the socket, fig. 4b is a bottom view of the socket, and fig. 4c is a top view of the socket.
Fig. 5 is a schematic view of a base structure of the present invention, wherein fig. 5a is a front view of the base, fig. 5b is a right side view of the base, and fig. 5c is a top view of the base.
In fig. 1 to 5, a socket (1), a socket (2), a base (3), a wafer template inlet (11), a wafer template groove (12), a positioning groove (13), a socket screw (21), an upper socket pipe (22), a rubber square ring (23), a plastic square ring (24), a socket door (25), a rubber gasket (26), a socket fixing nut (27), a lower socket pipe (31), a positioning reed (32) and a positioning point (33).
Detailed Description
Referring to the shapes and structures of fig. 1 to 5, the following embodiments are performed.
1. Inserting plate 1: is a movable insert. The inserting plate 1 is provided with a wafer template inlet 11 and a wafer template groove 12, and a wafer template 01 can be put in from the wafer template inlet 11 and pushed into the wafer template groove 12. The insert plate has 3 positioning grooves 13 corresponding to the positions of the wafer template 01.
2. And (3) a socket 2: the lower part is a socket screw 21 which is mounted on the top cover of the sample chamber, sleeved with a rubber gasket 26 and fixed by a socket fixing nut 27. A rubber square ring 23 and a plastic square ring 24 are sequentially placed at the inlet end of the upper plug board pipeline 22 and fixed by screws. The side length of the inner ring of the rubber square ring 23 is 0.5mm smaller than the corresponding side length of the inserting plate 1, so that the gap between the inserting plate 1 and the inner wall of the upper inserting plate pipeline 22 is blocked when the inserting plate 1 is inserted; the length of the inner circle of the plastic square ring 24 is the same as the corresponding length of the upper flashboard pipeline 22. A socket door 25 is provided at the entrance of the upper insert duct 22 to open or close the entrance.
3. Base 3: a lower plug board pipeline 31 is arranged, and the inlet of the lower plug board pipeline is made into a bell mouth shape; the middle section of the base 3 is provided with a positioning reed 32; the positioning reed 32 is provided with a positioning point 33; the base 3 is fixed on the bottom plate of the sample chamber by screws.
4. The upper and lower insert conduits 22, 32 are sized to fit into the insert 1. When the base 3 and the sockets 2 are installed, the circle center of the round hole in the wafer template 01 is just at the position where the infrared beam passes through during normal measurement; the upper insert conduit 22 faces the lower insert conduit 32.
5. Except as specifically noted, the components are made of plastic or metal; all parts are black.
The utility model discloses an use: loading the wafer template 01 with the sample into the plug board 1; the socket door 25 is pulled open, the plugboard 1 is inserted into the plugboard 1 from the upper plugboard pipeline 22 of the socket 2 and pushed down to the lower plugboard pipeline 31 of the base 3, and the front end of the plugboard 1 sequentially passes through the plastic square ring 24, the rubber square ring 23 and the positioning point 33 of the positioning spring piece 32 in the process; when the positioning groove 13 of the plugboard 1 moves to the positioning point 33, the positioning groove 13 is lightly clamped by the positioning point 33, and infrared spectrum measurement can be performed on a sample on the wafer template 01 corresponding to the positioning point 33; in the same manner, when the board 1 is moved so that the other positioning groove 13 is slightly caught by the positioning point 33, the infrared spectroscopy can be performed on the sample on the wafer template 01 corresponding to the positioning groove 13.
Note that: for the powdered sample: the sample was placed in a circular hole of a wafer template 01, and pressed into a wafer with a tablet press to be measured in a non-release manner. For the film samples: the measurement can be performed by pressing the film with a magnetic ring before the circular hole of the wafer template 01. The utility model discloses be not suitable for survey liquid and gaseous sample. The reference dimensions of the wafer template 01 are: the length is 25mm, the width is 15mm, the thickness is 4mm, and the diameter of the round hole is 7 mm.
The above embodiments are only preferred embodiments of the present invention, and the protection scope of the present invention cannot be limited thereby, and any insubstantial changes and substitutions made by those skilled in the art based on the present invention, including changes and substitutions in component materials, shapes, and sizes, are all within the protection scope of the present invention.

Claims (1)

1. The utility model provides an infrared spectrometer sample frame, includes picture peg (1), socket (2) and base (3), its characterized in that: the inserting plate (1) is provided with a wafer template inlet 11 and a wafer template groove 12; an upper plug board pipeline (22) is arranged in the plug socket (2), a plug socket door 25, a plastic square ring 24 and a rubber square ring 23 are arranged on the upper plug board pipeline (22) from top to bottom, a plug socket screw rod 21 extends into the sample chamber from the top cover of the sample chamber, and is fixed by a plug socket fixing screw cap 27 after being sleeved with a rubber gasket 26; the inlet of a lower inserting plate pipeline (31) of the base (3) is made into a bell mouth shape; and a positioning reed (32) provided with a positioning point (33) is arranged at the middle section of the lower inserting plate pipeline (31).
CN202020413249.6U 2020-03-27 2020-03-27 Infrared spectrum appearance sample frame Expired - Fee Related CN211652508U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202020413249.6U CN211652508U (en) 2020-03-27 2020-03-27 Infrared spectrum appearance sample frame

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202020413249.6U CN211652508U (en) 2020-03-27 2020-03-27 Infrared spectrum appearance sample frame

Publications (1)

Publication Number Publication Date
CN211652508U true CN211652508U (en) 2020-10-09

Family

ID=72686916

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202020413249.6U Expired - Fee Related CN211652508U (en) 2020-03-27 2020-03-27 Infrared spectrum appearance sample frame

Country Status (1)

Country Link
CN (1) CN211652508U (en)

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CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20201009

Termination date: 20210327