CN211603389U

CN211603389U - Aging test device for electronic equipment

Info

Publication number: CN211603389U
Application number: CN201922348343.8U
Authority: CN
Inventors: 范彩凤
Original assignee: Shanghai Beizhen Electronic Technology Co ltd
Current assignee: Shanghai Beizhen Electronic Technology Co ltd
Priority date: 2019-12-24
Filing date: 2019-12-24
Publication date: 2020-09-29
Anticipated expiration: 2029-12-24

Abstract

The utility model discloses an aging testing device for electronic equipment, including bearing the seat, bear the seat upper end and be connected with a pair of bounding wall, and be connected with a plurality of baffles between a pair of bounding wall, the baffle inboard is equipped with the fixed plate, bear the seat side and cut and have a plurality of screws corresponding with the fixed plate, and be connected with long propulsion screw in the screw, be connected with the propulsion nut on the long propulsion screw, bear the seat inside division chisel have with propulsion nut assorted slide opening, the propulsion nut upper end is connected with the slider, it has with slider assorted slide opening to cut and chisel on the seat, and the slide opening is linked together with the propulsion chamber, fixedly connected with bearing on the long propulsion screw, and the outer wall and the screw fixed connection of bearing, the end connection that long propulsion screw is located propulsion chamber inboard has the stopper, and the diameter of stopper is greater than the aperture that advances the nut. The utility model discloses simple structure, convenient operation can prevent effectively that the examination of awaiting measuring from waiting rocking of electronic component, improves the testing accuracy degree.

Description

Aging test device for electronic equipment

Technical Field

The utility model relates to an aging testing device technical field especially relates to an aging testing device for electronic equipment.

Background

In the related art, the electronic device needs to be subjected to an aging test before being shipped from a factory to detect the use performance of the electronic device. When the electronic equipment is subjected to the aging test, a plurality of electronic equipment are collectively placed on an aging rack. Due to the fact that the aging rack is arranged in the special isolated aging room, electronic equipment needs to be carried remotely, product turnover and production period of the electronic equipment are prolonged, and delivery time is affected. Moreover, the electronic equipment on the aging rack is placed in a centralized manner, so that the sampling randomness of quality testing personnel is influenced, and the interception range of defective products is reduced.

In order to improve the above problem, chinese patent No. CN209132355U discloses an aging testing device for electronic equipment, which comprises a box body, a testing device and a switch member, wherein a placing space is provided in the box body, a taking and placing opening communicated with the placing space is provided on the box body, an observation window for observing the internal condition of the placing space is provided on the box body, the testing device and the electronic equipment are both provided in the placing space, the electronic equipment is electrically connected with the testing device, and the switch member is movably provided on the box body to open or close the taking and placing opening. According to the utility model discloses an aging testing device, aging testing device form into box formula structure, and simple structure, sealing performance are good, can reduce the operating noise that electronic equipment is carrying out aging testing. Moreover, the aging test device can be flexibly distributed on a production line, so that the electronic equipment can be conveniently taken and placed, the logistics cost is reduced, the aging test condition of the electronic equipment can be observed through the observation window, and the operation is more convenient.

However, the testing device is not provided with a structure for fixing the electronic element to be tested, and the electronic element is easy to shake due to vibration of the device in the testing process, so that the looseness of the connection part is easily caused, and the testing accuracy is reduced.

SUMMERY OF THE UTILITY MODEL

The utility model aims at solving the shortcoming that exists among the prior art, and the aging testing device for electronic equipment who proposes.

In order to achieve the above purpose, the utility model adopts the following technical scheme:

the utility model provides an aging testing device for electronic equipment, is including bearing the seat, bear the seat upper end and be connected with a pair of bounding wall, and be connected with a plurality of baffles between a pair of bounding wall, the baffle inboard is equipped with the fixed plate, bear the seat side and cut and have a plurality of screws corresponding with the fixed plate, and be connected with long propulsion screw in the screw, be connected with the propulsion nut on the long propulsion screw, bear the seat inside and cut and have and impel nut assorted slide opening, impel the nut upper end and be connected with the slider, it has the slide opening with slider assorted to cut on bearing the seat, and the slide opening is linked together with the propulsion chamber.

Preferably, the long propelling screw is fixedly connected with a bearing, and the outer wall of the bearing is fixedly connected with the screw hole.

Preferably, the end part of the long propelling screw rod, which is positioned on the inner side of the propelling cavity, is connected with a limiting block, and the diameter of the limiting block is larger than the aperture of the propelling nut.

Preferably, the bearing seat is provided with a plurality of heat dissipation holes from top to bottom, and the heat dissipation holes are located between the pair of partition plates.

Preferably, the lower end of the bearing seat is connected with a heat dissipation box, and the bottom end in the heat dissipation box is connected with a heat dissipation fan.

Preferably, the upper end of the heat dissipation box is connected with a fixing frame, and a locking bolt is connected between the fixing frame and the bearing seat.

Compared with the prior art, the utility model provides an aging testing device for electronic equipment possesses following beneficial effect:

1. through the fixed plate, the long screw rod and the advancing nut that advance that set up, long advancing screw rod rotation drive advances nut rectilinear movement, advances the nut and drives the fixed plate and press close to the electronic component surface that awaits measuring and press from both sides tight electronic component that awaits measuring through the slider, can effectively prevent awaiting measuring rocking of electronic component, improves the testing accuracy.

2. A plurality of heat dissipation holes are formed in the bearing seat from top to bottom and are located between the pair of partition plates, and therefore the heat dissipation effect is improved.

3. The heat dissipation box internally provided with the heat dissipation fan is connected to the lower end of the bearing seat, the heat dissipation fan is opened, and the heat dissipation fan conducts air cooling heat dissipation on the electronic element to be tested through the heat dissipation hole, so that the heat dissipation effect is further improved.

The part that does not relate to in the device all is the same with prior art or can adopt prior art to realize, the utility model discloses simple structure, convenient operation can prevent effectively that examination awaiting measuring electronic component from rocking, improves the test accuracy.

Drawings

Fig. 1 is a schematic top view of an aging test apparatus for electronic devices according to the present invention;

fig. 2 is a schematic bottom view of an aging test apparatus for electronic devices according to the present invention;

fig. 3 is a schematic cross-sectional structural diagram of an aging testing apparatus for electronic devices according to the present invention;

fig. 4 is a schematic top view of an aging testing apparatus for electronic devices according to the present invention.

In the figure: 1-bearing seat, 2-coaming, 3-clapboard, 4-fixing plate, 5-long pushing screw, 6-slide block, 7-pushing cavity, 8-pushing nut, 9-limiting block, 10-heat dissipation box, 11-heat dissipation fan, 12-locking bolt, 13-slide hole, 14-bearing, 15-heat dissipation hole and 16-fixing frame.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments.

In the description of this patent, it is noted that unless otherwise specifically stated or limited, the terms "mounted," "connected," and "disposed" are to be construed broadly and can include, for example, fixedly connected, disposed, detachably connected, disposed, or integrally connected and disposed. The specific meaning of the above terms in this patent may be understood by those of ordinary skill in the art as appropriate.

In the description of the present invention, it is to be understood that the terms "upper", "lower", "front", "rear", "left", "right", "top", "bottom", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplicity of description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, should not be construed as limiting the present invention.

Example 1

Referring to fig. 1-4, an aging testing device for electronic equipment comprises a bearing seat 1, a pair of enclosing plates 2 is welded at the upper end of the bearing seat 1, a plurality of partition plates 3 are welded between the pair of enclosing plates 2, a fixing plate 4 is arranged on the inner side of each partition plate 3, a plurality of screw holes corresponding to the fixing plates 4 are formed in the side end of the bearing seat 1 in a chiseled mode, a long pushing screw rod 5 is connected with the screw holes in a threaded mode, a pushing nut 8 is connected with the long pushing screw rod 5 in a threaded mode, a sliding hole 13 matched with the pushing nut 8 is formed in the bearing seat 1 in a chiseled mode, a sliding block 6 is welded at the upper end of the pushing nut 8, a sliding hole 13 matched with the sliding block 6 is formed.

The utility model discloses in, the welding has bearing 14 on the long propulsion screw 5, and the outer wall and the screw welding of bearing 14.

The end part of the long propelling screw 5, which is positioned at the inner side of the propelling cavity 7, is welded with a limiting block 9, and the diameter of the limiting block 9 is larger than the aperture of the propelling nut 8, so that the propelling nut 8 is prevented from being separated from the long propelling screw 5.

A plurality of heat dissipation holes 15 are drilled in the bearing seat 1 from top to bottom, and the heat dissipation holes 15 are located between the pair of partition boards 3, so that the heat dissipation effect is improved.

The working principle is as follows: a tester places an electronic component to be tested in a lattice consisting of a surrounding plate 2 and a partition plate 3, screws up a long pushing screw rod 5, drives a pushing nut 8 to move linearly by rotating the long pushing screw rod 5, and the pushing nut 8 drives a fixing plate 4 to be close to the surface of the electronic component to be tested through a sliding block 6 and clamps the electronic component to be tested, so that the electronic component to be tested can be effectively prevented from shaking, and the testing accuracy is improved.

Example 2

Referring to fig. 2-3, in the present embodiment, compared with embodiment 1, the lower end of a bearing seat 1 is connected with a heat dissipation box 10, the bottom end of the heat dissipation box 10 is connected with a heat dissipation fan 11 through a bolt, a fixing frame 16 is welded at the upper end of the heat dissipation box 10, and a locking bolt 12 is screwed between the fixing frame 16 and the bearing seat 1.

The working principle is as follows: the heat dissipation box 10 is connected to the lower end of the bearing seat 1 through the locking bolt 12, the heat dissipation fan 11 is opened, and the heat dissipation fan 11 conducts air cooling heat dissipation on the electronic element to be tested through the heat dissipation holes 15, so that the heat dissipation effect is further improved.

The above, only be the concrete implementation of the preferred embodiment of the present invention, but the protection scope of the present invention is not limited thereto, and any person skilled in the art is in the technical scope of the present invention, according to the technical solution of the present invention and the utility model, the concept of which is equivalent to replace or change, should be covered within the protection scope of the present invention.

Claims

1. An aging test device for electronic equipment comprises a bearing seat (1), and is characterized in that a pair of coamings (2) is connected with the upper end of the bearing seat (1), a plurality of clapboards (3) are connected between the pair of enclosing plates (2), a fixing plate (4) is arranged at the inner side of each clapboard (3), a plurality of screw holes corresponding to the fixing plate (4) are drilled at the side end of the bearing seat (1), a long pushing screw rod (5) is connected in the screw hole, a pushing nut (8) is connected on the long pushing screw rod (5), a sliding hole (13) matched with the pushing nut (8) is drilled in the bearing seat (1), the upper end of the propelling nut (8) is connected with a sliding block (6), a sliding hole (13) matched with the sliding block (6) is formed in the bearing seat (1) in a chiseled mode, and the sliding hole (13) is communicated with the propelling cavity (7).

2. The aging testing device for electronic equipment according to claim 1, wherein the long pushing screw (5) is fixedly connected with a bearing (14), and the outer wall of the bearing (14) is fixedly connected with the screw hole.

3. The aging testing device for electronic equipment according to claim 2, wherein the end of the long pushing screw (5) inside the pushing cavity (7) is connected with a limiting block (9), and the diameter of the limiting block (9) is larger than the aperture of the pushing nut (8).

4. The burn-in test device for electronic equipment according to claim 1, wherein the carrier (1) has a plurality of heat dissipation holes (15) drilled from top to bottom, and the heat dissipation holes (15) are located between the pair of partitions (3).

5. The aging testing device for electronic equipment according to claim 4, wherein the lower end of the bearing seat (1) is connected with a heat dissipation box (10), and the bottom end of the heat dissipation box (10) is connected with a heat dissipation fan (11).

6. The aging testing device for electronic equipment according to claim 5, characterized in that a fixing frame (16) is connected to the upper end of the heat dissipation box (10), and a locking bolt (12) is connected between the fixing frame (16) and the bearing seat (1).