CN211554462U - A calibration tool for polarizing microscope - Google Patents
A calibration tool for polarizing microscope Download PDFInfo
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- CN211554462U CN211554462U CN202020291281.1U CN202020291281U CN211554462U CN 211554462 U CN211554462 U CN 211554462U CN 202020291281 U CN202020291281 U CN 202020291281U CN 211554462 U CN211554462 U CN 211554462U
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- polarizing
- calibration
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Abstract
The utility model discloses a calibration tool for polarizing microscope, its characterized in that: the backlight module comprises a half-shading sheet and a half-shading sheet supporting plate, wherein the half-shading sheet comprises two polarizing plates which are symmetrically arranged, a circular hole is formed in the middle of the half-shading sheet supporting plate, the half-shading sheet is shielded at the circular hole, and the polarization direction of the polarizing plates forms an included angle of 37 degrees with the symmetric line of the polarizing plates. The beneficial effects of the utility model include: the calibration difficulty of the polarizing microscope is reduced, the difference between parallel light intensity and vertical light intensity can be obviously judged, and the calibration of the polarizing microscope is simple and easy to operate.
Description
Technical Field
The utility model relates to a field of calibration, inspection tool of instrument, instrument of polarized light, concretely relates to a calibration tool and calibration method for polarizing microscope.
Background
When the instrument or microscope using polarized light as the basic working principle needs to perform quantitative analysis on the measured sample, the direction correction has to be performed on the polarized light component used by the instrument. However, in the ordinary observation method, it is only possible to recognize whether the light energy is weak, and the polarization direction cannot be determined. In the conventional polarizing microscope, two types of tools are generally used for determining the standard direction of polarized light, i.e., a mineral chip (mineral chip) containing biotite mineral, and a thin-film polarizing plate or a half-shadow plate made of mineral such as quartz. In the prior art, the polarization direction of the initial optical device can be judged to be approximately 0 degrees horizontally or 90 degrees vertically by using a mineral slice of biotite. However, it is often used as a teaching tool, needs to have a certain knowledge and identification degree, and is not universal. In the factory calibration work, the searching is slow, the operation is not easy, and more professional knowledge is needed for workers. And the judgment error is considered to be large.
Disclosure of Invention
To the weak point among the above-mentioned prior art, the utility model provides a calibration tool and calibration method for polarizing microscope, its simple structure can judge the polarization direction of microscopical polarization portion according to the image result, convenient regulation.
In order to achieve the above purpose, the utility model adopts the following technical scheme:
a calibration tool for a polarizing microscope, characterized by: the backlight module comprises a half-shading sheet and a half-shading sheet supporting plate, wherein the half-shading sheet comprises two polarizing plates which are symmetrically arranged, a circular hole is formed in the middle of the half-shading sheet supporting plate, the half-shading sheet is shielded at the circular hole, and the polarization direction of the polarizing plates forms an included angle of 37 degrees with the symmetric line of the polarizing plates.
Furthermore, the supporting plate of the half-shadow mask is a rectangular plate, the periphery of the supporting plate is rounded, and the symmetrical axis of the half-shadow mask is vertical to the long edge of the supporting plate of the half-shadow mask.
Furthermore, the half-shadow mask supporting plate is a metal thin plate, and the polarization direction symbol and the polarization angle value of the half-shadow mask are etched on the front surface of the metal thin plate.
A polarization direction calibration method of a polarization microscope is characterized by comprising the following steps:
s1, arranging a point light source in front of the polarization part of the polarization microscope;
s2, placing a half-shadow mask with the polarization direction of 37 degrees at the back of the polarization part of the polarization microscope, and observing the result;
s3, judging the polarization direction of the polarization part of the polarization microscope according to the observed image result;
and S4, adjusting the direction of the polarizing part of the polarizing microscope according to the observation result.
Further, if the result of the observation in step S3 is half bright and half dark, it indicates that the included angle between the polarization direction of the polarization part and the direction of the symmetry axis of the halftone is an acute angle; when the observed result in the S3 shows that the brightness is consistent and the whole brightness is bright, the polarization direction of the polarization part is parallel to the direction of the symmetry axis of the half shadow mask; when the brightness is uniform and the overall brightness is low as a result of the observation in S3, it is indicated that the polarization direction of the polarization part is perpendicular to the direction of the symmetry axis of the halftone.
The beneficial effects of the utility model include: the calibration difficulty of the polarizing microscope is reduced, the difference between parallel light intensity and vertical light intensity can be obviously judged, and the calibration of the polarizing microscope is simple and easy to operate.
Drawings
Fig. 1 is a schematic structural diagram of the present invention;
FIG. 2 is a schematic diagram of the calibration method of the present invention;
fig. 3 is a polarization diagram corresponding to the partial images of the present invention.
Detailed Description
The present invention will be described in further detail with reference to the following embodiments and accompanying drawings.
A polarization microscope polarization direction calibration tool shown in figure 1 comprises a half-shadow mask 1 and a half-shadow mask supporting plate 2, wherein the half-shadow mask 1 is two polarizing plates which are symmetrically arranged, a circular hole is formed in the middle of the half-shadow mask supporting plate 2, the half-shadow mask 1 is shielded at the circular hole, and the polarization direction of each polarizing plate forms an included angle of 37 degrees with the symmetric line of the polarizing plate. The supporting plate 2 of the half-shadow mask is a rectangular plate, the periphery of the supporting plate is rounded, and the symmetrical axis of the half-shadow mask 1 is vertical to the long edge of the supporting plate 2 of the half-shadow mask. The half-shadow mask supporting plate 2 is a metal thin plate, and the polarization direction symbol and the polarization angle value of the half-shadow mask 1 are etched on the front surface of the metal thin plate.
According to the calibration principle shown in fig. 2, the polarization microscope polarization direction calibration method of the present invention is characterized by comprising the following steps:
s1, arranging a point light source in front of the polarization part of the polarization microscope;
s2, placing a half-shadow mask with the polarization direction of 37 degrees at the back of the polarization part of the polarization microscope, and observing the result;
s3, judging the polarization direction of the polarization part of the polarization microscope according to the observed image result;
and S4, adjusting the direction of the polarizing part of the polarizing microscope according to the observation result.
According to the calibration method of the present invention, some of the results observed are shown in fig. 3;
if the result of the observation in the step S3 is half bright and half dark, the included angle between the polarization direction of the polarization part and the direction of the symmetry axis of the half shadow mask is an acute angle; when the observed result in the S3 shows that the brightness is consistent and the whole brightness is bright, the polarization direction of the polarization part is parallel to the direction of the symmetry axis of the half shadow mask; when the brightness is uniform and the overall brightness is low as a result of the observation in S3, it is indicated that the polarization direction of the polarization part is perpendicular to the direction of the symmetry axis of the halftone.
The technical solutions provided by the embodiments of the present invention are described in detail above, and the principles and embodiments of the present invention are explained herein by using specific examples, and the descriptions of the above embodiments are only applicable to help understand the principles of the embodiments of the present invention; meanwhile, for a person skilled in the art, according to the embodiments of the present invention, there may be variations in the specific implementation manners and application ranges, and in summary, the content of the description should not be construed as a limitation to the present invention.
Claims (3)
1. A calibration tool for a polarizing microscope, characterized by: the solar cell comprises a half-shadow mask (1) and a half-shadow mask supporting plate (2), wherein the half-shadow mask (1) is two polarizing films which are symmetrically arranged, a circular hole is formed in the middle of the half-shadow mask supporting plate (2), the half-shadow mask (1) is shielded at the circular hole, and the polarization direction of each polarizing film forms an included angle of 37 degrees with the symmetric line of the polarizing film.
2. A calibration tool for a polarization microscope according to claim 1, wherein: the supporting plate (2) of the half-shadow mask is a rectangular plate, the periphery of the supporting plate is rounded, and the symmetrical axis of the half-shadow mask (1) is vertical to the long edge of the supporting plate (2) of the half-shadow mask.
3. A calibration tool for a polarization microscope according to claim 1, wherein: the supporting plate (2) of the half-shadow mask is a metal thin plate, and the polarization direction symbol and the polarization angle numerical value of the half-shadow mask (1) are etched on the front surface of the supporting plate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020291281.1U CN211554462U (en) | 2020-03-11 | 2020-03-11 | A calibration tool for polarizing microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020291281.1U CN211554462U (en) | 2020-03-11 | 2020-03-11 | A calibration tool for polarizing microscope |
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| CN211554462U true CN211554462U (en) | 2020-09-22 |
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| CN202020291281.1U Active CN211554462U (en) | 2020-03-11 | 2020-03-11 | A calibration tool for polarizing microscope |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111258047A (en) * | 2020-03-11 | 2020-06-09 | 重庆奥特光学仪器有限责任公司 | Polarization microscope polarization direction calibration tool and calibration method |
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2020
- 2020-03-11 CN CN202020291281.1U patent/CN211554462U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111258047A (en) * | 2020-03-11 | 2020-06-09 | 重庆奥特光学仪器有限责任公司 | Polarization microscope polarization direction calibration tool and calibration method |
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