CN211554462U - A calibration tool for polarizing microscope - Google Patents

A calibration tool for polarizing microscope Download PDF

Info

Publication number
CN211554462U
CN211554462U CN202020291281.1U CN202020291281U CN211554462U CN 211554462 U CN211554462 U CN 211554462U CN 202020291281 U CN202020291281 U CN 202020291281U CN 211554462 U CN211554462 U CN 211554462U
Authority
CN
China
Prior art keywords
shadow mask
plate
shadow
supporting plate
polarizing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn - After Issue
Application number
CN202020291281.1U
Other languages
Chinese (zh)
Inventor
陶兴泉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Chongqing Optec Instrument Co ltd
Original Assignee
Chongqing Optec Instrument Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chongqing Optec Instrument Co ltd filed Critical Chongqing Optec Instrument Co ltd
Priority to CN202020291281.1U priority Critical patent/CN211554462U/en
Application granted granted Critical
Publication of CN211554462U publication Critical patent/CN211554462U/en
Withdrawn - After Issue legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Microscoopes, Condenser (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Polarising Elements (AREA)

Abstract

本实用新型公开了一种用于偏光显微镜的校准工具,其特征在于:包括半荫片及半荫片托板,其中所述半荫片为两片对称布置的偏振片,所述半荫片托板中部具有圆孔,所述半荫片遮挡在圆孔处,所述偏振片的偏振方向与其对称线呈37°夹角。本实用新型的有益效果包括:降低了偏光显微镜的校准难度,可明显判断平行和垂直的光强差别,偏光显微镜校准简单易操作。

Figure 202020291281

The utility model discloses a calibration tool for a polarizing microscope, which is characterized by comprising a half-shadow plate and a half-shadow plate support plate, wherein the half-shadow plate is two symmetrically arranged polarizers, the half-shadow plate is There is a circular hole in the middle of the support plate, the half-shadow plate is shielded at the circular hole, and the polarization direction of the polarizer and its symmetry line form an included angle of 37°. The beneficial effects of the utility model include: the calibration difficulty of the polarized light microscope is reduced, the difference between parallel and vertical light intensity can be clearly judged, and the calibration of the polarized light microscope is simple and easy to operate.

Figure 202020291281

Description

一种用于偏光显微镜的校准工具A calibration tool for polarized light microscopes

技术领域technical field

本实用新型涉及偏振光的仪器、工具的校准、检验工具的领域,具体涉及一种用于偏光显微镜的校准工具及校准方法。The utility model relates to the field of polarized light instruments, calibration of tools, and inspection tools, in particular to a calibration tool and a calibration method for polarized light microscopes.

背景技术Background technique

当以偏振光为基本工作原理的仪器或显微镜,需要对被测样本进行定量分析的时候,那么就不得不对仪器所使用的偏振光部件,进行方向校正。但是在普通观察手段下,只能识别光能量是否变弱,而无法判断出偏振方向。以偏光显微镜为例,以往判断偏振光基准方向一般有两种工具,带有黑云母矿物的矿片(矿物切片),使用薄膜偏振片或石英等矿物制作的半荫片。现有技术中虽然使用黑云母的矿物切片可以判断出初始光学器件的偏振方向,是水平的0°,还是竖直的90°的大致方向。但其往往作为教学工具使用,需要具有一定知识性质的辨识度,不具有普遍性。在工厂校准工作中,显得寻的慢,不易操作,且需要工人具有较多的专业知识。而且认为判断误差较大。When an instrument or microscope with polarized light as its basic working principle needs to perform quantitative analysis on the sample to be tested, it is necessary to correct the direction of the polarized light components used in the instrument. However, under ordinary observation methods, it is only possible to identify whether the light energy is weakened, but cannot determine the polarization direction. Taking a polarizing microscope as an example, in the past, there were generally two tools for judging the reference direction of polarized light, ore slices (mineral slices) with biotite minerals, and half-shadow films made of thin-film polarizers or minerals such as quartz. In the prior art, although the mineral slice of biotite can be used to determine the polarization direction of the initial optical device, whether it is a horizontal 0° or a vertical direction of 90°. However, it is often used as a teaching tool, which requires a certain degree of recognition of knowledge and is not universal. In the factory calibration work, it seems slow to find, difficult to operate, and requires workers to have more professional knowledge. And it is considered that the judgment error is large.

发明内容SUMMARY OF THE INVENTION

针对上述现有技术中的不足之处,本实用新型提供一种用于偏光显微镜的校准工具及校准方法,其结构简单,可以根据图像结果判断显微镜的偏振部的偏振方向,方便调节。Aiming at the deficiencies in the above-mentioned prior art, the present invention provides a calibration tool and calibration method for polarized light microscopes, which have a simple structure, and can determine the polarization direction of the polarizing part of the microscope according to the image results, which is convenient for adjustment.

为了达到上述目的,本实用新型采用了以下技术方案:In order to achieve the above object, the utility model adopts the following technical solutions:

一种用于偏光显微镜的校准工具,其特征在于:包括半荫片及半荫片托板,其中所述半荫片为两片对称布置的偏振片,所述半荫片托板中部具有圆孔,所述半荫片遮挡在圆孔处,所述偏振片的偏振方向与其对称线呈37°夹角。A calibration tool for a polarizing microscope, characterized in that it comprises a half-shadow plate and a half-shadow plate support, wherein the half-shadow plate is two symmetrically arranged polarizers, and the half-shadow plate has a circular shape in the middle of the plate. The half-shadow plate is shielded at the circular hole, and the polarization direction of the polarizer is at an angle of 37° with its line of symmetry.

进一步地,所述半荫片托板为矩形板,四周倒圆角,所述半荫片的对称轴线与所述半荫片托板的长边垂直。Further, the half-shadow plate is a rectangular plate with rounded corners around, and the symmetry axis of the half-shadow plate is perpendicular to the long side of the half-shadow plate.

进一步地,所述半荫片托板为金属薄板,其正面蚀刻有半荫片的偏振方向符号及偏振角度数值。Further, the half shadow plate supporting plate is a thin metal plate, and the front surface of the half shadow plate is etched with the polarization direction symbol and the polarization angle value of the half shadow plate.

一种偏光显微镜偏振方向校准方法,其特征在于,包括以下步骤:A method for calibrating the polarization direction of a polarizing microscope, comprising the following steps:

S1、在偏光显微镜的偏振部前方设置点光源;S1. Set a point light source in front of the polarizing part of the polarizing microscope;

S2、将偏振方向为37°的半荫片放置在偏光显微镜的偏振部后方,观察结果;S2. Place the half-shade with a polarization direction of 37° behind the polarizing part of the polarizing microscope, and observe the results;

S3、根据观察到的图像结果判断偏光显微镜的偏振部偏振方向;S3, judge the polarization direction of the polarization part of the polarization microscope according to the observed image results;

S4、根据观察结果调整偏光显微镜的偏振部的方向。S4. Adjust the direction of the polarizing part of the polarizing microscope according to the observation result.

进一步地,步骤S3中观察的结果为一半明一半暗则说明偏振部偏振方向与所述半荫片的对称轴方向的夹角为锐角;当S3中观察的结果为明暗一致,且整体亮度偏亮则说明偏振部偏振方向与所述半荫片的对称轴方向平行;当S3中观察的结果为明暗一致,且整体亮度偏暗则说明偏振部偏振方向与所述半荫片的对称轴方向垂直。Further, if the result observed in step S3 is half light and half dark, it means that the angle between the polarization direction of the polarizing part and the direction of the symmetry axis of the half-shadow plate is an acute angle; when the result observed in S3 is that the light and dark are consistent, and the overall brightness is partial. If it is bright, it means that the polarization direction of the polarizing part is parallel to the direction of the symmetry axis of the half-shadow; when the result observed in S3 is the same light and dark, and the overall brightness is dark, it means that the polarization direction of the polarizing part is parallel to the symmetry axis of the half-shadow. vertical.

本实用新型的有益效果包括:降低了偏光显微镜的校准难度,可明显判断平行和垂直的光强差别,偏光显微镜校准简单易操作。The beneficial effects of the utility model include: the calibration difficulty of the polarizing microscope is reduced, the difference between parallel and vertical light intensity can be clearly judged, and the calibration of the polarizing microscope is simple and easy to operate.

附图说明Description of drawings

图1是本实用新型的结构示意图;Fig. 1 is the structural representation of the present utility model;

图2是本实用新型校准方法的原理图;2 is a schematic diagram of the calibration method of the present invention;

图3是本实用新型部分图像对应的偏振情况图。FIG. 3 is a polarization diagram corresponding to some images of the present invention.

具体实施方式Detailed ways

下面结合具体实施例及附图来进一步详细说明本实用新型。The present utility model will be described in further detail below with reference to specific embodiments and accompanying drawings.

一种如图1所示的偏光显微镜偏振方向校准工具,包括半荫片1及半荫片托板2,其中所述半荫片1为两片对称布置的偏振片,所述半荫片托板2中部具有圆孔,所述半荫片1遮挡在圆孔处,所述偏振片的偏振方向与其对称线呈37°夹角。所述半荫片托板2为矩形板,四周倒圆角,所述半荫片1的对称轴线与所述半荫片托板2的长边垂直。所述半荫片托板2为金属薄板,其正面蚀刻有半荫片1的偏振方向符号及偏振角度数值。A polarization direction calibration tool for a polarizing microscope as shown in FIG. 1 includes a half-shadow plate 1 and a half-shadow plate holder 2, wherein the half-shadow plate 1 is two symmetrically arranged polarizers, and the half-shadow plate holder There is a circular hole in the middle of the plate 2, and the half-shadow film 1 is shielded at the circular hole, and the polarization direction of the polarizer and its symmetry line are at an angle of 37°. The half-shadow plate 2 is a rectangular plate with rounded corners around it. The axis of symmetry of the half-shadow plate 1 is perpendicular to the long side of the half-shadow plate 2 . The half-shadow plate 2 is a thin metal plate, and its front side is etched with the polarization direction symbol and the polarization angle value of the half-shadow plate 1 .

根据图2所示的校准原理,本实用新型的偏光显微镜偏振方向校准方法,其特征在于,包括以下步骤:According to the calibration principle shown in FIG. 2 , the polarization direction calibration method of the polarizing microscope of the present invention is characterized in that, it includes the following steps:

S1、在偏光显微镜的偏振部前方设置点光源;S1. Set a point light source in front of the polarizing part of the polarizing microscope;

S2、将偏振方向为37°的半荫片放置在偏光显微镜的偏振部后方,观察结果;S2. Place the half-shade with a polarization direction of 37° behind the polarizing part of the polarizing microscope, and observe the results;

S3、根据观察到的图像结果判断偏光显微镜的偏振部偏振方向;S3, judge the polarization direction of the polarization part of the polarization microscope according to the observed image results;

S4、根据观察结果调整偏光显微镜的偏振部的方向。S4. Adjust the direction of the polarizing part of the polarizing microscope according to the observation result.

根据本实用新型的校准方法,观察到的部分结果如图3所示;According to the calibration method of the present invention, the observed partial results are shown in Figure 3;

步骤S3中观察的结果为一半明一半暗则说明偏振部偏振方向与所述半荫片的对称轴方向的夹角为锐角;当S3中观察的结果为明暗一致,且整体亮度偏亮则说明偏振部偏振方向与所述半荫片的对称轴方向平行;当S3中观察的结果为明暗一致,且整体亮度偏暗则说明偏振部偏振方向与所述半荫片的对称轴方向垂直。The result observed in step S3 is half light and half dark, which means that the angle between the polarization direction of the polarizing part and the direction of the symmetry axis of the half-shadow film is an acute angle; when the result observed in S3 is that the light and dark are consistent, and the overall brightness is bright, it means that The polarization direction of the polarizing part is parallel to the direction of the symmetry axis of the half-shadow; when the result observed in S3 is the same light and dark, and the overall brightness is dark, it means that the polarization direction of the polarizing part is perpendicular to the symmetry axis of the half-shadow.

以上对本实用新型实施例所提供的技术方案进行了详细介绍,本文中应用了具体个例对本实用新型实施例的原理以及实施方式进行了阐述,以上实施例的说明只适用于帮助理解本实用新型实施例的原理;同时,对于本领域的一般技术人员,依据本实用新型实施例,在具体实施方式以及应用范围上均会有改变之处,综上所述,本说明书内容不应理解为对本实用新型的限制。The technical solutions provided by the embodiments of the present utility model have been described in detail above. The principles and implementations of the embodiments of the present utility model are described in this paper by using specific examples. The descriptions of the above embodiments are only suitable for helping the understanding of the present utility model. The principle of the embodiment; at the same time, for those skilled in the art, according to the embodiment of the present utility model, there will be changes in the specific implementation and application scope. Utility Model Restrictions.

Claims (3)

1. A calibration tool for a polarizing microscope, characterized by: the solar cell comprises a half-shadow mask (1) and a half-shadow mask supporting plate (2), wherein the half-shadow mask (1) is two polarizing films which are symmetrically arranged, a circular hole is formed in the middle of the half-shadow mask supporting plate (2), the half-shadow mask (1) is shielded at the circular hole, and the polarization direction of each polarizing film forms an included angle of 37 degrees with the symmetric line of the polarizing film.
2. A calibration tool for a polarization microscope according to claim 1, wherein: the supporting plate (2) of the half-shadow mask is a rectangular plate, the periphery of the supporting plate is rounded, and the symmetrical axis of the half-shadow mask (1) is vertical to the long edge of the supporting plate (2) of the half-shadow mask.
3. A calibration tool for a polarization microscope according to claim 1, wherein: the supporting plate (2) of the half-shadow mask is a metal thin plate, and the polarization direction symbol and the polarization angle numerical value of the half-shadow mask (1) are etched on the front surface of the supporting plate.
CN202020291281.1U 2020-03-11 2020-03-11 A calibration tool for polarizing microscope Withdrawn - After Issue CN211554462U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202020291281.1U CN211554462U (en) 2020-03-11 2020-03-11 A calibration tool for polarizing microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202020291281.1U CN211554462U (en) 2020-03-11 2020-03-11 A calibration tool for polarizing microscope

Publications (1)

Publication Number Publication Date
CN211554462U true CN211554462U (en) 2020-09-22

Family

ID=72494786

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202020291281.1U Withdrawn - After Issue CN211554462U (en) 2020-03-11 2020-03-11 A calibration tool for polarizing microscope

Country Status (1)

Country Link
CN (1) CN211554462U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111258047A (en) * 2020-03-11 2020-06-09 重庆奥特光学仪器有限责任公司 Polarization microscope polarization direction calibration tool and calibration method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111258047A (en) * 2020-03-11 2020-06-09 重庆奥特光学仪器有限责任公司 Polarization microscope polarization direction calibration tool and calibration method
CN111258047B (en) * 2020-03-11 2025-02-11 重庆奥特光学仪器有限责任公司 A polarization direction calibration tool and calibration method for polarizing microscope

Similar Documents

Publication Publication Date Title
CN211554462U (en) A calibration tool for polarizing microscope
CN110044931A (en) A kind of detection device on bend glass surface and internal flaw
CN105651189A (en) Non-destructive online testing equipment used for measuring thickness of ink layer in mobile phone cover plate
CN110108715B (en) Defect detection method for transparent parallel flat plate
TW305934B (en)
CN102955378B (en) Photoresist morphology characterization method
CN115471465A (en) A TFT Substrate Line Defect Detection Method Based on Difference Image Method
CN111258047A (en) Polarization microscope polarization direction calibration tool and calibration method
CN108398776A (en) A kind of general level adjusting apparatus adapted on microscope
CN114171421B (en) Photovoltaic crystalline silicon cell SE process visual inspection system and method
CN108195567B (en) A kind of quality detection device and detection method of sunglasses functional sheet
CN104677709A (en) Method for preparing HRTEM sample with specific crystal orientation relation interface
CN103398662B (en) The measuring method of 10 ~ 100 μm of solid film thickness and device
CN203643357U (en) Device for detecting defects of silicon carbide wafer micro tubes
CN110044932A (en) A kind of detection method on bend glass surface and internal flaw
Ernould et al. Applications of the Method
CN112394073B (en) Method for rapidly and accurately measuring orientation of crystal axis of gallium oxide single crystal
CN212287245U (en) Quartzy reference surface processing frock
TW200407659A (en) Manufacturing method of optical device and the defect detection tool used by the same
CN209745446U (en) A transmission photoelastic instrument
CN112129244B (en) Wafer chamfering detection method
CN102520202B (en) Method for detecting pendulous reed stress of accelerometer
McGuire et al. Automated mapping of micropipes in SiC wafers using polarized-light microscope
CN220650432U (en) Liquid rating auxiliary device in textile detection
CN208887810U (en) It is polarized lens device and the polarisation stress gauge containing the device

Legal Events

Date Code Title Description
GR01 Patent grant
GR01 Patent grant
AV01 Patent right actively abandoned
AV01 Patent right actively abandoned
AV01 Patent right actively abandoned

Granted publication date: 20200922

Effective date of abandoning: 20241225

AV01 Patent right actively abandoned

Granted publication date: 20200922

Effective date of abandoning: 20241225