CN211528544U - Single-reflecting surface compact range device - Google Patents
Single-reflecting surface compact range device Download PDFInfo
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- CN211528544U CN211528544U CN201921459181.9U CN201921459181U CN211528544U CN 211528544 U CN211528544 U CN 211528544U CN 201921459181 U CN201921459181 U CN 201921459181U CN 211528544 U CN211528544 U CN 211528544U
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Abstract
The utility model discloses a single plane of reflection contracts field device. One embodiment of the apparatus comprises: the single-reflector offset feed irradiation device comprises a feed source and a single-reflector system, wherein the feed source irradiates the reflector offset feed of the single-reflector system, and the focal length of the single-reflector system is 2-3 times of the caliber. The implementation mode adopts the long focus design with larger focal diameter ratio, can control the cross polarization to a reasonable range by reducing the offset feed amount through the long focus so as to improve the isolation degree of the cross polarization, can ensure that the isolation degree of the cross polarization is larger than-30 dB and approaches between-38 dB and-40 dB, improves the measurement precision of the cross polarization isolation antenna, is easy to realize the manufacturing and assembling precision, does not have the accumulated error of multi-reflecting surface assembly, relatively easily realizes the reflecting surface precision required by higher-frequency work, improves the engineering realizability of compact field system design, is suitable for a millimeter wave/THz test field, and overcomes the problem that a double/multi-reflecting surface system is difficult to realize low cross polarization.
Description
Technical Field
The utility model relates to a compact range technical field. And more particularly to a single reflecting surface compact range device.
Background
With the development of the THz (Tera Hertz, terahertz for short) technology, the demand for precisely measuring the THz large-aperture antenna is increasingly urgent, especially for satellite communication antennas and full-polarization remote sensing antennas with high requirements on cross-polarization isolation. Conventional high cross-polarization isolation compact typically employs equivalent tele or large focal ratio designs of dual or multi-reflector systems, or compensation designs such as feed-forward cassegrain compact to reduce cross-polarization introduced by the bias feed structure and the feed itself. The long-focus design of the double or multi-reflector system is beneficial to reducing the curvature of the main reflector and inhibiting the cross polarization of the collimation reflector, but if the THz waveband compact field adopts the multi-reflector system cascade combination, errors of all levels of reflectors are accumulated, and the engineering implementation complexity of ensuring the precision of each reflector is increased under the same precision requirement.
Therefore, there is a need to provide a new compact range device.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide a single plane of reflection contracts range device to solve at least one in the problem that prior art exists.
In order to achieve the above purpose, the utility model adopts the following technical scheme:
the utility model provides a single plane of reflection contracts field device, include: the single-reflector offset feed irradiation device comprises a feed source and a single-reflector system, wherein the feed source irradiates the reflector offset feed of the single-reflector system, and the focal length of the single-reflector system is 2-3 times of the caliber.
Optionally, the reflective surface edge of the single reflective surface system has a curled structure or a sawtooth structure.
Optionally, the single reflecting surface system is placed in a microwave dark room or a microwave dark box.
Optionally, wave-absorbing materials are arranged in the microwave dark room and the microwave dark box.
Optionally, the reflecting surface of the single reflecting surface system is a paraboloid of revolution.
Optionally, the edge length of the reflecting surface of the single reflecting surface system is greater than 3 times of the operating wavelength.
Optionally, the edge length of the reflecting surface of the single reflecting surface system is greater than 5 times of the operating wavelength.
Optionally, the focal length of the single-reflector system is 2.5 times of the aperture.
The utility model has the advantages as follows:
the utility model discloses an embodiment adopts the great long burnt design of focal length ratio, the accessible long burnt reduces the bias feedback volume and controls cross polarization to reasonable scope, in order to promote cross polarization isolation, can make cross polarization isolation be greater than-30 dB, approach between-38 dB-, -40dB, the measurement accuracy of orthogonal polarization isolation antenna has been improved, manufacturing and assembly precision realize easily, there is not the accumulative error of many plane of reflection assembly, realize the plane of reflection precision of higher frequency work requirement relatively easily, the engineering realizability of compact field system design has been improved, be applicable to millimeter wave/THz test field, it is difficult to realize the problem of low cross polarization to have overcome two/many plane of reflection systems.
Drawings
The following describes the embodiments of the present invention in further detail with reference to the accompanying drawings;
fig. 1 is a schematic layout diagram of a single-reflector compact range apparatus according to an embodiment of the present invention;
fig. 2 shows the amplitude of the dead zone central horizontal line of the single-reflector compact range apparatus according to an embodiment of the present invention (dB value, each frequency point is sequentially reduced by 1dB after the amplitude is normalized);
FIG. 3 illustrates the phase (degrees) of the horizontal line at the center of the quiet zone of a single reflector compact range apparatus in accordance with an embodiment of the present invention;
FIG. 4 illustrates the dead-zone center horizontal line cross-polarization amplitude (dB value) of a single reflector compact range device in accordance with an embodiment of the present invention;
FIG. 5 shows the amplitude of the dead-zone central vertical line of a single reflector compact range apparatus according to an embodiment of the present invention (dB value, each frequency point is sequentially reduced by 1dB after amplitude normalization);
FIG. 6 illustrates the phase (in degrees) of the vertical line at the center of the quiet zone of a single reflector compact range apparatus in accordance with an embodiment of the present invention;
FIG. 7 illustrates the magnitude (dB value) of the cross polarization of the dead center vertical line of a single reflector compact range device in accordance with an embodiment of the present invention;
similar parts in the figures are denoted by the same reference numerals.
Detailed Description
In order to explain the present invention more clearly, the present invention will be further described with reference to the preferred embodiments and the accompanying drawings. It is to be understood by persons skilled in the art that the following detailed description is illustrative and not restrictive, and is not to be taken as limiting the scope of the invention.
An embodiment of the utility model provides a single plane of reflection contracts range device, include: the single-reflector offset feed irradiation device comprises a feed source and a single-reflector system, wherein the feed source irradiates the reflector offset feed of the single-reflector system, and the focal length of the single-reflector system is 2-3 times of the caliber.
The layout of the single reflecting surface is adopted, the test device has the advantages of simple and compact structure and relative convenience in manufacturing, can improve the amplitude-phase flatness and polarization purity of the quasi-plane wave in a dead zone, is favorable for improving the test precision of an antenna or RCS, and is suitable for being applied to a THz wave band test field with higher requirements on the manufacturing precision.
The feed source irradiates a precise reflecting surface of the single reflecting surface system, spherical wavefront collimation is corrected into plane waves, a quasi-plane wave quiet zone with equal amplitude and equal phase is formed, a bias feed structure is adopted on shielding geometric layout of the feed source, and the bias feed layout causes large cross polarization, so that the single reflecting surface system adopts a long focus design with a relatively large focal diameter, the focal diameter ratio is between 2 and 3, the bias feed amount is reduced to a reasonable range through the long focus design, the cross polarization isolation degree is generated, and the cross polarization isolation degree is larger than-30 dB and approaches to-38 dB to-40 dB. The reflecting surface is of an ultra-wideband structure, and if the working frequency of the system changes and exceeds a standard bandwidth, a proper feed source is replaced to keep the optimal irradiation on the reflecting surface.
As an alternative implementation mode, the edge of the reflecting surface of the single reflecting surface system is provided with a curling structure or a sawtooth structure so as to inhibit the interference of edge diffraction on the scenic area and improve the flatness of the quiet area field. However, the present invention is not limited to curling or jagging only for the reflective surface edge treatment of a single reflective surface compact range device.
As an alternative embodiment, the single reflecting surface system is placed in a microwave dark room or a microwave dark box.
Wave-absorbing materials are distributed in the microwave darkroom and the microwave darkbox.
The utility model discloses a single plane of reflection contracts field device's plane of reflection system not only limits in whether install absorbing material's microwave darkroom or microwave camera bellows.
As an alternative embodiment, the reflecting surface of the single reflecting surface system is a paraboloid of revolution.
As an alternative embodiment, the edge length of the reflecting surface of the single reflecting surface system is greater than 3 times the operating wavelength.
As an alternative embodiment, the edge length of the reflecting surface of the single reflecting surface system is more than 5 times the operating wavelength.
As an alternative embodiment, the focal length of the single-reflector system is 2.5 times the aperture.
When the caliber of the dead zone exceeds 300 times of wavelength, the caliber utilization rate of the dead zone approaches 75% of the ratio of the central entity of the reflecting surface, rather than 40% traditionally considered.
Through the matched irradiation of the high-gain feed source, the cross polarization is controlled, meanwhile, the increase of the spatial attenuation is controlled, and the spatial attenuation is equivalent to a feedforward Cassegrain compact field with the same scale.
The utility model discloses a single plane of reflection compact field device adopts the great long burnt design of focal length ratio, it controls cross polarization to reasonable scope to reduce the offset feedback volume through the long burnt, in order to promote cross polarization isolation, can make cross polarization isolation be greater than-30 dB, it is close to-38 dB-40 dB, the measurement accuracy of cross polarization isolation antenna has been improved, manufacturing and assembly precision realize easily, there is not the accumulative error of many plane of reflection assembly, realize the plane of reflection precision of higher frequency work requirement relatively easily, the engineering realizability of compact field system design has been improved, be applicable to millimeter wave THz test field, the problem that two/many plane of reflection systems are difficult to realize low cross polarization has been overcome.
As a specific embodiment of the present application, fig. 1 shows a schematic layout diagram of a single-reflecting-surface compact range apparatus according to a specific embodiment, where 10 is a reflecting surface of a single-reflecting-surface system, 20 is a reflecting-surface back frame, 30 is a feed source, 40 is a feed source base, and 50 is a microwave-dark-chamber wave-absorbing material. The reflection surface entity of the single reflection surface compact field is a revolution paraboloid, and the interference of edge diffraction on a quiet area is inhibited by adopting a sawtooth edge. The size of a reflecting surface is generally required to be 3-5 times larger than the longest working wavelength, the requirement is easily met for a millimeter wave THz compact range system, the outer size of a caliber is 1000mm multiplied by 1000mm, the focal length is 2.5 times of the caliber, the edge of the reflecting surface adopts a sawtooth structure, a side tooth scheme adopts right-angle gradual change, the length of the side tooth is 125mm, the proportion of the edge of an entity is 75%, and the height of a feed source is not lower than 1000 mm. The front edge of the quiet zone is at the 3-time caliber, and the central height of the quiet zone is not less than 1600 mm.
The feed source 30 emits spherical waves which are corrected into plane waves with equal amplitude and equal phase through the reflecting surface 10 of the single reflecting surface system, but in order to solve the problem that the feed source shielding adopts a bias feed layout, cross polarization is introduced, the design with a larger focal diameter ratio is adopted to improve the cross polarization isolation, and the cross polarization isolation can be larger than-30 dB and approaches to-38 dB to-40 dB.
In this embodiment, a multilayer fast multipole algorithm is adopted, and in a frequency band range of 40 to 640GHz, the amplitude, phase and cross polarization field of a quiet zone field are calculated, and a technical requirement specifies that a quiet zone needs to form a quasi-uniform amplitude and uniform phase plane wave field in a range greater than 400mm (horizontal) × 400mm (vertical) × 2000mm (front and back), fig. 2 shows the amplitude (dB value, 1dB is sequentially reduced for each frequency point after amplitude normalization) of a quiet zone central horizontal line of a single-reflecting-surface compact range device according to a specific embodiment of the present invention; FIG. 3 illustrates the phase (degrees) of the horizontal line at the center of the quiet zone of a single reflector compact range apparatus in accordance with an embodiment of the present invention; FIG. 4 illustrates the dead-zone center horizontal line cross-polarization amplitude (dB value) of a single reflector compact range device in accordance with an embodiment of the present invention; FIG. 5 shows the amplitude of the dead-zone central vertical line of a single reflector compact range apparatus according to an embodiment of the present invention (dB value, each frequency point is sequentially reduced by 1dB after amplitude normalization); FIG. 6 illustrates the phase (in degrees) of the vertical line at the center of the quiet zone of a single reflector compact range apparatus in accordance with an embodiment of the present invention; FIG. 7 illustrates the magnitude (dB value) of the cross polarization of the dead center vertical line of a single reflector compact range device in accordance with an embodiment of the present invention; the design values of all indexes can meet the requirements of technical indexes, and the design values of the cross polarization at two ends of a dead zone horizontal line (+/-200 mm and the position with the worst cross polarization) can be better than-38 dB.
According to the typical quiet zone index required by the industry, the lower frequency of the working of the example can be expanded to 3GHz, the theoretical design can ensure that the high-frequency working can be far higher than 240GHz, the RMS precision of the reflector required by the practical performance is better than 1/100 shortest wavelength, the precision mechanical design and manufacturing capability are depended, for example, the precision of the profile RMS is better than 6 microns, and the highest working frequency can reach 500 GHz.
In the description of the present invention, it is to be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood according to specific situations by those skilled in the art.
It should also be noted that in the description of the present invention, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
Obviously, the above embodiments of the present invention are only examples for clearly illustrating the present invention, and are not intended to limit the embodiments of the present invention, and it is obvious for a person skilled in the art to make other variations or changes based on the above description, and all embodiments cannot be exhaustive here, and all obvious variations or changes that belong to the technical solutions of the present invention are still in the scope of protection of the present invention.
Claims (4)
1. A single reflecting surface compact range apparatus, comprising:
the single-reflector offset feed irradiation system comprises a feed source and a single-reflector system, wherein the feed source irradiates the reflector offset feed of the single-reflector system, and the focal length of the single-reflector system takes a value of 2-3 times of the caliber;
the edge of the reflecting surface of the single reflecting surface system is provided with a curling structure or a sawtooth structure, and the reflecting surface of the single reflecting surface system is a paraboloid of revolution;
the single-reflecting-surface system is arranged in a microwave darkroom or a microwave darkbox, and wave-absorbing materials are distributed in the microwave darkroom and the microwave darkbox.
2. The single reflecting surface compact range device of claim 1,
the edge length of the reflecting surface of the single reflecting surface system is more than 3 times of the working wavelength.
3. The single reflecting surface compact range device of claim 2,
the edge length of the reflecting surface of the single reflecting surface system is more than 5 times of the working wavelength.
4. The single reflecting surface compact range device of claim 1,
the focal length of the single reflector system is 2.5 times of the caliber.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921459181.9U CN211528544U (en) | 2019-09-04 | 2019-09-04 | Single-reflecting surface compact range device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921459181.9U CN211528544U (en) | 2019-09-04 | 2019-09-04 | Single-reflecting surface compact range device |
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| Publication Number | Publication Date |
|---|---|
| CN211528544U true CN211528544U (en) | 2020-09-18 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201921459181.9U Active CN211528544U (en) | 2019-09-04 | 2019-09-04 | Single-reflecting surface compact range device |
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| CN (1) | CN211528544U (en) |
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- 2019-09-04 CN CN201921459181.9U patent/CN211528544U/en active Active
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