Background
At present, the module power supply is widely applied to the fields of industry, civilian use, national defense and the like. Because the requirements of efficiency and temperature rise need to be met, most module power supplies still use non-isolated traditional module power supply testing and aging devices, and basically adopt a non-isolated mode of a power resistor and an indicator lamp, judge whether the module power supply works normally or not in testing or aging by depending on the brightness of the indicator lamp, and judge whether the module power supply works normally or not in a strong current area or a weak current area without an isolating device. Such a test and burn-in apparatus is simple. However, the real-time monitoring of the test or aging state cannot be realized, and the working state of each time interval cannot be judged. The power testing device has the advantages that the functions of automatic control, automatic storage, automatic monitoring and alarming are not available, electric isolation is not available, the power testing end is in a high-voltage working state, certain risks exist in batch production, and certain potential safety hazards are brought to users or users.
Because the module power belongs to industrial grade product, it is great to receive the environmental impact of use, and for waterproof dustproof, the module power all adopts encapsulating technology, makes its shell and the unable dismouting of internal circuit board, so test and ageing to the module power become especially important, adopts artificial traditional mode, the unable work quality of real-time supervision module power, and many multichannel module power simultaneous working, can't form and be incorporated into the power networks. The product that leads to producing still can bring certain potential safety hazard for the user, has increased batch production's quality management and control and safety protection's the degree of difficulty. The scheme can not fundamentally control the quality and safety of the module power supply, so that the batch production of the module power supply is more difficult;
in order to solve the potential safety hazard scheduling problem in difficult batch production among the prior art and the batch production, the utility model provides a module power multichannel intelligent test and ageing device.
SUMMERY OF THE UTILITY MODEL
The utility model aims at solving the problem in the prior art, and the module power multichannel intelligent test and ageing device that proposes.
In order to achieve the above purpose, the utility model adopts the following technical scheme:
the utility model provides a module power multichannel intelligent test and ageing device, includes the device main part, the device main part includes AC high voltage unit and signal low voltage unit, reset button and No. three AC-DC auxiliary power are installed respectively to device main part lower extreme both sides, install No. two AC-DC auxiliary power, No. one AC-DC auxiliary power, bee calling organ, communication chip, communication port, No. two driver chip, MCU chip, a driver chip, start button and stop button between No. three AC-DC auxiliary power and the reset button in proper order, stop button is close to one side of reset button, No. two AC-DC auxiliary power is close to one side of No. three AC-DC auxiliary power, the device main part is close to one side of reset button and is installed power load output port, power load module from top to bottom in proper order, The signal low-voltage unit comprises a photoelectric linear isolation amplifier, an electronic switch, a power load module, an MCU chip, a communication chip, a first drive chip, a second drive chip, a reset key, a stop key, a start key, a communication port and a buzzer, wherein the communication port can be connected with a computer, the MCU chip is a central processing unit with storage and intelligent control functions, the communication chip is an analog-to-digital conversion and data acquisition chip, the first drive chip and the second drive chip have signal amplification and signal output functions, and the first AC-DC auxiliary power supply, No. two AC-DC auxiliary power supplies, No. three AC-DC auxiliary power supplies have the function of changing AC220V or AC380V of input into 5V, 3.3V + the slot can be inserted into the module power supply, the photoelectric linear isolation amplifier has the function of electrically isolating high voltage and + · low voltage and can play the role of signal transmission, the electronic switch is controlled by the MCU chip and an external computer, the power load module is controlled by the electronic switch, an AC power plug is arranged on one side of the device main body close to the No. three AC-DC auxiliary power supplies, and the AC power plug is connected with an external AC power supply.
Preferably, the first AC-DC auxiliary power supply, the second AC-DC auxiliary power supply and the third AC-DC auxiliary power supply are all isolated power supplies.
Preferably, the electronic switch is any one of power semiconductor devices such as a field effect transistor, a triode, a silicon controlled rectifier and the like, and the electronic switch is connected to the power load module in a series connection mode.
Preferably, the photoelectric linear isolation amplifier is a linear isolation device such as an optical coupler.
Preferably, the MCU chip and the electronic switch have automatic monitoring and electrical isolation functions.
Compared with the prior art, the utility model provides a module power multichannel intelligent test and ageing device possesses following beneficial effect:
the utility model discloses before test and ageing power load, an electronic switch who keeps apart has been established ties, through controlling MCU, control electronic switch that can be very convenient to can carry out real time monitoring to its operating condition.
Because the device has increased and has kept apart auxiliary power supply, no matter whether multichannel module power normally works, this module power multichannel intelligence test and ageing device can both normal operating.
Because the high-precision linear isolation amplifier is adopted, no matter whether a high-voltage area and a low-voltage area inside the module power supply are electrically isolated or not, a good safe electrical isolation effect can be achieved, and the precision of a test and an aging numerical value can be ensured.
The utility model has the advantages of convenient control, simple process, easy mass production and automatic production.
The utility model discloses a well part that does not relate to all is the same with prior art or can adopt prior art to realize, the utility model discloses simple structure, convenient operation.
Example 1
As shown in figure 1, the module power supply multi-path intelligent testing and aging device comprises a device body 1, wherein the device body 1 comprises an AC high-voltage unit and a signal low-voltage unit, a reset key 7 and a third AC-DC auxiliary power supply 18 are respectively arranged on two sides of the lower end of the device body 1, a second AC-DC auxiliary power supply 17, a first AC-DC auxiliary power supply 16, a buzzer 15, a communication chip 14, a communication port 13, a second driving chip 12, an MCU chip 11, a first driving chip 10, a starting key 9 and a stopping key 8 are sequentially arranged between the third AC-DC auxiliary power supply 18 and the reset key 7, the stopping key 8 is close to one side of the reset key 7, the second AC-DC auxiliary power supply 17 is close to one side of the third AC-DC auxiliary power supply 18, and a power load output port 20, a power load output port 20 and a signal low-voltage unit are sequentially arranged on one side of the device body 1, The device comprises a power load module 2, an electronic switch 3, a slot 4, an LED indicator lamp 5 and a photoelectric linear isolation amplifier 6, wherein an AC high-voltage unit comprises the slot 4, a first AC-DC auxiliary power supply 16, a second AC-DC auxiliary power supply 17, a third AC-DC auxiliary power supply 18 and an AC power plug 19, and a signal low-voltage unit comprises the photoelectric linear isolation amplifier 6, the electronic switch 3, the power load module 2, an MCU chip 11, a communication chip 14, a first driving chip 10, a second driving chip 12, a reset key 7, a stop key 8, a start key 9, a communication port 13 and a buzzer 15.
The communication port 13 can be connected with a computer, the MCU chip 11 is a central processing unit with storage and intelligent control functions, the communication chip 14 is an analog-to-digital conversion and data acquisition chip, the first drive chip 10 and the second drive chip 12 have signal amplification and signal output functions, the first AC-DC auxiliary power supply 16, the second AC-DC auxiliary power supply 17 and the third AC-DC auxiliary power supply 18 have functions of converting input AC220V or AC380V into +/-5V and +/-3.3V, the slot 4 can be inserted into a module power supply, the photoelectric linear isolation amplifier 6 has functions of electrically isolating high voltage and low voltage and playing a role in signal transmission, the electronic switch 3 is controlled by the MCU chip 11 and an external computer, the power load module 2 is controlled by the electronic switch 3, an AC power plug 19 is arranged on the side of the device body 1 close to the third AC-DC auxiliary power supply 18, the AC power plug 19 is connected to an external AC power source.
The first AC-DC auxiliary power supply 16, the second AC-DC auxiliary power supply 17 and the third AC-DC auxiliary power supply 18 are all isolated power supplies.
The electronic switch 3 is any one of power semiconductor devices such as a field effect transistor, a triode, a silicon controlled rectifier and the like, and the electronic switch 3 is connected to the power load module 2 in a series connection mode.
The photoelectric linear isolation amplifier 6 is a linear isolation device such as an optical coupler.
The MCU chip 11 and the electronic switch 3 have automatic monitoring and electrical isolation functions.
The utility model discloses before test and ageing power load, an electronic switch 3 of keeping apart has been established ties, through controlling MCU chip 11, control electronic switch 3 that can be very convenient to can carry out real time monitoring to its operating condition.
Because the device is additionally provided with three auxiliary power supplies, namely a first AC-DC auxiliary power supply 16, a second AC-DC auxiliary power supply 17 and a third AC-DC auxiliary power supply 18, the multi-path intelligent testing and aging device for the module power supply can normally run no matter whether the multi-path module power supply works normally or not.
The AC-DC auxiliary power supply provides voltage and current required by work for the module power supply multipath testing and aging device, and the module power supply multipath testing and aging device comprises the following working steps: firstly insert the slot 4 of module power multichannel test and ageing device respectively with a plurality of module power, plug in AC power plug 19, the switch on, buzzer 15 long ring 1S, the suggestion is ready, presses start button 9, begins the test, and the button stops button 8, can suspend this test and ageing at any time, and button 7 resets for the manual key that resets, and last test data of storage in MCU chip 11 can be clear away to this key.
Because the high-precision photoelectric linear isolation amplifier 6 is adopted, no matter whether a high-voltage area and a low-voltage area inside the module power supply are electrically isolated or not, a good safe electrical isolation effect can be achieved, and the precision of a test and an aging numerical value can be ensured.
The working principle is as follows: the utility model discloses a: the testing and aging system comprises an AC-DC auxiliary power supply part, a grid-connected communication part, a plurality of slots 4, an electronic switch 3, a power resistor, an output port, a photoelectric linear isolation amplifier 6 and an inserted module power supply and working instruction control of the communication part, when a module power supply to be tested is inserted into the module power supply multi-path intelligent testing and aging device, corresponding state indicating lamps of each path are normally on to indicate that the module power supply is inserted into the respective slots 4, meanwhile, a buzzer 15 of the communication part buzzes for 1S, a start key 9 is pressed to start the testing and aging device, testing and aging time is input according to user requirements, an MCU chip 11 starts timing and is interconnected with each path, communication signals for external testing and aging are output through a socket of a communication line, the first path to the last path of module power supplies are scanned according to sequence, and the voltage, current, zero-crossing signals, reference voltage and other production values of each path of module power supply are synchronously tested, and real-time storage is carried out through the MCU chip 11, monitoring is carried out, once the abnormity of the module power supply of a certain path is found, the MCU chip 11 can monitor the working state of the path and record, an instruction is sent out, the electronic switch 3 of the path is closed, the operation of the path is stopped so as to protect the normal operation of other paths in the device, meanwhile, the working state of the path is reported through the MCU chip 11, the time of the occurrence of the defect and the reason of the occurrence of the defect are recorded, and all control parts are in a low-voltage safe working area.
The utility model discloses a control method, concrete step is as follows:
firstly, an AC power plug 19 is inserted into a commercial power 220V or AC380V alternating current power supply, then three auxiliary power supplies, namely a first AC-DC auxiliary power supply 16, a second AC-DC auxiliary power supply 17 and a third AC-DC auxiliary power supply 18, are inserted into a slot 4, the power supply is switched on, a test and aging state is entered by issuing a test and aging instruction through a computer or pressing a start key 9 of a module power supply multi-path intelligent test and aging device, wherein an MCU chip 11, a communication chip 14 and a communication port 13 form a software part, an electronic switch 3, a power load module 2, the first AC-DC auxiliary power supply 16, the second AC-DC auxiliary power supply 17 and the third AC-DC auxiliary power supply 18, the slot 4 and an optoelectronic linear isolation amplifier 6 form a hardware part, and the voltage, current, power, temperature rise, zero-crossing signals (including non-zero-crossing signals) of the module power supply can be started up through the test and aging device, information such as overload protection, short-circuit protection, voltage regulation rate and the like is stored in the MCU chip 11 or is transmitted to an external computer through the communication port 13, and the inserted module power supply is judged, so that the functions of automatic detection and automatic aging are realized.
Whole ageing module power multichannel intelligent test and ageing device, the feasible software and hardware that can be accurate combine together to can carry out automatic coding to multichannel male module power, really accomplish real-time distributed control, reach intelligent test and automatic ageing purpose, and the utility model discloses a simple process, it is multiple functional, can test and ageing by automatic control power module, easily big batch and automated production.
Above, only be the concrete implementation of the preferred embodiment of the present invention, but the protection scope of the present invention is not limited thereto, and any person skilled in the art is in the technical scope of the present invention, according to the technical solution of the present invention and the design of the present invention, equivalent replacement or change should be covered within the protection scope of the present invention.