CN211402629U

CN211402629U - Test marking device and test equipment

Info

Publication number: CN211402629U
Application number: CN201921907553.XU
Authority: CN
Inventors: 金二兵; 李景涛; 陈飞; 成斌
Original assignee: Joint Stars Technology Co ltd
Current assignee: Joint Stars Technology Co ltd
Priority date: 2019-11-06
Filing date: 2019-11-06
Publication date: 2020-09-01
Anticipated expiration: 2029-11-06
Also published as: WO2021088329A1

Abstract

The utility model discloses a test mark device and test equipment. Wherein the test marking device includes the bed frame and locates probe test subassembly on the bed frame, probe test subassembly includes probe body and first driving piece, first drive the probe body is close to or is kept away from the motion of the examination spare of awaiting measuring, still includes: the marking assembly is arranged on the base frame and comprises a marking body and a second driving piece which are arranged in parallel, the output end of the second driving piece is connected to the marking body through a first connecting piece, and the marking body determines to mark the piece to be tested according to the test result of the piece to be tested, which is tested by the probe body. The probe testing component is arranged for testing the piece to be tested, and the marking component is arranged for marking the piece to be tested, so that the integration of the probe testing component and the piece to be tested is realized; wherein through setting up the parallel setting of mark body and second driving piece, improved the integrated level of mark subassembly, and reduced the shared space of direction of motion along probe test subassembly.

Description

Test marking device and test equipment

Technical Field

The utility model relates to a test technical field, concretely relates to test marking device and test equipment.

Background

The PCB is named as a printed circuit board in chinese, is a carrier for mounting electronic components, and is also a provider for electrical connection of electronic components, and thus, is an important electronic component. In order to ensure that the quality of a product using the PCB is guaranteed to a certain extent, the test work after the PCB is manufactured is very important.

In the prior art, a test probe device is usually installed on a movable module, the movable module moves to drive the test probe device to move, so that the test probe device is controlled to be pricked at each test point of a PCB (printed circuit board), whether the PCB is qualified is detected on line, and after the test is finished, a corresponding circuit board is marked by a separately arranged marking device to distinguish good products and defective products.

The test probe device and the marking device are separately arranged, so that the integration level of the test probe device and the marking device is lower, and the occupied space is larger.

SUMMERY OF THE UTILITY MODEL

Therefore, the to-be-solved technical problem of the present invention lies in overcoming the low integration level of the test probe device and the marking device in the prior art, and the large occupation space, thereby providing a test marking device.

A test marking device comprises a pedestal and a probe test assembly arranged on the pedestal, wherein the probe test assembly comprises a probe body and a first driving piece, the first driving piece drives the probe body to move close to or far away from a to-be-tested part, and the test marking device further comprises:

the marking assembly is arranged on the base frame and comprises a marking body and a second driving piece which are arranged in parallel, the output end of the second driving piece is connected to the marking body through a first connecting piece, and the marking body is used for determining and marking the piece to be tested according to the test result of the piece to be tested, which is tested by the probe body.

Furthermore, the mark body comprises a mark arm, a mark connecting piece and a first elastic piece arranged between the mark arm and the mark connecting piece, and the mark connecting piece is connected to the second driving piece and sleeved on the mark arm.

Further, the mark body still includes spacing subassembly, spacing subassembly includes stop part and spacing portion, stop part locates mark arm with on one of them of mark connecting piece, spacing portion locates mark arm with on one of them another of mark connecting piece, stop part to spacing portion spacing.

Furthermore, the mark body further comprises a mark cover body assembly, the mark cover body assembly comprises a cover body, a first cover body connecting piece and a second cover body connecting piece, the cover body is rotatably connected to the mark arm through the first cover body connecting piece, and the cover body is rotatably connected to the base frame through the second cover body connecting piece.

Furthermore, the probe test assembly further comprises a synchronous belt transmission assembly arranged on the base frame, the synchronous belt transmission assembly is arranged at the output end of the first driving piece, and the probe body is connected to the synchronous belt transmission assembly in parallel.

Furthermore, the probe test assembly further comprises a guide rail auxiliary assembly arranged on the base frame, the guide rail auxiliary assembly and the synchronous belt transmission assembly are arranged in parallel, and the probe body is connected to the guide rail auxiliary assembly in a sliding mode.

Furthermore, the probe test assembly further comprises a first sensing assembly, the first sensing assembly comprises a first sensor and a first sensing piece, the first sensor is adjustably connected to the base frame along the movement direction of the probe body, and the first sensing piece is fixedly connected to the probe body.

Further, still include the second response subassembly, the second response subassembly includes second sensor and second response piece, the second sensor sets firmly in on the bed frame, second response piece rotatable coupling in on the bed frame.

Further, still include the vision subassembly, the vision subassembly is located on the bed frame, and with the probe body sets up in parallel.

A test apparatus, comprising:

the clamping device is used for clamping the piece to be tested;

the test marking device is used for testing and marking the piece to be tested.

The utility model discloses technical scheme has following advantage:

1. the utility model provides a pair of test mark device, it includes the bed frame and locates probe test subassembly on the bed frame, wherein probe test subassembly includes probe body and first driving piece, first drive the probe body is close to or keeps away from the motion of the test piece that awaits measuring, still includes: the marking assembly is arranged on the base frame and comprises a marking body and a second driving piece which are arranged in parallel, the output end of the second driving piece is connected to the marking body through a first connecting piece, and the marking body is used for determining and marking the piece to be tested according to the test result of the piece to be tested, which is tested by the probe body. The test marking device with the structure realizes the integration of the test piece to be tested by the probe test component and the marking component for marking the test piece to be tested; wherein through setting up the parallel setting of mark body and second driving piece, improved the integrated level of mark subassembly, and reduced the shared space of direction of motion along probe test subassembly.

2. The utility model provides a pair of test marking device, the mark body includes mark arm, mark connecting piece and locates first elastic component between the two, the mark connecting piece connect in second driving piece and cover are located on the mark arm. According to the test marking device with the structure, the marking arm, the marking connecting piece and the first elastic piece are arranged, when the marking arm marks the to-be-tested pieces with different thicknesses, the first elastic piece is adjusted adaptively according to the to-be-tested pieces, so that the marking arm is adaptive to the to-be-tested pieces with different thicknesses.

3. The utility model provides a pair of test marking device, the mark body still includes spacing subassembly, spacing subassembly includes stop part and spacing portion, stop part locates the mark arm with on one of them of mark connecting piece, spacing portion is located the mark arm with mark connecting piece is wherein on another one of them, stop part is right spacing portion is spacing. According to the test marking device with the structure, the blocking part and the limiting part are arranged, so that the telescopic motion stroke of the first elastic part is limited.

4. The utility model provides a pair of test mark device, the mark body is still including mark lid subassembly, mark lid subassembly includes lid body, first lid connecting piece and second lid connecting piece, the lid body through first lid connecting piece rotatable coupling in mark arm, the lid body through second lid connecting piece rotatable coupling in the bed frame. The test marking device with the structure is provided with the marking cover body assembly and is used for protecting the marking arm.

5. The utility model provides a pair of test marking device, probe test subassembly is still including locating synchronous belt drive subassembly on the bed frame, synchronous belt drive subassembly is located the output of first driving piece, probe body parallel connection in synchronous belt drive subassembly. The test marking device with the structure has the advantages that the synchronous belt transmission assembly is arranged, so that the occupied space in the motion direction of the probe test assembly is reduced when the probe body is driven.

6. The utility model provides a pair of test marking device, probe test subassembly is still including locating guide rail auxiliary assembly on the bed frame, guide rail auxiliary assembly with the parallel setting of synchronous belt drive subassembly, probe body sliding connection in guide rail auxiliary assembly. The test marking device with the structure improves the motion precision of the probe body by being provided with the guide rail auxiliary assembly.

7. The utility model provides a pair of test marking device, probe test subassembly still includes first response subassembly, first response subassembly includes first sensor and first response piece, first sensor is followed the direction of motion of probe body connect adjustably in the bed frame, first response piece link firmly in the probe body. The test marking device with the structure is provided with the first induction assembly adjustably to control the movement stroke of the probe body, so that the damage of the probe action to a test piece to be tested is reduced, and the test marking device can be adapted to the test pieces to be tested with different thicknesses.

8. The utility model provides a pair of test marking device still includes second response subassembly, second response subassembly includes second sensor and second response piece, the second sensor set firmly in on the bed frame, second response piece rotatable coupling in on the bed frame. The test mark device with the structure ensures the safety of the device by providing the second sensor to enable the device to continue to act when accidental contact of a clamping device or other devices occurs.

9. The utility model provides a pair of test equipment, include: the clamping device is used for clamping the piece to be tested; the test marking device is used for testing and marking the piece to be tested. The test equipment with the structure naturally has all the advantages brought by the test marking device.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the embodiments or the technical solutions in the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.

Fig. 1 is a schematic structural diagram of a test marking apparatus provided in an embodiment of the present invention;

FIG. 2 is a schematic structural view of the test marking apparatus shown in FIG. 1, without showing a portion of the base frame;

FIG. 3 is a rear view of the test flag assembly shown in FIG. 2;

FIG. 4 is an enlarged partial view of the test flag assembly of FIG. 2 after rotation;

FIG. 5 is an enlarged partial view of the probe body shown in FIG. 2;

FIG. 6 is an enlarged partial view of the marker assembly shown in FIG. 3;

FIG. 7 is an enlarged view of a portion of the test marker device of FIG. 3 without the marker housing;

FIG. 8 is a schematic view of the test flag assembly of FIG. 7 without the first flag connector;

FIG. 9 is a schematic structural view of the cover body shown in FIG. 8 when opened;

description of reference numerals:

1-a base frame;

2-probe test assembly, 21-first driving piece, 2211-driving wheel, 2212-driven wheel, 2213-synchronous belt, 2214-U-shaped fixing piece, 2221-sliding rail, 2222-sliding block, 2231-L-shaped fixing piece, 2232-first fixing piece, 22331-vertical part, 22332-horizontal part, 2241-first sensor, 2242-first induction adjusting piece, 2243-second induction adjusting piece and 225-probe body;

3-marking assembly, 311-marking housing, 3121-first marking arm, 3122-second marking arm, 3131-first marking connector, 3132-second marking connector, 314-first elastic element, 3151-blocking portion, 3152-limiting portion, 3161-cover body, 3162-first cover connector, 3163-second cover connector, 3164-second elastic element, 3165-first connecting shaft, 3166-second connecting shaft, 32-second driving element, 33-first connecting element;

41-second sensor, 421-trigger end arm, 422-sense end arm;

5-a vision component;

61-a main control circuit board, 62-a first branch control circuit board and 63-a second branch control circuit board.

Detailed Description

The technical solution of the present invention will be described clearly and completely with reference to the accompanying drawings, and obviously, the described embodiments are some, but not all embodiments of the present invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplification of description, but do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.

In the description of the present invention, it is to be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.

Furthermore, the technical features mentioned in the different embodiments of the invention described below can be combined with each other as long as they do not conflict with each other.

Examples

The present embodiment provides a test apparatus comprising a holding device and a test marking device as shown in fig. 1 to 9, wherein the holding device is used for holding a test piece to be tested, and the test marking device is used for testing and marking the test piece to be tested. Specifically, the piece to be tested may be a PCB board or others.

The test marking device comprises a base frame 1, a probe test component 2, a marking component 3, a vision component 5, a second sensing component and a control component. Wherein the probe testing component 2, the marking component 3, the vision component 5, the second induction component and the control component are all arranged on the base frame 1.

The probe test assembly 2 in this embodiment includes a first driving member 21, a synchronous belt drive assembly, a guide rail auxiliary assembly, a probe connection assembly, a first sensing assembly, and a probe body 225. Specifically, the first driving member 21 is a motor, and the first driving member drives the probe body 225 to move close to or away from the test piece.

As shown in fig. 2, the synchronous belt transmission assembly in this embodiment includes a driving wheel 2211, a driven wheel 2212 and a synchronous belt 2213, wherein the driving wheel 2211 is sleeved and fixed on an output end of the first driving member 21, the driven wheel 2212 is sleeved and fixed on a driven shaft, the driven shaft is inserted and fixed on two opposite end arms of the U-shaped fixing member 2214, the other end arm of the U-shaped fixing member 2214 is fixed on the base frame 1, and the synchronous belt 2213 is sleeved on the driving wheel 2211 and the driven wheel 2212. Through being provided with synchronous belt drive assembly, when realizing the transmission to probe body 225, reduced along the shared space of the direction of motion of probe test subassembly 2.

As shown in fig. 4, the guide rail auxiliary assembly in this embodiment includes a slide rail 2221 and a slide block 2222 disposed on the slide rail 2221, wherein the slide rail 2221 is fixed on the base frame 1 and is disposed in parallel with the synchronous belt transmission assembly, and the slide block 2222 slides on the slide rail 2221. By providing the guide rail auxiliary assembly, the movement accuracy of the probe body 225 is improved.

As shown in fig. 2, 4 and 5, the probe connecting assembly includes an L-shaped fixing part 2231, a first fixing part 2232 and a second fixing part, wherein the vertical arm of the L-shaped fixing part 2231 and the first fixing part 2232 are fixedly connected and respectively located at two sides of the timing belt 2213, and the horizontal arm of the L-shaped fixing part 2231 is fixed on the sliding block 2222. The L-shaped fixing part 2231 and other parts fixedly connected with the L-shaped fixing part are driven to move by the movement of the synchronous belt 2213.

As shown in fig. 2 and 5, the second fixture in this embodiment includes a vertical portion 22331 and a horizontal portion 22332, and the vertical portion 22331 and the horizontal portion 22332 are sequentially disposed along a direction close to the test piece, wherein the vertical portion 22331 is fixed on the horizontal arm of the L-shaped fixture 2231, and the horizontal portion 22332 is fixed with the probe body 225, so that the probe body 225 is slidably connected to the guide rail auxiliary assembly by the L-shaped fixture 2231.

First response subassembly in this embodiment includes first sensor 2241, first response piece, first response adjustment piece 2242 and second response adjustment piece 2243, and first sensor 2241 is connected in bed frame 1 through first response adjustment piece 2242, second response adjustment piece 2243 along the direction of motion of probe body 225 is adjustable, and first response piece links firmly in one side that probe body 225 is close to first sensor 2241.

Referring specifically to fig. 5, the first sensing adjustment member 2242 is fixedly disposed in an open slot of the horizontal portion 22332 of the second fixing member; the second sensing adjustment member 2243 is provided with a bar-shaped hole through which it is connected to the bottom surface of the horizontal portion 22332 of the second fixing member, and the second sensing adjustment member 2243 is provided with an exposure hole allowing the sensing portion of the first sensor 2241 to be exposed; first sensor 2241 is attached to second sensing adjustment member 2243. When the position of the first sensor 2241 needs to be adjusted according to the to-be-tested pieces with different thicknesses, the first sensor 2241 is placed at the corresponding position by adjusting the position of the strip-shaped hole, a first fastening piece such as a screw is placed between two oppositely-arranged protruding arms of the first induction adjusting piece 2242 protruding out of the open slot, and the first sensor 2241 is screwed and fixed.

Through the adjustable first response subassembly that sets up to the motion stroke of control probe body 225, thereby reduce the probe action to the damage of the test piece that awaits measuring to and can adapt to the test piece that awaits measuring of different thickness.

As shown in fig. 2 and 3, the marking assembly 3 in this embodiment includes a marking body and a second driving member 32, which are disposed in parallel and fixed on the base frame 1, and an output end of the second driving member 32 is connected to the marking body through a first connecting member 33, wherein the marking body determines whether to mark the to-be-tested object as good or bad according to a test result of the to-be-tested object tested by the probe body 225. Specifically, the second drive member 32 may be a cylinder or other drive member.

As shown in fig. 6, the marking body in this embodiment includes a marking housing 311, a marking arm, a marking connector, a first elastic element 314, a limiting assembly, and a marking cover assembly, wherein the marking arm, the marking connector, the first elastic element 314, and the limiting assembly are located in the marking housing 311, the marking housing 311 is fixed on the base frame 1, and the marking cover assembly is covered on the marking housing 311.

Referring to fig. 7 and 8 in particular, the marking arm includes a first marking arm 3121 and a second marking arm 3122 that are sequentially disposed along a direction away from the marking cover assembly and are integrally formed, the marking link includes a first marking link 3131 and a second marking link 3132 that are sequentially disposed along a direction away from the marking cover assembly and are separately disposed, one end of the first marking link 3131 is sleeved and fixed on the second marking link 3132, and the other end is sleeved on the second marking arm 3122, the second marking link 3132 is connected to an output end of the second driving element 32 through the first link 33; and the first elastic element 314 is sleeved on the second marking arm 3122, one end of the first elastic element 314 abuts against the end surface of the first marking arm 3121, and the other end abuts against the step surface in the first marking connector 3131.

By providing the marking arm, the marking connector and the first elastic member 314, when the marking arm marks the pieces to be tested with different thicknesses, the first elastic member 314 is adaptively adjusted according to the pieces to be tested, so that the marking arm is adapted to the pieces to be tested with different thicknesses.

As shown in fig. 7, the limiting assembly includes a blocking portion 3151 and a limiting portion 3152, the blocking portion 3151 is disposed on the first marking arm 3121, the limiting portion 3152 is disposed on the first marking connector 3131, wherein the limiting portion 3152 is disposed on a side of the blocking portion 3151 close to the marking cover assembly, and the blocking portion 3151 blocks the limiting portion 3152 for limiting. Alternatively, the stop 3151 may be disposed on the first flag connector 3131 and the stop 3152 may be disposed on the first flag arm 3121, wherein the stop 3152 is disposed on a side of the stop 3151 away from the flag cover assembly. The first elastic member 314 is restricted in its expansion and contraction stroke by the provision of the blocking portion 3151 and the stopper portion 3152.

As shown in fig. 7, the marking cover assembly includes a cover body 3161, a first cover body coupling 3162, a second cover body coupling 3163, and a second elastic member 3164, wherein the cover body 3161 is rotatably connected to the marking arm via the first cover body coupling 3162, the cover body 3161 is rotatably connected to the base frame 1 via the second cover body coupling 3163, and the second elastic member 3164 applies a force to the second cover body coupling 3163 to prevent the rotation angle of the second cover body coupling 3163 from being too large. The marking cover body assembly is arranged and used for protecting the marking arm. As shown in fig. 7, the cover body is shown as being closed when the cover body is covered on the mark housing; as shown in fig. 9, the cover body is not covered on the mark case and is opened.

Referring to fig. 7 and 9 in particular, two first cover coupling members 3162 are symmetrically disposed, one end of each first cover coupling member 3162 is rotatably connected to the first marking arm 3121, and the other end thereof is rotatably connected to the cover body 3161; two second cover body connecting pieces 3163 are symmetrically arranged, the two second cover body connecting pieces 3163 are sequentially provided with a first connecting shaft 3165 and a second connecting shaft 3166 along the direction far away from the cover body 3161, one end part of the second cover body connecting piece 3163 is rotatably connected to the cover body 3161, and the other end part is rotatably connected to the marking housing 311 through the second connecting shaft 3166; the second elastic member 3164 is sleeved on the second connection shaft 3166, one of the acting ends of the second elastic member 3164 acts on the marking housing 311, and the other acting end acts on the first connection shaft 3165.

As shown in fig. 3 and 4, the second sensing assembly in this embodiment includes a second sensor 41 and a second sensing member, the second sensor 41 is fixed on the base frame 1, and the second sensing member is rotatably connected to the base frame 1. The second sensing member includes a triggering end arm 421 and a sensing end arm 422, which are disposed at an angle, and the two are integrally formed or disposed separately. When the trigger end arm 421 is contacted, the sensing end arm 422 is driven to rotate to trigger the second sensing element. Specifically, two triggering end arms 421 are symmetrically arranged in fig. 3, and a third elastic element is arranged between the two triggering end arms 421, so that the second sensing element can be reset. By providing the second sensor 41, the device is made to continue to operate when accidental contact occurs, for example, with a gripping device or other device, ensuring the safety of the device.

As shown in fig. 4, the vision assembly 5 in this embodiment is disposed on the base frame 1 and is disposed in parallel with the probe body 225. In particular, the vision component 5 may be a CCD camera or other vision component 5.

As shown in fig. 2 and fig. 3, the control component in this embodiment includes a main control circuit board 61, a first sub control circuit board 62 and a second sub control circuit board 63, and the main control circuit board 61 is electrically connected to the first sub control circuit board 62 and the second sub control circuit board 63, respectively. Specifically, the main control circuit board 61 is fixedly arranged on the base frame 1 along a direction perpendicular to the movement direction of the probe test assembly 2, the first sub-control circuit board 62 is fixedly arranged on the base frame 1 and is used for controlling the limit movement stroke of the probe body 225, and the second sub-controller is fixedly arranged on the base frame 1 and controls the stop of the device according to the information of the second sensor 41.

The utility model discloses a test marking device, through being provided with the test piece of probe test subassembly 2 test and mark the piece of waiting to test of subassembly 3 mark, realized the integration of both; wherein, the integration level of the marking component 3 is improved and the space occupied along the motion direction of the probe test component 2 is reduced by arranging the marking body and the second driving piece 32 in parallel.

It should be understood that the above examples are only for clarity of illustration and are not intended to limit the embodiments. Other variations and modifications will be apparent to persons skilled in the art in light of the above description. And are neither required nor exhaustive of all embodiments. And obvious variations or modifications can be made without departing from the scope of the invention.

Claims

1. A test marking device comprises a pedestal and a probe test assembly arranged on the pedestal, wherein the probe test assembly comprises a probe body and a first driving piece, the first driving piece drives the probe body to move close to or far away from a piece to be tested, and the test marking device is characterized by further comprising:

2. The test marking device of claim 1, wherein the marking body comprises a marking arm, a marking connector and a first elastic member disposed therebetween, the marking connector being connected to the second driving member and sleeved on the marking arm.

3. The test marking device of claim 2, wherein the marking body further comprises a limiting component, the limiting component comprises a blocking portion and a limiting portion, the blocking portion is disposed on one of the marking arm and the marking connector, the limiting portion is disposed on the other of the marking arm and the marking connector, and the blocking portion limits the limiting portion.

4. The test marking device of claim 2 or 3, wherein the marking body further comprises a marking cover assembly, the marking cover assembly comprises a cover body, a first cover connector and a second cover connector, the cover body is rotatably connected to the marking arm via the first cover connector, and the cover body is rotatably connected to the base frame via the second cover connector.

5. The test marking device as claimed in claim 4, wherein the probe test assembly further comprises a synchronous belt transmission assembly disposed on the base frame, the synchronous belt transmission assembly is disposed at the output end of the first driving member, and the probe body is connected in parallel to the synchronous belt transmission assembly.

6. The test marking device of claim 5, wherein the probe test assembly further comprises a rail auxiliary assembly disposed on the base frame, the rail auxiliary assembly and the synchronous belt drive assembly are disposed in parallel, and the probe body is slidably connected to the rail auxiliary assembly.

7. The test marking apparatus of claim 6, wherein the probe test assembly further comprises a first sensing assembly, the first sensing assembly comprising a first sensor and a first sensing member, the first sensor being adjustably coupled to the base frame along the direction of movement of the probe body, the first sensing member being fixedly coupled to the probe body.

8. The test marking device of claim 7, further comprising a second sensing assembly, the second sensing assembly including a second sensor and a second sensing member, the second sensor being secured to the base frame, the second sensing member being rotatably coupled to the base frame.

9. The test marking device of claim 8, further comprising a vision assembly disposed on the pedestal and in parallel with the probe body.

10. A test apparatus, comprising:

the clamping device is used for clamping the piece to be tested;

a test marking apparatus as claimed in any one of claims 1 to 9 for testing and marking the piece to be tested.