CN211320062U

CN211320062U - Probe testing device of solar cell

Info

Publication number: CN211320062U
Application number: CN202020433729.9U
Authority: CN
Inventors: 孙永; 李亮亮; 刘权辉; 周超; 刘长明
Original assignee: Zhejiang Jinko Solar Co Ltd; Jinko Solar Co Ltd
Current assignee: Zhejiang Jinko Solar Co Ltd; Jinko Solar Co Ltd
Priority date: 2020-03-30
Filing date: 2020-03-30
Publication date: 2020-08-21
Anticipated expiration: 2030-03-30

Abstract

The utility model provides a probe testing arrangement of solar wafer, include: a magnetic support and a probe row; the magnetic support comprises a probe row support, a support rod and a base; a magnet is arranged in the probe row bracket; the base and the probe row support are connected with the probe row support through a support rod; fixed blocks are arranged at two ends of the probe row; the probe row is magnetically connected with the probe row support through the fixing block. Compared with the prior art, the utility model discloses a magnetism realizes fixing of probe row position, and the position can be adjusted at will, has simplified the dismantlement and the installation of probe row, has realized accuracy nature and the simplicity and convenience that adjustment or change test battery piece probe were arranged.

Description

Probe testing device of solar cell

Technical Field

The utility model belongs to the technical field of solar cell, especially, relate to a probe testing arrangement of solar wafer.

Background

A solar cell, also called a photovoltaic cell, is a semiconductor device for directly converting solar light energy into electric energy, and because it is a green environmental product, it does not cause environmental pollution, and it is a renewable resource, under the situation of current energy shortage, the solar cell becomes a new energy with a wide development prospect.

The performance of the solar cell can not be tested in the conventional production, process improvement, product sizing, weather-proof experiment and the like of the solar cell, and then grading, efficiency calibration, unqualified screening and the like are carried out on the cell according to the test effect. In the prior art, a probe test device is generally used for testing the efficiency of the battery, namely, a plurality of test probe rows, wherein the number of the test probe rows corresponds to the number of main grids of the battery, and 1, 2, 3, … … and n are used.

The test of solar cells has very high requirements on the position accuracy of the probes, and the probes need to be aligned up and down to press the main grid lines, so that the positions of the probe banks need to be strictly controlled when the probe banks are replaced or different numbers of probe banks are switched. Generally, a probe row is fixed and changed by screwing a screw hole on a fixed seat, placing a nut in a groove on a fixed support, and using the screw and the nut to fix and change the position. All will the elasticity screw nut in this kind of mode adjustment, it is more loaded down with trivial details, get the elasticity on the screw or the tightness can all make probe row position the deviation appear, and screw and nut wearing and tearing are great, time is still easy smooth silk etc. for a long time, and if there is a probe row to damage when changing, need with the whole dismantlement of several probe rows in front of it just can take out, the work load has been increased, thereby bring many troubles for test work, this just makes us go to seek more conveniently, quick and accurate mode goes to adjust and fix probe row position, thereby promote work efficiency greatly.

SUMMERY OF THE UTILITY MODEL

In view of this, the to-be-solved technical problem of the present invention is to provide a probe testing device for solar cell, which is capable of adjusting or replacing the probe row of the solar cell with high accuracy and simplicity.

The utility model provides a probe testing arrangement of solar wafer, include:

a magnetic support and a probe row;

the magnetic support comprises a probe row support, a support rod and a base; a magnet is arranged in the probe row bracket;

the base and the probe row support are connected with the probe row support through a support rod;

fixed blocks are arranged at two ends of the probe row;

the probe row is magnetically connected with the probe row support through the fixing block.

Preferably, the magnetic bracket is a switch type magnetic bracket.

Preferably, one end of the probe row bracket is connected with the support rod; the other end is provided with a control switch which controls the directions of two poles of the magnet in the probe row bracket.

Preferably, a plurality of control switches are arranged on the probe row support.

Preferably, the base is a soft magnetic base.

Preferably, the fixed block is provided with a groove; the shape of the groove is matched with the shape of the cross section of the probe row support.

Drawings

Fig. 1 is a schematic top view of a probe testing device for a solar cell provided by the present invention;

fig. 2 is a schematic structural diagram of the position of an upper probe row of the probe testing device for a solar cell provided by the present invention;

fig. 3 is a schematic structural diagram of a lower probe row position of the probe testing device for solar cells.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely below with reference to the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

The utility model provides a probe testing arrangement of solar wafer, include:

a magnetic support and a probe row;

fixed blocks are arranged at two ends of the probe row;

The utility model discloses a magnetism realizes the fixed of probe bank position, and the position can be adjusted at will, has simplified the dismantlement and the installation of probe bank, has realized the accuracy nature and the simplicity that the adjustment or change test battery piece probe were arranged, ensures the high accuracy that the probe pushed down the position.

See fig. 1, 2 and 3; fig. 1 is a schematic top view of a probe testing device for a solar cell provided by the present invention; fig. 2 is a schematic structural diagram of the position of an upper probe row of the probe testing device for a solar cell provided by the present invention; fig. 3 is a schematic structural diagram of a lower probe row position of the probe testing device for solar cells provided by the present invention; wherein 1 is the base, 2 is the bracing piece, 3 is probe row support, 4 is control switch, 5 is the fixed block, 6 is the probe row.

The utility model provides a probe testing device, which comprises a magnetic force bracket; the magnetic support is preferably a switch type magnetic support; the magnetic support preferably comprises a probe row support, a support rod and a base; the probe row support is preferably a strip-shaped probe row support; the number of the probe bank supports is preferably 2 or 2; a magnet is arranged in the probe row bracket; the magnet is preferably a bar magnet; the magnet can be a permanent magnet or a permanent magnet; one end of the probe row support is connected with the support rod, the other end of the probe row support is provided with a control switch, and the two-stage directions of the magnets in the probe row support are controlled through the control switch; the control switch is used for controlling the whole magnetic support; the probe row support is also preferably provided with a plurality of control switches, namely the probe row support is provided with a plurality of magnets in a segmented manner, each control switch corresponds to one segment of magnet and separately controls the magnetism of the corresponding probe row support so as to separately control the probe rows at the corresponding positions; the probe row support is connected with the base through a support rod; the base is preferably a soft magnetic base.

The principle of the switch type magnetic force support is that a cylinder is arranged in a probe row support, a strip-shaped permanent magnet or a permanent magnet is placed in the middle of the probe row support, a soft magnetic material (the soft magnetic material is a ferrite material which is easy to magnetize and demagnetize under a weaker magnetic field) is arranged at the outer base, and the magnet in the probe row support is rotated by rotating a control switch. When two poles (N or S) of the magnet are in the vertical direction, namely the N or S pole of the magnet is opposite to the soft magnetic material base, the magnet is magnetized, and the magnet has strong magnetism in the direction, so the magnet can be used for attracting the surface of steel; when the two poles of the magnet are in the horizontal direction, namely the middle of the NS is opposite to the soft magnetic material base, the magnet cannot be magnetized (the middle of the elongated magnet has only minimal magnetism and can not be remembered), so that the magnet can be easily taken off from the surface of steel due to almost no magnetic force on the base. The switch type magnetic bracket utilizes two characteristics of 1) the magnetization and demagnetization speed of soft magnetic materials; 2) the bar-shaped permanent magnet or the permanent magnet has the characteristics that the middle magnetic field is extremely weak and the magnetic fields at two ends are extremely strong.

The probe testing device provided by the utility model also comprises a probe row; probes are arranged on the probe row; the two ends of the probe row are provided with fixed blocks which are magnetically connected with the probe row bracket through the fixed blocks; the fixed block is preferably a steel fixed block; the fixed block is preferably further provided with a groove, and the shape of the groove is matched with the shape of the cross section of the probe row support.

In the utility model, the probe rows in the probe test device are paired up and down and comprise an upper probe row and a lower probe row corresponding to the upper probe row, so that the test device also comprises a lower probe row bracket; the lower probe row is similar to the upper probe row in structure and is magnetically connected with the lower probe row support through a fixing block; the probes of the lower probe row are opposite to the probes of the upper probe row.

The utility model discloses a can be by the magnetic force support of on-off control magnetic force, the switch is in normally open state during normal test, and the probe is arranged and is tightly adsorbed on probe row support through both ends fixed block (the material can be adsorbed by magnet for steel etc.), if will arrange the position to the probe and adjust, as long as close the switch, the magnetic force on the probe row support disappears, just can adjust probe row position at will.

In order to further explain the present invention, the following detailed description is made in conjunction with the embodiments of the present invention for a probe testing device of a solar cell.

As shown in fig. 1 and 2, the switch-type magnetic support is a support capable of controlling magnetic force through a switch, and is used for contacting with fixing blocks at two sides of the probe row to fix the position of the probe row. The fixed blocks at the two ends of the probe row play a role in connecting the probe row with the switch-type magnetic support, and are made of steel or other substances capable of being adsorbed by magnets (5 fixed blocks of the probe row are arranged in the figure, and each fixed block corresponds to one probe row respectively). When the position of the probe bar needs to be adjusted, a switch on the probe bar support is closed, the magnetic force of the switch type magnetic support disappears, and the fixed blocks at the two ends of the probe bar are separated from the probe bar support, so that the position of the probe bar can be adjusted; after the adjustment is finished, a switch on the probe row support is turned on, the probe row support recovers magnetism, the fixed blocks at the two ends of the probe row and the probe row support are adsorbed together again, and then the position of the probe row can be fixed.

The specific operation process is as follows:

1) selecting a probe row according to the number of main grids of the battery piece to be tested;

2) arranging probes with fixing blocks on the probe row fixing support, and adjusting the positions of the probe rows according to the positions of the main grids of the battery pieces;

3) after the position of the probe row is determined, a switch on a probe row support is turned on, the probe row support has magnetic force, and fixed blocks at two ends of the probe row and the fixed supports at the corresponding positions are tightly adsorbed together through the magnetic force;

4) whether the position of the probe row and the position of the main grid of the battery piece have deviation or not is checked through testing, if fine adjustment is needed, a switch located on a probe row support is turned off, magnetic force on the probe row support disappears, the fixing block is separated from the probe row support, the position of the probe row can be adjusted randomly according to needs, the switch is turned on after adjustment, the probe row support obtains magnetic force again, the fixing blocks at the two ends of the probe row and the probe row support are adsorbed together, and then the position of the probe row is fixed.

Claims

1. The utility model provides a probe testing arrangement of solar wafer which characterized in that includes:

a magnetic support and a probe row;

fixed blocks are arranged at two ends of the probe row;

2. The probe testing device of claim 1, wherein the magnetic mount is a switch-mode magnetic mount.

3. The probe test apparatus of claim 2, wherein one end of the probe bank holder is connected to a support bar; the other end is provided with a control switch which controls the directions of two poles of the magnet in the probe row bracket.

4. The probe test apparatus of claim 2, wherein the probe bank holder is provided with a plurality of control switches.

5. The probe testing device of claim 1, wherein the base is a soft magnetic base.

6. The probe test device according to claim 1, wherein a groove is provided on the fixing block; the shape of the groove is matched with the shape of the cross section of the probe row support.