CN211293154U - Multi-way switch testing device - Google Patents
Multi-way switch testing device Download PDFInfo
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- CN211293154U CN211293154U CN201921880021.1U CN201921880021U CN211293154U CN 211293154 U CN211293154 U CN 211293154U CN 201921880021 U CN201921880021 U CN 201921880021U CN 211293154 U CN211293154 U CN 211293154U
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Abstract
The utility model relates to a multi-way switch testing device; when the pin protection circuit of each pin of a specific chip to be tested is subjected to VDD test, the microcontroller controls the first multi-way switch to enable one output/input end corresponding to the VDD pin of the chip to be tested to be communicated with the public input/output end, and the VDD end of the chip to be tested is grounded; then, the microcontroller controls a plurality of output/input ends of the second multi-way switch to be communicated with a common input/output end in turn, so that the direct current of 2.5V500uA output by the constant voltage circuit and the constant current circuit is input to the chip to be tested through different pins of the chip to be tested, and then the voltage comparison circuit is used for comparing and judging whether the voltage of the direct current of 2.5V500uA output by the constant voltage circuit and the constant current circuit after the direct current is input to the chip to be tested through the VSS end of the chip to be tested is higher than an open-circuit voltage or lower than a short-circuit voltage or not, if the two conditions are not met, the voltage comparison circuit does not output, namely, the tested pin of the chip to be.
Description
Technical Field
The utility model relates to an integrated circuit tests technical field, more specifically says, relates to a multi-way switch testing arrangement.
Background
In the IC (Integrated Circuit) Test in the prior art, after the IC is packaged in a packaging factory, the IC is sent to a Test factory, and the Test factory performs a Test by using a large-scale ATE (Automatic Test Equipment). There is a ten-fold rule in the field of IC testing, i.e. the cost for a bad product found in the next process is ten-fold higher than the cost for a bad product found in the previous process. Therefore, if the chip is found to have packaging or processing problems after testing, the chip needs to be fed back to the packaging factory for improvement, thereby causing a drastic increase in the chip modification cost.
In order to reduce the cost and ensure the production quality, packaging factories increasingly pay more attention to finding problems in advance. Therefore, the packaging factory samples the chip in advance before packaging, and tries to solve the problem at the front end. For front-end IC testing in a packaging plant, testing chips for open and short circuits is one of the most important tests. However, for a package factory, it is expensive to test using a large ATE, and most of the other resources in the ATE except for the part for open-short circuit testing are redundant. This results in high cost for the packaging plant to test the IC using ATE, and most of the functions of ATE are wasted.
SUMMERY OF THE UTILITY MODEL
The to-be-solved technical problem of the utility model lies in, to the above-mentioned defect of prior art, provide a circuit simply, with low costs, small multi-way switch testing arrangement.
The utility model provides a technical scheme that its technical problem adopted is:
constructing a multi-path switch testing device, which comprises a chip to be tested with a pin protection circuit, a first multi-path switch, a second multi-path switch, a microcontroller, a constant voltage circuit, a constant current circuit and a voltage comparison circuit; the output/input ends of the first multi-way switch are correspondingly connected with the output/input ends of the second multi-way switch one by one and are also connected with the pins of the chip to be tested one by one;
the constant voltage circuit is connected with a power supply and used for outputting 2.5V direct current, the constant current circuit is connected with the constant voltage circuit and used for outputting 500uA current, and the constant current circuit is also connected with the voltage comparison circuit and a common input/output end of the second multi-way switch; the common input/output end of the first multi-way switch is grounded;
the output end of the voltage comparison circuit is connected with the microcontroller, a plurality of I/O ends of the microcontroller are connected with a plurality of address ends and forbidden ends of the first multi-way switch in a one-to-one mode, and a plurality of I/O ends of the microcontroller are also connected with a plurality of address ends and forbidden ends of the second multi-way switch in a one-to-one mode;
the multi-way switch testing device also comprises a state display circuit, wherein the state display circuit is used for displaying whether the pin protection circuit of each pin of the chip to be tested is normal or not.
The utility model discloses a multi-way switch testing arrangement, wherein, the constant voltage circuit is three-terminal stabilivolt, the IN end of three-terminal stabilivolt is connected with the positive pole of power, the ADJ end ground connection of three-terminal stabilivolt, the OUT end of three-terminal stabilivolt respectively with constant current circuit and voltage comparison circuit connection; the IN end and the ADJ end of the three-end voltage-stabilizing tube are connected IN parallel with a first capacitor, and the OUT end and the ADJ end of the three-end voltage-stabilizing tube are connected IN parallel with a second capacitor.
The utility model discloses a multi-way switch testing arrangement, wherein, constant current circuit includes first resistance, second resistance, third resistance and first triode and second triode; the first resistor and the second resistor are both connected with the OUT end of the three-end voltage-regulator tube; the other end of the first resistor is connected with an emitting electrode of the first triode, the other end of the second resistor is connected with an emitting electrode of the second triode, a base electrode of the first triode is connected with a base electrode of the second triode, the emitting electrode of the first triode is connected with the third resistor, and the other end of the third resistor is grounded; and the collector of the second triode is respectively connected with the voltage comparison circuit and the common input/output end of the second multi-way switch.
The utility model discloses a multi-way switch testing arrangement, wherein, voltage comparison circuit includes first voltage comparator and second voltage comparator; the reverse input end of the first voltage comparator is connected with a fourth resistor and a fifth resistor, the other end of the fourth resistor is connected with the OUT end of the three-terminal voltage regulator tube, and the other end of the fifth resistor is grounded; the same-direction input end of the second voltage comparator is connected with a sixth resistor and a seventh resistor, the other end of the sixth resistor is connected with the OUT end of the three-terminal voltage regulator tube, and the other end of the seventh resistor is grounded; the same-direction input end of the first voltage comparator is connected with the reverse-direction input end of the second voltage comparator and is also connected with the collector electrode of the second triode;
the output end of the first voltage comparator is connected with a first diode, and the anode of the first diode is connected with the output end of the first voltage comparator; the output end of the second voltage comparator is connected with a second diode, and the anode of the second diode is connected with the output end of the second voltage comparator; the negative electrode of the first diode is connected with the negative electrode of the second diode and is also connected with an eighth resistor, the other end of the eighth resistor is connected with a third triode, and the base electrode of the third triode is connected with the other end of the eighth resistor; a collector of the third triode is connected with a ninth resistor, the other end of the ninth resistor is connected with the anode of the power supply, and an emitter of the third triode is grounded; and the collector electrode of the third triode is connected with the P1.7 end of the microcontroller.
The utility model discloses a multi-way switch testing arrangement, wherein, state display circuit includes first emitting diode and second emitting diode; the anode of the first light-emitting diode is connected with the anode of the second light-emitting diode and is also connected with a tenth resistor, and the other end of the tenth resistor is connected with the anode of the power supply; the cathode of the first light emitting diode is connected with the P1.7 end of the microcontroller, and the cathode of the second light emitting diode is connected with the P1.6 end of the microcontroller.
Multi-way switch testing arrangement, wherein, multi-way switch testing arrangement still includes the mode and sets up the circuit, the mode set up the circuit with microcontroller connects and is used for control one or more output/input end and public input/output end of first multi-way switch or break off and control one or more output/input end and public input/output end of second multi-way switch or break off.
The beneficial effects of the utility model reside in that: when the pin protection circuit of each pin of a specific chip to be tested is subjected to VDD test, the microcontroller controls the first multi-way switch to enable one output/input end corresponding to the VDD pin of the chip to be tested to be communicated with the public input/output end, and the VDD end of the chip to be tested is grounded; then, the microcontroller controls a plurality of output/input ends of a second multi-way switch to be communicated with a common input/output end in turn, so that the direct current of 2.5V500uA output by the constant voltage circuit and the constant current circuit is input to a chip to be tested through pins of different chips to be tested, wherein two output/input ends, corresponding to a VDD end and a VSS end of the chip to be tested, of the second multi-way switch are forbidden to be communicated with the common input/output end, and the test is meaningless after the second multi-way switch is conducted;
then, a voltage comparison circuit is used for comparing and judging whether the voltage of the 2.5V500uA direct current output by a constant voltage circuit and a constant current circuit after being input to a chip to be detected through different pins of the chip to be detected is higher than an open-circuit voltage or lower than a short-circuit voltage, if one condition is met, the voltage comparison circuit outputs an alarm signal to a microcontroller, namely, the detected pin of the chip to be detected has an open-circuit fault or a short-circuit fault, the microcontroller controls a state display circuit to display the pin fault, if the two conditions are not met, the voltage comparison circuit does not output, namely, the detected pin of the chip to be detected is normal, and the microcontroller controls the state display circuit to display the pin normal;
when a pin protection circuit of each pin of a specific chip to be tested is subjected to VSS test, the difference is that the direct current of 2.5V500uA output by a constant voltage circuit and a constant current circuit is input to the chip to be tested through a VSS end of the chip to be tested by a second multi-path switch, a plurality of output/input ends of a first multi-path switch are communicated with a common input/output end in turn, namely a plurality of pins of the chip to be tested are grounded in turn, wherein the VDD end of the chip to be tested is continuously grounded;
then, a voltage comparison circuit is used for comparing and judging whether the voltage of the 2.5V500uA direct current output by a constant voltage circuit and a constant current circuit after being input to a chip to be detected through a VSS end of the chip to be detected is higher than an open-circuit voltage or lower than a short-circuit voltage, if one condition is met, the voltage comparison circuit outputs an alarm signal to a microcontroller, namely, a detected pin of the chip to be detected has an open-circuit or short-circuit fault, the microcontroller controls a state display circuit to display the pin fault, if the two conditions are not met, the voltage comparison circuit does not output, namely, the detected pin of the chip to be detected is normal, and the microcontroller controls the state display circuit to display the pin normally;
the test data of each pin of the chip to be tested is preset in the microcontroller to realize automatic test, or can be manually controlled through a mode setting circuit to achieve the purpose of detecting the chip to be tested; the circuit is simple, low in cost, small in size, convenient to use and wide in applicability.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the present invention will be further described below with reference to the accompanying drawings and embodiments, wherein the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained without inventive work according to the drawings:
fig. 1 is a circuit diagram of a multi-way switch testing device according to a preferred embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, a clear and complete description will be given below with reference to the technical solutions of the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by a person of ordinary skill in the art without creative efforts belong to the protection scope of the present invention.
The multi-way switch testing device of the preferred embodiment of the present invention is shown in fig. 1; the circuit comprises a chip (not shown) or an integrated circuit (not shown) to be tested with a pin protection circuit, a first multi-way switch U3, a second multi-way switch U4, a microcontroller U6, a constant voltage circuit 10, a constant current circuit 20 and a voltage comparison circuit 30; a plurality of output/input ends of the first multi-way switch U3 are correspondingly connected with a plurality of output/input ends of the second multi-way switch U4 in a one-to-one manner and are also connected with a plurality of pins of a chip to be tested in a one-to-one manner; the pin protection circuit is known to be formed by two diodes connected in series through common knowledge, wherein the anode of a first diode is connected with the cathode of a second diode, and a node is connected with a pin of a chip to be tested (not shown in the figure), the cathode of the first diode is connected with a VDD terminal, and the anode of the second diode is connected with a VSS terminal; the voltage drop of the diode is generally about 0.7V;
the constant voltage circuit 10 is connected with a power supply and used for outputting 2.5V direct current, the constant current circuit 20 is connected with the constant voltage circuit 10 and used for outputting 500uA current, and the constant current circuit 20 is also connected with the voltage comparison circuit 30 and a common input/output end of a second multi-way switch U4; the common input/output end of the first multi-way switch U3 is grounded;
the output end of the voltage comparison circuit 30 is connected with a microcontroller U6, a plurality of I/O ends of the microcontroller U6 are connected with a plurality of address ends and forbidden ends of a first multi-way switch U3 in a one-to-one mode, and a plurality of I/O ends of the microcontroller U6 are also connected with a plurality of address ends and forbidden ends of a second multi-way switch U4 in a one-to-one mode;
the multi-way switch testing device also comprises a state display circuit 40, wherein the state display circuit 40 is used for displaying whether the pin protection circuit of each pin of the chip to be tested is normal or not;
when the pin protection circuit of each pin of a specific chip to be tested is subjected to VDD test, the microcontroller U6 controls the first multi-way switch U3 to enable one output/input end corresponding to the VDD pin of the chip to be tested to be communicated with a common input/output end, and the VDD end of the chip to be tested is grounded; then, the microcontroller U6 controls a plurality of output/input ends of the second multi-way switch U4 to be communicated with a common input/output end in turn, so that the direct current of 2.5V500uA output by the constant voltage circuit 10 and the constant current circuit 20 is input to the chip to be tested through different pins of the chip to be tested, wherein two output/input ends corresponding to the VDD end and the VSS end of the chip to be tested and the second multi-way switch U4 are forbidden to be communicated with the common input/output end, that is, the test is meaningless after the second multi-way switch U4 is conducted;
then, the voltage comparison circuit 30 compares and judges whether the voltage of the 2.5V500uA direct current output by the constant voltage circuit 10 and the constant current circuit 20 after being input to the chip to be tested through different pins of the chip to be tested is higher than an open-circuit voltage (1.5V) or lower than a short-circuit voltage (0.2V), if one condition is met, the voltage comparison circuit 30 outputs an alarm signal to the microcontroller U6, namely, the tested pin of the chip to be tested has an open-circuit fault or a short-circuit fault, the microcontroller U6 controls the state display circuit 40 to display the pin fault, if the two conditions are not met, the voltage comparison circuit 30 does not output, namely, the tested pin of the chip to be tested is normal, and the microcontroller U6 controls the state display circuit 40 to display the pin normally;
when a pin protection circuit of each pin of a specific chip to be tested is subjected to VSS test, the difference is that the direct current of 2.5V500uA output by a constant voltage circuit 10 and a constant current circuit 20 is input to the chip to be tested through a VSS end of the chip to be tested by a second multi-way switch U4, a plurality of output/input ends of a first multi-way switch U3 are communicated with a common input/output end in turn, namely, a plurality of pins of the chip to be tested are grounded in turn, wherein the VDD end of the chip to be tested is controlled by a first multi-way switch U3 to be continuously grounded or idle;
then, the voltage comparison circuit 30 is used for comparing and judging whether the voltage of the 2.5V500uA direct current output by the constant voltage circuit 10 and the constant current circuit 20 after being input to the chip to be tested through the VSS end of the chip to be tested is higher than an open-circuit voltage or lower than a short-circuit voltage, if one condition is met, the voltage comparison circuit 30 outputs an alarm signal to the microcontroller U6, namely, the tested pin of the chip to be tested has an open-circuit or short-circuit fault, the microcontroller U6 controls the state display circuit 40 to display the pin fault, if the two conditions are not met, the voltage comparison circuit 30 does not output, namely, the tested pin of the chip to be tested is normal, and the microcontroller U6 controls the state display circuit 40 to display the pin normally;
the test data of each pin of the chip to be tested is preset in the microcontroller to realize automatic test, or the microcontroller U6 can be connected with an external control circuit to realize the detection of the chip to be tested and obtain feedback information (including chip fault information and chip normal information) or manually control the chip to be tested through the mode setting circuit 50; the circuit is simple, low in cost, small in size, convenient to use and wide in applicability.
As shown IN fig. 1, the constant voltage circuit 10 is a three-terminal regulator tube U1, the IN terminal of the three-terminal regulator tube U1 is connected to the positive electrode of the power supply, the ADJ terminal of the three-terminal regulator tube U1 is grounded, and the OUT terminal of the three-terminal regulator tube U1 is connected to the constant current circuit 20 and the voltage comparison circuit 30, respectively; a first capacitor C2 is connected IN parallel between the IN end and the ADJ end of the three-terminal regulator tube U1, and a second capacitor C1 is connected IN parallel between the OUT end and the ADJ end of the three-terminal regulator tube U1; matching that of the voltage comparison circuit 30.
As shown in fig. 1, the constant current circuit 20 includes a first resistor R1, a second resistor R2, a third resistor R3, a first transistor Q2, and a second transistor Q1; the first resistor R1 and the second resistor R2 are both connected with the OUT end of the three-terminal voltage regulator tube U1; the other end of the first resistor R1 is connected with an emitter of a first triode Q2, the other end of the second resistor R2 is connected with an emitter of a second triode Q1, a base of the first triode Q2 is connected with a base of a second triode Q1, an emitter of a first triode Q2 is connected with a third resistor R3, and the other end of the third resistor R3 is grounded; the collector of the second triode Q1 is respectively connected with the voltage comparison circuit 30 and the common input/output end of the second multi-way switch U4; the current of 500uA is output to ensure that no danger occurs when the chip to be tested is short-circuited.
As shown in FIG. 1, the voltage comparison circuit 30 includes a first voltage comparator U2: A and a second voltage comparator U2: B; the reverse input end of the first voltage comparator U2A is connected with a fourth resistor R9 and a fifth resistor R5, the other end of the fourth resistor R9 is connected with the OUT end of a three-terminal voltage regulator tube U1, and the other end of the fifth resistor R5 is grounded; the same-direction input end of a second voltage comparator U2, B is connected with a sixth resistor R10 and a seventh resistor R6, the other end of the sixth resistor R10 is connected with the OUT end of a three-terminal voltage regulator tube U1, and the other end of the seventh resistor R6 is grounded; the same-direction input end of the first voltage comparator U2: A is connected with the reverse-direction input end of the second voltage comparator U2: B and is also connected with the collector electrode of a second triode Q1; so that the reverse input end of the first voltage comparator U2: A obtains 1.5V voltage, and the same-direction input end of the second voltage comparator U2: B obtains 0.2V voltage; the 2.5V direct current output by the constant voltage circuit 10 is compared with the reference after being input to the chip to be tested;
the output end of the first voltage comparator U2A is connected with a first diode D1, and the anode of the first diode D1 is connected with the output end of the first voltage comparator U2A; the output end of the second voltage comparator U2: B is connected with a second diode D2, and the anode of the second diode D2 is connected with the output end of the second voltage comparator U2: B; the negative electrode of the first diode D1 is connected with the negative electrode of the second diode D2 and is also connected with an eighth resistor R12, the other end of the eighth resistor R12 is connected with a third triode Q3, and the base electrode of the third triode Q3 is connected with the other end of the eighth resistor R12; a collector of the third triode Q3 is connected with a ninth resistor R15, the other end of the ninth resistor R15 is connected with the positive electrode of the power supply, and an emitter of the third triode Q3 is grounded; the collector of the third triode Q3 is connected with the P1.7 end of the microcontroller U6; the circuit is simple, the cost is low, and the requirement of the microcontroller U6 on high and low level identification is met.
As shown in fig. 1, the state display circuit 40 includes a first light emitting diode D3 and a second light emitting diode D4; the anode of the first light-emitting diode D3 is connected with the anode of the second light-emitting diode D4 and is also connected with a tenth resistor R16, and the other end of the tenth resistor R16 is connected with the anode of a power supply; the cathode of the first light-emitting diode D3 is connected with the P1.7 end of the microcontroller U6, and the cathode of the second light-emitting diode D4 is connected with the P1.6 end of the microcontroller U6; for example; if the pin of the chip to be tested is normal, the first light-emitting diode D3 or the second light-emitting diode D4 is controlled to be normally on, and if the pin of the chip to be tested has a fault (open circuit or short circuit), the first light-emitting diode D3 or the second light-emitting diode D4 is controlled to flicker;
as shown in fig. 1, the multi-way switch testing device further includes a mode setting circuit 50, the mode setting circuit 50 is connected to the microcontroller U6 for controlling one or more input/output terminals of the first multi-way switch U3 to be connected to or disconnected from a common input/output terminal, and controlling one or more input/output terminals of the second multi-way switch U4 to be connected to or disconnected from a common input/output terminal; the mode setting circuit 50 includes 8 point-action switches and 1 knife switch; when the output/input end of the first multi-way switch U3 or the second multi-way switch U4 needs to be continuously communicated with the common input/output end, the inching switch corresponding to the output/input end of the first multi-way switch U3 or the second multi-way switch U4 needs to be pressed for a few seconds in the corresponding knife switch state so as to realize a VDD test or a VSS test; but for example: when the inching switch is triggered under the condition that the knife switch is opened, the output/input end of the inching switch corresponding to the first multi-way switch U3 is communicated with the common input/output end in turn (inching); when the inching switch is triggered under the condition that the knife switch is closed, the output/input ends of the inching switch corresponding to the second multi-way switch U4 are communicated with the common input/output end in turn (inching); the control of a first multi-way switch U3 and a second multi-way switch U4 is realized;
as shown in fig. 1, the switch K1 is used to clear the setting of the mode setting circuit 50 on the microcontroller U6, that is, the mode setting circuit 50 is used to set the pin grounding or the direct current connection of 2.5V300uA corresponding to the chip to be tested in the VDD test or VSS test state, and the switch K1 is turned on to realize clear setting.
It will be understood that modifications and variations can be made by persons skilled in the art in light of the above teachings and all such modifications and variations are considered to be within the scope of the invention as defined by the following claims.
Claims (6)
1. A multi-channel switch testing device comprises a chip to be tested with a pin protection circuit, a first multi-channel switch, a second multi-channel switch, a microcontroller, a constant voltage circuit, a constant current circuit and a voltage comparison circuit; the circuit is characterized in that a plurality of output/input ends of the first multi-way switch are correspondingly connected with a plurality of output/input ends of the second multi-way switch one by one and are also connected with a plurality of pins of the chip to be tested one by one;
the constant voltage circuit is connected with a power supply and used for outputting 2.5V direct current, the constant current circuit is connected with the constant voltage circuit and used for outputting 500uA current, and the constant current circuit is also connected with the voltage comparison circuit and a common input/output end of the second multi-way switch; the common input/output end of the first multi-way switch is grounded;
the output end of the voltage comparison circuit is connected with the microcontroller, a plurality of I/O ends of the microcontroller are connected with a plurality of address ends and forbidden ends of the first multi-way switch in a one-to-one mode, and a plurality of I/O ends of the microcontroller are also connected with a plurality of address ends and forbidden ends of the second multi-way switch in a one-to-one mode; the microcontroller is used for controlling the work of the first multi-way switch and the second multi-way switch;
the multi-way switch testing device also comprises a state display circuit, wherein the state display circuit is used for displaying whether the pin protection circuit of each pin of the chip to be tested is normal or not.
2. The multi-channel switch testing device according to claim 1, wherein the constant voltage circuit is a three-terminal regulator tube, an IN terminal of the three-terminal regulator tube is connected with a positive electrode of the power supply, an ADJ terminal of the three-terminal regulator tube is grounded, and an OUT terminal of the three-terminal regulator tube is respectively connected with the constant current circuit and the voltage comparison circuit; the IN end and the ADJ end of the three-end voltage-stabilizing tube are connected IN parallel with a first capacitor, and the OUT end and the ADJ end of the three-end voltage-stabilizing tube are connected IN parallel with a second capacitor.
3. The multi-way switch testing device as claimed in claim 2, wherein the constant current circuit comprises a first resistor, a second resistor, a third resistor, a first triode and a second triode; the first resistor and the second resistor are both connected with the OUT end of the three-end voltage-regulator tube; the other end of the first resistor is connected with an emitting electrode of the first triode, the other end of the second resistor is connected with an emitting electrode of the second triode, a base electrode of the first triode is connected with a base electrode of the second triode, the emitting electrode of the first triode is connected with the third resistor, and the other end of the third resistor is grounded; and the collector of the second triode is respectively connected with the voltage comparison circuit and the common input/output end of the second multi-way switch.
4. The multi-way switch test device of claim 3, wherein the voltage comparison circuit comprises a first voltage comparator and a second voltage comparator; the reverse input end of the first voltage comparator is connected with a fourth resistor and a fifth resistor, the other end of the fourth resistor is connected with the OUT end of the three-terminal voltage regulator tube, and the other end of the fifth resistor is grounded; the same-direction input end of the second voltage comparator is connected with a sixth resistor and a seventh resistor, the other end of the sixth resistor is connected with the OUT end of the three-terminal voltage regulator tube, and the other end of the seventh resistor is grounded; the same-direction input end of the first voltage comparator is connected with the reverse-direction input end of the second voltage comparator and is also connected with the collector electrode of the second triode;
the output end of the first voltage comparator is connected with a first diode, and the anode of the first diode is connected with the output end of the first voltage comparator; the output end of the second voltage comparator is connected with a second diode, and the anode of the second diode is connected with the output end of the second voltage comparator; the negative electrode of the first diode is connected with the negative electrode of the second diode and is also connected with an eighth resistor, the other end of the eighth resistor is connected with a third triode, and the base electrode of the third triode is connected with the other end of the eighth resistor; a collector of the third triode is connected with a ninth resistor, the other end of the ninth resistor is connected with the anode of the power supply, and an emitter of the third triode is grounded; and the collector electrode of the third triode is connected with the P1.7 end of the microcontroller.
5. The multi-way switch testing device of claim 1, wherein the status display circuit comprises a first light emitting diode and a second light emitting diode; the anode of the first light-emitting diode is connected with the anode of the second light-emitting diode and is also connected with a tenth resistor, and the other end of the tenth resistor is connected with the anode of the power supply; the cathode of the first light emitting diode is connected with the P1.7 end of the microcontroller, and the cathode of the second light emitting diode is connected with the P1.6 end of the microcontroller.
6. The multiswitch test device of claim 1 further comprising a mode setting circuit connected to the microcontroller for controlling one or more of the output/inputs of the first multiswitch to be on or off with a common input/output and for controlling one or more of the output/inputs of the second multiswitch to be on or off with a common input/output.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921880021.1U CN211293154U (en) | 2019-11-04 | 2019-11-04 | Multi-way switch testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921880021.1U CN211293154U (en) | 2019-11-04 | 2019-11-04 | Multi-way switch testing device |
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| Publication Number | Publication Date |
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| CN211293154U true CN211293154U (en) | 2020-08-18 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201921880021.1U Active CN211293154U (en) | 2019-11-04 | 2019-11-04 | Multi-way switch testing device |
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| CN (1) | CN211293154U (en) |
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2019
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