CN211235950U - Clamp used in preparation process of sample for dielectric property test - Google Patents
Clamp used in preparation process of sample for dielectric property test Download PDFInfo
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- CN211235950U CN211235950U CN201922251609.7U CN201922251609U CN211235950U CN 211235950 U CN211235950 U CN 211235950U CN 201922251609 U CN201922251609 U CN 201922251609U CN 211235950 U CN211235950 U CN 211235950U
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Abstract
The utility model discloses an anchor clamps that use in sample preparation process are used in dielectric property test, locate on the pillar and cooperate the splint that press from both sides tight sample with the base including the base that is used for placing the sample, set up pillar and the cover on the base, the pillar sets up a plurality ofly and all pillars and arranges for along circumference. The utility model discloses an anchor clamps that use in the sample preparation process are used in dielectric property test can realize that the clamp of sample is tight fixed, conveniently polishes the sample, improves work efficiency and sample quality.
Description
Technical Field
The utility model belongs to the technical field of general aviation auxiliary assembly, specifically speaking, the utility model relates to an anchor clamps that use in sample preparation process are used in dielectric property test.
Background
The dielectric property of a material refers to the property of exhibiting the accumulation and loss of electrostatic energy under the action of an electric field, and is generally expressed by a dielectric constant and a dielectric loss. The dielectric property plays a crucial role in aviation, military and electronics. In the laboratory method for detecting dielectric properties of solids, the dielectric properties are usually tested by a high-Q cavity method.
But the experiment has higher requirements on the tested sample, the tested sample is a uniform medium, the surface is smooth, tidy and flat, and abnormal magazines and air holes do not exist in the test sample; the non-parallelism of the two principal planes of the sample is required to be not more than 0.01mm, and the non-straightness of the two principal planes of the sample is required to be not more than 0.01 mm. Generally, the samples to be inspected can not meet the requirements, later-stage manual treatment is needed, scratches on some surfaces can be treated by a hand grinding mode, and if the parallelism and the straightness are required to be less than 0.01mm, the success rate is low.
SUMMERY OF THE UTILITY MODEL
The utility model discloses aim at solving one of the technical problem that exists among the prior art at least. Therefore, the utility model provides an anchor clamps that dielectric property test used in with sample preparation process, the purpose improves the sample quality.
In order to realize the purpose, the utility model discloses the technical scheme who takes does: anchor clamps that use in sample preparation process are used in dielectric property test, including the base that is used for placing the sample, set up pillar and the cover on the base and locate the pillar and cooperate the splint of tight sample with the base, the pillar sets up a plurality ofly and all pillars and arranges for along circumference.
Set up on the pillar and be used for right splint carry out spacing sawtooth, the sawtooth sets up a plurality ofly, and all sawteeth are arranged in proper order and are the equidistance distribution for the length direction along the pillar, splint have the through-hole that lets the pillar pass.
The number of the supporting columns is four.
The base with splint are discoid structure and base and splint are coaxial setting.
The utility model discloses an anchor clamps that use in the sample preparation process are used in dielectric property test can realize that the clamp of sample is tight fixed, conveniently polishes the sample, improves work efficiency and sample quality.
Drawings
The description includes the following figures, the contents shown are respectively:
FIG. 1 is a schematic structural diagram of a fixture used in a sample preparation process for dielectric property testing of the present invention;
labeled as: 1. a base; 2. a splint; 3. a pillar; 4. and (4) saw teeth.
Detailed Description
The following detailed description of the embodiments of the present invention will be given with reference to the accompanying drawings, for the purpose of helping those skilled in the art to understand more completely, accurately and deeply the conception and technical solution of the present invention, and to facilitate its implementation.
As shown in FIG. 1, the utility model provides an anchor clamps that use in sample preparation process are used in dielectric property test, locate pillar 3 and the cover on the base 1 and cooperate the splint 2 of tight sample with base 1 including the base 1 that is used for placing the sample, pillar 3 sets up a plurality ofly and all pillars 3 are for arranging along circumference.
Specifically, as shown in fig. 1, the base 1 and the clamping plate 2 are both disc-shaped structures, the base 1 and the clamping plate 2 are coaxially arranged, the diameter of the base 1 is larger than that of the clamping plate 2, the length direction of the support 3 is parallel to the axis of the base 1, all the supports 3 are uniformly distributed along the circumferential direction by taking the axis of the base 1 as a central line, and one end of each support 3 is fixedly connected with the base 1.
As shown in fig. 1, as preferred, set up on the pillar 3 and be used for carrying out spacing sawtooth 4 to splint 2, sawtooth 4 sets up a plurality ofly, and all sawtooth 4 are for arranging in proper order and for the equidistance distribution along the length direction of pillar 3, and splint 2 has the through-hole that lets pillar 3 pass, sets up the draw-in groove that lets sawtooth 4 embedding on the internal face of through-hole, and the through-hole sets up a plurality ofly and all through-holes are along circumference evenly distributed with splint 2's axis as the central line on splint 2. Each pillar 3 passes a through-hole on a splint 2 respectively, and the sawtooth 4 on the pillar 3 imbeds in the draw-in groove in the through-hole, makes splint 2 and base 1 keep relatively fixed, and then can cooperate with base 1 and press from both sides tight sample for dielectric property test.
As shown in fig. 1, in the present embodiment, the pillars 3 are provided in total of four.
The invention has been described above by way of example with reference to the accompanying drawings. Obviously, the specific implementation of the present invention is not limited by the above-described manner. Various insubstantial improvements are made by adopting the method conception and the technical proposal of the utility model; or without improvement, the above conception and technical solution of the present invention can be directly applied to other occasions, all within the protection scope of the present invention.
Claims (4)
1. Anchor clamps that use in sample preparation process are used in dielectric property test, its characterized in that: including the base that is used for placing the sample, set up pillar on the base and the cover locate the pillar and cooperate the splint that press from both sides tight sample with the base, the pillar sets up a plurality ofly and all pillars are for arranging along circumference.
2. The jig used in the preparation of the sample for dielectric property test according to claim 1, wherein: set up on the pillar and be used for right splint carry out spacing sawtooth, the sawtooth sets up a plurality ofly, and all sawteeth are arranged in proper order and are the equidistance distribution for the length direction along the pillar, splint have the through-hole that lets the pillar pass.
3. The jig used in the preparation of the sample for dielectric property test according to claim 1 or 2, wherein: the number of the supporting columns is four.
4. The jig used in the preparation of the sample for dielectric property test according to claim 1 or 2, wherein: the base with splint are discoid structure and base and splint are coaxial setting.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201922251609.7U CN211235950U (en) | 2019-12-16 | 2019-12-16 | Clamp used in preparation process of sample for dielectric property test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201922251609.7U CN211235950U (en) | 2019-12-16 | 2019-12-16 | Clamp used in preparation process of sample for dielectric property test |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN211235950U true CN211235950U (en) | 2020-08-11 |
Family
ID=71919456
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201922251609.7U Active CN211235950U (en) | 2019-12-16 | 2019-12-16 | Clamp used in preparation process of sample for dielectric property test |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN211235950U (en) |
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2019
- 2019-12-16 CN CN201922251609.7U patent/CN211235950U/en active Active
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