CN211180031U - Test system and frequency hopping filter test device - Google Patents

Test system and frequency hopping filter test device Download PDF

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Publication number
CN211180031U
CN211180031U CN201921622930.5U CN201921622930U CN211180031U CN 211180031 U CN211180031 U CN 211180031U CN 201921622930 U CN201921622930 U CN 201921622930U CN 211180031 U CN211180031 U CN 211180031U
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capacitor
pin
electrically connected
control chip
resistor
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陶有红
王靖
黄月亮
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Hefei Powersky Electronic Technology Co ltd
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Hefei Powersky Electronic Technology Co ltd
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Abstract

The utility model discloses a test system, including voltage regulating module, voltage stabilizing module, microcontroller module, burn mouth, L ED circuit, interface module, voltage regulating module and voltage stabilizing module's input electric connection, voltage regulating module still links to each other with external power supply circuit, voltage stabilizing module's output respectively with L ED circuit module, microcontroller module electric connection, microcontroller module still with burn mouthful electric connection, interface module still respectively with PC port, microcontroller module, frock device electric connection the utility model also discloses a frequency hopping filter testing arrangement, the utility model discloses a test system can prestore debugging information, and power module provides stable voltage for test system and frequency hopping filter respectively, and voltage regulating module and voltage stabilizing module among the test system can realize changing the voltage height to output stable voltage, thereby overcome the unstable problem that leads to the test result unsafe.

Description

Test system and frequency hopping filter test device
Technical Field
The utility model relates to the field of communication technology, especially, relate to a test system and frequency hopping filter testing arrangement.
Background
In the research and development stage, the frequency hopping filter needs a set of planning and systematized test system, so that the test of each index of a product is met, and the product development cycle is shortened. Then the existing test system all has the problem of single test index, and the complicated test environment can make the supply voltage unstable, leading to the problems of inconvenient debugging, inaccurate test result, etc.
The utility model discloses a utility model patent of application number "CN201420844019. X" discloses a test system of wave filter, this test system includes network analyzer, the debugging computer of being connected with network analyzer and with two at least displays of debugging computer connection, wherein network analyzer includes two at least debugging port groups, a filter is awaited measuring to every debugging port group link, the debugging computer distinguishes the actual measurement data of the wave filter that awaits measuring according to different debugging port groups with network analyzer, and show on the debugging interface of the display of difference. However, when the patent scheme is used, because the supply voltage may be unstable, the test result is inaccurate, and the popularization and the use cannot be realized.
SUMMERY OF THE UTILITY MODEL
The utility model aims to solve the technical problem that a test system and frequency hopping filter testing arrangement are provided to solve the unsafe problem of test result.
The utility model discloses a following technical means realizes solving above-mentioned technical problem:
a test system comprises a voltage regulating module, a voltage stabilizing module, a microcontroller module, a burning port, an L ED circuit and an interface module, wherein the voltage regulating module is electrically connected with the input end of the voltage stabilizing module, the voltage regulating module is also connected with an external power supply circuit, the output end of the voltage stabilizing module is respectively electrically connected with a L ED circuit module and the microcontroller module, the microcontroller module is also electrically connected with the burning port, and the interface module is also respectively electrically connected with an external PC port, the microcontroller module and an external tool device;
the voltage regulating module comprises a low-voltage output circuit and a high-voltage output circuit, and the high-voltage output circuit is connected with the low-voltage output circuit in parallel.
The power supply is supplied to the voltage regulating module through the external power circuit, the voltage regulating module is used for outputting required working voltage according to working requirements, the voltage stabilizing module is used for stabilizing and filtering the working voltage, the PC end inputs a test instruction to the microcontroller module through the interface module, and the L ED circuit is used for displaying whether the working state is correct or not.
As a further scheme of the utility model, the low-voltage output circuit comprises a resistor R2, a resistor R3, a resistor R4, a diode D1, a diode D2, a diode D3, an inductor L1, a capacitor C10, a capacitor C11, a capacitor C12, a capacitor C13 and a main control chip U1, wherein,
the anode of the diode D3 is electrically connected with one end of a capacitor C12, the anode of the diode D3 is grounded, the other end of the capacitor C12 is electrically connected with the anode of a diode D2, the cathode of the diode D2 is electrically connected with the 1 st pin of a main control chip U1, the capacitor C12 is also connected with the capacitor C13 IN parallel, the anode of the diode D2 is connected with an external power supply through an IN port, and the voltage provided by the power supply can be determined according to actual working requirements;
the negative electrode of the diode D1 is grounded, the positive electrode of the diode D1 is electrically connected with one end of a resistor R2, the other end of the resistor R2 is electrically connected with one end of a capacitor C10, and is also electrically connected with one end of a resistor R4 and a controllable end of a resistor R4, one end of the capacitor C10 connected with the resistor R2 outputs a first voltage VCC1, the capacitor C10 is electrically connected with a 5 th pin of a main control chip U1 and is grounded, the other end of the resistor R4 is electrically connected with one end of a resistor R3 and a 4 th pin of the main control chip U1, the other end of the resistor R3 is grounded and is electrically connected with one end of a capacitor C11, a 3 rd pin and a 0 th pin of the main control chip U1, the other end of the capacitor C11 is electrically connected with one end of an inductor L1 and the controllable end of a resistor R4, and the other end of the inductor L1 is electrically connected with a 2 nd pin of the main control chip U1 and the negative electrode of the diode D3.
As a further aspect of the present invention: the high-voltage output circuit comprises a resistor R6, a resistor R7, a resistor R8, a resistor R9, a capacitor C18, a capacitor C19, a capacitor C7, a main control chip U2, a transformer T1 and a diode D6, wherein the transformer T1 comprises a main side coil T11 and a secondary side coil T12;
one end of the resistor R9 is electrically connected with the voltage regulating circuit, the other end of the resistor R9 is connected with one end of the resistor R8, the other end of the resistor R8 is grounded, one end of the resistor R9, which is connected with the resistor R8, is also electrically connected with the 2 nd pin of the main control chip U2, the 1 st pin of the main control chip U2 is grounded, the 4 th pin of the main control chip U2 is connected with one end of the capacitor C7 and is also electrically connected with an external power supply through the input end, and the other end of the capacitor C7 is grounded;
the dotted terminal of the primary side coil T11 is electrically connected to the 4 th pin of the main control chip U2, the dotted terminal of the primary side coil T11 is electrically connected to the 3 rd pin of the main control chip U2, the dotted terminal of the secondary side coil T12 is electrically connected to the anode of the diode D6, the dotted terminal of the secondary side coil T12 is grounded, the cathode of the diode D6 is electrically connected to one terminal of the resistor R7 and to the controllable terminal of the resistor R7, the other terminal of the resistor R7 is electrically connected to the 5 th pin of the main control chip U2, the 5 th pin of the main control chip U2 is also electrically connected to one terminal of the resistor R6, the other terminal of the resistor R6 is electrically connected to the 1 st pin of the main control chip U2, the one terminal of the resistor R6 connected to the 1 st pin of the main control chip U2 is also electrically connected to one terminal of the capacitor C19, the other terminal of the capacitor C19 is connected to the cathode of the diode D6, and the capacitor C18, and the end of the capacitor 19 connected with the cathode of the diode D6 outputs high voltage.
As a further aspect of the present invention: the voltage stabilizing module comprises a capacitor C14, a capacitor C15, a capacitor C16, a capacitor C17, a main control chip U3 and a connecting piece, wherein one end of the capacitor C14 is connected with a first voltage VCC1 and is electrically connected with the 3 rd pin of the main control chip U3, the other end of the capacitor C14 is connected with the 1 st pin of the main control chip U3, the capacitor C15 is connected with the capacitor C14 in parallel, the 1 st pin of the main control chip U3 is grounded, the 2 nd pin of the main control chip U3 is electrically connected with one end of a capacitor C16, the other end of the capacitor C16 is grounded, the capacitor C16 is connected with the capacitor C17 in parallel, the 2 nd pin of the main control chip U3 is also electrically connected with the 1 st pin of the connecting piece, the 2 nd pin of the main control chip U3 outputs a second voltage VCC2 and is electrically connected with one end of a resistor R9, the 2 nd pin of the connecting piece is grounded, and the.
As a further scheme of the utility model, the microcontroller module comprises a main control chip U4, a UART1, a UART2, a capacitor C1, a capacitor C5, a capacitor C6, a capacitor C8, a reset circuit and a crystal oscillator XTA L1;
the 17 th pin of the main control chip U4 is electrically connected to the 3 rd pin of the UART1, and the 20 th pin of the main control chip U4 is electrically connected to the 2 nd pin of the UART 1; the 1 st pin of the UART1 is grounded, and the 4 th pin is externally connected to a second voltage VCC 2.
The 43 rd pin of the main control chip U4 and the 3 rd pin electric connection of UART2, the 44 th pin of the main control chip U4 and the 2 nd pin electric connection of UART2, the 1 st pin of UART2 is grounded, the 4 th pin of UART2 is all external second voltage VCC 2.
The 12 th pin, the 18 th pin, the 63 th pin, the 47 th pin of the main control chip U4 are grounded, the 31 st, the 19 th, the 64 th, the 48 th pins of the main control chip U4 are all externally connected with a second voltage VCC2, the 32 nd pin of the main control chip U4 is electrically connected with one end of a capacitor C8, and the other end of the capacitor C8 is grounded.
The second voltage VCC2 is further electrically connected to one end of the capacitor C1, and the other end of the capacitor C1 is grounded.
The capacitor C2, the capacitor C3 and the capacitor C4 are further included, and the capacitor C2, the capacitor C3 and the capacitor C4 are all connected in parallel with the capacitor C1.
The second voltage VCC2 is further electrically connected to a reset circuit, the reset circuit includes a resistor R1, a RST1 and a capacitor C9, one end of the resistor R1 is electrically connected to a power supply, the other end of the resistor R1 is electrically connected to a RST1, the other end of the RST1 is grounded, one end of the RST1 connected to the resistor R1 is electrically connected to a 1 st pin of the main control chip U4, and the capacitor C9 is connected to the RST1 in parallel.
The 6 th pin, 54 th pin of master control chip U4 connect respectively at the both ends of crystal oscillator XTA L1, the one end that crystal oscillator XTA L1 links to each other with master control chip 6 th pin still with electric capacity C5's one end electric connection, electric capacity C5's the other end ground connection and with electric capacity C6's one end electric connection, electric capacity C6's the other end connects the one end that crystal oscillator XTA L1 and master control chip 54 th pin link to each other.
The main control chip U4 is also connected with an external PC end through an interface module.
L ED circuit includes a plurality of resistance R5, a plurality of diode D4, wherein, a plurality of resistance R5 is parallelly connected, the external second voltage VCC2 of resistance R5's one end, resistance R5's the other end and diode D5's anodal electric connection, the negative pole and the main control chip U4 electric connection of a plurality of diode, just the negative pole of diode still passes through interface module and external PC end electric connection.
As a further scheme of the utility model, the model of the main control chip U1 is L M2596S chip, the model of the main control chip U2 is X L6009 chip, the model of the main control chip U3 is ASM1117-33 chip, and the model of the main control chip U4 is STM 32F-103.
A frequency hopping filter test device comprises a network analyzer, a frequency hopping filter, a test system, a power module and a PC terminal, wherein,
the network analyzer, the frequency modulation filter and the test system are sequentially and electrically connected, the frequency hopping filter is further electrically connected with the power module, and the test system is further electrically connected with the power module and the PC end respectively.
The testing system can pre-store debugging information, in the working process, the power supply module respectively provides stable voltage for the testing system and the frequency hopping filter, a debugging instruction is input to the testing system through the PC terminal, the testing system retrieves the stored debugging information, driving control tuning voltage is output to the frequency hopping filter, various working modes of the frequency hopping filter are controlled, and indexes of the frequency hopping filter are tested through the network analyzer.
As a further aspect of the present invention: the power supply module comprises a first power supply and a second power supply, wherein the first power supply is a GPC-603D direct current power supply, the second power supply is an ES1-100 and 012 adjustable constant current power supply, and the first power supply and the second power supply can be connected in series.
The utility model has the advantages that:
1. the utility model discloses in, can prestore debugging information among the test system, in the working process, voltage regulating module and voltage stabilizing module can realize changing the voltage height to output stable voltage, thereby overcome the unstable unsafe problem that leads to the test result of voltage.
2. The utility model discloses IN, the power ripple of IN port department can be eliminated to low pressure output circuit's electric capacity C12 and electric capacity C13, and the reverse influence input of voltage of the diode D2 effective prevention output that adds simultaneously improves the output stability of power, and the diode D3 that the output is linked plays the steady voltage effect, through inductance L1 choke suppression output voltage ripple, optimizes output voltage.
3. The utility model discloses among the high voltage output circuit, when providing the high level for main control chip U2's 2 nd pin, main control chip U2's 5 th pin feedback voltage realizes adjusting output high pressure through changing resistance R17 to output high pressure, and then controls the height, according to the actual work needs, can make nimble selection moreover, obtains the high pressure of equidimension not. Simultaneously, transformer T1 can richen the selection of voltage adjustment nature, adds diode D6 direction isolation, prevents that the voltage reversal of output from influencing the input, provides the output stability of voltage to can test different frock device.
4. The utility model relates to an among the frequency hopping filter testing arrangement, power module provides stable voltage for test system and frequency hopping filter respectively, inputs the debugging instruction for test system through the PC end, and test system transfers the debugging information in the storage, gives frequency hopping filter output drive control tuning voltage, controls frequency hopping filter's various working methods, through network analyzer test frequency hopping filter's index
5. In the testing device of the frequency hopping filter, the testing system can call the stored debugging information according to the high and low levels corresponding to the capacitance matrix switch corresponding to the frequency point of the frequency hopping filter, and can test various indexes of the frequency hopping filter, such as insertion loss and power consumption, systematically and automatically; the influence of all factors on the system is taken into consideration in the test process, the tested data are more accurate, reliable support is provided for the optimized debugging of the product, and the product development period is greatly shortened.
Drawings
Fig. 1 is a block diagram of the system of the present invention.
Fig. 2 is a system block diagram of the testing system of the present invention.
Fig. 3 is a schematic diagram of a low voltage output circuit according to the present invention.
Fig. 4 is a schematic diagram of a high voltage output circuit according to the present invention.
Fig. 5 is a schematic diagram of a voltage stabilizing circuit according to the present invention.
Fig. 6 is a schematic diagram of a control circuit according to the present invention.
Fig. 7 is a schematic diagram of a reset circuit according to the present invention.
Fig. 8 is a schematic diagram of an L ED circuit according to the present invention.
Detailed Description
To make the purpose, technical solution and advantages of the embodiments of the present invention clearer, the embodiments of the present invention are combined to clearly and completely describe the technical solution in the embodiments of the present invention, and obviously, the described embodiments are some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.
Example 1
As shown in FIG. 2, FIG. 2 is the system block diagram of the testing system of the present invention, a testing system, which comprises a voltage regulating module, a voltage stabilizing module, a microcontroller module, a burning port, L ED circuit, and an interface module, wherein the voltage regulating module is electrically connected with the input end of the voltage stabilizing module, the voltage regulating module is further connected with an external power circuit, the output end of the voltage stabilizing module is respectively electrically connected with the L ED circuit module and the microcontroller module, the microcontroller module is further electrically connected with the burning port, and the interface module is further respectively electrically connected with an external PC port, the microcontroller module and an external tooling device.
The power supply is supplied to the voltage regulating module through the external power circuit, the voltage regulating module is used for outputting required working voltage according to working requirements, the voltage stabilizing module is used for stabilizing and filtering the working voltage, the PC end inputs a test instruction to the microcontroller module through the interface module, and the L ED circuit is used for displaying whether the working state is correct or not, so that the detection of the tooling device is realized.
Preferably, in this embodiment, the interface module is an F L ASH data read-write interface.
Further, in this embodiment, the voltage regulation module includes a low voltage output circuit and a high voltage output circuit, and the high voltage output circuit is connected in parallel with the low voltage output circuit;
referring to fig. 3, fig. 3 is a schematic diagram of a low voltage output circuit in the present invention, wherein the low voltage output circuit includes a resistor R2, a resistor R3, a resistor R4, a diode D1, a diode D2, a diode D3, an inductor L1, a capacitor C10, a capacitor C11, a capacitor C12, a capacitor C13, and a main control chip U1,
the positive electrode of the diode D3 is electrically connected with one end of the capacitor C12, the positive electrode of the diode D3 is grounded, the other end of the capacitor C12 is electrically connected with the positive electrode of the diode D2, the negative electrode of the diode D2 is electrically connected with the 1 st pin of the main control chip U1, the capacitor C12 is further connected IN parallel with the capacitor C13, the positive electrode of the diode D2 is connected with an external power supply through an IN port, the voltage provided by the power supply can be determined according to actual working requirements, and the voltage provided IN the embodiment is between 5V and 36V;
the negative electrode of the diode D1 is grounded, the positive electrode of the diode D1 is electrically connected with one end of a resistor R2, the other end of the resistor R2 is electrically connected with one end of a capacitor C10, and is also electrically connected with one end of a resistor R4 and a controllable end of a resistor R4, one end of the capacitor C10 connected with the resistor R2 outputs a first voltage VCC1, the capacitor C10 is electrically connected with a 5 th pin of a main control chip U1 and is grounded, the other end of the resistor R4 is electrically connected with one end of a resistor R3 and a 4 th pin of the main control chip U1, the other end of the resistor R3 is grounded and is respectively electrically connected with one end of a capacitor C11, a 3 rd pin and a 0 th pin of the main control chip U1, the other end of the capacitor C11 is respectively electrically connected with one end of an inductor L1 and the controllable end of a resistor R4, the other end of the inductor L1 is electrically connected with a 2 nd pin of the main control chip U1 and the negative electrode of the diode D3;
preferably, in this embodiment, the diode D1 is a light emitting diode, and plays a role in prompting work.
In this embodiment, the model of the main control chip U1 is L M2596S.
IN this embodiment, the capacitor C12 and the capacitor C13 can eliminate power supply ripples at the IN port, the added diode D2 effectively prevents the voltage at the output end from reversely affecting the input end, so as to improve the output stability of the power supply, and the diode D3 linked to the output end plays a role IN stabilizing voltage, so as to suppress output voltage ripples through the choke coil of the inductor L1 and optimize the output voltage.
Referring to fig. 4, fig. 4 is a schematic diagram of a high voltage output circuit according to the present invention; the high-voltage output circuit comprises a resistor R6, a resistor R7, a resistor R8, a resistor R9, a capacitor C18, a capacitor C19, a capacitor C7, a main control chip U2, a transformer T1 and a diode D6, wherein the transformer T1 comprises a main side coil T11 and a secondary side coil T12;
one end of the resistor R9 is electrically connected with the voltage regulating circuit, the other end of the resistor R9 is connected with one end of the resistor R8, the other end of the resistor R8 is grounded, one end of the resistor R9, which is connected with the resistor R8, is also electrically connected with the 2 nd pin of the main control chip U2, the 1 st pin of the main control chip U2 is grounded, the 4 th pin of the main control chip U2 is connected with one end of the capacitor C7 and is also electrically connected with an external power supply through the input end, and the other end of the capacitor C7 is grounded;
the dotted terminal of the primary side coil T11 is electrically connected to the 4 th pin of the main control chip U2, the dotted terminal of the primary side coil T11 is electrically connected to the 3 rd pin of the main control chip U2, the dotted terminal of the secondary side coil T12 is electrically connected to the anode of the diode D6, the dotted terminal of the secondary side coil T12 is grounded, the cathode of the diode D6 is electrically connected to one terminal of the resistor R7 and to the controllable terminal of the resistor R7, the other terminal of the resistor R7 is electrically connected to the 5 th pin of the main control chip U2, the 5 th pin of the main control chip U2 is also electrically connected to one terminal of the resistor R6, the other terminal of the resistor R6 is electrically connected to the 1 st pin of the main control chip U2, the one terminal of the resistor R6 connected to the 1 st pin of the main control chip U2 is also electrically connected to one terminal of the capacitor C19, the other terminal of the capacitor C19 is connected to the cathode of the diode D6, and the capacitor C18, and the capacitor 19 outputs high voltage with one end connected with the cathode of the diode D6 for standby, such as for detecting some tooling devices needing high voltage test, thus the system has wide application range.
In this embodiment, when the first voltage VCC1 is 5V and the second voltage VCC2 is 3.3V, the output high voltage is 138V;
preferably, the model of the main control chip U2 is an X L6009 chip, when a high level is provided to the 2 nd pin of the main control chip U2, the 5 th pin of the main control chip U2 feeds back voltage to output high voltage, and the output high voltage is adjusted by changing the resistor R17, so as to control the height.
Referring to fig. 5, fig. 5 is a schematic diagram of a voltage regulator circuit according to the present invention; further, the voltage stabilizing module includes a capacitor C14, a capacitor C15, a capacitor C16, a capacitor C17, a main control chip U3, and a connecting member, wherein one end of the capacitor C14 is connected to a first voltage VCC1 and is electrically connected to a 3 rd pin of the main control chip U3, the other end of the capacitor C14 is connected to a 1 st pin of the main control chip U3, the capacitor C15 is connected in parallel to the capacitor C14, a 1 st pin of the main control chip U3 is grounded, a 2 nd pin of the main control chip U3 is electrically connected to one end of the capacitor C16, the other end of the capacitor C16 is grounded, the capacitor C16 is connected in parallel to the capacitor C17, a 2 nd pin of the main control chip U3 is also electrically connected to a 1 st pin of the connecting member, a 2 nd pin of the main control chip U3 outputs a second voltage VCC2 and is electrically connected to one end of the resistor R9, a 2 nd pin of the connecting member is grounded, and the terminal.
Preferably, in this embodiment, the connector is a connector terminal of pheennix CONTACT, and the main control chip U3 is ASM 1117-33.
Further, in this embodiment, the microcontroller module includes a control circuit and a reset circuit, and the control circuit is electrically connected to the reset circuit.
Referring to fig. 6, fig. 6 is a schematic diagram of a control circuit according to the present invention; the control circuit includes:
the system comprises a main control chip U4, a UART1 (Asynchronous Receiver Transmitter/Transmitter), a UART2, a capacitor C1, a capacitor C5, a capacitor C6, a capacitor C8 and a crystal oscillator XTA L1, wherein the main control chip U4 is STM32F-103 in the embodiment;
the 17 th pin of the main control chip U4 is electrically connected to the 3 rd pin of the UART1, and the 20 th pin of the main control chip U4 is electrically connected to the 2 nd pin of the UART 1; the 1 st pin of the UART1 is grounded, and the 4 th pin is externally connected to a second voltage VCC 2.
The 43 rd pin of the main control chip U4 and the 3 rd pin electric connection of UART2, the 44 th pin of the main control chip U4 and the 2 nd pin electric connection of UART2, the 1 st pin of UART2 is grounded, the 4 th pin of UART2 is all external second voltage VCC 2.
The 12 th pin, the 18 th pin, the 63 th pin, the 47 th pin of the main control chip U4 are grounded, the 31 st, the 19 th, the 64 th, the 48 th pins of the main control chip U4 are all externally connected with a second voltage VCC2, the 32 nd pin of the main control chip U4 is electrically connected with one end of a capacitor C8, and the other end of the capacitor C8 is grounded.
The second voltage VCC2 is further electrically connected to one end of the capacitor C1, and the other end of the capacitor C1 is grounded.
Furthermore, the capacitor C2, the capacitor C3 and the capacitor C4 are further included, and the capacitor C2, the capacitor C3 and the capacitor C4 are all connected in parallel with the capacitor C1.
The second voltage VCC2 is also electrically connected to the reset circuit.
Referring to fig. 7, fig. 7 is a schematic diagram of a reset circuit according to the present invention; the reset circuit comprises a resistor R1, a RST1 and a capacitor C9, wherein one end of the resistor R1 is electrically connected with a power supply, the other end of the resistor R1 is electrically connected with a RST1, the other end of the RST1 is grounded, one end of the RST1, which is connected with the resistor R1, is electrically connected with a 1 st pin of a main control chip U4, and the capacitor C9 is connected with the RST1 in parallel.
The 6 th pin, 54 th pin of master control chip U4 connect respectively at the both ends of crystal oscillator XTA L1, the one end that crystal oscillator XTA L1 links to each other with master control chip 6 th pin still with electric capacity C5's one end electric connection, electric capacity C5's the other end ground connection and with electric capacity C6's one end electric connection, electric capacity C6's the other end connects the one end that crystal oscillator XTA L1 and master control chip 54 th pin link to each other.
Further, the main control chip U4 is connected to an external PC terminal through an interface module. The main control chip U4 is also electrically connected with a burning port, and the model of the burning port is an SWD burning port.
As shown in fig. 8, fig. 8 is a schematic diagram of an L ED circuit in the present invention, wherein the L ED circuit includes a plurality of resistors R5 and a plurality of diodes D4, wherein the plurality of resistors R5 are connected in parallel, an external second voltage VCC2 at one end of the resistor R5, the other end of the resistor R5 is electrically connected to the anode of the diode D5, the cathodes of the plurality of diodes are electrically connected to the main control chip U4, and the cathodes of the diodes are electrically connected to the external PC terminal through the interface module.
Preferably, in this embodiment, the number of the resistors R5 is 23, the number of the diodes D5 is 23, and the diode D5 is a light emitting diode; and the cathode of each diode D5 is electrically connected to pins 58, 59, 61, 62, 29, 30, 33, 34, 35, 36, 8, 9, 10, 11, 24, 25, 37, 38, 39, 40, 51, 52, 53 of the main control chip U4 in turn.
In the embodiment, an external power circuit supplies power to an L M2596S chip, a L M2596S chip outputs required working voltage according to working requirements, a L M2596S chip is connected with an ASM117-33 chip, the ASM117-33 chip stabilizes and filters the voltage output by an L M2596S chip, a L M2596S chip provides stable direct-current power for a whole tooling device, a PC end inputs a test instruction to an STM32F-103 microcontroller through an F L ASH data read-write interface, and a L ED circuit is used for prompting whether the working state is correct or not.
The working principle is as follows: in the utility model, the external power supply supplies power to the voltage regulating circuit to output voltage, the low voltage output circuit and the high voltage output circuit in the voltage regulating module respectively output a first voltage VCC1 to the voltage stabilizing circuit, and the voltage stabilizing circuit outputs a second voltage VCC2 to supply power to the control module, thereby realizing the detection of the tool device; meanwhile, the high-voltage output circuit can also output high voltage for detection work, the low-voltage output circuit can optimize output, the high-voltage output circuit can output high voltage, and the selectable high-voltage range is large.
Example 2
Referring to fig. 1, fig. 1 is a block diagram of the system of the present invention; a frequency hopping filter test device comprises a network analyzer, a frequency hopping filter, a test system, a power module and a PC terminal, wherein,
the network analyzer, the frequency modulation filter and the test system are sequentially and electrically connected, the frequency hopping filter is further electrically connected with the power module, and the test system is further electrically connected with the power module and the PC end respectively.
The testing system can pre-store debugging information, the power supply module provides stable voltage for the testing system and the frequency hopping filter respectively during working, a debugging instruction is input to the testing system through the PC end, the testing system retrieves the stored debugging information, driving control tuning voltage is output to the frequency hopping filter, various working modes of the frequency hopping filter are controlled, and indexes of the frequency hopping filter are tested through the network analyzer.
Preferably, in this embodiment, the model of the network analyzer is an agilent network analyzer 8714.
Preferably, in this embodiment, the power module includes a first power source and a second power source, the first power source is a GPC-603D dc power source, the second power source is an ES1-100-012 adjustable constant current power source, and the first power source and the second power source can be connected in series.
The working principle is as follows:
the testing system of the utility model can fetch the debugging information in the storage according to the high and low levels corresponding to the capacitance matrix switch corresponding to the frequency point of the frequency hopping filter, and test various indexes of the frequency hopping filter, such as insertion loss and power consumption, and has systematization and automation; the influence of all factors on the system is taken into consideration in the test process, the tested data are more accurate, reliable support is provided for the optimized debugging of the product, and the product development period is greatly shortened.
The above embodiments are only used to illustrate the technical solution of the present invention, and not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not depart from the spirit and scope of the present invention in its corresponding aspects.

Claims (10)

1. A test system is characterized by comprising a voltage regulating module, a voltage stabilizing module, a microcontroller module, a burning port, an L ED circuit and an interface module, wherein the voltage regulating module is electrically connected with the input end of the voltage stabilizing module, the voltage regulating module is also connected with an external power supply circuit, the output end of the voltage stabilizing module is respectively electrically connected with a L ED circuit module and the microcontroller module, the microcontroller module is also electrically connected with the burning port, and the interface module is also respectively electrically connected with an external PC port, the microcontroller module and an external tool device;
the voltage regulating module comprises a low-voltage output circuit and a high-voltage output circuit, and the high-voltage output circuit is connected with the low-voltage output circuit in parallel.
2. The test system of claim 1, wherein the low voltage output circuit comprises a resistor R2, a resistor R3, a resistor R4, a diode D1, a diode D2, a diode D3, an inductor L1, a capacitor C10, a capacitor C11, a capacitor C12, a capacitor C13, and a main control chip U1, wherein,
the LED driving circuit comprises a diode D, a capacitor C, a capacitor R, a resistor R, a diode D and a diode D, wherein the anode of the diode D is electrically connected with one end of the capacitor C, the cathode of the diode D is electrically connected with the anode of the diode D, the cathode of the diode D is electrically connected with a pin 1 of a main control chip U, the capacitor C is electrically connected with one end of the resistor R, the controllable end of the resistor R is electrically connected with one end of the capacitor C and the resistor R, a first voltage VCC is output, the capacitor C is electrically connected with a pin 5 of the main control chip U and is grounded, the other end of the resistor R is simultaneously electrically connected with one end of the resistor R and a pin 4 of the main control chip U, the other end of the resistor R is grounded and is respectively electrically connected with one end of the capacitor C, the main control chip U, the cathode of the controllable end of the inductor R and the diode D2 are electrically connected with the diode D.
3. The test system of claim 1, wherein the high voltage output circuit comprises a resistor R6, a resistor R7, a resistor R8, a resistor R9, a capacitor C18, a capacitor C19, a capacitor C7, a main control chip U2, a transformer T1 and a diode D6, wherein the transformer T1 comprises a primary side coil T11 and a secondary side coil T12, wherein;
one end of the resistor R9 is electrically connected with the voltage regulating circuit, the other end of the resistor R9 is connected with one end of the resistor R8, the other end of the resistor R8 is grounded, one end of the resistor R9, which is connected with the resistor R8, is also electrically connected with the 2 nd pin of the main control chip U2, the 1 st pin of the main control chip U2 is grounded, the 4 th pin of the main control chip U2 is connected with one end of the capacitor C7 and is also electrically connected with an external power supply through the input end, and the other end of the capacitor C7 is grounded;
the dotted terminal of the primary side coil T11 is electrically connected to the 4 th pin of the main control chip U2, the dotted terminal of the primary side coil T11 is electrically connected to the 3 rd pin of the main control chip U2, the dotted terminal of the secondary side coil T12 is electrically connected to the anode of the diode D6, the dotted terminal of the secondary side coil T12 is grounded, the cathode of the diode D6 is electrically connected to one terminal of the resistor R7 and to the controllable terminal of the resistor R7, the other terminal of the resistor R7 is electrically connected to the 5 th pin of the main control chip U2, the 5 th pin of the main control chip U2 is also electrically connected to one terminal of the resistor R6, the other terminal of the resistor R6 is electrically connected to the 1 st pin of the main control chip U2, the one terminal of the resistor R6 connected to the 1 st pin of the main control chip U2 is also electrically connected to one terminal of the capacitor C19, the other terminal of the capacitor C19 is connected to the cathode of the diode D6, and the capacitor C18, and the end of the capacitor 19 connected with the cathode of the diode D6 outputs high voltage.
4. The test system of claim 2, wherein the voltage regulator module comprises a capacitor C14, a capacitor C15, a capacitor C16, a capacitor C17, a main control chip U3 and a connecting piece, one end of the capacitor C14 is connected to a first voltage VCC1 and is electrically connected to the 3 rd pin of the main control chip U3, the other end of the capacitor C14 is connected with the 1 st pin of the main control chip U3, the capacitor C15 is connected with the capacitor C14 in parallel, the 1 st pin of the main control chip U3 is grounded, the 2 nd pin of the main control chip U3 is electrically connected with one end of the capacitor C16, the other end of the capacitor C16 is grounded, the capacitor C16 is connected with the capacitor C17 in parallel, and the 2 nd pin of the main control chip U3 is also electrically connected with the 1 st pin of the connector, the 2 nd pin of the main control chip U3 outputs a second voltage VCC2 and is electrically connected with one end of the resistor R9, and the 2 nd pin of the connector is grounded.
5. The test system of claim 4, wherein the microcontroller module comprises a main control chip U4, a UART1, a UART2, a capacitor C1, a capacitor C5, a capacitor C6, a capacitor C8, a reset circuit, a crystal oscillator XTA L1;
the 17 th pin of the main control chip U4 is electrically connected to the 3 rd pin of the UART1, and the 20 th pin of the main control chip U4 is electrically connected to the 2 nd pin of the UART 1; a 1 st pin of the UART1 is grounded, and a 4 th pin is externally connected with a second voltage VCC 2;
a 43 th pin of the main control chip U4 is electrically connected to a 3 rd pin of the UART2, a 44 th pin of the main control chip U4 is electrically connected to a 2 nd pin of the UART2, a 1 st pin of the UART2 is grounded, and a 4 th pin of the UART2 is externally connected to a second voltage VCC 2;
the 12 th pin, the 18 th pin, the 63 th pin and the 47 th pin of the main control chip U4 are grounded, the pins of the main control chip U4 are all externally connected with a second voltage VCC2, the 32 th pin of the main control chip U4 is electrically connected with one end of a capacitor C8, and the other end of the capacitor C8 is grounded;
the second voltage VCC2 is further electrically connected to one end of a capacitor C1, and the other end of the capacitor C1 is grounded;
the capacitor C2, the capacitor C3 and the capacitor C4 are further included, and the capacitor C2, the capacitor C3 and the capacitor C4 are all connected with the capacitor C1 in parallel; the second voltage VCC2 is also electrically connected to the reset circuit.
6. The test system of claim 5, wherein the reset circuit comprises a resistor R1, a resistor RST1, and a capacitor C9, one end of the resistor R1 is electrically connected to a power supply, the other end of the resistor R1 is electrically connected to a RST1, the other end of the RST1 is grounded, one end of the RST1 connected to the resistor R1 is electrically connected to the 1 st pin of the master control chip U4, and the capacitor C9 is connected in parallel to the RST 1;
the 6 th pin, 54 th pin of master control chip U4 connect respectively at the both ends of crystal oscillator XTA L1, the one end that crystal oscillator XTA L1 and master control chip U4 the 6 th pin link to each other still with electric capacity C5's one end electric connection, the other end ground connection of electric capacity C5 and with electric capacity C6's one end electric connection, the other end of electric capacity C6 connects the one end that crystal oscillator XTA L1 and master control chip 54 th pin link to each other.
7. The test system of any one of claims 5-6, wherein the main control chip U4 is further connected to an external PC terminal through an interface module, and the main control chip U4 is further electrically connected to the programming port.
8. The test system of any one of claims 5 to 6, wherein the L ED circuit comprises a plurality of resistors R5 and a plurality of diodes D4, wherein the plurality of resistors R5 are connected in parallel, an external second voltage VCC2 is provided at one end of the resistor R5, the other end of the resistor R5 is electrically connected to an anode of the diode D5, cathodes of the plurality of diodes are electrically connected to the main control chip U4, and cathodes of the diodes are further electrically connected to an external PC terminal through an interface module.
9. The frequency hopping filter testing device based on the testing system of any one of claims 1 to 8, further comprising a network analyzer, a frequency hopping filter, a power module, and a PC terminal, wherein the network analyzer, the frequency hopping filter, and the testing system are electrically connected in sequence, the frequency hopping filter is further electrically connected to the power module, and the testing system is further electrically connected to the power module and the PC terminal, respectively.
10. The apparatus of claim 9, wherein the power module comprises a first power source and a second power source, and the first power source is connected in series with the second power source.
CN201921622930.5U 2019-09-27 2019-09-27 Test system and frequency hopping filter test device Active CN211180031U (en)

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Application Number Priority Date Filing Date Title
CN201921622930.5U CN211180031U (en) 2019-09-27 2019-09-27 Test system and frequency hopping filter test device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201921622930.5U CN211180031U (en) 2019-09-27 2019-09-27 Test system and frequency hopping filter test device

Publications (1)

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CN211180031U true CN211180031U (en) 2020-08-04

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