CN211125567U - Electron microscope sample fixing device - Google Patents
Electron microscope sample fixing device Download PDFInfo
- Publication number
- CN211125567U CN211125567U CN202020307848.XU CN202020307848U CN211125567U CN 211125567 U CN211125567 U CN 211125567U CN 202020307848 U CN202020307848 U CN 202020307848U CN 211125567 U CN211125567 U CN 211125567U
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- Prior art keywords
- sample
- fixedly connected
- base
- electron microscope
- fixing device
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- 230000007246 mechanism Effects 0.000 claims abstract description 14
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 2
- 229910002804 graphite Inorganic materials 0.000 claims description 2
- 239000010439 graphite Substances 0.000 claims description 2
- 230000006835 compression Effects 0.000 abstract description 5
- 238000007906 compression Methods 0.000 abstract description 5
- 230000002349 favourable effect Effects 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 2
- 238000010894 electron beam technology Methods 0.000 description 2
- 230000001788 irregular Effects 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 238000004626 scanning electron microscopy Methods 0.000 description 1
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- Sampling And Sample Adjustment (AREA)
Abstract
The utility model discloses an electron microscope sample fixing device, which comprises a base, the base upper end fixedly connected with fixed block, the fixed block is kept away from the one end fixedly connected with electric telescopic handle of base, electric telescopic handle's output fixedly connected with sample plate, sample plate keeps away from the terminal surface of base and has seted up a plurality of mutually perpendicular's T-shaped groove, the T-shaped groove includes horizontal spout and vertical guide rail, be provided with a plurality of hold-down mechanism that are used for compressing tightly the sample in the horizontal spout, the utility model discloses be provided with hold-down mechanism, when compressing tightly firm, can install loading and unloading fast, convenient and work efficiency is high; the multiple pressing mechanisms can clamp multiple samples simultaneously; many mutually perpendicular's T-shaped groove makes things convenient for the nimble removal of sample, is favorable to the firm of sample centre gripping, the utility model discloses still be provided with height adjusting part, come the length of adjusting spring compression through rotating the clamp plate card, realize the sample clamping of co-altitude.
Description
Technical Field
The utility model relates to a fixing device technical field specifically is an electron microscope sample fixing device.
Background
Scanning electron microscopy (sem) is a modern cell biology research tool invented in 1965, and mainly uses secondary electron signal imaging to observe the surface morphology of a sample, i.e. a very narrow electron beam is used to scan the sample, and various effects are generated by the interaction between the electron beam and the sample, wherein the secondary electron emission of the sample is mainly generated.
When the scanning electron microscope sample placement platform on the market is in use, the sample to be seen is easy to slide due to the vibration of the environment, the observation result is influenced, the sample with an irregular shape cannot be fixed and observed, and the problem that a plurality of irregular samples cannot be clamped to be fixed and observed exists.
In response to the above problems, an improved electron microscope sample holding device is now devised.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide an electron microscope sample fixing device to solve the problem that proposes among the above-mentioned background art.
In order to achieve the above object, the utility model provides a following technical scheme:
The utility model provides an electron microscope sample fixing device, includes the base, base upper end fixedly connected with fixed block, the one end fixedly connected with that the base was kept away from to the fixed block is used for the high person of facilitating the use of adjusting device to observe the electric telescopic handle who uses, electric telescopic handle's output fixedly connected with is used for placing the sample board of sample, the terminal surface that the base was kept away from to the sample board has seted up a plurality of mutually perpendicular's T-shaped groove, the T-shaped groove includes horizontal spout and vertical guide rail, be provided with a plurality of hold-down mechanisms that are used for compressing tightly.
As a further aspect of the present invention: the bottom end of the base is provided with a clamping groove for fixing the base.
As a further aspect of the present invention: hold-down mechanism includes a plurality of circular pressure frames, circular pressure frame bottom central point puts and has seted up the opening, circular pressure frame inside is provided with can follow the gliding pressure integrated circuit board of circular pressure frame inner wall, pressure integrated circuit board central point puts and has seted up the mounting hole, pressure integrated circuit board is close to open-ended one end fixedly connected with spring, the one end fixed connection that the pressure integrated circuit board was kept away from to the spring puts at the circular bottom central point who presses the frame, the diameter of opening and mounting hole is less than the diameter of spring, be provided with even axle in the circular pressure frame, even axle passes mounting hole, spring, opening and guide rail fixedly connected with slider, the slider sets up in the horizontal spout in T-shaped groove, the slider can slide along T-shaped inslot wall, the mounting hole is connected through the altitude mixture control subassembly with even axle.
As a further aspect of the present invention: one end of the circular pressing frame, which is close to the sample plate, is fixedly connected with a rubber pad used for preventing the circular pressing frame from crushing the sample.
As a further aspect of the present invention: and a graphite block for reducing sliding resistance of the sliding block is fixedly connected in the sliding groove.
As a further aspect of the present invention: the height adjusting assembly comprises an internal thread and an external thread, the internal thread is fixedly connected to the inner side wall of the mounting hole of the pressing plate clamp, and the external thread is fixedly connected to the side wall of the connecting shaft.
Compared with the prior art, the beneficial effects of the utility model are that:
1. The utility model is provided with the pressing mechanism, can be quickly installed, assembled and disassembled while being firmly pressed, and is convenient and high in working efficiency; the multiple pressing mechanisms can clamp multiple samples simultaneously; the T-shaped grooves which are vertical to each other facilitate the flexible movement of the sample, and are beneficial to the stability of the sample clamping.
2. The utility model discloses still be provided with the altitude mixture control subassembly, come the length of adjusting spring compression through rotating the clamp plate card, realize the sample clamping of co-altitude not.
Drawings
Fig. 1 is a schematic three-dimensional structure diagram of an electron microscope sample fixing device.
Fig. 2 is a schematic structural diagram of an electron microscope sample fixing device.
Fig. 3 is a schematic structural diagram of a pressing mechanism in an electron microscope sample fixing device.
Wherein: sample plate 1, circular pressure frame 2, pressure integrated circuit board 3, spring 4, guide rail 5, base 6, draw-in groove 7, fixed block 8, electric telescopic handle 9, spout 10, slider 11, internal thread 12, mounting hole 13, external screw thread 14, even axle 15, opening 16.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
Please refer to fig. 1-3, in the embodiment of the present invention, an electron microscope sample fixing device, including a base 6, a clamping groove 7 for fixing the base 6 is provided at the bottom of the base 6, a fixed block 8 is fixedly connected to the upper end of the base 6, an electric telescopic rod 9 used for observing and using by a height user of convenience for adjusting the device is provided at the one end fixedly connected with where the base 6 is far away from the fixed block 8, an output end fixedly connected with of the electric telescopic rod 9 is used for placing a sample plate 1 of a sample, a plurality of mutually perpendicular's T-shaped grooves are provided at the end surface of the sample plate 1 far away from the base 6, the T-shaped grooves include a horizontal sliding groove 10 and a vertical guide rail 5, a plurality.
The pressing mechanism comprises a plurality of circular pressing frames 2, an opening 16 is formed in the center of the bottom end of each circular pressing frame 2, a pressing plate card 3 capable of sliding along the inner wall of each circular pressing frame 2 is arranged inside each circular pressing frame 2, a mounting hole 13 is formed in the center of each pressing plate card 3, a spring 4 is fixedly connected to one end, close to the opening 16, of each pressing plate card 3, one end, far away from the pressing plate card 3, of each spring 4 is fixedly connected to the center of the bottom of each circular pressing frame 2, the diameters of the opening 16 and the mounting hole 13 are smaller than those of the springs 4, a connecting shaft 15 is arranged in each circular pressing frame 2, each connecting shaft 15 penetrates through the corresponding mounting hole 13, each spring 4, each opening 16 and each guide rail 5 to be fixedly connected with a sliding block 11, each sliding block 11 is arranged in a horizontal sliding groove 10 of a T-shaped groove, each sliding block 11 can slide along the inner, the effect of altitude mixture control subassembly is the length of regulating spring 4 compression, realizes the sample centre gripping of co-altitude not, hold-down mechanism's theory of operation is a plurality of circular pressure frames of external force upwards pulling 2, and spring 4 is compressed, removes circular pressure frame 2 to sample edge through the T-slot, loosens circular pressure frame 2, and the sample edge is compressed tightly by circular pressure frame 2, hold-down mechanism's effect is when compressing tightly firmly, can install fast loading and unloading, and convenient and work efficiency is high, and a plurality of hold-down mechanism can realize a plurality of samples clamping simultaneously, and many mutually perpendicular's T-slot make things convenient for the sample to remove in a flexible way, are favorable to the firm of sample centre gripping.
Height adjusting subassembly includes internal thread 12 and external screw thread 14, internal thread 12 fixed connection is on the 13 inside walls of mounting hole of clamp plate card 3, external screw thread 14 fixed connection is on the lateral wall of even axle 15, internal thread 12 uses the length that can adjust spring 4 compression with the cooperation of external screw thread 14, realizes the sample centre gripping of co-altitude not.
The utility model discloses a theory of operation is: when using this electron microscope sample fixing device, according to the size and the height of sample, adjust the length of spring 4 compression through rotating pressure integrated circuit board 3, realize the sample centre gripping of co-altitude, then utilize a plurality of circular pressure frames 2 of the outside upwards pulling of external force, spring 4 is compressed, moves circular pressure frame 2 to sample corner through the T-slot, loosens circular pressure frame 2, and the sample corner is compressed tightly by circular pressure frame 2.
It is obvious to a person skilled in the art that the invention is not restricted to details of the above-described exemplary embodiments, but that it can be implemented in other specific forms without departing from the spirit or essential characteristics of the invention. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.
Furthermore, it should be understood that although the present description refers to embodiments, not every embodiment may contain only a single embodiment, and such description is for clarity only, and those skilled in the art should integrate the description, and the embodiments may be combined as appropriate to form other embodiments understood by those skilled in the art.
Claims (6)
1. The utility model provides an electron microscope sample fixing device, includes base (6), base (6) upper end fixedly connected with fixed block (8), its characterized in that, the one end fixedly connected with that base (6) were kept away from in fixed block (8) is used for adjusting device height person of facilitating the use to observe electric telescopic handle (9), the output fixedly connected with of electric telescopic handle (9) is used for placing sample board (1) of sample, sample board (1) is kept away from the terminal surface of base (6) and is seted up a plurality of mutually perpendicular's T-shaped groove, the T-shaped groove includes horizontal spout (10) and vertical guide rail (5), be provided with a plurality of hold-down mechanism that are used for compressing tightly the sample in horizontal spout (10).
2. The sample fixing device for the electron microscope according to claim 1, wherein a slot (7) for fixing the base (6) is formed at the bottom end of the base (6).
3. The electron microscope sample fixing device according to claim 1, wherein the pressing mechanism comprises a plurality of circular pressing frames (2), an opening (16) is formed in the center of the bottom end of each circular pressing frame (2), a pressing plate (3) capable of sliding along the inner wall of each circular pressing frame (2) is arranged inside each circular pressing frame (2), a mounting hole (13) is formed in the center of each pressing plate (3), a spring (4) is fixedly connected to one end, close to the opening (16), of each pressing plate (3), one end, far away from the pressing plate (3), of each spring (4) is fixedly connected to the center of the bottom of each circular pressing frame (2), the diameters of the opening (16) and the mounting hole (13) are smaller than that of each spring (4), a connecting shaft (15) is arranged in each circular pressing frame (2), and the connecting shaft (15) penetrates through the mounting holes (13), Spring (4), opening (16) and guide rail (5) fixedly connected with slider (11), slider (11) set up in horizontal spout (10) in the T-slot, slider (11) can be followed the slip of T-slot inner wall, mounting hole (13) are connected through height adjusting part with even axle (15).
4. An electron microscope sample fixing device according to claim 3, characterized in that a rubber pad for preventing the round pressing frame (2) from crushing the sample is fixedly connected to one end of the round pressing frame (2) close to the sample plate (1).
5. An electron microscope sample fixing device according to claim 3, characterized in that a graphite block for reducing the sliding resistance of the slide block (11) is fixedly connected in the slide groove (10).
6. The electron microscope sample fixing device according to claim 3, wherein the height adjusting component comprises an internal thread (12) and an external thread (14), the internal thread (12) is fixedly connected to the inner side wall of the mounting hole (13) of the clamp plate (3), and the external thread (14) is fixedly connected to the side wall of the connecting shaft (15).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020307848.XU CN211125567U (en) | 2020-03-12 | 2020-03-12 | Electron microscope sample fixing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020307848.XU CN211125567U (en) | 2020-03-12 | 2020-03-12 | Electron microscope sample fixing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN211125567U true CN211125567U (en) | 2020-07-28 |
Family
ID=71705650
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202020307848.XU Expired - Fee Related CN211125567U (en) | 2020-03-12 | 2020-03-12 | Electron microscope sample fixing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN211125567U (en) |
-
2020
- 2020-03-12 CN CN202020307848.XU patent/CN211125567U/en not_active Expired - Fee Related
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20200728 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |