CN211124111U

CN211124111U - Test system of RFID label weak mark screening function

Info

Publication number: CN211124111U
Application number: CN202020179395.7U
Authority: CN
Inventors: 伯林; 郑凯; 王亮; 萧惇仁; 张兵; 高飞
Original assignee: Yangzhou Jiuyuan Electronic Co ltd
Current assignee: Yangzhou Jiuyuan Electronic Co ltd
Priority date: 2020-02-18
Filing date: 2020-02-18
Publication date: 2020-07-28
Anticipated expiration: 2030-02-18

Abstract

A test system for RFID label weak label screening function belongs to the technical field of RFID label production and manufacturing, has novel system structure and clear working principle, is structurally formed by connecting a computer host, a test reader, a binding machine, an ink jet head, a test antenna and the test reader, realizes the communication between the binding equipment and the test system through a serial port, ensures zero delay, and ensures that the label is consistent with the test result; the broadband test antenna has the bandwidth of 850-960 MHz, so that different tags can be set with actual frequency points of the tags for testing, and misreading is reduced; at 800MHz ~ 970MHz internal full frequency channel scanning, through setting for one or more frequency point monitoring product property ability, realize the screening of weak mark product, through this novel production operation cost that can reduce, eliminate weak mark product flow direction terminal and appear the customer and complain unusual influence, play the promotion effect for the comprehensive popularization of RFID label.

Description

Test system of RFID label weak mark screening function

Technical Field

The utility model belongs to the technical field of RFID label manufacturing, a RFID label test system is related to, especially relate to a test system of RFID label weak mark screening function.

Background

The electronic tag is used as a data carrier and can play the roles of identification, article tracking and information acquisition. And an RFID system consisting of the electronic tag, the reader-writer, the antenna and the application software is directly connected with the corresponding management information system. Each item can be accurately tracked, including real-time data acquisition, secure data access channels, all product information available off-line, and the like. Currently, RFID technology has been widely applied to many fields such as industrial automation, commercial automation, etc., and the wide application of RFID tags does bring more convenience to people's lives.

At present, relevant equipment such as RFID electronic tag packaging and the like has been successfully developed by companies such as New leopard in Germany, Datacoom in Austria, French automation, Tomy in Japan, Mussaha in Germany and the like. These device-mounted test systems suffer from the following disadvantages: (1) the test system adopts a GO NO GO test mode, and can only judge whether the product has electric property by adjusting test power; (2) the method is sensitive to a test position and is easy to cause misreading abnormity; (3) weak standard products cannot be screened at all. Therefore, in order to eliminate the influence of the complaint abnormality of the weak standard product flowing to the terminal, it is necessary to design a test system capable of screening the weak standard.

SUMMERY OF THE UTILITY MODEL

The utility model discloses can't filter weak mark product to test system among the current electronic tags encapsulation equipment, easily appear misreading and be not enough such as unusual, provide a test system of RFID label weak mark screening function, through the utility model discloses can reduce production operation cost, eliminate weak mark product flow direction terminal and appear the influence that the visitor complained unusually, play the promotion effect for the comprehensive popularization of RFID label.

The technical scheme of the utility model is that: a test system for RFID label weak label screening function comprises a computer host provided with weak label screening test software, a test reader, a binding machine and an ink jet head; the method is characterized in that: the testing system also comprises a wide bandwidth testing antenna, a serial port of the computer host is connected with the testing reader, the testing reader is connected with the wide bandwidth testing antenna, a transmitting antenna is arranged on the front side of the wide bandwidth testing antenna, an inner ring pin is connected with the head of the transmitting antenna, inductive reactance adjusting metal wires are arranged at two ends of the tail of the transmitting antenna, a metal layer is arranged on the back side of the wide bandwidth testing antenna, a resistor is arranged on the metal layer, an outer ring pin is connected with the head of the metal layer, the inner ring pin is arranged at the center of the outer ring pin, the binding machine is communicated with the testing system through a serial port, a label to be detected is arranged above the PET layer, the wide bandwidth testing antenna is arranged below the PET layer, full frequency sweeping is carried out on the label through the testing reader, and a product frequency point is set as, and setting one or more frequency points to monitor the product performance, taking the optimal sensitivity of each frequency point under the full frequency band of the tested good label as a standard test curve, comparing the test label curve with the standard curve, screening the label with the performance not meeting the requirement, marking and realizing the screening of the weak label product.

The wide bandwidth test antenna is at the PCB board that thickness is 1.6mm, and the back metal level is that thickness is 20um, length and width is 53 × 80 mm's copper foil, and transmitting antenna is 20um, length and width is 7 × 72 mm's copper foil, increases impedance adjustment wire adjustment test antenna frequency point.

The resistor is a 50 omega patch resistor, the test bandwidth exceeds 80MHz, and the sweep frequency test result at the frequency range of 800-970 is consistent with the actual performance of the label.

The number of the outer ring pins is 4, the outer ring pins are communicated with each other to form a square structure, and the outer ring pins are communicated with the metal layer on the back of the wide bandwidth test antenna.

The utility model has the advantages that: the utility model provides a test system of RFID label weak mark screening function, the system structure is novel, and the theory of operation is clear, structurally by the computer host computer, test reader, bind machine, ink jet head, test antenna, test reader and connect and constitute, realize through the serial ports that bind equipment and test system communication, ensure zero delay, the label is unanimous with the test result; the broadband test antenna has the bandwidth of 850-960 MHz, so that different tags can be set with actual frequency points of the tags for testing, and misreading is reduced; at the full frequency channel scanning of 800MHz ~ 970MHz within range inner shell, through setting for one or more frequency point monitoring product property ability, realize the screening of weak mark product, through the utility model discloses can reduce production operation cost, eliminate weak mark product flow direction terminal and appear the visitor and complain unusual influence, play the promotion effect for the comprehensive popularization of RFID label.

Drawings

Fig. 1 is a schematic diagram of the system structure of the present invention.

Fig. 2 is the front structural schematic diagram of the middle-wide bandwidth test antenna of the present invention.

Figure 3 is the utility model discloses middle-wide bandwidth test antenna back structure sketch map.

In the figure: the device comprises an ink gun 1, a label 2, a test antenna 3, an outer ring pin 3-1, an inner ring pin 3-2, a transmitting antenna 3-3, an inductive reactance adjusting metal wire 3-4, a metal layer 3-5, a resistor 3-6, a test reader 4, a test system 5, a computer host 6, a binding machine 7 and a PET layer 8.

Detailed Description

The present invention will be further explained with reference to the accompanying drawings:

as shown in figures 1-3, a test system for RFID label weak label screening function comprises a computer host 6 for installing weak label screening test software, a test reader 4, a binding machine 7, an ink jet head 1 and a wide bandwidth test antenna 3, wherein a serial port of the computer host 6 is connected with the test reader 4, the test reader 4 is connected with the wide bandwidth test antenna 3, a transmitting antenna 3-3 is arranged on the front surface of the wide bandwidth test antenna 3, an inner ring pin 3-2 is connected with the head of the transmitting antenna 3-3, an inductive reactance adjusting metal wire 3-4 is arranged at two ends of the tail of the transmitting antenna 3-3, a metal layer 3-5 is arranged on the back surface of the wide bandwidth test antenna 3, a resistor 3-6 is arranged on the metal layer 3-5, an outer ring pin 3-1 is connected with the head of the metal layer 3-5, the inner ring pin 3-2 is arranged at the center of the outer ring, realize binding machine 7 and test system 5's communication through the serial ports, it arranges PET layer 8 top in to wait to detect label 2, wide bandwidth test antenna 3 sets up in PET layer 8's below, read 4 full frequency sweep frequency to label 2 through the test, the product frequency point sets up to the test frequency point, set for one or more frequency point monitoring product property ability, through the test yields label every frequency point department optimum sensitivity under full frequency channel as standard test curve, and compare test label curve with this standard curve, select the label that the performance does not satisfy the requirement, mark, realize the screening of weak mark product.

As shown in figures 1-3, a test system for RFID label weak label screening function, a wide bandwidth test antenna 3 is a PCB board with the thickness of 1.6mm, a back metal layer is a copper foil with the thickness of 20um and the length and width of 53 × 80mm, a transmitting antenna is a copper foil with the thickness of 20um and the length and width of 7 × 72mm, an inductance adjusting metal wire is added to adjust the frequency point of the test antenna, a resistor 3-6 is a 50 omega patch resistor, the test bandwidth exceeds 80MHz, the frequency sweep test result is consistent with the actual performance of a label in a frequency band of 790-970, the number of outer ring pins 3-1 is 4, the outer ring pins 3-1 are mutually communicated to form a square structure, and the outer ring pins 3-1 are communicated with the metal layer 3-5 on the back of the wide bandwidth test antenna 3.

As shown in fig. 1 to 3, the working principle of the test system for the RFID tag weak label screening function is as follows: after the equipment is carried by a piece of label, the binding host sends a testing demand signal to the computer host, the computer sends the testing demand signal to the testing reader, the reader sends a testing power signal to the testing antenna, and the testing antenna transmits the testing signal in an electromagnetic wave mode. After the label receives the electromagnetic wave signal sent by the test antenna, the label forms induced electromotive force to generate induced current to activate the label, and the content of the label returns to the test antenna in the form of the electromagnetic wave signal. The test antenna receives electromagnetic wave signals returned by the tags, converts the electromagnetic wave signals into analog signals, transmits the analog signals to the test reader, the test reader converts the analog signals into digital signals, transmits the digital signals to the test computer, and the test computer performs logic judgment according to the feedback signals and screens out tags with poor performance and weak performance. And feeding back the test result of the test computer to the binding equipment host to display the main interface of the equipment.

Claims

1. A test system for RFID label weak label screening function comprises a computer host (6) for installing weak label screening test software, a test reader (4), a binding machine (7) and an ink jet head (1); the method is characterized in that: the test system further comprises a wide bandwidth test antenna (3), a serial port of the computer host (6) is connected with the test reader (4), the test reader (4) is connected with the wide bandwidth test antenna (3), the front face of the wide bandwidth test antenna (3) is provided with a transmitting antenna (3-3), the head of the transmitting antenna (3-3) is connected with an inner ring pin (3-2), two ends of the tail of the transmitting antenna (3-3) are provided with inductive reactance adjusting metal wires (3-4), the back face of the wide bandwidth test antenna (3) is provided with a metal layer (3-5), the metal layer (3-5) is provided with a resistor (3-6), the head of the metal layer (3-5) is connected with an outer ring pin (3-1), and the inner ring pin (3-2) is arranged at the center of the outer ring pin (3-1), realize binding machine (7) and test system (5)'s communication through the serial ports, treat that label (2) of detecting are arranged in PET layer (8) top, wide bandwidth test antenna (3) set up the below on PET layer (8), read ware (4) through the test and carry out full frequency sweep to label (2), the product frequency point sets up to the test frequency point, set for one or more frequency point and monitor product property ability, locate optimum sensitivity as standard test curve at every frequency point under full frequency channel through the test non-defective products label, and compare test label curve and this standard curve, select the label that the performance can not meet the demands, mark, realize the screening of weak mark product.

2. The system for testing the RFID label weak label screening function according to claim 1, wherein the wide bandwidth test antenna (3) is a PCB board with a thickness of 1.6mm, the back metal layer is a copper foil with a thickness of 20um and a length and width of 53 × 80mm, the transmitting antenna is a copper foil with a thickness of 20um and a length and width of 7 × 72mm, and the inductance adjusting metal wire is added to adjust the frequency point of the test antenna.

3. The system for testing the RFID tag weak label screening function according to claim 1, wherein: the resistor (3-6) is a 50 omega patch resistor, the test bandwidth exceeds 80MHz, and the sweep frequency test result in the frequency band of 790-970 is consistent with the actual performance of the label.

4. The system for testing the RFID tag weak label screening function according to claim 1, wherein: the number of the outer ring pins (3-1) is 4, the outer ring pins are communicated with one another to form a square structure, and the outer ring pins (3-1) are communicated with the metal layer (3-5) on the back of the wide bandwidth test antenna (3).