CN211121924U - Switch testing device and system - Google Patents

Switch testing device and system Download PDF

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Publication number
CN211121924U
CN211121924U CN201922083609.0U CN201922083609U CN211121924U CN 211121924 U CN211121924 U CN 211121924U CN 201922083609 U CN201922083609 U CN 201922083609U CN 211121924 U CN211121924 U CN 211121924U
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China
Prior art keywords
circuit
sliding block
switch
acceleration
magnet motor
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CN201922083609.0U
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Chinese (zh)
Inventor
李树军
程磊
高捷
韩成辉
任海纶
陈建建
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Ningbo Military Pigeon Defense Technology Co ltd
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Ningbo Military Pigeon Defense Technology Co ltd
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Priority to CN201922083609.0U priority Critical patent/CN211121924U/en
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Abstract

The application discloses switch testing arrangement and system. Wherein, the device includes: the signal generator is used for generating a driving signal, wherein the driving signal is used for controlling the magnet motor to operate; the magnet motor is connected with the signal generator and used for generating a first acting force to the first side surface of the sliding block under the driving of the driving signal; the sliding block is used for bearing an acceleration switch to be tested; and the first end of the spring is contacted with the second side surface of the sliding block and is used for generating a second acting force on the second side surface, wherein the second side surface and the first side surface are oppositely arranged at two sides of the sliding block. The technical problem that whether the service life of the acceleration switch is short of a device for detecting the design requirement or not at the present stage is solved.

Description

Switch testing device and system
Technical Field
The application relates to the field of acceleration switch testing, in particular to a switch testing device and system.
Background
The acceleration switch is an inertia device which can sense acceleration, the acceleration switch needs to be detected whether the service life of the acceleration switch meets the design requirement after being produced, and a device which can detect whether the service life of the acceleration switch meets the design requirement is lacked at the present stage.
In view of the above problems, no effective solution has been proposed.
Disclosure of Invention
The embodiment of the application provides a switch testing device and a system, which at least solve the technical problem that whether the service life of an acceleration switch is short of a device for detecting whether the service life of the acceleration switch meets the design requirement at the present stage.
According to an aspect of an embodiment of the present application, there is provided a switch testing apparatus including: the signal generator is used for generating a driving signal, wherein the driving signal is used for controlling the magnet motor to operate; the magnet motor is connected with the signal generator and used for generating a first acting force to the first side surface of the sliding block under the driving of the driving signal; the sliding block is used for bearing an acceleration switch to be tested; and the first end of the spring is contacted with the second side surface of the sliding block and is used for generating a second acting force on the second side surface, wherein the second side surface and the first side surface are oppositely arranged at two sides of the sliding block.
Optionally, the apparatus further comprises: the sliding rail is used for bearing the sliding block and the spring; and the sliding rail frame is used for bearing and fixing the sliding rail and is in contact with the second end of the spring.
Optionally, the spring is located between the rail frame and the second side of the slider in a compressed state.
Optionally, the apparatus further comprises: and the stop lever is arranged on the slide rail and used for limiting the moving distance of the slide block on the slide rail.
Optionally, the apparatus further comprises: and the waveform collector is connected with the test circuit of the acceleration switch to be tested and is used for collecting and displaying a first waveform and a second waveform generated by the test circuit, wherein the first waveform corresponds to the acceleration generated by the sliding block due to the first acting force, and the second waveform corresponds to the acceleration generated by the sliding block due to the second acting force.
Optionally, the apparatus further comprises: and the base is used for horizontally bearing the magnet motor and the slide rail frame.
Optionally, the signal generator comprises a power circuit, an input circuit, an electromagnet control circuit, a L ED lamp group circuit, a display screen circuit, a buzzer circuit and a buzzer prompting circuit, wherein the power circuit is used for providing power, the input circuit is composed of matrix keys and resistors and used for inputting at least one of the following parameters through keys, the frequency of the magnet motor impacting a sliding block, the impacting times and the electrifying time of the magnet motor, the electromagnet control circuit is composed of field effect tubes, resistors and diodes and used for controlling the magnet motor to operate according to a driving signal, the 3556 ED lamp group circuit is composed of a plurality of L ED lamps and resistors and used for representing data input by the input circuit through displaying various light states, the vibration alarming circuit is composed of a vibrator, field effect tubes and resistors and used for sending vibration alarming information when at least one parameter input by the input circuit through keys exceeds a preset range, the display screen circuit is composed of a display screen and a capacitor and used for displaying data input by the input circuit in real time, the buzzer circuit is composed of triodes, the triode, the buzzer and the buzzer circuit is used for controlling the buzzer to send sound when the driving signal generated by the triode on the input circuit is amplified, and the electromagnet control circuit is connected with the power circuit and the display circuit L and the electromagnet control circuit and the buzzer prompting circuit.
Optionally, the power supply circuit comprises: the first voltage stabilizing chip is used for converting a 24V direct-current power supply into a 3.3V power supply; and the second voltage stabilizing chip is used for converting a battery power supply into a 3.3V power supply.
According to another aspect of the embodiments of the present application, there is also provided a switch testing system, including: the above test device; and the acceleration switch to be tested is arranged on the sliding block.
According to another aspect of the embodiments of the present application, there is provided another switch testing system, including: the above test device; the acceleration switch to be tested is arranged on the sliding block; an acceleration sensor, of which the threshold is known, is mounted on the slider.
In an embodiment of the present application, there is provided a switch testing apparatus, including: the signal generator is used for generating a driving signal, wherein the driving signal is used for controlling the magnet motor to operate; the magnet motor is connected with the signal generator and used for generating a first acting force to the first side surface of the sliding block under the driving of the driving signal; the sliding block is used for bearing an acceleration switch to be tested; and the first end of the spring is contacted with the second side surface of the sliding block and is used for generating a second acting force on the second side surface, wherein the second side surface and the first side surface are oppositely arranged at two sides of the sliding block. Therefore, the technical effect that whether the service life of the acceleration switch meets the actual requirement or not is rapidly detected, and the technical problem that whether the service life of the acceleration switch meets the design requirement or not is detected in the absence of the device for detecting the acceleration switch at the present stage or not is solved.
Drawings
The accompanying drawings, which are included to provide a further understanding of the application and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the application and together with the description serve to explain the application and not to limit the application. In the drawings:
FIG. 1 is a schematic structural diagram of a switch testing device according to an embodiment of the present application;
FIG. 2 is a schematic diagram of another switch testing apparatus according to an embodiment of the present application;
FIG. 3 is a block diagram of a signal generator according to an embodiment of the present application;
FIG. 4a is a schematic diagram of a power supply circuit according to an embodiment of the present application;
FIG. 4b is a schematic diagram of a keyboard input circuit according to an embodiment of the present application;
FIG. 4c is a schematic diagram of an electromagnet control circuit according to an embodiment of the present application;
FIG. 4d is a schematic diagram of an L ED lamp bank circuit according to an embodiment of the present application;
FIG. 4e is a schematic diagram of an L ED lamp bank circuit according to an embodiment of the present application;
FIG. 4f is a schematic diagram of a buzzer circuit in accordance with an embodiment of the present application;
FIG. 4g is a flow chart of a signal generator routine according to an embodiment of the present application;
FIG. 5 is a block diagram of a switch testing system according to an embodiment of the present application;
FIG. 6 is a block diagram of another switch test system according to an embodiment of the present application.
Detailed Description
In order to make the technical solutions better understood by those skilled in the art, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only partial embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
It should be noted that the terms "first," "second," and the like in the description and claims of this application and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the application described herein are capable of operation in sequences other than those illustrated or described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
Fig. 1 is a schematic structural diagram of a switch testing device according to an embodiment of the present application, and as shown in fig. 1, the device includes:
a signal generator 100 for generating a driving signal, wherein the driving signal is used for controlling the magnet motor 102 to operate.
And a magnet motor 102 connected to the signal generator 100 for generating a first force on the first side of the slider 104 under the driving of the driving signal.
And the sliding block 104 is used for bearing the acceleration switch to be tested.
And a spring 106, a first end of the spring 106 contacting a second side of the slider 104 for generating a second acting force to the second side, wherein the second side and the first side are opposite to each other on two sides of the slider 104.
According to an alternative embodiment of the present application, the switch testing device described above is used to test the service life of an acceleration switch, which is a type of inertial device that senses acceleration and performs actuation.
In an alternative embodiment of the present application, the acceleration switch testing apparatus is used as follows:
1) the magnet motor 102 is connected to the signal generator 100.
2) An acceleration switch (projectile counter) is fixed to the slide 104, while the test circuit is connected to a waveform collector; it should be noted that the acceleration switch is a main component of the projectile counter, and the test circuit mentioned here refers to a test circuit inside the acceleration switch.
3) Inputting parameters such as frequency, power-on time, impact frequency and the like into the signal generator 100, and pressing an output key;
4) the magnet motor 102 impacts the slide block 104 according to the input parameters, and the waveform collected by the waveform collector.
The test principle is as follows: after the magnet motor impacts the sliding block, the sliding block generates first acceleration, the acceleration switch installed on the sliding block is conducted after the first acceleration is detected, and at the moment, the test circuit generates a rising edge waveform. The slider receives the striking of magnet motor and moves compression spring left, and the elasticity of spring makes the slider produce the second acceleration, switches on again after the acceleration switch of installing on the slider detects the second acceleration, and test circuit produces a rising edge waveform again this moment. Namely, the acceleration switch detects two accelerations every time the magnet motor impacts the slider, and the acceleration switch is conducted twice to generate two rising edge waveforms.
When the switch testing device is used for testing the service life of the acceleration switch to be tested, the test can be carried out according to the quantity of the rising edge waveforms collected by the waveform collector, for example, the motor is driven to impact the sliding block according to a certain frequency, after a certain impact is completed, the rising edge waveforms are not collected by the waveform collector, and the acceleration switch fails and cannot detect the acceleration. The number of the rising edge waveforms collected by the waveform collector is the maximum number of times that the acceleration switch can be conducted (namely the service life of the acceleration switch).
Through above-mentioned device, can realize whether the life of short-term test acceleration switch reaches the requirement.
Fig. 2 is a schematic structural diagram of another switch testing apparatus according to an embodiment of the present application, and as shown in fig. 2, the apparatus further includes: a slide 108 for carrying the slider 104 and the spring 106; and a rail bracket 110 for carrying and fixing the rail 108 and contacting the second end of the spring 106.
According to an alternative embodiment of the present application, the spring 106 is positioned between the rail frame 110 and the second side of the slider 104 in a compressed state.
Optionally, the apparatus further comprises: and the stop lever 112 is arranged on the slide rail 108 and used for limiting the moving distance of the slide block 104 on the slide rail 108.
According to an alternative embodiment of the present application, the apparatus further comprises: and the waveform collector 114 is connected to the test circuit of the acceleration switch to be tested, and is configured to collect and display a first waveform and a second waveform generated by the test circuit, where the first waveform corresponds to the acceleration generated by the slider 104 due to the first acting force, and the second waveform corresponds to the acceleration generated by the slider 104 due to the second acting force.
Optionally, the apparatus further comprises: and a base 116 for horizontally carrying the magnet motor 102 and the slide rail 104.
The slide rail frame 110 and the magnet motor 102 are arranged on the base 116, and the whole test structure is fixed on the base 116; the slide rail 108 is arranged on the two slide rail frames 110, and the slide rail frames 110 and the slide rail 108 are fixed by screws, so that the slide rail 108 is ensured not to displace; a stop lever 112 is arranged on the right side of the sliding block 108 for limiting, the spring 106 is positioned between the sliding rail frame 110 and the sliding block 104, and the spring 106 is in a compressed state; the plunger of the magnet motor 102 may strike the slider 104.
Fig. 3 is a structural diagram of a signal generator according to an embodiment of the present application, and as shown in fig. 3, the signal generator 100 includes a power circuit 1001 for providing power, an input circuit 1002 composed of matrix keys and resistors for inputting at least one of the frequency of the magnet motor striking the slider, the number of times of striking, and the power-on time of the magnet motor by a key, an electromagnet control circuit 1003 composed of fets, resistors, and diodes for controlling the operation of the magnet motor according to a driving signal, a L ED lamp group circuit 1004 composed of a plurality of L ED lamps and resistors for representing data input by the input circuit by displaying various light states, a vibration alarm circuit 1005 composed of a vibrator, fets, and resistors for giving a vibration alarm message when at least one parameter input by the input circuit through the key exceeds a preset range, a display circuit 1006 composed of a display screen and a capacitor for displaying data input by the input circuit in real time, a buzzer circuit 1007, a triode 1005, a buzzer, and a resistor 63for generating a driving signal when the driving signal generated by the triode amplifies the input circuit, a control circuit 1003, a buzzer circuit 1006, a control circuit 1008, a buzzer for displaying data input circuit 1004 and a buzzer for displaying a buzzer according to a normal operation prompt circuit 1002, a buzzer circuit 1007, a buzzer circuit 1002, a buzzer circuit 1008, and a buzzer circuit 1002, and a buzzer circuit for displaying a buzzer circuit 1002, a buzzer circuit for displaying a buzzer circuit 1004 for displaying a buzzer for displaying a parameter.
According to an alternative embodiment of the present application, the power supply circuit 1001 includes: the first voltage stabilizing chip is used for converting a 24V direct-current power supply into a 3.3V power supply; and the second voltage stabilizing chip is used for converting a battery power supply into a 3.3V power supply.
Fig. 4a is a schematic diagram of a power supply circuit according to an embodiment of the present application, and as shown in fig. 4a, the power supply circuit 1001 is composed of two kinds of voltage regulator chips (U1, U2), a capacitor (C), a diode (D), a VTS device (T, surge protection device), and a switch (K1, K2); the circuit can select a power supply mode through a switch, can use a 24V power supply to supply power to convert into 3.3V, and can also select a lithium battery to supply power to convert into 3.3V, so that power is supplied to other parts of the circuit.
The capacitor C is a decoupling capacitor and a bypass capacitor and is used for stabilizing power output, and power is supplied by selectively closing different switches to select external power supply using a 24V power supply module or external lithium battery (L IVCC).
Fig. 4b is a schematic diagram of a keyboard input circuit according to an embodiment of the present application, and as shown in fig. 4b, the input circuit 1002 is a keyboard input circuit, and is composed of a 4 × 4 metal matrix keyboard and a corresponding pull-up resistor, and when a key on the keyboard is pressed, the key is determined by judging a generated signal, and a corresponding waiting operation is performed according to the key.
Fig. 4c is a schematic diagram of an electromagnet control circuit according to an embodiment of the present application, as shown in fig. 4c, the electromagnet control circuit 1003 is composed of a dual field effect transistor (Q1, Q3), a resistor, a diode, and a L ED display lamp, when an output switch is closed, the N-channel field effect transistor (Q3) is turned on by a control pulse, so that a voltage exists across a resistor R connected to Q1, and the P-channel field effect transistor (Q1) is turned on, so that a 24V voltage is applied across the electromagnet to drive the electromagnet to operate, and at the same time, the L ED display lamp emits light to display an operating state.
K is an output control switch, and the control pulse can be output only by closing the switch;
d is a diode used for stabilizing the work of the electromagnet;
r is an auxiliary control resistor and a current-limiting resistor;
q1 is a P-channel field effect transistor;
q2 and Q3 are N-channel field effect transistors.
Fig. 4d is a schematic diagram of an L ED lamp group circuit according to an embodiment of the present application, and as shown in fig. 4d, a L ED lamp group circuit 1004 is composed of L ED lamps and resistors, and can display different lamp light combinations, reflecting the current data input situation.
Fig. 4e is a schematic diagram of an L ED lamp set circuit according to the embodiment of the present application, as shown in fig. 4e, a vibration warning circuit 1005 is composed of a resistor (R), a vibrator (M), and an N-channel fet (Q4), and when the vibration warning circuit inputs a high level, the N-channel fet (Q4) is turned on to operate the vibrator (M), and when the keyboard input value exceeds an allowable range or is in an abnormal operating environment, the vibrator is driven to operate to warn.
According to an alternative embodiment of the present application, the display circuit 1006 is composed of a display and a decoupling capacitor, and is used for displaying the control data inputted by the keyboard and the working state in real time.
Fig. 4f is a schematic diagram of a buzzer circuit according to an embodiment of the present application, and as shown in fig. 4f, the buzzer circuit 1007 is composed of a transistor (Q5), a buzzer (Bell), and a resistor (R), the transistor (Q5) is used for amplifying a signal to drive the buzzer (Bell) to operate, and this circuit is reserved for replacing or distinguishing the vibration alarm circuit.
According to an alternative embodiment of the present application, the power-on prompting circuit 1008 is composed of a music chip and a speaker, and prompts whether the initialized working state is normal or not when the power-on is performed.
In an optional embodiment of the present application, the controller circuit 1009 is composed of a single chip microcomputer, a horn socket, a power indicator, a crystal oscillator, and the like, the horn socket is used for programming a flash program of the single chip microcomputer through a JTAG format, the power indicator displays a power working state, and the crystal oscillator provides a clock signal for the single chip microcomputer.
The program running on the signal generator mainly has the functions of detecting the input value of the key, controlling the output of the pulse signal according to the input value and controlling the work of the electromagnet by using the pulse signal. And simultaneously, the working state and the input information of the signal generator are displayed in real time by using the display screen.
Fig. 4g is a flow chart of a signal generator program according to an embodiment of the present application, and as shown in fig. 4g, the flow chart mainly includes the following steps:
s401, starting a signal generator, and starting a program;
s402, closing the watchdog program;
s403, initializing a crystal oscillator;
s404, initializing an IO port;
s405, setting a display screen;
and S406, while circulating, waiting for key input, and specifically, outputting pulses according to input parameters such as frequency, time, frequency and the like in the circulating execution process. It should be noted that the frequency, time and times are the parameters mentioned above, such as the input frequency, the power-on time, the number of impacts, etc. in the signal generator.
Fig. 5 is a block diagram of a switch test system according to an embodiment of the present application, as shown in fig. 5, the system including: a switch test device 50; and the acceleration switch to be tested 52 is arranged on the slide block of the switch testing device 50.
According to an alternative embodiment of the present application, the test principle of the test system is as follows: after the magnet motor impacts the sliding block, the sliding block is enabled to generate first acceleration, the acceleration switch to be tested installed on the sliding block is conducted after the first acceleration is detected, and at the moment, the test circuit generates a rising edge waveform. The slider is impacted by the magnet motor and then moves to the left to compress the spring, the elastic force of the spring enables the slider to generate second acceleration, the acceleration switch to be tested is conducted again after detecting the second acceleration, and at the moment, the test circuit generates a rising edge waveform again. Namely, the magnet motor impacts the slider once, the acceleration switch to be tested detects two accelerations, and the two accelerations are conducted twice to generate two rising edge waveforms.
When the switch testing system is used for testing the service life of the acceleration switch to be tested, the test can be carried out according to the quantity of the rising edge waveforms collected by the waveform collector, for example, the motor is driven to impact the sliding block according to a certain frequency, and after a certain impact is completed, the waveform collector does not collect the rising edge waveforms, so that the acceleration switch fails and cannot detect the acceleration. The number of the rising edge waveforms collected by the waveform collector is the maximum number of times that the acceleration switch can be conducted (namely the service life of the acceleration switch).
Through the system, whether the service life of the acceleration switch meets the requirement or not can be quickly detected.
It should be noted that, reference may be made to the description of the embodiment shown in fig. 1 to 4 for a preferred embodiment of the switch testing device 50, and details are not repeated here.
Fig. 6 is a block diagram of another switch test system according to an embodiment of the present application, as shown in fig. 6, the system including:
a switch test device 60;
an acceleration switch to be tested 62 installed on the slider of the switch testing device 60;
an acceleration sensor 64 of known threshold is mounted on the slider of the switch test device 60.
According to an alternative embodiment of the application, an acceleration sensor and an acceleration switch with known threshold values are simultaneously installed on a switch testing device for testing, and the threshold values of the acceleration switch can be measured through adjusting parameters for a plurality of tests, wherein the threshold values refer to the magnitude of the acceleration sensed by the acceleration.
Through many times of experiments, the stability and the consistency of the acceleration switch can be tested. For example, it can be detected through multiple tests whether the acceleration values sensed by the acceleration switch are the same, if the acceleration values are consistent or each sensed and speed error is within a certain range, the stability and consistency of the acceleration switch are relatively good, otherwise, corresponding correction is needed.
It should be noted that, reference may be made to the description of the embodiment shown in fig. 1 to 4 for a preferred embodiment of the switch testing device 60, and details are not repeated here.
The above-mentioned serial numbers of the embodiments of the present application are merely for description and do not represent the merits of the embodiments.
In the above embodiments of the present application, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments.
In the embodiments provided in the present application, it should be understood that the disclosed technology can be implemented in other ways. The above-described embodiments of the apparatus are merely illustrative, and for example, the division of the units may be a logical division, and in actual implementation, there may be another division, for example, multiple units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, units or modules, and may be in an electrical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
The foregoing is only a preferred embodiment of the present application and it should be noted that those skilled in the art can make several improvements and modifications without departing from the principle of the present application, and these improvements and modifications should also be considered as the protection scope of the present application.

Claims (10)

1. A switch testing device, comprising:
the signal generator is used for generating a driving signal, wherein the driving signal is used for controlling the magnet motor to operate;
the magnet motor is connected with the signal generator and used for generating a first acting force on the first side surface of the sliding block under the driving of the driving signal;
the sliding block is used for bearing an acceleration switch to be tested;
and a first end of the spring is in contact with a second side surface of the sliding block and is used for generating a second acting force on the second side surface, wherein the second side surface and the first side surface are oppositely arranged on two sides of the sliding block.
2. The apparatus of claim 1, further comprising:
the sliding rail is used for bearing the sliding block and the spring;
and the sliding rail frame is used for bearing and fixing the sliding rail and is in contact with the second end of the spring.
3. The apparatus of claim 2, wherein the spring is positioned between the rail bracket and the second side of the slider in compression.
4. The apparatus of claim 2, further comprising:
and the stop lever is arranged on the slide rail and used for limiting the moving distance of the slide block on the slide rail.
5. The apparatus of claim 1, further comprising:
and the waveform collector is connected with the test circuit of the acceleration switch to be tested and is used for collecting and displaying a first waveform and a second waveform generated by the test circuit, wherein the first waveform corresponds to the acceleration generated by the sliding block due to the first acting force, and the second waveform corresponds to the acceleration generated by the sliding block due to the second acting force.
6. The apparatus of claim 2, further comprising:
and the base is used for horizontally bearing the magnet motor and the slide rail frame.
7. The apparatus of claim 1, wherein the signal generator comprises:
a power supply circuit for supplying power;
the input circuit consists of a matrix key and a resistor and is used for inputting at least one of the following parameters through the key: the frequency of the magnet motor impacting the slider, the impacting times and the power-on time of the magnet motor;
the electromagnet control circuit consists of a field effect transistor, a resistor and a diode and is used for controlling the magnet motor to operate according to the driving signal;
l ED lamp group circuit composed of multiple L ED lamps and resistors for representing the data input by the input circuit by displaying multiple lamp light states;
the vibration alarm circuit consists of a vibrator, a field effect tube and a resistor and is used for sending out vibration alarm information under the condition that the at least one parameter input by the input circuit through the key exceeds a preset range;
the display screen circuit consists of a display screen and a capacitor and is used for displaying data input by the input circuit in real time;
the buzzer circuit consists of a triode, a buzzer and a resistor and is used for controlling the buzzer to make a sound when the triode amplifies a driving signal generated by the input circuit;
the starting-up prompting circuit consists of a music chip and a loudspeaker and is used for prompting whether the signal generator is started up normally or not;
the controller circuit is connected with the power supply circuit, the input circuit, the electromagnet control circuit, the L ED lamp group circuit, the vibration warning circuit, the display screen circuit, the buzzer circuit and the power-on prompting circuit, is used for generating the driving signal according to at least one parameter input by the input circuit, and controls the electromagnet control circuit, the L ED lamp group circuit, the vibration warning circuit, the display screen circuit, the buzzer circuit and the power-on prompting circuit to work.
8. The apparatus of claim 7, wherein the power circuit comprises:
the first voltage stabilizing chip is used for converting a 24V direct-current power supply into a 3.3V power supply;
and the second voltage stabilizing chip is used for converting a battery power supply into a 3.3V power supply.
9. A switch test system, comprising:
the test device of any one of claims 1 to 8;
and the acceleration switch to be tested is arranged on the sliding block.
10. A switch test system, comprising:
the test device of any one of claims 1 to 8;
the acceleration switch to be tested is arranged on the sliding block;
an acceleration sensor of known threshold mounted on the slider.
CN201922083609.0U 2019-11-27 2019-11-27 Switch testing device and system Active CN211121924U (en)

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Application Number Priority Date Filing Date Title
CN201922083609.0U CN211121924U (en) 2019-11-27 2019-11-27 Switch testing device and system

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113686652A (en) * 2021-08-27 2021-11-23 黄山永舟仪器有限公司 Durable testing arrangement of oil level sensor resistance card

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113686652A (en) * 2021-08-27 2021-11-23 黄山永舟仪器有限公司 Durable testing arrangement of oil level sensor resistance card

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