CN211088210U

CN211088210U - Tester for producing high-power semiconductor

Info

Publication number: CN211088210U
Application number: CN201922370289.7U
Authority: CN
Inventors: 庄伟东
Original assignee: NANJING SILVERMICRO ELECTRONICS Ltd
Current assignee: NANJING SILVERMICRO ELECTRONICS Ltd
Priority date: 2019-12-26
Filing date: 2019-12-26
Publication date: 2020-07-24
Anticipated expiration: 2029-12-26

Abstract

The utility model discloses a tester is used in high-power semiconductor production, including main part and grip slipper, the both sides inner wall welding at main part top has same crossbeam, the welding of crossbeam top one side has first electric telescopic handle, the flexible end welding of first electric telescopic handle has the lantern ring, the lantern ring cup joints on the crossbeam, the welding of lantern ring bottom has second electric telescopic handle, second electric telescopic handle bottom is equipped with the grip slipper, inside second electric telescopic handle's flexible end stretched into the grip slipper, the equal welding of grip slipper both sides inner wall has the spring, the spring other end has all welded the centre gripping arm, the fixed axle has all been run through at centre gripping arm middle part, the welding of centre gripping arm bottom has test probe. The utility model discloses can measure the resistivity of semiconductor under the different temperatures, the analysis is more comprehensive, the testing data is more reliable. The detection of each position of the semiconductor can be realized, the detection probe or the semiconductor does not need to be moved manually, time and labor are saved, and the detection efficiency is high.

Description

Tester for producing high-power semiconductor

Technical Field

The utility model relates to a semiconductor production technical field especially relates to a tester is used in high-power semiconductor production.

Background

The semiconductor refers to a material having a conductivity between a conductor and an insulator at normal temperature. Semiconductors are used in the fields of integrated circuits, consumer electronics, communication systems, photovoltaic power generation, lighting applications, high-power conversion, and the like. After production and formation, the semiconductor needs to be tested for its performance, and the resistivity of the semiconductor is one of the most important properties.

The existing semiconductor tester can only test the resistivity of a semiconductor at normal temperature, but the temperature is a main influence factor of the resistivity of the semiconductor, and the resistivity of the semiconductor can be comprehensively known and analyzed only by testing the resistivity of the semiconductor at different temperatures; in addition, when the resistivity of different parts of a semiconductor is tested by the conventional semiconductor tester, the semiconductor or the test probe needs to be moved manually, so that the operation is troublesome, and time and labor are wasted.

An effective solution to the problems in the related art has not been proposed yet.

SUMMERY OF THE UTILITY MODEL

The utility model aims at solving the defects existing in the prior art and providing a tester for producing a high-power semiconductor.

In order to achieve the above purpose, the utility model adopts the following technical scheme:

a tester for producing a high-power semiconductor comprises a main body and a clamping seat, wherein the inner walls of two sides of the top of the main body are welded with a same beam, a first electric telescopic rod is welded on one side of the top of the cross beam, a lantern ring is welded at the telescopic end of the first electric telescopic rod, the lantern ring is sleeved on the cross beam, a second electric telescopic rod is welded at the bottom of the lantern ring, a clamping seat is arranged at the bottom of the second electric telescopic rod, the telescopic end of the second electric telescopic rod extends into the clamping seat, the telescopic end of the second electric telescopic rod is not connected with the clamping seat in a contact way, springs are welded on the inner walls of the two sides of the clamping seat, clamping arms are welded on the other ends of the springs, the clamping arm is characterized in that a fixed shaft penetrates through the middle of the clamping arm, the fixed shaft is connected with the clamping arm in a rotating mode, two ends of the fixed shaft are connected with the inner wall of the clamping seat in a welding mode, and a detection probe is welded at the bottom of the clamping arm.

Preferably, the supporting rods are welded on two sides of the top of the clamping seat, and the top of each supporting rod is connected with the bottom of the lantern ring in a welding mode.

Preferably, the detection probe is "L" type, inside the detection probe top stretched into the centre gripping arm, detection probe top electric connection has same wire.

Preferably, the main body shell is hollow, and heating wires are uniformly embedded in the main body shell.

Preferably, the welding of the inside bottom of main part has the test table, and detects that the platform both ends all weld and have lower fixed block, the fixed block top is equipped with the fixed block down, it is fixed through locking bolt with lower fixed block to go up the fixed block.

Preferably, be equipped with the thermometer on one side inner wall of main part, the middle part at main part top is equipped with the display screen, the connection is inlayed with the main part to the display screen, display screen and test probe electric connection.

Preferably, one side at main part top is equipped with two shift knob, and two shift knob respectively with first electric telescopic handle and second electric telescopic handle electric connection, shift knob one side is equipped with adjust knob, and adjust knob and heating wire electric connection.

The utility model has the advantages that:

1. the utility model discloses a heating wire heats the semiconductor, and reuse thermometer measurement main part internal temperature shows in real time on the display screen, detects the resistivity of semiconductor with the test probe, can measure the resistivity of semiconductor under the different temperatures, can carry out comprehensive analysis to the resistivity of this semiconductor, and the analysis is more comprehensive, the measured data is more reliable.

2. The utility model discloses an electric telescopic handle makes the monitor remove, can realize the detection to each position of semiconductor, need not artifical manual removal monitor or semiconductor, labour saving and time saving, detection efficiency is high.

Drawings

FIG. 1 is a schematic view of the inside of a tester for manufacturing high power semiconductors according to the present invention;

FIG. 2 is a schematic structural view of a clamping seat of a tester for producing high-power semiconductors according to the present invention;

FIG. 3 is an external schematic view of a tester for high power semiconductor manufacturing according to the present invention;

fig. 4 is a semiconductor fixing schematic diagram of the tester for producing high-power semiconductor according to the present invention.

In the figure: 1. a first electric telescopic rod; 2. a collar; 3. a second electric telescopic rod; 4. a thermometer; 5. a clamping seat; 6. an upper fixed block; 7. detecting the probe; 8. a main body; 9. a cross beam; 10. an electric heating wire; 11. a lower fixed block; 12. a clamp arm; 13. a fixed shaft; 14. a wire; 15. a spring; 16. a display screen.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments.

Referring to fig. 1-4, a tester for high-power semiconductor production comprises a main body 8 and a clamping seat 5, wherein the inner walls of two sides of the top of the main body 8 are welded with a same beam 9, one side of the top of the beam 9 is welded with a first electric telescopic rod 1, the telescopic end of the first electric telescopic rod 1 is welded with a lantern ring 2, the lantern ring 2 can move on the beam 9 by the first electric telescopic rod 1, the lantern ring 2 is sleeved on the beam 9, the bottom of the lantern ring 2 is welded with a second electric telescopic rod 3, the bottom of the second electric telescopic rod 3 is provided with the clamping seat 5, the telescopic end of the second electric telescopic rod 3 extends into the clamping seat 5, the telescopic end of the second electric telescopic rod 3 is not connected with the clamping seat 5 in a contact manner, springs 15 are welded on the inner walls of two sides of the clamping seat 5, clamping arms 12 are welded on the other ends of the, the middle part of the clamping arm 12 is penetrated with a fixed shaft 13, the fixed shaft 13 enables the clamping arm 12 to rotate only in the circumferential direction and not move horizontally, the fixed shaft 13 is connected with the clamping arm 12 in a rotating mode, two ends of the fixed shaft 13 are connected with the inner wall of the clamping seat 5 in a welding mode, the bottom of the clamping arm 12 is welded with a detection probe 7, and the detection probe 7 detects the resistivity of a semiconductor.

The utility model discloses in, 5 top both sides welding of grip slipper has the bracing piece, and 2 bottom welded connection of bracing piece top and lantern ring, the bracing piece plays supporting role to grip slipper 5. detection probe 7 is "L" type, inside detection probe 7 top stretches into centre gripping arm 12, detection probe 7 top electric connection has same wire 14, wire 14 makes between detection probe 7 and the semiconductor return circuit, the inside cavity of main part 8 shell, the inside even embedding of main part 8 shell has heating wire 10, heating wire 10 heats main part 8 inside, 8 inside bottom welding of main part has the detection platform, and detect the platform both ends and all weld down fixed block 11, lower fixed block 11 top is equipped with fixed block 6, it is fixed through locking bolt to go up fixed block 6 and lower fixed block 11, go up fixed block 6 and lower fixed block 11 with the semiconductor centre gripping at the middle part, be equipped with thermometer 4 on one side inner wall of main part 8, the middle part at main part 8 top is equipped with display screen 16, display screen 16 and main part 8 connect, display screen 16 and detection probe 7 electric connection, the temperature that the resistivity that thermometer 4 tested and detection probe 7 detected out shows in real time that the resistivity is equipped with on one side of display screen 16 and the electric switch control knob is equipped with two electric telescopic link and the electric telescopic handle of the electric switch of the electric heating switch of the electric telescopic handle of the electric switch 1 and.

The working principle is as follows: opening the side door by using a handle, respectively placing two ends of the semiconductor on the two lower fixed blocks 11, placing the upper fixed block 6, screwing a locking bolt to fix the semiconductor, and closing the side door; pressing a first switch button, starting the first electric telescopic rod 1, enabling the detection probe 7 to move to a first detection position, then closing the first electric telescopic rod 1, pressing a second switch button, starting the second electric telescopic rod 3, enabling the telescopic end of the second electric telescopic rod to squeeze the top end of the clamping arm 12 open, enabling the two detection probes 7 to approach each other and respectively contact with the two sides of the semiconductor for detection, displaying detection data on the display screen 16 in real time, starting the first electric telescopic rod 1 again, enabling the detection probes 7 to move to the next detection position, and repeatedly operating to detect all positions of the semiconductor; after the detection is finished at normal temperature, the heating temperature of the electric heating wire 10 is adjusted by using the adjusting knob, and the operation is repeated to detect the resistivity of the semiconductor at different temperatures.

Having shown and described the basic principles and essential features of the invention and advantages thereof, it will be apparent to those skilled in the art that the invention is not limited to the details of the foregoing exemplary embodiments, but is capable of other specific forms without departing from the spirit or essential characteristics thereof, and it is therefore intended that the embodiments be considered as exemplary and not limiting in any way, since the scope of the invention is defined by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein and are therefore not to be embraced therein by any reference numerals in the claims.

Furthermore, it should be understood that although the present description refers to embodiments, not every embodiment may contain only a single embodiment, and such description is for clarity only, and those skilled in the art should integrate the description, and the embodiments may be combined as appropriate to form other embodiments understood by those skilled in the art.

Claims

1. The tester for the production of the high-power semiconductor comprises a main body (8) and a clamping seat (5), and is characterized in that the inner walls of two sides of the top of the main body (8) are welded with a same cross beam (9), one side of the top of the cross beam (9) is welded with a first electric telescopic rod (1), the telescopic end of the first electric telescopic rod (1) is welded with a lantern ring (2), the lantern ring (2) is sleeved on the cross beam (9), the bottom of the lantern ring (2) is welded with a second electric telescopic rod (3), the bottom of the second electric telescopic rod (3) is provided with the clamping seat (5), the telescopic end of the second electric telescopic rod (3) extends into the clamping seat (5), the telescopic end of the second electric telescopic rod (3) is not connected with the clamping seat (5) in a contact manner, springs (15) are welded on the inner walls of two sides of the clamping seat (5), and clamping arms (12) are welded, the utility model discloses a clamp arm, including centre gripping arm (12), fixed axle (13) have all been run through at centre gripping arm (12) middle part, fixed axle (13) and centre gripping arm (12) rotate to be connected, the both ends and the grip slipper (5) inner wall welded connection of fixed axle (13), the welding of centre gripping arm (12) bottom has test probe (7).

2. The tester for producing the high-power semiconductor as claimed in claim 1, wherein the supporting rods are welded on two sides of the top of the clamping seat (5), and the top of the supporting rods is welded with the bottom of the lantern ring (2).

3. The tester for producing high-power semiconductors according to claim 1, wherein the testing probe (7) is "L", the top of the testing probe (7) extends into the holding arm (12), and the top of the testing probe (7) is electrically connected with the same wire (14).

4. The tester for producing high-power semiconductor as claimed in claim 1, wherein the main body (8) is hollow inside the casing, and the heating wire (10) is embedded uniformly inside the casing of the main body (8).

5. The tester for producing the high-power semiconductor according to claim 1, wherein the bottom of the inside of the main body (8) is welded with a detection table, the two ends of the detection table are welded with lower fixing blocks (11), the top of each lower fixing block (11) is provided with an upper fixing block (6), and the upper fixing block (6) and the lower fixing block (11) are fixed through locking bolts.

6. The tester for producing the high-power semiconductor according to claim 1 or 3, wherein a thermometer (4) is arranged on one side inner wall of the main body (8), a display screen (16) is arranged in the middle of the top of the main body (8), the display screen (16) is connected with the main body (8) in an embedded manner, and the display screen (16) is electrically connected with the detection probe (7).

7. The tester for producing the high-power semiconductor according to claim 1, wherein two switch buttons are arranged on one side of the top of the main body (8), and are electrically connected with the first electric telescopic rod (1) and the second electric telescopic rod (3) respectively, and an adjusting knob is arranged on one side of the switch buttons and is electrically connected with the electric heating wire (10).