CN211061971U - One-to-two test host and system - Google Patents
One-to-two test host and system Download PDFInfo
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- CN211061971U CN211061971U CN202020081781.2U CN202020081781U CN211061971U CN 211061971 U CN211061971 U CN 211061971U CN 202020081781 U CN202020081781 U CN 202020081781U CN 211061971 U CN211061971 U CN 211061971U
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Abstract
The embodiment of the utility model discloses one drags two test hosts and system. The test host computer includes: the control panel and the selection switches are arranged in the case, the power supply is electrically connected with the control panel, each selection switch comprises a fixed end and at least two selection ends, the fixed ends are electrically connected with the control panel, and the control panel is used for controlling the selection switches to switch between the at least two selection ends; at least one group of test port groups is arranged on the case, and each group of test port groups comprises a first test port, at least one second test port and at least two third test ports. Different devices to be tested are connected into the test host to be tested by switching on different selection ends of the selection switch, after one device to be tested is tested, the other device to be tested in a waiting state is tested immediately, the problem that one test host can only test one device to be tested is solved, and the effects of reducing waiting time and improving working efficiency are achieved.
Description
Technical Field
The embodiment of the utility model provides a relate to equipment detection technique, especially relate to a one drags two test hosts and system.
Background
In order to guarantee the product quality in the production process of radio frequency products, the electrical property of the products needs to be detected. Currently, a computer is usually connected to a testing instrument to sequentially inspect devices to be tested. After the existing testing instrument detects one device to be tested, the detected device to be tested needs to be disconnected and then connected with another device to be tested for testing, and the testing efficiency is low.
SUMMERY OF THE UTILITY MODEL
The utility model provides a one drags two test host computers and system to realize that one drags two test host computers and a test instrument connect two equipment that awaits measuring, switch over through the radio frequency switch, reach the effect of ping-pong test (when the testee of a station tested, another station and another testee were connected the operation and entered into after the connection completion and wait for test state).
In a first aspect, an embodiment of the present invention provides a one drags two test hosts and includes: the control panel and the selection switches are arranged in the case, the power supply is electrically connected with the control panel, each selection switch comprises a fixed end and at least two selection ends, the fixed end is electrically connected with the control panel, and the control panel is used for controlling the selection switches to switch between the at least two selection ends;
the chassis is provided with at least one group of test port groups, and each group of test port groups comprises a first test port, at least one second test port and at least two third test ports;
the first test port is electrically connected with the control board and is used for connecting a test instrument;
the second test port is electrically connected with the control board and used for receiving a test feedback signal or outputting a test signal;
the third test ports in the test port group are connected with the selection ends in the selection switch in a one-to-one correspondence mode, and each third test port is used for being connected with a device to be tested.
Optionally, the at least one group of test port group includes a radio frequency test port group, in the radio frequency test port group, the first test port is a first radio frequency port for connecting a radio frequency instrument, the second test port is a second radio frequency port, the third test port is a third radio frequency port, the at least one selector switch includes a radio frequency switch, the first radio frequency port is connected with the third radio frequency port through the control board and the radio frequency switch, and the second radio frequency port is used for outputting a test signal to the burner.
Optionally, the at least one group of test ports includes a power test port group, in the power test port group, the first test port is a first power port for connecting a power instrument, the second test port is a second power port, the third test port is a third power port, the at least one selector switch includes a power relay, the first power port passes through the control board and the power relay, and is connected with the third power port, and the second power port is used for receiving a test feedback signal of the power instrument.
Optionally, the second test port is a USB port.
Optionally, the control panel includes a main board and an expansion control panel, the expansion control panel is electrically connected to the main board, the power supply is electrically connected to the main board, the at least one selection switch is electrically connected to the expansion control panel, and the expansion control panel is used for expanding the port.
Optionally, the motherboard includes 2 USB interfaces, 2 network ports, 1 high-definition multimedia interface, and 2 audio interfaces;
the expansion control panel comprises 5 radio frequency heads, 6 physical serial ports, 8 USB interfaces, 2 parallel interfaces, 3 power supply switching interfaces, a starting external interface, 2 12V output interfaces and 1 24V output interface.
In a second aspect, an embodiment of the present invention further provides a one-to-two test system, which includes at least one test instrument, at least two devices to be tested, and the one-to-two test host provided in the embodiment of the first aspect of the present invention;
the test instrument is connected with a first test port of the one-to-two test host, and the equipment to be tested is connected with a third test port of the one-to-two test host in a one-to-one corresponding mode.
Optionally, the one-to-two test system further includes two recorders, the at least one test instrument includes a radio frequency instrument, the at least two devices to be tested include two devices to be tested, and the recorders are connected to the devices to be tested in a one-to-one correspondence manner;
the at least one group of test port group comprises a radio frequency test port group, wherein the first test port is a first radio frequency port, the at least one second test port comprises two second radio frequency ports, the at least two third test ports comprise two third radio frequency ports, the at least one selector switch comprises a radio frequency switch, the first radio frequency port passes through the control board and the radio frequency switch and is connected with the third radio frequency ports, the second radio frequency ports are connected with the burner in a one-to-one correspondence manner, a radio frequency detection end of the radio frequency instrument is connected with the first radio frequency port, the equipment to be tested is connected with the third radio frequency ports in a one-to-one correspondence manner, and a radio frequency output end of the equipment to be tested is connected with the third radio frequency ports.
Optionally, the at least one test instrument includes a power supply instrument, and the at least two devices under test include two devices under test;
the at least one set of test ports includes a set of power test ports in which, the first test port is a first power port, the second test port includes a second power port, the third test ports include two third power ports, the at least one selection switch includes a power relay, the first power port passes through the control board and the power relay, is connected with the third power supply port, the power supply output end of the power supply instrument is connected with the first power supply port, the electric signal detection end of the power supply instrument is respectively connected with the equipment to be tested at the second power supply port, the signal feedback end of the power supply instrument is connected with the equipment to be tested, the equipment to be tested is connected with the third power supply port in a one-to-one correspondence mode, and the power supply end of the equipment to be tested is connected with the third power supply port.
Optionally, the device under test comprises an assembly printed circuit board.
The utility model discloses a thereby select switch switches over the different selection end of switch-on and inserts test host computer with the equipment to be tested of difference and tests, test host computer tests a equipment to be tested and accomplishes the back, test host computer tests another equipment to be tested that is in wait state at once to another equipment to be tested, solve test host computer test need connect another equipment to be tested disconnection of the equipment to be tested that has tested after having tested an equipment to be tested again, perhaps connect two equipment to be tested and need two test instrument's problem simultaneously, realize that one drags two test host computers and a test instrument and connect two equipment to be tested, switch through select switch, reach the effect of ping-pong test.
Drawings
Fig. 1 is a schematic structural diagram of a one-to-two test host provided in an embodiment of the present invention;
fig. 2 is a schematic structural diagram of another one-to-two test host provided in an embodiment of the present invention;
fig. 3 is a schematic structural diagram of another one-to-two test host provided in an embodiment of the present invention;
fig. 4 is a schematic structural diagram of another one-to-two test host provided in an embodiment of the present invention;
fig. 5 is a schematic structural diagram of another one-to-two test host according to an embodiment of the present invention.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting of the invention. It should be further noted that, for the convenience of description, only some of the structures related to the present invention are shown in the drawings, not all of the structures.
Fig. 1 is a schematic structural diagram of a one-to-two test host provided by an embodiment of the present invention, as shown in fig. 1, the test host includes: the power supply comprises a case 1, a power supply 10, a control panel 20 and at least one selection switch 30, wherein the control panel 20 and the selection switch 30 are arranged in the case 1, the power supply 10 is electrically connected with the control panel 20, each selection switch 30 comprises a fixed end A and at least two selection ends (B and C), the fixed end A is electrically connected with the control panel 20, and the control panel 20 is used for controlling the selection switch 30 to switch between the at least two selection ends (B and C);
at least one group of test port groups 2 is arranged on the chassis 1, and each group of test port groups 2 comprises a first test port 40, at least one second test port 50 and at least two third test ports 60 (including 61 and 62);
the first test port 40 is electrically connected to the control board 20 and is used for connecting a test instrument 70;
the second test port 60 is electrically connected to the control board 20 for receiving a test feedback signal or outputting a test signal;
the third test ports 60 in the test port group 2 are connected to the selection terminals of one selection switch 30 in a one-to-one correspondence manner, and each third test port 60 is used for connecting one device under test 80.
When the test host 100 provided in this embodiment is used to test the device under test 80, the control board 20 sends a test signal to the device under test 80 through the third test port 60, after receiving the test signal, the device under test 80 sends a corresponding return signal, the return signal is transmitted to the selection switch 30 through the third radio frequency port 60, and then is transmitted to the test instrument 70 through the control board 20 and the first test port 40, the test instrument 70 tests the received return signal, and transmits the test result back to the control board 20 through the first test port 40, if the host is connected to a display screen, the test result is displayed at a corresponding position on the display screen. When the selection switch 30 is connected to the selection terminal B, the test host 100 provided in this embodiment is connected to the device to be tested 81 through the third test port 61, and the test host 100 tests the device to be tested 81; when the selection switch 30 turns on the selection terminal C, the test host 100 provided in this embodiment is connected to the device under test 82 through the third test port 62, and the test host 100 tests the device under test 82.
When the test host 100 provided in this embodiment is used to test the device under test 80, the selection switch 30 is first connected to the selection terminal C, and the device under test 81 is tested; after the test is completed, the selection switch 30 is connected to the selection terminal C, and at this time, the test host 100 tests the device under test 82, and at the same time, the device under test connected to the third test port is replaced, so that the device under test is replaced without affecting the test.
The utility model discloses a thereby select switch switches over the different selection end of switch-on and inserts test host computer with the equipment to be tested of difference and tests, test host computer tests a equipment to be tested and accomplishes the back, test host computer tests another equipment to be tested that is in wait state at once to another equipment to be tested, solve test host computer test need connect another equipment to be tested disconnection of the equipment to be tested that has tested after having tested an equipment to be tested again, perhaps connect two equipment to be tested and need two test instrument's problem simultaneously, realize that one drags two test host computers and a test instrument and connect two equipment to be tested, switch through select switch, reach the effect of ping-pong test.
In another embodiment of the present invention, fig. 2 is a schematic structural diagram of another one-to-two test host provided by the embodiment of the present invention, as shown in fig. 2, optionally, at least one set of test port group 2 includes a radio frequency test port group, in the radio frequency test port group, the first test port is a first radio frequency port 41 for connecting a radio frequency instrument 71, the second test port 50 is a second radio frequency port (51 and 52), the third test port 60 is a third radio frequency port (61 and 62), at least one selector switch includes a radio frequency switch 31, the first radio frequency port 41 is connected to the third radio frequency port 60 via a control board 20 and the radio frequency switch 31, and the second radio frequency port 50 is used for outputting a test signal to the burner 90.
For example, as shown in fig. 2, the test host according to the embodiment is connected to two devices under test (81 and 82) through two third rf ports (61 and 62), and connected to two recorders (91 and 92) through two second rf ports (51 and 52), when the rf switch is connected to the selection terminal B, the third rf port 61 and the first rf port 41 are connected to the control board 20 through the rf switch 31, that is, the device under test 81 is connected to the rf instrument 70, and the device under test 81 is connected to the recorders 91; at this time, the device to be tested 82 is in a waiting state, and the burner 92 is in a waiting state; the control board 20 sends a main control signal to the burner 91 through the second radio frequency port 51, the burner 91 sends a test signal to the device 81 to be tested connected with the burner, the device 81 to be tested sends a radio frequency signal after receiving the test signal, the radio frequency signal is transmitted to the radio frequency switch 31 through the third radio frequency port 61, and then is transmitted to the radio frequency instrument 71 through the control board 20 and the first radio frequency port 41, the radio frequency instrument 71 tests the received radio frequency signal, the test result is transmitted back to the control board 20 through the first radio frequency port 41, and the display screen connected with the host displays the test result at a corresponding position. When the radio frequency switch turns on the selection terminal C, similar to the above scheme, the description is not repeated.
In another embodiment of the present invention, fig. 3 is a schematic structural diagram of a further one-to-two test host provided by the embodiment of the present invention, as shown in fig. 3, optionally, at least one set of test ports 2 includes a power test port set, in the power test port set, the first test port is a first power port 42 for connecting a power instrument 72, the second test port is a second power port 53, the third test port 60 is a third power port (63 and 64), at least one selection switch includes a power relay 32, the first power port 42 is connected to the third power port (63 and 64) through the control board 20 and the power relay 32, and the second power port 53 is used for receiving a test feedback signal of the power instrument 72.
Illustratively, as shown in fig. 3, the test host provided in the embodiment connects two devices under test (81 and 82) through two third power ports (63 and 64), connects the power instrument 72 through one second power port 53 and the first power port 42, and when the power relay 32 is connected to the selection terminal B, the third power port 63 and the first power port 42 communicate with the control board 20 through the power relay 32, that is, the device under test 81 communicates with the power instrument 72; at this time, the device under test 82 is in a waiting state; the control board 20 sends a test signal to the device 81 to be tested through the power relay 32 and the third power port 63, the device 81 to be tested sends an electric signal after receiving the test signal, the electric signal is transmitted to the power relay 32 through the third power port 63, the test feedback signal is directly transmitted to the power supply instrument 72, the power supply instrument 72 tests the received feedback signal, the test result is transmitted back to the control board 20 through the second power port 53, and the display screen connected with the host computer displays the test result at a corresponding position. When the power supply relay 32 turns on the selection terminal C, similarly to the above-described scheme, description will not be repeated.
Wherein the power supply instrument is a programmable power supply.
In the above embodiment, the first test port may include a first radio frequency port and a first power port at the same time, the second test port may include a second radio frequency port and a second power port at the same time, and the third test port may include a third radio frequency port and a third power port at the same time, and when the test host tests the device to be tested, the test host may perform the radio frequency test and the power test at the same time.
Optionally, the second test port is a USB port.
Fig. 4 is a schematic structural diagram of another one-driving-two test host provided in an embodiment of the present invention, as shown in fig. 4, optionally, the control board 20 includes a main board 21 and an expansion control board 22, the expansion control board 22 is electrically connected to the main board 21, the power supply 10 is electrically connected to the main board 21, the at least one selection switch 30 is electrically connected to the expansion control board 22, and the expansion control board 22 is used for an expansion port.
The expansion control board 22 expands the ports of the test hosts, so that one test host with two ports is connected with two devices to be tested, and the working efficiency is improved.
Optionally, the main board includes 2 USB interfaces, 2 network ports, 1 high-definition multimedia interface, and 2 audio interfaces;
enabling communication with external devices, transmitting data, and sending video and audio signals.
The expansion control board comprises 5 radio frequency heads, 6 physical serial ports, 8 USB interfaces, 2 parallel interfaces, 3 power supply switching interfaces, a starting external interface, 2 12V output interfaces and 1 24V output interface.
The expansion control board provides 5 radio frequency heads, three of the 5 radio frequency heads are respectively connected with the first radio frequency port and the two third radio frequency ports, and the expansion control board can be connected with a plurality of test instruments and equipment to be tested so as to realize flexible and various radio frequency test methods; the 6 physical serial ports, the 8 USB ports and the 2-path parallel port can be connected with a plurality of external devices, so that the test host can be communicated with the plurality of external devices; the 3 paths of power supply switching interfaces are respectively connected with the first power supply port and the two second power supply ports, so that a plurality of test instruments and equipment to be tested can be connected, and flexible and various power supply test methods are realized; the starting-up external interface is used for connecting external equipment; the test host can supply power to external equipment through the 2-way 12V output interface and the 1-way 24V output interface.
As shown in fig. 1, in a second aspect, an embodiment of the present invention further provides a one-to-two test system, which includes at least one test instrument 70, at least two devices under test (81 and 82), and a one-to-two test host 100 provided in an embodiment of the first aspect of the present invention;
the test instrument 70 is connected to the first test port 40 of the one-drive-two test host 100, and the device under test 80 is connected to the third test port 60 of the one-drive-two test host 1 in a one-to-one correspondence manner.
As shown in fig. 2, optionally, the one-to-two test system further includes two recorders (91 and 92), at least one of the test instruments includes a radio frequency instrument 71, at least two devices under test 80 include two devices under test (81 and 82), and the recorders (91 and 92) are connected to the devices under test (81 and 82) in a one-to-one correspondence;
the at least one group of test ports 2 includes a radio frequency test port group, in the radio frequency test port group, the first test port is a first radio frequency port 41, the at least one second test port 50 includes two second radio frequency ports (51 and 52), the at least two third test ports 60 includes two third radio frequency ports (61 and 62), the at least one selector switch includes a radio frequency switch 31, the first radio frequency port 40 is connected with the third radio frequency port 60 through the control board 20 and the radio frequency switch 31, the second radio frequency ports 50 are connected with the burners (91 and 92) in a one-to-one correspondence, the radio frequency detection end of the radio frequency instrument 71 is connected with the first radio frequency port 41, the devices to be tested (81 and 82) are connected with the third radio frequency ports (61 and 62) in a one-to-one correspondence, and the radio frequency output ends of the devices to be tested (81 and 82) are connected with the third radio frequency ports (61 and 62).
As shown in fig. 3, optionally, the at least one test instrument includes a power supply instrument 72, and the at least two devices under test include two devices under test (81 and 82);
the at least one set of test ports 2 includes a set of power test ports in which a first test port is a first power port 42, a second test port includes a second power port 53, a third test port 60 includes two third power ports (63 and 64), at least one selector switch includes a power relay 32, the first power port 42 is connected to the power relay 32 via the control board 20, the power supply output end of the power supply instrument 72 is connected with the first power supply port 42, the electric signal detection end of the power supply instrument 72 is connected with the second power supply port 53, the signal feedback end of the power supply instrument 72 is connected with the second power supply port 53, the devices to be tested (81 and 82) are correspondingly connected with the third power supply ports (63 and 64) one by one, and the power supply ends (81 and 82) of the devices to be tested are connected with the third power supply ports (63 and 64).
Optionally, the device under test comprises a mounting printed circuit board.
Specifically, the equipment to be tested is the PCB board at bluetooth chip and bluetooth chip place, and the bluetooth chip can't be independently connected with the test host computer, will be surveyed the bluetooth chip paster on the PCB board, is connected the PCB board with the test host computer through third test port, and the PCB board passes through the radio frequency line simultaneously and is connected with the burning ware.
Fig. 5 is a schematic structural diagram of another one-to-two test host according to an embodiment of the present invention, as shown in fig. 5, a P1 port is a power-on external interface in the above embodiment, a P2 port and a P14 port are 2-way 12V output interfaces in the above embodiment, a P3 port is a first power port in the above embodiment, a P4 port is a second power port in the above embodiment, a P5 port is 8 USB interfaces in the above embodiment and is a third test port, a P6 port is a 2-way parallel interface in the above embodiment, a P7 port is 6 physical serial ports in the above embodiment, a P8 port is a second rf port in the above embodiment, a P9 port is a first rf port in the above embodiment, a P10 port is 2 audio interfaces on a motherboard in the above embodiment, a P11 port is 2 network ports on the motherboard in the above embodiment, a P12 port is 2 USB interfaces on the motherboard in the above embodiment, the P13 port is 1 high-definition multimedia interface on the motherboard in the above embodiment, the P15 port is 1 channel 24V output interface in the above embodiment, the P16 port and the P8 port are 5 rf heads in the expansion control board in the above embodiment, and the P17 port is a power interface for supplying power to the test host.
It should be noted that the foregoing is only a preferred embodiment of the present invention and the technical principles applied. It will be understood by those skilled in the art that the present invention is not limited to the particular embodiments described herein, but is capable of various obvious changes, rearrangements and substitutions as will now become apparent to those skilled in the art without departing from the scope of the invention. Therefore, although the present invention has been described in greater detail with reference to the above embodiments, the present invention is not limited to the above embodiments, and may include other equivalent embodiments without departing from the scope of the present invention.
Claims (10)
1. A one-to-two test host, comprising: the control panel and the selection switches are arranged in the case, the power supply is electrically connected with the control panel, each selection switch comprises a fixed end and at least two selection ends, the fixed end is electrically connected with the control panel, and the control panel is used for controlling the selection switches to switch between the at least two selection ends;
the chassis is provided with at least one group of test port groups, and each group of test port groups comprises a first test port, at least one second test port and at least two third test ports;
the first test port is electrically connected with the control board and is used for connecting a test instrument;
the second test port is electrically connected with the control board and used for receiving a test feedback signal or outputting a test signal;
the third test ports in the test port group are connected with the selection ends in the selection switch in a one-to-one correspondence mode, and each third test port is used for being connected with a device to be tested.
2. The one-drive-two test host of claim 1, wherein the at least one test port set comprises a radio frequency test port set, in which the first test port is a first radio frequency port for connecting a radio frequency instrument, the second test port is a second radio frequency port, the third test port is a third radio frequency port, the at least one selection switch comprises a radio frequency switch, the first radio frequency port is connected to the third radio frequency port through the control board and the radio frequency switch, and the second radio frequency port is used for outputting a test signal to the burner.
3. The one-drive-two test host machine as claimed in claim 1 or 2, wherein the at least one test port group comprises a power test port group, in the power test port group, the first test port is a first power port for connecting a power instrument, the second test port is a second power port, the third test port is a third power port, the at least one selector switch comprises a power relay, the first power port is connected with the third power port through the control board and the power relay, and the second power port is used for receiving a test feedback signal of the power instrument.
4. The one-drag-two test host of claim 1, wherein the second test port is a USB port.
5. The one-drive-two test host of claim 1, wherein the control board comprises a motherboard and an expansion control board, the expansion control board is electrically connected to the motherboard, the power supply is electrically connected to the motherboard, the at least one selection switch is electrically connected to the expansion control board, and the expansion control board is used for expansion ports.
6. The one-drive-two test host according to claim 5, wherein the motherboard comprises 2 USB interfaces, 2 network ports, 1 high definition multimedia interface and 2 audio interfaces;
the expansion control panel comprises 5 radio frequency heads, 6 physical serial ports, 8 USB interfaces, 2 parallel interfaces, 3 power supply switching interfaces, a starting external interface, 2 12V output interfaces and 1 24V output interface.
7. A two-in-one test system comprising at least one test instrument, at least two devices under test, and the one-in-two test host of any one of claims 1-6;
the test instrument is connected with a first test port of the one-to-two test host, and the equipment to be tested is connected with a third test port of the one-to-two test host in a one-to-one corresponding mode.
8. The system according to claim 7, further comprising two burners, wherein the at least one test instrument comprises a radio frequency instrument, the at least two devices under test comprise two devices under test, and the burners are connected to the devices under test in a one-to-one correspondence;
the at least one group of test port group comprises a radio frequency test port group, wherein the first test port is a first radio frequency port, the at least one second test port comprises two second radio frequency ports, the at least two third test ports comprise two third radio frequency ports, the at least one selector switch comprises a radio frequency switch, the first radio frequency port passes through the control board and the radio frequency switch and is connected with the third radio frequency ports, the second radio frequency ports are connected with the burner in a one-to-one correspondence manner, a radio frequency detection end of the radio frequency instrument is connected with the first radio frequency port, the equipment to be tested is connected with the third radio frequency ports in a one-to-one correspondence manner, and a radio frequency output end of the equipment to be tested is connected with the third radio frequency ports.
9. The system according to claim 7 or 8, wherein the at least one test instrument comprises a power supply instrument, and the at least two devices under test comprise two devices under test;
the at least one set of test ports includes a set of power test ports in which, the first test port is a first power port, the second test port includes a second power port, the third test ports include two third power ports, the at least one selection switch includes a power relay, the first power port passes through the control board and the power relay, is connected with the third power supply port, the power supply output end of the power supply instrument is connected with the first power supply port, the electric signal detection end of the power supply instrument is respectively connected with the second power supply port, the signal feedback end of the power supply instrument is connected with the equipment to be tested, the equipment to be tested is connected with the third power supply port in a one-to-one corresponding mode, and the power supply end of the equipment to be tested is connected with the third power supply port.
10. The system of claim 7, wherein the device under test comprises a populated printed circuit board.
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| CN202020081781.2U CN211061971U (en) | 2020-01-15 | 2020-01-15 | One-to-two test host and system |
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| CN202020081781.2U CN211061971U (en) | 2020-01-15 | 2020-01-15 | One-to-two test host and system |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112153549A (en) * | 2020-09-16 | 2020-12-29 | 杭州兆华电子有限公司 | Type _ C earphone PCBA, electrical parameter testing system and testing method thereof |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112153549A (en) * | 2020-09-16 | 2020-12-29 | 杭州兆华电子有限公司 | Type _ C earphone PCBA, electrical parameter testing system and testing method thereof |
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