CN211014377U

CN211014377U - Testing device for frequency response of photoelectronic device

Info

Publication number: CN211014377U
Application number: CN201921694321.0U
Authority: CN
Inventors: 孙同勋
Original assignee: Wuhan Dewei Hanke Photoelectric Technology Co ltd
Current assignee: Wuhan Dewei Hanke Photoelectric Technology Co ltd
Priority date: 2019-10-11
Filing date: 2019-10-11
Publication date: 2020-07-14
Anticipated expiration: 2029-10-11

Abstract

The utility model relates to the technical field of optoelectronic devices, and discloses a testing device for frequency response of optoelectronic devices, which rotates through a motor, the motor drives a gear to rotate, the gear drives a rack to move rightwards when rotating, the rack is fixedly arranged in a platform, the rack drives the platform to move rightwards, the platform drives a placing plate and a left fixed block to move rightwards, the placing plate and the left fixed block drive the optoelectronic devices to move rightwards, and then the optoelectronic devices are used by matching a slide block and a chute, the optoelectronic devices enter a fixed groove of the right fixed block, the device moves downwards through a cylinder, the cylinder drives a spring sleeve to move downwards, the spring sleeve drives a metal probe to move downwards, the metal probe drives a metal sheet to move downwards, the metal sheet is contacted with the optoelectronic devices, and then a lead connected with the bottom of the spring is used by matching with a frequency response detector, thereby achieving the purpose of automatic detection.

Description

Testing device for frequency response of photoelectronic device

Technical Field

The utility model relates to an optoelectronic device technical field specifically is an optoelectronic device frequency response's testing arrangement.

Background

Frequency response is an electronic representation of the difference in the processing power of an instrument for signals at different frequencies. Like distortion, this is also a very important parameter indicator. The frequency response is also called a response curve, and refers to a variation curve of the gain along with the frequency. Any sound equipment or carrier has its frequency response curve. The ideal frequency response curve should be flat and the sound signal should pass through without distortion.

At present, optoelectronic device products are increasingly thinned, the density of internal electronic elements and chips is increasingly high, the optoelectronic devices cannot vibrate randomly, otherwise, the optoelectronic devices can be damaged, the devices are generally detected manually, however, detection is not uniform during manual detection, improper detection can cause the optoelectronic devices to flow into the market, and therefore not only is the working efficiency affected, but also the use experience of users is affected.

SUMMERY OF THE UTILITY MODEL

Technical problem to be solved

Not enough to prior art, the utility model provides a photoelectronic device frequency response's testing arrangement, but possess self-holding photoelectronic device, can also the automated inspection advantage, solved at present and seem, photoelectronic device product is more and more thin type, the concentration of its inside electronic component and chip is more and more high, this also has leaded to photoelectronic device be can not random vibration, otherwise can lead to photoelectronic device's damage, generally all be artifical to these devices detect, but can have when artifical the detection detect and detect inhomogeneous, detect and when can not lead to the market that flows in, this not only influences work efficiency, still can influence user's use experience's problem.

(II) technical scheme

But for realizing above-mentioned possesses self-holding photoelectronic device, can also the automated inspection purpose, the utility model provides a following technical scheme: a testing device for frequency response of optoelectronic devices comprises a base, wherein the top of the base is respectively and fixedly provided with a support column and a right fixed block, the top of the base is provided with a chute, the tops of two support columns are fixedly provided with a cross rod, the tops of the cross rods are respectively and fixedly provided with a support and a frequency response detector, the inside of the support is fixedly provided with an air cylinder, an output shaft of the air cylinder is fixedly provided with a spring sleeve, the bottom of the spring sleeve is fixedly provided with a metal probe, the bottom of the metal probe is movably provided with a metal sheet, the inside of the chute is connected with a slide block in a sliding manner, the top of the slide block is fixedly connected with a platform, the top of the platform is respectively and fixedly provided with a left fixed block and a spring, the top of the spring is, the fixed slot has been seted up on the surface of left side fixed block, the inside fixed mounting of base has the motor, the output shaft fixed mounting of motor has the gear, the motion groove has been seted up to the bottom of platform, the inner wall fixed mounting in motion groove has the rack.

Preferably, the support is in a frame form, so that the air cylinder is conveniently fixed.

Preferably, the cross rod is internally provided with a through hole with the diameter equal to that of the spring sleeve, so that the spring sleeve is convenient to fix.

Preferably, the surface of the right fixing block is also provided with a fixing groove, so that the photoelectronic device can be conveniently fixed.

Preferably, the diameter of the fixing groove is equal to the width of the photoelectronic device, so that the photoelectronic device is convenient to fix and cannot shake randomly during testing.

Preferably, the frequency response detector is connected with the placing plate through a lead, and the frequency of the optoelectronic device can be directly observed.

Preferably, the gear and the rack are meshed and connected, so that the gear drives the rack to move conveniently.

(III) advantageous effects

Compared with the prior art, the utility model provides a testing arrangement of optoelectronic device frequency response possesses following beneficial effect:

1. this photoelectronic device frequency response's testing arrangement, rotate through the motor, the motor drives the gear and rotates, the gear drives the rack and moves right when rotating, and the rack is the inside of fixed mounting at the platform, the rack drives the platform and moves right, the platform drives and places board and left fixed block and moves right, place board and left fixed block and drive photoelectronic device and move right, the cooperation of rethread slider and spout is used, photoelectronic device will get into inside the fixed slot of right fixed block, thereby it can the self-holding photoelectronic device to reach to possess.

2. According to the testing device for the frequency response of the photoelectronic device, the cylinder moves downwards, the cylinder drives the spring sleeve to move downwards, the spring sleeve drives the metal probe to move downwards, the metal probe drives the metal sheet to move downwards, the metal sheet is contacted with the photoelectronic device, and the conducting wire connected to the bottom of the spring is matched with the frequency response detector for use, so that automatic detection is achieved.

Drawings

FIG. 1 is a schematic structural view of the present invention;

FIG. 2 is a top view of the structure moving groove of the present invention;

FIG. 3 is an enlarged view of the point A in the structure of FIG. 1;

fig. 4 is a sectional view of the sliding chute of the present invention.

In the figure: the device comprises a base 1, a support column 2, a cross rod 3, a support 4, a cylinder 5, a spring sleeve 6, a metal probe 7, a metal sheet 8, a frequency response detector 9, a motor 10, a right fixing block 11, a sliding block 12, a platform 13, a placing plate 14, an optoelectronic device 15, a left fixing block 16, a fixing groove 17, a moving groove 18, a gear 19, a rack 20, a spring 21 and a sliding groove 22.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Referring to fig. 1-4, a testing apparatus for frequency response of an optoelectronic device, including a base 1, a support column 2 and a right fixed block 11 are respectively and fixedly installed at the top of the base 1, a sliding slot 22 is opened at the top of the base 1, a cross rod 3 is fixedly installed at the top of the two support columns 2, a bracket 4 and a frequency response detector 9 are respectively and fixedly installed at the top of the cross rod 3, the frequency response detector 9 is proposed to be a liubao brand, the model number of the frequency response detector is L B-RZ, the frequency response detector 9 includes a frequency display screen and a switch inside, which is convenient for directly observing frequency test results, a cylinder 5 is fixedly installed inside the bracket 4, the bracket 4 is presented in a frame form, which is convenient for fixing the cylinder 5, a spring sleeve 6 is fixedly installed at an output shaft of the cylinder 5, a through hole with the diameter equal to that of the spring sleeve 6 is opened inside the cross rod 3, which is convenient for fixing the spring sleeve 6, a metal probe 7 is fixedly installed at the bottom of the spring sleeve 6, a metal sheet 8 is movably installed at the bottom of the metal probe 7, a sliding connection with a slide block 12 is connected with a top of the slide block 12, a platform 13, a left fixed block 16 is fixedly installed at the top of the spring 13, a rack 21, a rack 17, a movable rack 15 is connected with a rack 15, a rack 15 fixed groove 18, a rack 15 fixed on which is connected with a rack 17, a rack 17 which is connected with a photoelectric device, a rack 17 which is convenient for directly connected with a rack 17, a.

The working principle is that when the optoelectronic device 15 needs to be tested, the motor 10 is used for rotating, the motor 10 drives the gear 19 to rotate, the gear 19 drives the rack 20 to move rightwards when rotating, the rack 20 is fixedly arranged inside the platform 13, the rack 20 drives the platform 13 to move rightwards, the platform 13 drives the placing plate 14 and the left fixing block 16 to move rightwards, the placing plate 14 and the left fixing block 16 drive the optoelectronic device 15 to move rightwards, then the optoelectronic device 15 enters the fixing groove 17 of the right fixing block 11 through the matching of the sliding block 12 and the sliding groove 22, so that the optoelectronic device 15 is tightly clamped inside the two fixing grooves 17 for detection, when in detection, the air cylinder 5 moves downwards, the air cylinder 5 drives the spring sleeve 6 to move downwards, the spring sleeve 6 drives the metal probe 7 to move downwards, and the metal probe 7 drives the metal sheet 8 to move downwards, the metal sheet 8 is in contact with the optoelectronic device 15, and the spring 21 at the bottom of the placing plate 14 transmits the frequency of the optoelectronic device 15 to the frequency response detector 9 through a lead wire for observation and detection.

In summary, the testing device for the frequency response of the optoelectronic device drives the motor 10 to rotate, the motor 10 drives the gear 19 to rotate, the gear 19 drives the rack 20 to move rightwards when rotating, the rack 20 is fixedly installed inside the platform 13, the rack 20 drives the platform 13 to move rightwards, the platform 13 drives the placing plate 14 and the left fixing block 16 to move rightwards, the placing plate 14 and the left fixing block 16 drive the optoelectronic device 15 to move rightwards, and then the optoelectronic device 15 enters the fixing groove 17 of the right fixing block 11 through the matching use of the sliding block 12 and the sliding groove 22, so as to achieve the purpose of automatically clamping the optoelectronic device 15, the testing device for the frequency response of the optoelectronic device moves downwards through the air cylinder 5, the air cylinder 5 drives the spring sleeve 6 to move downwards, the spring sleeve 6 drives the metal probe 7 to move downwards, and the metal probe 7 drives the metal sheet 8 to move downwards, the metal sheet 8 contacts with the photoelectronic device 15, and then is matched with the frequency response detector 9 through a lead connected with the bottom of the spring 21, so that automatic detection can be realized

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims

1. A test device for frequency response of an optoelectronic device comprises a base (1) and is characterized in that: the top of the base (1) is respectively fixedly provided with a support column (2) and a right fixed block (11), the top of the base (1) is provided with a chute (22), the top of the two support columns (2) is fixedly provided with a cross rod (3), the top of the cross rod (3) is respectively fixedly provided with a support (4) and a frequency response detector (9), the inside of the support (4) is fixedly provided with a cylinder (5), the output shaft of the cylinder (5) is fixedly provided with a spring sleeve (6), the bottom of the spring sleeve (6) is fixedly provided with a metal probe (7), the bottom of the metal probe (7) is movably provided with a metal sheet (8), the inside of the chute (22) is slidably connected with a slide block (12), the top of the slide block (12) is fixedly connected with a platform (13), and the top of the platform (13) is respectively fixedly provided with a left fixed block (16), the top fixed mounting of spring (21) has place board (14), the top swing joint who places board (14) has photoelectronic device (15), fixed slot (17) have been seted up on the surface of left side fixed block (16), the inside fixed mounting of base (1) has motor (10), the output shaft fixed mounting of motor (10) has gear (19), motion groove (18) have been seted up to the bottom of platform (13), the inner wall fixed mounting of motion groove (18) has rack (20).

2. A device for testing the frequency response of an optoelectronic device according to claim 1, wherein: the support (4) is in the form of a frame.

3. A device for testing the frequency response of an optoelectronic device according to claim 1, wherein: the cross rod (3) is internally provided with a through hole with the diameter equal to that of the spring sleeve (6).

4. A device for testing the frequency response of an optoelectronic device according to claim 1, wherein: the surface of the right fixing block (11) is also provided with a fixing groove (17).

5. A device for testing the frequency response of an optoelectronic device according to claim 1, wherein: the diameter of the fixing groove (17) is equal to the width of the optoelectronic component (15).

6. A device for testing the frequency response of an optoelectronic device according to claim 1, wherein: the frequency response detector (9) is connected with the placing plate (14) through a lead.

7. A device for testing the frequency response of an optoelectronic device according to claim 1, wherein: the gear (19) is meshed with the rack (20).