CN211014352U

CN211014352U - Portable semiconductor discrete device testing arrangement

Info

Publication number: CN211014352U
Application number: CN201921929915.5U
Authority: CN
Inventors: 薛芳峰; 吴方军; 乔德定; 严建华; 喻建华; 吴恒华
Original assignee: Dexing Yifa Power Semiconductor Co ltd
Current assignee: Dexing Yifa Power Semiconductor Co ltd
Priority date: 2019-11-11
Filing date: 2019-11-11
Publication date: 2020-07-14
Anticipated expiration: 2029-11-11

Abstract

The utility model discloses a portable discrete semiconductor device testing arrangement, including the tester, the slot has all been seted up to the both sides at tester top, the jack has been seted up in the outside of slot inner wall, the inner wall of slot is provided with the casing, the top fixedly connected with handle of casing, shells inner wall's front side fixedly connected with bearing, the inner ring fixedly connected with spliced pole of bearing, the back fixedly connected with gear of spliced pole. The utility model discloses a set up tester, slot, jack, casing, handle, bearing, spliced pole, gear, pinion rack, sliding sleeve, slide bar, movable plate and insert the post, it is great to have solved its volume of current testing arrangement, and the workman of being not convenient for removes and carries, when carrying, needs protection testing arrangement, the problem of wasting time and energy, this portable semiconductor discrete device testing arrangement possesses the advantage of conveniently carrying, has improved testing arrangement's practicality, the user's of being convenient for use.

Description

Portable semiconductor discrete device testing arrangement

Technical Field

The utility model relates to a discrete semiconductor device technical field specifically is a portable discrete semiconductor device testing arrangement.

Background

Semiconductor discrete devices generally refer to semiconductor transistor diodes, semiconductor triodes, triodes and semiconductor special devices.

Semiconductor discrete device need use testing arrangement at the in-process of production for detect semiconductor discrete device, its volume of current testing arrangement is great, and the workman of being not convenient for removes and carries, when carrying, needs protection testing arrangement, wastes time and energy, has reduced testing arrangement's practicality, the not convenient to use person's use.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a portable semiconductor discrete device testing arrangement possesses the advantage that conveniently carries, and it is great to have solved its volume of current testing arrangement, and the workman of being not convenient for removes and carries, when carrying, needs protection testing arrangement, the problem that wastes time and energy.

In order to achieve the above object, the utility model provides a following technical scheme: the utility model provides a portable discrete semiconductor device testing arrangement, includes the tester, the slot has all been seted up to the both sides at tester top, the jack has been seted up in the outside of slot inner wall, the inner wall of slot is provided with the casing, the top fixedly connected with handle of casing, shells inner wall's front side fixedly connected with bearing, the inner ring fixedly connected with spliced pole of bearing, the back fixedly connected with gear of spliced pole, the bottom meshing of gear has the pinion rack, the bottom fixedly connected with sliding sleeve of pinion rack, the inner wall sliding connection of sliding sleeve has the slide bar, the both ends of slide bar all with the inner wall fixed connection of casing, the bottom fixedly connected with movable plate of sliding sleeve, the bottom of movable plate and the inner wall sliding connection of casing, the outer side fixedly connected with of movable plate is with the inserted column that the jack cooperation was used.

Preferably, the surface of the handle is fixedly connected with a sponge sleeve, and the surface of the sponge sleeve is provided with anti-skid lines.

Preferably, the front side of spliced pole runs through the casing and extends to the outside fixedly connected with carousel of casing, the surface of carousel is provided with anti-skidding line.

Preferably, both ends on the surface of the sliding rod and the outer side of the sliding sleeve are fixedly connected with limiting plates, and the inner sides of the limiting plates are fixedly connected with cushion pads.

Preferably, the inner side of the moving plate is fixedly connected with a spring, and the inner side of the spring is fixedly connected with the inner wall of the shell.

Preferably, the bottom of the moving plate is fixedly connected with a sliding block, a sliding groove matched with the sliding block for use is formed in the inner wall of the shell, and the sliding block is connected inside the sliding groove in a sliding mode.

Compared with the prior art, the beneficial effects of the utility model are as follows:

1. the utility model discloses a set up tester, slot, jack, casing, handle, bearing, spliced pole, gear, pinion rack, sliding sleeve, slide bar, movable plate and insert the post, it is great to have solved its volume of current testing arrangement, and the workman of being not convenient for removes and carries, when carrying, needs protection testing arrangement, the problem of wasting time and energy, this portable semiconductor discrete device testing arrangement possesses the advantage of conveniently carrying, has improved testing arrangement's practicality, the user's of being convenient for use.

2. The utility model discloses a setting of sponge cover, the compliance of handle has been increased, prevent handle fish tail palm, setting through the carousel, the area of contact between spliced pole and the user has been increased, convenient to use person rotates the spliced pole, setting through the limiting plate, can restrict the sliding sleeve, the motion range of convenient to use person control sliding sleeve, setting through the spring, can provide thrust for the movable plate, make more smooth and easy of movable plate motion, setting through slider and spout, the frictional force between movable plate and the shells inner wall has been reduced, make more smooth and easy of movable plate motion, slider and spout have also played spacing effect simultaneously.

Drawings

FIG. 1 is a schematic structural view of the present invention;

FIG. 2 is a partial cross-sectional view of the structure of the present invention;

fig. 3 is an enlarged view of a portion a in the structure diagram 2 of the present invention.

In the figure: the device comprises a tester 1, a slot 2, a jack 3, a shell 4, a handle 5, a bearing 6, a connecting column 7, a gear 8, a toothed plate 9, a sliding sleeve 10, a sliding rod 11, a moving plate 12, a inserting column 13, a sponge sleeve 14, a rotary table 15, a limiting plate 16, a spring 17, a sliding block 18 and a sliding groove 19.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Referring to fig. 1-3, a portable semiconductor discrete device testing apparatus comprises a tester 1, slots 2 are respectively formed on both sides of the top of the tester 1, jacks 3 are formed on the outer sides of the inner walls of the slots 2, a shell 4 is arranged on the inner wall of each slot 2, a handle 5 is fixedly connected to the top of each shell 4, a sponge sleeve 14 is fixedly connected to the surface of each handle 5, anti-skid patterns are arranged on the surface of each sponge sleeve 14, the softness of each handle 5 is increased by the arrangement of the sponge sleeve 14, the palm of each handle 5 is prevented from being scratched by the handle 5, a bearing 6 is fixedly connected to the front side of the inner wall of each shell 4, a connecting column 7 is fixedly connected to the inner ring of each bearing 6, the front side of each connecting column 7 penetrates through each shell 4 and extends to the outer side of each shell 4, a turntable 15 is fixedly connected to the surface of each turntable, the connecting column 7 is convenient for a user to rotate, a gear 8 is fixedly connected to the back of the connecting column 7, a toothed plate 9 is meshed at the bottom of the gear 8, a sliding sleeve 10 is fixedly connected to the bottom of the toothed plate 9, a sliding rod 11 is slidably connected to the inner wall of the sliding sleeve 10, limiting plates 16 are fixedly connected to the two ends of the surface of the sliding rod 11 and positioned on the outer side of the sliding sleeve 10, a buffer pad is fixedly connected to the inner sides of the limiting plates 16, the sliding sleeve 10 can be limited by the arrangement of the limiting plates 16, the user can conveniently control the movement range of the sliding sleeve 10, the two ends of the sliding rod 11 are fixedly connected to the inner wall of the shell 4, a moving plate 12 is fixedly connected to the bottom of the sliding sleeve 10, a spring 17 is fixedly connected to the inner side of the moving plate 12, the inner side of the spring 17 is fixedly connected to the inner wall, the inner wall of the shell 4 is provided with a sliding groove 19 matched with the sliding block 18 for use, the sliding block 18 is connected to the inside of the sliding groove 19 in a sliding mode, friction force between the moving plate 12 and the inner wall of the shell 4 is reduced through the arrangement of the sliding block 18 and the sliding groove 19, the moving plate 12 can move more smoothly, the sliding block 18 and the sliding groove 19 also play a limiting role, the bottom of the moving plate 12 is connected with the inner wall of the shell 4 in a sliding mode, and the outer side of the moving plate 12 is fixedly connected with an insertion column 13 matched with the insertion hole 3 for use.

During the use, the user inserts casing 4 to the inside of slot 2, rotatory carousel 15, carousel 15 drives spliced pole 7 rotatory, spliced pole 7 drives gear 8 through bearing 6 and rotates, gear 8 drives pinion rack 9 and moves to the outside, pinion rack 9 drives sliding sleeve 10 and moves to the outside, sliding sleeve 10 drives movable plate 12 and moves to the outside at the surface of slide bar 11, movable plate 12 drives post 13 and moves to the outside, make post 13 insert to the inside of jack 3, fix casing 4 on the surface of tester 1, during the removal, directly hold handle 5 alright take away.

In summary, the following steps: this discrete device testing arrangement of portable semiconductor through setting up tester 1, slot 2, jack 3, casing 4, handle 5, bearing 6, spliced pole 7, gear 8, pinion rack 9, sliding sleeve 10, slide bar 11, movable plate 12 and inserted column 13, has solved its volume of current testing arrangement great, and the workman of being not convenient for removes and carries, when carrying, need protect testing arrangement, the problem that wastes time and energy.

It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims

1. A portable semiconductor discrete device testing apparatus, comprising a tester (1), characterized in that: the testing device comprises a testing instrument (1), a slot (2) is formed in each of two sides of the top of the testing instrument (1), a jack (3) is formed in the outer side of the inner wall of the slot (2), a shell (4) is arranged on the inner wall of the slot (2), a handle (5) is fixedly connected to the top of the shell (4), a bearing (6) is fixedly connected to the front side of the inner wall of the shell (4), a connecting column (7) is fixedly connected to the inner ring of the bearing (6), a gear (8) is fixedly connected to the back of the connecting column (7), a toothed plate (9) is meshed with the bottom of the gear (8), a sliding sleeve (10) is fixedly connected to the bottom of the toothed plate (9), a sliding rod (11) is slidably connected to the inner wall of the sliding sleeve (10), two ends of the sliding rod (11) are fixedly connected with the inner, the bottom of the moving plate (12) is in sliding connection with the inner wall of the shell (4), and the outer side of the moving plate (12) is fixedly connected with an inserting column (13) matched with the inserting hole (3) for use.

2. A portable semiconductor discrete device testing apparatus according to claim 1, characterized in that: the surface of the handle (5) is fixedly connected with a sponge sleeve (14), and the surface of the sponge sleeve (14) is provided with anti-skid lines.

3. A portable semiconductor discrete device testing apparatus according to claim 1, characterized in that: the front side of spliced pole (7) runs through casing (4) and extends to outside fixedly connected with carousel (15) of casing (4), the surface of carousel (15) is provided with anti-skidding line.

4. A portable semiconductor discrete device testing apparatus according to claim 1, characterized in that: the two ends of the surface of the sliding rod (11) are fixedly connected with limiting plates (16) on the outer sides of the sliding sleeves (10), and the inner sides of the limiting plates (16) are fixedly connected with cushion pads.

5. A portable semiconductor discrete device testing apparatus according to claim 1, characterized in that: the inner side of the moving plate (12) is fixedly connected with a spring (17), and the inner side of the spring (17) is fixedly connected with the inner wall of the shell (4).

6. A portable semiconductor discrete device testing apparatus according to claim 1, characterized in that: the bottom of the moving plate (12) is fixedly connected with a sliding block (18), the inner wall of the shell (4) is provided with a sliding groove (19) matched with the sliding block (18) for use, and the sliding block (18) is connected inside the sliding groove (19) in a sliding mode.