CN210954118U

CN210954118U - Integrated circuit test support plate

Info

Publication number: CN210954118U
Application number: CN201921880655.7U
Authority: CN
Inventors: 方经军
Original assignee: Suzhou Stende Electronic Technology Co Ltd
Current assignee: Suzhou Stende Electronic Technology Co Ltd
Priority date: 2019-11-04
Filing date: 2019-11-04
Publication date: 2020-07-07
Anticipated expiration: 2029-11-04

Abstract

The utility model discloses an integrated circuit tests support plate relates to the integrated circuit field, comprising a base plate, the top front end fixedly connected with test support plate of bottom plate, test support plate's top is provided with integrated circuit board, be provided with the carousel in the middle of test support plate's the rear, the top fixedly connected with support column of carousel, the top fixedly connected with connecting plate of support column, one side threaded connection that the support column was kept away from to the connecting plate has the lead screw, the bottom fixedly connected with clamp plate of lead screw. The utility model discloses a set up lead screw and clamp plate in integrated circuit board's top, in integrated circuit board test process, rotatory lead screw drives the clamp plate and presses down fixedly to integrated circuit board, is favorable to the accuracy nature of test result, reduces test error, through compression spring's setting, when the clamp plate is exerted pressure, compression spring can play the effect of buffering to integrated circuit board, has played effectual guard action to integrated circuit board.

Description

Integrated circuit test support plate

Technical Field

The utility model relates to an integrated circuit field, in particular to integrated circuit test support plate.

Background

An integrated circuit is a miniature electronic device or component, and adopts a certain process to interconnect the elements of transistor, resistor, capacitor and inductor, etc. required in a circuit with the wiring, and make them produce on a small or several small semiconductor wafers or medium substrates, then package them in a tube shell to form a miniature structure with required circuit function, in which all the elements are formed into a whole body, so that the electronic element can be greatly developed towards the aspects of microminiaturization, low power consumption, intellectualization and high reliability.

Therefore, it is desirable to provide an integrated circuit test carrier that solves the above problems.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide an integrated circuit tests support plate to solve the problem that proposes among the above-mentioned background art.

In order to achieve the above object, the utility model provides a following technical scheme: an integrated circuit test carrier plate comprises a bottom plate, wherein a test carrier plate is fixedly connected to the front end above the bottom plate, an integrated circuit board is arranged above the test carrier plate, a turntable is arranged in the middle of the rear part of the test carrier plate, a support column is fixedly connected to the top end of the turntable, a connecting plate is fixedly connected to the top end of the support column, a lead screw is in threaded connection with one side of the connecting plate, which is far away from the support column, and a pressing plate is fixedly connected to the bottom end of the lead;

the upper surface of the bottom plate is fixedly connected with a plurality of compression springs, the upper surface of the test carrier plate is fixedly provided with a plurality of joints, contact heads are fixedly connected above the joints, a lower protective cover is arranged on the outer side of each contact head, an upper protective cover is connected above the outer side of the lower protective cover in a sliding manner, and a through hole is formed in the middle of the top of the upper protective cover;

the left and right sides of lower protection casing has all seted up the activity groove, the inside fixedly connected with memory spring in activity groove, the one end fixedly connected with fixture block of lower protection casing is kept away from to memory spring, the spout has all been seted up to the inner wall left and right sides of going up the protection casing, the upper and lower both ends of spout all are provided with the draw-in groove.

Optionally, the left end of the test carrier plate is rotatably connected with a cover plate, and the bottom of the turntable is fixedly connected with the bottom plate.

Optionally, the test carrier is fixedly connected to the bottom plate through a compression spring, and the pressing plate is made of a rubber material.

Optionally, the bottom and the test support plate fixed connection of lower protection casing, the diameter value of through-hole is greater than the diameter value at contact head top.

Optionally, the two movable grooves are horizontally and symmetrically distributed, and the fixture block is bullet-shaped.

Optionally, the two sliding grooves are horizontally and symmetrically distributed, and the clamping groove is formed in the upper protective cover.

Optionally, the depth value of draw-in groove is greater than the depth value of spout, fixture block and draw-in groove joint.

The utility model discloses a technological effect and advantage:

1. the utility model discloses a set up lead screw and clamp plate in integrated circuit board's top, in integrated circuit board test process, rotatory lead screw drives the clamp plate and presses down fixedly to integrated circuit board, is favorable to the accuracy nature of test result, reduces test error, through compression spring's setting, when the clamp plate is exerted pressure, compression spring can play the effect of buffering to integrated circuit board, has played effectual guard action to integrated circuit board.

2. The utility model discloses an go up the setting of protection casing, movable groove, memory spring, fixture block, spout and draw-in groove, the test support plate finishes using the back, will go up the protection casing and upwards lift up, the fixture block removes the certain distance joint inside the draw-in groove, can make and go up the protection casing and wrap up the contact head is fixed completely, and the butt joint contact has played effectual guard action, through the setting of apron, has played effectual guard action to the test support plate, prevents that it from receiving the damage to effectual dustproof effect has been played.

Drawings

Fig. 1 is a schematic structural diagram of the present invention.

Fig. 2 is a schematic view of the test carrier structure of the present invention.

Fig. 3 is a schematic sectional view of the contact head structure of the present invention.

Fig. 4 is a schematic view of a part of an enlarged structure at a in fig. 3 according to the present invention.

In the figure: 1. a base plate; 2. testing the carrier plate; 3. a cover plate; 4. an integrated circuit board; 5. a turntable; 6. a support pillar; 7. a connecting plate; 8. a screw rod; 9. pressing a plate; 10. a compression spring; 11. a joint; 12. a contact head; 13. a lower protective cover; 14. an upper protective cover; 15. a through hole; 16. a movable groove; 17. a memory spring; 18. a clamping block; 19. a chute; 20. a clamping groove.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", and the like, indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for convenience of description and simplicity of description, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, should not be construed as limiting the present invention.

In the present invention, unless otherwise expressly stated or limited, the terms "disposed," "mounted," "connected," and "fixed" are to be construed broadly, e.g., as meaning either a fixed connection or a removable connection; may be a mechanical connection; may be directly connected or indirectly connected through an intermediate. The specific meaning of the above terms in the present invention can be understood according to specific situations by those skilled in the art.

Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless specifically limited otherwise.

The utility model provides an integrated circuit testing carrier plate as shown in figures 1-4, which comprises a bottom plate 1, a testing carrier plate 2 is fixedly connected with the front end of the upper part of the bottom plate 1, a cover plate 3 is rotatably connected with the left end of the testing carrier plate 2, the testing carrier plate 2 is effectively protected from being damaged by the arrangement of the cover plate 3, and an effective dustproof effect is achieved, an integrated circuit board 4 is arranged above the testing carrier plate 2, a rotary disc 5 is arranged in the middle of the rear part of the testing carrier plate 2, the bottom of the rotary disc 5 is fixedly connected with the bottom plate 1, a support column 6 is fixedly connected with the top end of the rotary disc 5, a connecting plate 7 is fixedly connected with the top end of the support column 6, a screw rod 8 is connected with one side of the connecting plate 7 far away from the support column 6 by screw threads, a pressing plate 9 is fixedly connected with the bottom end of the screw, in the testing process of the integrated circuit board 4, the rotary screw rod 8 drives the pressing plate 9 to press and fix the integrated circuit board 4, so that the accuracy of a testing result is facilitated, and the testing error is reduced;

the upper surface of the base plate 1 is fixedly connected with a plurality of compression springs 10, the test carrier plate 2 is fixedly connected with the base plate 1 through the compression springs 10, when the pressing plate 9 presses, the compression springs 10 can play a buffering effect on the integrated circuit board 4 and play an effective protection role on the integrated circuit board 4, a plurality of joints 11 are fixedly arranged on the upper surface of the test carrier plate 2, contact heads 12 are fixedly connected above the joints 11, lower protective covers 13 are arranged on the outer sides of the contact heads 12, the bottoms of the lower protective covers 13 are fixedly connected with the test carrier plate 2, upper protective covers 14 are slidably connected above the outer sides of the lower protective covers 13, through holes 15 are formed in the middles of the tops of the upper protective covers 14, and the diameter values of the through holes 15 are larger than the diameter values of;

the left side and the right side of the lower protective cover 13 are respectively provided with an active slot 16, the two active slots 16 are horizontally and symmetrically distributed, the interior of the active slot 16 is fixedly connected with a memory spring 17, one end of the memory spring 17 far away from the lower protective cover 13 is fixedly connected with a clamping block 18, the clamping block 18 is in a bullet shape, the left side and the right side of the inner wall of the upper protective cover 14 are respectively provided with a sliding slot 19, the two sliding slots 19 are horizontally and symmetrically distributed, the upper end and the lower end of each sliding slot 19 are respectively provided with a clamping slot 20, each clamping slot 20 is arranged on the upper protective cover 14, the depth value of each clamping slot 20 is larger than that of each sliding slot 19, each clamping block 18 is clamped with each clamping slot 20, after the test carrier plate 2 is used, the upper protective cover 14 is lifted upwards, each clamping block 18 moves for a certain distance and is clamped in each clamping slot 20, and the contact head 12, the contact 12 is effectively protected.

The utility model discloses the theory of operation:

when the test device is used, the cover plate 3 is opened, the integrated circuit board 4 is placed on the test carrier plate 2, the connecting plate 7 is pulled, the turntable 5 drives the connecting plate 7 to rotate to the position above the integrated circuit board 4, the screw 8 is rotated to drive the pressing plate 9 to press and fix the integrated circuit board 4, when the pressing plate 9 presses, the compression spring 10 drives the test carrier plate 2 to buffer downwards, the test carrier plate 2 and the integrated circuit board 4 are both effectively protected, after the test is finished, the upper protective cover 14 is pulled upwards, the fixture block 18 slides out from the clamping groove 20 on the upper side, the fixture block 18 slides to the clamping groove 20 on the lower side from the sliding groove 19, the memory spring 17 pushes the fixture block 18 into the clamping groove 20 to be locked, the upper protective cover 14 completely wraps the contact 12, and the contact 12 is effectively protected.

Finally, it should be noted that: although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that modifications and variations can be made in the embodiments or in part of the technical features of the embodiments without departing from the spirit and the scope of the invention.

Claims

1. An integrated circuit test carrier board, comprising a base plate (1), characterized in that: a testing carrier plate (2) is fixedly connected to the front end of the upper portion of the bottom plate (1), an integrated circuit board (4) is arranged above the testing carrier plate (2), a rotary table (5) is arranged in the middle of the rear portion of the testing carrier plate (2), a supporting column (6) is fixedly connected to the top end of the rotary table (5), a connecting plate (7) is fixedly connected to the top end of the supporting column (6), a lead screw (8) is connected to one side, far away from the supporting column (6), of the connecting plate (7) in a threaded mode, and a pressing plate (9) is fixedly connected to the bottom end;

the upper surface of the bottom plate (1) is fixedly connected with a plurality of compression springs (10), the upper surface of the test carrier plate (2) is fixedly provided with a plurality of joints (11), a contact head (12) is fixedly connected above the joints (11), a lower protective cover (13) is arranged on the outer side of the contact head (12), an upper protective cover (14) is connected above the outer side of the lower protective cover (13) in a sliding manner, and the middle of the top of the upper protective cover (14) is provided with a through hole (15);

activity groove (16) have all been seted up to the left and right sides of lower protection casing (13), the inside fixedly connected with memory spring (17) in activity groove (16), the one end fixedly connected with fixture block (18) of lower protection casing (13) are kept away from in memory spring (17), spout (19) have all been seted up to the inner wall left and right sides of going up protection casing (14), the upper and lower both ends of spout (19) all are provided with draw-in groove (20).

2. The integrated circuit test carrier of claim 1, wherein:

the left end of the test carrier plate (2) is rotatably connected with a cover plate (3), and the bottom of the turntable (5) is fixedly connected with the bottom plate (1).

3. The integrated circuit test carrier of claim 1, wherein:

the test carrier plate (2) is fixedly connected with the bottom plate (1) through a compression spring (10), and the pressing plate (9) is made of rubber materials.

4. The integrated circuit test carrier of claim 1, wherein:

the bottom and the test support plate (2) fixed connection of lower protection casing (13), the diameter value of through-hole (15) is greater than the diameter value at contact (12) top.

5. The integrated circuit test carrier of claim 1, wherein:

the two movable grooves (16) are horizontally and symmetrically distributed, and the fixture blocks (18) are bullet-shaped.

6. The integrated circuit test carrier of claim 1, wherein:

the two sliding grooves (19) are horizontally and symmetrically distributed, and the clamping grooves (20) are formed in the upper protective cover (14).

7. The integrated circuit test carrier of claim 1, wherein:

the depth value of draw-in groove (20) is greater than the depth value of spout (19), fixture block (18) and draw-in groove (20) joint.