CN210923535U - Infrared thermal image probe structure for automobile coating detection - Google Patents

Infrared thermal image probe structure for automobile coating detection Download PDF

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Publication number
CN210923535U
CN210923535U CN201921823037.9U CN201921823037U CN210923535U CN 210923535 U CN210923535 U CN 210923535U CN 201921823037 U CN201921823037 U CN 201921823037U CN 210923535 U CN210923535 U CN 210923535U
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Prior art keywords
shell
objective lens
mounting
infrared
probe
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CN201921823037.9U
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Chinese (zh)
Inventor
罗国栋
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Dongguan Xintai Instrument Co ltd
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Dongguan Xintai Instrument Co ltd
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Priority to CN201921823037.9U priority Critical patent/CN210923535U/en
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Abstract

The utility model provides an infrared thermal imaging probe structure for automobile coating detection, which comprises a mounting seat and a probe shell arranged on the mounting seat; the probe shell comprises an upper shell and a lower shell, an objective lens assembly is arranged in the upper shell, a substrate is arranged in the lower shell, a conductive lining plate is arranged in the middle of the upper end of the substrate, and a conductive copper plate is arranged above the conductive lining plate; the upper end of the substrate is also provided with a mounting clamp, a mounting cylinder is arranged in the mounting clamp, an infrared detector is arranged in the mounting cylinder, and the infrared detector is connected with the conductive copper plate through a conducting piece; the lower end of the base plate is provided with a circuit board. The objective lens assembly and the infrared detector are respectively fixed in the upper shell and the lower shell, then the fixed probe shell is fixed with the mounting seat, the mounting seat is used for being fixed with the assembly shell, and the objective lens assembly and the infrared detector are integrated in the probe shell, so that the structure is tighter.

Description

Infrared thermal image probe structure for automobile coating detection
Technical Field
The utility model relates to a thermal infrared imager technique, concretely relates to thermal infrared imager for car coating film detects, especially a thermal infrared image probe structure that car coating film detected.
Background
In the field of automobile coating, the traditional mode is to judge whether the coating is good or bad by manual experience, and the integrity and the smoothness of a paint film formed after the automobile coating are difficult to judge by naked eyes.
An infrared thermal imager is a device that converts an image of the temperature distribution of a target object into a visible image by detecting the infrared radiation of the target object and applying signal processing, photoelectric conversion, and other means using an infrared thermal imaging technique. If the paint film is incomplete or uneven, the obtained temperature distribution images have great difference, so that many manufacturers use infrared thermal imagers to observe the integrity and the flatness of the paint film.
Existing thermal infrared imagers for automobile film coating are all purchased finished products, and thermal infrared imaging probe structures of the existing thermal infrared imagers are embedded in a shell, wherein an objective lens system and a detection system are designed in a separated structure, so that a larger structural space is needed.
SUMMERY OF THE UTILITY MODEL
In view of this, the main objective of the present invention is to provide an infrared thermal imaging probe structure for detecting a coated film of an automobile.
The utility model adopts the technical proposal that:
an infrared thermal imaging probe structure for detecting the coated film of car is composed of
The mounting seat is arranged on the probe shell on the mounting seat;
the probe shell comprises an upper shell and a lower shell, an objective lens assembly is arranged in the upper shell, a substrate is arranged in the lower shell, a conductive lining plate is arranged in the middle of the upper end of the substrate, and a conductive copper plate is arranged above the conductive lining plate;
the upper end of the substrate is also provided with a mounting clamp, a mounting cylinder is arranged in the mounting clamp, an infrared detector is arranged in the mounting cylinder, and the infrared detector is connected with the conductive copper plate through a conducting piece; the lower end of the base plate is provided with a circuit board.
Furthermore, the objective lens assembly comprises an objective lens barrel, an infrared lens arranged inside the objective lens barrel, a support ring arranged on the outer end face of the objective lens barrel, and a positioning ring arranged on the outer end face of the support ring.
Furthermore, the bottom edge of the upper shell is provided with an outer mounting lining plate.
Furthermore, the upper end of the mounting clamp is provided with a positioning column.
Further, the upper shell and the lower shell are fixed through screws.
In the above, the objective lens assembly and the infrared detector are respectively fixed in the upper shell and the lower shell, the upper shell and the lower shell are fixed to form the probe shell, then the fixed probe shell is fixed with the mounting seat, and the mounting seat is used for being fixed with the assembly shell.
Drawings
Fig. 1 is a schematic structural diagram of the present invention;
FIG. 2 is a schematic diagram of the structure of FIG. 1, partially broken away;
fig. 3 is the mounting structure diagram of the mid-infrared detector and the circuit board of the present invention.
Detailed Description
The invention will be described in detail with reference to the drawings and specific embodiments, wherein the exemplary embodiments and descriptions are provided to explain the invention, but not to limit the invention.
Referring to fig. 1 to 3, the utility model discloses an infrared thermal imaging probe structure for automobile coating detection, which comprises
The mounting seat 7 is arranged on the probe shell on the mounting seat 7;
the probe shell comprises an upper shell 75 and a lower shell 72, an installation outer lining plate 79 is arranged at the bottom edge of the upper shell 75, a mounting hole is formed in the installation outer lining plate 79, a base plate 80 is arranged in the lower shell, a screw 83 is arranged on the base plate 80, and the screw 83 is fixed with the mounting hole to be fixed between the upper shell and the lower shell.
An objective lens assembly 73 is arranged inside the upper shell 75, the objective lens assembly 73 includes an objective lens barrel 76, an infrared lens 74 arranged inside the objective lens barrel 76, a support ring 77 arranged on the outer end face of the objective lens barrel 76, and a positioning ring 78 arranged on the outer end face of the support ring 77, the positioning ring 78 is matched and corresponding to the mounting groove inside the upper shell 75, and the support ring 77 is used for protecting the outer end of the objective lens barrel 76, so as to prevent the objective lens barrel 76 from being damaged during assembly.
A base plate 80 is arranged in the lower shell 72, a conductive lining plate 89 is arranged in the middle of the upper end of the base plate 80, and a conductive copper plate 88 is arranged above the conductive lining plate 89; the upper end of the substrate 80 is also provided with a mounting clamp 84, a mounting cylinder 85 is arranged in the mounting clamp 84, an infrared detector 82 is arranged in the mounting cylinder 85, and the infrared detector 82 is connected with a conductive copper plate 88 through a conducting piece 87; the lower end of the base plate 80 is provided with a circuit board 81.
In the above, the infrared detector preferably selects a medium-wave InSb (indium antimonide) detector and an MCT (mercury cadmium telluride) detector, and the circuit board is a general circuit board integrated with an ARM processor.
When the probe is installed, the positioning ring 78 is screwed in along the installation groove in the upper shell, the infrared detector 82 is installed on the substrate 80, the circuit board 81 is fixed on the substrate 80, the fixing mode can be gluing or screw fixing, the objective assembly and the infrared detector 82 are respectively fixed in the upper shell 75 and the lower shell 72, the upper shell 75 and the lower shell 72 are fixed to form a probe shell, then the fixed probe shell is fixed with the mounting seat, and the mounting seat is used for being fixed with the assembly shell.
The technical solutions disclosed in the embodiments of the present invention are described in detail above, and the principles and embodiments of the present invention are explained herein by using specific embodiments, and the descriptions of the above embodiments are only applicable to help understand the principles of the embodiments of the present invention; meanwhile, for a person skilled in the art, according to the embodiments of the present invention, there may be variations in the specific implementation manners and application ranges, and in summary, the content of the description should not be construed as a limitation to the present invention.

Claims (5)

1. An infrared thermal imaging probe structure for automobile film coating detection is characterized by comprising
The mounting seat is arranged on the probe shell on the mounting seat;
the probe shell comprises an upper shell and a lower shell, an objective lens assembly is arranged in the upper shell, a substrate is arranged in the lower shell, a conductive lining plate is arranged in the middle of the upper end of the substrate, and a conductive copper plate is arranged above the conductive lining plate;
the upper end of the substrate is also provided with a mounting clamp, a mounting cylinder is arranged in the mounting clamp, an infrared detector is arranged in the mounting cylinder, and the infrared detector is connected with the conductive copper plate through a conducting piece; the lower end of the base plate is provided with a circuit board.
2. The infrared thermal image probe structure for automobile coating detection according to claim 1, wherein the objective lens assembly comprises an objective lens barrel, an infrared lens arranged inside the objective lens barrel, a support ring arranged on the outer end face of the objective lens barrel, and a positioning ring arranged on the outer end face of the support ring.
3. The infrared thermal image probe structure for automobile coating detection according to claim 1, wherein an outer mounting lining plate is arranged at the bottom edge of the upper shell.
4. The infrared thermal image probe structure for automobile coating detection according to claim 1, wherein a positioning column is arranged at the upper end of the mounting clamp.
5. The infrared thermographic probe structure for automobile film coating detection according to claim 1, wherein the upper shell and the lower shell are fixed by screws.
CN201921823037.9U 2019-10-28 2019-10-28 Infrared thermal image probe structure for automobile coating detection Active CN210923535U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201921823037.9U CN210923535U (en) 2019-10-28 2019-10-28 Infrared thermal image probe structure for automobile coating detection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201921823037.9U CN210923535U (en) 2019-10-28 2019-10-28 Infrared thermal image probe structure for automobile coating detection

Publications (1)

Publication Number Publication Date
CN210923535U true CN210923535U (en) 2020-07-03

Family

ID=71353146

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201921823037.9U Active CN210923535U (en) 2019-10-28 2019-10-28 Infrared thermal image probe structure for automobile coating detection

Country Status (1)

Country Link
CN (1) CN210923535U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116623263A (en) * 2023-07-24 2023-08-22 深圳市顺益丰实业有限公司 Adjusting device for film coating uniformity of semiconductor device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116623263A (en) * 2023-07-24 2023-08-22 深圳市顺益丰实业有限公司 Adjusting device for film coating uniformity of semiconductor device
CN116623263B (en) * 2023-07-24 2023-10-31 深圳市顺益丰实业有限公司 Adjusting device for film coating uniformity of semiconductor device

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