CN210838409U - Semi-automatic capper of miniature spring probe - Google Patents
Semi-automatic capper of miniature spring probe Download PDFInfo
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- CN210838409U CN210838409U CN201921798416.7U CN201921798416U CN210838409U CN 210838409 U CN210838409 U CN 210838409U CN 201921798416 U CN201921798416 U CN 201921798416U CN 210838409 U CN210838409 U CN 210838409U
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Abstract
The utility model discloses a semi-automatic capper of micro-spring type probe, include: the device comprises a base, a connecting block A, X shaft sliding assembly and a Z-axis fine adjustment assembly, wherein the connecting block A and the X-axis sliding assembly are arranged on the base, and the Z-axis fine adjustment assembly is arranged on the connecting block A; the X-axis sliding assembly includes: fixed slide, X axle slip table, connecting plate C, probe fixed baseplate and probe fixed block, X axle slip table sets up on fixed slide and can follow fixed slide and remove, connecting plate C sets up on the X axle slip table, probe fixed baseplate sets up and is used for placing the probe on connecting plate C, the probe fixed block sets up and is used for pushing down the probe on the probe fixed baseplate. In this way, the utility model discloses can solve current manual formula capper precision poor, the problem of inefficiency.
Description
Technical Field
The utility model relates to an electronic components field especially relates to a semi-automatic capper of micro-spring probe.
Background
The spring type probe is formed by riveting and prepressing three basic components, namely a needle shaft, a spring and a sleeve 11 (shown in figure 1) through a precision instrument, wherein the needle shaft and the spring are preset in the sleeve. When the probe is used, the probe is electrified or conducted, most of the probe is obliquely downward contacted with a copper wall through one end of the needle shaft, and the spring bears a small amount of gravity, so that the inner wall of the needle tube (copper sleeve) is required to be smooth. Normally, the spring is in a compressed state within the sleeve. To prevent the spring from deforming and recovering, the sleeve needs to be sealed, and a small section of the sleeve is pressed inwards to form a sealing groove, so that the spring is limited to be ejected.
Common needle tube sealing modes are divided into two types: automatic sealing and manual sealing. The automatic sealing needs special automatic sealing equipment, the special equipment is expensive, the small-scale production cost is high, and the automatic sealing is suitable for mass production; the manual sealing needs an operator to have certain operation proficiency, the sealing precision cannot be guaranteed, and the production efficiency is low.
SUMMERY OF THE UTILITY MODEL
The utility model discloses the main technical problem who solves provides a semi-automatic capper of micro-spring probe, can solve current manual formula capper precision poor, the problem of inefficiency.
In order to solve the technical problem, the utility model discloses a technical scheme be: the utility model provides a semi-automatic capper of miniature spring formula probe, includes: the device comprises a base, a connecting block A, X shaft sliding assembly and a Z-axis fine adjustment assembly, wherein the connecting block A and the X-axis sliding assembly are arranged on the base, and the Z-axis fine adjustment assembly is arranged on the connecting block A;
the X-axis sliding assembly includes: the probe fixing device comprises a fixing sliding seat, an X-axis sliding table, a connecting plate C, a probe fixing base and a probe fixing block, wherein the X-axis sliding table is arranged on the fixing sliding seat and can move along the fixing sliding seat;
the Z-axis fine adjustment assembly comprises: fixed plate, Z axle sliding block group, thousandth degree knob, cutter fixed plate, connecting block B and the execution cutter of L type, one side of L type fixed plate is fixed in connecting block A, and the another side of L type fixed plate is used for fixed Z axle sliding block group, Z axle sliding block group includes: fixed block A and slider B, fixed block A is fixed in the fixed plate, slider B and cutter fixing plate fixed connection, thousand dividing knob is fixed in on slider B and the bottom of thousandth degree knob corresponds with fixed block A for when thousand dividing knob rotates, slider B can be for fixed block A along Z to the motion, carry out the cutter and pass through connecting block B and connect in cutter fixing plate, the edge of a knife position of carrying out the cutter corresponds with the probe on the probe fixed baseplate.
Preferably, the knife edge is set to be in a contracted shape, the depth of the knife edge is gradually increased along one direction, and the width of the knife edge is also gradually increased along the same direction.
Preferably, the knife edge has the same depth increment and width increment in the same direction, that is, the seal area of the knife edge has the same Y-axis increment and Z-axis increment in the same direction.
Preferably, the contact parts of the fixed sliding seat and the X-axis sliding table are arranged into dovetail-shaped or V-shaped structures matched with each other.
Preferably, the probe mounting groove has been seted up to probe fixed baseplate up end, the probe groove of stepping down has been seted up to the lower terminal surface of probe fixed block, and the probe mounting groove adopts arc type groove structure with the probe groove of stepping down, and the probe mounting groove is stepped down the shape and the probe phase-match behind the groove combination with the probe, and after the probe was packed into, the arc wall can be accurate the restriction probe the movable allowance and do not restrict the rotation of probe in Y axle direction.
Preferably, the contact site of probe fixed base and probe fixed block sets up to dovetail or the V type structure of mutual matching, and probe fixed block and probe fixed base compound mode are the spout form, can carry out Y axle removal fast, and the probe is packed into or will have sealed the probe of accomplishing and take out before sealing, only needs to remove probe fixed block position in Y axle direction and can accomplish convenient and fast.
Preferably, a sliding mechanism and a guide mechanism are arranged between the fixed block A and the sliding block B.
Preferably, one side that fixed block A is close to slider B is provided with draw runner A, one side that slider B is close to fixed block A is provided with draw runner B, draw runner A all is provided with the arc wall with the opposite side of draw runner B, is provided with the ball in the arc wall between draw runner A and draw runner B, and inside ball adopts the steel ball, uses to select through strict size, and control clearance surplus improves Z axle sliding block group's bulk rigidity, reduces elastic deformation, guarantees that device motion precision is within 0.01 mm.
Preferably, the side of fixed block A is provided with connecting plate D, the guide way has been seted up to connecting plate D, slider B is provided with the screw rod with one side, one side that the screw rod is close to slider B is provided with the neck, the diameter of neck is less than the screw rod, the neck sets up in connecting plate D's guide way.
The utility model has the advantages that:
1. the depth of the seal is controlled by the Z-axis fine adjustment assembly, the required depth can be manually adjusted according to the requirements of customers, the size adjustment can be completed through the dial knob, and the operation is simple and convenient;
2. the width of the seal is controlled by the structure of the knife edge, and because the knife edge structure is designed for equivalent increment of width and depth, namely the increment of the Y axis is the same as the increment of the Z axis in the same direction, the change of the width of the seal can be realized when the position of the Z axis is adjusted, no additional operation is needed, and the sealing time is saved;
3. the probe fixing base is provided with an outer arc-shaped groove in order to ensure the fixing precision of the position of the probe, after the probe is installed, the arc-shaped groove can accurately limit the movement allowance of the probe and does not limit the rotation of the probe in the Y-axis direction, the positioning adjustment work is not needed, and the working efficiency is higher; the arc-shaped groove design can increase the contact area between the probe and the probe fixing base, so that sufficient friction force exists between the probe and the probe fixing base, and the sealing groove is convenient to form.
Drawings
FIG. 1 is a schematic perspective view of a prior art probe;
fig. 2 is a schematic perspective view of a preferred embodiment of a semi-automatic capper of a microspring probe according to the present invention;
FIG. 3 is a schematic perspective view of the X-axis slide assembly;
FIG. 4 is a perspective view of the Z-axis fine adjustment assembly;
FIG. 5 is a schematic perspective view of another angle of the Z-axis fine adjustment assembly;
FIG. 6 is an exploded view of FIG. 5;
FIG. 7 is a schematic perspective view of the probe-fixing base;
fig. 8 is a schematic perspective view of the probe fixing block;
fig. 9 is a schematic perspective view of the fixed block a;
FIG. 10 is a schematic perspective view of the slider B;
FIG. 11 is a perspective view of the tool holding plate;
FIG. 12 is a perspective view of the implement tool;
fig. 13 is a partially enlarged view illustrating a portion a of fig. 12;
FIG. 14 is a force diagram of the probe sleeve shown;
the parts in the drawings are numbered as follows: 1. the probe comprises a probe, 11, a sleeve, 12, a sealing groove, 2, a base, 3, connecting blocks A, 4, an X-axis sliding assembly, 5, a Z-axis fine adjustment assembly, 41, a fixed sliding seat, 42, an X-axis sliding table, 43, connecting plates C, 44, a probe fixed base, 45, a probe fixed block, 51, a fixed plate, 52, a Z-axis sliding block set, 53, a dial knob, 54, a knob fixed block, 55, a cutter fixed plate, 56, connecting blocks B, 57, an execution cutter, 441, a probe mounting groove, 442, a V-shaped groove, 451, a probe abdicating groove, 452, a V-shaped bar, 521, a fixed block A, 522, a sliding block B, 523, a guide groove, 524, a screw rod, 525, a connecting plate D, 526, a sliding bar A, 527, an arc-shaped groove, 528, a neck, 529, a sliding bar B, 530, an arc-shaped groove, 551.
Detailed Description
The following detailed description of the preferred embodiments of the present invention will be provided in conjunction with the accompanying drawings, so as to enable those skilled in the art to more easily understand the advantages and features of the present invention, and thereby define the scope of the invention more clearly and clearly.
Referring to fig. 2, an embodiment of the present invention includes:
a semi-automatic capper of miniature spring formula probe includes: the device comprises a base 2, a connecting block A3, an X-axis sliding assembly 4 and a Z-axis fine-tuning assembly 5, wherein the connecting block A3 and the X-axis sliding assembly 4 are arranged on the base 2, and the Z-axis fine-tuning assembly 5 is arranged on a connecting block A3;
as shown in fig. 3, the X-axis sliding assembly 4 includes: the probe fixing device comprises a fixed sliding seat 41, an X-axis sliding table 42, a connecting plate C43, a probe fixing base 44 and a probe fixing block 45, wherein the X-axis sliding table 42 is arranged on the fixed sliding seat 41, the contact parts of the fixed sliding seat 41 and the X-axis sliding table 42 are arranged into V-shaped structures which are matched with each other, a precise miniature linear guide rail is adopted, the probe fixing device can move along the fixed sliding seat, the connecting plate C43 is arranged on the X-axis sliding table 42 and provides a fixing position point of the probe fixing base 44, the probe fixing base 44 is arranged on the connecting plate C43 and used for placing a probe 1, and the probe fixing block 45 is arranged on the probe fixing base 44; the contact parts of the probe fixing base 44 and the probe fixing block 45 are arranged to be mutually matched in a V-shaped structure, and the probe fixing block 45 and the probe fixing base 44 are combined in a sliding chute mode, so that Y-axis movement can be rapidly carried out;
as shown in fig. 4, 5, and 6, the Z-axis fine adjustment assembly 5 includes: the Z-axis sliding block set comprises an L-shaped fixing plate 51, a Z-axis sliding block set 52, a dial knob 53, a cutter fixing plate 55, a connecting block B56 and an executing cutter 57, wherein one side of the L-shaped fixing plate 51 is fixed to the connecting block A3, the other side of the L-shaped fixing plate 51 is used for fixing the Z-axis sliding block set 52, and the Z-axis sliding block set 52 comprises: the probe sealing device comprises a fixing block A521 and a sliding block B522, wherein the fixing block A521 is fixed on the fixing plate 51, the sliding block B522 is fixedly connected with the cutter fixing plate 55, the thousand-degree knob 53 is fixed on the sliding block B522 through a knob fixing block 54, the bottom end of the thousandth-degree knob 53 corresponds to the fixing block A521, so that when the thousand-degree knob 53 rotates, the sliding block B522 can move along the Z direction relative to the fixing block A521, the executive cutter 57 is connected to the cutter fixing plate 55 through a connecting block B56, and the knife edge 571 of the executive cutter corresponds to the position 12 to be sealed of the probe on the probe fixing base 44.
As shown in fig. 5, 6, 9 and 10, a slide bar a526 is arranged on one side of the fixed block a521 close to the slide block B522, a slide bar B529 is arranged on one side of the slide block B522 close to the fixed block a521, arc-shaped grooves (527 and 530) are arranged on the opposite sides of the slide bar a526 and the slide bar B529, and balls are arranged in the arc-shaped grooves (527 and 530) between the slide bar a526 and the slide bar B529, and the balls are steel balls, and are selected according to strict sizes, so that the gap allowance is controlled, the overall rigidity of the Z-axis slide block group 52 is improved, the elastic deformation is reduced, and the movement precision of the device is ensured to be within 0.01 mm.
The side surface of the fixed block 521A is provided with a connecting plate D525, the connecting plate D525 is provided with a guide groove 523, the same side of the slider B522 is provided with a screw 524, one side of the screw 524 close to the slider B522 is provided with a neck 528, the diameter of the neck 528 is smaller than that of the screw 524, the neck 528 is arranged in the guide groove 523 of the connecting plate D525, and when the fixed block a521 and the slider B522 move relatively, the neck 528 of the screw 524 can move relatively in the guide groove 523 of the connecting plate D525 to achieve a guide function.
As shown in fig. 7 and 8, a probe mounting groove 441 has been seted up on the upper end surface of the probe fixing base 44, a probe abdicating groove 451 has been seted up on the lower end surface of the probe fixing block 45, the probe mounting groove 441 and the probe abdicating groove 451 adopt an arc-shaped groove structure, the shape of the probe mounting groove 441 and the probe abdicating groove 451 after combination is matched with the probe 1, and after the probe is installed, the arc-shaped groove can accurately limit the movement allowance of the probe 1 and does not limit the rotation of the probe in the Y-axis direction.
As shown in fig. 12 and 13, the knife edge 571 is configured to be in a contracted shape, and the depth of the knife edge 571 gradually increases along one direction, and the width thereof also gradually increases along the same direction. The knife edge 571 has the same depth increment and width increment in the same direction, that is, the increment of the knife edge in the sealing area in the same direction on the Y axis is the same as the increment on the Z axis, and the sealing width can be changed when the position of the Z axis is adjusted.
As shown in fig. 11, a schematic perspective view of the cutter fixing plate 55 is shown, in which a cutter mounting groove 551 is formed in the middle of the cutter fixing plate, the connecting block B56 is fixed in the cutter mounting groove 551, the actuating cutter 57 is fixed at the outer end of the connecting block B56, the Y-direction size of the actuating cutter 57 is increased by adding the connecting block B56, and the connecting blocks B with different lengths can be replaced according to probes with different models, so that the application range of the device is expanded.
The utility model discloses a working process does: when the sealing operation is performed, the probe fixing block 45 is pushed towards the direction far away from the execution cutter 57, so that the probe installation groove 441 is integrally leaked, then the first spring probe sample is loaded to the probe fixing base 44, the probe fixing block 45 is reset, the probe 1 is completely coated under the combined action of the probe fixing base 44 and the probe fixing block 45, and only one rotational degree of freedom in the Y-axis direction is reserved; adjusting the left and right positions of the X-axis sliding assembly 4 to align the starting section of the sealing area of the execution cutter edge 571 with the starting point of the probe sealing groove 12 in the X-axis direction, rotating the indexing knob 53 to enable the execution cutter 57 to move downwards, and when the lowest position of the edge 571 is just tangent to the probe sleeve 11, stopping rotating to realize the positioning operation of the execution cutter;
the depth of the sealing groove is determined according to the processing drawing, and the indexing knob 53 is rotated to feed the cutter 57 downward by the groove depth. At this time, the probe 1 can see a clear pressed trace; in the direction of the X axis, the X axis sliding assembly 4 is slowly moved, so that the knife edge of the probe 1 and the executive cutter 57 generate interaction force, the spring probe is subjected to stress analysis as shown in fig. 14, under the action of force F, the probe 1 rotates, so that the sleeve 11 is preliminarily extruded out of the sealing groove, the depth direction is controlled by force F1, force F2 controls the rotary extrusion of the probe, and when the rotating angle is 360 degrees, the complete sealing groove 12 can be formed on the outer side of the sleeve;
after the sealing groove 12 is formed, moving the execution cutter 57 in a reverse direction to enable the execution cutter 57 to be far away from the probe 1, opening the probe fixing block 45, taking out the packaged probe 1 by using a pair of tweezers, carrying out first-piece inspection on a measuring microscope, measuring related parameters such as the depth and radian of the sealing groove 12, judging the completion condition of sealing operation, and if the sealing groove is qualified, loading the next probe to start production; otherwise, adjusting the position parameters properly according to the measurement data until the sample is qualified, and starting batch production.
The above only is the embodiment of the present invention, not limiting the patent scope of the present invention, all the equivalent structures or equivalent processes that are used in the specification and the attached drawings or directly or indirectly applied to other related technical fields are included in the patent protection scope of the present invention.
Claims (9)
1. The utility model provides a semi-automatic capper of micro-spring formula probe which characterized in that includes: the device comprises a base, a connecting block A, X shaft sliding assembly and a Z-axis fine adjustment assembly, wherein the connecting block A and the X-axis sliding assembly are arranged on the base, and the Z-axis fine adjustment assembly is arranged on the connecting block A;
the X-axis sliding assembly includes: the probe fixing device comprises a fixing sliding seat, an X-axis sliding table, a connecting plate C, a probe fixing base and a probe fixing block, wherein the X-axis sliding table is arranged on the fixing sliding seat and can move along the fixing sliding seat;
the Z-axis fine adjustment assembly comprises: fixed plate, Z axle sliding block group, thousandth degree knob, cutter fixed plate, connecting block B and the execution cutter of L type, one side of L type fixed plate is fixed in connecting block A, and the another side of L type fixed plate is used for fixed Z axle sliding block group, Z axle sliding block group includes: fixed block A and slider B, fixed block A is fixed in the fixed plate, slider B and cutter fixing plate fixed connection, thousand dividing knob is fixed in on slider B and the bottom of thousandth degree knob corresponds with fixed block A for when thousand dividing knob rotates, slider B can be for fixed block A along Z to the motion, carry out the cutter and pass through connecting block B and connect in cutter fixing plate, the edge of a knife position of carrying out the cutter corresponds with the probe on the probe fixed baseplate.
2. The semi-automatic capper of miniature spring type probe of claim 1 characterized in that, the edge sets up to shrink form, and the degree of depth of edge is gradually increased along a direction, and along same direction, the width also gradually increases.
3. The semi-automatic capper of claim 2, characterized in that, the edge is in the same direction, the increase of depth is the same as the increase of width.
4. The semi-automatic capper of microspring probe of claim 1 wherein, the contact portion of fixed slide and X axle slip table sets up to mutually supporting dovetail type or V type structure.
5. The semi-automatic capper of microspring probe of claim 1, characterized in that, probe mounting groove has been seted up to probe fixed base up end, the lower terminal surface of probe fixed block has seted up the probe groove of stepping down, the shape and the probe phase-match after probe mounting groove and the combination of probe groove of stepping down groove.
6. The semi-automatic capper of miniature spring type probe of claim 1 or 5 characterized in that, the contact portion of probe fixed base and probe fixed block sets up to mutually matched dovetail type or V type structure.
7. The semi-automatic capper of miniature spring type probe of claim 1 characterized in that, be provided with slide mechanism and guiding mechanism between fixed block A and slider B.
8. The semi-automatic capper of miniature spring type probe of claim 7 characterized in that, one side that fixed block A is close to slider B is provided with slide A, one side that slider B is close to fixed block A is provided with slide B, the opposite side of slide A and slide B all is provided with the arc wall, is provided with the ball in the arc wall between slide A and slide B.
9. The semi-automatic capper of miniature spring probe of claim 7, characterized in that, the side of fixed block A is provided with connecting plate D, connecting plate D has seted up the guide way, slider B is provided with the screw rod with one side, the screw rod is provided with the neck near slider B one side, the diameter of neck is less than the screw rod, the neck sets up in connecting plate D's guide way.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921798416.7U CN210838409U (en) | 2019-10-24 | 2019-10-24 | Semi-automatic capper of miniature spring probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921798416.7U CN210838409U (en) | 2019-10-24 | 2019-10-24 | Semi-automatic capper of miniature spring probe |
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| Publication Number | Publication Date |
|---|---|
| CN210838409U true CN210838409U (en) | 2020-06-23 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201921798416.7U Active CN210838409U (en) | 2019-10-24 | 2019-10-24 | Semi-automatic capper of miniature spring probe |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110690632A (en) * | 2019-10-24 | 2020-01-14 | 苏州英世米半导体技术有限公司 | Semi-automatic capper of miniature spring probe |
| CN112719107A (en) * | 2020-12-22 | 2021-04-30 | 贵州顺安科技有限公司 | Probe sealing processing machine |
-
2019
- 2019-10-24 CN CN201921798416.7U patent/CN210838409U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110690632A (en) * | 2019-10-24 | 2020-01-14 | 苏州英世米半导体技术有限公司 | Semi-automatic capper of miniature spring probe |
| CN110690632B (en) * | 2019-10-24 | 2024-05-14 | 苏州英世米半导体技术有限公司 | Semi-automatic sealing machine of miniature spring type probe |
| CN112719107A (en) * | 2020-12-22 | 2021-04-30 | 贵州顺安科技有限公司 | Probe sealing processing machine |
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