CN210775646U - Load test system - Google Patents
Load test system Download PDFInfo
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- CN210775646U CN210775646U CN201921502135.2U CN201921502135U CN210775646U CN 210775646 U CN210775646 U CN 210775646U CN 201921502135 U CN201921502135 U CN 201921502135U CN 210775646 U CN210775646 U CN 210775646U
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Abstract
The utility model discloses a load test system, including voltage measurement module, current measurement module, signal processing circuit module, the MCU controller, display and button module, this system is based on the synchro-genesis technique, realize the collection of voltage signal and current signal on the circuit through voltage measurement module and current measurement module, and carry out signal processing through signal processing circuit module, realize voltage waveform and current waveform's analysis and relevant parameter's calculation through the MCU controller at last, realize the test to the load condition, this system architecture is simple, the reliability is high, it is more convenient than traditional area load test mode, safety, high efficiency.
Description
Technical Field
The utility model relates to an electric power system area load test technical field, more specifically the saying so relates to a load test system.
Background
At present, when a substation is put into operation, a load test of a current loop needs to be performed, for example, a load test of a 220kV line and a 110kV line, and in order to compare whether a phase of a current is correct, a conventional method at present generally needs to measure data such as a magnitude and a phase of the current by using a same voltage source as a reference.
However, the existing method has the following problems in the measurement process: when loads are carried at different places, if the two places are far away from each other, the measurement is carried out with larger workload when the same voltage source cannot be obtained, and meanwhile, the potential safety hazard is increased.
Therefore, how to provide a safe, convenient, accurate and reliable load testing system is a problem that needs to be solved by those skilled in the art.
SUMMERY OF THE UTILITY MODEL
In view of this, the utility model provides a load test system, this system are based on the synchronous emergence technique, and system structure is simple, the reliability is high and safe, high-efficient, has solved traditional load test mode inefficiency and the problem that the potential safety hazard is difficult to overcome.
In order to achieve the above purpose, the utility model adopts the following technical scheme:
the utility model provides a load test system, which comprises a voltage measurement module, a current measurement module, a signal processing circuit module, an MCU controller, a display and a key module, wherein the voltage measurement module and the current measurement module are electrically connected with the signal processing circuit module;
the voltage measuring module is used for measuring A, B, C three-phase voltage of a point to be measured on the line to obtain an alternating current voltage signal;
the current measuring module is used for measuring A, B, C three-phase current of a point to be measured on the line to obtain an alternating current signal;
the signal processing circuit module is used for carrying out multichannel sampling and analog-to-digital conversion processing on the alternating voltage signal and the alternating current signal to obtain a measurement voltage waveform and a measurement current waveform;
the MCU controller is used for analyzing and processing the measurement voltage waveform and the measurement current waveform, and calculating active power and reactive power according to the voltage amplitude and the current amplitude in the waveforms;
the display is used for displaying the measured voltage waveform, the measured current waveform, the active power and the reactive power in real time;
and the key module is used for inputting an operation instruction by a user.
Further, the voltage measuring module is composed of two voltage dividing resistors connected in series.
Furthermore, the two voltage dividing resistors are high-precision RJ711 type voltage dividing resistors.
Further, the current measuring module comprises a Hall current sensor and a resistor R136The output end of the Hall current sensor and the resistor R136And the output end of the Hall current sensor is also electrically connected with the signal processing circuit module.
Further, the Hall current sensor is a CHB-25NP type sensor.
Furthermore, the signal processing circuit module comprises a multi-channel sampling chip and an analog-to-digital conversion chip, the input end of the multi-channel sampling chip is electrically connected with the voltage measuring module and the current measuring module, the output end of the multi-channel sampling chip is electrically connected with the analog-to-digital conversion chip, and the analog-to-digital conversion chip is also electrically connected with the MCU controller.
Furthermore, the multi-channel sampling chip is a 16-to-1 bidirectional analog switch chip with the model number of CD 4067.
Furthermore, the analog-to-digital conversion chip is a MAX1241 type 12-bit A/D conversion chip.
According to the technical scheme, compare with prior art, the utility model discloses a load test system is provided, this system is based on the synchronous emergence technique, through voltage measurement module and current measurement module realization circuit on voltage signal and current signal's collection, and carry out signal processing through signal processing circuit module, realize voltage waveform and current waveform's analysis and relevant parameter's calculation through the MCU controller at last, realize the test to the load state, this system simple structure, the reliability is high, it is more convenient than traditional area load test mode, safety, high efficiency.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the provided drawings without creative efforts.
Fig. 1 is a schematic diagram of an overall structure of a load testing system according to the present invention;
FIG. 2 is a schematic diagram illustrating a voltage waveform measurement principle in an embodiment of the present invention;
FIG. 3 is a schematic diagram of a current waveform measurement principle in an embodiment of the present invention;
fig. 4 is a schematic diagram of a voltage measurement module circuit according to an embodiment of the present invention;
fig. 5 is a schematic circuit diagram of a current measuring module according to an embodiment of the present invention;
fig. 6 is a schematic diagram of a connection relationship circuit of the signal processing circuit module and the MCU controller according to an embodiment of the present invention;
fig. 7 is a schematic diagram of current and voltage waveforms in an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
Referring to the attached drawing 1, the embodiment of the utility model discloses a load testing system, this system includes voltage measurement module 2, current measurement module 1, signal processing circuit module 3, MCU controller 4, display 5 and button module 6, voltage measurement module 2 and current measurement module 1 are all connected with signal processing circuit module 3 electricity, signal processing circuit module 3, display 5 and button module 6 are all connected with MCU controller 4 electricity;
the voltage measuring module 2 is used for measuring A, B, C three-phase voltage of a point to be measured on the line to obtain an alternating current voltage signal;
the current measuring module 1 is used for measuring A, B, C three-phase current of a point to be measured on a line to obtain an alternating current signal;
the signal processing circuit module 3 is used for carrying out multichannel sampling and analog-to-digital conversion processing on the alternating voltage signals and the alternating current signals to obtain measuring voltage waveforms and measuring current waveforms;
the MCU controller 4 is used for analyzing and processing the measured voltage waveform and the measured current waveform, and calculating active power and reactive power according to the voltage amplitude and the current amplitude in the waveform;
the display 5 is used for displaying the measured voltage waveform, the measured current waveform, the active power and the reactive power in real time;
and the key module 6 is used for inputting an operation instruction by a user.
Specifically, the measurement principle of the voltage measurement module 2 for measuring A, B, C three-phase voltage at the point to be measured on the line at regular time is shown in fig. 2, and the measurement principle of the current measurement module 1 for measuring A, B, C three-phase current at the point to be measured on the line is shown in fig. 3.
In particular, with reference to fig. 4, the voltage measuring module 2 consists of two voltage dividing resistors connected in series.
In one specific embodiment, both voltage dividing resistors are high precision RJ711 type voltage dividing resistors.
In particular, with reference to fig. 5, the current measuring module 1 comprises a hall current sensor and a resistor R136Output terminal of Hall current sensor and resistor R136And the output end of the Hall current sensor is also electrically connected with the signal processing circuit module 3.
In a specific embodiment, the HallThe current sensor is a CHB-25NP type sensor. In the embodiment, a CHB-25NP type sensor is selected as a system measuring element, and 0-25 mA current obtained by measurement of a Hall sensor passes through a resistor R136And converting the voltage signal into a voltage signal of 0-5V, and then measuring the current by converting the voltage signal.
Specifically, the signal processing circuit module 3 comprises a multi-channel sampling chip and an analog-to-digital conversion chip, wherein the input end of the multi-channel sampling chip is electrically connected with the voltage measuring module 2 and the current measuring module 1, the output end of the multi-channel sampling chip is electrically connected with the analog-to-digital conversion chip, and the analog-to-digital conversion chip is further electrically connected with the MCU controller 4.
In a specific embodiment, a 16-to-1 bidirectional analog switch chip with the model of CD4067 is selected as the multichannel sampling chip, an MAX1241 type 12-bit A/D conversion chip is selected as the analog-to-digital conversion chip, an STC89C51 single-chip microcomputer is selected as the MCU controller, three-bit general I/O ports P1.0-P1.2 are used as chip selection interfaces of the single-chip microcomputer, P1.1 is used for chip selection signals, P1.2 is used for data input, and P1.0 generates a driving pulse SCLK. The working process is as follows: the system firstly selects CD4067 by using pin 7 of port P1, then realizes the selection of 16 paths of analog signals by using signals P1.3-P1.6, inputs the selected signals to the analog signal input port of MAX1241, and realizes the conversion of the signals by setting P1.0-P1.2.
Specifically, referring to fig. 6, pin 1 and pin 3 of the a/D conversion chip MAX1241 are connected to a +5V power supply, pin 2 is connected to the measurement circuit, pin 4 is connected to a +10V power supply and grounded through a capacitor C7, pin 6, pin 7, and pin 8 of the a/D conversion chip MAX1241 are sequentially connected to ports P1.2, P1.1, and P1.0 of the STC89C51 single chip microcomputer, respectively, and pin 5 of the a/D conversion chip MAX1241 is grounded.
In addition, a reset circuit composed of a key S2, a capacitor C14 and a resistor R41, a crystal oscillator circuit composed of a capacitor C12, a capacitor C13 and a crystal oscillator Y2, and a pull-up resistor composed of R61, R62, R65, R67, R70, R72, R73 and R74 are further arranged on the periphery of the STC89C51 single chip microcomputer.
Specifically, the process of completing the load test of the system comprises the following steps:
s1: respectively carrying out alternating voltage detection and alternating current detection on a line to be detected;
s2: sampling and analog-to-digital converting the detected alternating voltage signal and alternating current signal to obtain a measuring voltage waveform and a measuring current waveform, and displaying the measuring voltage waveform and the measuring current waveform; as shown in fig. 7, the measurement voltage waveform and the measurement current waveform;
s3: taking a point of the measuring voltage waveform or the measuring current waveform which is changed from a negative value to a positive value as a zero point, respectively analyzing and judging the position and time of a zero crossing point in the measuring voltage waveform and the measuring current waveform, and further calculating a current phase and amplitude and a voltage phase and amplitude;
s4: and calculating the load according to the current amplitude and the voltage amplitude, and calculating the magnitude of the active load and the reactive load according to the phase difference between the current and the voltage to realize the test of the load state.
Specifically, the current phase is calculated in step 3, and the calculation formula is as follows:
φ＝2ntπ/T
where φ is the phase of the current, T is the sampling interval, T is the period of the waveform, here 20 ms;
calculating the current amplitude by the following formula:
in the formula, wherein IrmsIs the effective value of the current; m is the number of samples in one period, and I is the sampling value.
Specifically, the voltage amplitude is calculated in step 3, and the calculation formula is as follows:
in the formula of UrmsAnd m is the effective value of the voltage, m is the sampling number of one period, and U is the sampling value.
Specifically, the magnitude of the active load is calculated in step 4, and the calculation formula is as follows:
in the formula of UrmsIs the effective value of the voltage, IrmsIs the effective value of the current, phi is the phase difference between the current and the voltage;
and calculating to obtain the magnitude of the reactive load, wherein the calculation formula is as follows:
in the formula of UrmsIs the effective value of the voltage, IrmsPhi is the effective value of the current and phi is the phase difference between the current and the voltage.
According to the technical scheme, compared with the prior art, the load testing system provided by the embodiment realizes the acquisition of voltage signals and current signals on a line through the voltage measuring module and the current measuring module, processes the signals through the signal processing circuit module, and finally realizes the analysis of voltage waveforms and current waveforms and the calculation of related parameters through the MCU controller to realize the test of the load state.
The embodiments in the present description are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other. The device disclosed by the embodiment corresponds to the method disclosed by the embodiment, so that the description is simple, and the relevant points can be referred to the method part for description.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (8)
1. A load test system is characterized by comprising a voltage measurement module, a current measurement module, a signal processing circuit module, an MCU (microprogrammed control unit) controller, a display and a key module, wherein the voltage measurement module and the current measurement module are electrically connected with the signal processing circuit module;
the voltage measuring module is used for measuring A, B, C three-phase voltage of a point to be measured on the line to obtain an alternating current voltage signal;
the current measuring module is used for measuring A, B, C three-phase current of a point to be measured on the line to obtain an alternating current signal;
the signal processing circuit module is used for carrying out multichannel sampling and analog-to-digital conversion processing on the alternating voltage signal and the alternating current signal to obtain a measurement voltage waveform and a measurement current waveform;
the MCU controller is used for analyzing and processing the measurement voltage waveform and the measurement current waveform, and calculating active power and reactive power according to the voltage amplitude and the current amplitude in the waveforms;
the display is used for displaying the measured voltage waveform, the measured current waveform, the active power and the reactive power in real time;
and the key module is used for inputting an operation instruction by a user.
2. The load testing system according to claim 1, wherein said voltage measuring module comprises two voltage dividing resistors connected in series.
3. The load testing system according to claim 2, wherein both of said voltage dividing resistors are high precision RJ711 type voltage dividing resistors.
4. The load testing system of claim 1, wherein the current measurement module comprises a hall current sensor and a resistor R136The output end of the Hall current sensor and the resistor R136And the output end of the Hall current sensor is also electrically connected with the signal processing circuit module.
5. A load testing system according to claim 4, wherein said Hall current sensor is a CHB-25NP type sensor.
6. The load testing system according to claim 1, wherein the signal processing circuit module comprises a multi-channel sampling chip and an analog-to-digital conversion chip, an input end of the multi-channel sampling chip is electrically connected with the voltage measuring module and the current measuring module, an output end of the multi-channel sampling chip is electrically connected with the analog-to-digital conversion chip, and the analog-to-digital conversion chip is further electrically connected with the MCU controller.
7. The load testing system of claim 6, wherein said multi-channel sampling chip is a 1-out-of-16 bi-directional analog switch chip having a model number of CD 4067.
8. The system of claim 6, wherein the analog-to-digital conversion chip is a MAX1241 type 12-bit A/D conversion chip.
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| CN201921502135.2U CN210775646U (en) | 2019-09-10 | 2019-09-10 | Load test system |
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| CN201921502135.2U CN210775646U (en) | 2019-09-10 | 2019-09-10 | Load test system |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110531150A (en) * | 2019-09-10 | 2019-12-03 | 浙江蓝迪电力科技有限公司 | A kind of Road test system and method |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110531150A (en) * | 2019-09-10 | 2019-12-03 | 浙江蓝迪电力科技有限公司 | A kind of Road test system and method |
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